CN202770534U - Temperature field measuring device in laser processing process based on LabView - Google Patents

Temperature field measuring device in laser processing process based on LabView Download PDF

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Publication number
CN202770534U
CN202770534U CN 201220447936 CN201220447936U CN202770534U CN 202770534 U CN202770534 U CN 202770534U CN 201220447936 CN201220447936 CN 201220447936 CN 201220447936 U CN201220447936 U CN 201220447936U CN 202770534 U CN202770534 U CN 202770534U
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temperature
chip microcomputer
sensor
laser processing
measuring device
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郭华锋
雍兆
满家祥
张佐营
杨根喜
李清伟
胡志强
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Xuzhou University of Technology
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Xuzhou University of Technology
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Abstract

The utility model discloses a temperature field measuring device in a laser processing process based on LabView. The temperature field measuring device in the laser processing process based on LabView mainly comprises a temperature measuring device and a software control portion, wherein the temperature measuring device comprises an infrared temperature measuring sensor, a one-chip microcomputer, a one-chip microcomputer power supplying module, a sensor power supplying module, a 22.1184MH crystal oscillator and reset circuit, the infrared temperature measuring sensor is connected with the one-chip microcomputer through circuit, the one-chip microcomputer is connected with a host computer through an RS232 chip, the sensor power supplying module is connected with a sensor, the one-chip microcomputer power supplying module is connected with the one-chip microcomputer, and the infrared temperature measuring sensor is fixed on a main shaft of a laser machine tool through a fixture. The temperature field measuring device in the laser processing process based on LabView is advantaged in that the temperature field measuring device has properties of simple equipment, relatively low cost and wide temperature measuring scope; fixed point and dynamic temperature measuring types can be carried out by changing a position of a temperature measuring sensor; different environment demands can be met.

Description

Laser processing procedure temperature field measuring apparatus based on LabView
Technical field
The utility model relates to laser processing procedure temperature field measurement field, and is specifically a kind of based on LabView's
The laser processing procedure temperature field measuring apparatus.
Background technology
Common characteristics of laser processing procedure such as laser melting coating, laser remolten, laser bonding are exactly to form the high temperature molten bath with the metal material interaction under the high energy beam laser action.But the unbalanced unstable characteristics of the distinctive rapid heat cycle characteristic of Laser Processing and input energy certainly will cause the marked change in temperature field, affect the stability of metal pool, produce larger thermograde and thermal stress, and then cause the defective such as buckling deformation, cracking of drip molding or coating.Than outside, the differentiation in temperature field has determined the heat and mass in the laser molten pool in the process, and then has directly had influence on the tissue, performance, surface quality etc. of shape, metal level and the matrix in molten bath.Therefore laser processing procedure is carried out temperature field measurement and monitoring, for its temperature field evolution rule of announcement, reasonably select material and optimization processing technology parameter, control forming quality extremely important meaning is arranged.
The measurement in temperature field generally all is by thermopair, Portable infrared temperature measuring rifle or infrared thermography, carries out based on the methods such as temperature field measurement of high-speed CCD in laser melting coating, laser remolten, the laser beam welding at present.
Thermocouple temperature measurement has the structure letter, singly is widely used, model is many, temperature-measuring range is wide, the advantage such as cheap, but its metering system is contact type measurement, when measuring, need to immersion thermocouple in the matrix punching, matrix is damaged, and can not measure the temperature of molten bath central spot, can only one-point measurement, can not carry out real time temperature and measure.
Portable infrared temperature measuring rifle or infrared thermography belong to non-contact measurement, and be easy to carry, and can carry out telemeasurement, uses in recent years more and more extensive in the thermometric field.But business-like infrared temperature-measuring gun or infrared thermography temperature-measuring range are less, generally all below 1200 ℃, then need custom-made, price comparatively expensive if carry out high temperature measurement.Key is that business-like Portable infrared temperature measuring rifle can not be measured in real time to whole process, can only gather a certain moment temperature, can't obtain the development law in process temperature field.Although infrared thermography can be recorded the video recording of whole process, obtains the process temperature field, be according to its contour structures design specialized anchor clamps, and also general because volume is larger, be not easy to be installed on the machining tool main shaft.
Temperature field measurement based on high-speed CCD, its principle is to take the heat radiation images in molten bath in the laser processing procedure by high-speed CCD, then demarcating, contrast the temperature field that can obtain body surface by image processing techniques distributes, it is the new development trend that the high temp objects temperature field is detected, but be subjected to the blackbody radiation source device-restrictive, its temperature calibration scope also is restricted, particularly aspect the high-temperature area demarcation; And comparatively loaded down with trivial details at aspects such as image data acquiring, image processing, program design exploitations, also be in generally laboratory stage.
Summary of the invention
In order to solve the deficiency of above-mentioned prior art and temp measuring system, the utility model provides a kind of laser processing procedure temperature field measuring apparatus based on LabView, can satisfy the measurement demand in temperature field in the laser processing procedures such as laser melting coating, laser remolten and laser bonding.
The utility model is realized with following technical scheme: the laser processing procedure temperature field measuring apparatus based on LabView has a temperature measuring equipment, and described temperature measuring equipment comprises infrared temperature-test sensor, single-chip microcomputer, single-chip microcomputer power supply module, sensor power supply module, 22.1184MH crystal oscillator and reset circuit; Described infrared temperature-test sensor is connected with single-chip microcomputer by circuit, single-chip microcomputer links to each other with host computer by the RS232 chip, sensor power supply module is connected with sensor, and single-chip microcomputer power supply module links to each other with single-chip microcomputer, and infrared temperature-test sensor is installed in laser processing device and is set up.
The beneficial effects of the utility model: this temperature measuring equipment temperature-measuring range is wide, and precision is high, can fix a point and dynamic two kinds of temperature surveys by the position that changes temperature probe, satisfies the different condition needs.
Description of drawings
The utility model is described in further detail below in conjunction with drawings and Examples.
Fig. 1 is the utility model theory diagram;
Fig. 2 is the utility model system circuit diagram;
Fig. 3 is the utility model host computer procedure process flow diagram;
Fig. 4 is the utility model slave computer Single Chip Microcomputer (SCM) program process flow diagram;
Fig. 5 is that the utility model is based on the temp measuring system interface of LabView.
Embodiment
Laser processing procedure temperature field measuring apparatus based on LabView mainly is comprised of software control part and temperature measuring equipment, and software control part is comprised of LabView program and Single Chip Microcomputer (SCM) program.Software section is developed simple to operate, friendly interface, open strong temperature real-time measurement system take C language technology, singlechip technology, virtual instrument technique, measuring technology etc. as the basis according to actual processing technology.
As shown in Figure 1, temperature measuring equipment comprises infrared temperature-test sensor, single-chip microcomputer, single-chip microcomputer power supply module, sensor power supply module, 22.1184MH crystal oscillator and reset circuit.Described infrared temperature-test sensor is connected with single-chip microcomputer by circuit, and single-chip microcomputer links to each other with host computer by the RS232 chip, and the 24V power supply adaptor is connected with sensor, and the 5V power supply adaptor links to each other with single-chip microcomputer.For example, laser processing device is set to laser process machine, and laser process machine generally is by CO 2The numerical control laser process machine that laser instrument and digital control system form.Infrared temperature-test sensor is fixed on by anchor clamps and carries out thermometric on the laser process machine main shaft.
The microcontroller power supply module comprises power supply adaptor, protection switch and the power light of a 5V.Power supply adaptor changes into the 220V alternating current D.C. regulated power supply of 5V through processes such as power transformer, rectification, filtering, voltage stabilizings, power to single-chip microcomputer.Sensor power supply module mainly comprises the power supply adaptor of a 24V, and the D.C. regulated power supply that obtains a 24V through above-mentioned conversion is equally powered to infrared sensor.Why adopt two power supplys, mainly be since A/D when conversion with the operating voltage of single-chip microcomputer as reference voltage, for avoiding single-chip microcomputer working power influence of fluctuations A/D transformation result, thereby affect the accuracy of data acquisition, therefore to single-chip microcomputer and sensor power supply the time, adopt respectively independently high-precision regulated power supply, guaranteed the accuracy of data acquisition.
Wherein, single-chip microcomputer power supply module adopts the TA-22GT2 type power supply adaptor of Co., Ltd among the LG, after connecting the 220V alternating current, the volt circuit that turns of power supply inside is passed through the 220V alternating current D.C. regulated power supply that the processes such as power transformer, rectification, filtering, voltage stabilizing change into 24V, then powers to single-chip microcomputer.
Infrared temperature-test sensor power supply module adopts the type HX2403-A(608 of Xiangtan City China prosperous electronics technology company limited) the type power supply adaptor.After connecting the 220V alternating current, the volt circuit that turns of power supply adaptor inside is passed through the 220V alternating current D.C. regulated power supply that the processes such as power transformer, rectification, filtering, voltage stabilizing change into 5V, then powers to infrared temperature-test sensor.
As shown in Figure 2, when power supply begins after single-chip microcomputer and sensor power supply, each several part is started working, temperature sensor begins the collecting temperature data, and with the temperature data that the gathers formal output with voltage, after the data computing of the A/D acquisition port of single-chip microcomputer with temperature sensor output, by the Max232 serial communication circuit, send to host computer with transforming good data.
As shown in Figure 3 and Figure 4, during temperature measurement system work, host computer is according to the program flow diagram work of Fig. 3, and slave computer is according to the process flow diagram operation of Fig. 4.After host computer is opened, system interface as shown in Figure 5.
To be applied to the temperature survey of matrix fixed point thermal source in the laser processing procedure among Fig. 1 based on the laser processing procedure temperature field measuring apparatus of LabView, the operation steps of the utility model temp measuring system is:
Figure 779963DEST_PATH_IMAGE001
Infrared temperature-test sensor is connected with single-chip microcomputer by circuit; single-chip microcomputer links to each other with host computer by the RS232 chip; the infrared temperature-test sensor power module is connected with infrared temperature-test sensor; the microcontroller power supply module is connected with single-chip microcomputer; press protection switch on the single-chip microcomputer; this moment, pilot lamp lighted, and showed that system is in running order.Then by anchor clamps infrared temperature-test sensor is fixed on the laser process machine worktable, and aims at matrix point.
Figure 916546DEST_PATH_IMAGE002
With temp measuring system of the present utility model access power supply, open host computer, the process flow diagram of host computer and slave computer as shown in Figures 2 and 3, the operation interface that occurs at the host computer screen is as shown in Figure 5.
Figure 585425DEST_PATH_IMAGE003
At operation interface parameters is set: please select to input selection string slogan COM3 in the serial ports, in the baud rate hurdle, input fixedly baud rate 115200, according to the needs input alarm temperature of rapidoprint, at path and the form G: TEMP.XSL of data outgoing route column input storage data.
Figure 516472DEST_PATH_IMAGE004
Left button is clicked temperature curve in the Graph Control module, selects curve display mode commonly used, generally selects broken line graph to use more.
The accuracy selection column is inputted three kinds of optional precision " 1 ", " 2 ", " 3 " as required in the parameter display module, as required input " 3 ", at this moment data precision " 0.01 " in the present embodiment.Select column input User Defined numerical value in the cycle, as the input cycle be 50, namely every 50ms receives a temperature data.Date and time column system can provide automatically, is consistent with the current host computer time.
Figure 945496DEST_PATH_IMAGE006
Above-mentioned parameter is clicked first start/stop button on system's operation interface after setting completed, clicks upper left corner operation button again, and temp measuring system is started working.The dynamic display module of temperature curve can show dynamic temperature curve, the demonstration Current Temperatures that can fluctuate of the scale in the dynamic temperature meter, and the real time temperature in the parameter display module can dynamically show current transient temperature.When temperature survey finished, left mouse button was clicked the start/stop button, and temp measuring system quits work.
If in the thermometric process, want to check the temperature logs details, can take full advantage of pantography and translation functions in the Graph Control module, zoom function has six kinds, translation functions can realize curve about, left and right sides translation.
Figure 833479DEST_PATH_IMAGE008
The output of data and picture and preservation.After temperature survey is complete, clicks right button at the dynamic display window of temperature curve and select to derive button---derive simplified image and the temperature measurement result curve can be saved to required file with the form of bitmap, use for analyzing.Measurement data is kept at step automatically simultaneously
Figure 12788DEST_PATH_IMAGE003
In in the set path, can in calculating, utilize Excel or Origin software to open further analysis and editor.
This device can be realized Real-time Collection, the dynamic monitoring of temperature data in the laser processing procedures such as laser remolten, laser melting coating, laser bonding, heat alert, temperature data storage and output, the display mode setting of different temperatures curve and the output of temperature curve picture, different temperatures precision setting, temperature curve dynamically show, the playback of data, check and edition function, require to select the sensor of different temperature-measuring ranges according to thermometric, can realize 0～2500 ℃ with interior temperature survey.The native system human-computer interaction interface is friendly, simple to operate, have stronger upgrading extended capability, can be widely used in mobile molten bath heat source temperature or the measurement of fixed point heat source temperature and monitoring field in the laser processing procedures such as laser remolten, laser melting coating, laser bonding, be the effective tool of temperature field evolution in the above-mentioned laser processing procedure of research.
The experimenter can clearly observe temperature variation in the laser processing procedure by display, being convenient to the staff reads, replace in the past pointwise thermometric, the mode of analyzing and processing again, give temperature field in laser melting coating, laser remolten and the laser beam welding obtain and analyzing and processing is brought great convenience.
In experiment is carried out or after the experiment, can both by communication module link to each other with PC to process just now repeatedly observe, fix a point to analyze, the operations such as analyzing and processing of temperature curve, can be better, faster, draw more accurately the temperature field result.

Claims (1)

1. laser processing procedure temperature field measuring apparatus based on LabView, comprise temperature measuring equipment, it is characterized in that: described temperature measuring equipment comprises infrared temperature-test sensor, single-chip microcomputer, single-chip microcomputer power supply module, sensor power supply module, 22.1184MH crystal oscillator and reset circuit; Described infrared temperature-test sensor is connected with single-chip microcomputer by circuit, single-chip microcomputer links to each other with host computer by the RS232 chip, sensor power supply module is connected with sensor, and single-chip microcomputer power supply module links to each other with single-chip microcomputer, and infrared temperature-test sensor is installed in laser processing device and is set up.
CN 201220447936 2012-09-04 2012-09-04 Temperature field measuring device in laser processing process based on LabView Expired - Fee Related CN202770534U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106493468A (en) * 2016-11-03 2017-03-15 中国工程物理研究院流体物理研究所 Integrated femtosecond laser micro/nano processing system and processing method based on LabVIEW
CN108627268A (en) * 2018-07-09 2018-10-09 安徽理工大学 Numerically-controlled machine tool temperature measurement system based on Labview
CN110702234A (en) * 2019-11-05 2020-01-17 广东电网有限责任公司 GIS infrared temperature measuring device and temperature compensation calibration method thereof
CN112229538A (en) * 2020-09-14 2021-01-15 中国科学院上海光学精密机械研究所 Device and method for measuring temperature of femtosecond laser processing material based on thermodynamics method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106493468A (en) * 2016-11-03 2017-03-15 中国工程物理研究院流体物理研究所 Integrated femtosecond laser micro/nano processing system and processing method based on LabVIEW
CN106493468B (en) * 2016-11-03 2018-01-16 中国工程物理研究院流体物理研究所 Integrated femtosecond laser micro/nano processing system and processing method based on LabVIEW
CN108627268A (en) * 2018-07-09 2018-10-09 安徽理工大学 Numerically-controlled machine tool temperature measurement system based on Labview
CN110702234A (en) * 2019-11-05 2020-01-17 广东电网有限责任公司 GIS infrared temperature measuring device and temperature compensation calibration method thereof
CN112229538A (en) * 2020-09-14 2021-01-15 中国科学院上海光学精密机械研究所 Device and method for measuring temperature of femtosecond laser processing material based on thermodynamics method
CN112229538B (en) * 2020-09-14 2022-12-02 中国科学院上海光学精密机械研究所 Device and method for measuring temperature of femtosecond laser processing material based on thermodynamics method

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