CN202649352U - Static electricity decay time tester - Google Patents

Static electricity decay time tester Download PDF

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Publication number
CN202649352U
CN202649352U CN 201220301593 CN201220301593U CN202649352U CN 202649352 U CN202649352 U CN 202649352U CN 201220301593 CN201220301593 CN 201220301593 CN 201220301593 U CN201220301593 U CN 201220301593U CN 202649352 U CN202649352 U CN 202649352U
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CN
China
Prior art keywords
static electricity
electrostatic
chip microcomputer
converter
voltage source
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201220301593
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Chinese (zh)
Inventor
罗健
钟智勇
顾小明
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CHENGDU YONGJIAN TECHNOLOGY CO LTD
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CHENGDU YONGJIAN TECHNOLOGY CO LTD
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Priority to CN 201220301593 priority Critical patent/CN202649352U/en
Application granted granted Critical
Publication of CN202649352U publication Critical patent/CN202649352U/en
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Expired - Fee Related legal-status Critical Current

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Abstract

The utility model discloses a static electricity decay time tester. The static electricity decay time tester consists of a single-chip microcomputer, a stabilized high-voltage source, a static electricity electrifying apparatus, a non-contact type static electricity potential sensor, a signal amplifying circuit, an A/D converter, a keyboard and a display. The static electricity electrifying apparatus comprises a charging method apparatus, a corona power spray apparatus and a friction method apparatus. The single-chip microcomputer is connected with the stabilized high-voltage source. The stabilized high-voltage source is connected with the static electricity electrifying apparatus, and supplies power to the charging method apparatus and the corona power spray apparatus. The non-contact type static electricity potential sensor is connected with the signal amplifying circuit. The signal amplifying circuit is connected with the A/D converter, and the A/D converter transmits digital signals to the single-chip microcomputer. The multifunctional static electricity decay time tester combines three methods - the corona power spray method, the charging method and the friction method- into a whole, facilitates the overall assessment of the static electricity performance of the to-be-tested sample, and can reasonably and truthfully reflect the static electricity decay characteristics of the to-be-tested-material.

Description

The electrostatic attenuation time testing instrument
Technical field
The utility model relates to a kind of tester, particularly a kind of electrostatic attenuation time testing instrument that can carry out to various materials electrostatic test under complex environment.
Background technology
The electrostatic attenuation time constant is to weigh the important physical amount of antistatic material performance, is very important to the measurement of electrostatic attenuation time constant for the control electrostatic hazard.Differentiate the influence degree of static in the production run, check electrostatic defending product, the electrostatic discharge simulation test of estimating the antistatic countermeasure effect and occuring to carry out after the static discharge harm all needs measurement of electrostatic and relevant parameters thereof.The electrostatic attenuation time measurement is by making someway tested sample charged after stablize the initial potential value, remove the electrostatic generator that acts on tested sample, then with tested sample ground connection, make it begin discharge, utilize simultaneously monitoring system to measure in real time the time dependent deamplification of tested sample surface electrostatic current potential, calculate electric charge and be reduced to the die-away time of setting the termination current potential, and estimate on this basis the antistatic performance of measured material.Existing electrostatic attenuation measurement of time method mainly is divided into corona spray electrical method, mise-a-la-masse method and rubbing manipulation 3 classes according to the difference of charged mode under measured material structure and the actual environment.At present, electrostatic charge die-away test instrument kind on the market is more various, but it is a kind of that the charged mode of tested sample is only had, and can only be used for estimating the antistatic property under a certain class formation material or a certain charged mode, and function is generally single.
The utility model content
The technical problems to be solved in the utility model provides a kind of Multifunctional static electricity tester die-away time that can measure simultaneously the material electrostatic attenuation time constant of three kinds of charged modes.
For solving the problems of the technologies described above, the utility model has adopted a kind of electrostatic attenuation time testing instrument, it is characterized in that: be comprised of single-chip microcomputer, stable high voltage source, electrostatic electrification device, contactless electrostatic potential sensor, signal amplification circuit, A/D converter, keyboard and display, described electrostatic electrification device comprises mise-a-la-masse method device, corona spray electric installation and rubbing manipulation device; Described single-chip microcomputer stable connection high-voltage power supply, the stable high voltage source is connected with the electrostatic electrification device, is mise-a-la-masse method device and the power supply of corona power distribution equipment; Contactless electrostatic potential sensor connects amplifying circuit, and described amplifying circuit connects A/D converter, and A/D converter is delivered to single-chip microcomputer with digital signal.
The beneficial effect that the utlity model has: three kinds of methods such as the dizzy spray of this Multifunctional static electricity tester die-away time current collection electrical method, mise-a-la-masse method, rubbing manipulation are integrated, be convenient to the antistatic property of thoroughly evaluating tested sample, can reflect more reasonable, more realistically the electrostatic attenuation characteristic of measured material.
Description of drawings
Fig. 1 is the utility model system architecture diagram.
Embodiment
This electrostatic attenuation time testing instrument, be comprised of single-chip microcomputer, stable high voltage source, electrostatic electrification device, contactless electrostatic potential sensor, signal amplification circuit, A/D converter, keyboard and display, the electrostatic electrification device comprises mise-a-la-masse method device, corona spray electric installation and rubbing manipulation device; Single-chip microcomputer stable connection high-voltage power supply, the stable high voltage source is connected with the electrostatic electrification device, is mise-a-la-masse method device and the power supply of corona power distribution equipment; Contactless electrostatic potential sensor connects amplifying circuit, and amplifying circuit connects A/D converter, and A/D converter is delivered to single-chip microcomputer with digital signal.
The charge decay time measurement is to make tested sample charged after stablize initial electrostatic voltage by mise-a-la-masse method, corona spray electrical method or rubbing manipulation, remove the electrostatic generator that acts on tested sample, then the rapid ground connection of tested sample is made it begin discharge, utilize simultaneously the monitoring system take single-chip microcomputer as core to measure in real time the time dependent deamplification of tested sample surface electrostatic current potential, calculate electric charge and be reduced to the die-away time of setting the termination current potential, and estimate on this basis the antistatic performance of measured material.
The Timer/Counter function that the measurement of charge decay time can utilize single-chip microcomputer to carry realizes, need only the instantaneous beginning timing that makes single-chip microcomputer begin to decay from initial voltage at measured material by programming, when decaying to the setting final voltage, stop immediately timing, just can obtain the electrostatic charge die-away time of measured material more accurately.Its gordian technique is accurately to measure in real time measured material electrostatic potential value, and changes into digital signal by the defeated people's passage of single-chip computer control system and deliver to the single-chip microcomputer terminal, the moment of the interrupt response of control Timer/Counter.The electrostatic attenuation time testing instrument can be measured the electrostatic attenuation time constant of measured material automatically, and this comprises half life period, discharge time constant and the time that decays to another magnitude of voltage from a certain setting voltage value.When using corona spray electrical method and mise-a-la-masse method to measure, all need-the adjustable stable high voltage direct supply of 7~7kV sprays electricity or charging to measured material, even but in fact be met the high-voltage power supply of condition, the electrostatic potential that measured material is obtained is all on the low side than actual value, such as in corona spray electrical method, measuring measured material decays to 1kV from 5kV time, utilize 5kV stable high voltage DC voltage to make material charged by the spray electric installation, when the material surface current potential no longer rises, its actual institute static electrification current potential only about 3.5kV, this will inevitably cause to survey the electrostatic attenuation time constant on the low side.Solution is that the higher high-voltage power supply of choose reasonable is charged to measured material, after the time, makes the measured material surface potential greater than desired initial electrostatic magnitude of voltage through long enough.When the band electric process finishes, utilize immediately and receive measure portion Real Time Monitoring material surface potential value, when reaching the initial electrostatic voltage conditions, open immediately the single-chip microcomputer clocking capability and continue potential decay state in the monitoring material static discharge process, so just can really realize measured material from initial voltage to the final voltage measurement function of die-away time.
Multifunction Electrostatic Charge Decay Test Apparatus is take the AT89C51 single-chip microcomputer as core component, and single-chip microcomputer is standard control high-voltage power supply, mise-a-la-masse method device and the power supply of corona power distribution equipment by the initial value of keyboard input.Tested sample is charged to certain potentials, presses the test key mapping and will control plant equipment and make high-voltage power supply close and make tested sample ground connection, starts simultaneously A/D converter.Then, utilize contactless electrostatic transducer directly to measure tested sample by 3 kinds of charged mode gained electrostatic potentials, with the electrostatic attenuation signal on the measured material amplify, the processing such as filtering, convert the digital signal that single-chip microcomputer can identify to through A/D and deliver to the single-chip microcomputer terminal.Single-chip microcomputer cooperate corresponding program will received signal and the parameter inputted of keyboard compare, allow steering logic unit judges and control closing of timer.At last, demonstrate the electrostatic attenuation time that records by light-emitting diode display, thereby realize the function of charge decay time tester.
3 kinds of methods such as the dizzy spray of this electrostatic attenuation time testing instrument current collection electrical method, mise-a-la-masse method, rubbing manipulation are integrated, and are convenient to the antistatic property of thoroughly evaluating tested sample, have overcome the deficiency of existing surveying instrument.This tester can be by the correlativity of the electrostatic attenuation time constant of the different tested sample of research under 3 kinds of charged modes, analyze theoretically the applicable object of every kind of method of testing, for electrostatic attenuation characteristic more reasonable, that reflect measured material more realistically provides technical basis.

Claims (1)

1. electrostatic attenuation time testing instrument, it is characterized in that: be comprised of single-chip microcomputer, stable high voltage source, electrostatic electrification device, contactless electrostatic potential sensor, signal amplification circuit, A/D converter, keyboard and display, described electrostatic electrification device comprises mise-a-la-masse method device, corona spray electric installation and rubbing manipulation device; Described single-chip microcomputer stable connection high-voltage power supply, the stable high voltage source is connected with the electrostatic electrification device, is mise-a-la-masse method device and the power supply of corona power distribution equipment; Contactless electrostatic potential sensor connects amplifying circuit, and described amplifying circuit connects A/D converter, and A/D converter is delivered to single-chip microcomputer with digital signal.
CN 201220301593 2012-06-27 2012-06-27 Static electricity decay time tester Expired - Fee Related CN202649352U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220301593 CN202649352U (en) 2012-06-27 2012-06-27 Static electricity decay time tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220301593 CN202649352U (en) 2012-06-27 2012-06-27 Static electricity decay time tester

Publications (1)

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CN202649352U true CN202649352U (en) 2013-01-02

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CN 201220301593 Expired - Fee Related CN202649352U (en) 2012-06-27 2012-06-27 Static electricity decay time tester

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106646047A (en) * 2016-12-22 2017-05-10 天津欣旭达科技有限公司 Novel static attenuation time tester
CN106855595A (en) * 2016-12-10 2017-06-16 成都赋阳技术开发有限公司 A kind of electrostatic attenuation time testing instrument for detecting Destaticizing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106855595A (en) * 2016-12-10 2017-06-16 成都赋阳技术开发有限公司 A kind of electrostatic attenuation time testing instrument for detecting Destaticizing device
CN106855595B (en) * 2016-12-10 2019-04-05 南京灵雀智能制造有限公司 It is a kind of for detecting the electrostatic attenuation time testing instrument of Destaticizing device
CN106646047A (en) * 2016-12-22 2017-05-10 天津欣旭达科技有限公司 Novel static attenuation time tester

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130102

Termination date: 20130627