CN202602619U - An optimizing device for short-period stability of an atomic clock - Google Patents
An optimizing device for short-period stability of an atomic clock Download PDFInfo
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- CN202602619U CN202602619U CN 201220125782 CN201220125782U CN202602619U CN 202602619 U CN202602619 U CN 202602619U CN 201220125782 CN201220125782 CN 201220125782 CN 201220125782 U CN201220125782 U CN 201220125782U CN 202602619 U CN202602619 U CN 202602619U
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Abstract
The utility model discloses an optimizing device for short-period stability of an atomic clock and belongs to atomic clock field. The device comprises a setting module, a modulation depth regulating module, a modulation frequency regulating module, a microwave power regulating module, and a computing module. The setting module sets multiple operating parameter points. The modulation depth regulating module regulates the modulation depth of a synthesizer of the atomic clock according to experimental points corresponding to the modulation depth in the operating parameter points. The modulation frequency regulating module regulates the modulation frequency of the synthesizer according to experimental points corresponding to the modulation frequency in the operating parameter points. The microwave power regulating module regulates the microwave power of a microwave signal inputted into a physical system according to experimental points corresponding to the microwave power in the operating parameter points. The computing module computes frequency discrimination slope of the atomic clock corresponding to the operating parameter points and selects an optimum operating parameter point according to the frequency discrimination slope. The optimizing device for short-period stability of an atomic clock increases short-period stability of atomic frequency standard.
Description
Technical field
The utility model relates to the atomic clock field, the short steady optimization means of particularly a kind of atomic clock.
Background technology
The parameter optimization of atomic clock comprises the long-term stability parameter optimization and the short-term stability parameter optimization of atomic clock.The short-term stability parameter optimization is to obtain the optimum working parameter point of all system parameterss that influence short-term stability through relevant optimization Test.Wherein, the system parameters that influences short-term stability mainly comprises modulation depth and modulating frequency.
The experiment of existing short-term stability parameter optimization is a system parameters to be measured with modulation depth and modulating frequency promptly, then system parameters to be measured is optimized one by one.For example, at first optimize modulating frequency: the value of fixed modulation depth, modulating frequency is regulated among a small circle, measure the stability of the output frequency signal of atomic clock, the modulating frequency value when selecting short-term stability the highest is as the optimum work value of modulating frequency; Optimize modulation depth then: the modulating frequency that will optimize is fixed on its optimum work value, and modulation depth is regulated among a small circle, measures the stability of the output frequency signal of atomic clock, obtains the optimum work value of modulation depth; At last with both combination of optimum work value as the optimum working parameter point of all system parameterss of aforementioned atomic clock short-term stability.
In the process that realizes the utility model, the inventor finds that there is following problem at least in prior art:
Change system parameters to be measured optimized order one by one,, can produce other optimum working parameter point like predetermined fixed modulating frequency rather than modulation depth.This is because the experiment of existing parameter optimization is a method of taking some system parameters of predetermined fixed, has ignored and has had interactive influence between each system parameters.Correspondingly, be used for the optimization means complex structure of existing parameter optimization experiment,, and then limited the further raising of the short-term stability of atomic clock so the optimum working parameter point that finally obtains is inaccurate.
The utility model content
In order to improve the short-term stability of atomic clock, the utility model embodiment provides a kind of atomic clock short steady optimization means.Said technical scheme is following:
The short steady optimization means of a kind of atomic clock, said device comprises:
Be used to be provided with the module of a plurality of running parameter points; Each said running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each said experimental point; The said experimental point quantity of corresponding a plurality of experimental points of each said parameter to be optimized and correspondence is identical; Be evenly distributed in the said parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprise the two-end-point of said span; Have only a said experimental point identical at most in per two said running parameter points, and the number of times that each said experimental point occurs in all said running parameter points equate; Said parameter to be optimized comprises modulation depth, modulating frequency and microwave power;
Be used for experimental point, the modulation depth adjustment module of the modulation depth of the synthesizer of adjusting atomic clock according to each said running parameter point corresponding modulating degree of depth;
Be used for experimental point, regulate the modulating frequency adjustment module of the modulating frequency of said synthesizer according to each said running parameter point corresponding modulating frequency;
Be used for experimental point, regulate the microwave power adjustment module of the microwave power of the microwave signal that inputs to physical system according to the corresponding microwave power of each said running parameter point; And
Be used to calculate the frequency discrimination slope of the corresponding atomic clock of each said running parameter point, and select the computing module of optimum working parameter point according to said frequency discrimination slope;
The said module that is provided with links to each other with said computing module with said modulation depth adjustment module, said modulating frequency adjustment module, said microwave power adjustment module respectively; Said modulation depth adjustment module links to each other with said synthesizer respectively with said modulating frequency adjustment module; The microwave of said microwave power adjustment module and said atomic clock doubly, mixing links to each other; Said computing module links to each other with servo circuit with the VCXO of said atomic clock respectively.
Wherein, said device also comprises the C field current adjustment module of the C field current that is used to change said atomic clock;
Said C field current adjustment module links to each other with the microwave cavity of said computing module and said atomic clock respectively.
Wherein, said computing module comprises:
Be used for regulating the regulon of the size of the voltage-controlled voltage that inputs to said atomic frequency standard VCXO;
After being used to gather the said VCXO of each adjusting, the quantum correction voltage signal of exporting behind the synchronous phase demodulation of the servo circuit of said atomic frequency standard, the collecting unit of acquisition correction voltage;
Be used for obtaining the frequency discrimination slope curve, and calculate the computing unit of the frequency discrimination slope of the corresponding said atomic frequency standard of each said running parameter point according to said frequency discrimination slope curve according to the output frequency and the said quantum correction voltage signal of said VCXO; And
The said frequency discrimination slope of all that are used for relatively calculating, the running parameter point that the frequency discrimination slope is maximum is as the comparing unit of the said optimum working parameter point corresponding with said atomic frequency standard short-term stability;
Said regulon links to each other with said computing unit with said VCXO respectively; Said collecting unit links to each other with said computing unit with said servo circuit respectively; Said computing unit links to each other with said comparing unit.
Wherein, said computing module comprises computer and microcontroller.
Wherein, said device also comprises, is used to show the display module of said frequency discrimination slope and said optimum working parameter point; Said display module links to each other with said computing module.
The beneficial effect that the technical scheme that the utility model embodiment provides is brought is: through module is set the running parameter point is set, and makes that the experimental point of corresponding parameter to be optimized is evenly distributed in the running parameter point in parameter range to be optimized; Modulation depth adjustment module, modulating frequency adjustment module and microwave power adjustment module are regulated modulation depth, modulating frequency and the microwave power of said atomic clock respectively according to each said running parameter point; Computing module calculates the frequency discrimination slope of the corresponding atomic clock of each running parameter point, and selects the optimum working parameter point according to the frequency discrimination slope; Simplified the steady optimization means of weak point that the traditional parameters optimization experiment adopts; Can solve in the short-term stability parameter optimization experiment of existing atomic clock and have interactive problem between the system parameters; The optimum working parameter point that the parameter optimization experiment is obtained through optimization means is more accurate, has improved the short-term stability of atomic clock; Further balance long-term stability, improved the stability of atomic clock complete machine.
Description of drawings
In order to be illustrated more clearly in the technical scheme among the utility model embodiment; The accompanying drawing of required use is done to introduce simply in will describing embodiment below; Obviously, the accompanying drawing in describing below only is some embodiment of the utility model, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the sketch map of the atomic clock that provides among the utility model embodiment;
Fig. 2 is the sketch map of the short steady optimization means of a kind of atomic clock that provides among the utility model embodiment;
Fig. 3 is the sketch map of the C field current adjustment module operation principle that provides among the utility model embodiment;
Fig. 4 is the sketch map that the running parameter point that provides among the utility model embodiment distributes;
Fig. 5 is the sketch map of the frequency discrimination slope curve that provides among the utility model embodiment;
Fig. 6 is the sketch map that concerns of the microwave power that provides among the utility model embodiment and difference on the frequency.
Embodiment
For the purpose, technical scheme and the advantage that make the utility model is clearer, will combine accompanying drawing that the utility model execution mode is done to describe in detail further below.
For ease of description, at first the structure of atomic clock is introduced below the said device of the utility model.Referring to Fig. 1, atomic clock generally comprises physical system 1 and electronic circuit.Physical system 1 comprises C field coil 1a and microwave cavity 1b etc.Electronic circuit mainly comprise isolated amplifier 2, microwave doubly, mixing 3, synthesizer 4, servo circuit 5 and VCXO 6.Based on this; Referring to Fig. 2; The utility model embodiment provides a kind of device of short-term stability parameter optimization of atomic clock, and this device specifically comprises: module 101, modulation depth adjustment module 102, modulating frequency adjustment module 103, microwave power adjustment module 104 and computing module 105 are set.
Wherein, module 101 being set links to each other with modulation depth adjustment module 102, modulating frequency adjustment module 103, microwave power adjustment module 104 and computing module 105 respectively; Modulation depth adjustment module 102 links to each other with synthesizer 4 respectively with modulating frequency adjustment module 103; The microwave of microwave power adjustment module 104 and atomic clock doubly, mixing 3 links to each other; Computing module 105 links to each other with servo circuit 5 with the VCXO 6 of atomic clock respectively.
Module 101 is set, is used to be provided with a plurality of running parameter points; Each running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each experimental point; The experimental point quantity of corresponding a plurality of experimental points of each parameter to be optimized and correspondence is identical; Be evenly distributed in the parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprise the two-end-point of span; Have only an experimental point identical at most in per two running parameter points, and the number of times that each experimental point occurs in all working parameter point equate; This parameter to be optimized comprises modulation depth, modulating frequency and microwave power.
Modulation depth adjustment module 102 is used for the experimental point according to each running parameter point corresponding modulating degree of depth, regulates the modulation depth of the synthesizer 4 of atomic clock.
Particularly, in synthesizer 4, preset f0, f1 in the register of DDS.Corresponding to rising edge, the trailing edge of the modulating frequency that inputs to DDS, DDS output f0, f1.Wherein, the difference of f0 and f1 is modulation depth.This is a prior art, no longer details.
Modulating frequency adjustment module 103 is used for the experimental point according to each running parameter point corresponding modulating frequency, regulates the modulating frequency of synthesizer 4.
Particularly, control and regulate the size that microprocessor in the synthesizer 4 exports the modulating frequency of DDS to.This is a prior art, no longer details.
Microwave power adjustment module 104 is used for the experimental point according to the corresponding microwave power of each running parameter point, regulates the microwave power of the microwave signal that inputs to physical system 1.
Particularly, control and regulate microwave doubly, mixing 3 inputs to the size of the microwave signal of physical system 1, the microwave power size of indirect regulation microwave signal.
Computing module 105 is used to calculate the frequency discrimination slope of the corresponding atomic clock of each running parameter point, and selects the optimum working parameter point according to the frequency discrimination slope.
Wherein, computing module 105 comprises:
Regulon, collecting unit, computing unit and comparing unit; Wherein, regulon links to each other with computing unit with VCXO 6 respectively; Collecting unit links to each other with computing unit with servo circuit 5 respectively; Computing unit links to each other with comparing unit.
Regulon, the size that is used for regulating the voltage-controlled voltage that inputs to atomic frequency standard VCXO 6.
Collecting unit, be used to gather each adjusting VCXO 6 after, the quantum exported behind the synchronous phase demodulation of the servo circuit of atomic frequency standard correction voltage signal obtains correction voltage.
Computing unit is used for obtaining the frequency discrimination slope curve according to the output frequency and the quantum correction voltage signal of VCXO 6, and calculates the frequency discrimination slope of the corresponding atomic frequency standard of each running parameter point according to the frequency discrimination slope curve.
Comparing unit, all frequency discrimination slopes that are used for relatively calculating, the running parameter point that the frequency discrimination slope is maximum is as the optimum working parameter point corresponding with the atomic frequency standard short-term stability.
Wherein, computing module 405 comprises computer and microcontroller.
Wherein, this device also comprises:
C field current adjustment module 106 is used to change the C field current of atomic clock.Wherein, C field current adjustment module 106 links to each other with computing module 105.
Particularly, referring to Fig. 3, C field coil 1a is wound on the cavity wall of whole microwave cavity 1b, and constitutes the loop with peripheral electrified wire 1c; C field current adjustment module 106 is controlled the size of current among the whole C field coil 1a through the size of current of control electrified wire 1c.
Correspondingly, microwave power adjustment module 104 also is used for, and after changing the C field current, regulates the microwave power of atomic clock.
Correspondingly; Computing module 105 also is used for; Keep in the optimum working parameter point all the other experimental points except that the corresponding experimental point of microwave power constant simultaneously; Measure the frequency-splitting of atomic clock output frequency and standard clock source, and confirm the optimum experimental point and the C field current of corresponding microwave power in the optimum working parameter point according to difference.
Wherein, this device also comprises:
Be used to show the display module 107 of frequency discrimination slope and optimum working parameter point; This display module 107 links to each other with computing module 105.
Wherein, following to the course of work and the principles illustrated of installing described in the utility model embodiment:
The first step: confirm parameter to be optimized and each parameter range to be optimized.
As shown in table 1, in the present embodiment, this parameter to be optimized comprises modulation depth, modulating frequency and microwave power.Wherein, the atomic clock short-term stability is mainly by the figure of merit Q and the signal to noise ratio decision of the coefficient spectral line of quantized system.On the one hand, under the situation that the optimum running parameter point of long-term stability is confirmed, the system parameters that influences figure of merit Q and signal to noise ratio mainly comprises modulation depth and modulating frequency.On the other hand, because the restriction of the Physical Mechanism of quantized system for making the short-term stability of finally obtaining more accurate, in an embodiment, is also considered the influence of microwave power to short-term stability.
Wherein, present embodiment is respectively modulation depth, modulating frequency and microwave power and confirms a span.The span of modulation depth is 250Hz～450Hz, and the span of modulating frequency is 79Hz～99Hz, the span of microwave power is-and 40dBm～-30dBm.Confirm a span for each parameter to be optimized, purpose is in order to reduce experiment number.Because in practical operation, comprehensively test is the comparison difficulty.
Wherein, the value of modulation depth should be less than the live width of atom in the physical system.And for than narrow linewidth, span is 100Hz-500Hz.Be convenient even value, present embodiment has been chosen the span of 250Hz～450Hz as modulation depth.The value of modulating frequency should be avoided the integral multiple of civil power 50Hz, and present embodiment has been chosen the span of 79Hz～99Hz as modulating frequency.The span of microwave power will be considered the influence of noise saturated broadening when, in the present embodiment span of microwave power be-40dBm～-30dBm.For convenient explanation, hereinafter represent modulation depth, modulating frequency and microwave power with A, B and C respectively.
Table 1
| Parameter to be optimized | Span |
| A (modulation depth) | 250Hz～450Hz |
| B (modulating frequency) | 79Hz～99Hz |
| C (microwave power) | -40dBm～-30dBm |
Second step: the experimental point of in each parameter range to be optimized, choosing each parameter to be optimized.
Wherein, The corresponding experimental point quantity of the corresponding a plurality of experimental points of each parameter to be optimized and each parameter to be optimized is identical, is evenly distributed in the parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprises the two-end-point of this span.
This mode of choosing experimental point can guarantee that the experimental point of the correspondence of each parameter to be optimized is evenly distributed in the span of himself, improve the accuracy of experimental measurements.
Table 2
| Parameter to be optimized | Experimental point | Difference |
| A | 250Hz、350Hz、450Hz | 100Hz |
| B | 79Hz、89Hz、99Hz | 10Hz |
| C | -40dBm、-35dBm、-30dBm | 5dBm |
In the present embodiment, as shown in table 2, the experimental point that modulation depth, modulating frequency and microwave power are corresponding respectively is 3; According to the size of experimental point, A comprises A1, A2, A3; B comprises B1, B2, B3; C comprises C1, C2, C3.The experimental point that modulation depth, modulating frequency and microwave power are corresponding has included the end points of self span and evenly respectively in self span.Difference between the adjacent experimental point of modulation depth is 100Hz, and the difference between the adjacent experimental point of modulating frequency is adjacent is 10Hz, and the difference between the adjacent experimental point of microwave power is 5dBm.
The 3rd step: through module 101 is provided with atomic clock according to experimental point running parameter point is set.
Wherein, each running parameter point comprises parameters to be optimized corresponding different between a plurality of experimental points and each experimental point, has only an experimental point identical at most in per two running parameter points, and the number of times that each experimental point occurs in all working parameter point equates.
This set mode can guarantee that all running parameter points are evenly distributed, and further improve the accuracy of experimental measurements in all parameter range to be optimized.
Present embodiment is provided with 9 running parameter points by the mode of aforementioned setting according to experimental point, and is specifically as shown in table 3,
Table 3
| The running parameter period | A (modulation depth) | B (modulating frequency) | C (microwave power) |
| ① | 250Hz | 79Hz | - |
| ② | 250Hz | 89Hz | - |
| ③ | 250Hz | 99Hz | - |
| ④ | 350Hz | 79Hz | - |
| ⑤ | 350Hz | 89Hz | - |
| ⑥ | 350Hz | 99Hz | - |
| ⑦ | 450Hz | 79Hz | - |
| ⑧ | 450Hz | 89Hz | - |
| ⑨ | 450Hz | 99Hz | -35dBm |
As can beappreciated from fig. 4,9 running parameter points are evenly distributed in the span of modulation depth, modulating frequency and microwave power in the table 3.
The 4th step: modulation depth, modulating frequency and the microwave power of regulating atomic clock through modulation depth adjustment module 102, modulating frequency adjustment module 103 and microwave power adjustment module 104 respectively according to each running parameter point.
Particularly, at first, in table 3, select a running parameter point to be measured; Secondly, the value of the system parameters of atomic clock that will be corresponding with each experimental point in this running parameter point is adjusted to the value of corresponding experimental point.For example, selected running parameter point 1., so, according to running parameter point 1., the modulation depth with atomic clock is adjusted to 250Hz respectively, modulating frequency is adjusted to 79Hz and microwave power is adjusted to-40dBm.
The 5th step: through the frequency discrimination slope of the corresponding atomic clock of computing module 105 each running parameter point of calculating, and according to frequency discrimination slope selection optimum working parameter point; And through display module 107 demonstrations frequency discrimination slope that calculates and the optimum working parameter point of selecting.
Wherein, behind running parameter point completion adjusting modulation depth, modulating frequency and the microwave power selected, operation atomic clock complete machine, calculating and record be the frequency discrimination slope of the atomic clock of the running parameter point correspondence of selection once.Specifically comprise:
A, adjusting input to the size of the voltage-controlled voltage of VCXO in the atomic frequency standard.
Particularly;, this step made the voltage-controlled slope curve of voltage-controlled voltage and VCXO 6 output frequencies before beginning; And think in quantized system live width scope and to change voltage-controlled voltage; The frequency output of VCXO 6 is linear, so can obtain the output frequency of corresponding VCXO 6 directly according to concrete voltage-controlled magnitude of voltage.Wherein, the size of voltage-controlled voltage depends on the output frequency of VCXO 6, and this output frequency should be near atom 0-0 transition centre frequency.
Behind b, the each adjusting of the collection VCXO, the quantum correction voltage signal of exporting behind the synchronous phase demodulation of the servo circuit of atomic frequency standard obtains the voltage of rectifying a deviation.
Particularly; The output frequency signal of VCXO 6 through isolated amplifier 2 deliver to synthesizer 4 in the atomic clock, microwave doubly, the preparation of accomplishing the 6.8346875MHz frequency signal of mixing 3 links acts on physical system 1; Quantum frequency discrimination effect through physical system 1; After obtaining light inspection signal and delivering in the servo circuit 5 pre-amplifier and accomplish signal and amplify, deliver in the servo circuit 5 lock again and amplify mutually and accomplish output quantum correction voltage signal behind the synchronous phase demodulation.This is a prior art, no longer details.
What be worth explanation is, the voltage-controlled voltage that writes down among quantum correction voltage signal and a becomes relation one to one, that is, the quantum voltage signal of rectifying a deviation becomes with the output frequency of VCXO 6 one to one to concern.
C, obtain the frequency discrimination slope curve, and calculate the frequency discrimination slope of the atomic frequency standard of each running parameter point correspondence according to the frequency discrimination slope curve according to the output frequency of VCXO and quantum correction voltage signal.
Particularly, be the X axle with the output frequency of the VCXO 6 that obtains, be the Y axle with quantum correction voltage signal, draw the frequency discrimination slope curve according to the output frequency and the one-to-one relationship of correction voltage signal.Referring to Fig. 5, in the frequency discrimination slope curve that present embodiment obtains, the X value that trough is corresponding representes that with f1 the X value that crest is corresponding is represented with f2.The Y value corresponding with f1 used V
LExpression, the Y value corresponding with f2 used V
HExpression.The method of calculating the frequency discrimination slope is specially, at V
L-V
HIn the scope; Select one through the determination methods of software and approach 0 point most; Write down the value of its X axle simultaneously, this position is decided to be initial point (0,0), respectively get identical point (for example getting 20 points) to the left and right limit of X axle respectively according to this; These 41 point data are carried out curve fitting, draw corresponding slope value and count the frequency discrimination slope.This is a prior art, no longer details.
D, all frequency discrimination slopes that relatively calculate, the running parameter point that the frequency discrimination slope is maximum is as the optimum working parameter point corresponding with the atomic frequency standard short-term stability.
Referring to table 4, accomplished the measurement of all working parameter point among the utility model embodiment after, calculate all frequency discrimination slopes.
Table 4
| The running parameter period | A (modulation depth) | B (modulating frequency) | C (microwave power) | The |
| ① | 250Hz | 79Hz | -40dBm | 2.575V/ |
| ② | 250Hz | 89Hz | -35dBm | 2.856V/ |
| ③ | 250Hz | 99Hz | -30dBm | 1.982V/ |
| ④ | 350Hz | 79Hz | -35dBm | 3.278V/Hz |
| ⑤ | 350Hz | 89Hz | -30dBm | 2.478V/ |
| ⑥ | 350Hz | 99Hz | -40dBm | 2.178V/ |
| ⑦ | 450Hz | 79Hz | -30dBm | 3.078V/ |
| ⑧ | 450Hz | 89Hz | -40dBm | 1.778V/ |
| ⑨ | 450Hz | 99Hz | -35dBm | 1.845V/Hz |
In the present embodiment, used the short-term stability of frequency discrimination slope reflection atomic clock complete machine.4. result of experiment has selected the maximum running parameter point of frequency discrimination slope, and promptly modulation depth is chosen in 350Hz, and modulating frequency is chosen in 79Hz, and microwave power is chosen in-35dBm.
What be worth explanation is, has regulated a running parameter point to be measured after, with the frequency discrimination slope of this running parameter point correspondence to be measured of calculating; Continue to regulate other running parameter point to be measured then, and calculate corresponding frequency discrimination slope.
The 6th step: the optimum working parameter point that obtains through C field current adjustment module 106, microwave power adjustment module 104 and 105 pairs of computing modules is optimized.
Particularly; Change the C field current of atomic clock earlier through C field current adjustment module 106; Further regulate the microwave power of atomic clock again through microwave power adjustment module 104; Keep simultaneously in the optimum working parameter point except that all the other experimental points of the corresponding experimental point of microwave power constant, through the frequency-splitting of computing module 105 measurement atomic clock output frequencies and standard clock source, and confirm the optimum experimental point and the C field current of corresponding microwave power in the optimum working parameter point according to this difference.
Wherein, the excursion of C field current is 1mA-2.5mA; The adjustable range of microwave power be microwave power corresponding in the optimum working parameter point of atomic clock long-term stability with the optimum working parameter point of short-term stability between the corresponding microwave power.
Wherein, use C
ShortThe microwave power optimum value of correspondence in the optimum working parameter point of selecting in the expression 202; Use C
LongCorresponding microwave power optimum value in the optimum working parameter point that obtains in the expression long-term stability.In order to solve the problem of the different microwave optimum value that obtains in the long and short steady parameter optimization experiment, present embodiment carries out balance through the size that changes the C field current.Particularly, change a C field current earlier, change fixing this C field current in back, (scope is C to regulate microwave power again
Long～C
ShortBetween), the difference frequency value of measuring the output of atomic clock complete machine frequency signal changes; And change the C field current one time, and again microwave power to be regulated after fixing, the difference frequency value of measuring the output of atomic clock complete machine frequency signal changes; And the like, seek the flex point of microwave power to difference on the frequency.
What be worth explanation is that the change amount of C field current is 0.5mA; The regulated quantity of microwave power is-0.5dBm.
In the present embodiment, microwave power optimum value corresponding in the optimum working parameter point that obtains in the short-term stability is-35dBm.Microwave power optimum value corresponding in the optimum working parameter point of supposing to obtain in the long-term stability is-40dBm.Referring to Fig. 6, microwave power is-and during 38dBm, tangible flex point has appearred in difference on the frequency, and C field current at this moment is 1.5mA.Therefore, the optimum experimental point of corresponding microwave power is-38dBm in the optimum working parameter point, and the C field current is 1.5mA.
The beneficial effect that the technical scheme that the utility model embodiment provides is brought is: through module is set the running parameter point is set, and makes that the experimental point of corresponding parameter to be optimized is evenly distributed in the running parameter point in parameter range to be optimized; Modulation depth adjustment module, modulating frequency adjustment module and microwave power adjustment module are regulated modulation depth, modulating frequency and the microwave power of atomic clock respectively according to each running parameter point; Computing module calculates the frequency discrimination slope of the corresponding atomic clock of each running parameter point, and selects the optimum working parameter point according to the frequency discrimination slope; Simplified the steady optimization means of weak point that the traditional parameters optimization experiment adopts; Can solve in the short-term stability parameter optimization experiment of existing atomic clock and have interactive problem between the system parameters; The optimum working parameter point that the parameter optimization experiment is obtained through optimization means is more accurate, has improved the short-term stability of atomic clock; Further balance long-term stability, improved the stability of atomic clock complete machine.
The all or part of step that one of ordinary skill in the art will appreciate that realization the foregoing description can be accomplished through hardware; Also can instruct relevant hardware to accomplish through program; Described program can be stored in a kind of computer-readable recording medium; The above-mentioned storage medium of mentioning can be a read-only memory, disk or CD etc.
The above is merely the preferred embodiment of the utility model, and is in order to restriction the utility model, not all within the spirit and principle of the utility model, any modification of being done, is equal to replacement, improvement etc., all should be included within the protection range of the utility model.
Claims (5)
1. an atomic clock is lacked steady optimization means, it is characterized in that said device comprises:
Be used to be provided with the module of a plurality of running parameter points; Each said running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each said experimental point; The said experimental point quantity of corresponding a plurality of experimental points of each said parameter to be optimized and correspondence is identical; Be evenly distributed in the said parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprise the two-end-point of said span; Have only a said experimental point identical at most in per two said running parameter points, and the number of times that each said experimental point occurs in all said running parameter points equate; Said parameter to be optimized comprises modulation depth, modulating frequency and microwave power;
Be used for experimental point, the modulation depth adjustment module of the modulation depth of the synthesizer of adjusting atomic clock according to each said running parameter point corresponding modulating degree of depth;
Be used for experimental point, regulate the modulating frequency adjustment module of the modulating frequency of said synthesizer according to each said running parameter point corresponding modulating frequency;
Be used for experimental point, regulate the microwave power adjustment module of the microwave power of the microwave signal that inputs to physical system according to the corresponding microwave power of each said running parameter point; And
Be used to calculate the frequency discrimination slope of the corresponding atomic clock of each said running parameter point, and select the computing module of optimum working parameter point according to said frequency discrimination slope;
The said module that is provided with links to each other with said computing module with said modulation depth adjustment module, said modulating frequency adjustment module, said microwave power adjustment module respectively; Said modulation depth adjustment module links to each other with said synthesizer respectively with said modulating frequency adjustment module; The microwave of said microwave power adjustment module and said atomic clock doubly, mixing links to each other; Said computing module links to each other with servo circuit with the VCXO of said atomic clock respectively.
2. device according to claim 1 is characterized in that, said device also comprises the C field current adjustment module of the C field current that is used to change said atomic clock;
Said C field current adjustment module links to each other with said computing module.
3. device according to claim 1 is characterized in that, said computing module comprises:
Be used for regulating the regulon of the size of the voltage-controlled voltage that inputs to said atomic frequency standard VCXO;
After being used to gather the said VCXO of each adjusting, the quantum correction voltage signal of exporting behind the synchronous phase demodulation of the servo circuit of said atomic frequency standard, the collecting unit of acquisition correction voltage;
Be used for obtaining the frequency discrimination slope curve, and calculate the computing unit of the frequency discrimination slope of the corresponding said atomic frequency standard of each said running parameter point according to said frequency discrimination slope curve according to the output frequency and the said quantum correction voltage signal of said VCXO; And
The said frequency discrimination slope of all that are used for relatively calculating, the running parameter point that the frequency discrimination slope is maximum is as the comparing unit of the said optimum working parameter point corresponding with said atomic frequency standard short-term stability;
Said regulon links to each other with said computing unit with said VCXO respectively; Said collecting unit links to each other with said computing unit with said servo circuit respectively; Said computing unit links to each other with said comparing unit.
4. device according to claim 1 is characterized in that said computing module comprises computer and microcontroller.
5. device according to claim 1 is characterized in that, said device also comprises,
Be used to show the display module of said frequency discrimination slope and said optimum working parameter point; Said display module links to each other with said computing module.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102624387A (en) * | 2012-03-29 | 2012-08-01 | 江汉大学 | Method and device for optimizing short-term stability parameters of atomic frequency standard |
| CN103067004A (en) * | 2012-12-17 | 2013-04-24 | 江汉大学 | Double-bulb type atomic clock |
| CN103138755A (en) * | 2013-01-22 | 2013-06-05 | 江汉大学 | Output frequency reproduction device and method of atomic clock |
| CN105811972A (en) * | 2016-03-11 | 2016-07-27 | 清华大学 | Pulse-type coherent population atomic clock magnetic field servo system |
| CN107272394A (en) * | 2017-06-16 | 2017-10-20 | 江汉大学 | A kind of integrated resonant time dissemination system calibration method of backup formula |
| CN111313895A (en) * | 2020-03-30 | 2020-06-19 | 中国电子科技集团公司第五十四研究所 | System multi-reference-source multi-clock accurate time-frequency synthesis method |
-
2012
- 2012-03-29 CN CN 201220125782 patent/CN202602619U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102624387A (en) * | 2012-03-29 | 2012-08-01 | 江汉大学 | Method and device for optimizing short-term stability parameters of atomic frequency standard |
| CN103067004A (en) * | 2012-12-17 | 2013-04-24 | 江汉大学 | Double-bulb type atomic clock |
| CN103067004B (en) * | 2012-12-17 | 2016-03-30 | 江汉大学 | Two bubble atomic clock |
| CN103138755A (en) * | 2013-01-22 | 2013-06-05 | 江汉大学 | Output frequency reproduction device and method of atomic clock |
| CN103138755B (en) * | 2013-01-22 | 2016-02-17 | 江汉大学 | A kind of device and method reappearing the output frequency of atomic clock |
| CN105811972A (en) * | 2016-03-11 | 2016-07-27 | 清华大学 | Pulse-type coherent population atomic clock magnetic field servo system |
| CN105811972B (en) * | 2016-03-11 | 2019-02-22 | 清华大学 | A kind of pulsed coherent layout Trapping of Atoms clock magnetic field servo-system |
| CN107272394A (en) * | 2017-06-16 | 2017-10-20 | 江汉大学 | A kind of integrated resonant time dissemination system calibration method of backup formula |
| CN111313895A (en) * | 2020-03-30 | 2020-06-19 | 中国电子科技集团公司第五十四研究所 | System multi-reference-source multi-clock accurate time-frequency synthesis method |
| CN111313895B (en) * | 2020-03-30 | 2023-03-28 | 中国电子科技集团公司第五十四研究所 | System multi-reference-source multi-clock accurate time-frequency synthesis method |
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