CN202563269U - Atomic clock long-term stability optimization apparatus - Google Patents

Abstract

The utility model discloses an atomic clock long-term stability optimization apparatus which comprises a setting module for setting a plurality of working parameter points; a lamp temperature regulation module for regulating temperature of a spectrum lamp in a physical system of an atomic clock according to experimental points of each working parameter point corresponding to the lamp temperature; a cavity temperature regulation module for regulating temperature of a microwave cavity in the physical system of the atomic clock according to the experimental points of each working parameter point corresponding to the cavity temperature; a C field current regulation module for regulating current magnitude of a C field coil in the physical system according to the experimental points of each working parameter point corresponding to C field current; and a measurement module for measuring a frequency difference between atomic clock output frequencies corresponding to each working parameter point and that of a standard clock source and selecting an optimal working parameter point according to the frequency difference. The apparatus can be used to raise long-term stability for atomic clocks.

Description

Atomic clock long-term stability optimization device

technical field

The utility model relates to the field of atomic clocks, in particular to an atomic clock long-term stability optimization device.

Background technique

The long-term stability of atomic clock is an important index to measure the performance of atomic clock, which is mainly affected by the long-term drift characteristics of atomic clock. Since there is currently no physical model to explain the reasons for the long-term drift, when measuring and improving the long-term stability of atomic clocks, a large number of parameter optimization experiments must be designed to select the best operating parameter points for the long-term stability of atomic clocks.

Among them, there are many system parameters that affect the long-term stability, including lamp temperature, cavity temperature, microwave power, etc., so it is basically impossible to select all relevant parameters for a comprehensive parameter optimization experiment in actual operation. Traditional parameter optimization experiments usually use optimization devices to optimize system parameters one by one. First, optimize the first system parameter: fix the values of other system parameters, adjust the first system parameter, measure the stability of the frequency signal output of the atomic clock, and select the value with the highest stability as the first system parameter then optimize the second system parameter: fix the optimized system parameter at its optimal value, and fix the values of the remaining unoptimized system parameters to obtain the optimal value of the second system parameter; repeat The aforementioned steps until the optimal values of all system parameters are obtained, the combination of the optimal values of all system parameters is the optimal working parameter point of the aforementioned atomic clock. Specifically, taking the lamp temperature and cavity temperature as examples, firstly, the cavity temperature is fixed, and the lamp temperature is adjusted to obtain the optimal value of the lamp temperature; then, the lamp temperature is fixed at the optimal parameter point, and the cavity temperature is adjusted to obtain The optimal value of the chamber temperature; finally, the combination of the lamp temperature and the optimal value of the chamber temperature is taken as the optimal operating parameter point of the atomic clock.

In the process of realizing the utility model, the inventor finds that the prior art has at least the following problems:

Changing the order of optimization of the aforementioned system parameters, such as pre-fixing the lamp temperature instead of the cavity temperature, will produce another optimal operating parameter point. This is because the traditional parameter optimization experiment adopts the method of pre-fixing some system parameters, ignoring the influence of interaction between system parameters. Correspondingly, the optimization device used in traditional parameter optimization experiments has a complicated structure, which leads to inaccurate optimal working parameter points, which limits the further improvement of the long-term stability of atomic clocks.

Utility model content

In order to improve the long-term stability of the atomic clock, the embodiment of the utility model provides an atomic clock long-term stability optimization device. Described technical scheme is as follows:

An atomic clock long-term stability optimization device is characterized in that the device comprises:

A setting module for setting a plurality of working parameter points; each said working parameter point includes a plurality of experimental points and each experimental point corresponds to a different parameter to be optimized, and each said parameter to be optimized corresponds to a plurality of experimental points and corresponds to The number of experimental points is the same, and the experimental points corresponding to the same parameter to be optimized are uniformly distributed within the value range of the parameter to be optimized and include the two ends of the value range, and every two operating parameter points Only one experimental point is the same at most, and the number of occurrences of each of the experimental points in all the operating parameter points is equal; the parameters to be optimized include lamp temperature, chamber temperature and C field current;

A lamp temperature adjustment module for adjusting the temperature of the spectral lamp in the physical system of the atomic clock according to the experimental point corresponding to the lamp temperature in each of the working parameter points;

A cavity temperature adjustment module for adjusting the temperature of the microwave cavity in the physical system according to the experimental point corresponding to the cavity temperature in each of the working parameter points;

A C-field current adjustment module for adjusting the magnitude of the energizing current of the C-field coil in the physical system according to the experimental point corresponding to the C-field current in each of the working parameter points; and

A measurement module for measuring the frequency difference between the output frequency of the atomic clock corresponding to each of the operating parameter points and the standard clock source, and selecting the best operating parameter point according to the frequency difference;

The setting module is respectively connected with the lamp temperature adjustment module, the cavity temperature adjustment module, the C field current adjustment module and the measurement module; the lamp temperature adjustment module is connected with the spectrum lamp; the cavity The temperature regulation module is connected with the microwave cavity; the C-field current regulation module is connected with the C-field coil; the measurement module is connected with the isolation amplifier of the atomic clock.

Wherein, the lamp temperature adjustment module is also used for,

Fine-tuning the experimental point corresponding to the lamp temperature in the optimal working parameter point;

Correspondingly, the measurement module is also used for,

Measure the frequency difference between the output frequency of the atomic clock and the standard clock source after fine-tuning, and determine the optimal experimental point corresponding to the lamp temperature in the optimal working parameter point according to the frequency difference.

Wherein, the lamp temperature adjustment module specifically includes:

a first heating unit for heating the spectral lamp of the atomic clock;

a first bridge unit for measuring the temperature of the spectrum lamp and converting the measured temperature into a voltage value;

a first differential amplification unit for differentially amplifying the voltage value output by the bridge unit;

A first analog-to-digital conversion unit for collecting the voltage value output by the differential amplification unit and converting it into a digital signal; and

A first processing unit for controlling whether the heating unit works according to the digital signal converted by the analog-to-digital conversion unit;

The first heating unit is connected to the first processing unit; the first bridge unit is respectively connected to the first differential amplification unit and the first processing unit; the first differential amplification unit is connected to the first differential amplification unit The first analog-to-digital conversion unit is connected; the first analog-to-digital conversion unit is connected to the first processing unit.

Wherein, the chamber temperature adjustment module specifically includes:

a second heating unit for heating the microwave cavity of the atomic clock;

a second bridge unit for measuring the temperature of the microwave cavity and converting the measured temperature into a voltage value;

a second differential amplification unit for differentially amplifying the voltage value output by the bridge unit;

a second analog-to-digital conversion unit for collecting the voltage value output by the differential amplification unit and converting it into a digital signal; and

A second processing unit for controlling whether the heating unit works according to the digital signal converted by the analog-to-digital conversion unit;

The second heating unit is connected to the second processing unit; the second bridge unit is connected to the second differential amplification unit and the second processing unit respectively; the second differential amplification unit is connected to the second differential amplification unit The second analog-to-digital conversion unit is connected; the second analog-to-digital conversion unit is connected to the second processing unit.

Wherein, the first bridge unit or the second bridge unit specifically includes:

Thermistor, first constant temperature resistor, digital potentiometer, second constant temperature resistor, and DC voltage reference;

Wherein, the first end of the thermistor is connected to the second end of the first constant temperature resistor, the first end of the first constant temperature resistor is connected to the second end of the digital potentiometer, and the digital potentiometer The first end is connected to the second end of the second constant temperature resistor, the first end of the second constant temperature resistor is connected to the second end of the thermistor, and the DC voltage reference is located between the thermistor and the thermistor. Between the connection point of the second constant temperature resistor, the connection point of the first constant temperature resistor and the digital potentiometer.

Further, the first processing unit or the second processing unit is a single-chip microcomputer.

The beneficial effect brought by the technical solution provided by the embodiment of the utility model is: the working parameter points are set through the setting module, and the experimental points of the parameters to be optimized corresponding to the working parameter points are evenly distributed within the value range of the parameters to be optimized; The lamp temperature adjustment module, cavity temperature adjustment module and C field current adjustment module respectively adjust the lamp temperature, chamber temperature and C field current of the atomic clock according to each operating parameter point; the measurement module measures the output frequency of the atomic clock corresponding to each operating parameter point and the standard clock source frequency difference, and select the best working parameter point according to the frequency difference; the optimization device used in the traditional parameter optimization experiment is simplified, and the problem of interaction between system parameters in the existing parameter optimization experiment can be solved, so that the parameter optimization experiment can pass The optimal working parameter point obtained by optimizing the device is more accurate, which improves the long-term stability of the atomic clock.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings that need to be used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some implementations of the present invention. For example, those of ordinary skill in the art can also obtain other drawings based on these drawings on the premise of not paying creative efforts.

Fig. 1 is a schematic diagram of an atomic clock long-term stability optimization device provided in an embodiment of the present invention;

Fig. 2 is the schematic diagram of the first electric bridge unit provided in the utility model embodiment;

Fig. 3 is the working diagram of the C field current regulation module provided in the utility model embodiment;

Fig. 4 is a schematic diagram of the point distribution of working parameters provided in the embodiment of the present invention;

Fig. 5 is a test curve diagram of lamp temperature and frequency difference provided in the embodiment of the present invention.

Detailed ways

In order to make the purpose, technical solutions and advantages of the present utility model clearer, the implementation of the present utility model will be further described in detail below in conjunction with the accompanying drawings.

In order to facilitate the description of the device described in the embodiment of the present invention, the structure of the atomic clock is first introduced below. An atomic clock generally includes a physical system 1 and electronic circuits. The physical system 1 mainly includes a spectral lamp 1a, a microwave cavity 1b, a C-field coil 1c, and an integrated filter bubble 1d. The electronic circuit mainly includes an isolation amplifier 2, a microwave multiplier, a frequency mixer 3, a synthesizer 4, a servo circuit 5 and a voltage-controlled crystal oscillator 6.

Based on this, referring to Fig. 1, an embodiment of the present invention provides an atomic clock long-term stability optimization device, which specifically includes a setting module 101, a lamp temperature adjustment module 102, a cavity temperature adjustment module 103, a C field current adjustment module 104 and a measurement Module 105; wherein, the setting module 101 is connected to the lamp temperature adjustment module 102, the cavity temperature adjustment module 103, the C field current adjustment module 104 and the measurement module 105; the lamp temperature adjustment module 102 is connected to the spectrum lamp 1a; the cavity temperature adjustment module 103 It is connected to the microwave cavity 1b; the C-field current adjustment module 104 is connected to the C-field coil 1c; the measurement module 105 is connected to the isolation amplifier 2 of the atomic clock.

The setting module 101 is used to set a plurality of operating parameter points; each operating parameter point includes a plurality of experimental points and each experimental point corresponds to a different parameter to be optimized, and each parameter to be optimized corresponds to a plurality of experimental points and the corresponding experimental point The number is the same, the experimental points corresponding to the same parameter to be optimized are evenly distributed in the value range of the parameter to be optimized and include the two ends of the value range, and only one experimental point is the same in every two working parameter points, and each The number of experimental points appearing in all working parameter points is equal; the parameters to be optimized include lamp temperature, chamber temperature and C field current.

The lamp temperature adjustment module 102 is used to adjust the temperature of the spectrum lamp 1a in the physical system 1 of the atomic clock according to the experimental point corresponding to the lamp temperature in each working parameter point.

Wherein, referring to FIG. 2, the lamp temperature adjustment module 102 specifically includes:

The first heating unit 1021 is connected with the first processing unit 1025 and used for heating the spectrum lamp 1a of the atomic clock.

Specifically, the first heating unit 1021 is a heating wire 1e arranged on the periphery of the spectrum lamp 1a.

The first bridge unit 1022 is connected to the first differential amplification unit 1023 and the first processing unit 1025 respectively, and is used to measure the temperature of the spectrum lamp 1a and convert the measured temperature into a voltage value.

Specifically, the first bridge unit 1022 presets and measures the actual temperature of the spectral lamp 1a according to the instruction of the first processing unit 1025, and generates a voltage difference according to the difference between the preset temperature and the actual temperature.

The first differential amplification unit 1023 is connected to the first bridge unit 1022 and the first analog-to-digital conversion unit 1021 respectively, and is used for differentially amplifying the voltage value output by the first bridge unit 1022 .

The first analog-to-digital conversion unit 1024 is connected to the first differential amplification unit 1023 and the first processing unit 1025 respectively, and is used to collect the voltage value output by the first differential amplification unit 1023 and convert it into a digital signal.

The first processing unit 1025 is configured to control whether the first heating unit 1021 works according to the digital signal converted by the first analog-to-digital conversion unit 1024 .

Specifically, the first processing unit 1025 judges whether the actual temperature of the spectrum lamp 1a is consistent with the preset temperature through the preset "digital signal-lamp temperature" relationship table according to the received digital signal; if the actual temperature of the spectrum lamp 1a is lower than preset temperature value, then control the first heating unit 1021 to heat the spectrum lamp; if the actual temperature of the spectrum lamp 1a is equal to or higher than the preset temperature value, then stop the first heating unit 1021 from working; preferably, the first processing unit 1025 is specifically a single-chip microcomputer.

The cavity temperature adjustment module 103 is configured to adjust the temperature of the microwave cavity 1b in the physical system 1 according to the experimental point corresponding to the cavity temperature in each working parameter point.

Wherein, the chamber temperature adjustment module 103 specifically includes:

The second heating unit is used to heat the microwave cavity 1b of the atomic clock;

The second bridge unit is used to measure the temperature of the microwave cavity 1b and convert the measured temperature into a voltage value;

The second differential amplification unit is used to differentially amplify the voltage value output by the second bridge unit;

The second analog-to-digital conversion unit is used to collect the voltage value output by the second differential amplifier unit and convert it into a digital signal;

The second processing unit is configured to control whether the second heating unit works according to the digital signal converted by the second analog-to-digital conversion unit.

It is worth noting that the structure of the chamber temperature adjustment module 103 is the same as that of the lamp temperature adjustment module 102 , which will not be described in detail here.

Further, the first bridge unit 1022 specifically includes:

Thermistor 1022a, first constant temperature resistor 1022b, digital potentiometer 1022c, second constant temperature resistor 1022d, and DC voltage reference 1022e; wherein, the first end of thermistor 1022a is connected to the second end of the first constant temperature resistor 1022b, and the first The first end of constant temperature resistance 1022b is connected with the second end of digital potentiometer 1022c, the first end of digital potentiometer 1022c is connected with the second end of second constant temperature resistance 1022d, the first end of second constant temperature resistance 1022d is connected with thermistor The second end of the resistor 1022a is connected, and the DC voltage reference 1022e is located between the connection point a of the thermistor 1022a and the second constant temperature resistor 1022d, and the connection point b of the first constant temperature resistor 1022b and the digital potentiometer 1022c.

Thermistor 1022a is used to measure the temperature of spectrum lamp 1a in real time;

The first constant temperature resistor 1022b and the second constant temperature resistor 1022d are used to balance the bridge;

The digital potentiometer 1022c is used to change the resistance value according to the command word of the first processing unit 1025, and preset the temperature of the spectrum lamp 1a;

The DC voltage reference 1022e is used to provide a voltage reference for the bridge.

Wherein, the structure of the second bridge unit 1032 is the same as that of the first bridge unit 1022 , which will not be described in detail here.

The C-field current adjustment module 104 is configured to adjust the energizing current of the C-field coil 1c in the physical system 1 according to the experimental point corresponding to the C-field current in each working parameter point.

Wherein, referring to FIG. 3 , the C-field coil 1c is wound on the cavity wall of the entire microwave cavity 1b, and forms a loop with the peripheral conducting wire 1f; the C-field current adjustment module 104 controls the entire The magnitude of the current in the C field coil 1c.

The measuring module 105 is used to measure the frequency difference between the output frequency of the atomic clock corresponding to each working parameter point and the standard clock source, and select the best working parameter point according to the frequency difference.

Further, the lamp temperature adjustment module 102 is also used for fine-tuning the experimental point corresponding to the lamp temperature in the optimal working parameter point, and keeping the rest of the experimental points in the optimal working parameter point unchanged.

Correspondingly, the measurement module 105 is also used to measure the frequency difference between the fine-tuned atomic clock output frequency and the standard clock source, and determine the optimal experimental point corresponding to the lamp temperature in the optimal working parameter point according to the frequency difference. The fine-tuning range is 0.5°C before and after the experimental point corresponding to the lamp temperature in the current best working parameter point, and the adjustment amount of each adjustment is 0.1°C.

Wherein, the working process and principle of the device described in the embodiment of the utility model are described as follows:

Step 1: Determine the parameters to be optimized and the value range of each parameter to be optimized through the setting module 101 .

As shown in Table 1, in this embodiment, the parameters to be optimized include lamp temperature, chamber temperature and C field current. Because the long-term stability of the atomic clock depends on the long-term drift characteristics of the atomic clock, as a method for optimizing long-term stability parameters, the parameters to be optimized must be selected from the parameters that affect the long-term drift characteristics of the atomic clock. It is easy to know that the parameters that affect the long-term drift characteristics mainly include lamp temperature, chamber temperature and C field current. Among them, the lamp temperature is the temperature of the spectrum lamp, which determines the optical frequency shift; the cavity temperature is the temperature of the microwave cavity in the cavity-bubble system, which determines the weak chemical and physical reactions in the absorbing bubble; the C field current is wound on the microwave cavity The energizing current of the C field coil determines the frequency shift of the microwave power.

Wherein, the value range of the lamp temperature is 120°C-130°C, the value range of the cavity temperature is 60°C-70°C, and the value range of the C field current is 1mA-2mA. A value range is determined for each parameter to be optimized in order to reduce the number of experiments. Because in actual operation, it is more difficult to conduct a comprehensive experiment. In this embodiment, a value range is respectively determined for the lamp temperature, the cavity temperature and the C field current. Wherein, the value ranges of lamp temperature, chamber temperature and C field current are a suitable range determined by combining zero light intensity frequency shift, zero bubble temperature coefficient and microwave power frequency shift. This is a prior art and will not be described in detail.

For the convenience of explanation, A, B and C are used to represent the lamp temperature, chamber temperature and C field current respectively in the following.

Table 1

Parameters to be optimized Ranges A(lamp temperature) 120℃～130℃ B (cavity temperature) 60℃～70℃ C (C field current) 1mA-2mA

Second step: select the experimental points of each parameter to be optimized in the value range of each parameter to be optimized by setting module 101; wherein, each parameter to be optimized corresponds to a plurality of experimental points and the number of experimental points corresponding to each parameter to be optimized Similarly, the experimental points corresponding to the same parameter to be optimized are uniformly distributed within the value range of the parameter to be optimized and include both ends of the value range.

This method of selecting experimental points can ensure that the corresponding experimental points of each parameter to be optimized are evenly distributed within its own value range, and improve the accuracy of experimental measurement results.

Table 2

Experimental point difference 120°C, 125°C, 130°C 5°C 60°C, 65°C, 70°C 5°C 1mA, 1.5mA, 2mA 0.5mA

In this embodiment, as shown in Table 2, there are three experimental points corresponding to the lamp temperature, chamber temperature and C field current; according to the size of the experimental points, A includes A1, A2, and A3; B includes B1, B2, and B3 ; C includes C1, C2, C3. The experimental points corresponding to the lamp temperature, chamber temperature and C field current all include the endpoints of their own value ranges and are evenly within their own value ranges. As shown in Table 2, the difference between adjacent experimental points of lamp temperature and cavity temperature is 5°C, and the difference between adjacent experimental points of C field current is 0.5mA.

Step 3: set the operating parameter points of the atomic clock according to the experimental points through the setting module 101; wherein, each operating parameter point includes a plurality of experimental points and each experimental point corresponds to different parameters to be optimized, and the maximum of each two operating parameter points Only one experimental point is the same, and the number of times each experimental point appears in all working parameter points is equal.

This setting method can ensure that all working parameter points are evenly distributed within the value range of all parameters to be optimized, further improving the accuracy of experimental measurement results.

In this embodiment, according to the foregoing setting method, 9 working parameter points are set according to the experimental points, specifically as shown in Table 3,

table 3

Working parameter point number A(lamp temperature) B (cavity temperature) C (C field current) ① A1(120℃) B1(60℃) C1(1mA) ② A1(120℃) B2(65℃) C2(1.5mA) ③ A1(120℃) B3(70℃) C3(2mA) ④ A2(125℃) B1(60℃) C2(1.5mA) ⑤ A2(125℃) B2(65℃) C3(2mA) ⑥ A2(125℃) B3(70℃) C1(1mA) ⑦ A3(130℃) B1(60℃) C3(2mA) ⑧ A3(130℃) B2(65℃) C1(1mA) ⑨ A3(130℃) B3(70℃) C2(1.5mA)

It can be seen from Figure 4 that the nine operating parameter points in Table 2 are evenly distributed within the value range of lamp temperature, chamber temperature and C field current.

Step 4: through the lamp temperature adjustment module 102, cavity temperature adjustment module 103, and C-field current adjustment module 104, adjust the parameters of the atomic clock according to each working parameter point.

For example, if the working parameter point ① in the aforementioned Table 3 is selected, then, according to the working parameter point ①, the lamp temperature of the atomic clock is adjusted to 120°C, the chamber temperature is adjusted to 60°C, and the C field current is adjusted to 1mA.

Step 5: Measure the frequency difference between the output frequency of the atomic clock and the standard clock source through the measurement module 105 to obtain the optimal operating parameter point.

Among them, after adjusting the lamp temperature, chamber temperature and C field current according to the selected working parameter points, measure and record the frequency difference between the output frequency of the atomic clock and the standard clock source once. After the measurement of all working parameter points is completed, compare all recorded frequency differences, and obtain the working parameter point with the smallest frequency difference as the best working parameter point corresponding to the long-term stability of the atomic clock.

In this embodiment, the form of frequency difference is used to reflect the long-term stability of the atomic clock. As a result of the experiment, the operating parameter point ⑥ with the smallest frequency difference was selected, that is, the lamp temperature was selected at 125°C, the cavity temperature was selected at 70°C, and the C field current was selected at 1mA.

It is worth noting that after adjusting a working parameter point to be tested, measure the frequency difference corresponding to the working parameter point to be tested; then continue to adjust other working parameter points to be tested, and measure the corresponding frequency difference.

Step 6: Optimizing the obtained optimum working parameter points through the lamp temperature adjustment module 102 and the measurement module 105 .

Among them, the value range of the parameters to be optimized is determined by the frequency shift of zero light intensity, the temperature coefficient of zero bubble and the frequency shift of microwave power. Moreover, in order to save system resources, the experimental points are only selected within the range of values. Therefore, the specific selection of experimental points cannot be very comprehensive. For example, in this embodiment, the difference between adjacent experimental points of lamp temperature and cavity temperature is 5°C. However, the actual atomic clock, whether it is the light source module or the resonant absorbing bubble, has a much smaller control range than 5°C for operating temperature fluctuations. Based on this, it is necessary to further optimize the optimal working parameter point.

Specifically, because changes in the spectral line type will eventually affect the output of the atomic clock's overall frequency, changing the temperature of the spectral lamp will change the entire spectral line type. Under different spectral line types, the contribution of light intensity changes to the system is different. the same. Therefore, in this embodiment, the experimental point 125°C corresponding to the lamp temperature in the best working parameter point is selected for fine-tuning. The adjustment amount of the adjustment is 0.1°C.

Further, by adjusting the spectral lamp temperature of the atomic clock to vary between 124.5°C and 125.5°C, and measuring the frequency difference between the output frequency of the system and the standard clock source, the inflection point of the lamp temperature versus frequency is found. Referring to Fig. 5, the abscissa is the lamp temperature of the spectral lamp, represented by A'; the ordinate is the frequency difference value between the output frequency of the atomic clock recorded by measurement and the standard clock source, represented by Y'. It can be seen from the figure that as the temperature of the spectrum lamp changes, the output frequency of the whole machine will change within 5×10 ^-11 /°C to 1×10 ^-12 /°C. Among them, when the lamp temperature is 125.2 ℃, the difference frequency value is the smallest. Therefore, it is determined that the lamp temperature is at 125.2°C as the optimal experimental point among the optimal working parameter points.

The beneficial effect brought by the technical solution provided by the embodiment of the utility model is: the working parameter points are set through the setting module, and the experimental points of the parameters to be optimized corresponding to the working parameter points are evenly distributed within the value range of the parameters to be optimized; The lamp temperature adjustment module, cavity temperature adjustment module and C field current adjustment module respectively adjust the lamp temperature, chamber temperature and C field current of the atomic clock according to each operating parameter point; the measurement module measures the output frequency of the atomic clock corresponding to each operating parameter point and the standard clock source frequency difference, and select the best working parameter point according to the frequency difference; the optimization device used in the traditional parameter optimization experiment is simplified, and the problem of interaction between system parameters in the existing parameter optimization experiment can be solved, so that the parameter optimization experiment can pass The optimal working parameter point obtained by optimizing the device is more accurate, which improves the long-term stability of the atomic clock.

Those of ordinary skill in the art can understand that all or part of the steps for implementing the above embodiments can be completed by hardware, and can also be completed by instructing related hardware through a program. The program can be stored in a computer-readable storage medium. The above-mentioned The storage medium mentioned may be a read-only memory, a magnetic disk or an optical disk, and the like.

The above descriptions are only preferred embodiments of the present utility model, and are not intended to limit the present utility model. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present utility model shall be included in this utility model. within the scope of protection of utility models.

Claims (6)

1. An atomic clock long-term stability optimization device is characterized in that, the device comprises: A setting module for setting a plurality of working parameter points; each said working parameter point includes a plurality of experimental points and each experimental point corresponds to a different parameter to be optimized, and each said parameter to be optimized corresponds to a plurality of experimental points and corresponds to The number of experimental points is the same, and the experimental points corresponding to the same parameter to be optimized are uniformly distributed within the value range of the parameter to be optimized and include the two ends of the value range, and every two operating parameter points Only one experimental point is the same at most, and the number of occurrences of each of the experimental points in all the operating parameter points is equal; the parameters to be optimized include lamp temperature, chamber temperature and C field current; A lamp temperature adjustment module for adjusting the temperature of the spectral lamp in the physical system of the atomic clock according to the experimental point corresponding to the lamp temperature in each of the working parameter points; A cavity temperature adjustment module for adjusting the temperature of the microwave cavity in the physical system according to the experimental point corresponding to the cavity temperature in each of the working parameter points; A C-field current adjustment module for adjusting the magnitude of the energizing current of the C-field coil in the physical system according to the experimental point corresponding to the C-field current in each of the working parameter points; and A measurement module for measuring the frequency difference between the output frequency of the atomic clock corresponding to each of the operating parameter points and the standard clock source, and selecting the best operating parameter point according to the frequency difference; The setting module is respectively connected with the lamp temperature adjustment module, the cavity temperature adjustment module, the C field current adjustment module and the measurement module; the lamp temperature adjustment module is connected with the spectrum lamp; the cavity The temperature regulation module is connected with the microwave cavity; the C-field current regulation module is connected with the C-field coil; the measurement module is connected with the isolation amplifier of the atomic clock. 2. The device according to claim 1, wherein the lamp temperature adjustment module is also used for: Fine-tuning the experimental point corresponding to the lamp temperature in the optimal working parameter point; Correspondingly, the measurement module is also used for, Measure the frequency difference between the output frequency of the atomic clock and the standard clock source after fine-tuning, and determine the optimal experimental point corresponding to the lamp temperature in the optimal working parameter point according to the frequency difference. 3. The device according to claim 1, wherein the lamp temperature adjustment module specifically comprises: a first heating unit for heating the spectral lamp of the atomic clock; a first bridge unit for measuring the temperature of the spectrum lamp and converting the measured temperature into a voltage value; a first differential amplification unit for differentially amplifying the voltage value output by the bridge unit; A first analog-to-digital conversion unit for collecting the voltage value output by the differential amplification unit and converting it into a digital signal; and A first processing unit for controlling whether the heating unit works according to the digital signal converted by the analog-to-digital conversion unit; The first heating unit is connected to the first processing unit; the first bridge unit is respectively connected to the first differential amplification unit and the first processing unit; the first differential amplification unit is connected to the first differential amplification unit The first analog-to-digital conversion unit is connected; the first analog-to-digital conversion unit is connected to the first processing unit. 4. The device according to claim 1, wherein the chamber temperature adjustment module specifically comprises: a second heating unit for heating the microwave cavity of the atomic clock; a second bridge unit for measuring the temperature of the microwave cavity and converting the measured temperature into a voltage value; a second differential amplification unit for differentially amplifying the voltage value output by the bridge unit; a second analog-to-digital conversion unit for collecting the voltage value output by the differential amplification unit and converting it into a digital signal; and A second processing unit for controlling whether the heating unit works according to the digital signal converted by the analog-to-digital conversion unit; The second heating unit is connected to the second processing unit; the second bridge unit is connected to the second differential amplification unit and the second processing unit respectively; the second differential amplification unit is connected to the second differential amplification unit The second analog-to-digital conversion unit is connected; the second analog-to-digital conversion unit is connected to the second processing unit. 5. The device according to claim 3 or 4, wherein the first bridge unit or the second bridge unit specifically comprises: Thermistor, first constant temperature resistor, digital potentiometer, second constant temperature resistor, and DC voltage reference; Wherein, the first end of the thermistor is connected to the second end of the first constant temperature resistor, the first end of the first constant temperature resistor is connected to the second end of the digital potentiometer, and the digital potentiometer The first end is connected to the second end of the second constant temperature resistor, the first end of the second constant temperature resistor is connected to the second end of the thermistor, and the DC voltage reference is located between the thermistor and the thermistor. Between the connection point of the second constant temperature resistor, the connection point of the first constant temperature resistor and the digital potentiometer. 6. The device according to claim 3 or 4, wherein the first processing unit or the second processing unit is a single chip microcomputer.

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