CN202563269U - Atomic clock long-term stability optimization apparatus - Google Patents
Atomic clock long-term stability optimization apparatus Download PDFInfo
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- CN202563269U CN202563269U CN201220125813XU CN201220125813U CN202563269U CN 202563269 U CN202563269 U CN 202563269U CN 201220125813X U CN201220125813X U CN 201220125813XU CN 201220125813 U CN201220125813 U CN 201220125813U CN 202563269 U CN202563269 U CN 202563269U
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Abstract
The utility model discloses an atomic clock long-term stability optimization apparatus which comprises a setting module for setting a plurality of working parameter points; a lamp temperature regulation module for regulating temperature of a spectrum lamp in a physical system of an atomic clock according to experimental points of each working parameter point corresponding to the lamp temperature; a cavity temperature regulation module for regulating temperature of a microwave cavity in the physical system of the atomic clock according to the experimental points of each working parameter point corresponding to the cavity temperature; a C field current regulation module for regulating current magnitude of a C field coil in the physical system according to the experimental points of each working parameter point corresponding to C field current; and a measurement module for measuring a frequency difference between atomic clock output frequencies corresponding to each working parameter point and that of a standard clock source and selecting an optimal working parameter point according to the frequency difference. The apparatus can be used to raise long-term stability for atomic clocks.
Description
Technical field
The utility model relates to the atomic clock field, the long steady optimization means of particularly a kind of atomic clock.
Background technology
The long-term stability of atomic clock is to weigh an important indicator of atomic clock performance, and it mainly receives the influence of the long term drift characteristic of atomic clock.Owing to the reason that does not have physical model to long term drift at present makes an explanation, therefore, when measuring and improve the long-term stability of atomic clock, must a large amount of parameter optimization of design test, to select the long-term stability optimum working parameter point of atomic clock.
Wherein, the systematic parameter that influences long-term stability is numerous, comprises lamp temperature, chamber temperature, microwave power etc., carries out comprehensive parameter optimization experiment so choose all correlation parameters, is impossible basically in practical operation.The Traditional parameter optimization experiment normally adopts optimization means that systematic parameter is optimized one by one.At first, optimize first systematic parameter: the value of fixing all the other systematic parameters, this first systematic parameter is regulated, measure the degree of stability of the frequency signal output of atomic clock, the value when selecting degree of stability the highest is as the optimal value of this first systematic parameter; Optimize second systematic parameter then: the systematic parameter that will optimize is fixed on its optimal value, and the value of fixing all the other systematic parameters of not optimizing, and obtains the optimal value of this second systematic parameter; Repeat abovementioned steps, until the optimal value that obtains all systematic parameters, the combination of the optimal value of all systematic parameters is the optimum working parameter point of aforementioned atomic clock.Particularly, be example with lamp temperature, chamber temperature, at first earlier that the chamber temperature is fixing, regulate the lamp temperature, obtain the optimal value of lamp temperature; Then, the lamp temperature is fixed on this optimized parameter point, regulates the chamber temperature, obtain the optimal value of chamber temperature; At last, with the combination of the optimal value of the gentle chamber of lamp temperature optimum working parameter point as atomic clock.
In the process that realizes the utility model, the inventor finds that there is following problem at least in prior art:
Change the order of aforementioned system parameter optimization,, can produce other optimum working parameter point like predetermined fixed lamp temperature rather than chamber temperature.This is because the Traditional parameter optimization experiment is to take the method for some systematic parameter of predetermined fixed, has ignored and has had interactive influence between each systematic parameter.Correspondingly, be used for the optimization means complex structure of traditional parameters optimization experiment, the optimum working parameter point that causes finally obtaining is inaccurate, and then has limited the further raising of the long-term stability of atomic clock.
The utility model content
In order to improve the long-term stability of atomic clock, the utility model embodiment provides a kind of atomic clock long steady optimization means.Said technical scheme is following:
The long steady optimization means of a kind of atomic clock is characterized in that said device comprises:
Be used to be provided with the module of a plurality of running parameter points; Each said running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each experimental point; The experimental point quantity of corresponding a plurality of experimental points of each said parameter to be optimized and correspondence is identical; Be evenly distributed in the said parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprise the two-end-point of said span; Have only an experimental point identical at most in per two said running parameter points, and the number of times that each said experimental point occurs in all said running parameter points equate; Said parameter to be optimized comprises lamp temperature, the gentle C field current in chamber;
Be used for experimental point, the lamp temperature adjustment module of the temperature of spectrum lamp in the physical system of adjusting atomic clock according to the corresponding lamp temperature of each said running parameter point;
Be used for experimental point, regulate the chamber temperature adjustment module of the temperature of microwave cavity in the said physical system according to each said running parameter point corresponding cavity temperature;
Be used for experimental point, regulate the C field current adjustment module of the electrical current size of C field coil in the said physical system according to the corresponding C field current of each said running parameter point; And
Be used to measure the output frequency of the corresponding atomic clock of each said running parameter point and the difference on the frequency of standard clock source, and select the measurement module of optimum working parameter point according to said difference on the frequency;
The said module that is provided with links to each other with said measurement module with said lamp temperature adjustment module, said chamber temperature adjustment module, said C field current adjustment module respectively; Said lamp temperature adjustment module links to each other with said spectrum lamp; Said chamber temperature adjustment module links to each other with said microwave cavity; Said C field current adjustment module links to each other with said C field coil; Said measurement module links to each other with the isolated amplifier of said atomic clock.
Wherein, said lamp temperature adjustment module also is used for,
Experimental point to corresponding lamp temperature in the said optimum working parameter point is finely tuned;
Correspondingly, said measurement module also is used for,
Measure the difference on the frequency of fine setting said atomic clock output frequency in back and standard clock source, and confirm the optimum experimental point of corresponding lamp temperature in the said optimum working parameter point according to said difference on the frequency.
Wherein, said lamp temperature adjustment module specifically comprises:
Be used to first heating unit of the spectrum lamp heating of said atomic clock;
Be used to measure the temperature of said spectrum lamp and be the first electric bridge unit of magnitude of voltage the temperature transition that records;
Be used for the first difference amplifying unit with the magnitude of voltage difference amplification of said electric bridge unit output;
First AD conversion unit that is used to gather the magnitude of voltage of said difference amplifying unit output and converts digital signal into; And
Be used for first processing unit of whether working according to the said heating unit of Digital Signals of said AD conversion unit conversion;
Said first heating unit links to each other with said first processing unit; The said first electric bridge unit links to each other with said first processing unit with the said first difference amplifying unit respectively; The said first difference amplifying unit links to each other with said first AD conversion unit; Said first AD conversion unit links to each other with said first processing unit.
Wherein, said chamber temperature adjustment module specifically comprises:
Be used to second heating unit of the microwave cavity heating of said atomic clock;
Be used to measure the temperature of said microwave cavity and be the second electric bridge unit of magnitude of voltage the temperature transition that records;
Be used for the second difference amplifying unit with the magnitude of voltage difference amplification of said electric bridge unit output;
Second AD conversion unit that is used to gather the magnitude of voltage of said difference amplifying unit output and converts digital signal into; And
Be used for second processing unit of whether working according to the said heating unit of Digital Signals of said AD conversion unit conversion;
Said second heating unit links to each other with said second processing unit; The said second electric bridge unit links to each other with said second processing unit with the said second difference amplifying unit respectively; The said second difference amplifying unit links to each other with said second AD conversion unit; Said second AD conversion unit links to each other with said second processing unit.
Wherein, the said first electric bridge unit or the second electric bridge unit specifically comprise:
Thermistor, the first constant temperature resistance, digital potentiometer, the second constant temperature resistance and DC voltage benchmark;
Wherein, Said thermistor first end links to each other with the said first constant temperature resistance, second end; First end of the said first constant temperature resistance links to each other with second end of said digital potentiometer; First end of said digital potentiometer links to each other with second end of the said second constant temperature resistance; First end of the said second constant temperature resistance links to each other with second end of said thermistor, and said DC voltage benchmark is between the tie point of the tie point of said thermistor and the said second constant temperature resistance, the said first constant temperature resistance and said digital potentiometer.
Further, said first processing unit or second processing unit are single-chip microcomputer.
The beneficial effect that the technical scheme that the utility model embodiment provides is brought is: through module is set the running parameter point is set, and makes that the experimental point of corresponding parameter to be optimized is evenly distributed in the running parameter point in parameter range to be optimized; Lamp temperature adjustment module, chamber temperature adjustment module and C field current adjustment module are regulated the gentle C field current in lamp temperature, chamber of atomic clock respectively according to each running parameter point; Measurement module is measured the output frequency of the corresponding atomic clock of each running parameter point and the difference on the frequency of standard clock source, and selects the optimum working parameter point according to difference on the frequency; Simplified the optimization means that the traditional parameters optimization experiment adopts; Can solve in the existing parameter optimization experiment and have interactive problem between the systematic parameter; The optimum working parameter point that the parameter optimization experiment is obtained through optimization means is more accurate, has improved the long-term stability of atomic clock.
Description of drawings
In order to be illustrated more clearly in the technical scheme among the utility model embodiment; The accompanying drawing of required use is done to introduce simply in will describing embodiment below; Obviously, the accompanying drawing in describing below only is some embodiment of the utility model, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the synoptic diagram of the long steady optimization means of a kind of atomic clock that provides among the utility model embodiment;
Fig. 2 is the synoptic diagram of the first electric bridge unit that provides among the utility model embodiment;
Fig. 3 is the work synoptic diagram of the C field current adjustment module that provides among the utility model embodiment;
Fig. 4 is the synoptic diagram that the running parameter point that provides among the utility model embodiment distributes;
Fig. 5 is the lamp temperature that provides among the utility model embodiment and the test curve figure of difference on the frequency.
Embodiment
For the purpose, technical scheme and the advantage that make the utility model is clearer, will combine accompanying drawing that the utility model embodiment is done to describe in detail further below.
For ease of description, at first the structure of atomic clock is introduced below the said device of the utility model embodiment.Atomic clock generally comprises physical system 1 and electronic circuit.Physical system 1 mainly comprises spectrum lamp 1a, microwave cavity 1b, C field coil 1c and integrated filtering bubble 1d etc.Electronic circuit mainly comprise isolated amplifier 2, microwave doubly, mixing 3, synthesizer 4, servo circuit 5 and VCXO 6.
Based on this, referring to Fig. 1, the utility model embodiment provides a kind of atomic clock long steady optimization means, and this device specifically comprises module 101, lamp temperature adjustment module 102, chamber temperature adjustment module 103, C field current adjustment module 104 and measurement module 105 are set; Wherein, module 101 being set links to each other with measurement module 105 with lamp temperature adjustment module 102, chamber temperature adjustment module 103, C field current adjustment module 104 respectively; Lamp temperature adjustment module 102 links to each other with spectrum lamp 1a; Chamber temperature adjustment module 103 links to each other with microwave cavity 1b; C field current adjustment module 104 links to each other with C field coil 1c; Measurement module 105 links to each other with the isolated amplifier 2 of atomic clock.
Lamp temperature adjustment module 102 is used for the experimental point according to the corresponding lamp temperature of each running parameter point, the temperature of spectrum lamp 1a in the physical system 1 of adjusting atomic clock.
Wherein, referring to Fig. 2, lamp temperature adjustment module 102 specifically comprises:
First heating unit 1021 links to each other with first processing unit 1025, is used to the spectrum lamp 1a heating of atomic clock.
Particularly, first heating unit 1021 is for being arranged on the peripheral heater strip 1e of spectrum lamp 1a.
The first electric bridge unit 1022 links to each other with first processing unit 1025 with the first difference amplifying unit 1023 respectively, is used for the temperature of measure spectrum lamp 1a and is magnitude of voltage with the temperature transition that records.
Particularly, the first electric bridge unit 1022 presets the actual temperature with measure spectrum lamp 1a according to the instruction of first processing unit 1025, and produces voltage difference according to the difference of temperature that presets and actual temperature.
The first difference amplifying unit 1023 links to each other with first AD conversion unit 1021 with the first electric bridge unit 1022 respectively, is used for the magnitude of voltage difference of the first electric bridge unit, 1022 outputs is amplified.
First AD conversion unit 1024 links to each other with first processing unit 1025 with the first difference amplifying unit 1023 respectively, is used to gather the magnitude of voltage of the first difference amplifying unit, 1023 outputs and convert digital signal into.
Whether first processing unit 1025 is used for working according to Digital Signals first heating unit 1021 of first AD conversion unit, 1024 conversions.
Particularly, first processing unit 1025 through " digital signal-lamp temperature " relation table that presets, judges whether spectrum lamp 1a actual temperature is consistent with the temperature that presets according to the digital signal that receives; If spectrum lamp 1a actual temperature is lower than the temperature value that presets, then controls first heating unit 1021 and be the spectrum lamp heating; If spectrum lamp 1a actual temperature is equal to or higher than the temperature value that presets, then stop 1021 work of first heating unit; Preferably, first processing unit 1025 is specially single-chip microcomputer.
Chamber temperature adjustment module 103 is used for the experimental point according to each running parameter point corresponding cavity temperature, regulates the temperature of microwave cavity 1b in the physical system 1.
Wherein, chamber temperature adjustment module 103 specifically comprises:
Second heating unit is used to the microwave cavity 1b heating of atomic clock;
The second electric bridge unit is used to measure the temperature of microwave cavity 1b and is magnitude of voltage with the temperature transition that records;
The second difference amplifying unit is used for the magnitude of voltage difference of second electric bridge unit output is amplified;
Second AD conversion unit is used to gather the magnitude of voltage of second difference amplifying unit output and convert digital signal into;
Whether second processing unit is used for working according to Digital Signals second heating unit of second AD conversion unit conversion.
What be worth explanation is that chamber temperature adjustment module 103 is identical with the structure of lamp temperature adjustment module 102, is not described in detail in this.
Further, the first electric bridge unit 1022 specifically comprises:
Thermistor 1022a, the first constant temperature resistance 1022b, digital potentiometer 1022c, the second constant temperature resistance 1022d and DC voltage benchmark 1022e; Wherein, Thermistor 1022a first end links to each other with the first constant temperature resistance 1022b, second end; First end of the first constant temperature resistance 1022b links to each other with second end of digital potentiometer 1022c; First end of digital potentiometer 1022c links to each other with second end of the second constant temperature resistance 1022d; First end of the second constant temperature resistance 1022d links to each other with second end of thermistor 1022a, and DC voltage benchmark 1022e is between the tie point b of tie point a, the first constant temperature resistance 1022b and the digital potentiometer 1022c of the thermistor 1022a and the second constant temperature resistance 1022d.
Thermistor 1022a is used for the temperature of real-time measure spectrum lamp 1a;
The first constant temperature resistance 1022b, the second constant temperature resistance 1022d are used for balanced bridge;
Digital potentiometer 1022c is used for changing resistance according to the command word of first processing unit 1025, presets the temperature of spectrum lamp 1a;
DC voltage benchmark 1022e is used for Voltage Reference to electric bridge being provided.
Wherein, the second electric bridge unit 1032 is identical with the first electric bridge unit, 1022 structures, is not described in detail in this.
C field current adjustment module 104 is used for the experimental point according to the corresponding C field current of each running parameter point, regulates the electrical current size of C field coil 1c in the physical system 1.
Wherein, referring to Fig. 3, C field coil 1c is wound on the cavity wall of whole microwave cavity 1b, and constitutes the loop with peripheral electrified wire 1f; C field current adjustment module 104 is controlled the size of current among the whole C field coil 1c through the size of current of control electrified wire 1f.
Further, lamp temperature adjustment module 102 also is used for, and the experimental point of corresponding lamp temperature in the optimum working parameter point is finely tuned, and keep all the other experimental points in the optimum working parameter point constant.
Correspondingly, measurement module 105 also is used for, and measures the difference on the frequency of fine setting back atomic clock output frequency and standard clock source, and confirms the optimum experimental point of corresponding lamp temperature in the optimum working parameter point according to difference on the frequency.The scope of fine setting is before and after the experimental point of corresponding lamp temperature in the current optimum working parameter point each 0.5 ℃, and the regulated quantity of adjusting is 0.1 ℃ at every turn.
Wherein, following to the course of work and the principles illustrated of installing described in the utility model embodiment:
The first step: confirm parameter to be optimized and each parameter range to be optimized through module 101 is set.
As shown in table 1, in the present embodiment, this parameter to be optimized comprises lamp temperature, the gentle C field current in chamber.Because the long-term stability of atomic clock depends on the long term drift characteristic of atomic clock, so as a kind of long-term stability parameters optimization method, parameter to be optimized must be chosen in the parameter of the long term drift characteristic that influences atomic clock.Know that easily the parameter that influences the long term drift characteristic mainly comprises lamp temperature, the gentle C field current in chamber.Wherein, the lamp temperature is the temperature of spectrum lamp, has determined optical frequency shift; The chamber temperature is the temperature of microwave cavity in the cavity bubble system, has determined to absorb chemical physics reaction faint in the bubble; The C field current is the electrical current that is wound on the C field coil on the microwave cavity, has determined the microwave power frequency displacement.
Wherein, the span of lamp temperature is 120 ℃～130 ℃, and the span of chamber temperature is 60 ℃～70 ℃, and the span of C field current is 1mA-2mA.Confirm a span for each parameter to be optimized, purpose is in order to reduce experiment number.Because in practical operation, comprehensively test is the comparison difficulty.Present embodiment is respectively the lamp temperature, the gentle C field current in chamber is confirmed a span.Wherein, the span of lamp temperature, the gentle C field current in chamber is a suitable scope that combines zero light intensity frequency displacement, zero bubble temperature coefficient and microwave power frequency displacement to determine.This is a prior art, no longer details.
For convenient explanation, hereinafter use A, B and C indication lamp temperature, the gentle C field current in chamber respectively.
Table 1
| Parameter to be optimized | Span |
| A (lamp temperature) | 120℃～130℃ |
| B (chamber temperature) | 60℃～70℃ |
| C (C field current) | 1mA-2mA |
Second step: in each parameter range to be optimized, choose the experimental point of each parameter to be optimized through module 101 is set; Wherein, The corresponding experimental point quantity of the corresponding a plurality of experimental points of each parameter to be optimized and each parameter to be optimized is identical, is evenly distributed in the parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprises the two-end-point of this span.
This mode of choosing experimental point can guarantee that the experimental point of the correspondence of each parameter to be optimized is evenly distributed in the span of himself, improve the degree of accuracy of experimental measurements.
Table 2
| Experimental point | Difference |
| 120℃、125℃、130 |
5℃ |
| 60℃、65℃、70 |
5℃ |
| 1mA、1.5mA、2mA | 0.5mA |
In the present embodiment, as shown in table 2, lamp temperature, the chamber corresponding experimental point of gentle C field current respectively are 3; According to the size of experimental point, A comprises A1, A2, A3; B comprises B1, B2, B3; C comprises C1, C2, C3.The corresponding experimental point of the gentle C field current of lamp temperature, chamber has included the end points of self span and evenly respectively in self span.As shown in table 2, the difference between the adjacent experimental point of lamp temperature, chamber temperature is 5 ℃, and the difference between the experimental point of C field current is adjacent is 0.5mA.
The 3rd step: through module 101 is provided with atomic clock according to experimental point running parameter point is set; Wherein, each running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each experimental point, has only an experimental point identical at most in per two running parameter points, and the number of times that each experimental point occurs in all working parameter point equates.
This set mode can guarantee that all running parameter points are evenly distributed, and further improve the degree of accuracy of experimental measurements in all parameter range to be optimized.
Present embodiment is provided with 9 running parameter points by the mode of aforementioned setting according to experimental point, and is specifically as shown in table 3,
Table 3
| The running parameter period | A (lamp temperature) | B (chamber temperature) | C (C field current) |
| ① | A1(120℃) | B1(60℃) | C1(1mA) |
| ② | A1(120℃) | B2(65℃) | C2(1.5mA) |
| ③ | A1(120℃) | B3(70℃) | C3(2mA) |
| ④ | A2(125℃) | B1(60℃) | C2(1.5mA) |
| ⑤ | A2(125℃) | B2(65℃) | C3(2mA) |
| ⑥ | A2(125℃) | B3(70℃) | C1(1mA) |
| ⑦ | A3(130℃) | B1(60℃) | C3(2mA) |
| ⑧ | A3(130℃) | B2(65℃) | C1(1mA) |
| ⑨ | A3(130℃) | B3(70℃) | C2(1.5mA) |
As can beappreciated from fig. 4,9 running parameter points are evenly distributed in the span of lamp temperature, the gentle C field current in chamber in the table 2.
The 4th step: the parameter of regulating atomic clock through lamp temperature adjustment module 102, chamber temperature adjustment module 103, C field current adjustment module 104 respectively according to each running parameter point.
For example, selected in the aforementioned table 3 running parameter point 1., so, according to running parameter point 1., respectively the lamp temperature of atomic clock has been adjusted to 120 ℃, chamber temperature and is adjusted to 60 ℃ and C field current and is adjusted to 1mA.
The 5th step: the difference on the frequency through measurement module 105 measurement atomic clock output frequencies and standard clock source, obtain the optimum working parameter point.
Wherein, accomplish adjusting lamp temperature, the gentle C field current in chamber according to the running parameter point of selecting after, measure and write down the difference on the frequency of atomic clock output frequency and standard clock source.After the measurement of accomplishing all working parameter point, relatively all difference on the frequencies of record obtain the minimum running parameter point of difference on the frequency, as the optimum working parameter point corresponding with the atomic clock long-term stability.
In the present embodiment, used the long-term stability of the form reflection atomic clock complete machine of difference on the frequency.6. result of experiment has selected the minimum running parameter point of difference on the frequency, and promptly the lamp temperature is chosen in 125 ℃, and the chamber temperature is chosen in 70 ℃, and C field current size is chosen in 1mA.
What be worth explanation is behind the intact running parameter point to be measured of every adjusting, to measure the corresponding difference on the frequency of this running parameter point to be measured; Continue to regulate other running parameter point to be measured then, and measure corresponding difference on the frequency.
The 6th step: the optimum working parameter point that obtains through lamp temperature adjustment module 102 and 105 pairs of measurement modules is optimized.
Wherein, because parameter range to be optimized is steeped temperature coefficient and microwave power frequency displacement decision by zero light intensity frequency displacement, zero.And,, only in span, choose experimental point for conserve system resources.Therefore, specifically choosing of experimental point can not be very comprehensive.For example, in the present embodiment, the difference between the adjacent experimental point of lamp temperature, chamber temperature is 5 ℃.Yet no matter actual atomic clock complete machine is light source module, or resonance absorption bubble link is littler more than 5 ℃ to the scope of working temperature fluctuation control.Based on this, need further optimize the optimum working parameter point.
Particularly, because the variation of spectrum line style finally can influence the output of atomic clock complete machine frequency, change the temperature of spectrum lamp, overall optical spectral line type will be changed, under the different spectrum line style, the contribution that light intensity changes system is different.So in the present embodiment, selected the experimental point of corresponding lamp temperature in the optimum working parameter point to finely tune for 125 ℃, the scope of fine setting is respectively 0.5 ℃ of the experimental point front and back of corresponding lamp temperature in the current optimum working parameter point, the regulated quantity of adjusting is 0.1 ℃ at every turn.
Further, change between 124.5 ℃～125.5 ℃ scopes through the spectrum lamp lamp temperature of regulating atomic clock, the output frequency of measuring system and the difference on the frequency of standard clock source are sought the flex point of lamp temperature to frequency simultaneously.Referring to Fig. 5, horizontal ordinate is a spectrum lamp lamp temperature, uses A ' expression; Ordinate is used Y ' expression for through the atomic clock output frequency of survey record and the difference on the frequency numerical value of standard clock source.Can know that by figure along with the change of spectrum lamp temperature, the frequency of complete machine output can be 5 * 10
-11/ ℃ to 1 * 10
-12/ ℃ in change.Wherein, the lamp temperature is in the time of 125.2 ℃, and the difference frequency value is minimum.Therefore, confirm the lamp temperature 125.2 ℃ for optimum working parameter point in optimum experimental point.
The beneficial effect that the technical scheme that the utility model embodiment provides is brought is: through module is set the running parameter point is set, and makes that the experimental point of corresponding parameter to be optimized is evenly distributed in the running parameter point in parameter range to be optimized; Lamp temperature adjustment module, chamber temperature adjustment module and C field current adjustment module are regulated the gentle C field current in lamp temperature, chamber of atomic clock respectively according to each running parameter point; Measurement module is measured the output frequency of the corresponding atomic clock of each running parameter point and the difference on the frequency of standard clock source, and selects the optimum working parameter point according to difference on the frequency; Simplified the optimization means that the traditional parameters optimization experiment adopts; Can solve in the existing parameter optimization experiment and have interactive problem between the systematic parameter; The optimum working parameter point that the parameter optimization experiment is obtained through optimization means is more accurate, has improved the long-term stability of atomic clock.
The all or part of step that one of ordinary skill in the art will appreciate that realization the foregoing description can be accomplished through hardware; Also can instruct relevant hardware to accomplish through program; Described program can be stored in a kind of computer-readable recording medium; The above-mentioned storage medium of mentioning can be a ROM (read-only memory), disk or CD etc.
The above is merely the preferred embodiment of the utility model, and is in order to restriction the utility model, not all within the spirit and principle of the utility model, any modification of being done, is equal to replacement, improvement etc., all should be included within the protection domain of the utility model.
Claims (6)
1. an atomic clock is grown steady optimization means, it is characterized in that said device comprises:
Be used to be provided with the module of a plurality of running parameter points; Each said running parameter point comprises a plurality of experimental points and the corresponding different parameter to be optimized of each experimental point; The experimental point quantity of corresponding a plurality of experimental points of each said parameter to be optimized and correspondence is identical; Be evenly distributed in the said parameter range to be optimized with the corresponding experimental point of same parameter to be optimized and comprise the two-end-point of said span; Have only an experimental point identical at most in per two said running parameter points, and the number of times that each said experimental point occurs in all said running parameter points equate; Said parameter to be optimized comprises lamp temperature, the gentle C field current in chamber;
Be used for experimental point, the lamp temperature adjustment module of the temperature of spectrum lamp in the physical system of adjusting atomic clock according to the corresponding lamp temperature of each said running parameter point;
Be used for experimental point, regulate the chamber temperature adjustment module of the temperature of microwave cavity in the said physical system according to each said running parameter point corresponding cavity temperature;
Be used for experimental point, regulate the C field current adjustment module of the electrical current size of C field coil in the said physical system according to the corresponding C field current of each said running parameter point; And
Be used to measure the output frequency of the corresponding atomic clock of each said running parameter point and the difference on the frequency of standard clock source, and select the measurement module of optimum working parameter point according to said difference on the frequency;
The said module that is provided with links to each other with said measurement module with said lamp temperature adjustment module, said chamber temperature adjustment module, said C field current adjustment module respectively; Said lamp temperature adjustment module links to each other with said spectrum lamp; Said chamber temperature adjustment module links to each other with said microwave cavity; Said C field current adjustment module links to each other with said C field coil; Said measurement module links to each other with the isolated amplifier of said atomic clock.
2. device according to claim 1 is characterized in that, said lamp temperature adjustment module also is used for,
Experimental point to corresponding lamp temperature in the said optimum working parameter point is finely tuned;
Correspondingly, said measurement module also is used for,
Measure the difference on the frequency of fine setting said atomic clock output frequency in back and standard clock source, and confirm the optimum experimental point of corresponding lamp temperature in the said optimum working parameter point according to said difference on the frequency.
3. device according to claim 1 is characterized in that, said lamp temperature adjustment module specifically comprises:
Be used to first heating unit of the spectrum lamp heating of said atomic clock;
Be used to measure the temperature of said spectrum lamp and be the first electric bridge unit of magnitude of voltage the temperature transition that records;
Be used for the first difference amplifying unit with the magnitude of voltage difference amplification of said electric bridge unit output;
First AD conversion unit that is used to gather the magnitude of voltage of said difference amplifying unit output and converts digital signal into; And
Be used for first processing unit of whether working according to the said heating unit of Digital Signals of said AD conversion unit conversion;
Said first heating unit links to each other with said first processing unit; The said first electric bridge unit links to each other with said first processing unit with the said first difference amplifying unit respectively; The said first difference amplifying unit links to each other with said first AD conversion unit; Said first AD conversion unit links to each other with said first processing unit.
4. device according to claim 1 is characterized in that, said chamber temperature adjustment module specifically comprises:
Be used to second heating unit of the microwave cavity heating of said atomic clock;
Be used to measure the temperature of said microwave cavity and be the second electric bridge unit of magnitude of voltage the temperature transition that records;
Be used for the second difference amplifying unit with the magnitude of voltage difference amplification of said electric bridge unit output;
Second AD conversion unit that is used to gather the magnitude of voltage of said difference amplifying unit output and converts digital signal into; And
Be used for second processing unit of whether working according to the said heating unit of Digital Signals of said AD conversion unit conversion;
Said second heating unit links to each other with said second processing unit; The said second electric bridge unit links to each other with said second processing unit with the said second difference amplifying unit respectively; The said second difference amplifying unit links to each other with said second AD conversion unit; Said second AD conversion unit links to each other with said second processing unit.
5. according to claim 3 or 4 described devices, it is characterized in that the said first electric bridge unit or the second electric bridge unit specifically comprise:
Thermistor, the first constant temperature resistance, digital potentiometer, the second constant temperature resistance and DC voltage benchmark;
Wherein, Said thermistor first end links to each other with the said first constant temperature resistance, second end; First end of the said first constant temperature resistance links to each other with second end of said digital potentiometer; First end of said digital potentiometer links to each other with second end of the said second constant temperature resistance; First end of the said second constant temperature resistance links to each other with second end of said thermistor, and said DC voltage benchmark is between the tie point of the tie point of said thermistor and the said second constant temperature resistance, the said first constant temperature resistance and said digital potentiometer.
6. according to claim 3 or 4 described devices, it is characterized in that said first processing unit or second processing unit are single-chip microcomputer.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102611448A (en) * | 2012-03-29 | 2012-07-25 | 江汉大学 | Method and device for optimizing long-period stability parameters of atomic frequency standard |
| CN103048916A (en) * | 2012-12-17 | 2013-04-17 | 江汉大学 | Combined type atomic clock |
| CN103076746A (en) * | 2012-12-17 | 2013-05-01 | 江汉大学 | Wall shift measurement system and control method thereof |
| CN106774532A (en) * | 2016-12-29 | 2017-05-31 | 江汉大学 | Steady optical frequency output intent high and its control system |
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2012
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102611448A (en) * | 2012-03-29 | 2012-07-25 | 江汉大学 | Method and device for optimizing long-period stability parameters of atomic frequency standard |
| CN102611448B (en) * | 2012-03-29 | 2014-06-25 | 江汉大学 | Method and device for optimizing long-period stability parameters of atomic frequency standard |
| CN103048916A (en) * | 2012-12-17 | 2013-04-17 | 江汉大学 | Combined type atomic clock |
| CN103076746A (en) * | 2012-12-17 | 2013-05-01 | 江汉大学 | Wall shift measurement system and control method thereof |
| CN103048916B (en) * | 2012-12-17 | 2015-10-07 | 江汉大学 | Combined type atomic clock |
| CN103076746B (en) * | 2012-12-17 | 2016-03-30 | 江汉大学 | A kind of control method of wall shift measurement system |
| CN106774532A (en) * | 2016-12-29 | 2017-05-31 | 江汉大学 | Steady optical frequency output intent high and its control system |
| CN106774532B (en) * | 2016-12-29 | 2019-02-01 | 江汉大学 | High steady optical frequency output method and its control system |
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