CN202533397U - Detecting mechanism of silicon wafer slicing machine - Google Patents
Detecting mechanism of silicon wafer slicing machine Download PDFInfo
- Publication number
- CN202533397U CN202533397U CN201220060816XU CN201220060816U CN202533397U CN 202533397 U CN202533397 U CN 202533397U CN 201220060816X U CN201220060816X U CN 201220060816XU CN 201220060816 U CN201220060816 U CN 201220060816U CN 202533397 U CN202533397 U CN 202533397U
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- China
- Prior art keywords
- silicon chip
- microtome
- fixed
- testing agency
- test rod
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Abstract
The utility model discloses a detecting mechanism of a silicon wafer slicing machine, which is used for detecting broken steel wires of a wire mesh of the silicon wafer slicing machine. The detecting mechanism comprises a detecting rod arranged at the lower side of the wire mesh and fixed devices respectively fixed at two ends of the detecting rod; the fixed devices are locked on a machine stand shell of the silicon wafer slicing machine; and the detecting rod is electrically connected with the machine stand shell of the silicon wafer slicing machine through the fixed devices. In the silicon wafer slicing production process, when a steel wire in the wire mesh is broken, the steel wire is connected to the detecting rod under the action of gravity, and the detecting rod is connected with the machine stand shell of the silicon wafer slicing machine through the fixed devices, so that an electric control module signal is closed to be 1, and then, a corresponding alarm is shown through a program, the function of automatic broken wire detection is achieved, evacuation abnormality is avoided, and the evacuation rate is reduced.
Description
[technical field]
The utility model relates to the silicon chip microtome, relates in particular to a kind of testing agency of silicon chip microtome.
[background technology]
At present, to MB 271 multi-thread microtomes, utilize the guide wheel winding steel wire, and cloth becomes gauze between two guide wheels.In silicon chip cutting production run, when the steel wire in the gauze breaks when falling, the steel wire that falls of breaking continues to twine with guide wheel, causes the silicon rod counterpart steel wire of certain-length to find time, and causes the silicon rod in the cutting to scrap, thereby directly causes cost allowance.
[utility model content]
Based on this, be necessary to provide a kind of and can detect the break testing agency of the silicon chip microtome that falls of steel wire.
A kind of testing agency of silicon chip microtome; Be used to detect the steel wire that falls that breaks of silicon chip microtome gauze; The stationary installation that it comprises the test rod that is arranged at said gauze downside and is individually fixed in said test rod two ends; Said stationary installation is locked in the board shell of said silicon chip microtome, and said test rod electrically connects through the board shell of said stationary installation and said silicon chip microtome.
In a preferred embodiment, said stationary installation comprise locking said test rod two ends binding ring, with said binding ring fixing and fix the fixed support of said test rod and connect said fixed support and be fixed in the fixed supported slab of the board shell of said silicon chip microtome mutually.
In a preferred embodiment, the limiting section of spacing said test rod when also being included in said fixed support with respect to the rotation of said fixed supported slab, said limiting section is arranged on the said fixed supported slab.
In a preferred embodiment, said limiting section is the spacing pillar that is convexly set on the said fixed supported slab.
In a preferred embodiment, the xsect of said test rod is a square.
In a preferred embodiment, said binding ring comprises locking hole and regulates the adjuster bar of said locking hole size.
In a preferred embodiment; Said locking hole comprise the endoporus of accommodating said test rod and along subscriber to connecting endoporus and extraneous opening; Said binding ring also comprise along perpendicular to subscriber to the adjustment hole that runs through said opening, said adjuster bar is the screw rod that is contained in the adjustment hole.
In a preferred embodiment, said fixed support comprises the fixed orifice of fixing said test rod and the mating holes that cooperates with said fixed supported slab, and said fixed orifice and said mating holes are provided with at interval.
In a preferred embodiment, said fixed supported slab comprises main part, and convexes with confession mating holes sheathed fixed leg and described spacing pillar, said fixed leg and said spacing pillar spacer setting from said main part respectively.
In a preferred embodiment, said main part is provided with holding hole, and the testing agency of said silicon chip microtome also comprises the fixture that passes holding hole and fixed supported slab is immobilizated in the silicon chip microtome.
In silicon chip cutting production run, when the steel wire in the gauze breaks when falling, the steel wire gravitate will snap on the test rod; Test rod is through the board shell conducting of stationary installation and line microtome; Thereby automatically controlled module signal closes is 1, and then reveals corresponding warning through program list, realizes the function that broken string detects automatically; Avoid finding time taking place unusually, reduce evacuation rate.
[description of drawings]
Fig. 1 is installed on the synoptic diagram of silicon chip microtome for the pick-up unit of silicon chip microtome;
Fig. 2 is installed on the synoptic diagram of another angle of silicon chip microtome for the pick-up unit of silicon chip microtome shown in Figure 1;
Fig. 3 is the synoptic diagram of test rod;
Fig. 4 is the synoptic diagram of binding ring;
Fig. 5 is support bracket fastened synoptic diagram;
Fig. 6 is the synoptic diagram of fixed supported slab;
Fig. 7 is the synoptic diagram of another angle of fixed supported slab shown in Figure 6.
[embodiment]
Please join Fig. 1 to Fig. 2, a kind of testing agency 100 of silicon chip microtome is used to detect the steel wire that falls that breaks of silicon chip microtome gauze 200, the stationary installation 150 that it comprises the test rod 110 that is arranged at gauze 200 downsides and is individually fixed in test rod 110 two ends.Stationary installation 150 is locked in the board shell 300 of silicon chip microtome, and test rod 110 electrically connects through the board shell 300 of stationary installation 150 with the silicon chip microtome.Stationary installation 150 comprise locking test rod 110 two ends binding ring 120, with binding ring 120 mutually fixing and fixed test bar fixed support 130 and connection fixed support 130 and be fixed in the fixed supported slab 140 of the board shell 300 of silicon chip microtome.
In silicon chip (not shown) cutting production run, when in the gauze 200 have steel wire to break to fall the time, the steel wire gravitate will snap on the test rod 110; Test rod 110 is through board shell 300 conductings of stationary installation 150 with the line microtome; Thereby automatically controlled module signal closes is 1, and then reveals corresponding warning through program list, realizes the function that broken string detects automatically; Avoid finding time taking place unusually, reduce evacuation rate.
Concrete, please join Fig. 1 to Fig. 7, the limiting section 141 of spacing test rod 110 when the testing agency 100 of silicon chip microtome also comprises fixed support 130 with respect to fixed supported slab 140 rotations, limiting section 141 is arranged on the fixed supported slab 140.In the concrete embodiment, limiting section 141 is for being convexly set in the spacing pillar on the fixed supported slab 140.Test rod 110 in use is close to gauze; And when the silicon chip microtome in maintenance or when changing guide wheel etc.; Then need test rod 110 to abdicate certain position; At this moment, just need fixed support 130 with respect to fixed supported slab 140 rotating certain angle, and limiting section 141 has well guaranteed rotational angle.
The xsect of test rod 110 is a square, and this kind shape can have good conducting effect when the steel wire contact overlaps at test rod 110, and can prevent test rod 110 flexural deformations, and is easily firm when being fixed in fixed support in addition.
Fixed support 130 comprises the fixed orifice 131 of fixed test bar 110 and the mating holes 132 that cooperates with fixed supported slab 140, and fixed orifice 131 is provided with mating holes 132 at interval.The symmetria bilateralis of locking hole 121 is distributed with locking connecting hole 125, and the symmetria bilateralis of fixed orifice 131 is distributed with and is fixedly connected hole 133, and the testing agency 100 of silicon chip microtome also comprises connection locking connecting hole 125 and the securing member that is fixedly connected hole 133 (not shown).With this, with test rod 110 held stationary on fixed support 130.
Fixed supported slab 140 comprises that main part 142 and autonomous respectively body 142 convex with fixed leg 143 and the described spacing pillar that supplies mating holes 132 sheathed.Fixed leg 143 and spacing pillar spacer setting, and line and horizontal line between anchor post 140 fixing back fixed legs 143 and spacing pillar are the acute angle setting.Can make the position that test rod 110 is positioned to be needed like this.
The silicon chip microtome is provided with a pair of guide wheel 400, is provided with test rod 110 near each guide wheel 400.So, no matter steel wire from which guide wheel 400 drops, and all can guarantee to snap on the test rod 110 and by detecting promptly and accurately, and then reach the unusual rate of finding time that reduces, and realizes reducing the purpose of scrapping.
The above embodiment has only expressed several kinds of embodiments of the utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model claim.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the utility model design, can also make some distortion and improvement, these all belong to the protection domain of the utility model.Therefore, the protection domain of the utility model patent should be as the criterion with accompanying claims.
Claims (10)
1. the testing agency of a silicon chip microtome; Be used to detect the steel wire that falls that breaks of silicon chip microtome gauze; It is characterized in that; The stationary installation that it comprises the test rod that is arranged at said gauze downside and is individually fixed in said test rod two ends, said stationary installation are locked in the board shell of said silicon chip microtome, and said test rod electrically connects through the board shell of said stationary installation and said silicon chip microtome.
2. the testing agency of silicon chip microtome according to claim 1; It is characterized in that, said stationary installation comprise locking said test rod two ends binding ring, with said binding ring fixing and fix the fixed support of said test rod and connect said fixed support and be fixed in the fixed supported slab of the board shell of said silicon chip microtome mutually.
3. the testing agency of silicon chip microtome according to claim 2 is characterized in that, the limiting section of spacing said test rod when also being included in said fixed support with respect to the rotation of said fixed supported slab, and said limiting section is arranged on the said fixed supported slab.
4. the testing agency of silicon chip microtome according to claim 3 is characterized in that, said limiting section is the spacing pillar that is convexly set on the said fixed supported slab.
5. the testing agency of silicon chip microtome according to claim 1 is characterized in that, the xsect of said test rod is a square.
6. the testing agency of silicon chip microtome according to claim 2 is characterized in that, said binding ring comprises locking hole and regulates the adjuster bar of said locking hole size.
7. the testing agency of silicon chip microtome according to claim 6; It is characterized in that; Said locking hole comprise the endoporus of accommodating said test rod and along subscriber to connecting endoporus and extraneous opening; Said binding ring also comprise along perpendicular to subscriber to the adjustment hole that runs through said opening, said adjuster bar is the screw rod that is contained in the adjustment hole.
8. the testing agency of silicon chip microtome according to claim 2 is characterized in that, said fixed support comprises the fixed orifice of fixing said test rod and the mating holes that cooperates with said fixed supported slab, and said fixed orifice and said mating holes are provided with at interval.
9. the testing agency of silicon chip microtome according to claim 4; It is characterized in that; Said fixed supported slab comprises main part, and convexes with confession mating holes sheathed fixed leg and described spacing pillar, said fixed leg and said spacing pillar spacer setting from said main part respectively.
10. the testing agency of silicon chip microtome according to claim 9 is characterized in that, said main part is provided with holding hole, and the testing agency of said silicon chip microtome also comprises the fixture that passes holding hole and fixed supported slab is immobilizated in the silicon chip microtome.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220060816XU CN202533397U (en) | 2012-02-23 | 2012-02-23 | Detecting mechanism of silicon wafer slicing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220060816XU CN202533397U (en) | 2012-02-23 | 2012-02-23 | Detecting mechanism of silicon wafer slicing machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202533397U true CN202533397U (en) | 2012-11-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201220060816XU Expired - Fee Related CN202533397U (en) | 2012-02-23 | 2012-02-23 | Detecting mechanism of silicon wafer slicing machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202533397U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103317608A (en) * | 2013-07-09 | 2013-09-25 | 江苏协鑫硅材料科技发展有限公司 | Line breaking detecting device of multi-line cutting machine |
| CN107808490A (en) * | 2017-11-21 | 2018-03-16 | 江苏兴达钢帘线股份有限公司 | A kind of split type anti-steel wire dropping device |
-
2012
- 2012-02-23 CN CN201220060816XU patent/CN202533397U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103317608A (en) * | 2013-07-09 | 2013-09-25 | 江苏协鑫硅材料科技发展有限公司 | Line breaking detecting device of multi-line cutting machine |
| CN103317608B (en) * | 2013-07-09 | 2016-08-10 | 江苏协鑫硅材料科技发展有限公司 | The broken thread detector of multi-line cutting machine |
| CN107808490A (en) * | 2017-11-21 | 2018-03-16 | 江苏兴达钢帘线股份有限公司 | A kind of split type anti-steel wire dropping device |
| CN107808490B (en) * | 2017-11-21 | 2023-11-24 | 江苏兴达钢帘线股份有限公司 | Split type steel wire falling prevention device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170331 Address after: 215153 Suzhou province high tech Zone, Jiangsu, No. five road, No. 69 Patentee after: Suzhou GCL Photovoltaic Technology Co., Ltd. Address before: 215153 Kunlun Road, Suzhou high tech Industrial Development Zone, Jiangsu, China, No. 68, No. Patentee before: GCL Artes Photovoltaic Technology Co. Ltd (Suzhou) |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121114 Termination date: 20200223 |