CN202522529U - High-resolution X-ray elliptical bent crystal spectrometer - Google Patents
High-resolution X-ray elliptical bent crystal spectrometer Download PDFInfo
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- CN202522529U CN202522529U CN2011205415506U CN201120541550U CN202522529U CN 202522529 U CN202522529 U CN 202522529U CN 2011205415506 U CN2011205415506 U CN 2011205415506U CN 201120541550 U CN201120541550 U CN 201120541550U CN 202522529 U CN202522529 U CN 202522529U
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Abstract
The utility model discloses a high-resolution X-ray elliptical bent crystal spectrometer which comprises an elliptical bent crystal and a detector. The high-resolution X-ray elliptical bent crystal spectrometer is characterized in that two focuses of the elliptical bent crystal are named as a front focus and a rear focus according to the light beam heading direction; the front focus is provided with a radiation light source; the rear focus is provided with a filter sheet slit component, and the rear focus is positioned in a slit of the filter sheet slit component; and a light path emitted by the radiation light source is provided with a glancing incidence lens device. The high-resolution X-ray elliptical bent crystal spectrometer disclosed by the utility model has large spectrum window and good light collecting efficiency, is long in operation distance, easy to debug and convenient to use, and meanwhile, has high actual measurement spectral resolution and signal-to-noise ratio. Compared with the similar types of instruments, the high-resolution X-ray elliptical bent crystal spectrometer has the advantages that the signal-to-noise ratio of a spectrogram is improved by 3 times, and the spectral resolution (lambda/delta lambda) can reach 1000.
Description
Technical field
The utility model relates to bent crystal spectrometer, the oval bent crystal spectrometer of particularly a kind of high-resolution X ray.
Background technology
In experimental studies such as inertial confinement fusion (Inertial Confinement Fusion is called for short ICF) field, also exist many arguements to wait to solve, due to some resolution just because of spectrometer does not reach.In addition, the resolution of spectrometer also is the important indicator that the spectrometer development is pursued.
The physical process of laser conversion X ray comprises procedure problem such as laser absorption, electronics heat transfer, nonequilibrium radiation fluid mechanics and atomic power, and phenomenon is very complicated.Include a large amount of plasmoid information in the X ray line spectrum of plasma resonance and the radiation continuous spectrum, because these radiation X ray intensity and line contour are fully by the abundance decision of electron temperature, electron density, ion temperature, ion concentration and the various ions of plasma.Therefore diagnose the X-ray energy spectrum of laser plasma emission, in experimental studies such as laser and matter interaction, x-ray laser, ICF and laser plasma X-ray light source, play important effect.Therefore; The X ray crystal spectrometer grows up under such background just; And in experimental studies such as x-ray laser and ICF field, for obtaining more high-precision data, observe the theoretical phenomenon of being foretold, and find to have brought into play important effect in the process of the new rule of new phenomenon.
Crystal spectrometer can be divided into by structure type: types such as flat crystal spectrometer, convex surface crystal spectrometer and concave surface bended crystal spectrometer.The concave surface bended crystal spectrometer comprises: Johann type crystal spectrometer, Johansso type crystal spectrometer, VonHamos type crystal spectrometer, sphere crystal spectrometer, hypersphere crystal spectrometer, logarithmic spiral crystal spectrometer also have oval bent crystal spectrometer etc.
The survey spectral method of more various X ray crystal spectrometers can be found; Utilizing oval bent crystal beam split to carry out spectral measurement is overall target best techniques wherein; And oval bent crystal manufacture craft and price are very suitable at present, thereby are acknowledged as one of feasible again method of tool prospect.The oval bent crystal also be current uniquely can realize composing window, high resolution capacity greatly, good collection efficiency is arranged, long operating distance and the energy spectrometer that rolls into one such as easy to use; Utilize the singularity of elliptic geometry optical principle to suppress or screening experiment in a large amount of parasitic lights to the influence of useful information, make the X-ray spectrogram that obtains the high power spectrum resolution characteristic of high-contrast become possibility.For this reason, both at home and abroad colleges and universities, scientific research institutions are interested in especially oval flexure crystal spectrometer and applied research thereof, and have carried out number of research projects.At home; The most representative work of this respect is that Xiao Shali group of photoelectric project institute of University Of Chongqing is under the subsidy of national 863 high technology item; The light that utilizes elliptic geometry optics to send from a focus must converge at the character of another focus through oval concave reflection; In conjunction with Prague (Bragg) diffraction law: 2dsin θ=n λ, wherein d is that the interplanar of crystal is separated; θ is the Bragg angle of diffraction; N is that the order of diffraction is inferior; λ is a lambda1-wavelength.The oval bent crystal spectrometer of the X ray of photoelectric project institute of University Of Chongqing development, oval eccentricity and focal length are respectively 0.9586 and 1350mm, and figure is as shown in Figure 1 for its simple structure.0A, 0B are two focuses of the oval bent crystal 02 of the oval bent crystal spectrometer of X ray among the figure, the oval bent crystal 02 of band adjustment platform, detector 04.Principle of work: light source is placed on 0A point position, and the photoirradiation that light source sends is on the oval bent crystal 02, and the optical dispersion after the diffraction of the oval bent crystal 02 or reflection realizes spectrally resolved measurement on detector 04 diagnosis face.Utilize the oval bent crystal spectrometer of X ray; Adopt X-ray film or X ray CCD or X ray streak camera in succession as detector; On " starlight II " and " refreshing light II " laser aid, laser plasma radiation X ray power spectrum has been carried out measuring examination, and confirmed whether it produces a desired effect.But from relevant experimental data with X ray ellipse flexure crystal spectrometer measure spectrum, experimental result is not very good, and spectrum resolution characteristic (λ/Δ λ) only has 486 (referring to list of references: Xiao Shali, Tang Yuelin; Xiong Xiancai, Zhong Xianxin is noble and unsullied; The oval bent crystal spectrometer experimental study [J] of poplar state flood .X ray. optical precision engineering, 2004,12 (4): 415-419); Compare with the flat crystal spectrometer, actual measurement spectral resolution and signal to noise ratio (S/N ratio) do not have real raising, and differ greatly with theoretical value.Trace it to its cause, except that technology, have in high-temperature plasma; Because unusual high temperature, high pressure and extremely complicated electromagnetic field produce the magnetic fluid motion process of various complicacies, and produce various forms of radiation, the continuous spectrum of the radiation of existing freedom-free process and freedom-constraint process; The characteristic line spectrum that the radiation of bound-bound transition process is arranged again, power spectrum is abundant, can spectral limit generally be to several keV from tens eV; Even tens keV on a large scale; Only adopting filter disc to be difficult to obtain very gratifying result, mainly is that required true picture may blured even cover to the high energy X radiation, and diagnostic system is produced disadvantageous background radiation.In addition, the principal element that influences the power spectrum resolving power also has Bragg angle and dispersion angle.Corresponding to certain dispersion angle, Bragg angle is big more, and resolving power is high more; For certain Bragg angle, the more little resolving power of dispersion angle is just high more.Because the restriction of experiment condition, the raising of Bragg angle is limited, so in order to improve resolving power, will reduce dispersion angle as much as possible.But dispersion angle is relevant with several factors.Except that spectrometer is arranged caused by factors broadening of spectral lines (for example natural broadening, dopplerbroadening, field cause broadening, collision broadening etc.); Also have the influence of the inherent caused by factors broadening of spectral lines of crystal spectrometer (as because diffraction characteristic and the analyzing crystal structure itself of crystal, and the broadening that causes of the spatial discrimination ability of the broadening that causes along with variation of temperature of the grating constant of the broadening that causes of the defective that causes of crystal processing and fabricating, crystal, detector, the caused broadening of geometrical aberration that causes of crystal and light source space size etc. in addition) to the measured spectrum resolution characteristic.In practical application, can't fully highlight self advantage and potential based on the oval bent crystal of X ray, exist the power spectrum resolution characteristic not high with realistic problems such as signal to noise ratio (S/N ratio) is undesirable.It is very necessary addressing the above problem.
Summary of the invention
The purpose of the utility model is to overcome the technical deficiency of the oval bent crystal spectrometer of above-mentioned existing X ray, proposes the oval bent crystal spectrometer of a kind of high-resolution X ray, and this bent crystal spectrometer should have higher measured spectra resolution, the better spectrogram of signal to noise ratio (S/N ratio).
The technical solution of the utility model is following:
The oval bent crystal spectrometer of a kind of high-resolution X ray; Comprise the oval bent crystal and detector; Two focuses that it is characterized in that the described oval bent crystal are called front focus and back focus by the light beam working direction, in described front focus radiating light source are set, and in described back focus filter disc slit assembly are set; And back focus is arranged in the slit of this filter disc slit assembly, and the glancing incidence lens device is set on the light path that radiating light source sends.
The formation of described filter disc slit assembly is that filter disc frame and rectangular slit is overlapping and be fixed on the combo box.
Described glancing incidence lens device is made up of level crossing and light barrier; One side of this light barrier and formation logical light narrow slit vertical with described glancing incidence mirror plane; Guarantee that the light that light source sends only limits to just can incide on the described oval bent crystal through the light of described flat mirror reflects, and form the diffraction beam split.
Described diagnostic system is X-ray film, imaging plate (Imaging plate is called for short IP) or X ray CCD camera.
The technique effect of the utility model is following:
The utility model utilizes Ray-tracing Method in the oval bent crystal spectrometer of X ray; Increase glancing incidence mirror, filter disc and slit assembly optical element and carried out modeling and simulating; The oval bent crystal spectrometer of original X ray is not done any change, can reach 3 times of the signal to noise ratio (S/N ratio)s and the measured spectrum resolution characteristic that improve spectrogram effectively and reach 1000.Simultaneously, these simulated properties have also obtained further embodiment or confirmation in the comprehensive examination to the oval bent crystal spectrometer of high-resolution X ray on " refreshing light II " laser aid.
Description of drawings
Fig. 1 is oval bent crystal structure of existing X ray and principle of work simple diagram
Among the figure: 0A, 0B are respectively oval two focuses; Light emitting source is positioned at 0A; The 02 oval bent crystal; 04 detector.
Fig. 2 is the structure diagram of the oval bent crystal spectrometer of the utility model high-resolution X ray.
Among the figure: A, B are respectively the front focus and the back focus of the oval bent crystal; Light emitting source is positioned at A; 1-glancing incidence mirror system; The oval bent crystal of 2-; 3-filter disc and slit assembly; The 4-detector.
Fig. 3 slit and filter disc modular construction synoptic diagram
Among the figure: 31 combo boxes; 32 adjustable slits, scope: 0.1～10mm; 33 filter disc frames.
Fig. 4 is for there being the spectrum synoptic diagram figure of articulation point on the utility model device light path.
Fig. 5 is the original spectrogram of titanium ion spectral line of IP record
Fig. 6 is the titanium ion spectral line average luminous intensity distribution plan after Fig. 5 space integral
Fig. 7 is the aluminium ion spectral line original graph of CCD record
Fig. 8 is the aluminium ion spectral line average luminous intensity distribution plan after Fig. 7 space integral
Embodiment
Below in conjunction with embodiment and accompanying drawing the utility model is described further, but not should with this limit the utility model can scope.
See also Fig. 2 earlier, Fig. 2 is the structure diagram of the oval bent crystal spectrometer of the utility model high-resolution X ray.Visible by figure; The oval bent crystal spectrometer of the utility model high-resolution X ray comprises the oval bent crystal 2 and detector 4, and two focuses of the described oval bent crystal 2 are called front focus A and back focus B by the light beam working direction; At described front focus A radiating light source is set; At described back focus B filter disc slit assembly 3 is set, and back focus B is arranged in the slit of this filter disc slit assembly 3, glancing incidence lens device 1 is set on the light path that radiating light source sends.
The characteristics of the oval bent crystal spectrometer of the utility model high-resolution X ray:
One of which; Be between the light source and the oval bent crystal, to increase a glancing incidence lens device; Utilize the total reflection characteristic of glancing incidence mirror to block the sigmatron in the experiment; Described glancing incidence lens device 1 is made up of level crossing 11 and light barrier 12, and one side of this light barrier 12 is vertical with described glancing incidence mirror 11 planes and constitute logical light narrow slit, guarantees that light that light source sends only limits to just can incide on the described oval bent crystal 2 and form the diffraction beam split through the light that described level crossing 11 reflects.
Its two, be between the oval bent crystal and detector, to increase a filter disc and slit assembly, the formation of described filter disc slit assembly 3 is that filter disc frame 33 and rectangular slit 32 is overlapping and be fixed on the combo box 31.See figure Fig. 3 for details.Utilize the absorption characteristic of filter disc material, can decay through reasonably selecting material, thickness, even absorb the X ray of low energy region fully light; Utilize slit to limit oval bent crystal defective and dimension of light source influence degree to the wavelength parallax error; Through selection slit width reasonably; Can make the oval bent crystal actual measurement of X ray spectrogram that enough good spectral resolution and signal to noise ratio (S/N ratio) are arranged, form the oval bent crystal spectrometer of high-resolution X ray.
The photoirradiation that the pointolite of principle of work: front focus A sends reflects through glancing incidence to level crossing 11; Effectively be in the light through light barrier 12; Have only and let the light of having come through flat mirror reflects arrive to carry out diffraction or reflection on the oval bent crystal; Be dispersed on the detector 4 through filter and slit assembly 3 again, realize spectrally resolved diagnostic measures.Fig. 4 is for there being the spectrum synoptic diagram figure of articulation point on the utility model device light path.The use character express is: shown in the light intensity distributions figure (a) that light source sends, after the glancing incidence mirror reflection, light intensity distributions becomes figure (b), finds that from figure the X ray of high-energy section is blocked; Pass through the oval bent crystal again, light intensity distributions becomes figure (c), and continuous spectrum or quasi continuous spectrum have become line spectrum; Behind filter and slit assembly, light intensity distributions becomes figure (d) again, and the X ray of low energy region is absorbed, parasitic light is blocked, thereby makes and have good clear spectrogram to look like to become possibility on the detector.
Be the embodiment experimental result of the utility model device below:
Experiment case 1:
Lasing condition: frequency multiplication (λ=0.532 μ m); Energy is 1200J; The about 2.24ns of pulsewidth; Point is burnt; Crystalline material alpha-quartz
titanium target; Filter disc is 45 μ m titanium films, and slit width is 5mm, uses the IP record.The original spectrogram of titanium ion spectral line of Fig. 5 IP record.Fig. 6 is a titanium ion spectral line spectrogram.From Fig. 6, can release measured spectrum resolution characteristic (E/ Δ E) is 1105.
Experiment case 2:
Lasing condition: frequency multiplication (λ=0.532 μ m); Energy is 1000J, the about 2.1ns of pulsewidth, focal spot φ ≈ 230 μ m; Crystalline material alpha-quartz
aluminium target; Filter disc is 5 μ m aluminium films, and slit width is 5mm, receives image with CCD.The original spectrogram of aluminium ion spectral line of Fig. 7 CCD record.Fig. 8 is an aluminium ion spectral line spectrogram.From Fig. 8, can release measured spectra resolution characteristic (λ/Δ λ) is 982.6.
Claims (4)
1. the oval bent crystal spectrometer of a high-resolution X ray; Comprise the oval bent crystal (2) and detector (4); Two focuses that it is characterized in that the described oval bent crystal (2) are called front focus (A) and back focus (B) by the light beam working direction; (A) is provided with radiating light source in described front focus; In described back focus (B) filter disc slit assembly (3) is set, and back focus (B) is arranged in the slit of this filter disc slit assembly (3), glancing incidence lens device (1) is set on the light path that radiating light source sends.
2. the oval bent crystal spectrometer of high-resolution X ray according to claim 1 is characterized in that: the formation of described filter disc slit assembly (3) is that filter disc frame (33) and rectangular slit (32) is overlapping and be fixed on the combo box (31).
3. the oval bent crystal spectrometer of high-resolution X ray according to claim 1; It is characterized in that: described glancing incidence lens device (1) is made up of level crossing (11) and light barrier (12); One side of this light barrier (12) is vertical with described glancing incidence mirror (11) plane and constitute logical light narrow slit, guarantees that light that light source sends only limits to light through described level crossing (11) reflection and just can incide the described oval bent crystal (2) and go up and form the diffraction beam split.
4. according to the oval bent crystal spectrometer of each described high-resolution X ray of claim 1 to 3, it is characterized in that: described detector (4) is X-ray film, imaging plate or X ray CCD camera.
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| CN2011205415506U CN202522529U (en) | 2011-12-21 | 2011-12-21 | High-resolution X-ray elliptical bent crystal spectrometer |
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| CN104819987A (en) * | 2015-04-02 | 2015-08-05 | 中国工程物理研究院激光聚变研究中心 | Superhigh-spectral resolution X ray grazing incidence microimaging system |
| CN106842281A (en) * | 2017-03-06 | 2017-06-13 | 中国工程物理研究院激光聚变研究中心 | Multiresolution transmits cylinder Spectrometer |
| CN107807491A (en) * | 2017-11-02 | 2018-03-16 | 中国工程物理研究院上海激光等离子体研究所 | A kind of double sphere bent crystal imaging systems and its adjusting method for being used for zero astigmatic image error |
| CN105510955B (en) * | 2015-12-01 | 2018-07-13 | 中国工程物理研究院上海激光等离子体研究所 | The offline accurate adjustment of elliptically bent crystal spectrometer and the online accurate method for resetting collimation |
| JP2018189933A (en) * | 2017-05-12 | 2018-11-29 | コニカミノルタ株式会社 | Grating, x-ray talbot imaging device, and grating manufacturing method |
| CN109725343A (en) * | 2017-10-27 | 2019-05-07 | 曲阜师范大学 | The parallel Spectrometer device of parabola type X-ray off axis |
| CN113406133A (en) * | 2021-06-15 | 2021-09-17 | 上海科技大学 | X-ray free electron laser single-pulse online diagnosis energy spectrometer |
| CN113848224A (en) * | 2021-10-13 | 2021-12-28 | 北京大学 | Identification system for elements contained in sample |
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2011
- 2011-12-21 CN CN2011205415506U patent/CN202522529U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104819987A (en) * | 2015-04-02 | 2015-08-05 | 中国工程物理研究院激光聚变研究中心 | Superhigh-spectral resolution X ray grazing incidence microimaging system |
| CN104819987B (en) * | 2015-04-02 | 2018-03-16 | 中国工程物理研究院激光聚变研究中心 | The X ray glancing incidence micro imaging system that a kind of superelevation spectrum is differentiated |
| CN105510955B (en) * | 2015-12-01 | 2018-07-13 | 中国工程物理研究院上海激光等离子体研究所 | The offline accurate adjustment of elliptically bent crystal spectrometer and the online accurate method for resetting collimation |
| CN106842281A (en) * | 2017-03-06 | 2017-06-13 | 中国工程物理研究院激光聚变研究中心 | Multiresolution transmits cylinder Spectrometer |
| CN106842281B (en) * | 2017-03-06 | 2023-04-28 | 中国工程物理研究院激光聚变研究中心 | Multi-resolution transmission cylindrical surface flexural crystal spectrometer |
| JP2018189933A (en) * | 2017-05-12 | 2018-11-29 | コニカミノルタ株式会社 | Grating, x-ray talbot imaging device, and grating manufacturing method |
| CN109725343A (en) * | 2017-10-27 | 2019-05-07 | 曲阜师范大学 | The parallel Spectrometer device of parabola type X-ray off axis |
| CN107807491A (en) * | 2017-11-02 | 2018-03-16 | 中国工程物理研究院上海激光等离子体研究所 | A kind of double sphere bent crystal imaging systems and its adjusting method for being used for zero astigmatic image error |
| CN113406133A (en) * | 2021-06-15 | 2021-09-17 | 上海科技大学 | X-ray free electron laser single-pulse online diagnosis energy spectrometer |
| CN113848224A (en) * | 2021-10-13 | 2021-12-28 | 北京大学 | Identification system for elements contained in sample |
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