CN202512232U - Connection detecting device of voltage-withstanding tester - Google Patents
Connection detecting device of voltage-withstanding tester Download PDFInfo
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- CN202512232U CN202512232U CN201220127592XU CN201220127592U CN202512232U CN 202512232 U CN202512232 U CN 202512232U CN 201220127592X U CN201220127592X U CN 201220127592XU CN 201220127592 U CN201220127592 U CN 201220127592U CN 202512232 U CN202512232 U CN 202512232U
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Abstract
The utility model discloses a connection detecting device of a voltage-withstanding tester. The connection detecting device of the voltage-withstanding tester comprises an impedance detecting module, a programmable logic gate, a microprocessor, and a high voltage output module. The impedance detecting module is used for an electric connection between the connection detecting device of the tester and a to-be-detected product, and produces driving signals. The microprocessor receives signals of the programmable logic gate, and controls the high voltage output module according to a connection condition between the connection detecting device of the tester and the to-be-detected product. That a contact between the to-be-detected product and the connection detecting device of the tester is reliable or not can be monitored in the whole course of detecting, reliability of detection results is improved, and detecting quality of the to-be-detected product is guaranteed. The detecting of the to-be-detected product can be fully guaranteed to proceed in a good connection state, and accuracy of final detection results can be guaranteed.
Description
Technical field
The utility model relates to the voltage-withstand test technical field, is specifically related to a kind of joint detection device of dielectric strength tester.
Background technology
In order to ensure the practical safety of product, electric type product especially, it all can carry out safety test before manufacturing is rolled off the production line, like leakage current test, voltage-withstand test.In recent years, the test volume of stipulating because of relevant laws and regulations increased year by year, and test procedure requires more rigorous, can check out the product to be measured of defective products or critical defective products really with expectation.At present; Most electrical equipment manufacturer adopts traditional test modes or traditional test circuit structure, and still, whether this traditional test mode or test circuit structure are difficult in before the test and to contacting reliably between testing apparatus and the product to be measured detect; Though whether or it is reliable before product test to be measured, to detect contact; But whether reliable, these all can cause the reliability of product test quality to receive greatly to query, thereby can't guarantee product quality if also can't monitor its whole test process contact.
As shown in Figure 1, be the circuit theory diagrams of leakage current lower limit method of inspection.Utilize this mode whether to check reliably as product to be measured and Hi-pot test end in contact; There is a kind of problem; Because this kind mode be leakage current value according to product itself as basis for estimation, but the leakage current value that different product to be measured had is different, be not each product all be the same; Therefore on judging, cause the erroneous judgement phenomenon easily, this check system reliability is not high.
As shown in Figure 2, be the circuit theory diagrams of open capacitance method of inspection.Utilize the method to contact whether reliably check with high-voltage output end as product to be measured; There is a kind of problem equally; This mode is that an electric capacity is measured with the equivalence of product to be measured own; When test lead contact with product to be measured with two kinds of situation of breaking off under, formed electric capacity is vicissitudinous at the two ends of whole product to be measured, thereby can judge according to the front and back capacitance change and whether contact reliable foundation between test circuit and the product to be measured.But there are many parameters in this mode under the production inspection environment; Its product self capacity amount to be measured is not at every turn identical with electric capacity when test lead is opened a way; And when installing measurement jig or lead additional and change, its electric capacity also can change, and therefore also causes the erroneous judgement phenomenon easily.Therefore this check system reliability is not high yet.In addition because of must making a decision earlier before each test, thus the test duration be extended, cause the testing efficiency reduction, do not meet economic benefit.
As shown in Figure 3, be the circuit theory diagrams of resistance exposure test method.Utilize the method to contact whether reliably check with high-voltage output end as product to be measured; More reliable than aforesaid way or method in principle; But still there is a kind of problem; Therefore before the kind mode is before equipment uses or at every turn product test, install a resistance value checking circuit additional as whether contacting good basis for estimation.Whether the method is can check out really to contact well really; But the unreliable phenomenon that this mode can occur judging under the production inspection environment because of only before equipment uses, doing check, but can't guarantee not have in service time backward loose contact or broken string phenomenon; Or do check before each product test; Whether but can't in the whole checkout procedure of product, contact reliably by the monitoring product, therefore be prone to cause the erroneous judgement phenomenon yet, therefore this check system reliability is not high yet.Because of making a decision earlier before each test, therefore exist the test duration to be extended equally in addition, the shortcoming that testing efficiency is low does not meet economic benefit.
This shows,, be badly in need of the voltage-withstand test technology that a kind of testing reliability is good, testing efficiency is high in order to guarantee the reliability of test products.
The utility model content
The utility model provides a kind of joint detection device of dielectric strength tester, can solve the problem that withstand voltage survey device reliability is not high and testing efficiency is low.
The utility model provides a kind of joint detection device of dielectric strength tester, comprising:
Be electrically connected and produce driving signal between the impedance detection module, the joint detection device that is used to detect tester and product to be measured;
Programmable logic gate is used for that the driving signal of impedance detection module and setting signal are compared the back and produces and be connected decision signal and export to microprocessor;
Microprocessor is used to receive the connection decision signal of programmable logic gate and according to the startup that connects decision signal control high voltage output module or cut out;
High voltage output module is used for producing the Hi-pot test signal according to the order of microprocessor.
Preferably; Said impedance detection module comprises at least one Low ESR conduction detection device and at least one high impedance conduction detection device; Isolate induction installation and isolated power supply, wherein, isolated power supply is that Low ESR conduction detection device, high impedance conduction detection device and isolation induction installation provide working power; Low ESR conduction detection device and high impedance conduction detection device are connected to the isolation induction installation, isolate induction installation and export said programmable logic gate to.
Preferably, said isolation induction installation comprises a plurality of isolation sensor circuits, and each Low ESR conduction detection device or high impedance conduction detection device all are connected with one and isolate sensor circuit; Said isolated power supply comprises a plurality of insulating power supplies, and each Low ESR conduction detection device or high impedance conduction detection device all connect an insulating power supply.
Preferably, high voltage output module comprises master controller and high pressure generating apparatus, and master controller is connected to described microprocessor through the I/O controller, and high pressure generating apparatus is connected in master controller.
Preferably, be connected with the warning indicating device on the said microprocessor.
Preferably, said microprocessor also is connected with the remote control control module that is used to receive the remote test control signal.
Preferably, said high voltage output module also comprises a plurality of Hi-pot test passages, and said Hi-pot test passage connects the high-pressure side and the low pressure end of high pressure generating apparatus respectively, has the gating switch that is used to select high-pressure side output or low pressure end output in the Hi-pot test passage.
Technique scheme can be found out; Because the utility model embodiment adopts the impedance detection module that test loop is detected in real time; And in time detected connection decision signal being sent to microprocessor, microprocessor in time controls high voltage output module and opens or cut out output, so the joint detection device of the dielectric strength tester that provides of the utility model embodiment is compared with existing withstand voltage test method or voltage-withstand test structure; Can realize that test is omnidistance (before comprising test; In the test) whether contacting between the joint detection device of product to be measured and tester is reliably monitored, improved reliability of testing result, guaranteed the test mass of product to be measured; And can realize intelligence test, and in time close high pressure output for the situation of loose contact that occurs in the test process or short-term, guaranteed safety of products to be measured; Need not before the test parameter of testing apparatus or product to be measured is made a decision, directly access can be tested, and has promoted testing efficiency.
Description of drawings
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiment of the utility model, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the circuit theory diagrams of leakage current lower limit method of inspection in the prior art;
Fig. 2 is the circuit theory diagrams of open capacitance method of inspection in the prior art;
Fig. 3 is the circuit theory diagrams of resistance exposure test method in the prior art;
Fig. 4 is the structure principle chart of the joint detection device of single channel dielectric strength tester among the utility model embodiment 1;
Fig. 5 is anti-conduction detection device of the utility model embodiment 1 medium or low resistance and the circuit theory diagrams of isolating sensor circuit;
Fig. 6 is a high impedance conduction detection device and the circuit theory diagrams of isolating sensor circuit among the utility model embodiment 1;
Fig. 7 (a) is the structure principle chart of the joint detection device of multichannel dielectric strength tester among the utility model embodiment 2;
Fig. 7 (b) is the structure principle chart of high impedance conduction detection module among the utility model embodiment 2;
Fig. 7 (c) is the structure principle chart of the anti-conduction detection module of the utility model embodiment 2 medium or low resistances.
Embodiment
To combine the accompanying drawing among the utility model embodiment below, the technical scheme among the utility model embodiment is carried out clear, intactly description, obviously, described embodiment only is the utility model part embodiment, rather than whole embodiment.Based on the embodiment in the utility model, those of ordinary skills are not making all other embodiment that obtained under the creative work prerequisite, all belong to the scope of the utility model protection.
Embodiment 1:
The utility model embodiment provides a kind of joint detection device of dielectric strength tester, and is as shown in Figure 4, comprises impedance detection module 1, programmable logic gate 2, microprocessor 3 and high voltage output module 4.Wherein, high voltage output module 4, programmable logic gate 2 all are connected in microprocessor 3, and the input end of impedance detection module 1 is connected in the tie point of high voltage output module 4 and product to be measured, and the output terminal of impedance detection module 1 is connected to programmable logic gate 2.
Be electrically connected and produce driving signal between the joint detection device that impedance detection module 1 is used to detect tester and the product to be measured, promptly detect the joint detection device of tester and whether reliably contact with electric property between the product to be measured.It is understandable that; Impedance detection module 1 contacts the reliable or unreliable driving signal that all can produce at the joint detection device of tester with product to be measured; But the driving signal that is produced under the reliable situation in contact is with to contact the driving signal that insecure situation produces different; This driving signal belongs to voltage signal, therefore judges through the voltage magnitude of driving signal whether contact is reliable.The utility model embodiment middle impedance detection module 1 comprises a Low ESR conduction detection device 11 and high impedance conduction detection device 12; Isolate induction installation 13 and isolated power supply 14; Wherein, Isolated power supply 14 provides working power for Low ESR conduction detection device 11, high impedance conduction detection device 12 and isolation induction installation 13; Low ESR conduction detection device 11 is connected to high impedance conduction detection device 12 isolates induction installation 13, isolates induction installation 13 and exports said programmable logic gate 2 to.
Because the resistance test device that the utility model is executed in the example has included only a Low ESR conduction detection device and a high impedance conduction detection device; Therefore the resistance test device among the utility model embodiment is defined as single channel resistance test device, the respectively corresponding passage of each Low ESR conduction detection device or high impedance conduction detection device.Test under the duty that suspends fully for the joint detection device that guarantees this tester, Low ESR conduction detection device 11, high impedance conduction detection device 12, isolation induction installation 13 and isolated power supply 14 all adopt floating ground.
In order to guarantee that each passage all is in independently state, said isolation induction installation 13 comprises a plurality of isolation sensor circuits, and each Low ESR conduction detection device or high impedance conduction detection device all are connected with one and isolate sensor circuit; Said isolated power supply 14 comprises a plurality of insulating power supplies, and each Low ESR conduction detection device or high impedance conduction detection device all connect an insulating power supply.
Fig. 5 shows the connected mode of each Low ESR conduction detection device and single insulating power supply and single isolation sensor circuit among the utility model embodiment, among Fig. 5, isolates sensor circuit 131 and is connected with testing circuit in the Low ESR conduction detection device 11; Among the utility model embodiment, the testing circuit in the Low ESR conduction detection device 11 adopts the current detecting principle, and wherein H end and L end are end to be measured; Be the two ends that product 18 to be measured is connected with the joint detection device of dielectric strength tester; If end to be measured connects good (contact is reliable), the inside of product 18 to be measured is equivalent to the resistance of a less resistance, and then electric current flows to the L end by the H end; And then on resistance R 18, produce voltage; Can change with the voltage of optocoupler U1 between its pin one and pin 4 in the isolation sensor circuit 131 that Low ESR conduction detection device 11 is connected this moment, thereby change the voltage at its pin 3 places, realized end change in current to be measured is converted into the process of change in voltage; Therefore; It is understandable that the pin of optocoupler U1 3 is driving signal through the voltage signal that R11 exported, the S1 end is connected to programmable logic gate 2 among Fig. 5.The VCK end is connected to insulating power supply.
Fig. 6 shows the connected mode of each high impedance conduction detection device and single insulating power supply and single isolation sensor circuit among the utility model embodiment.Among Fig. 6, isolate and isolate the same circuit structure of sensor circuit 131 employings among sensor circuit 132 and above-mentioned Fig. 5, its output terminal S2 is connected to programmable logic gate 2 equally; Repeat no more here; And the testing circuit of high impedance conduction detection device 12 adopts the voltage detecting principle, and wherein the M end is end to be measured with the N end, if is connected well (contacting reliably) between the joint detection device of product to be measured 18 and dielectric strength tester; The product to be measured 18 that then M holds and the N termination is gone into is equivalent to the resistance that impedance is very high; But do not open a way, the VDK end is connected to insulating power supply in the circuit, so electric current can flow to the N end by the M end; And on resistance 28, produce dividing potential drop; Thereby the complex pipe conducting that triode Q1 and triode Q3 are formed, and then voltage changes between the pin one of the optic coupling element U2 in the isolation sensor circuit 132 and the pin 4, finally on the pin 3 of optic coupling element U2, produces driving signal and exports driving signal to the S end by R21.If bad connection (it is unreliable to contact); Then the resistance of M end and N end increases or open circuit; Complex pipe ends; Voltage drop is low or reduces near 0 on the pin one of optic coupling element U2, so the voltage on the pin 3 of optic coupling element U2 can promote, thus so driving signal connection status that expression M end and N hold that changes.
High voltage output module 4 comprises master controller 41 and high pressure generating apparatus 42, and master controller 41 is connected to described microprocessor 3 through I/O controller 5, and high pressure generating apparatus 42 is connected in master controller 41.
Below in conjunction with Fig. 4 the principle of work of the joint detection device of the dielectric strength tester among the utility model embodiment is made an explanation.
It is understandable that; Do not have the product to be measured of transformer coil for other; It detects principle is the same; Therefore be equivalent to above-mentioned primary coil like the product power input, product casing then is equivalent to above-mentioned iron-core coil, and the mode of connection for the joint detection device of the dielectric strength tester of the product to be measured that does not have transformer coil and the utility model embodiment is that those skilled in the art can be known.In the introduction of above-mentioned impedance detection module 1; We can know; Low ESR conduction detection device 11 and high impedance conduction detection device 12 in the impedance detection module 1; Isolate induction installation 13 and isolated power supply 14, a suspended state detection loop down is provided, the zero potential RP that promptly detects the loop in the impedance detection module 1 is floating ground.So detection loop in the impedance detection module 1; With product 18 to be measured being provided the high pressure generating apparatus 42 of Hi-pot test is under the suspended state of isolating, to detect; Therefore can be in whole Hi-pot test process to product contact keep watch on detection, can be because of producing influence to detecting the loop in the Hi-pot test to test.
After the joint detection device of dielectric strength tester and product to be measured 18 connected; Start isolated power supply 14; Low ESR conduction detection device 11, high impedance conduction detection device 12 and isolation induction installation 13 are started working, and it is understandable that isolated power supply 14 comprises a plurality of insulating power supplies among the utility model embodiment; Each independent current source is independently-powered respectively with high impedance conduction detection device 12 to Low ESR conduction detection device 11; Certainly isolated power supply 14 also can adopt the insulating power supply with many output controls, but the insulating power supply cost of many output controls is higher, and does not have the independently-powered isolation effect of independent insulating power supply good.
At the beginning of the test; Connect the joint detection device and product to be measured 18 of dielectric strength tester according to aforesaid way after; Isolated power supply 14 starts Low ESR conduction detection device 11 and high impedance conduction detection device 12 simultaneously; Low ESR conduction detection device 11 is to utilize the end size of current principle to be measured of flowing through to judge; This end to be measured is two links that product to be measured inserts the joint detection device of dielectric strength tester, and high impedance conduction detection device 12 is to utilize terminal impedance size gained partial pressure value principle to be measured to judge.Low ESR conduction detection device 11 produces the two-way driving signals at connected isolation induction installation 21 and isolation induction installation 22 respectively with high impedance conduction detection device 12, and the two-way driving signal exports on the programmable logic gate 2 simultaneously, the setting signal that programmable logic gate 2 receives on the microprocessors 3; If being arranged in the two-way driving signal, any one tunnel driving signal represented bad connection (it is unreliable to contact); Then programmable logic gate 2 will be sent to microprocessor 3 with comparative result through inner comparing unit, and 3 of microprocessors can be controlled the warning indicating device and give the alarm, and operating personnel connect product to be measured again; Show connection good (contact is reliable) up to microprocessor 3 control warning indicating devices 31; At this moment, operating personnel press the start key on the telepilot under situation unmanned around the discharge testing apparatus, after remote control control module 32 receives enabling signal; Enabling signal is sent to microprocessor 3; Microprocessor 3 is sent to the master controller 41 of high voltage output module through I/O controller 5 with enabling signal, and master controller 41 just starts high pressure generating apparatus 42 at high pressure HV end output high pressure, low pressure LV end for high pressure generating apparatus with reference to zero potential; Thereby get into the voltage-withstand test stage;, perhaps connect when breaking off if occur bad connection (it is unreliable to contact) suddenly in the stage at voltage-withstand test, impedance detection module 1 can produce the driving signal of expression bad connection equally; Issue microprocessor 3 via programmable logic gate 2; Microprocessor 3 can in time be issued master controller 41 through I/O controller 5 with shutdown signal, in time closes high pressure generating apparatus 42 by master controller 41, and while microprocessor 3 also can be controlled warning indicating device 31 and give the alarm; Alert connects product 18 to be measured again, and then gets into test phase again.
Embodiment 2:
As shown in Figure 7; The joint detection device of the dielectric strength tester among the utility model embodiment has a plurality of high impedance conduction detection devices and a plurality of Low ESR conduction detection device, and the joint detection device that therefore defines the dielectric strength tester among the utility model embodiment is the joint detection device of multichannel dielectric strength tester.
In the joint detection device of the dielectric strength tester of the utility model embodiment; Its high voltage output module 7 also comprises a plurality of Hi-pot test passages; The high-pressure side HV end and the low pressure end LV end that connect high pressure generating apparatus like Fig. 7 (a) mesohigh TCH test channel 71 respectively; High-pressure side HV end is high-voltage output terminal in fact, and low pressure end LV end is high pressure zero potential reference edge in fact.Has the gating switch that is used to select high-pressure side output or low pressure end output in the Hi-pot test passage 71.Therefore, each Hi-pot test passage (CH, CH1 ... CHn) all can select as high-voltage output end or high pressure zero potential reference edge by gating switch.
The utility model embodiment middle impedance detection module 101 is slightly different with impedance detection module 1 in the foregoing description 1; Impedance detection module 101 among the utility model embodiment has 1 high impedance conduction detection module 100 and a plurality of Low ESR conduction detection modules (110,111 ... 11n); Said its circuit structure of high impedance conduction detection module is shown in Fig. 7 (b); Constitute by high impedance conduction detection device 1011, isolation induction installation 1012 and insulating power supply 1013; For connection and the principle of work between high impedance conduction detection device 1011, isolation induction installation 1012 and the insulating power supply; Can repeat no more referring to the detailed introduction in the foregoing description 1 here.Said its circuit structure of Low ESR conduction detection module is made up of Low ESR conduction detection device 1021, isolation induction installation 1022 and insulating power supply 1023 shown in Fig. 7 (c).
It is understandable that; A kind of improved form as the utility model embodiment; High impedance conduction detection module in the impedance detection module 101 and Low ESR conduction detection module form with integrated mode; Number of combinations and form can be made combination in any according to testing requirement; Promptly can be combined to form by a high impedance conduction detection module and a plurality of Low ESR conduction detection module, also can be combined to form by a Low ESR conduction detection module and a plurality of high impedance conduction detection module, can also be to detect module by a plurality of high impedance conduction detection modules and a plurality of Low ESR to be combined to form.Said its circuit structure of high impedance conduction detection module is shown in Fig. 7 (b); Constitute by high impedance conduction detection device 1011, isolation induction installation 1012 and insulating power supply 1013; For connection and the principle of work between high impedance conduction detection device 1011, isolation induction installation 1012 and the insulating power supply; Can repeat no more referring to the detailed introduction in the foregoing description 1 here.Said its circuit structure of Low ESR conduction detection module is made up of Low ESR conduction detection device 1021, isolation induction installation 1022 and insulating power supply 1023 shown in Fig. 7 (c).
It is understandable that; The joint detection device of the multichannel dielectric strength tester among the utility model embodiment is with respect to the joint detection device of the single channel dielectric strength tester in the foregoing description 1; Low ESR conduction detection device and/or high impedance conduction detection device have structurally been increased; And principle of work still with embodiment 1 in the joint detection device of single channel dielectric strength tester identical; Therefore can repeat no more referring to the detailed introduction among the embodiment 1 for other part introductions of the joint detection device of multichannel dielectric strength tester here.
The joint detection device of the multichannel dielectric strength tester among the utility model embodiment can be tested a plurality of products to be measured simultaneously, therefore compares the joint detection device of the single channel dielectric strength tester among the embodiment 1, and its work efficiency is greatly improved.
More than the joint detection device and the joint detection method thereof of dielectric strength tester that the utility model embodiment is provided carried out detailed introduction; Used concrete example among this paper the principle and the embodiment of the utility model are set forth, the explanation of above embodiment just is used to help to understand the core concept of the utility model; Simultaneously, for one of ordinary skill in the art, according to the thought of the utility model, the part that on embodiment and range of application, all can change, in sum, this description should not be construed as the restriction to the utility model.
Claims (8)
1. the joint detection device of dielectric strength tester is characterized in that, comprising:
Be electrically connected and produce driving signal between the impedance detection module, the joint detection device that is used to detect tester and product to be measured;
Programmable logic gate is used for that the driving signal of impedance detection module and setting signal are compared the back and produces and be connected decision signal and export to microprocessor;
Microprocessor is used to receive the connection decision signal of programmable logic gate and according to the startup that connects decision signal control high voltage output module or cut out;
High voltage output module is used for producing the Hi-pot test signal according to the order of microprocessor.
2. the joint detection device of dielectric strength tester as claimed in claim 1; It is characterized in that: said impedance detection module comprises at least one Low ESR conduction detection device and at least one high impedance conduction detection device; Isolate induction installation and isolated power supply; Wherein, Isolated power supply is that Low ESR conduction detection device, high impedance conduction detection device and isolation induction installation provide working power, and Low ESR conduction detection device and high impedance conduction detection device are connected to the isolation induction installation, isolate induction installation and export said programmable logic gate to.
3. the joint detection device of dielectric strength tester as claimed in claim 2; It is characterized in that: said isolation induction installation comprises a plurality of isolation sensor circuits, and each Low ESR conduction detection device or high impedance conduction detection device all are connected with one and isolate sensor circuit; Said isolated power supply comprises a plurality of insulating power supplies, and each Low ESR conduction detection device or high impedance conduction detection device all connect an insulating power supply.
4. like the joint detection device of claim 1 or 2 or 3 described dielectric strength testers; It is characterized in that: high voltage output module comprises master controller and high pressure generating apparatus; Master controller is connected to described microprocessor through the I/O controller, and high pressure generating apparatus is connected in master controller.
5. like the joint detection device of claim 1 or 2 or 3 described dielectric strength testers, it is characterized in that: be connected with the warning indicating device on the said microprocessor.
6. the joint detection device of dielectric strength tester as claimed in claim 5, it is characterized in that: said microprocessor also is connected with the remote control control module that is used to receive the remote test control signal.
7. like the joint detection device of claim 1,2 or 3 described dielectric strength testers; It is characterized in that: said high voltage output module also comprises a plurality of Hi-pot test passages; Said Hi-pot test passage connects the high-pressure side and the low pressure end of high pressure generating apparatus respectively, has the gating switch that is used to select high-pressure side output or low pressure end output in the Hi-pot test passage.
8. the joint detection device of dielectric strength tester as claimed in claim 6; It is characterized in that: said high voltage output module also comprises a plurality of Hi-pot test passages; Said Hi-pot test passage connects the high-pressure side and the low pressure end of high pressure generating apparatus respectively, has the gating switch that is used to select high-pressure side output or low pressure end output in the Hi-pot test passage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220127592XU CN202512232U (en) | 2012-03-29 | 2012-03-29 | Connection detecting device of voltage-withstanding tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201220127592XU CN202512232U (en) | 2012-03-29 | 2012-03-29 | Connection detecting device of voltage-withstanding tester |
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| Publication Number | Publication Date |
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| CN202512232U true CN202512232U (en) | 2012-10-31 |
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| CN201220127592XU Expired - Lifetime CN202512232U (en) | 2012-03-29 | 2012-03-29 | Connection detecting device of voltage-withstanding tester |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102590779A (en) * | 2012-03-29 | 2012-07-18 | 东莞帝佑仪器有限公司 | Connection detection device of dielectric strength tester and connection detection method thereof |
-
2012
- 2012-03-29 CN CN201220127592XU patent/CN202512232U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102590779A (en) * | 2012-03-29 | 2012-07-18 | 东莞帝佑仪器有限公司 | Connection detection device of dielectric strength tester and connection detection method thereof |
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Granted publication date: 20121031 |