CN202383065U - 透光率检测系统 - Google Patents
透光率检测系统 Download PDFInfo
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- CN202383065U CN202383065U CN201120563747XU CN201120563747U CN202383065U CN 202383065 U CN202383065 U CN 202383065U CN 201120563747X U CN201120563747X U CN 201120563747XU CN 201120563747 U CN201120563747 U CN 201120563747U CN 202383065 U CN202383065 U CN 202383065U
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CN201120563747XU CN202383065U (zh) | 2011-12-29 | 2011-12-29 | 透光率检测系统 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103487408A (zh) * | 2013-09-09 | 2014-01-01 | 华南理工大学 | 一种便携式玻璃透过率、反射率现场测试分光光度计 |
CN103852452A (zh) * | 2012-11-28 | 2014-06-11 | 海洋王(东莞)照明科技有限公司 | 透光率试验方法以及测试系统 |
CN104897619A (zh) * | 2015-05-08 | 2015-09-09 | 中国铝业股份有限公司 | 一种简易分辨尼龙66和尼龙mc的方法 |
CN109000884A (zh) * | 2018-05-04 | 2018-12-14 | 芜湖良匠机械制造有限公司 | 一种用于监测玻璃基板透光性的检测装置 |
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2011
- 2011-12-29 CN CN201120563747XU patent/CN202383065U/zh not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103852452A (zh) * | 2012-11-28 | 2014-06-11 | 海洋王(东莞)照明科技有限公司 | 透光率试验方法以及测试系统 |
CN103487408A (zh) * | 2013-09-09 | 2014-01-01 | 华南理工大学 | 一种便携式玻璃透过率、反射率现场测试分光光度计 |
CN104897619A (zh) * | 2015-05-08 | 2015-09-09 | 中国铝业股份有限公司 | 一种简易分辨尼龙66和尼龙mc的方法 |
CN109000884A (zh) * | 2018-05-04 | 2018-12-14 | 芜湖良匠机械制造有限公司 | 一种用于监测玻璃基板透光性的检测装置 |
CN109000884B (zh) * | 2018-05-04 | 2020-12-01 | 芜湖良匠机械制造有限公司 | 一种用于监测玻璃基板透光性的检测装置 |
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Owner name: KUNSHAN JINGXUN ELECTRONIC TECHNOLOGY CO., LTD. Free format text: FORMER OWNER: HOLY TEST TECHNOLOGY CO., LTD. Effective date: 20131218 |
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Free format text: CORRECT: ADDRESS; FROM: TAIWAN, CHINA TO: 215300 SUZHOU, JIANGSU PROVINCE |
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Effective date of registration: 20131218 Address after: 215300 science and Technology Plaza, Qianjin Science Park, Qianjin East Road, Kunshan Development Zone, Suzhou, Jiangsu Patentee after: Kunshan Jingxun Electronic Technology Co., Ltd. Address before: Lane 19, Lane 217, Lane five, Longtan Road, Taoyuan County, Taiwan, China 1 Patentee before: Holy-test Technology Co., Ltd. |
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Address after: 215300 No. 118, organ Road, Kunshan Development Zone, Jiangsu, Suzhou Patentee after: Kunshan Jingxun Electronic Technology Co., Ltd. Address before: 215300 science and Technology Plaza, Qianjin Science Park, Qianjin East Road, Kunshan Development Zone, Suzhou, Jiangsu Patentee before: Kunshan Jingxun Electronic Technology Co., Ltd. |
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Granted publication date: 20120815 |
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