CN202133706U - Inductive high sensitivity electricity testing apparatus - Google Patents

Inductive high sensitivity electricity testing apparatus Download PDF

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Publication number
CN202133706U
CN202133706U CN201120282431U CN201120282431U CN202133706U CN 202133706 U CN202133706 U CN 202133706U CN 201120282431 U CN201120282431 U CN 201120282431U CN 201120282431 U CN201120282431 U CN 201120282431U CN 202133706 U CN202133706 U CN 202133706U
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China
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circuit
electricity
cmos
pin
testing apparatus
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Expired - Fee Related
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CN201120282431U
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Chinese (zh)
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刘喆
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Individual
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Individual
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Abstract

The utility model belongs to the field of electric technology, and relates to an inductive high sensitivity electricity testing apparatus, which can be used for not only testing the dangerous voltage of electric appliances, but also testing the non-dangerous leakage voltage carried by the metal housing of the electric appliances or by metal bodies. The electricity testing apparatus comprises a direct current power supply DC, a CMOS integrated circuit, an induction probe TAN, an electricity testing indicating circuit, and a direct current power supply working state indicating circuit, and is characterized in that the type of the CMOS integrated circuit used in the circuit is CD4017. In order to overcome the defect that the prior electricity testing pen can not identify the non-dangerous induction electromotive force, the electricity testing apparatus uses the CMOS integrated circuit with very high input end impedance as the core component of the electricity testing apparatus circuit, and the circuit dispenses with a hand-contact electrode as a loop. When the electricity testing apparatus approaches an object with electricity, the electromotive force sensed by the induction probe, of the object with electricity is used for forming clock signals needed by the COMS integrated circuit, and for driving an LED D1 to light to indicate that whether the object to be tested is provided with electricity or not.

Description

The highly sensitive survey electric installation of induction type
Technical field
The utility model belongs to the application of electronic technology field, relates to the highly sensitive survey electric installation of a kind of induction type.
Background technology
The structure of test pencil commonly used is to be composed in series by surveying electrical contact, current-limiting resistance, neon tube, metal spring and hand touched electrode.Its principle is to survey electrical contact to contact with tested metal object, and staff contact hand touched electrode constitutes the loop, and when tested metal object had high voltage relative to the earth, the neon tube starter represented that tested metal object is charged.But; The metal shell or the metallic object of a lot of electrical appliances do not have the adventurous electric shock voltage of human body; Only the distributed capacitance induction through the electrical appliance metal section and part produces electromotive force; General test pencil can not be discerned the induction electromotive force of 50~90V, and whether electric leakages such as especially by day open air maintenance, detection line, equipment or electrical appliance bring very big difficulty, are easy to cause misjudgment.
Can not discern the deficiency of no dangerous induction electromotive force in order to overcome existing test pencil, be necessary to develop and a kind ofly can discern adventurous electric shock voltage, also can discern non-hazardous induction electromotive force survey electric installation.Below specify the relevant manufacturing technology of the highly sensitive survey electric installation of this induction type.
The utility model content
Goal of the invention and beneficial effect: the highly sensitive survey electric installation of induction type can detect the potential safety hazard that there is electric leakage in metal object, can test and show non-hazardous induction electromotive force.Utilize the very high CMOS integrated circuit CD4017 of sending-end impedance as the core parts of surveying the electric installation circuit; Circuit need not be provided with the hand touched electrode as the loop; Be used to form the required clock signal of CMOS IC 1 work with the electromotive force of surveying electric installation inductive probe induction charging metal object; Whether light light emitting diode D1 by CMOS IC 1 inner other drives then and indicate tested metal object charged, utilizing this technical scheme to develop becomes electrician's instrument used in everyday.
Overcome existing test pencil and can only discern adventurous electric shock voltage (that is: greater than 100V voltage), can not test the defective that 50~90V does not have dangerous induction electromotive force.Whether the utility model provides the highly sensitive survey electric installation of a kind of induction type can not only measure tested metal object charged; And the highly sensitive survey electric installation of induction type is used the wrapped with insulation inductive probe; When surveying the electric installation use; Inductive probe need not touch the live metal object, as long as can detect near charging zone, can effectively solve, remedy problem and defective that existing test pencil exists.
Technical characterictic: the highly sensitive survey electric installation of a kind of induction type, by direct supply DC, CMOS IC 1, inductive probe TAN, survey electric indicating circuit, direct supply duty indicating circuit and direct supply filtering circuit and form, its characteristic comprises:
The model that the CMOS integrated circuit uses in the circuit is CD4017;
Inductive probe TAN connects 14 pin of CMOS IC 1, and the material of inductive probe TAN is copper RVV, and the shape of inductive probe TAN is bent into down " U " shape;
Survey electric indicating circuit and form, 11 pin of a termination CMOS IC 1 of resistance R 1, the positive pole of the other end sending and receiving optical diode D1 of resistance R 1, the negative pole connection circuit ground GND of light emitting diode D1 by resistance R 1, light emitting diode D1;
16 pin of CMOS IC 1 connect the positive pole of direct supply DC, 8 pin of CMOS IC 1,13 pin and 15 pin connection circuit ground GND through keyswitch AN.
2. direct supply duty indicating circuit is made up of light emitting diode D2 and resistance R 2, it is characterized in that: the end of the anodal connecting resistance R2 of light emitting diode D2, the anodal VCC of the other end connection circuit of resistance R 2, the negative pole connection circuit ground GND of light emitting diode D2.
3. the anodal VCC of the anodal connection circuit of the electrochemical capacitor C1 in the direct supply DC filtering circuit, electrochemical capacitor C1 negative pole connection circuit ground GND.
The circuit working principle: what core circuit used is the very high CMOS IC 1 of sending-end impedance; The external inductive probe TAN of input end of clock 14 pin of CMOS integrated circuit worker C1; Because of its input impedance very high; Inductive probe TAN can be sensitive induce tested metal object with voltage; The voltage of sensing with inductive probe TAN makes the 11 pin output high level of counter CMOS IC 1 as the clock signal of CMOS integrated circuit work, is directly driven by the high level of 11 pin of CMOS IC 1 and lights light emitting diode D1.
Description of drawings
Accompanying drawing 1 is the embodiment circuit working schematic diagram that the utility model provides a highly sensitive survey electric installation of induction type.
Embodiment
Accompanying drawing 1 and description of drawings to specifications below; And, require the correlation technique of the utility model is further described in conjunction with the described components and parts technical parameter of following examples according to the annexation between the components and parts in the described each several part circuit of utility model content.
The selection of components and parts and technical parameter thereof
CMOS IC 1 is 16 pin decade counters, and the packing forms of CMOS IC 1 mainly contains two kinds of plastic packaging dual-in-line DIP, ceramic dual inline type DIP, and WV is: 3~18V; The CMOS integrated circuit is a decade counter, and model is CD4017, and it uses pin and corresponding function is:
1 pin VSS: the negative pole that connects direct supply;
11 pin Q9: count pulse the 9th output terminal;
13 pin EN: input end of clock, the pulse negative edge is effective;
14 pin CP: clock signal input terminal, this schmitt trigger in the input end of clock has the shaping pulse function;
15 pin R: zero clearing input end;
16 pin VDD: meet the anodal VCC of direct supply DC, DC voltage scope: 3~18V.
Light emitting diode D1 is that Φ 5 red light emitting diodes are used for the whether charged indication of tested metal object; Light emitting diode D2 is that Φ 5 green LEDs are used for the direct supply indication; Keyswitch AN is a keyswitch open in usual; Dropping resistor R1 resistance is 470 Ω, and dropping resistor R2 resistance is 820 Ω; Electrochemical capacitor C1 is used for the filtering of direct supply DC, and its capacity is 470 μ F/16V; DC is the 9V laminated cell.
Circuit production and debugging
The making of inductive probe TAN: the specification of inductive probe and shape are the keys of making the utility model success or not, survey electric probe and require to select the above appearance of copper cash ¢ 2.0mm that the sheath copper cash of one insulation material layer parcel, its length requirement >=140mm are arranged.In order to increase the induction area of inductive probe TAN, dwindle the volume of surveying electric installation, the sheath copper cash of making inductive probe TAN requires shape to be bent into down " U " shape.
Method of application
When using the highly sensitive survey electric installation of induction type; The hand-held highly sensitive survey electric installation of induction type, the switch AN that presses & hold, and after direct supply work indication luminotron diode D2 lights; With the approaching metal object to be measured (charging zone) of the inductive probe TAN that surveys electric installation; Note observing luminotron diode D1 working condition then,, explain that tested metal object is charged as long as light emitting diode D1 is lighted; Tested metal object is not charged if light emitting diode D1 does not work explanation, perhaps only has the safe voltage below the 50V.

Claims (2)

1. highly sensitive survey electric installation of induction type, by direct supply DC, CMOS IC 1, inductive probe TAN, survey electric indicating circuit, direct supply duty indicating circuit and direct supply DC and form, its characteristic comprises:
The model that the CMOS integrated circuit uses in the circuit is CD4017;
Inductive probe TAN connects 14 pin of CMOS IC 1, and the material of inductive probe TAN is copper RVV, and the shape of inductive probe TAN is bent into down " U " shape;
Survey electric indicating circuit and form, 11 pin of a termination CMOS IC 1 of resistance R 1, the positive pole of the other end sending and receiving optical diode D1 of resistance R 1, the negative pole connection circuit ground GND of light emitting diode D1 by resistance R 1, light emitting diode D1;
16 pin of CMOS IC 1 connect the positive pole of direct supply DC, 8 pin of CMOS IC 1,13 pin and 15 pin connection circuit ground GND through keyswitch AN.
2. the highly sensitive survey electric installation of induction type according to claim 1; Direct supply duty indicating circuit is made up of light emitting diode D2 and resistance R 2; It is characterized in that: the end of the anodal connecting resistance R2 of light emitting diode D2; The anodal VCC of the other end connection circuit of resistance R 2, the negative pole connection circuit ground GND of light emitting diode D2.
CN201120282431U 2011-07-28 2011-07-28 Inductive high sensitivity electricity testing apparatus Expired - Fee Related CN202133706U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201120282431U CN202133706U (en) 2011-07-28 2011-07-28 Inductive high sensitivity electricity testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201120282431U CN202133706U (en) 2011-07-28 2011-07-28 Inductive high sensitivity electricity testing apparatus

Publications (1)

Publication Number Publication Date
CN202133706U true CN202133706U (en) 2012-02-01

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Application Number Title Priority Date Filing Date
CN201120282431U Expired - Fee Related CN202133706U (en) 2011-07-28 2011-07-28 Inductive high sensitivity electricity testing apparatus

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102323471A (en) * 2011-07-28 2012-01-18 刘喆 Induction type high-sensitivity electricity testing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102323471A (en) * 2011-07-28 2012-01-18 刘喆 Induction type high-sensitivity electricity testing device

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Granted publication date: 20120201

Termination date: 20120728