CN202093062U - Power chip testing probe card - Google Patents
Power chip testing probe card Download PDFInfo
- Publication number
- CN202093062U CN202093062U CN201120131598XU CN201120131598U CN202093062U CN 202093062 U CN202093062 U CN 202093062U CN 201120131598X U CN201120131598X U CN 201120131598XU CN 201120131598 U CN201120131598 U CN 201120131598U CN 202093062 U CN202093062 U CN 202093062U
- Authority
- CN
- China
- Prior art keywords
- power chip
- probe
- circuit board
- printed circuit
- probe card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a power chip testing probe card, which comprises probes and a printed circuit board. The probes are connected with the printed circuit board and are made of taperless tungsten steel, the distance among the probes is more than 1m, the diameter of the tip of each probe ranges from 8mils to 12mils, the printed circuit board is provided with arc cloth cords. The service life of the power chip testing probe card is prolonged on the condition that the testing requirements of high current and voltage are met.
Description
Technical field
The utility model relates to a kind of probe, particularly a kind of power chip test probe card.
Background technology
Along with China's IC industrial chain fast development, ring---chip testing equipment constantly enlarges in the share in market as important one in this industrial chain, and the demand of chip testing probe also increases fast.In existing digital circuit, mimic channel and Digital Analog Hybrid Circuits test, all use the power chip test probe card, the power chip test probe card generally comprises the probe that contacts with electrode on the wafer and sends the printed circuit board (PCB) (PCB) of detection signal to this probe, the power chip test probe card have following some make main points: one, the pressure point tested on demand of power chip test probe card is made pin; Two, the needle point diameter is the 1/3-1/4 of pressure point size; Three, tip portion is taper, and tip portion is formed by the wolfram steel material bending that is ground to taper; Four, use the position of 120 ° of High temp. epoxy resins locking pins; Five, printed circuit board (PCB) uses common material to make.But there is following problem in existing power chip test probe card: do not have fixing pressure point position, need oneself to specify bundle point position; The needle point diameter is less, burns pin under the situation of high-current test easily; Length of needlepoint is too little, and serviceable life is shorter; 120 ° High temp. epoxy resins can be softening under the bigger situation of high-current test thermal value, influences the fixing of pin position; The material of printed circuit board (PCB) can not be born high temperature, and concrete wiring has more sharp-pointed angle can discharge under high-tension situation.
The utility model content
Technical problem to be solved in the utility model provides a kind of power chip test probe card, and it satisfies under the test request of big electric current and big voltage, and prolong serviceable life.
For solveing the technical problem, the utility model provides a kind of power chip test probe card, it is characterized in that, it comprises probe and printed circuit board (PCB), probe is connected with printed circuit board (PCB), probe is made by zero draft wolfram steel, and the distance between the probe is greater than 1m, and the needle point diameter of probe is 8mils～12mils; Printed circuit board (PCB) has wiring, wiring be shaped as arc.
Positive progressive effect of the present utility model is: the utility model power chip test probe card satisfies under the test request of big electric current and big voltage, and it is accurate to prick the some position, and prolong serviceable life.
Description of drawings
Fig. 1 is the structural representation of the utility model power chip test probe card.
Embodiment
Lift a preferred embodiment below, and come the clearer the utility model that intactly illustrates in conjunction with the accompanying drawings.
As shown in Figure 1, the utility model power chip test probe card comprises probe 1 and printed circuit board (PCB) 2, and probe 1 is connected with printed circuit board (PCB) 2, and the distance between the probe 1 prevents sparking greater than 1mm, and it is accurate to prick the some position.The needle point diameter of probe 1 is 8mils～12mils (mils is the long measure of wafer layout, the 1mil=mil), to bear big electric current (more than three amperes) and big voltage, is not easy to burn pin.The material of probe 1 uses zero draft wolfram steel material, improves the measuring current that probe can bear, and increases the service life.Printed circuit board (PCB) 2 has wiring 21, wiring 21 be shaped as arc, prevent to produce point discharge.
Though more than described embodiment of the present utility model, but those skilled in the art is to be understood that, these only illustrate, and under the prerequisite that does not deviate from principle of the present utility model and essence, can make numerous variations or modification to these embodiments.Therefore, protection domain of the present utility model is limited by appended claims.
Claims (1)
1. a power chip test probe card is characterized in that, it comprises probe and printed circuit board (PCB), and probe is connected with printed circuit board (PCB), and probe is made by zero draft wolfram steel, and the distance between the probe is greater than 1m, and the needle point diameter of probe is 8mils～12mils; Printed circuit board (PCB) has wiring, wiring be shaped as arc.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120131598XU CN202093062U (en) | 2011-04-28 | 2011-04-28 | Power chip testing probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120131598XU CN202093062U (en) | 2011-04-28 | 2011-04-28 | Power chip testing probe card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202093062U true CN202093062U (en) | 2011-12-28 |
Family
ID=45368122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201120131598XU Expired - Fee Related CN202093062U (en) | 2011-04-28 | 2011-04-28 | Power chip testing probe card |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202093062U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640558A (en) * | 2021-08-11 | 2021-11-12 | 山东大学 | Replaceable probe set and probe card |
-
2011
- 2011-04-28 CN CN201120131598XU patent/CN202093062U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640558A (en) * | 2021-08-11 | 2021-11-12 | 山东大学 | Replaceable probe set and probe card |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111228 Termination date: 20150428 |
|
| EXPY | Termination of patent right or utility model |