CN202066941U - Test device for laminated sheet-type voltage dependent resistor chain - Google Patents
Test device for laminated sheet-type voltage dependent resistor chain Download PDFInfo
- Publication number
- CN202066941U CN202066941U CN 201020680751 CN201020680751U CN202066941U CN 202066941 U CN202066941 U CN 202066941U CN 201020680751 CN201020680751 CN 201020680751 CN 201020680751 U CN201020680751 U CN 201020680751U CN 202066941 U CN202066941 U CN 202066941U
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- CN
- China
- Prior art keywords
- anchor clamps
- test
- row
- dependent resistor
- voltage dependent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a test device for a laminated sheet-type voltage dependent resistor chain, which comprises a clamp, a console which is provided with a test button, and a parameter test instrument, wherein the clamp is arranged on the console and is connected with the parameter test instrument, and the test device is characterized in that: the clamp is provided with a clamp printed circuit board (PCB) of a conducting test needle and a clamp positioning plate, the clamp is connected with the parameter test instrument, i.e. a needle cap end of the conducting test needle of the clamp PCB is connected with the parameter test instrument, and each pin end of the conducting test needle is adequately contacted with each outer electrode corresponding to the laminated sheet-type voltage dependent resistor chain product to be tested. The clamp positioning plate is a positioning plate with a mechanical positioning probe. The test device has a simple structure and is convenient to operate, the information is simple and direct to feed back, the test data is directly displayed on a personal computer system monitor, the test device is suitable for testing and judging different electrical parameters of the laminated sheet-type voltage dependent resistor chain, and laminated sheet-type voltage dependent resistor chain is facilitated to select.
Description
Technical field
The utility model relates to proving installation, particularly relates to a kind of lamination type piezoresistor row and uses proving installation and method of testing thereof.
Background technology
When same printed circuit board (PCB) (Printed Circuit Board, initialism are PCB) circuit adopts a plurality of type piezoresistor, usually take too much circuit area, cause circuit complicated, bring circuit design, safeguard the hidden danger of aspect.And type piezoresistor row is as a kind of novel pressure-active element, can be on same monomer integrated a plurality of voltage dependent resistor (VDR)s and each voltage dependent resistor (VDR) and skin resistance layer constitute the RC loop, not only dwindle the advantage of small product size, preventing electro-static discharge (the ElectroStatic Discharge that also has voltage dependent resistor (VDR), initialism is ESD) and electromagnetic interference (EMI) (ElectromagneticInterference, initialism is EMI) effect, be applied on multifunction, microminiaturized communication, the consumer electronics product.Type piezoresistor row complex structure, test parameter is many, and not seeing as yet so far has the relevant report of lamination type piezoresistor row with proving installation.
Summary of the invention
Technical problem to be solved in the utility model is the defective that remedies above-mentioned prior art, provides a kind of lamination type piezoresistor row to use proving installation.
Technical matters of the present utility model is solved by the following technical programs.
This lamination type piezoresistor row uses proving installation, comprises anchor clamps, is provided with the control desk and the parameter tester of testing button, and described anchor clamps are placed on the described control desk, and are connected with described parameter tester.
This lamination type piezoresistor row with the characteristics of proving installation is:
Described anchor clamps are provided with anchor clamps PCB and the anchor clamps location-plate that comprises the conductive test pin, it is that the pin cap end of conductive test pin of described anchor clamps PCB is connected with described parameter tester that described anchor clamps are connected with described parameter tester, each stitch end of described conductive test pin fully contacts with corresponding each external electrode of tested lamination type piezoresistor row's product, with the accuracy of guaranteeing to test.
Described anchor clamps location-plate is the location-plate that is provided with the mechanical positioning probe, by the mechanical positioning probe lamination type piezoresistor is arranged the relevant position that product accurately is positioned described anchor clamps location-plate, and then clamping and positioning is on control desk.
Lamination type piezoresistor row of the present utility model is solved by following further technical scheme with the proving installation technical matters.
Described control desk is the control desk by the control of personal computer (Personal Computer initialism is PC) system, described PC system is connected with described parameter tester with described control desk respectively, the various performance parameters that described parameter tester is tested lamination type piezoresistor row product successively according to the program of setting, and test data is sent to described PC system.
Described control desk comprises control main board and outer container, and described control main board is provided with the control desk program, sends instruction to described parameter tester by setup program.
Described PC system is the microsystem that is provided with test control program.Described PC system is used to control described parameter tester collecting test data, and the test data that described parameter tester is transmitted and the standard parameter value of setting are analyzed, whether the various performance parameters of judging lamination type piezoresistor row product is qualified, and result of determination shown by display, feed back to the operator.
Preferably, described PC system adopts the microsystem that is provided with test control program of Pentium4 processor.
Described parameter tester comprises voltage dependent resistor (VDR) dc parameter test instrument and voltage dependent resistor (VDR) direct capacitance tester, described voltage dependent resistor (VDR) dc parameter test instrument is used to test lamination type piezoresistor row product dc parameter, comprises pressure sensitive voltage Vb, leakage current IL, insulation impedance CrossIR and dc impedance R
DC, and calculating nonlinear factor α value, described voltage dependent resistor (VDR) direct capacitance tester is used to test lamination type piezoresistor row product direct capacitance parameter, comprises capacitor C and dissipation factor DF.
The beneficial effect that the utility model is compared with the prior art is:
The utility model apparatus structure is simple, easy to operate, and the information feedback simple, intuitive, test data directly is presented on the PC system display, be applicable to every electrical parameter of test lamination type piezoresistor row and judge, be beneficial to lamination type piezoresistor row is carried out sorting.
Description of drawings
Fig. 1 is the one-piece construction synoptic diagram of the utility model embodiment;
Fig. 2 is the clamp structure synoptic diagram of Fig. 1;
Fig. 3 is anchor clamps PCB and the anchor clamps location-plate partial enlarged drawing of Fig. 2;
Fig. 4 is the terminal synoptic diagram of ten terminals, the eight lamination type piezoresistors row product of Fig. 3;
Fig. 5 is the product internal components connection diagram of Fig. 4.
Embodiment
Below in conjunction with embodiment and contrast accompanying drawing the utility model is described.
A kind of lamination type piezoresistor row shown in Fig. 1～3 use proving installation, comprises anchor clamps 5, is provided with control desk 1, voltage dependent resistor (VDR) dc parameter test instrument 2 and the voltage dependent resistor (VDR) direct capacitance tester 3 controlled by PC system 4 of testing button.Anchor clamps 5 are provided with anchor clamps PCB 6 and the anchor clamps location-plate 7 that comprises the conductive test pin, the pin cap end of the conductive test pin 8 of anchor clamps PCB 6 is connected with voltage dependent resistor (VDR) direct capacitance tester 3 with voltage dependent resistor (VDR) dc parameter test instrument 2, and anchor clamps location-plate 7 is the location-plates that are provided with the mechanical positioning probe.Ten terminals of ten terminals, eight lamination type piezoresistors row product 9 are connected shown in Fig. 4,5 with internal components.
PC system 4 adopts the microsystem that is provided with test control program of Pentium4 processor, be used to control voltage dependent resistor (VDR) dc parameter test instrument 2 and voltage dependent resistor (VDR) direct capacitance tester 3 collecting test data, and the test data of its transmission and the standard parameter value of setting be analyzed, whether the various performance parameters of judging lamination type piezoresistor row product is qualified, and result of determination shown by display, feed back to the operator.
This embodiment is specifically designed to the dc parameter and the direct capacitance parameter of test lamination type piezoresistor row product 9.Dc parameter comprises pressure sensitive voltage Vb, leakage current IL, insulation impedance CrossIR and dc impedance R
DC, and calculate nonlinear factor α value; The direct capacitance parameter comprises capacitor C and dissipation factor DF.
Concrete method of testing has following steps successively:
1) location product
Tested 10 terminals, 8 lamination type piezoresistors row product 9 accurately is positioned the relevant position of anchor clamps location-plate 7 by the anchor clamps location-plate 7 that is provided with the mechanical positioning probe, and then clamping and positioning is on control desk 1, each external electrode 10 of tested ten terminals, eight lamination type piezoresistors row product 9 fully contacts with conductive test pin 8 corresponding each stitch ends of anchor clamps PCB 6, with the accuracy of guaranteeing to test;
2) test products
Press testing button, control desk sends instruction, test dc parameter and the direct capacitance parameter that lamination type piezoresistor is arranged product 9 by voltage dependent resistor (VDR) dc parameter test instrument 2 and voltage dependent resistor (VDR) direct capacitance tester 3 respectively by the program of setting, dc parameter comprises pressure sensitive voltage, leakage current, insulation impedance and dc impedance, and calculate nonlinear system numerical value, the direct capacitance parameter comprises electric capacity and dissipation factor;
3) data processing
The test data of voltage dependent resistor (VDR) dc parameter test instrument 2 and voltage dependent resistor (VDR) direct capacitance tester 3 is sent to PC system 4 by GPIB, the test control program that PC system 4 is provided with is analyzed the standard parameter value of test data and setting, whether the various performance parameters of judging lamination type piezoresistor row product is qualified, and result of determination fed back to the operator by display, test is so far finished.
Above content be in conjunction with concrete preferred implementation to further describing that the utility model is done, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field; under the prerequisite that does not break away from the utility model design, make some alternative or obvious modification that are equal to; and performance or purposes are identical, all should be considered as belonging to the scope of patent protection that the utility model is determined by claims of being submitted to.
Claims (6)
1. lamination type piezoresistor row uses proving installation, comprises anchor clamps, is provided with the control desk and the parameter tester of testing button, and described anchor clamps are placed on the described control desk, and are connected with described parameter tester, it is characterized in that:
Described anchor clamps are provided with anchor clamps printing board PCB and the anchor clamps location-plate that comprises the conductive test pin, it is that the pin cap end of conductive test pin of described anchor clamps PCB is connected with described parameter tester that described anchor clamps are connected with described parameter tester, and each stitch end of described conductive test pin fully contacts with corresponding each external electrode of tested lamination type piezoresistor row's product;
Described anchor clamps location-plate is the location-plate that is provided with the mechanical positioning probe.
2. lamination type piezoresistor row as claimed in claim 1 uses proving installation, it is characterized in that:
Described control desk is the control desk by personal computer PC system control, and described PC system is connected with described parameter tester with described control desk respectively.
3. lamination type piezoresistor row as claimed in claim 1 or 2 uses proving installation, it is characterized in that:
Described control desk comprises control main board and outer container.
4. lamination type piezoresistor row as claimed in claim 3 uses proving installation, it is characterized in that:
Described PC system is a microsystem.
5. lamination type piezoresistor row as claimed in claim 4 uses proving installation, it is characterized in that:
Described PC system adopts the microsystem of Pentium4 processor.
6. lamination type piezoresistor row as claimed in claim 5 uses proving installation, it is characterized in that:
Described parameter tester comprises voltage dependent resistor (VDR) dc parameter test instrument and voltage dependent resistor (VDR) direct capacitance tester.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020680751 CN202066941U (en) | 2010-12-24 | 2010-12-24 | Test device for laminated sheet-type voltage dependent resistor chain |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020680751 CN202066941U (en) | 2010-12-24 | 2010-12-24 | Test device for laminated sheet-type voltage dependent resistor chain |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202066941U true CN202066941U (en) | 2011-12-07 |
Family
ID=45060801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201020680751 Expired - Fee Related CN202066941U (en) | 2010-12-24 | 2010-12-24 | Test device for laminated sheet-type voltage dependent resistor chain |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202066941U (en) |
-
2010
- 2010-12-24 CN CN 201020680751 patent/CN202066941U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20111207 Termination date: 20161224 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |