CN202041185U - Detecting device for divergence angle of output light of semiconductor laser unit - Google Patents
Detecting device for divergence angle of output light of semiconductor laser unit Download PDFInfo
- Publication number
- CN202041185U CN202041185U CN2011200714639U CN201120071463U CN202041185U CN 202041185 U CN202041185 U CN 202041185U CN 2011200714639 U CN2011200714639 U CN 2011200714639U CN 201120071463 U CN201120071463 U CN 201120071463U CN 202041185 U CN202041185 U CN 202041185U
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- semiconductor laser
- laser unit
- unit
- divergence angle
- divergence
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Abstract
The utility model discloses a detecting device for the divergence angle of the output light of a semiconductor laser unit. The semiconductor laser unit is connected with a direct-current (DC) power supply; a semiconductor laser detector is connected with a DC ampere meter, wherein the semiconductor laser detector moves on the semicircle trajectory or rail with the semiconductor laser unit as the center of a circle, and the DC ampere meter is used for acquiring electric current data that reflect X axis light intensity distribution and Y axis light intensity distribution. The data output end of the DC ampere meter is connected with a microprocessor, a data processing unit is arranged in the microprocessor, and the light intensity distribution curve is drawn by the data procession unit according to the electric current data acquired by the DC ampere meter so as to obtain the divergence angle of the output light of the semiconductor laser unit. The detecting device for the divergence angle of the output light of the semiconductor laser unit is simple in structure, is easy to implement and can fast detect the offset status and the offset degree of the divergence angle of the output light of the semiconductor laser unit.
Description
Technical field
The utility model relates to a kind of bright dipping angle of divergence pick-up unit of semiconductor laser.
Background technology
At the optic communication device production field, the focus optically-coupled of semiconductor laser TO need be advanced adapter, if the bright dipping angle of divergence angular deflection of semiconductor laser TO then can cause the problem that coupling adapter misplaces, coupling efficiency is low, coupling speed reduces.For whether being offset with regard to decidable semiconductor laser TO bright dipping part, provide a kind of TO of semiconductor laser accurately bright dipping angle of divergence angle measurement unit to seem very necessary at front end.
The utility model content
The utility model wants the technical solution problem to provide a kind of bright dipping angle of divergence pick-up unit of semiconductor laser, the bright dipping angle of divergence pick-up unit of this semiconductor laser is simple in structure, easy to implement, the energy fast detecting goes out the bright dipping angle of divergence of semiconductor laser skew situation and degrees of offset.
The utility model is to solve the problems of the technologies described above the technical scheme that is adopted to be:
A kind of bright dipping angle of divergence pick-up unit of semiconductor laser; semiconductor laser connects direct supply, is being the semiconductor laser detector that moves on the semicircle track in the center of circle or the track with the semiconductor laser and the DC ammeter of the current data that is used to gather reflection X-axis light distribution and Y-axis light distribution is joined.
The data output end of DC ammeter connects microprocessor, draws out the data processing unit that the curve of light distribution obtains the bright dipping angle of divergence of semiconductor laser thereby be provided with in microprocessor according to the current data of DC ammeter collection.
The beneficial effects of the utility model:
The bright dipping angle of divergence pick-up unit of semiconductor laser of the present utility model, (what in fact measure is current data to adopt simple instrument and equipment to measure X-axis in 0-180 ° and the light distribution data of Y-axis, current data reflection light distribution), according to the light distribution data creating X-Y curve of light distribution of X-axis and Y-axis, can detect the skew situation and the degrees of offset of the bright dipping angle of divergence of semiconductor laser at last according to the X-Y curve of light distribution again.Therefore, the utility model is simple in structure, easy to implement, and the measuring accuracy height.Detection after the bright dipping angle of divergence pick-up unit of semiconductor laser of the present utility model is researched and developed for chip, the detection after the TO encapsulation all are significant.
Description of drawings
Fig. 1 is the structural representation of bright dipping angle of divergence pick-up unit of the semiconductor laser of embodiment 1;
Fig. 2 is the X-Y curve of light distribution, and figure a is the X-Y curve of light distribution of no light shift, and figure b is the X-Y curve of light distribution that light shift is arranged.X-axis coordinate among Fig. 2 is the number of degrees, and the semiconductor laser detector that moves with X-axis is denoted as 0 with respect to 90 ° of semiconductor laser, is convenient to observe intuitively distribution situation.The current value that the Y-axis coordinate collects for the DC ammeter that connects the semiconductor laser detector, unit are milliampere.
Label declaration: 1-semiconductor laser detector, 2-semiconductor laser, the semicircle track of 3-.
Embodiment
The utility model is described in further detail below in conjunction with the drawings and specific embodiments.
As shown in Figure 1; a kind of bright dipping angle of divergence pick-up unit of semiconductor laser; semiconductor laser connects direct supply, is being the semiconductor laser detector that moves on the semicircle track in the center of circle or the track with the semiconductor laser and the DC ammeter of the current data that is used to gather reflection X-axis light distribution and Y-axis light distribution is joined.
The data output end of DC ammeter connects microprocessor, draws out the data processing unit that the curve of light distribution obtains the bright dipping angle of divergence of semiconductor laser thereby be provided with in microprocessor according to the current data of DC ammeter collection.
The course of work is as follows: at first semiconductor laser to be detected is inserted direct current driven source (1), open the direct current driven source and make semiconductor laser work.Then DC ammeter is fixed and inserted to the optical semiconductor detector, the optical semiconductor detector is placed the semiconductor laser parallel position, move for the center semicircular in shape with the semiconductor laser, whenever move the electric current of once measuring an optical semiconductor detector product dirt, until moving to the X-axis light distribution that 180 degree can be measured semiconductor laser.Then semiconductor laser is revolved and turn 90 degrees, reverse once more mobile optical semiconductor detector, with semiconductor laser TO is that the center semicircular in shape moves, whenever move the electric current of once measuring an optical semiconductor detector generation, can measure the Y-axis light distribution (see figure 1) of semiconductor laser TO until moving to 0 degree.Two groups of data are drawn, and the horizontal ordinate of the peak of curve is 0, represents that then bright dipping is not inclined to one side, otherwise expresses the light shift (see figure 2).The X coordinate of the peak of curve, i.e. the number of degrees of expression skew.As two number of degrees of scheming two corresponding X-axis of dotted line difference among the b, both differences are the number of degrees of skew, and the number of degrees of skew are the bright dipping angle of divergence.
Claims (2)
1. the bright dipping angle of divergence pick-up unit of a semiconductor laser; it is characterized in that; semiconductor laser connects direct supply, is being the semiconductor laser detector that moves on the semicircle track in the center of circle or the track with the semiconductor laser and the DC ammeter of the current data that is used to gather reflection X-axis light distribution and Y-axis light distribution is joined.
2. the bright dipping angle of divergence pick-up unit of the semiconductor laser of direct current rheology according to claim 1, it is characterized in that, the data output end of DC ammeter connects microprocessor, draws out the data processing unit that the curve of light distribution obtains the bright dipping angle of divergence of semiconductor laser thereby be provided with in microprocessor according to the current data of DC ammeter collection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200714639U CN202041185U (en) | 2011-03-17 | 2011-03-17 | Detecting device for divergence angle of output light of semiconductor laser unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200714639U CN202041185U (en) | 2011-03-17 | 2011-03-17 | Detecting device for divergence angle of output light of semiconductor laser unit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202041185U true CN202041185U (en) | 2011-11-16 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011200714639U Expired - Lifetime CN202041185U (en) | 2011-03-17 | 2011-03-17 | Detecting device for divergence angle of output light of semiconductor laser unit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202041185U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102914420A (en) * | 2012-10-10 | 2013-02-06 | 西安炬光科技有限公司 | Semiconductor laser beam characteristic testing device and testing method |
| CN104379384A (en) * | 2012-10-05 | 2015-02-25 | 皇家飞利浦有限公司 | Detection system using photo-sensors |
| CN107456664A (en) * | 2017-08-22 | 2017-12-12 | 哈尔滨工程大学 | A kind of scalable 3D optical fiber accelerator morning inspection instrument of hemispherical |
| CN107748381A (en) * | 2017-09-01 | 2018-03-02 | 兰州空间技术物理研究所 | A kind of semicircle rake ion thruster beam divergence angle test device |
| CN108871186A (en) * | 2017-05-12 | 2018-11-23 | 株式会社三丰 | Three-dimensional measuring machine and method for three-dimensional measurement |
| CN111351641A (en) * | 2020-03-12 | 2020-06-30 | 苏州矩阵光电有限公司 | Method and device for measuring far-field divergence angle of laser |
-
2011
- 2011-03-17 CN CN2011200714639U patent/CN202041185U/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104379384A (en) * | 2012-10-05 | 2015-02-25 | 皇家飞利浦有限公司 | Detection system using photo-sensors |
| CN102914420A (en) * | 2012-10-10 | 2013-02-06 | 西安炬光科技有限公司 | Semiconductor laser beam characteristic testing device and testing method |
| CN108871186A (en) * | 2017-05-12 | 2018-11-23 | 株式会社三丰 | Three-dimensional measuring machine and method for three-dimensional measurement |
| CN107456664A (en) * | 2017-08-22 | 2017-12-12 | 哈尔滨工程大学 | A kind of scalable 3D optical fiber accelerator morning inspection instrument of hemispherical |
| CN107748381A (en) * | 2017-09-01 | 2018-03-02 | 兰州空间技术物理研究所 | A kind of semicircle rake ion thruster beam divergence angle test device |
| CN107748381B (en) * | 2017-09-01 | 2019-09-10 | 兰州空间技术物理研究所 | A kind of semicircle ion thruster beam divergence angle test device rake |
| CN111351641A (en) * | 2020-03-12 | 2020-06-30 | 苏州矩阵光电有限公司 | Method and device for measuring far-field divergence angle of laser |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20111116 |
|
| CX01 | Expiry of patent term | ||
| DD01 | Delivery of document by public notice |
Addressee: Pang Yong Document name: Notice of termination of patent right |
|
| DD01 | Delivery of document by public notice |