CN202009378U - Level shift circuit - Google Patents

Level shift circuit Download PDF

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Publication number
CN202009378U
CN202009378U CN2011201185736U CN201120118573U CN202009378U CN 202009378 U CN202009378 U CN 202009378U CN 2011201185736 U CN2011201185736 U CN 2011201185736U CN 201120118573 U CN201120118573 U CN 201120118573U CN 202009378 U CN202009378 U CN 202009378U
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CN
China
Prior art keywords
resistance
current source
circuit
voltage
level shift
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Expired - Lifetime
Application number
CN2011201185736U
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Chinese (zh)
Inventor
陈波
罗广泉
白青刚
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BYD Semiconductor Co Ltd
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BYD Co Ltd
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Priority to CN2011201185736U priority Critical patent/CN202009378U/en
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Abstract

A level shift circuit, used for shifting the difference voltage of two ends of a tested circuit, comprises a first resistor, a second resistor, a first current source and a second current source, wherein one end of the tested circuit is connected to the first current source by the first resistor, and the other end is connected to the second current source by the second resistor, and the pressure drops on the first resistor and second resistor are equal. By serially connecting a group of resistors and current sources to the two ends of the tested circuit, and by adjusting the resistances of the resistors and the currents of the current sources, voltage at the two ends of the tested circuit is shifted to a suitable voltage. Besides, only resistors and current sources are used, therefore the circuit is simple in structure and low in cost.

Description

A kind of level shift circuit
Technical field
The utility model relates to integrated circuit fields, is specifically related to a kind of level shift circuit.
Background technology
In the integrated circuit (IC) design process, usually need the voltage in circuit somewhere is adjusted, at this moment the shift circuit that just needs a level, reasonably adjust the processing of voltage for subsequent conditioning circuit, such as current sampling circuit, current sampling circuit is judged tested current in loop size by the voltage difference at direct detection measured resistance two ends.Yet under many circumstances, the voltage at measured resistance two ends very high or or even negative voltage, such voltage is unfavorable for Direct Sampling and processing, can bring bigger error; Want to reduce error and just need carry out sampling behind the level shift again, common level shift circuit structure is comparatively complicated again.
The utility model content
The utility model is for solving in the prior art level shift circuit structure than complicated problems, thereby a kind of simple level shift circuit is provided.
For solving the problems of the technologies described above, the utility model provides following technical scheme:
A kind of level shift circuit is used for the voltage difference at circuit-under-test two ends is shifted, and comprising: first resistance, second resistance, first current source and second current source; One end of described circuit-under-test is connected with first current source by first resistance, and the other end of described circuit-under-test is connected with second current source by second resistance, and described first resistance and the second ohmically pressure drop equate.
Further, described first resistance and second resistance equate.
Further, described first current source and second current source equate.
Further, described first current source and the equal ground signalling of the second current source negative terminal.
Further, described circuit-under-test is a resistance.
Compared with prior art, the utlity model has following beneficial effect: a kind of level shift circuit that the utility model provides, by connect respectively at the circuit-under-test two ends one group of resistance and current source, and by the resistance of adjusting resistance or the electric current of current source, can be with the voltage shift at circuit-under-test two ends to suitable voltage, and only by resistance and current source, this circuit structure is simple, and cost is low.
Description of drawings
Fig. 1 is the utility model first embodiment high level shift circuit schematic diagram.
Fig. 2 is the negative or electronegative potential level shift circuit schematic diagram of the utility model second embodiment.
Embodiment
Clearer for technical problem, technical scheme and beneficial effect that the utility model is solved, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explanation the utility model, and be not used in qualification the utility model.
The utility model is divided into high voltage and two kinds of situations of low-voltage with circuit-under-test voltage, respectively circuit is described.
Embodiment one
Circuit-under-test voltage is high voltage, need reduce voltage, and be the utility model first embodiment high level shift circuit schematic diagram as Fig. 1; A kind of level shift circuit is used for the voltage difference at circuit-under-test two ends is shifted, and comprising: first resistance R 1, second resistance R 2, the first current source I 1With the second current source I 2One end of described circuit-under-test 10 is by first resistance R 1With the first current source I 1Connect, the other end of described circuit-under-test is by second resistance R 2With the second current source I 2Connect described first resistance R 1With R on second resistance 2Pressure drop equate.By connect respectively at the circuit-under-test two ends one group of resistance and current source, and the resistance by regulating resistance or the electric current of current source, can be with the voltage shift at circuit-under-test two ends to suitable voltage, and only by resistance and current source, this circuit structure is simple, and cost is low.
We suppose that circuit-under-test 10 is a resistance R herein s, this measured resistance R sCan be the resistance of equivalence, measured resistance R sThe voltage at two ends is Vb and Va; Set first resistance and second resistance and equate R 1=R 2=R; First current source and second current source equate, I 1=I 2=I.And the described first current source I 1With the second current source I 2The equal ground signalling of negative terminal, the sense of current as shown in the figure, electric current I 1And I 2Be respectively to flow through first resistance R 1, second resistance R 2Electric current, first resistance R 1With second resistance R 2The voltage at two ends is respectively U 1, U 2, first resistance R 1With second resistance R 2Respectively at the first current source I 1With the second current source I 2Node voltage be respectively VA and VB; So:
VB=Vb-U2 (1)
VA=Va-U1 (2)
U wherein 1=I 1R 1U 2=I 2R 2(3)
Because R 1=R 2=R, I 1=I 2=I, so:
I 1R 1=?I 2R 2=IR (4)
Be U 1=U 2(5)
Can get: VB-VA=(Vb-U2)-(Va-U1)=Vb-Va (6)
By above result as can be known, the voltage difference at AB two ends and measured resistance R sThe pressure reduction at two ends equates, so this circuit can reduce the circuit-under-test magnitude of voltage in the situation that does not influence sampled result.And by regulating R 1And R 2Resistance and current source I 1And I 2Electric current, guarantee I 1R 1=I 2R 2Just can obtain the voltage of any appropriate, avoid error that the high-tension circuit Direct Sampling is brought thereby subtract.
Embodiment two
Circuit-under-test voltage is low-voltage or negative pressure, need raise to voltage, and be the negative or electronegative potential level shift circuit schematic diagram of the utility model second embodiment as Fig. 2; A kind of level shift circuit is used for the voltage difference at circuit-under-test two ends is shifted, and comprising: the 3rd resistance R 3, the 4th resistance R 4, the 3rd current source I 3With the 4th current source I 4One end of described circuit-under-test 10 is by the 3rd resistance R 3With the 3rd current source I 3Connect, the other end of described circuit-under-test 10 is by the 4th resistance R 4With the 4th current source I 4Connect described the 3rd resistance R 3With R on the 4th resistance 4Pressure drop equate.By connect respectively at the circuit-under-test two ends one group of resistance and current source, and the resistance by regulating resistance or the electric current of current source, can be with the voltage shift at circuit-under-test two ends to suitable voltage, and only by resistance and current source, this circuit structure is simple, and cost is low.
We suppose that circuit-under-test 10 is a resistance R herein s, this measured resistance R sCan be the resistance of equivalence, set the 3rd resistance and the 4th resistance and equate R 3=R 4=R; The 3rd current source and the 4th current source equate, I 3=I 4=I.The sense of current as shown in the figure, electric current I 3And I 4Be respectively to flow through the 3rd resistance R 3, the 4th resistance R 4Electric current, the 3rd resistance R 3With the 4th resistance R 4The voltage at two ends is respectively U 3, U 4, the 3rd resistance R 3With the 4th resistance R 4Respectively at the 3rd current source I 3With the 4th current source I 4Node voltage be respectively VD and VC; So
VD=Vd+U 4 (7)
VC=Vc+U 3 (8)
U wherein 3=I 3R 3U 4=I 4R 4(9)
Because R 3=R 4=R, I 3=I 4=I, so:
I 3R 3?=?I 4R 4=?IR (10)
U 3=?U 4 (11)
Can get VD-VC=(Vd+ U 4)-(Vc+ U 3)=Vd-Vc (12)
By above result as can be known, the voltage difference at CD two ends and measured resistance R sThe pressure reduction at two ends equates, so this circuit can not influence the situation lifting circuit-under-test magnitude of voltage of sampled result.And by regulating R 3And R 4Resistance and current source I 3And I 4Electric current, guarantee I 3R 3=I 4R 4, just can obtain the voltage of any appropriate, avoided error that negative pressure circuit Direct Sampling is brought thereby subtract.
In above-mentioned two kinds of circuit, accurately the current source of coupling can be realized by current mirror, also can realize by other circuit.
If the electric current I of two current sources is with respect to the measured resistance R that flows through sThe electric current at two ends is enough little, and (I is with respect to the R that flows through usually sThe electric current at two ends can be ignored), can in reasonable range, not influence sampling precision.
The above only is preferred embodiment of the present utility model; not in order to restriction the utility model; all any modifications of within spirit of the present utility model and principle, being done, be equal to and replace and improvement etc., all should be included within the protection range of the present utility model.

Claims (5)

1. a level shift circuit is used for the voltage difference at circuit-under-test two ends is shifted, and it is characterized in that, comprising: first resistance, second resistance, first current source and second current source; One end of described circuit-under-test is connected with first current source by first resistance, and the other end of described circuit-under-test is connected with second current source by second resistance, and described first resistance and the second ohmically pressure drop equate.
2. level shift circuit according to claim 1 is characterized in that, described first resistance and second resistance equate that described first current source and second current source equate.
3. level shift circuit according to claim 1 is characterized in that, described first current source and the equal ground signalling of the second current source negative terminal.
4. level shift circuit according to claim 1 is characterized in that, described circuit-under-test is a resistance.
5. level shift circuit according to claim 1 is characterized in that, described first current source and second current source are current mirror.
CN2011201185736U 2011-04-21 2011-04-21 Level shift circuit Expired - Lifetime CN202009378U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011201185736U CN202009378U (en) 2011-04-21 2011-04-21 Level shift circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011201185736U CN202009378U (en) 2011-04-21 2011-04-21 Level shift circuit

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CN202009378U true CN202009378U (en) 2011-10-12

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Application Number Title Priority Date Filing Date
CN2011201185736U Expired - Lifetime CN202009378U (en) 2011-04-21 2011-04-21 Level shift circuit

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109217858A (en) * 2017-06-30 2019-01-15 对话半导体(英国)有限公司 The overvoltage protection of transistor unit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109217858A (en) * 2017-06-30 2019-01-15 对话半导体(英国)有限公司 The overvoltage protection of transistor unit

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C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20191205

Address after: 518119 1 Yanan Road, Kwai Chung street, Dapeng New District, Shenzhen, Guangdong

Patentee after: SHENZHEN BYD MICROELECTRONICS Co.,Ltd.

Address before: BYD 518118 Shenzhen Road, Guangdong province Pingshan New District No. 3009

Patentee before: BYD Co.,Ltd.

TR01 Transfer of patent right
CP01 Change in the name or title of a patent holder

Address after: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province

Patentee after: BYD Semiconductor Co.,Ltd.

Address before: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province

Patentee before: BYD Semiconductor Co.,Ltd.

CP01 Change in the name or title of a patent holder
CP03 Change of name, title or address

Address after: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province

Patentee after: BYD Semiconductor Co.,Ltd.

Address before: 518119 No.1 Yan'an Road, Kwai Chung street, Dapeng New District, Shenzhen City, Guangdong Province

Patentee before: SHENZHEN BYD MICROELECTRONICS Co.,Ltd.

CP03 Change of name, title or address
CX01 Expiry of patent term

Granted publication date: 20111012

CX01 Expiry of patent term