CN201892507U - Workpiece surface defect depth detector - Google Patents

Workpiece surface defect depth detector Download PDF

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Publication number
CN201892507U
CN201892507U CN2010205889175U CN201020588917U CN201892507U CN 201892507 U CN201892507 U CN 201892507U CN 2010205889175 U CN2010205889175 U CN 2010205889175U CN 201020588917 U CN201020588917 U CN 201020588917U CN 201892507 U CN201892507 U CN 201892507U
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CN
China
Prior art keywords
microscope
workpiece
objective lens
gauge
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010205889175U
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Chinese (zh)
Inventor
惠征
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
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Individual
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Filing date
Publication date
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Priority to CN2010205889175U priority Critical patent/CN201892507U/en
Application granted granted Critical
Publication of CN201892507U publication Critical patent/CN201892507U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

A workpiece surface defect depth detector is a surface defect detector which is simple and practical to use and is high in precision. The detector is formed by the combination of an industrial microscope and a dial gauge, wherein a linked detection panel is arranged on an objective lens of the industrial microscope, the linked detection panel moves along with the objective lens, a dial gauge stand is connected with an industrial microscope body through a connecting rod, and a gauge outfit is pressed on the detection panel. When a workpiece is detected by the detector, the focusing hand ring of the microscope is adjusted to make the objective lens of the microscope focus on the surface of the workpiece to be detected, and now the dial gauge is zeroed; and then the objective lens of the microscope is moved to the defect bottom of the workpiece to be detected, the focusing hand ring of the microscope is adjusted to make the objective lens of the microscope focus on the defect bottom of the workpiece to be detected, now the linked detection panel also moves along with the objective lens of the microscope to drive the gauge outfit of the dial gauge to finely move, the read of the dial gauge is recorded, several antapexes are detected, and full-scale reading is the workpiece surface defect depth.

Description

The Surface Flaw depth detection apparatus
One, technical field:
The utility model relates to a kind of Surface Flaw depth detection apparatus, but the fast detecting Surface Flaw degree of depth.
Two, background technology:
In production practices, the Surface Flaw depth detection is a more complicated technical work, need expend more manpower and materials, and accuracy of detection is not high yet.
Three, summary of the invention:
The purpose of this utility model is that a kind of novel Surface Flaw depth detection apparatus will be provided, but the fast detecting Surface Flaw degree of depth.
The utility model is combined by an industrial microscope and a clock gauge.At the microscopical objection lens portion of industry one interlock check-out console is set, the interlock check-out console moves with object lens, the clock gauge gauge stand links to each other by connecting link with industrial microscope body, gauge outfit is pressed check-out console, and object lens are the Surface Flaw degree of depth in the difference of two corresponding clock gauge readings of focus point of surface of the work and defective bottom.For making things convenient for reading, when detecting workpiece, adjust microscope and focus on bracelet, micro objective is focused on the measured workpiece surface, at this moment clock gauge is returned to zero; Next step moves micro objective to measured workpiece defective bottom, adjust microscope and focus on bracelet, micro objective is focused in measured workpiece defective bottom, at this moment the check-out console that links is also moving thereupon, drive the fine motion of clock gauge gauge outfit, record clock gauge reading is surveyed point of several ends more, the reading maximum be the Surface Flaw degree of depth.
Four, description of drawings:
Accompanying drawing is the use synoptic diagram of Surface Flaw depth detection apparatus.
1. focus on bracelet among the figure, 2. interlock check-out console, 3. micro objective, 4. clock gauge gauge outfit, 5. connecting link, 6. clock gauge.
Five, embodiment:
Industrial microscope and clock gauge are made up by connecting link (5), in the microscopical object lens of industry (3) portion one interlock check-out console (2) is set, make clock gauge gauge outfit (4) press check-out console (2), during detection, adjust microscope and focus on bracelet (1), micro objective (3) is focused on the measured workpiece surface, at this moment clock gauge (6) is returned to zero; Next step moves micro objective (3) to measured workpiece defective bottom, adjust microscope and focus on bracelet (1), micro objective (3) is focused in measured workpiece defective bottom, at this moment the check-out console (2) that links is also moving thereupon, drive clock gauge gauge outfit (4) fine motion, record clock gauge (6) reading is surveyed point of several ends more, the reading maximum be the Surface Flaw degree of depth.

Claims (1)

1. Surface Flaw depth detection apparatus, it is characterized in that: one interlock check-out console is set at the microscopical objection lens portion of industry, the interlock check-out console moves with object lens, the clock gauge gauge stand links to each other by connecting link with industrial microscope body, gauge outfit is pressed check-out console, and object lens are the Surface Flaw degree of depth in the difference of two corresponding clock gauge readings of focus point of surface of the work and defective bottom.
CN2010205889175U 2010-10-26 2010-10-26 Workpiece surface defect depth detector Expired - Fee Related CN201892507U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010205889175U CN201892507U (en) 2010-10-26 2010-10-26 Workpiece surface defect depth detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010205889175U CN201892507U (en) 2010-10-26 2010-10-26 Workpiece surface defect depth detector

Publications (1)

Publication Number Publication Date
CN201892507U true CN201892507U (en) 2011-07-06

Family

ID=44221981

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010205889175U Expired - Fee Related CN201892507U (en) 2010-10-26 2010-10-26 Workpiece surface defect depth detector

Country Status (1)

Country Link
CN (1) CN201892507U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107588707A (en) * 2017-10-31 2018-01-16 广西玉柴机器股份有限公司 A kind of detection method and device of nozzle hole depth
CN107957424A (en) * 2017-11-17 2018-04-24 南京大学 A kind of detection method for differentiating ultrathin transparent plate surface flaw using microscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107588707A (en) * 2017-10-31 2018-01-16 广西玉柴机器股份有限公司 A kind of detection method and device of nozzle hole depth
CN107957424A (en) * 2017-11-17 2018-04-24 南京大学 A kind of detection method for differentiating ultrathin transparent plate surface flaw using microscope
CN107957424B (en) * 2017-11-17 2020-08-11 南京大学 Detection method for identifying surface flaws of ultrathin transparent plate by using microscope

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110706

Termination date: 20131026