CN201829108U - Light interference and diffraction experimental instrument with telescopic base - Google Patents
Light interference and diffraction experimental instrument with telescopic base Download PDFInfo
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- CN201829108U CN201829108U CN2010205651063U CN201020565106U CN201829108U CN 201829108 U CN201829108 U CN 201829108U CN 2010205651063 U CN2010205651063 U CN 2010205651063U CN 201020565106 U CN201020565106 U CN 201020565106U CN 201829108 U CN201829108 U CN 201829108U
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Abstract
The utility model relates to a light interference and diffraction experimental instrument with a telescopic base, which is applied to the physical optics teaching in middle school, comprising a base, an optical screen, a diffraction plate, a diffraction plate support and a semiconductor laser source. The diffraction plate is installed on the diffraction plate support; the optical screen, the diffraction plate and the semiconductor laser source are sequentially placed on the same straight line; the base comprises a movable end plate, a left fixing end plate, a right fixing end plate and a load plate; the left fixing end plate and the right fixing end plate are fixedly connected by the load plate, and the movable end plate and the left fixing end plate are connected by a telescopic rod; the movable end plate is provided with an optical screen inserting hole, and the optical screen is installed on the optical screen inserting hole; the load plate is provided with a support socket, the diffraction plate support is installed on the support socket; and the semiconductor laser source is fixed on the load plate. By adopting the light interference and diffraction experimental instrument of the utility model, in the physical optics teaching in middle school, the light interference and diffraction experimental instrument is more compact, and more convenient and reliable for operation, has better experiment teaching effect, and is convenient for students to observe and experiment in groups.
Description
Technical field
The utility model relates to teaching and experiment equipment, particularly relates to the interference of light diffraction experiment instrument that is used for middle school physical optics teaching.
Background technology
At present, the experimental apparatus that is used for interference diffraction in the physical optics teaching of middle school, " the interference of light diffraction demonstrator " that is numbered J20223 only arranged and be numbered " the Poisson bright spot demonstrator " of J20041 though these instruments can both be finished the interference diffraction experiment, but because its structure is too scattered, can only on table top, move and test, optical screen meeting off-beams direction of illumination when mobile, and image-forming range is far away, can only be projeced into remote projection surfaces such as wall, be unfavorable for student's observation and grouping experiment.
Summary of the invention
Technical problem to be solved in the utility model is that structure is too scattered in the existing interference diffraction experimental apparatus, and image-forming range is far away, is unfavorable for the problem of observation of students, and then the telescopic interference of light diffraction experiment of a kind of base instrument is provided.
The technical scheme that the utility model addresses the above problem is as follows: the telescopic interference of light diffraction experiment of a kind of base instrument, comprise base, optical screen, diffraction plate, diffraction plate support and semiconductor laser light source, diffraction plate is installed on the diffraction plate support, described optical screen, diffraction plate and semiconductor laser light source are on the same straight line in turn, described base comprises movable end plate, left fixed charge method end plate, right fixed charge method end plate and holds the thing plate, fixedly connected by holding the thing plate between a left side fixed charge method end plate and the right fixed charge method end plate, be connected by expansion link between movable end plate and the left fixed charge method end plate; Movable end plate is provided with the optical screen jack, and optical screen is installed on the optical screen jack; The described thing plate that holds is provided with bracket socket, and the diffraction plate support is installed on the bracket socket; Described semiconductor laser light source is fixed on and holds on the thing plate.
Preferably, described expansion link is made of the more piece metal tube, and an end is fixed on the fixed charge method end plate, and the other end passes fixed charge method end plate and is connected with movable end plate telescopically.
Preferably, described bracket socket is provided with vertical adjustment knob and horizontal adjustment knob.
Preferably, described semiconductor laser light source and bracket socket are arranged on the same base plate, and base plate is located at and holds on the thing plate.
Semiconductor laser light source scalable spot size of the present utility model, movable end plate can be flexible according to the experiment needs, regulates the distance between optical screen and the diffraction plate, so that can obtain interference diffraction image clearly.Owing to be that the interference diffraction image can not depart from optical screen, is convenient to adjust along the flexible good directionality of double track guiding.Bracket socket is provided with horizontal adjustment knob, vertical adjustment knob and support jack, can interfere the position of penetrating sheet in three-dimensional adjusted, makes it to align the light beam of semiconductor laser light source.Semiconductor laser light source and bracket socket are co-located on forms the interference diffraction experimental provision on the same base.The interference diffraction device can be adsorbed on and holds on the thing plate.
The Experiments of Optics that the telescopic interference of light diffraction experiment of this base instrument can be finished have: 1, single slit diffraction (different seams are wide).2, poplar formula two-slit interference (different seams are wide).3, monofilament diffraction.4, delthyrium diffraction.5, square hole diffraction.6, oblong aperture diffraction.7, circular hole diffraction.8, Poisson bright spot (blank screen diffraction).9, three seam diffraction.10, Fpir Crevices diffraction.11, knife edge diffraction.
The utility model interference of light diffraction experiment instrument makes in the teaching of middle school physical optics, that interference of light diffraction experiment instrument becomes is compacter, more convenient operation, reliable, experiment teaching effect is better, is convenient to observation of students and grouping experiment.
Description of drawings
Fig. 1 is the structural representation of the utility model interference of light diffraction experiment instrument.
Fig. 2 is the schematic top plan view of interference of light diffraction experiment instrument shown in Figure 1.
Fig. 3 be interference of light diffraction experiment instrument shown in Figure 1 A to view.
Embodiment
Further describe the utility model below in conjunction with embodiment and accompanying drawing, but protection domain of the present utility model is not limited to this.
With reference to Fig. 1-3, the telescopic interference of light diffraction experiment of a kind of base instrument, it comprises movable end plate 1, left fixed charge method end plate 2, expansion link 3, optical screen jack 4, optical screen 5, diffraction plate 6, diffraction plate support 7, bracket socket 8, vertical adjustment knob 9, horizontal adjustment knob 10, semiconductor laser light source 11, holds thing plate 12, right fixed charge method end plate 13, base plate 14.
Above-mentioned movable end plate 1, left fixed charge method end plate 2, right fixed charge method end plate 13 and hold thing plate 12 and constitute bases, fixed charge method end plate 2 links to each other with fixed charge method end plate 13 by holding thing plate 12.Expansion link 3 is made of the more piece metal tube, and an end is fixed on the fixed charge method end plate 13, and the other end passes fixed charge method end plate 2 and is connected with movable end plate 1 telescopically.
Above-mentioned diffraction plate 6, diffraction plate support 7, bracket socket 8 and semiconductor laser light source 11 constitute the interference diffraction experimental provision.Bracket socket 8 is provided with vertical adjustment knob 9 and horizontal adjustment knob 10, vertical adjustment knob 9 scalable diffraction plate supports 7 move up and down, horizontal adjustment knob 10 is passed from the bottom of bracket socket 8 and gearing mesh, thereby can make diffraction plate 6 tangential movements finish the various dried diffraction experiments that spread out.
Above-mentioned movable end plate 1 is provided with optical screen jack 4, and optical screen 5 is inserted on the optical screen jack 4.Semiconductor laser light source 11 and bracket socket 8 are arranged on the same base plate 14, and base plate 14 is located at and is held on the thing plate 12.
In the use at first the optical screen jack 4 on the optical screen 5 insertion activity end plates 1, again the interference diffraction experimental provision is adsorbed in and holds on the thing plate 12, the connection semiconductor light sources makes light be mapped to the optical screen center and mixes up spot size according to the experiment needs, diffraction plate support 7 is inserted in the bracket socket 8, then diffraction plate 6 is inserted diffraction plate support 7, adjusting vertical adjustment knob 9 makes laser beam just in time shine getting final product of diffraction plate 6 centers, regulate horizontal adjustment knob 10 and make diffraction plate 6 tangential movements, make the perpendicular successively delthyrium of penetrating of laser beam, square hole, oblong aperture, blank screens etc. can be finished the diffraction of light experiment.Use the same method, can finish experiments such as single slit diffraction, two-slit interference.
Claims (4)
1. the telescopic interference of light diffraction experiment of base instrument, comprise base, optical screen, diffraction plate, diffraction plate support and semiconductor laser light source, diffraction plate is installed on the diffraction plate support, described optical screen, diffraction plate and semiconductor laser light source are on the same straight line in turn, it is characterized in that: described base comprises movable end plate, left fixed charge method end plate, right fixed charge method end plate and holds the thing plate, fixedly connected by holding the thing plate between a left side fixed charge method end plate and the right fixed charge method end plate, be connected by expansion link between movable end plate and the left fixed charge method end plate; Movable end plate is provided with the optical screen jack, and optical screen is installed on the optical screen jack; The described thing plate that holds is provided with bracket socket, and the diffraction plate support is installed on the bracket socket; Described semiconductor laser light source is fixed on and holds on the thing plate.
2. the telescopic interference of light diffraction experiment of base according to claim 1 instrument, it is characterized in that: described expansion link is made of the more piece metal tube, and an end is fixed on the fixed charge method end plate, and the other end passes fixed charge method end plate and is connected with movable end plate telescopically.
3. the telescopic interference of light diffraction experiment of base according to claim 1 instrument, it is characterized in that: described bracket socket is provided with vertical adjustment knob and horizontal adjustment knob.
4. the telescopic interference of light diffraction experiment of base according to claim 1 instrument, it is characterized in that: described semiconductor laser light source and bracket socket are arranged on the same base plate, and base plate is located at and holds on the thing plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205651063U CN201829108U (en) | 2010-10-18 | 2010-10-18 | Light interference and diffraction experimental instrument with telescopic base |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205651063U CN201829108U (en) | 2010-10-18 | 2010-10-18 | Light interference and diffraction experimental instrument with telescopic base |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201829108U true CN201829108U (en) | 2011-05-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010205651063U Expired - Lifetime CN201829108U (en) | 2010-10-18 | 2010-10-18 | Light interference and diffraction experimental instrument with telescopic base |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201829108U (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103440804A (en) * | 2013-08-07 | 2013-12-11 | 天津城建大学 | Handheld dynamic light wave diffraction demonstration instrument |
| CN103680275A (en) * | 2013-12-27 | 2014-03-26 | 齐齐哈尔大学 | Variable-angle single slit diffraction experiment instrument |
| CN103943015A (en) * | 2014-01-21 | 2014-07-23 | 浙江向阳花教学器材有限公司 | Minisize physical optical viewer |
| CN103996341A (en) * | 2014-04-21 | 2014-08-20 | 成都科创佳思科技有限公司 | Diffraction teaching device |
| CN104318839A (en) * | 2014-11-17 | 2015-01-28 | 江南大学 | Michelson interferometer convenient to adjust |
| CN105679163A (en) * | 2016-04-25 | 2016-06-15 | 王星竹 | Device for demonstrating light diffraction |
| CN108564863A (en) * | 2018-05-28 | 2018-09-21 | 北京工业大学 | A kind of portable Zoom lens experiment instrument |
| CN108877439A (en) * | 2018-07-25 | 2018-11-23 | 河南师范大学 | A kind of multi-functional diffraction demonstrator |
| CN109686206A (en) * | 2018-12-27 | 2019-04-26 | 天津良益科技股份有限公司 | A kind of two-slit interference diffraction experiment by narrow opening instrument |
| CN111768685A (en) * | 2020-07-30 | 2020-10-13 | 马鞍山学院 | Diffraction experimental device and experimental method thereof |
-
2010
- 2010-10-18 CN CN2010205651063U patent/CN201829108U/en not_active Expired - Lifetime
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103440804A (en) * | 2013-08-07 | 2013-12-11 | 天津城建大学 | Handheld dynamic light wave diffraction demonstration instrument |
| CN103440804B (en) * | 2013-08-07 | 2015-05-13 | 天津城建大学 | Handheld dynamic light wave diffraction demonstration instrument |
| CN103680275A (en) * | 2013-12-27 | 2014-03-26 | 齐齐哈尔大学 | Variable-angle single slit diffraction experiment instrument |
| CN103680275B (en) * | 2013-12-27 | 2016-07-06 | 齐齐哈尔大学 | A kind of diffraction experiment by narrow opening instrument of varied angle |
| CN103943015B (en) * | 2014-01-21 | 2016-02-03 | 浙江向阳花教学器材有限公司 | Miniature physical optics viewer |
| CN103943015A (en) * | 2014-01-21 | 2014-07-23 | 浙江向阳花教学器材有限公司 | Minisize physical optical viewer |
| CN103996341A (en) * | 2014-04-21 | 2014-08-20 | 成都科创佳思科技有限公司 | Diffraction teaching device |
| CN104318839A (en) * | 2014-11-17 | 2015-01-28 | 江南大学 | Michelson interferometer convenient to adjust |
| CN105679163A (en) * | 2016-04-25 | 2016-06-15 | 王星竹 | Device for demonstrating light diffraction |
| CN108564863A (en) * | 2018-05-28 | 2018-09-21 | 北京工业大学 | A kind of portable Zoom lens experiment instrument |
| CN108877439A (en) * | 2018-07-25 | 2018-11-23 | 河南师范大学 | A kind of multi-functional diffraction demonstrator |
| CN109686206A (en) * | 2018-12-27 | 2019-04-26 | 天津良益科技股份有限公司 | A kind of two-slit interference diffraction experiment by narrow opening instrument |
| CN111768685A (en) * | 2020-07-30 | 2020-10-13 | 马鞍山学院 | Diffraction experimental device and experimental method thereof |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20110511 |
|
| CX01 | Expiry of patent term |