CN201820770U - Buffering and conveying detector for solar silicon chip detection platform - Google Patents
Buffering and conveying detector for solar silicon chip detection platform Download PDFInfo
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- CN201820770U CN201820770U CN2010202195020U CN201020219502U CN201820770U CN 201820770 U CN201820770 U CN 201820770U CN 2010202195020 U CN2010202195020 U CN 2010202195020U CN 201020219502 U CN201020219502 U CN 201020219502U CN 201820770 U CN201820770 U CN 201820770U
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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Abstract
The utility model provides a buffering and conveying detector for a solar silicon chip detection platform, in the technical scheme, a solar silicon chip is conveyed to a corresponding pre-detecting position via a bearing and conveying part, because the bearing and conveying part keeps a buffering and pressing distance from a base below, when the detector props against the solar silicon chip, stress of the solar silicon chip can be partly transferred to the bearing and conveying part, part of stress can be absorbed by the buffering deformation of the bearing and conveying part, the detector can smoothly prop against and provide electric energy or receive the electric energy generated by the solar silicon chip, so the trouble that the solar silicon chip is damaged by stress is greatly avoided, and better detecting efficiency and product acceptability are obtained.
Description
Technical field
The utility model relates to a kind of buffering transportation and detection apparatus, particularly a kind of buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform.
Background technology
The main composition parts of solar panels are solar silicon chip, solar silicon chip was both light and thin, in automated manufacturing and testing process, if it is careless slightly, promptly might cause breakage, unfilled corner or cut damage, even producing the microscopic checks that naked eyes can't be discovered, these problems should be exhausted and may avoid, to promote the qualification rate of solar silicon chip in manufacturing and testing process.
Existing solar silicon chip detecting machine platform, solar silicon chip is in the solar silicon chip detecting machine platform course of conveying, transmit by the carrying of one group of carrying conveying member, please refer to as shown in Figure 1, with the signal of belt pulley bearing mode, this carrying conveying member 11 is arranged on the pedestal 12, and solar silicon chip 3 is by the transmission of the carrying of carrying conveying member 11, carry along a specific direction, detect operation to a predetermined tested position.
Detection operation herein can probably be divided into one group of optical detection and one group of Photoelectric Detection, so-called optical detection is meant by optical image capturing apparatus such as for example video cameras, obtain the external image data of solar silicon chip 3, whether for example whether appearance has scratch, fine fisssure or wiring good, in order to judging whether solar silicon chip 3 has the appearance flaw, for another the characteristic in order to follow-up classification such as appearance color and luster of solar silicon chip 3.As for Photoelectric Detection, it then is light source luminescent by detector 13 simulated solar irradiations, shine on the tested solar silicon chip 3, connect the bus electrode that touches solar silicon chip 3 with the probe in the detector 13 again, derive solar silicon chip 3 and be subjected to illumination electricity energy, thereby judge whether the conversion efficiency that its reception transform light energy is electric energy output is good; Perhaps, be to give solar silicon chip 3, and obtain the infrared image of solar silicon chip 3 to be measured, use and judge whether there is internal flaw in the silicon by infrared camera by the probe in the detector 13 output electric energy.
Yet, solar silicon chip 3 thickness are very thin, and unavoidable in manufacture process slight warpage appears, the pedestal 12 of existing board is smooth hard load planes at the probe location of corresponding detector 13, therefore when probe is conflicted solar silicon chip 3 downwards, solar silicon chip 3 is subjected to the extruding of detector 13 and pedestal 12 simultaneously, the solar silicon chip 3 more serious to warpage situation own, will be as shown in Figure 2, cause the breakage or the unfilled corner of tested solar silicon chip 3, making increases unnecessary damage in the testing process, and therefore qualification rate reduces.
Especially as shown in Figure 3, be sent to the next stop when being extruded damaged solar silicon chip 3 by carrying conveying member 11, a little residual fragmentation will be retained on the pedestal 12, when the tested solar silicon chip 3 of following a slice continues to be sent to the detection position, can be subjected to more that residual fragmentation supports and by the frame height, easier fragmentation damages when probe presses down, even only be therefore to be subjected to scratch, still can reduce qualification rate; Thus, a slice pressurized and the damaged damage that will cause follow-up more solar silicon chips 3 influence the operating efficiency of board greatly.
Therefore, providing a kind of and reduce the solar silicon chip probability damaged because of the extruding that is subjected to detector and pedestal, and then promote the qualification rate of solar silicon chip, increase the board detection efficiency, is prior art an open question still.
The utility model content
One of the utility model purpose is to provide a kind of buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform that damages tested solar silicon chip that do not have in testing process.
Another purpose that this is novel is to provide a kind of buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform that promotes solar silicon chip qualification rate in automated manufacturing and testing process.
The purpose again that this is novel is to provide in the tested process of a kind of minimizing solar silicon chip, because of the testing process fragmentation, causes shutting down the buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform of removing the probability of handling.
The utility model is to realize like this, a kind of buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform, this solar silicon chip detecting machine platform comprises the buffering transportation and detection apparatus that one group of pedestal, a group of processing unit, winding are subjected to the sorter of this processing unit instruction and are arranged at this pedestal, and these tested solar silicon chips have the bus electrode of plural number for electric energy transmitting respectively, and this buffering transportation and detection apparatus comprises:
One group is arranged at this pedestal, carries the carrying conveying member of these tested solar silicon chips through a predetermined tested position along throughput direction;
One group to carrying conveying member, detect these tested solar silicon chips and exporting the detector of check data to this processing unit;
Wherein, this detector comprise one group with probes should predetermined tested position corresponding, these bus electrodes of butt; And this carrying conveying member be to should being scheduled to tested position, maintains a buffering depression distance with the pedestal of below.
More specifically, the probe of these these bus electrodes of butt is one group of probe, and this detector more comprises one group of mechanical arm that drives this group probe lifting.
More specifically, this detector more comprises one group of higher source luminance.
More specifically, this carrying conveying member comprises the plural groups belt pulley, and plural number is subjected to these plural groups belt pulleys to drive, carry the belt of these tested solar silicon chips respectively.
The present invention also provides a kind of solar silicon chip detecting machine platform, and this detection board comprises:
One group of pedestal;
One group of processing unit;
One winding is subjected to the sorter of this processing unit instruction; And
One group of buffering transportation and detection apparatus that is arranged at this pedestal comprises:
One group is arranged at this pedestal, carries the carrying conveying member of these tested solar silicon chips through a predetermined tested position along throughput direction; And
One group to carrying conveying member, detect these tested solar silicon chips and exporting the detector of check data to this processing unit;
Wherein, this detector comprises that one group supplies being scheduled to the probe of tested position, these bus electrodes of butt; This carrying conveying member be to should being scheduled to tested position, maintains a buffering depression distance with the pedestal of below.
More specifically, this buffering transportation and detection apparatus comprises at least one group of optics inspection module, and one group of photoelectricity inspection module.
A kind of buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform that the utility model provides, solar silicon chip is carried conveying member and is sent to the predetermined tested position of this correspondence, because of the pedestal that carries conveying member and below maintains a buffering depression distance, so when detector abuts to solar silicon chip, the stressed of solar silicon chip can partly be transferred to the carrying conveying member, rely on the buffering distortion of carrying conveying member, the absorption portion downforce, detector is butt and electric energy is provided or receives the solar silicon chip energy that generates electricity smoothly then, and reduce significantly that solar silicon chip is compressed and damaged puzzlement, better testing efficiency and better product percent of pass is provided.
Description of drawings
Fig. 1 is that existing solar silicon chip detects schematic diagram;
Fig. 2 is the existing damaged schematic diagram of the tested extruding of solar silicon chip;
Fig. 3 is that existing solar silicon chip is carried the detection schematic diagram;
Fig. 4 is the solar silicon chip detecting machine platform schematic perspective view of the utility model embodiment;
Fig. 5 is that the processing unit of the utility model embodiment links calcspar;
Fig. 6 is the buffering transportation and detection apparatus schematic perspective view of the utility model embodiment;
Fig. 7 is that schematic diagram is carried in the solar silicon chip carrying of the utility model embodiment;
Fig. 8 is that solar silicon chip to the predetermined tested position signal of the utility model embodiment reaches
Fig. 9 is the solar silicon chip detection side view of the utility model embodiment.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer,, the utility model is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the utility model, and be not used in qualification the utility model.
See also Fig. 4 and shown in Figure 5, use solar silicon chip detecting machine platform 4 of the present utility model and comprise the buffering transportation and detection apparatus 44 that one group of pedestal 41, a group of processing unit 42, winding are subject to processing the sorter 43 of device 42 instructions and are arranged at pedestal 41, wherein cushion transportation and detection apparatus 44 and comprise at least one group of optical detection module 441 and Photoelectric Detection module 442.And for the purpose of explanation, the direction that defines the tested solar silicon chip 3 of aforementioned buffering transportation and detection apparatus 44 carryings is for detecting throughput direction.And tested solar silicon chip 3 has the bus electrode of plural number for electric energy transmitting respectively.
Tested solar silicon chip 3 is sent to corresponding predetermined tested position through 44 carryings of buffering transportation and detection apparatus and accepts detection, and by being arranged at optical image intake devices 4411 such as for example including many group video cameras in the optical detection module 441, respectively image datas such as the surface image of tested solar silicon chip 3 and color are absorbed, and export the gained data to processing unit 42, the foundation of putting to corresponding classification position as tested solar silicon chip 3.
Please in the lump with reference to figure 6, the buffering transportation and detection apparatus 44 that solar silicon chip detecting machine platform of the present utility model is used more comprises one group of carrying conveying member 443 and detector 444, wherein carrying conveying member 443 is to comprise two groups of belt pulleys 4431 that are arranged at pedestal 41 in the present embodiment, and two groups driven and the belt 4432 in order to carry tested solar silicon chip 3 by belt pulley 4431; And detector 444 comprises probe 4441, mechanical arm 4442 and higher source luminance 4443, and be arranged in the Photoelectric Detection module 442, and the Photoelectric Detection flow process is please in the lump with reference to shown in figure 7,8 and 9, by belt 4432 tested solar silicon chip 3 is carried according to the direction of arrow at first as shown in Figure 7, and be delivered to the detection position that is positioned at Photoelectric Detection module 442 as shown in Figure 8, and probe 4441 is to drive lifting by mechanical arm 4442.Wherein, belt 4432 is in the predetermined tested position of correspondence, is that the pedestal 41 with the below maintains a buffering depression distance.
When tested solar silicon chip 3 is scheduled to tested position along detecting the throughput direction carrying through one by belt 4432, this moment as shown in Figure 9, mechanical arm 4442 drives probe 4441 to tested solar silicon chip 3 butts, touch the bus electrode 31 of the plural number confession electric energy transmitting on the tested solar silicon chip 3, higher source luminance 4443 in the detector 444 is lighted at this moment, the transform light energy that tested solar silicon chip 3 receives with being about to is an electric energy, and exports the data of checking to processing unit 42 by Photoelectric Detection module 442 via bus electrode 31 and probe 4441.Because belt 4432 maintains a buffering depression distance with the pedestal 41 of below, so, when probe 4441 compresses tested solar silicon chip 3, tested solar silicon chip 3 also is expressed to belt 4432 downwards, at this moment, belt 4432 can directly not conflicted pedestal 41 and be cushioned to some extent, tested solar silicon chip 3 is also damaged with regard to not compressed by probe 4441, judge by processing unit 42 more at last, and carry out the classification of solar silicon chip 3 by the sorter 43 of accepting processing unit 42 instructions.
The buffering transportation and detection apparatus that the utility model provides, solar silicon chip is carried conveying member and is sent to the predetermined tested position of this correspondence, because of the pedestal that carries conveying member and below maintains a buffering depression distance, so when detector abuts to solar silicon chip, the stressed of solar silicon chip can partly be transferred to the carrying conveying member, rely on the buffering distortion of carrying conveying member, the absorption portion downforce, detector is butt and electric energy is provided or receives the solar silicon chip energy that generates electricity smoothly then, and reduce significantly that solar silicon chip is compressed and damaged puzzlement, better testing efficiency and better product percent of pass is provided.In sum; the buffering transportation and detection apparatus that solar silicon chip detecting machine platform of the present utility model is used can avoid tested solar silicon chip impaired in testing process really; and promote the qualification rate of solar silicon chip in automated manufacturing and testing process, further reduce the puzzlement that needs to shut down cleaning because of fragmentation.
The above only is preferred embodiment of the present utility model; not in order to restriction the utility model; all any modifications of within spirit of the present utility model and principle, being done, be equal to and replace and improvement etc., all should be included within the protection range of the present utility model.
Claims (6)
1. buffering transportation and detection apparatus that is used for solar silicon chip detecting machine platform, this solar silicon chip detecting machine platform comprises the buffering transportation and detection apparatus that one group of pedestal, a group of processing unit, winding are subjected to the sorter of this processing unit instruction and are arranged at this pedestal, and these tested solar silicon chips have the bus electrode of plural number for electric energy transmitting respectively, it is characterized in that this buffering transportation and detection apparatus comprises:
One group is arranged at this pedestal, carries the carrying conveying member of these tested solar silicon chips through a predetermined tested position along throughput direction;
One group to carrying conveying member, detect these tested solar silicon chips and exporting the detector of check data to this processing unit;
Wherein, this detector comprise one group with probes should predetermined tested position corresponding, these bus electrodes of butt; And this carrying conveying member be to should being scheduled to tested position, maintains a buffering depression distance with the pedestal of below.
2. buffering transportation and detection apparatus according to claim 1 is characterized in that, the probe of these these bus electrodes of butt is one group of probe, and this detector more comprises one group of mechanical arm that drives this group probe lifting.
3. according to claim 1 or 2 described buffering transportation and detection apparatus, it is characterized in that this detector more comprises one group of higher source luminance.
4. according to claim 1 or 2 described buffering transportation and detection apparatus, it is characterized in that this carrying conveying member comprises the plural groups belt pulley, and plural number is subjected to respectively these plural groups belt pulleys to drive, carry the belt of these tested solar silicon chips.
5. a solar silicon chip detecting machine platform is characterized in that, this detection board comprises:
One group of pedestal;
One group of processing unit;
One winding is subjected to the sorter of this processing unit instruction; And
One group of buffering transportation and detection apparatus that is arranged at this pedestal comprises:
One group is arranged at this pedestal, carries the carrying conveying member of these tested solar silicon chips through a predetermined tested position along throughput direction; And
One group to carrying conveying member, detect these tested solar silicon chips and exporting the detector of check data to this processing unit;
Wherein, this detector comprises that one group supplies being scheduled to the probe of tested position, these bus electrodes of butt; This carrying conveying member be to should being scheduled to tested position, maintains a buffering depression distance with the pedestal of below.
6. detection board according to claim 5 is characterized in that, this buffering transportation and detection apparatus comprises at least one group of optics inspection module, and one group of photoelectricity inspection module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202195020U CN201820770U (en) | 2010-06-08 | 2010-06-08 | Buffering and conveying detector for solar silicon chip detection platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202195020U CN201820770U (en) | 2010-06-08 | 2010-06-08 | Buffering and conveying detector for solar silicon chip detection platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201820770U true CN201820770U (en) | 2011-05-04 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010202195020U Expired - Fee Related CN201820770U (en) | 2010-06-08 | 2010-06-08 | Buffering and conveying detector for solar silicon chip detection platform |
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| Country | Link |
|---|---|
| CN (1) | CN201820770U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105699715A (en) * | 2016-04-08 | 2016-06-22 | 格力电器（武汉）有限公司 | Air condition electrical box testing system |
| CN106180004A (en) * | 2016-08-08 | 2016-12-07 | 深圳市华宇半导体有限公司 | The control system of fingerprint separator and control method |
| CN108450015A (en) * | 2015-08-31 | 2018-08-24 | 株式会社幸福日本 | IC tests system |
| CN109768770A (en) * | 2019-01-10 | 2019-05-17 | 成都中建材光电材料有限公司 | A kind of solar panel detecting device |
-
2010
- 2010-06-08 CN CN2010202195020U patent/CN201820770U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108450015A (en) * | 2015-08-31 | 2018-08-24 | 株式会社幸福日本 | IC tests system |
| CN105699715A (en) * | 2016-04-08 | 2016-06-22 | 格力电器（武汉）有限公司 | Air condition electrical box testing system |
| CN106180004A (en) * | 2016-08-08 | 2016-12-07 | 深圳市华宇半导体有限公司 | The control system of fingerprint separator and control method |
| CN109768770A (en) * | 2019-01-10 | 2019-05-17 | 成都中建材光电材料有限公司 | A kind of solar panel detecting device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110504 Termination date: 20190608 |