CN201804094U - Magnetic flux testing device for Hall chip - Google Patents
Magnetic flux testing device for Hall chip Download PDFInfo
- Publication number
- CN201804094U CN201804094U CN201020227824XU CN201020227824U CN201804094U CN 201804094 U CN201804094 U CN 201804094U CN 201020227824X U CN201020227824X U CN 201020227824XU CN 201020227824 U CN201020227824 U CN 201020227824U CN 201804094 U CN201804094 U CN 201804094U
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- magnetic flux
- hall chip
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Abstract
The utility model relates to a magnetic flux testing device (1) for a Hall chip of a sorting machine in SOT23 packaging test, and is characterized in that the magnetic flux testing device comprises a test bracket (9), a test socket (2), a test fixture (3), a plurality of golden fingers (5), a cover plate (6) and a coil (4), wherein the test socket (2) is fixed at the upper end of the test bracket; the test fixture (3) is arranged in the test socket (2) and used for placing the Hall chip to be tested; the golden fingers (5) are electrically connected with the test fixture (3); the cover plate (6) is positioned above the golden fingers (5) which are fixed between the cover plate (6) and the test socket (2); and the coil (4) is wound on the test bracket (9). The utility model can test the magnetic flux of the Hall chip in the SOT23 packaging test.
Description
Technical field
The utility model relates to a kind of Hall chip magnetic flux test device, the Hall chip of volume production is carried out the test of magnetic flux when the SOT23 packaging and testing.
Background technology
Hall effect is a kind of of magnetoelectric effect, when electric current with perpendicular to the direction of external magnetic field when being arranged in the conductor in this magnetic field, electric potential difference can appear between two end faces perpendicular to magnetic field and direction of current of conductor, this phenomenon is called Hall effect.Hall element promptly is to utilize Hall element measured physical quantity (as electric current, magnetic field, displacement, pressure etc.) to be converted to a kind of sensor of electromotive force output based on the Hall effect principle.It is simple in structure, and volume is little, and is contactless, and the reliability height is easily microminiaturized, therefore, has obtained using widely in measuring technique.In the production run of Hall product, need carry out the test of magnetic flux to the Hall product.
At present in the magnetic flux test of Hall product, realize test by the method that tested Hall chip is applied external magnetic field usually to its magnetic flux.General adopt twin coil to add magnetic and unicoil to add two kinds of methods of magnetic and apply external magnetic field, it is that twin coil is installed on the test fixture both sides that twin coil adds magnetism method, chip under test is placed in parallel in (as shown in Figure 4) between two coils, and chip under test is passed in the magnetic field that two coils produce; And unicoil to add magnetism method be that coil is placed horizontally on the surface level, chip under test is placed in parallel in (as shown in Figure 5) on this coil, chip under test is passed in the magnetic field that unicoil produces.In the SOT23 packaging and testing,, therefore can't carry out the test of magnetic flux to Hall chip because traditional SOT23 packaging and testing separator is not installed magnetic field.And the measuring head of traditional SOT23 packaging and testing separator and nozzle portion all are that magnetic conductive material is made, even if therefore in the SOT23 packaging and testing, Hall chip is applied magnetic field to carry out the magnetic flux test, aforementioned employed magnetic conductive material can be by permanent magnetization after adding magnetic, cause when not producing externally-applied magnetic field, also having remanent magnetism occurs, thereby bring the test deviation, produce erroneous judgement.
The utility model content
The purpose of this utility model is to provide the Hall chip magnetic flux test device of realizing the magnetic flux test in a kind of SOT23 of being used in packaging and testing.
The Hall chip magnetic flux test device of a kind of SOT23 of being used for packaging and testing separator of the present utility model comprises test bracket; Be fixed on the test bench of the upper end of described test bracket; Be arranged on the test fixture that is used to place tested Hall chip in the described test bench; The a plurality of golden fingers that are electrically connected with described test fixture; Be positioned at the cover plate of described golden finger top, described golden finger is fixed between described cover plate and the described test bench; And the coil on the described test bracket.
In addition, described coil is a unicoil.The height of described test fixture flushes with the upper end face of described coil.Described test bracket is the aluminum test bracket.Described test fixture is the copper test fixture.Described test bench is the test bench that epoxy resin is made.Described cover plate is the cover plate that epoxy resin is made.Described test bench is fixed on the described test bracket by glass screw.Described golden finger is fixed between described cover plate and the described test bench by glass screw.
By Hall chip magnetic flux test device of the present utility model traditional SOT23 packaging and testing separator is added magnetic, in the SOT23 packaging and testing, to realize magnetic flux test to Hall chip.
Description of drawings
Fig. 1 shows the synoptic diagram of Hall chip magnetic flux test device of the present utility model.
Fig. 2 shows the one-piece construction synoptic diagram of the rotating-disk testing separator that uses the utility model Hall chip magnetic flux test device.
Fig. 3 shows the front elevation of the rotating disk part of the Test handler among Fig. 2.
Fig. 4 shows the synoptic diagram that adopts twin coil to add magnetic.
Fig. 5 shows the synoptic diagram that adopts unicoil to add magnetic.
Reference numeral:
1, proving installation 2, test bench
3, test fixture 4, coil
5, golden finger 6, cover plate
7, screw 8, screw
9, test bracket 10, separator
11, rotating disk 12, suction nozzle
13, base 14, worktable
Embodiment
Below in conjunction with accompanying drawing and embodiment the technical solution of the utility model is described in further detail.
As shown in Figure 1, show Hall chip magnetic flux test device 1 according to the SOT23 of being used for packaging and testing separator of the present utility model.This proving installation 1 comprises a test bracket 9 (as shown in Figure 2), is wound with a coil 4 on this test bracket, and in the upper end of this test bracket one test bench 2 is installed, and test bench 2 is fixed on the test bracket by screw 8.In this test bench 2, be provided with a test fixture 3 that is used to place tested Hall chip.This proving installation 1 also comprises and being electrically connected with test fixture 3 so that two arrange golden fingers 5 with each pin of chip under test in being placed on this test fixture 3 electrically contact respectively, described golden finger promptly is the link of chip under test pin and external testing circuit, and all signals all transmit by golden finger.Golden finger is made up of numerous flavous conductive contact blades, because of its surface gold-plating and conductive contact blade are arranged as finger-shaped, so be called " golden finger ".Golden finger is actually in copper-clad plate and is covered with one deck gold again by special process, because the inoxidizability of gold is extremely strong, and conduction is also very strong.In addition, this proving installation 1 also comprises two cover plates 6 that lay respectively at two row's golden fingers, 5 tops, and each golden finger 5 is fixed between test bench 2 and the cover plate 6 by a screw 7 respectively.
In the utility model, realize test to Hall chip magnetic flux by traditional SOT23 packaging and testing separator being added magnetic.The coil 4 that adopts in this proving installation 1 is a unicoil.SOT23 packaging and testing separator adopts the structure of rotating disc type, as shown in Figure 2, this Test handler comprises worktable 14, be positioned at the base 13 on the worktable 14, proving installation 1 is installed on the base 13 by its test bracket 9, and the rotating disk 11 (as shown in Figure 3) that is positioned at this proving installation 1 top, be provided with a plurality of in the rotating disk 11 along the equally distributed suction nozzle 12 of its circumference.Each chip under test is sent to successively by suction nozzle 12 on the test fixture 3 of proving installation 1, and the structure of this kind Test handler causes adopting twin coil to add magnetism method SOT23 packaging and testing separator is added magnetic.Therefore, in the utility model, adopted unicoil to add magnetism method SOT23 packaging and testing separator has been added magnetic.
In the utility model, two joints of unicoil 4 are inserted in the testers (figure does not show), can change the size of the input current of coil 4 by tester, control the size of the magnetic flux of the externally-applied magnetic field that this coil 4 produces.The magnetic field that unicoil 4 produces is a uniform magnetic field perpendicular to coil section in the inside, the center of circle of this coil, apart from coil surface more far field will decay soon more, the magnetic line of force of formation is a curve, will no longer be perpendicular to coil surface.So the surface of tested Hall chip is parallel with coil surface and be close to inside, the coil center of circle and will obtain a good magnetic field and offer Hall chip.This proving installation 1 is configured such that the height of test fixture 3 flushes with the upper end of coil 4 in the present embodiment, to be placed in the test fixture 3 when tested Hall chip by the suction nozzle in the rotating disk 11 12 and to compress with golden finger 5 contact when good, this chip lower surface flushes with coil 4 upper end faces.This device accomplishes to make when carrying out the Hall chip magnetic flux test externally-applied magnetic field vertically by Hall chip fully, accomplishes the most accurate magnetic flux density measurement.Its concrete magnetic flux test philosophy is as follows: add a high level for the input pin of tested Hall chip, this moment, the output pin of this chip also was a high level, then coil 4 energisings are added externally-applied magnetic field to give this Hall chip, this externally-applied magnetic field changes from small to big, when output pin level during by high step-down, the magnetic field intensity of this point is the working point magnetic field intensity of required survey, reduce magnetic field then, when output pin level during by low uprising, the magnetic field intensity of this point is the point of release magnetic field intensity of required survey, and it is wide that the difference between working point magnetic field intensity and the point of release magnetic field intensity is the magnetic of this Hall chip.In this test, the wide and test specification of the magnetic that records more whether in range, as if being qualified Hall chip then, otherwise is underproof Hall chip in the test specification scope.
In the Hall chip magnetic flux test, the used permeability magnetic material of conventional test handler measuring head can when coil does not produce magnetic field, also have remanent magnetism and occur because of applying externally-applied magnetic field by permanent magnetization.And in proving installation 1 of the present utility model, the test bracket 9 that is used for twining for coil 4 is to make with the non-magnetic materials of aluminum.The test fixture 3 that is used to place Hall chip is to become with non-magnetic material copper.The cover plate 6 that is provided with the test bench 2 of test fixture 3 and is positioned at golden finger 5 tops all is to make with non-conducting material epoxy resin.And be used for golden finger 5 is fixed in screw 7 between cover plate 6 and the test bench 2, and the screw 8 of fixing test seat 2 on test bracket 9 all is to make with glass material.Therefore, the utility model adopts the non-magnetic material that the part parts of proving installation have been carried out not having the magnetization transformation, has eliminated the remanent magnetism phenomenon, has reduced test deviation and erroneous judgement, can obtain magnetic flux test accurately.
Above embodiment only is used for explanation but does not limit the utility model.The utility model also has various deformation and improvement within the scope of the claims.Simple, the equivalence that every foundation claims of the present utility model and description are done changes and modifies, and all falls into the claim protection domain of the utility model patent.
Claims (9)
1. Hall chip magnetic flux test device (1) that is used for SOT23 packaging and testing separator is characterized in that described device (1) comprising:
Test bracket (9);
Be fixed on the test bench (2) of the upper end of described test bracket;
Be arranged on the test fixture (3) that is used to place tested Hall chip in the described test bench (2);
The a plurality of golden fingers (5) that are electrically connected with described test fixture (3);
Be positioned at the cover plate (6) of described golden finger (5) top, described golden finger (5) is fixed between described cover plate (6) and the described test bench (2); And
Coil (4) on the described test bracket (9).
2. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, described coil (4) is a unicoil.
3. Hall chip magnetic flux test device according to claim 2 (1) is characterized in that, the height of described test fixture (3) flushes with the upper end face of described coil (4).
4. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, described test bracket (9) is the aluminum test bracket.
5. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, described test fixture (3) is the copper test fixture.
6. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, the test bench that described test bench (2) is made for epoxy resin.
7. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, the cover plate that described cover plate (6) is made for epoxy resin.
8. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, described test bench (2) is fixed on the described test bracket (9) by glass screw (8).
9. Hall chip magnetic flux test device according to claim 1 (1) is characterized in that, described golden finger (5) is fixed between described cover plate (6) and the described test bench (2) by glass screw (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201020227824XU CN201804094U (en) | 2010-06-13 | 2010-06-13 | Magnetic flux testing device for Hall chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201020227824XU CN201804094U (en) | 2010-06-13 | 2010-06-13 | Magnetic flux testing device for Hall chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201804094U true CN201804094U (en) | 2011-04-20 |
Family
ID=43873597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201020227824XU Expired - Lifetime CN201804094U (en) | 2010-06-13 | 2010-06-13 | Magnetic flux testing device for Hall chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201804094U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101887106A (en) * | 2010-06-13 | 2010-11-17 | 灿瑞半导体(上海)有限公司 | Hall chip magnetic flux test device |
| CN108333537A (en) * | 2018-04-20 | 2018-07-27 | 成都工业学院 | The debugging apparatus and adjustment method of cast sensor for measurement of magnetic field |
-
2010
- 2010-06-13 CN CN201020227824XU patent/CN201804094U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101887106A (en) * | 2010-06-13 | 2010-11-17 | 灿瑞半导体(上海)有限公司 | Hall chip magnetic flux test device |
| CN101887106B (en) * | 2010-06-13 | 2012-10-17 | 灿瑞半导体(上海)有限公司 | Hall chip magnetic flux test device |
| CN108333537A (en) * | 2018-04-20 | 2018-07-27 | 成都工业学院 | The debugging apparatus and adjustment method of cast sensor for measurement of magnetic field |
| CN108333537B (en) * | 2018-04-20 | 2024-02-27 | 成都工业学院 | Debugging device and method for tubular sensor for magnetic field test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CB03 | Change of inventor or designer information |
Inventor after: Yang Lianhong Inventor before: Luo Liquan Inventor before: Yang Lianhong |
|
| COR | Change of bibliographic data | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee after: SHANGHAI CANRUI TECHNOLOGY CO., LTD. Address before: 200081 room 1717, No. 1006, Shanghai, North Sichuan Road Patentee before: Orient-Chip Semiconductor (Shanghai) Co., Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20110420 |