CN201740853U - Analog integrated circuit test system based on virtual instrument - Google Patents
Analog integrated circuit test system based on virtual instrument Download PDFInfo
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- CN201740853U CN201740853U CN2010202278678U CN201020227867U CN201740853U CN 201740853 U CN201740853 U CN 201740853U CN 2010202278678 U CN2010202278678 U CN 2010202278678U CN 201020227867 U CN201020227867 U CN 201020227867U CN 201740853 U CN201740853 U CN 201740853U
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Abstract
The utility model discloses an analog integrated circuit test system based on virtual instrument comprising a computer, a bias tee, a power source, and a data acquisition card connected with the computer and a signal adjustment circuit. The computer and the data acquisition card can be used for producing the excitation signal required by the circuit to be tested, and for acquiring, processing, recording and displaying the data. The signal adjustment circuit can be used for adjusting the accuracy and stability of input and output signal, and for reducing the signal distortion and error of the system. By using the strong graphics and data processing capability of computer and combing the functions of high-capacity storage, display, file management, printing and output, the utility model has better flexibility, expandability, and high cost performance.
Description
Technical field
The utility model belongs to the ic test technique field, relates to a kind of integrated circuit test system, especially a kind of analog integrated circuit test system based on virtual instrument.
Background technology
The test analysis of Analogous Integrated Electronic Circuits is by applying a specific test and excitation to circuit under test, then analyze the relation of this Circuit responce and excitation, coming the duty of testing circuit, the function of evaluation circuits and characteristic.
Traditional integrated circuit test system is that the employing all purpose instrument is the building mode of test platform, and this system utilizes function signal generator to produce the needed signal of circuit, measures the time series that receives signal with digital oscilloscope. The establishment relative complex of test macro, and the requirement of the accuracy of instrument etc. limited its scope of application. The upgradability of this type systematic of what is more important is poor, and the Function Extension of system often is subject to the restriction of system hardware test specification.
The utility model content
The purpose of this utility model is to overcome the shortcoming of above-mentioned prior art, and a kind of analog integrated circuit test system based on virtual instrument is provided. This system is that a cover is special in the comparatively complete virtual test instrument of Analogous Integrated Electronic Circuits test analysis, and it can realize real-time output and the collection of signal under the control of software, can to test data in real time, accurately, collection and the intelligent analysis of high speed.
The purpose of this utility model solves by the following technical programs: this analog integrated circuit test system based on virtual instrument, comprise computer, biasing device, power supply and the data collecting card that is connected with computer, described data collecting card also is connected with signal conditioning circuit, and this signal conditioning circuit comprises programme-controlled gain circuit and AC-DC coupling circuit; Described AC-DC coupling circuit is made of coupling circuit and the power amplification circuit of mutual series connection, the output of described control gain circuit is connected to the input of coupling circuit, the output of described power amplification circuit is connected to the AC signal input of to-be-measured integrated circuit, and the AC signal output of to-be-measured integrated circuit is connected with the input of programme-controlled gain circuit; Described biasing device and power supply are connected respectively on the to-be-measured integrated circuit.
Above-mentioned programme-controlled gain circuit is by output signal conditioning circuit and input signal conditioning the electric circuit constitute; Above-mentioned output signal conditioning circuit comprises first and second latch, the DA converter, the first on-off circuit, the first attenuator circuit and the first gain amplifying circuit, the input of the input of described DA converter and the first on-off circuit is connected on the data collecting card by the first latch and the second latch respectively, described the first on-off circuit respectively with the first attenuator circuit be connected the gain amplifying circuit be connected, the input of described the first attenuator circuit and the first gain amplifying circuit series connection and the first attenuator circuit is connected on the data collecting card, and the output of the first gain amplifying circuit and the output of DA converter are connected respectively to the input of coupling circuit; Above-mentioned input signal conditioning circuit comprises the 3rd latch, second switch circuit, the second gain amplifying circuit and the second attenuator circuit, described second switch circuit is connected on the data collecting card by the 3rd latch, the second switch circuit respectively with the second gain amplifying circuit be connected attenuator circuit and be connected; The output of described the second gain amplifying circuit is connected on the data collecting card, and its input is connected with the output of the second attenuator circuit, and the AC signal input of the second attenuator circuit is connected on the to-be-measured integrated circuit.
Above-mentioned the first to three latch be 74HC377.
Above-mentioned DA converter is AD7541.
Above-mentioned first and second on-off circuit is relay.
Above-mentioned first and second attenuator circuit is resistor network.
Above-mentioned first and second gain amplifying circuit is PGA202.
Above-mentioned data collecting card is PCI1716L.
The utility model has been given full play to the powerful function of microcomputer and the flexibility of Software for Design, compares with the traditional common instrument, and it has the following advantages: 1) can store and read the waveform of tested integrated circuit by computer; 2) by mounting software on computers, the user can custom feature, its dependable performance, and whole system can be by software upgrading, and the modification of its function and upgrading make things convenient for the operation interface simple and flexible; Therefore this test macro has utilized existing computer resource to greatest extent, has reduced cost, has improved efficient; 3) compare with traditional test, extensibility of the present utility model is strong, utilizes the powerful figure of computer and data processing function, jumbo storage and demonstration, and the functions such as file management, printout have remedied the deficiency of traditional hardware instrument.
Description of drawings
Fig. 1 is structured flowchart of the present utility model; Fig. 2 is that the overall structure block diagram 3 of signal conditioning circuit in the utility model is input signal conditioning circuit 4 block diagrams; Fig. 4 is output signal conditioning circuit 3 block diagrams; Fig. 5 is line regulation test circuit figure; Fig. 6 is load regulation test circuit figure; Fig. 7 is for outputing test result.
The specific embodiment
Referring to Fig. 1 and Fig. 2, the analog integrated circuit test system based on virtual instrument of the present utility model comprises computer, biasing device, power supply and the data collecting card that is connected with computer, the signal conditioning circuit that is connected with data collecting card. Wherein signal conditioning circuit comprises programme-controlled gain circuit 1 and AC-DC coupling circuit 2, and AC-DC coupling circuit 2 is made of coupling circuit and the power amplification circuit of mutual series connection. The output of programme-controlled gain circuit 1 is connected to the input of coupling circuit, and the output of power amplification circuit is connected to the AC signal input of to-be-measured integrated circuit, and the AC signal output of to-be-measured integrated circuit is connected with the input of programme-controlled gain circuit 1; Aforesaid biasing device and power supply are connected respectively on the to-be-measured integrated circuit.
Above programme-controlled gain circuit 1 specifically is comprised of output signal conditioning circuit 3 and the input signal conditioning circuit 4 of the following stated: (1) output signal conditioning circuit 3: output signal conditioning circuit 3 comprises first and second latch A, B, the DA converter, the first on-off circuit K1, the first attenuator circuit S1 and the first gain amplifying circuit Z1, the input of the input of described DA converter and the first on-off circuit K1 is connected on the data collecting card by the first latch A and the second latch B respectively, described the first on-off circuit K1 respectively with the first attenuator circuit S1 be connected gain amplifying circuit Z1 and be connected, the input of the first attenuator circuit S1 and the first gain amplifying circuit Z1 series connection and the first attenuator circuit S1 is connected on the data collecting card, and the output of the first gain amplifying circuit Z1 and the output of DA converter are connected respectively to the input of coupling circuit.
(2) the input signal conditioning circuit 4: input signal conditioning circuit 4 comprises the 3rd latch C, second switch circuit K2, the second gain amplifying circuit Z2 and the second attenuator circuit S2, described second switch circuit K2 is connected on the data collecting card by the 3rd latch C, second switch circuit K2 respectively with the second gain amplifying circuit Z2 be connected attenuator circuit S2 and be connected; The output of the second gain amplifying circuit Z2 is connected on the data collecting card, and its input is connected with the output of the second attenuator circuit S2, and the AC signal input of the second attenuator circuit S2 is connected on the to-be-measured integrated circuit.
Referring to input signal conditioning circuit 4 block diagrams of Fig. 3 and output signal conditioning circuit 3 block diagrams of Fig. 4, in the optimal case that the utility model proposes, all employings 74HC377 of the first to three latch A, B, C; The DA converter adopts AD7541; First and second on-off circuit K1, K2 all adopt relay; First and second attenuator circuit S1, S2 all adopt resistor network; First and second gain amplifying circuit Z1, Z2 all adopt PGA202. Data collecting card of the present utility model adopts PCI1716L.
According to above hardware syndeton of the present utility model, function and the operation principle of following labor each circuit of the present utility model: the circuit under test among Fig. 1 (being to-be-measured integrated circuit) mainly is the power management chip circuit. Because of the difference of task to be measured, different circuit under test are distinguished to some extent, and computer and signal conditioning circuit have versatility. Computer is the core of whole system, and it is connected with data collecting card, and on computers special-purpose software systems is installed. And signal conditioning circuit will be finished the conditioning of both direction signal. A signal that is main frame produces will be done certain conditioning before finally as the excitation of object to be measured, such as amplifying, setover coupling etc. Another be main frame before acquisition system Excitation and response signal, tackle it and do certain conditioning, such as amplifying or decay, make it within the best acquisition range of main frame.
In this test macro signal conditioning circuit, 74HC377 is used for the numeric control command that the latch data capture card sends; On-off circuit and relay are used for cutting off and closed circuit under digital voltage; Resistor network provides the decay of different gears; PGA202 realizes that programme-controlled gain amplifies.
In the AC-DC coupling circuit 2 of the present utility model, coupling circuit is realized the coupling of the AC signal that program control direct current biasing and data collecting card produce. Power amplification circuit is realized the power amplification of the rear signal of coupling.
In the utility model, the biasing device that is connected with circuit under test mainly is according to the real needs of circuit under test test, and bias voltage, bias current, source resistance are provided, and makes it to be in corresponding test mode. The output response of circuit under test is sent to analyzing and processing, storage and printing (computer the is connected with printer) output that main frame (being computer) carries out data through signal conditioning circuit and data collecting card.
In preferred version of the present utility model, the data collecting card of test macro selects the combination of PCI-1721 and PCI-1716L two blocks of data capture cards with generation and the collection of settling signal, wherein PCI-1721 is connected (such as Fig. 4) with output signal conditioning circuit 3, and PCI-1716L is connected with input signal conditioning circuit 4. PCI-1721 is a high performance PCI analog output unit, and its maximum sampling rate is 10MHz, to guarantee the test frequency scope; Quantified precision is 12bit, to guarantee measuring accuracy and dynamic range. The 16bit high resolution A of PCI-1716L/D conversion has guaranteed the high speed input of analog signal amount up to the 250KS/s sampling rate. The combination of two card difference in functionality patterns has guaranteed signal generation and stablizing with continuous of gathering, and is considering in the situation of whole factor the scheme that signal frequency, pre-sampling number and buffer size cooperatively interact in the employing table 1. In addition, also with gain-programmed amplifier, high-resolution counter etc., for the Function Extension of instrument has been created condition, data transfer adopts the mode of sync buffering direct memory access simultaneously on the data collecting card, has guaranteed the quick and continuous of transfer of data.
Based on above-mentioned structure, the test cell that this system can detect is operational amplifier, low pressure difference linear voltage regulator, Switching Power Supply, LED driving, a reference source etc.
The relation of table 1 sample rate, pre-sampling number and buffer size
The performance verification of system is for the checking of performance and the accuracy of measurement of this test macro, adopts the method that native system measurement data and traditional common apparatus measures data are compared. Because traditional all purpose instrument manufacturing technology comparative maturity, its measurement result is extensively accepted by people, so its certainty of measurement and confidence level are higher. If this system's measured result is very close with traditional high precision instrument test result, just can think that institute's development system is to satisfy precision and application demand.
| Signal frequency (KHz) | 1 | 10 | 100 | 200 | 500 | 1000 |
| Pre-sampling number | 1K | 5K | 50K | 100K | 250K | 500K |
| Buffer size | 500 | 2500 | 25K | 50K | 125K | 250K |
The native system circuit under test selects low differential voltage linear voltage stabilizer circuit (sample AMC1117) for example, and adopt this system and traditional common instrument to its key parameter: the DC characteristic indexs such as line regulation, load regulation are tested. Line regulation reflected in the constant situation of the conditions such as environment temperature, the sensitivity level that output voltage changes with the variation of input voltage; Load regulation has reflected the sensitivity level that output voltage changes with the variation of load current. Actual test circuit such as Fig. 5, shown in Figure 6.
AMC1117 series is the positive integrated regulator of the adjustable or fixing output of low voltage difference three ends 1.5V, a 2.5V, 3.3V, 5V, and the sample that the utility model is selected is the low pressure difference linear voltage regulator of fixing output 1.5V. Test result is shown in table 2 and table 3. Figure 7 shows that this system when test voltage-stablizer line regulation, only intercepting duty is input voltage VIN=5V is to the test result of its output voltage.
Table 2 line regulation virtual test data (Vout1) and traditional test data (Vout2)
Table 3 load regulation virtual test data (Vout1) and traditional test data (Vout2)
Get at random two groups of data from table 2 and calculate line regulation: Get at random two groups of data computational load regulations from table 3: For AMC1117-1.5, learnt test condition by spec: 10mA＜IO＜1A，3.0V＜V
IN＜7.0V。
| Input voltage (Vin) | Output voltage (Vout1) | Output voltage (Vout2) |
| Vin＝4V | Vout1＝1.51587V | Vout2＝1.520V |
| Vin＝5V | Vout1＝1.51752V | Vout2＝1.521V |
| Vin＝6V | Vout1＝1.52015V | Vout2＝1.524V |
| Vin＝7V | Vout1＝1.52282V | Vout2＝1.527V |
| Electric current (Io) | Resistance (R) | Output voltage (Vout1) | Output voltage (Vout2) |
| Io＝200mA | R＝7.5Ω | Vout1＝1.51285V | Vout2＝1.523V |
| Io＝400mA | R＝3.75Ω | Vout1＝1.50328V | Vout2＝1.512V |
| Io＝600mA | R＝2.5Ω | Vout1＝1.49122V | Vout2＝1.498V |
Technical indicator: output voltage 1.470V＜VOUT＜1.530V, representative value are VOUT＝1.500V。
Line regulation: 1.0mV＜Δ VOI＜6.0mV，0.033％＜S
v＜0.600%; Load regulation: 1.0mV＜Δ VOL＜10.0mV，0.5％＜S
I＜5.0％。
Test result contrast: by table 2, table 3 and result of calculation as can be known virtual test and traditional high precision instrument test result substantially meet desired value among the spec of AMC1117-1.5, and relative error is less, shows that this virtual test system design is feasible; Compare with traditional test, this system expandability is strong, and powerful figure and data processing function, jumbo storage and demonstration, and the functions such as file management, printout have remedied again the deficiency of traditional hardware instrument.
Actual test result to low pressure difference linear voltage regulator shows that the utility model can be measured and process performance parameter of regulator real-time, quickly and accurately.
Claims (8)
1. analog integrated circuit test system based on virtual instrument, comprise computer, biasing device, power supply and the data collecting card that is connected with computer, it is characterized in that: described data collecting card also is connected with signal conditioning circuit, and this signal conditioning circuit comprises programme-controlled gain circuit (1) and AC-DC coupling circuit (2); Described AC-DC coupling circuit (2) is made of coupling circuit and the power amplification circuit of mutual series connection, the output of described programme-controlled gain circuit (1) is connected to the input of coupling circuit, the output of described power amplification circuit is connected to the AC signal input of to-be-measured integrated circuit, and the AC signal output of to-be-measured integrated circuit is connected with the input of programme-controlled gain circuit (1); Described biasing device and power supply are connected respectively on the to-be-measured integrated circuit.
2. the analog integrated circuit test system based on virtual instrument according to claim 1, it is characterized in that: described programme-controlled gain circuit (1) is comprised of output signal conditioning circuit (3) and input signal conditioning circuit (4); Described output signal conditioning circuit (3) comprises first and second latch (A, B), the DA converter, the first on-off circuit (K1), the first attenuator circuit (S1) and the first gain amplifying circuit (Z1), the input of the input of described DA converter and the first on-off circuit (K1) is connected on the data collecting card by the first latch (A) and the second latch (B) respectively, described the first on-off circuit (K1) respectively with the first attenuator circuit (S1) be connected the gain amplifying circuit (Z1) be connected, the input of described the first attenuator circuit (S1) and the first gain amplifying circuit (Z1) series connection and the first attenuator circuit (S1) is connected on the data collecting card, and the output of the first gain amplifying circuit (Z1) and the output of DA converter are connected respectively to the input of coupling circuit;
Described input signal conditioning circuit (4) comprises the 3rd latch (C), second switch circuit (K2), the second gain amplifying circuit (Z2) and the second attenuator circuit (S2), described second switch circuit (K2) is connected on the data collecting card by the 3rd latch (C), second switch circuit (K2) respectively with the second gain amplifying circuit (Z2) be connected attenuator circuit (S2) and be connected; The output of described the second gain amplifying circuit (Z2) is connected on the data collecting card, and its input is connected with the output of the second attenuator circuit (S2), and the AC signal input of the second attenuator circuit (S2) is connected on the to-be-measured integrated circuit.
3. the analog integrated circuit test system based on virtual instrument according to claim 2 is characterized in that: described the first to three latch (A, B, C) be 74HC377.
4. the analog integrated circuit test system based on virtual instrument according to claim 2, it is characterized in that: described DA converter is AD7541.
5. the analog integrated circuit test system based on virtual instrument according to claim 2, it is characterized in that: described first and second on-off circuit (K1, K2) is relay.
6. the analog integrated circuit test system based on virtual instrument according to claim 2, it is characterized in that: described first and second attenuator circuit (S1, S2) is resistor network.
7. the analog integrated circuit test system based on virtual instrument according to claim 2 is characterized in that: described first and second gain amplifying circuit (Z1, Z2) is PGA202.
8. the analog integrated circuit test system based on virtual instrument according to claim 1, it is characterized in that: described data collecting card is the combination of PCI-1721 and PCI1716L.
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| CN2010202278678U CN201740853U (en) | 2010-06-17 | 2010-06-17 | Analog integrated circuit test system based on virtual instrument |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103913692A (en) * | 2012-12-29 | 2014-07-09 | 北京谊安医疗系统股份有限公司 | Signal conditioning device for testing |
| CN104007339A (en) * | 2014-05-16 | 2014-08-27 | 中国空间技术研究院 | Online testing system for electrical parameters of photoelectric coupler in remote transmission mode and online testing method for photoelectric coupler |
| CN105911453A (en) * | 2016-04-15 | 2016-08-31 | 南京工程学院 | Virtual-instrument-technology-based general circuit debugging system and method |
| CN106405366A (en) * | 2015-07-31 | 2017-02-15 | 王健男 | Computer aided system and method for electronic product development and maintenance |
| CN115372408A (en) * | 2022-08-08 | 2022-11-22 | 东南大学 | Automatic 3 omega test system and method based on bridge and data acquisition card |
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2010
- 2010-06-17 CN CN2010202278678U patent/CN201740853U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103913692A (en) * | 2012-12-29 | 2014-07-09 | 北京谊安医疗系统股份有限公司 | Signal conditioning device for testing |
| CN104007339A (en) * | 2014-05-16 | 2014-08-27 | 中国空间技术研究院 | Online testing system for electrical parameters of photoelectric coupler in remote transmission mode and online testing method for photoelectric coupler |
| CN106405366A (en) * | 2015-07-31 | 2017-02-15 | 王健男 | Computer aided system and method for electronic product development and maintenance |
| CN105911453A (en) * | 2016-04-15 | 2016-08-31 | 南京工程学院 | Virtual-instrument-technology-based general circuit debugging system and method |
| CN105911453B (en) * | 2016-04-15 | 2019-03-22 | 南京工程学院 | Universal circuit debugging system and method based on virtual instrument technology |
| CN115372408A (en) * | 2022-08-08 | 2022-11-22 | 东南大学 | Automatic 3 omega test system and method based on bridge and data acquisition card |
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Granted publication date: 20110209 Termination date: 20110617 |