CN201732101U - High-temperature test fixture for surface mounted Schottky diodes SMA - Google Patents

High-temperature test fixture for surface mounted Schottky diodes SMA Download PDF

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Publication number
CN201732101U
CN201732101U CN 201020178712 CN201020178712U CN201732101U CN 201732101 U CN201732101 U CN 201732101U CN 201020178712 CN201020178712 CN 201020178712 CN 201020178712 U CN201020178712 U CN 201020178712U CN 201732101 U CN201732101 U CN 201732101U
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CN
China
Prior art keywords
supporting plate
metal sheets
sma
sheet metal
test fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201020178712
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Chinese (zh)
Inventor
黄建山
张练佳
陈建华
梅余锋
贲海蛟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RUGAO EADA ELECTRONICS CO Ltd
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RUGAO EADA ELECTRONICS CO Ltd
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Publication date
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Priority to CN 201020178712 priority Critical patent/CN201732101U/en
Application granted granted Critical
Publication of CN201732101U publication Critical patent/CN201732101U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a high-temperature test fixture for surface mounted Schottky diodes SMA, which comprises an epoxy resin baseboard and supports on two sides of the baseboard. The test fixture is characterized in that a front supporting plate and a rear supporting plate which extend along the direction of the supports on two sides of the baseboard are mounted on the baseboard, a plurality of pairs of metal sheets extending along the supporting plates are arranged on the inner sides of the front supporting plate and the rear supporting plate correspondingly, each pair of metal sheets correspondingly arranged on the inner sides of the front supporting plate and the rear supporting plate are provided with rectangular grooves symmetrically, and spring ejector pins are arranged above the metal sheets. The test fixture has the advantages that during usage, each SMA is placed between each pair of metal sheets, two electrodes of each diode are rightly located in the rectangular grooves of the metal sheets, and the top ends of the diode is pressed by each ejector pin, so that the two electrodes of each diode contact with the metal sheets well. Further, the test fixture is placed in an oven, and anodes and cathodes of testing leads of a test meter are connected with the metal sheets, thereby realizing SMA high-temperature performance tests.

Description

A kind of SMA high temperature test anchor clamps of stamp-mounting-paper diode
Technical field
The utility model relates to a kind of anchor clamps, particularly a kind of SMA high temperature test anchor clamps of stamp-mounting-paper diode.
Background technology
Before the paster diode dispatches from the factory, need carry out the sample testing of S MA high-temperature behavior, traditional method is direct the two poles of the earth and high temperature test wire bonds at stamp-mounting-paper diode, and the product that tests is directly scrapped, and causes the waste of product.
The utility model content
The technical problems to be solved in the utility model provides a kind of SMA high temperature test anchor clamps that can conveniently carry out the stamp-mounting-paper diode of SMA high temperature test.
For solving the problems of the technologies described above, the technical solution of the utility model is: a kind of SMA high temperature test anchor clamps of stamp-mounting-paper diode, comprise the epoxy resin base plate and be located at base plate two side stands, its innovative point is: described base plate is provided with the back and front supporting plate that extends along the both sides holder orientation, correspondence is provided with some sheet metals to extending along back up pad on the medial surface of described back and front supporting plate, and symmetry has rectangular slot on the corresponding every pair of sheet metal that is provided with of described back and front supporting plate medial surface; Be provided with a horizontal direction pull bar by bracket supports directly over the described sheet metal, described pull bar is provided with the quantity thimble corresponding with sheet metal, is provided with spring between described thimble and the pull bar.
Further, described front end panel is a metal material, and rear bearing sheet is an insulating material.
Advantage of the present utility model is: during use, stamp-mounting-paper diode places between every pair of sheet metal, and the two poles of the earth of diode are just dropped in the rectangular slot of sheet metal, and the top compresses by thimble, makes diode the two poles of the earth well contact sheet metal with this.These anchor clamps are placed in the baking oven, the test lead both positive and negative polarity of use test table is connected sheet metal with this again, can carry out the test of SMA high-temperature behavior.
Front end panel is a metal material, rear bearing sheet is an insulating material, like this, the negative pole of test lead is when connecting the sheet metal of front end panel, only need be connected with front end panel, the negative pole of test lead is other to be connected with each sheet metal on the rear bearing sheet respectively again, can test, do not need every pair of sheet metal all to connect twice, improved testing efficiency.
Description of drawings
Fig. 1 is the utility model diode SMA high temperature test anchor clamps front views.
Fig. 2 is an A-A line cut-open view among Fig. 1.
Embodiment
As shown in Figure 1, 2, comprise base plate 1, support 2, front end panel 3, rear bearing sheet 4, sheet metal 5, pull bar 6, thimble 7, spring 8.
Above-mentioned base plate 1 is the epoxy resin injection mo(u)lding, and its both sides are provided with support 2, and base plate 1 is provided with front end panel 3 and the rear bearing sheet 4 that extends along two side stands, 2 directions, and front end panel 3 is a metal material, and rear bearing sheet 4 is an insulating material.The medial surface correspondence of back and front supporting plate 3,4 is provided with eight to ten pairs of sheet metals 5 that extend along the back up pad direction, concrete: sheet metal 5a is located at the side of front end panel 3 towards rear bearing sheet 4, sheet metal 5b is located at the side of rear bearing sheet 4, with sheet metal 5a be a pair of, and on sheet metal 5a and sheet metal 5b, have the symmetry rectangular slot.
Be provided with a pull bar 6 by the horizontal direction of two stands 2 supportings directly over sheet metal 5a, 5b, this pull bar 6 is provided with the quantity thimble corresponding with sheet metal 7, is provided with spring 8 between this thimble 7 and the pull bar 6.
During use, stamp-mounting-paper diode to be tested 9 is placed between sheet metal 5a, the 5b, the two poles of the earth of diode 9 are just dropped in the rectangular slot of sheet metal 5a, 5b, and thimble 7 compresses diode 9 under the effect of spring 8, make diode 9 the two poles of the earth well contact with sheet metal 5a, 5b respectively.These anchor clamps are placed in the baking oven, the test lead both positive and negative polarity of use test table is connected sheet metal with this again, can carry out the test of SMA high-temperature behavior.Because front end panel 3 is a metal material, rear bearing sheet 4 is an insulating material, like this, the negative pole of test lead is when connecting the sheet metal of front end panel 4, only need be connected with front end panel 4 and get final product, the negative pole of test lead is other to be connected with each sheet metal on the rear bearing sheet respectively again, tests, do not need every pair of sheet metal all to connect twice, improved testing efficiency.

Claims (2)

1. the SMA high temperature test anchor clamps of a stamp-mounting-paper diode, comprise the epoxy resin base plate and be located at base plate two side stands, it is characterized in that: described base plate is provided with the back and front supporting plate that extends along the both sides holder orientation, correspondence is provided with some sheet metals to extending along back up pad on the medial surface of described back and front supporting plate, and symmetry has rectangular slot on the corresponding every pair of sheet metal that is provided with of described back and front supporting plate medial surface; Be provided with a horizontal direction pull bar by bracket supports directly over the described sheet metal, described pull bar is provided with the quantity thimble corresponding with sheet metal, is provided with spring between described thimble and the pull bar.
2. the SMA high temperature test anchor clamps of stamp-mounting-paper diode according to claim 1, it is characterized in that: described front end panel is a metal material, rear bearing sheet is an insulating material.
CN 201020178712 2010-05-05 2010-05-05 High-temperature test fixture for surface mounted Schottky diodes SMA Expired - Fee Related CN201732101U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201020178712 CN201732101U (en) 2010-05-05 2010-05-05 High-temperature test fixture for surface mounted Schottky diodes SMA

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201020178712 CN201732101U (en) 2010-05-05 2010-05-05 High-temperature test fixture for surface mounted Schottky diodes SMA

Publications (1)

Publication Number Publication Date
CN201732101U true CN201732101U (en) 2011-02-02

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201020178712 Expired - Fee Related CN201732101U (en) 2010-05-05 2010-05-05 High-temperature test fixture for surface mounted Schottky diodes SMA

Country Status (1)

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CN (1) CN201732101U (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103753320A (en) * 2013-12-23 2014-04-30 柳州市永信机械配件制造有限公司 Multi-thimble positioning method
WO2016011664A1 (en) * 2014-07-23 2016-01-28 上海硅酸盐研究所中试基地 High-temperature test fixture
CN106226562A (en) * 2016-07-11 2016-12-14 无锡宏纳科技有限公司 Spring downward cake core test fixture
CN107300668A (en) * 2016-04-14 2017-10-27 深圳市三联光智能设备股份有限公司 Paster touch-switch mechanism for testing and paster touch-switch braider
CN108459258A (en) * 2018-01-09 2018-08-28 南通康比电子有限公司 A kind of electric performance testing device of diode
CN111880070A (en) * 2020-08-24 2020-11-03 武汉博畅通信设备有限责任公司 Clamping device of PIN diode reverse bias current detection tool
CN113466651A (en) * 2021-07-08 2021-10-01 南京富立芝数码科技有限公司 Detection equipment for nixie tube

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103753320A (en) * 2013-12-23 2014-04-30 柳州市永信机械配件制造有限公司 Multi-thimble positioning method
WO2016011664A1 (en) * 2014-07-23 2016-01-28 上海硅酸盐研究所中试基地 High-temperature test fixture
CN104122448B (en) * 2014-07-23 2017-04-12 上海硅酸盐研究所中试基地 High-temperature test fixture
US10215798B2 (en) 2014-07-23 2019-02-26 R&D Center, Shanghai Institute Of Ceramics High-temperature test fixture
CN107300668A (en) * 2016-04-14 2017-10-27 深圳市三联光智能设备股份有限公司 Paster touch-switch mechanism for testing and paster touch-switch braider
CN106226562A (en) * 2016-07-11 2016-12-14 无锡宏纳科技有限公司 Spring downward cake core test fixture
CN108459258A (en) * 2018-01-09 2018-08-28 南通康比电子有限公司 A kind of electric performance testing device of diode
CN111880070A (en) * 2020-08-24 2020-11-03 武汉博畅通信设备有限责任公司 Clamping device of PIN diode reverse bias current detection tool
CN113466651A (en) * 2021-07-08 2021-10-01 南京富立芝数码科技有限公司 Detection equipment for nixie tube

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110202

Termination date: 20130505