CN201732101U - High-temperature test fixture for surface mounted Schottky diodes SMA - Google Patents
High-temperature test fixture for surface mounted Schottky diodes SMA Download PDFInfo
- Publication number
- CN201732101U CN201732101U CN 201020178712 CN201020178712U CN201732101U CN 201732101 U CN201732101 U CN 201732101U CN 201020178712 CN201020178712 CN 201020178712 CN 201020178712 U CN201020178712 U CN 201020178712U CN 201732101 U CN201732101 U CN 201732101U
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- supporting plate
- metal sheets
- sma
- sheet metal
- test fixture
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Abstract
The utility model relates to a high-temperature test fixture for surface mounted Schottky diodes SMA, which comprises an epoxy resin baseboard and supports on two sides of the baseboard. The test fixture is characterized in that a front supporting plate and a rear supporting plate which extend along the direction of the supports on two sides of the baseboard are mounted on the baseboard, a plurality of pairs of metal sheets extending along the supporting plates are arranged on the inner sides of the front supporting plate and the rear supporting plate correspondingly, each pair of metal sheets correspondingly arranged on the inner sides of the front supporting plate and the rear supporting plate are provided with rectangular grooves symmetrically, and spring ejector pins are arranged above the metal sheets. The test fixture has the advantages that during usage, each SMA is placed between each pair of metal sheets, two electrodes of each diode are rightly located in the rectangular grooves of the metal sheets, and the top ends of the diode is pressed by each ejector pin, so that the two electrodes of each diode contact with the metal sheets well. Further, the test fixture is placed in an oven, and anodes and cathodes of testing leads of a test meter are connected with the metal sheets, thereby realizing SMA high-temperature performance tests.
Description
Technical field
The utility model relates to a kind of anchor clamps, particularly a kind of SMA high temperature test anchor clamps of stamp-mounting-paper diode.
Background technology
Before the paster diode dispatches from the factory, need carry out the sample testing of S MA high-temperature behavior, traditional method is direct the two poles of the earth and high temperature test wire bonds at stamp-mounting-paper diode, and the product that tests is directly scrapped, and causes the waste of product.
The utility model content
The technical problems to be solved in the utility model provides a kind of SMA high temperature test anchor clamps that can conveniently carry out the stamp-mounting-paper diode of SMA high temperature test.
For solving the problems of the technologies described above, the technical solution of the utility model is: a kind of SMA high temperature test anchor clamps of stamp-mounting-paper diode, comprise the epoxy resin base plate and be located at base plate two side stands, its innovative point is: described base plate is provided with the back and front supporting plate that extends along the both sides holder orientation, correspondence is provided with some sheet metals to extending along back up pad on the medial surface of described back and front supporting plate, and symmetry has rectangular slot on the corresponding every pair of sheet metal that is provided with of described back and front supporting plate medial surface; Be provided with a horizontal direction pull bar by bracket supports directly over the described sheet metal, described pull bar is provided with the quantity thimble corresponding with sheet metal, is provided with spring between described thimble and the pull bar.
Further, described front end panel is a metal material, and rear bearing sheet is an insulating material.
Advantage of the present utility model is: during use, stamp-mounting-paper diode places between every pair of sheet metal, and the two poles of the earth of diode are just dropped in the rectangular slot of sheet metal, and the top compresses by thimble, makes diode the two poles of the earth well contact sheet metal with this.These anchor clamps are placed in the baking oven, the test lead both positive and negative polarity of use test table is connected sheet metal with this again, can carry out the test of SMA high-temperature behavior.
Front end panel is a metal material, rear bearing sheet is an insulating material, like this, the negative pole of test lead is when connecting the sheet metal of front end panel, only need be connected with front end panel, the negative pole of test lead is other to be connected with each sheet metal on the rear bearing sheet respectively again, can test, do not need every pair of sheet metal all to connect twice, improved testing efficiency.
Description of drawings
Fig. 1 is the utility model diode SMA high temperature test anchor clamps front views.
Fig. 2 is an A-A line cut-open view among Fig. 1.
Embodiment
As shown in Figure 1, 2, comprise base plate 1, support 2, front end panel 3, rear bearing sheet 4, sheet metal 5, pull bar 6, thimble 7, spring 8.
Above-mentioned base plate 1 is the epoxy resin injection mo(u)lding, and its both sides are provided with support 2, and base plate 1 is provided with front end panel 3 and the rear bearing sheet 4 that extends along two side stands, 2 directions, and front end panel 3 is a metal material, and rear bearing sheet 4 is an insulating material.The medial surface correspondence of back and front supporting plate 3,4 is provided with eight to ten pairs of sheet metals 5 that extend along the back up pad direction, concrete: sheet metal 5a is located at the side of front end panel 3 towards rear bearing sheet 4, sheet metal 5b is located at the side of rear bearing sheet 4, with sheet metal 5a be a pair of, and on sheet metal 5a and sheet metal 5b, have the symmetry rectangular slot.
Be provided with a pull bar 6 by the horizontal direction of two stands 2 supportings directly over sheet metal 5a, 5b, this pull bar 6 is provided with the quantity thimble corresponding with sheet metal 7, is provided with spring 8 between this thimble 7 and the pull bar 6.
During use, stamp-mounting-paper diode to be tested 9 is placed between sheet metal 5a, the 5b, the two poles of the earth of diode 9 are just dropped in the rectangular slot of sheet metal 5a, 5b, and thimble 7 compresses diode 9 under the effect of spring 8, make diode 9 the two poles of the earth well contact with sheet metal 5a, 5b respectively.These anchor clamps are placed in the baking oven, the test lead both positive and negative polarity of use test table is connected sheet metal with this again, can carry out the test of SMA high-temperature behavior.Because front end panel 3 is a metal material, rear bearing sheet 4 is an insulating material, like this, the negative pole of test lead is when connecting the sheet metal of front end panel 4, only need be connected with front end panel 4 and get final product, the negative pole of test lead is other to be connected with each sheet metal on the rear bearing sheet respectively again, tests, do not need every pair of sheet metal all to connect twice, improved testing efficiency.
Claims (2)
1. the SMA high temperature test anchor clamps of a stamp-mounting-paper diode, comprise the epoxy resin base plate and be located at base plate two side stands, it is characterized in that: described base plate is provided with the back and front supporting plate that extends along the both sides holder orientation, correspondence is provided with some sheet metals to extending along back up pad on the medial surface of described back and front supporting plate, and symmetry has rectangular slot on the corresponding every pair of sheet metal that is provided with of described back and front supporting plate medial surface; Be provided with a horizontal direction pull bar by bracket supports directly over the described sheet metal, described pull bar is provided with the quantity thimble corresponding with sheet metal, is provided with spring between described thimble and the pull bar.
2. the SMA high temperature test anchor clamps of stamp-mounting-paper diode according to claim 1, it is characterized in that: described front end panel is a metal material, rear bearing sheet is an insulating material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020178712 CN201732101U (en) | 2010-05-05 | 2010-05-05 | High-temperature test fixture for surface mounted Schottky diodes SMA |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201020178712 CN201732101U (en) | 2010-05-05 | 2010-05-05 | High-temperature test fixture for surface mounted Schottky diodes SMA |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201732101U true CN201732101U (en) | 2011-02-02 |
Family
ID=43523260
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201020178712 Expired - Fee Related CN201732101U (en) | 2010-05-05 | 2010-05-05 | High-temperature test fixture for surface mounted Schottky diodes SMA |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201732101U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103753320A (en) * | 2013-12-23 | 2014-04-30 | 柳州市永信机械配件制造有限公司 | Multi-thimble positioning method |
| WO2016011664A1 (en) * | 2014-07-23 | 2016-01-28 | 上海硅酸盐研究所中试基地 | High-temperature test fixture |
| CN106226562A (en) * | 2016-07-11 | 2016-12-14 | 无锡宏纳科技有限公司 | Spring downward cake core test fixture |
| CN107300668A (en) * | 2016-04-14 | 2017-10-27 | 深圳市三联光智能设备股份有限公司 | Paster touch-switch mechanism for testing and paster touch-switch braider |
| CN108459258A (en) * | 2018-01-09 | 2018-08-28 | 南通康比电子有限公司 | A kind of electric performance testing device of diode |
| CN111880070A (en) * | 2020-08-24 | 2020-11-03 | 武汉博畅通信设备有限责任公司 | Clamping device of PIN diode reverse bias current detection tool |
| CN113466651A (en) * | 2021-07-08 | 2021-10-01 | 南京富立芝数码科技有限公司 | Detection equipment for nixie tube |
-
2010
- 2010-05-05 CN CN 201020178712 patent/CN201732101U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103753320A (en) * | 2013-12-23 | 2014-04-30 | 柳州市永信机械配件制造有限公司 | Multi-thimble positioning method |
| WO2016011664A1 (en) * | 2014-07-23 | 2016-01-28 | 上海硅酸盐研究所中试基地 | High-temperature test fixture |
| CN104122448B (en) * | 2014-07-23 | 2017-04-12 | 上海硅酸盐研究所中试基地 | High-temperature test fixture |
| US10215798B2 (en) | 2014-07-23 | 2019-02-26 | R&D Center, Shanghai Institute Of Ceramics | High-temperature test fixture |
| CN107300668A (en) * | 2016-04-14 | 2017-10-27 | 深圳市三联光智能设备股份有限公司 | Paster touch-switch mechanism for testing and paster touch-switch braider |
| CN106226562A (en) * | 2016-07-11 | 2016-12-14 | 无锡宏纳科技有限公司 | Spring downward cake core test fixture |
| CN108459258A (en) * | 2018-01-09 | 2018-08-28 | 南通康比电子有限公司 | A kind of electric performance testing device of diode |
| CN111880070A (en) * | 2020-08-24 | 2020-11-03 | 武汉博畅通信设备有限责任公司 | Clamping device of PIN diode reverse bias current detection tool |
| CN113466651A (en) * | 2021-07-08 | 2021-10-01 | 南京富立芝数码科技有限公司 | Detection equipment for nixie tube |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110202 Termination date: 20130505 |