CN201522551U - On-load switch tester calibration device - Google Patents
On-load switch tester calibration device Download PDFInfo
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- CN201522551U CN201522551U CN2009202402808U CN200920240280U CN201522551U CN 201522551 U CN201522551 U CN 201522551U CN 2009202402808 U CN2009202402808 U CN 2009202402808U CN 200920240280 U CN200920240280 U CN 200920240280U CN 201522551 U CN201522551 U CN 201522551U
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- load switch
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Abstract
An on-load switch tester calibration device comprises an on-load switch tester and a comprehensive test system which is connected with the on-load switch tester for providing resistance amount and time amount, wherein the comprehensive test system is connected to a central processing unit, and a relay control comprehensive test system is further arranged between the comprehensive test system and the central processing unit, and a time providing system and a resistance providing system are further arranged between the on-load switch tester and the central processing unit, and an electronic switch control time providing system is arranged between the time providing system and the central processing unit. The calibration of the on-load switch tester is assured to be accurate and reliable through additionally providing the methods of movement process high precision independent measurements under the condition that the on-load switch movement process is completely simulated. The stability, accuracy and safety of the calibration device are guaranteed through continuously modifying and debugging hardware design and software design.
Description
Technical field
The utility model relates to a kind of loaded switch tester calibrating installation, is used to calibrate the loaded switch characteristic tester of present existence.
Background technology
At present, have the loaded switch characteristic tester of various models, pattern on the market, the loaded switch characteristic tester is mainly in order to measure the loaded switch performance.Measure the calibration of tracing to the source at the loaded switch characteristic tester in the market and have following problem:
1. ULTC can be used for pressure regulation, electrical network contact, the no distribution of work and adjusts the load trend in electrical network, so along with power system development, ULTC has become one of indispensable key equipment of modernized electrical network.
2. along with China's socio-economic development, power consumption is growing, and transformer is also improving constantly electric pressure, and the 500kV transformer is being promoted gradually, and the 1000kV transformer also begins to use in electrical network.Loaded switch is widely used in the transformer as the important instrument of regulating the merogenesis ratio.And the above transformer loaded switch of 100kV always operates under electriferous state, so can it operate as normal be directly connected to Electrical Safety, even personal security.Therefore the loaded switch tester has been widely used in transformer production and applying unit.And metrological service does not carry out the relevant calibration operation of loaded switch tester at present.
3. along with the transformer voltage grade progressively promotes, can loaded switch normally become gradually influences the key factor that can transformer safe and stable operation.And at present because of loaded switch break down cause with electrification also by trend of rising, caused very big economic loss, even jeopardized personal safety.Therefore early the safe condition of loaded switch is judged, significant to transformer production and applying unit.
4. loaded switch tester calibrating installation is mainly used to simulate the loaded switch action, comprises transit time and transition resistance.Domestic transient process is simulated with relay mostly at present, unstable because of relay itself, be easy to generate closed spring, and several milliseconds action delay is arranged, cause the development of present loaded switch tester calibrating installation to be difficult to break through the bottleneck of accurate measurement always, be difficult to promote in the whole society.
Summary of the invention
At above-mentioned problem, it is a kind of by integrated test system and independent test system loaded switch characteristic tester dimerous calibrating installation that the utility model provides.Integrated test system set time and two components of resistance can provide precision resister and signal transformation period simultaneously; The independent test system can provide resistance and time component respectively, and wherein the time component is by single-chip microcomputer and high speed electronic switch control, and time performance is good.
A kind of loaded switch tester calibrating installation, comprise a loaded switch switch testing instrument, be connected with an integrated test system that resistance and time quantum be provided with the loaded switch tester, integrated test system is connected to a central processing unit, and relay control integrated test system also is set between integrated test system and central processing unit; The time that also is provided with between loaded switch tester and central processing unit provides system and a resistance that system is provided, and wherein the time provides and is provided with an electronic switch control time between system and the central processing unit system is provided.
Described central processing unit comprises a single-chip microcomputer, and single-chip microcomputer is connected to a computing machine.
Integrated test system set resistance and time two components, precision resister and signal transformation period can be provided simultaneously, can simulate the loaded switch band point course of work, and by relay as the switch switching device, resistance is before and after switching, and resistance value produces response change, and whole process is by microcomputer monitoring, change procedure can show, and reaches the purpose of calibration loaded switch tester.
Time provides system and resistance to provide system that time component and resistive component then are provided respectively, and the time provides system by particularly high speed electronic switch control of electronic switch, high speed electronic switch precision height, and in the nanosecond rank, time performance is good.The resistance parameter provides system to provide separately by resistance, and does not consider the time.Like this, the greatly perfect tracing calibrating method of loaded switch tester is that the useful of integrated test system replenished.
Above-mentioned various device is subjected to Single-chip Controlling, and the data that record then have single-chip microcomputer to be transferred to computing machine, also are provided with display device and printing interface, are convenient to demonstration, printing etc.
Like this, the loaded switch tester calibrating installation that the utility model provides under the situation that the loaded switch course of action is simulated fully, provides the approach that moved process high precision independent measurement again, guarantees the calibration of loaded switch tester accurately and reliably.By continuous correction and debugging, guarantee stability, accuracy and the security of this calibrating installation to hardware design and software design.
Description of drawings
Fig. 1 is the electrical schematic diagram of the utility model embodiment.
Embodiment
Embodiment with indefiniteness further explains, illustrates the technical program below.
A kind of loaded switch tester calibrating installation, comprise a loaded switch switch testing instrument 1, be connected with an integrated test system 2 that resistance and time quantum be provided with loaded switch tester 1, integrated test system 2 is connected to a central processing unit, and a relay 6 control integrated test systems 2 also are set between integrated test system and central processing unit; The time that also is provided with between loaded switch tester 1 and central processing unit provides system 3 and a resistance that system 4 is provided, and wherein the time provides and is provided with 5 control times an of electronic switch between system 3 and the central processing unit system is provided.Described central processing unit comprises a single-chip microcomputer 7, and single-chip microcomputer is connected to a computing machine 8.
During application, when using integrated test system 2, loaded switch tester 1 inserts the integrated test system loop, the charged change procedure of integrated test system 2 simulation loaded switch.As the switch switching device, resistance is before and after switching by relay 6, and resistance value produces response change.Whole process is by single-chip microcomputer 7 monitoring, and change procedure can be printed as curve map.Concrete time and resistance value can show on the display interface of loaded switch tester calibrating installation.
When independent test system (being to provide system 3 and resistance that system 4 is provided the time) is provided, loaded switch tester 1 is when the Measuring Time parameter, the loaded switch tester provides system 3 loops 1 turn-on time, by high speed electronic switch 5 as the switch switching device, resistance is before and after switching, and resistance value produces response change.Whole process is by single-chip microcomputer 7 monitoring, and change procedure can be printed as curve map.Concrete time and resistance value can show on the display interface of loaded switch tester calibrating installation.
When the measuring resistance parameter, loaded switch tester 1 inserts resistance provides system 4 loops, and the loop provides measuring resistance, and the loaded switch tester will directly be measured this resistance value.
Claims (3)
1. loaded switch tester calibrating installation, comprise a loaded switch switch testing instrument, it is characterized in that: be connected with an integrated test system that resistance and time quantum be provided with the loaded switch tester, integrated test system is connected to a central processing unit, and relay control integrated test system also is set between integrated test system and central processing unit; The time that also is provided with between loaded switch tester and central processing unit provides system and a resistance that system is provided, and wherein the time provides and is provided with an electronic switch control time between system and the central processing unit system is provided.
2. loaded switch tester calibrating installation according to claim 1, it is characterized in that: described central processing unit comprises a single-chip microcomputer, single-chip microcomputer is connected to a computing machine.
3. loaded switch tester calibrating installation according to claim 2 is characterized in that: be connected with display device, printing interface with computing machine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202402808U CN201522551U (en) | 2009-10-30 | 2009-10-30 | On-load switch tester calibration device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202402808U CN201522551U (en) | 2009-10-30 | 2009-10-30 | On-load switch tester calibration device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201522551U true CN201522551U (en) | 2010-07-07 |
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ID=42508729
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009202402808U Expired - Fee Related CN201522551U (en) | 2009-10-30 | 2009-10-30 | On-load switch tester calibration device |
Country Status (1)
| Country | Link |
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| CN (1) | CN201522551U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944858A (en) * | 2012-11-12 | 2013-02-27 | 无锡市计量测试中心 | Residual current device action characteristic detector calibration instrument separating switch |
| CN104656014A (en) * | 2014-09-26 | 2015-05-27 | 天津电气科学研究院有限公司 | Switch operating characteristic testbed calibrating method based on current sensor method |
-
2009
- 2009-10-30 CN CN2009202402808U patent/CN201522551U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102944858A (en) * | 2012-11-12 | 2013-02-27 | 无锡市计量测试中心 | Residual current device action characteristic detector calibration instrument separating switch |
| CN102944858B (en) * | 2012-11-12 | 2014-12-03 | 无锡市计量测试中心 | Residual current device action characteristic detector calibration instrument separating switch |
| CN104656014A (en) * | 2014-09-26 | 2015-05-27 | 天津电气科学研究院有限公司 | Switch operating characteristic testbed calibrating method based on current sensor method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100707 Termination date: 20101030 |