CN201497712U - X-ray fluorescence spectrum coating analyzer - Google Patents

X-ray fluorescence spectrum coating analyzer Download PDF

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Publication number
CN201497712U
CN201497712U CN2009202346808U CN200920234680U CN201497712U CN 201497712 U CN201497712 U CN 201497712U CN 2009202346808 U CN2009202346808 U CN 2009202346808U CN 200920234680 U CN200920234680 U CN 200920234680U CN 201497712 U CN201497712 U CN 201497712U
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CN
China
Prior art keywords
fluorescence spectrum
spectrum coating
testing component
platform frame
test suite
Prior art date
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Expired - Fee Related
Application number
CN2009202346808U
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Chinese (zh)
Inventor
黄清华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Skyray Instrument Co Ltd
Original Assignee
Jiangsu Skyray Instrument Co Ltd
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Priority to CN2009202346808U priority Critical patent/CN201497712U/en
Application granted granted Critical
Publication of CN201497712U publication Critical patent/CN201497712U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The utility model relates to an X-ray fluorescence spectrum coating analyzer comprising a main bracket, a testing component and a sample platform, wherein the testing component is fixed on a lifting platform frame on the main bracket, the sample platform is positioned on the bottom of the main bracket and under the lifting platform frame, slide rails are arranged between the lifting platform frame and the main bracket, a Z-axis motor is connected on the lifting platform frame, an X-axis motor and a Y-axis motor are connected on the sample platform, position sensors are arranged on both sides of the bottom of the testing component, and a height laser device is arranged on the middle of the bottom of the testing component comprising a camera. The degree of automation of an instrument is increased, and the range of testable samples is widened; the testing component and tested samples are protected by the position sensors; the process of testing the samples can be observed at real time; and the position of the sample platform and that of the testing component can be adjusted. The X-ray fluorescence spectrum coating analyzer is applicable to the analysis of an X-ray fluorescence spectrum coating in the industries of environmental protection, clinical medicine, agriculture, geology, metallurgy, pharmacy, petrochemistry, and the like.

Description

A kind of X fluorescence spectrum coating analyser
Technical field
The utility model relates to a kind of trace element detector device, is specifically related to a kind of X fluorescence spectrum coating analyser.
Background technology
X fluorescence spectrum analyzer device is to use the x-ray bombardment sample, the XRF that produces is resolved, in order to the device of analytical sample element and content.Because X fluorescence spectrum instrument is easy to use, quick, the precision height, characteristics such as cost is low are widely used in a lot of industries.
In the prior art, its analytic sample can be solid, powder, molten sheet, and liquid etc., analytic target are applicable to industry samples such as steel-making, non-ferrous metal, cement, pottery, oil, glass.Not having the mark semi-quantitative method can be to the different shape qualitative analysis of samples, and can provide semi-quantitative results, and result precision can be near quantitative level to some sample, and analysis time is short.
X fluorescence spectrum coating analytical instrument is a kind of in the X fluorescence spectrum analyzer, be mainly used in carrying out the pointwise test of thickness of coating analysis and content on the bigger parts of range of size, its cardinal principle is that light-source system is launched X fluorescence, the X fluorescence is after on the sample, each X in the sample can be inspired feature X fluorescence, and these X fluorescence are detected the device system and receive, and analyzes to be converted into electric signal, the processing of electric signal process system module, and then obtain the needed analytical information of user.
At above-mentioned principle, the inventor has applied for that in 2006 name is called the patent of a kind of automatic location X fluorescent energy dispersive spectrometer, and the application number of patent is 200620014536.X.This patent is a kind of vacuum detecting X fluorescent energy dispersive spectrometer, comprise fuselage, light-source system, test macro and signal processing system are installed in the fuselage, wherein, light-source system comprises high voltage unit and X-ray pipe, above-mentioned parts all are fixed on the metal framework, and metal framework top also is provided with a sample stage, and sample is positioned on this sample stage.
Putting into practice the above-mentioned patent of discovery through the inventor also exists following problem to need to improve:
1. test suite is a fixed sturcture, can not move up and down, but the scope of specimen is less like this.
2. example platform is a fixed sturcture, can not move left and right, be difficult to accurately location sample position.
3. do not have real-time observation device, can not make the tester understand test process at any time.
Therefore the above-mentioned defective of existing X fluorescence spectrum coating analyser is improved and become the technical matters that needs to be resolved hurrily in the art.
The utility model content
The purpose of this utility model is to overcome the deficiency of above-mentioned technology, and a kind of X fluorescence spectrum coating analyser is provided, and it has solved technological deficiency and design drawback that original X fluorescence spectrum coating analyser exists.
The utility model is for satisfying above-mentioned purpose, by the following technical solutions: a kind of X fluorescence spectrum coating analyser, comprise main support, test suite and example platform, described test suite be fixed in described main support on a hoistable platform frame on, described example platform is positioned at the bottom of described main support and is positioned at the below of described hoistable platform frame, be provided with slide rail between described hoistable platform frame and the described main support, be connected with a Z spindle motor on the described hoistable platform frame.
Further, be connected with X-axis motor and y-axis motor on the described example platform.
Further, described test suite two bottom sides is provided with position transducer.
Further, centre position, described test suite bottom is provided with the height laser device.
Further, described test suite comprises a camera.
Based on above-mentioned design, advantage of the present utility model is: improved the robotization of instrument, but enlarged the scope of specimen; Position transducer has been protected test suite and sample; But the test process of real-time monitored sample; Example platform and test suite position-adjustable.
Other purposes of the present utility model and advantage can be further understood from the disclosed technical characterictic of the utility model.State with other purposes, feature and advantage and can become apparent on the utility model for allowing, embodiment cited below particularly also cooperates appended graphicly, is described in detail below.
Description of drawings
Fig. 1 is a kind of X fluorescence spectrum coating analyser structural representation of one of the utility model embodiment;
Fig. 2 is that X fluorescence spectrum coating analyser among Fig. 1 is from the structural representation of another angular observation;
Label declaration among Fig. 1 and Fig. 2: support 1, test suite 2, example platform 3, hoistable platform frame 4, slide rail 5, Z spindle motor 6, X-axis motor 7, y-axis motor 8, position transducer 9, height laser device 10, camera 11.
Specific embodiments:
Please refer to shown in Figure 1, a kind of X fluorescence spectrum coating analyser of the present utility model, comprise main support 1, test suite 2, and example platform 3, test suite 2 be fixed in main support 1 on a hoistable platform frame 4 on, example platform 3 is positioned at the bottom of main support 1 and is positioned at the below of hoistable platform frame 4, be provided with slide rail 5 between hoistable platform frame 4 and the main support 1, be connected with a Z spindle motor 6 on the hoistable platform frame 4, be connected with X-axis motor 7 and y-axis motor 8 on the example platform 3, test suite 2 two bottom sides are provided with position transducer 9, centre position, test suite 2 bottom is provided with height laser device 10, and test suite 2 comprises a camera 11.
The principle of work of X fluorescence spectrum coating analyser of the present utility model is: the test zone of sample being put into example platform 3; utilize 6 pairs of test suites of Z spindle motor 2 to carry out moving of short transverse; when test suite 2 drops to certain zone; because the protection of position transducer 9; test suite 2 is stopped action at once; so just, protected the injury of valuables in sample and the test suite 2; utilize the X of example platform 3 again; y-axis motor 7; 8 accurately move; guaranteed that sample can accurately arrive test position, can very clearly know the relation of sample and X fluorescence simultaneously by camera 11 testers.The effect of height laser device 10 is the assignment test height, realizes the coincidence of laser facula and X fluorescence, realizes the observability of X fluorescence.

Claims (5)

1. X fluorescence spectrum coating analyser, comprise main support, test suite and example platform, described test suite be fixed in described main support on a hoistable platform frame on, described example platform is positioned at the bottom of described main support and is positioned at the below of described hoistable platform frame, it is characterized in that: be provided with slide rail between described hoistable platform frame and the described main support, be connected with a Z spindle motor on the described hoistable platform frame.
2. X fluorescence spectrum coating analyser as claimed in claim 1 is characterized in that: be connected with X-axis motor and y-axis motor on the described example platform.
3. X fluorescence spectrum coating analyser as claimed in claim 1 is characterized in that: described test suite two bottom sides is provided with position transducer.
4. X fluorescence spectrum coating analyser as claimed in claim 1 is characterized in that: centre position, described test suite bottom is provided with the height laser device.
5. X fluorescence spectrum coating analyser as claimed in claim 1, it is characterized in that: described test suite comprises a camera.
CN2009202346808U 2009-08-12 2009-08-12 X-ray fluorescence spectrum coating analyzer Expired - Fee Related CN201497712U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009202346808U CN201497712U (en) 2009-08-12 2009-08-12 X-ray fluorescence spectrum coating analyzer

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Application Number Priority Date Filing Date Title
CN2009202346808U CN201497712U (en) 2009-08-12 2009-08-12 X-ray fluorescence spectrum coating analyzer

Publications (1)

Publication Number Publication Date
CN201497712U true CN201497712U (en) 2010-06-02

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CN2009202346808U Expired - Fee Related CN201497712U (en) 2009-08-12 2009-08-12 X-ray fluorescence spectrum coating analyzer

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105403583A (en) * 2014-09-09 2016-03-16 日本株式会社日立高新技术科学 X-ray Fluorescence Analyzer And Measurement Position Adjusting Method Therefore
CN109596656A (en) * 2019-01-14 2019-04-09 东华理工大学 A kind of laser assisted full-reflection X fluorescence uranium ore trace element analysis device
CN118329778A (en) * 2024-06-12 2024-07-12 厦门大学 Fluorescence hyperspectral testing device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105403583A (en) * 2014-09-09 2016-03-16 日本株式会社日立高新技术科学 X-ray Fluorescence Analyzer And Measurement Position Adjusting Method Therefore
CN109596656A (en) * 2019-01-14 2019-04-09 东华理工大学 A kind of laser assisted full-reflection X fluorescence uranium ore trace element analysis device
CN118329778A (en) * 2024-06-12 2024-07-12 厦门大学 Fluorescence hyperspectral testing device
CN118329778B (en) * 2024-06-12 2024-09-10 厦门大学 Fluorescence hyperspectral testing device

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100602

Termination date: 20120812