CN201464594U

CN201464594U - COG LCD short-circuit testing device

Info

Publication number: CN201464594U
Application number: CN2009201325024U
Authority: CN
Inventors: 李超; 韩喆; 徐长远; 王曙墩; 王肖明
Original assignee: SHENZHEN JINGHUA DISPLAYS CO Ltd
Current assignee: SHENZHEN JINGHUA DISPLAYS CO Ltd
Priority date: 2009-05-27
Filing date: 2009-05-27
Publication date: 2010-05-12
Anticipated expiration: 2019-05-27

Abstract

The utility model relates to a COG LCD short-circuit testing device comprising an LCD to be tested without binding an IC. The LCD comprises a plurality of IC binding electrodes, a probe, a driving device and an electric performance tester, wherein the anode of the electric performance tester is connected with the driving device by a lead; the cathode of the electric performance tester is connected with the probe by the lead; the probe contacts with the IC binding electrodes of a COG LCD to be tested; and the driving device is a copper-laid circuit board. In testing, the binding electrodes of the LCD to be tested are sequentially scraped by the probe, and by observing the condition of a lighting unit corresponding to a bonding electrode to be tested, whether the electrode to be tested is short-circuited or not can be judged. The COG LCD short-circuit testing device has simple manufacture, low cost and damage resistance.

Description

A kind of COG LCD short-circuit test device

Technical field

The utility model relates to a kind of short-circuit test device, is specifically related to a kind of COG LCD short-circuit test device.

Background technology

Along with development of science and technology, the application of liquid crystal display in people life more and more widely, along with the development of lcd technology, the kind of LCD is more and more, COG (chip on glass) is that driving IC chip directly is bundled in LCD is on glass, need not materials such as wiring board, chase.This mounting means can reduce the volume of LCD module greatly, and is easy to produce in enormous quantities, is applicable to the LCD of consumer electronics product, as: mobile phone, portable products such as PDA, this mounting means, under IC manufacturer's promotion, will be the main connected mode of IC and LCD from now on.

When using COG LCD connected mode, because COG LCD is connected the electrode PITCH (less than 50um) of position with IC littler than the electrode PITCH (greater than 150um) of conventional LCD, LCD electric performance test difficulty becomes big before causing the IC binding, conventional LCD uses conduction zebra bar PITCH＞150um just can directly carry out segmentation demonstration test, can test out easily because the defective products of the electric pole short circuit that produces in the LCD processing procedure.But because COG LCD electrode PITCH much smaller than conduction zebra bar PITCH, can only carry out showing test entirely and could reject the electric pole short circuit defective products after the IC binding, thereby make defective products inflow IC bind operation, the material of back segment is caused great waste.

Present normally used way is to use special tester to test before the IC binding, 2 shortcomings are arranged in this way: 1, the test card manufacture difficulty is big, test card need be made with it one to one high-density probe by each root electrode of every money LCD and contact with electrode and test, the cost of manufacture height, cycle is long, at present domesticly also can't produce.2, because number of probes is many, generally more than 200, diameter is few, generally below 20um, causes test card very easily to damage and often delays production.

The utility model content

The technical problems to be solved in the utility model is, at big, the flimsy defective of prior art COG LCD short-circuit test device manufacture difficulty, provides a kind of making simple and non-damageable COG LCD short-circuit test device.

The technical scheme that its technical matters that solves the utility model adopts is: construct a kind of COG LCD short-circuit test device, the COG LCD that comprises the IC of binding to be measured, the COG LCD of the described IC of binding to be measured comprises several IC binding electrodes, and described short-circuit test device also comprises:

Probe;

Be used to drive the drive unit of the COG LCD of the described IC of binding to be measured;

Be used to provide the electric performance test machine of power supply;

The positive pole of described electric performance test machine is connected with described drive unit by lead, and the negative pole of described electric performance test machine is connected with probe by lead, and described probe contacts with the IC binding electrode of described COG LCD to be measured.

Put in the case in technology of the present utility model, described drive unit is for applying copper circuit board, and described COG LCD is positioned to apply on the copper circuit board and with it and is electrically connected.

Put in the case in technology of the present utility model, also comprise base, described base comprises:

Two screw-thread micrometers;

A base plate that has the directions X chute;

A top board that has Y direction chute;

Slide block with " ten " font of described two chute corresponding matching;

Described slide block connects described base plate and described top board by the chute of correspondence; Described probe is installed on the support that is fixed on base plate, and two screw-thread micrometers are installed in two vertical direction of " ten " font slide block respectively.

Implement the utility model COG LCD short-circuit test device, have the following advantages: at first, this device has only a probe, streak the IC bindings bit electrode of LCD during test successively with probe, watch corresponding luminescence unit to show then and just can judge whether COG LCD has short circuit, therefore this device is made simply, and cost is low; Secondly, because this device has only a probe, bad back only needs to change one just, and breaks down unlike probe in the prior art, and whole test card just is done for; At last, control relatively moving of tested LCD and probe, make probe streak the IC binding electrode of all LCD successively, can accomplish the accurate highdensity IC binding electrode of measuring with the screw-thread micrometer of two vertical direction.

Description of drawings

The utility model is described in further detail below in conjunction with drawings and Examples, in the accompanying drawing:

Fig. 1 shows it is the logic diagram of the utility model COG LCD short-circuit test device;

Fig. 2 is to use the utility model to carry out the installation drawing of short-circuit test;

Fig. 3 (a) is the screen display figure of COG LCD when not tested;

Fig. 3 (b) is COG LCD test screen display figure just often;

Screen display figure when Fig. 3 (c) is COG LCD test short circuit;

Fig. 4 is the understructure figure of the utility model COG LCD short-circuit test device.

Drawing reference numeral is represented meaning:

1. apply tested COG LCD 3. probes of copper circuit board 2.

4. electric performance test machine 5. leads

6 (6 ', 6 ", 6 " '). the pairing luminescence unit of electrode

The IC binding electrode of 7 (7 ', 7 ", 7 " ') .COG LCD

8. top board 9. base plates 10. slide blocks

Embodiment

Fig. 1 shows the logic diagram of the utility model COG LCD short-circuit test device, and in the drawings, the electric performance test machine provides power supply for the short-circuit test device, and the alternating current of output transforms rear drive LCD through driving circuit and lights.The principle of this short-circuit test device and similar in the principle of the bound back of IC LCD operate as normal, just the electric main input has replaced the electric performance test machine in this device, and IC has replaced the drive unit in this device.When before IC binding, the whether short circuit of LCD being tested, when two output electrodes of electric performance test machine connect deposited copper circuit board input end and LCD output terminal respectively, whole device just forms a loop, when the tested IC bindings bit electrode of LCD does not have the short circuit generation, can light with the pairing luminescence unit of survey IC binding electrode, and not have other unnecessary luminescence unit and light.By relatively moving of control probe and LCD, make probe streak LCD successively and go up each IC binding electrode, and each checks the pairing luminescence unit of IC binding electrode successively, lights if only survey the pairing luminescence unit of IC binding electrode to some extent, and then the IC that surveys of explanation institute binds electrode does not have the short circuit generation; If light except the pairing luminescence unit of surveys IC binding electrode, also have other unnecessary image to light, then the IC that surveys of explanation institute binds electrode and binds electrode with the pairing IC of the unnecessary image of lighting short circuit has taken place.

Preferably, drive unit during test, is positioned at COGLCD to be measured on the deposited copper circuit board and electrical connection with it for driving the deposited copper circuit board of LCD.

Fig. 2 shows the synoptic diagram that the utility model COG LCD short-circuit test device carries out short-circuit test.At first, two leads 5 of electric performance test machine are inserted two delivery outlets of electric performance test machine respectively, the lead that links to each other with anodal delivery outlet is connected the input end that applies copper circuit board 1, the lead that links to each other with the negative pole delivery outlet is connected a probe 3, then, open the switch of electric performance test machine, make an IC binding of its bottom tip contact electrode by traveling probe 3, at this moment, the electric performance test machine, apply copper circuit, the pairing luminescence unit of IC binding electrode just forms a loop, observe demonstration situation with the corresponding luminescence unit of contact IC binding electrode, probe streaks the IC bindings bit electrode of LCD successively then, observe the demonstration situation of the luminescence unit of answering successively with survey binding electrode pair, if have the luminescence unit except that the corresponding luminescence unit of contact electrode institute demonstration also to occur, then can judge the electrode and the short circuit of probe electrodes in contact of unnecessary luminescence unit correspondence.

Below with array formula (6 * 4) LCD display be example when illustrating that respectively LCD is not tested, test just often and the screen display situation of test short circuit when taking place.

Fig. 3 (a) shows the screen display figure of LCD when not tested, and when not testing, the electric performance test machine is a not connecting system of external power supply, and LCD is the state of not working.

Fig. 3 (b) shows LCD test screen display figure just often, when probe streaks 7 ' time of IC binding electrode, at this moment, electric performance test machine, driving circuit and IC binding electrode 7 ' pairing luminescence unit 6 ' formation loop, triggering luminescence unit 6 ' light, and the IC bindings bit electrode 7 that has only and contacted ' pairing luminescence unit 6 ' bright, and other as with IC binding electrode 7 ", 7 " ' pairing luminescence unit 6 ", 6 " ' be to go out.

Screen display figure when Fig. 3 (c) shows LCD test short circuit, if IC binds electrode 7 "; 7 " ' be short-circuited, when probe streaks IC binding electrode 7 " time; be equivalent to IC binding electrode 7 ", 7 " ' and be communicated with; IC binding electrode 7 this moment " pairing luminescence unit 6 " and IC binding electrode 7 " ' pairing luminescence unit 6 " ' be connected in parallel; power supply; driving circuit and described two luminescence units in parallel form the loop of a closure; triggering luminescence unit 6 ", 6 " ' light; show as can be known by luminescence unit; IC binds electrode 7 ", 7 " ' and short circuit has taken place, reached the purpose of short-circuit detecting.

Fig. 4 is the understructure figure of the utility model COG LCD short-circuit test device, base comprise a base plate that has a directions X chute 9, one have Y direction chute top board 8 and with the slide block 10 of " ten " fonts of described two chute corresponding matching, slide block 10 connects described base plate 9 and top board 8, probe 3 is installed on the support that is fixed on base plate and (does not draw among the figure), and two screw-thread micrometers are installed in two vertical direction (not drawing among the figure) of the slide block of " ten " font respectively.When using device recited above that COG LCD is carried out short-circuit test, be placed on the top board 8 of base having the COG LCD to be measured that applies copper circuit board, screw-thread micrometer by two vertical direction is movable base plate 9 and top board 8 relatively, one of them IC binding electrode of probe 3 and COG LCD to be measured is contacted, observe and whether to have only one to bind the pairing luminescence unit of electrode with the IC that chooses and light, if illustrate that then the IC binding electrode of being chosen does not have short circuit and takes place; If also have unnecessary luminescence unit to light, illustrate that then short circuit has taken place for IC binding electrode and other electrodes of being chosen.

After testing an IC binding electrode, screw-thread micrometer movable base plate 9 and top board 8 by two vertical direction, the next IC binding electrode of probe 3 and COG LCD to be measured is contacted, finish the step same then with the front, and the like, make probe streak all IC binding electrodes of COG LCD to be measured successively, finish the test of all electrodes.

Utilization is installed in that screw-thread micrometer relatively moves probe and COG LCD to be measured on two vertical direction, make probe streak IC binding electrode successively, can adjust the speed that probe moves according to the frequency that tester's skill level and eye can be accepted the variation of LCD array.Translational speed such as optional probe is 0.2mm/s.

Claims

1. COG LCD short-circuit test device comprises the COG LCD (2) of the IC of binding to be measured, and the COG LCD (2) of the described IC of binding to be measured comprises several IC binding electrodes (7), it is characterized in that described short-circuit test device also comprises:

Probe (3);

Be used to drive the drive unit of the COG LCD (2) of the described IC of binding to be measured;

Be used to provide the electric performance test machine (4) of power supply;

The positive pole of described electric performance test machine (4) is connected with described drive unit by lead, and the negative pole of described electric performance test machine (4) is connected with probe (3) by lead, and described probe (3) contacts with the IC binding electrode (7) of described COG LCD to be measured.

2. COG LCD short-circuit test device according to claim 1 is characterized in that, described drive unit is for applying copper circuit board (1), and described COG LCD is positioned to apply on the copper circuit board and with it and is electrically connected.

3. COG LCD short-circuit test device according to claim 1 is characterized in that also comprise base, described base comprises:

Two screw-thread micrometers;

A base plate (9) that has the directions X chute;

A top board (8) that has Y direction chute;

Slide block (10) with " ten " font of described two chute corresponding matching; Described slide block (10) connects described base plate (9) and described top board (8) by the chute of correspondence; Described probe (3) is installed on the support that is fixed on base plate, and two screw-thread micrometers are installed in two vertical direction of " ten " font slide block respectively.