CN201421432Y - Coherent diffraction imaging processing device - Google Patents
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- CN201421432Y CN201421432Y CN2009200194783U CN200920019478U CN201421432Y CN 201421432 Y CN201421432 Y CN 201421432Y CN 2009200194783 U CN2009200194783 U CN 2009200194783U CN 200920019478 U CN200920019478 U CN 200920019478U CN 201421432 Y CN201421432 Y CN 201421432Y
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Abstract
The utility model discloses a coherent diffraction imaging processing device, which comprises a light source, a sample platform used for placing sample, and an image recording and processing device. The coherent diffraction imaging processing device is characterized by further comprising a beam expanding and a wave surface shaper, a multi-pinhole plate and a stepping rotating bracket, wherein themulti-pinhole plate is installed on the stepping rotating bracket, and the reference pinhole center on the multi-pinhole plate is coincided with the rotation center of the stepping rotating bracket; the light source, the beam expanding and the wave surface shaper, the sample, the multi-pinhole plate and the image recording and processing device are sequentially arranged along the forward directionof a light beam; the image recording and processing device comprises an image sensor which is arranged behind the stepping rotating bracket and is connected with a computer; and meanwhile, the computer is also connected with the stepping rotating bracket. The coherent diffraction imaging processing device has simple structure, convenient adjustment and lower cost, is applicable to multiple different light sources, can realize image formation of a plurality of objects or a three-dimensional object, does not need an imaging lens, and is particularly applicable to the occasion of X ray which cannot be easily prepared into the high quality imaging lens.
Description
Technical Field
The utility model relates to a coherent diffraction imaging technique, especially a coherent diffraction imaging processing apparatus who utilizes many pinhole boards to realize general complex amplitude object record and reappear.
Background
Coherent diffraction imaging is a technique that uses the intensity distribution of far-field or fraunhofer diffraction of object waves to achieve imaging of complex or three-dimensional objects. This technique is particularly useful in areas where high quality imaging lenses such as X-rays, electron beams are lacking or difficult to produce, since resolution limitations due to imaging lens aperture and aberrations can be avoided. The key problem of coherent diffraction imaging technology is how to recover the amplitude and phase information of the measured object wave from one or more diffraction intensity patterns accurately and quickly. Currently, one of the main approaches to solving this problem is to use an iterative algorithm. The traditional iteration method generally needs longer iteration time, and an iteration result has uncertainty; there are also some severe constraints on the object to be measured, such as the object to be fixed specifically, the requirement that the object to be measured is a pure amplitude object or a pure phase object, etc.
In order to improve the accuracy of phase recovery and imaging speed, some improved diffraction imaging techniques such as supersampling diffraction imaging technique, zoned scanning diffraction imaging technique, and the like have been developed in recent years (see phys. rev. lett.93, 023903 (2004); phys. rev. lett.98, 034801 (2007); phys. rev. lett.100, 155503 (2008); Science 321, 379 (2008)). However, none of the above techniques can fundamentally avoid the uncertainty of the iterative algorithm and the iterative result. The phase recovery process also needs to involve a large number of iterative processes; this means that dynamic or real-time imaging is still difficult to achieve with these methods.
SUMMERY OF THE UTILITY MODEL
The utility model aims at overcoming the problem that prior art exists and not enough, provide a coherent diffraction image processing apparatus, it lets the object wave that is sent by the formation of image object pass through a rotatable many pinhole board earlier, then reuse image sensor record object wave fraunhofer diffraction intensity distribution behind many pinhole boards, draws out the amplitude and the phase place distribution information of measured object wave with the help of computer image processing technique at last.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a coherent diffraction imaging processing device comprises a light source, a sample stage for placing a sample, an image recording and processing device, and is characterized by also comprising a beam expanding and wave surface shaper, a multi-pinhole plate and a stepping rotating bracket; the multi-pinhole plate is arranged on the stepping rotating bracket, and the center of a reference pinhole on the multi-pinhole plate is superposed with the rotating center of the stepping rotating bracket; the light source, the beam expanding and wave surface shaper, the sample, the multi-pinhole plate and the image recording and processing device are sequentially arranged along the advancing direction of the light beam; the image recording and processing device comprises an image sensor which is arranged behind the stepping rotating bracket and is connected with the computer; meanwhile, the computer is also connected with the stepping rotating bracket.
The distance Z1 between the sample and the multi-pinhole plate ensures that the phase change of the object wave irradiated on the multi-pinhole plate on the light-passing aperture of each pinhole is not more than pi/4 radian; the distance Z2 between the image sensor and the multiwell plate satisfies the fraunhofer diffraction condition, i.e. the light field distribution on the recording plane of the image sensor is proportional to the fourier transform of the object wave transmitted through the multiwell plate.
A coherent diffraction imaging processing device comprises a light source, a sample stage for placing a sample, an image recording and processing device, and is characterized by also comprising a beam expanding and wave surface shaper, a multi-pinhole plate, a stepping rotating bracket and a Fourier transform lens, wherein the multi-pinhole plate is arranged on the stepping rotating bracket, and the center of a reference pinhole on the multi-pinhole plate is superposed with the rotating center of the stepping rotating bracket; the light source, the beam expanding and wave surface shaper, the sample, the multi-pinhole plate, the Fourier transform lens and the image recording and processing device are sequentially arranged along the advancing direction of the light beam; the image recording and processing device comprises an image sensor which is arranged behind the stepping rotating bracket and is connected with the computer; meanwhile, the computer is also connected with the stepping rotating bracket.
The distance Z1 between the sample and the multi-pinhole plate ensures that the phase change of the object wave irradiated on the multi-pinhole plate on the light-passing aperture of each pinhole is not more than pi/4 radian; the image sensor is located in the back focal plane of the fourier transform lens, i.e. the light field distribution in the image sensor recording plane is proportional to the fourier transform of the object wave transmitted through the multipinhole plate.
The multi-pinhole plate is formed by arranging a reference pinhole and a plurality of measurement pinholes on an opaque thin plate; the distribution of each needle hole on the multi-needle hole plate meets the following requirements: two identical multi-pinhole plates are overlapped, when one of the plates is translated to enable the reference pinhole to be overlapped with any measuring pinhole of the other plate, the other pinholes cannot be overlapped; the size of the pinhole is such that the phase change of the object wave in the range of one pinhole is not more than a quarter wavelength.
The pinholes on the multi-pinhole plate are uniformly distributed on a semicircular ring, the intervals at the centers of the pinholes are equal and are not less than 1.5 times of the diameter of the pinholes, the pinholes at one end of the semicircular ring at the center of the pinhole plate are reference pinholes, and other pinholes are measurement pinholes.
The pinholes on the multi-pinhole plate are distributed on three straight lines which mutually form 120 degrees, wherein the pinholes at the intersection of the three straight lines in the center of the pinhole plate are reference pinholes, and other pinholes are measurement pinholes; the distance D0 between the center of the reference pinhole and the center of the adjacent measurement pinhole is not less than 1.5 times of the diameter of the pinhole, and the centers of the other measurement pinholes are equally spaced and are twice of D0.
The method does not require an iterative process at all. The phase recovery process is also performed in only one diffraction intensity image and does not involve the interactive processing of multiple images, so that the phase recovery process can be performed synchronously with the scanning recording process of the diffraction pattern. Therefore, the requirements on the scanning recording process and the positioning precision can be greatly reduced, and the diffraction imaging speed can be greatly improved, so that the possibility is provided for truly realizing real-time coherent diffraction imaging.
In order to realize the utility model, a specially designed diffraction imaging processing device must be adopted. The utility model discloses a diffraction formation of image processing apparatus includes the light source, expands and wave surface shaper, sample platform, is formed images object, many pinhole boards, step-by-step swivel mount, image sensor and computer. The light source, the beam expanding and wave surface shaper, the imaged object, the multi-pinhole plate and the image sensor are sequentially coaxially (optical axis) arranged along the advancing direction of the light beam. The imaged object is placed on a sample stage. The multi-pinhole plate is fixed on a stepping rotating frame which can precisely rotate in a stepping way. The image sensor and the stepping rotating frame are connected with a computer, and the computer is used for controlling the quantitative rotation of the rotating frame and the synchronous recording of the image sensor. The distance between adjacent parts is adjustable.
The method of the utility model is as follows:
(1) a monochromatic light is emitted by a light source, and the imaged object is illuminated after beam expanding and wave surface shaping. The light wave transmitted through the object (i.e., the object wave) travels a distance Z1 and strikes a specially designed multi-well plate. The multi-pinhole plate is provided with a reference pinhole and a plurality of measuring pinholes.
(2) The object wave, which has passed through the multiwell plate, continues a distance Z2 to the recording plane, where it forms its fraunhofer diffraction field. The intensity distribution pattern of the fraunhofer diffracted light field is recorded at the recording plane with a two-dimensional image sensor, such as a CCD.
(3) The Fraunhofer diffraction intensity pattern is subjected to inverse Fourier transform in a computer to obtain a correlation function pattern (generally a complex function) of the complex amplitude of the object wave passing through the multi-pinhole plate. And extracting the function value of the point corresponding to the central position of each measuring pinhole on the multi-pinhole plate in the related function pattern to obtain the relative amplitude and phase value of the measured object wave at each measuring pinhole.
(4) And rotating the multi-pinhole plate by taking the center of the reference pinhole as an axis so that the measuring pinhole scans on the plane where the multi-pinhole plate is positioned. And (4) recording Fraunhofer diffraction intensity patterns of the object wave passing through the multi-pinhole plate under different rotation angles, and repeating the step (3) for each recorded diffraction intensity pattern to obtain a two-dimensional sampling array of complex amplitude distribution of the object wave on the plane where the multi-pinhole plate is located. The object to be imaged can be reconstructed in a computer using the sampling array.
In the above method, the light source in step (1) may be a visible light source, or may be other coherent wave sources, such as ultraviolet light, X-ray, electron beam, and the like. The beam expanding and wave surface shaping processing unit mainly comprises a beam expander, a limiting diaphragm, a collimator or a condenser which are coaxially arranged in sequence along the propagation direction of light beams, and aims to carry out wave surface shaping on light waves emitted from a light source so as to generate coherent plane waves or spherical waves required by a subsequent light path. The multi-pinhole plate used in step (1) is formed by preparing a plurality of tiny pinholes on an opaque thin plate. The needle holes on the multi-needle-hole plate comprise a reference needle hole and a plurality of measuring needle holes. The arrangement mode of the porous plates meets the following requirements: if two identical multi-hole plates are overlapped, when one of the plates is translated to enable the reference pin hole to be overlapped with any measuring pin hole of the other plate, the other pin holes cannot be overlapped. The shape of the needle hole on the multi-needle hole plate can be a round hole or a light through hole with other shapes. The size of the pinhole depends on the spatial variation of the complex amplitude distribution of the object wave transmitted to the multiple pinhole plates, and the phase variation of the object wave within a pinhole is generally required to be not more than pi/4 radian. When the size of the pinhole is fixed, the distance Z1 between the multi-pinhole plate and the object to be imaged can be properly selected to satisfy the above condition.
The distance Z2 between the recording plane and the multi-well plate in step (2) satisfies the fraunhofer diffraction condition, i.e. the diffracted light field on the recording plane is proportional to the fourier transform of the object wave passing through the multi-well plate on the plane of the multi-well plate. The complex amplitude value of the object wave penetrating through the mth pinhole on the multi-pinhole plate is set as
Wherein A ismIs the amplitude of the object wave at the mth pin hole,is the object at the mth pinholeThe phase of the wave is such that,
is a coordinate variable on the plane of the pinhole plate (taking the center of the reference pinhole as the origin of coordinates),
is the coordinate of the center of the mth pinhole, j is an imaginary number,
is the aperture function of the mth pinhole; the intensity distribution of the resulting diffracted light field on the recording plane can be expressed as:
wherein, I0In order to be an integration constant, the first,
is a Fourier transform operator, N is the number of measuring pinholes on the pinhole plate, m is 0 corresponding to a reference pinhole,
is a coordinate variable on the recording plane.
The inverse fourier transform of the diffraction intensity pattern in step (3) may be implemented by a computer program for reading the diffraction intensity pattern into a computer, or may be implemented by a dedicated DSP chip. Since the intensity distribution of the fraunhofer diffraction of the object wave described by equation (2) is proportional to the mode power of the fourier transform function of the object wave, the result of the inverse fourier transform on it is exactly the correlation function of the object wave. In general, recovering the complex amplitude function of the object wave from the correlation function is a very difficult task to perform with an iterative algorithm. In the method, fromThe recorded diffraction intensity distribution is the Fraunhofer diffraction intensity of the object wave passing through the multi-pinhole plate, and the value of the correlation function at the point corresponding to the center position of any measurement pinhole is just proportional to the product of the complex amplitude of the object wave passing through the pinhole and the complex conjugate amplitude of the object wave passing through the reference pinhole (taking the center of the reference pinhole as the coordinate center). Therefore, the method does not require any iterative algorithm. The complex amplitude of the object wave transmitted through the multiwell plate can be directly extracted from the inverse fourier transform pattern of the diffraction intensity pattern. The specific calculation process is as follows: inverse Fourier transform of equation (1) to obtain a correlation function
Is composed of
Wherein A isnThe amplitude of the object wave at the nth pin hole,
is the phase of the object wave at the nth pinhole,
wherein,for integral variables, the symbol is the conjugate sign. According to the geometric meaning of the correlation operation shown in the formula (3) and considering the distribution characteristics of the pinholes on the pinhole plate, the coordinate vector of the formula (2) can be known
<math>
<mrow>
<mover>
<mi>r</mi>
<mo>→</mo>
</mover>
<mo>=</mo>
<msub>
<mover>
<mi>r</mi>
<mo>→</mo>
</mover>
<mi>m</mi>
</msub>
</mrow>
</math>
The value of (f) is proportional to the product of the complex amplitude of the object wave at the mth needle and the complex conjugate of the object wave at the reference needle, i.e. the value of (f) is proportional to the product of the complex amplitude of the object wave at the mth needle and the complex conjugate of the object wave at the reference needle
Wherein P is0Is a constant proportional to the pinhole area. (4) The formula shows that the value at the position corresponding to the central point of each measurement pinhole in the inverse fourier transform pattern given by the formula (2) is exactly the relative complex amplitude value of the object wave that we want to obtain through the pinhole.
The rotatable multi-pinhole plate in the step (4) takes a straight line which vertically passes through the center of the reference pinhole as a rotating shaft. Therefore, in the rotation process of the multi-pinhole plate, the position of the reference pinhole is always kept unchanged, so that the reference points of the object wave complex amplitude distribution measured under different rotation angles are kept consistent.
The principle of the utility model is that: the object wave emitted by the object to be imaged is firstly sampled by a rotatable multi-pinhole plate, then an image sensor records the intensity distribution pattern of Fraunhofer diffraction of the object wave passing through the multi-pinhole plate, then the diffraction intensity distribution is subjected to inverse Fourier transform to obtain the autocorrelation function of the recorded object wave, and the amplitude and phase information of the object wave to be measured can be directly extracted from the point corresponding to the central position coordinate of each measuring pinhole in the autocorrelation function, so that the diffraction imaging of the complex-amplitude object is realized.
The utility model has the advantages of it is following and beneficial effect:
(1) no imaging lens is required. The amplitude and phase information of the object wave is recovered from the Fraunhofer diffraction intensity pattern of the object wave through a simple algorithm.
(2) The process of extracting the amplitude and phase information of the wave from the Fraunhofer diffraction intensity pattern of the object wave does not need any iteration process, and the amplitude and phase information is directly extracted from the inverse Fourier transform pattern of the Fraunhofer diffraction intensity.
(3) The extraction process of the amplitude and phase information can be synchronously carried out with the recording process of the diffraction pattern, the efficiency is high, the speed is high, and a feasible way is provided for realizing the dynamic coherent diffraction imaging.
(4) The extraction of amplitude and phase information does not involve interactive processing between multiple patterns, which can greatly reduce the requirements on the stability and scanning accuracy of the recording system.
(5) The utility model discloses the many pinhole boards that adopt are easily prepared to specially adapted is difficult to like X ray such wave band that uses traditional imaging technology to form images.
Drawings
FIG. 1 is a process block diagram of a coherent diffraction imaging method of the present invention;
fig. 2 is a schematic diagram showing a pinhole distribution of a first design example of a multi-pinhole plate in the coherent diffraction imaging method of the present invention;
FIG. 3 is a schematic diagram of a pin hole distribution of a second exemplary design of a multi-pin-hole plate according to the present invention;
fig. 4 is a schematic structural diagram of a first embodiment of the coherent diffraction imaging processing apparatus of the present invention;
fig. 5 is a schematic structural diagram of a second embodiment of the coherent diffraction imaging processing apparatus according to the present invention;
FIG. 6a is an example of the results of an experiment using the coherent diffraction imaging method and apparatus of the present invention to perform coherent diffraction imaging;
FIG. 6b is an example of the results of coherent diffraction imaging using the coherent diffraction imaging method and apparatus of the present invention;
FIG. 6c is an example of the results of an experiment using the coherent diffraction imaging method and apparatus of the present invention to perform coherent diffraction imaging;
fig. 6d is an example of an experimental result of coherent diffraction imaging using the coherent diffraction imaging method and apparatus of the present invention.
The device comprises a light source 1, a beam expanding and wave surface shaper 2, a sample table 3, a sample 4, a stepping rotating support 5, a multi-pinhole plate 6, an image sensor 7, a computer 8 and a Fourier transform lens 9.
Detailed Description
For a better understanding of the present invention, the following description is given in conjunction with the accompanying drawings and examples.
As shown in fig. 1, the method of the present invention comprises the following steps: (1) a beam of monochromatic light emitted by a light source is processed by a beam expanding and wave surface shaping processing unit to form a beam of coherent plane wave (or convergent spherical light); illuminating an imaged object placed on a sample stage with the coherent plane wave (or spherical wave); (2) after object waves penetrating through an object are transmitted for a certain distance Z1, the object waves irradiate a multi-pinhole plate which is fixed on a rotating support and is provided with special pinhole distribution, and pinholes on the multi-pinhole plate are composed of a reference pinhole and a plurality of measurement pinholes; (3) the object wave which penetrates through the multi-pinhole plate continuously propagates to form a Fraunhofer diffraction light field in a far field (or after passing through a Fourier transform lens); (4) recording Fraunhofer diffraction intensity pattern of object wave passing through the multi-pinhole plate by using a two-dimensional image sensor (such as CCD); (5) performing inverse Fourier transform on the Fraunhofer diffraction intensity pattern by using an image processing technology to obtain a correlation function pattern of object wave complex amplitude passing through the multi-pinhole plate; extracting function values of points corresponding to the central positions of all the measuring pinholes on the multi-pinhole plate in the related function pattern to obtain the relative amplitude and phase value of the object wave complex amplitude passing through the multi-pinhole plate at all the measuring pinholes; (6) and rotating the multi-pinhole plate by taking the center of the reference pinhole as an axis so that the measuring pinhole scans on the plane where the multi-pinhole plate is positioned. And (5) recording Fraunhofer diffraction intensity patterns of the object wave passing through the multi-pinhole plate under different rotation angles, and repeating the step (5) for each recorded diffraction intensity pattern to obtain a two-dimensional sampling array of complex amplitude distribution of the object wave on the plane where the multi-pinhole plate is located. The object to be imaged can be reconstructed in a computer using the sampling array.
Fig. 2 is an exemplary embodiment of a multiple orifice plate of the present invention. The pinholes on the pinhole plate are uniformly distributed on a semicircular ring, and the interval between the centers of the pinholes is not less than 1.5 times of the diameter of the pinholes. The needle hole at one end of the semicircular ring at the center of the needle hole plate is a reference needle hole, and other needle holes are measurement needle holes. When the multi-pinhole plate is placed on the rotary support, the center of the reference pinhole is coincided with the rotary shaft.
Fig. 3 is a second embodiment of the multiple well plate of the method of the present invention. The pinholes of the multi-pinhole plate are distributed on three straight lines which mutually form 120 degrees. The needle hole at the intersection of the three straight lines in the center of the needle hole plate is a reference needle hole, and other needle holes are all measuring needle holes. The distance D0 between the center of the reference pinhole and the center of the adjacent measurement pinhole is not less than 1.5 times the diameter of the pinhole. The centers of the other measurement pinholes are equally spaced and are twice as much as D0. When the multi-pinhole plate is placed on the rotary support, the center of the reference pinhole is coincided with the rotary shaft.
Fig. 4 is an exemplary embodiment of a coherent diffraction imaging processing apparatus according to the present invention. The device comprises a light source 1, a beam expanding and wave surface shaper 2, a sample table 3, a sample 4, a stepping rotating bracket 5, a multi-pinhole plate 6, an image sensor 7 and a computer 8. A light source 1, a beam expanding and wave surface shaper 2, a sample stage 3, a sample 4, a stepping rotating bracket 5, a multi-pinhole plate 6 and an image sensor 7 are sequentially coaxially (optical axis) arranged along the advancing direction of a light beam. The mutual positions of the light source 1 and the beam expanding and wave surface shaper 2 ensure that monochromatic light emitted by the light source 1 forms a beam of plane wave or spherical wave after passing through the beam expanding and wave surface shaper 3. The relative distance Z1 between the sample (object to be imaged) 4 and the multiwell plate 6 ensures that the phase change of the object wave impinging on the multiwell plate at the clear aperture of each pinhole is no more than pi/4 radians. The distance Z2 between the multi-pinhole plate 6 and the photosensitive plane of the image sensor 7 ensures that Fraunhofer diffraction conditions are met, so that the diffracted light field of the object wave transmitted through the multi-pinhole plate 6 on the photosensitive plane of the image sensor is proportional to the Fourier transform of the object wave. The step rotating support 5 is controlled by a step driver controlled by a computer 8. The stepping rotating bracket 7 and the image sensor 8 are controlled by the same computer 8 to realize the synchronous recording of the rotation of the multi-pinhole plate and the diffraction intensity image. Extracting complex amplitude information of the object wave from the recorded diffraction intensity pattern and imaging is accomplished by a computer program designed according to the method of the present invention.
Fig. 5 shows a second embodiment of the device according to the invention, with one more fourier transform lens 9 than in fig. 4, i.e. the fourier transform lens 9 is placed between the multiwell plate 6 and the image sensor 7, the image sensor recording plane being located at the back focal plane of the fourier transform lens 9. This allows the device to be compact and the size of the fraunhofer diffraction intensity pattern propagating onto the sensor recording plane to be conveniently enlarged or reduced by varying the focal length of the lens 9.
Fig. 6 a-6 d show an example of the results of coherent diffraction imaging using the coherent diffraction imaging method and apparatus of the present invention. In the experiment, a light source adopts He-Ne laser, and the wavelength of an output light wave is 0.6328 microns; the imaged object is a miniature picture of the character DM; the multi-well plate employs the pin hole arrangement shown in fig. 2. The pinhole diameter was 28 microns and the pinhole spacing was 56 microns. The experimental apparatus used the second embodiment shown in fig. 3, in which the focal length of the fourier transform lens was 240 mm, the image sensor was a CCD digital camera, the number of pixels was 1300 × 1030, and the pixel size was 6.7 μm. FIG. 6a is one of the Fraunhofer diffraction intensity patterns of the measured waves recorded with a CCD. Fig. 6b and 6c are two-dimensional sampling arrays of the amplitude and phase distribution, respectively, of the object wave recovered from the recorded fraunhofer diffraction intensity pattern using the method of the present invention. Fig. 6d shows a reconstructed image of the measured object obtained by digital diffraction in a computer using the measurement data shown in fig. 6b and 6 c.
The method and the embodiment achieve the aim of reproducing the amplitude and phase distribution of the object wave by recording the Fraunhofer diffraction intensity pattern of the object wave passing through a multi-pinhole plate and processing the image of the pattern. The practice of the present invention is not limited to the specific embodiments described above. The method, the device and the system belong to the protection scope of the utility model, as long as the purpose of reproducing the amplitude and phase distribution of the object wave is realized by recording the Fraunhofer diffraction intensity pattern of the object wave after passing through the multi-pinhole plate.
Claims (7)
1. A coherent diffraction imaging processing device comprises a light source, a sample stage for placing a sample, an image recording and processing device, and is characterized by also comprising a beam expanding and wave surface shaper, a multi-pinhole plate and a stepping rotating bracket; the multi-pinhole plate is arranged on the stepping rotating bracket, and the center of a reference pinhole on the multi-pinhole plate is superposed with the rotating center of the stepping rotating bracket; the light source, the beam expanding and wave surface shaper, the sample, the multi-pinhole plate and the image recording and processing device are sequentially arranged along the advancing direction of the light beam; the image recording and processing device comprises an image sensor which is arranged behind the stepping rotating bracket and is connected with the computer; meanwhile, the computer is also connected with the stepping rotating bracket.
2. The coherent diffraction imaging processing apparatus according to claim 1, wherein a distance Z1 between the sample and the multi-well plate ensures that a phase change of an object wave irradiated onto the multi-well plate at each pinhole clear aperture is not more than pi/4 radians; the distance Z2 between the image sensor and the multiwell plate satisfies the fraunhofer diffraction condition, i.e. the light field distribution on the recording plane of the image sensor is proportional to the fourier transform of the object wave transmitted through the multiwell plate.
3. A coherent diffraction imaging processing device comprises a light source, a sample stage for placing a sample, an image recording and processing device, and is characterized by also comprising a beam expanding and wave surface shaper, a multi-pinhole plate, a stepping rotating bracket and a Fourier transform lens, wherein the multi-pinhole plate is arranged on the stepping rotating bracket, and the center of a reference pinhole on the multi-pinhole plate is superposed with the rotating center of the stepping rotating bracket; the light source, the beam expanding and wave surface shaper, the sample, the multi-pinhole plate, the Fourier transform lens and the image recording and processing device are sequentially arranged along the advancing direction of the light beam; the image recording and processing device comprises an image sensor which is arranged behind the stepping rotating bracket and is connected with the computer; meanwhile, the computer is also connected with the stepping rotating bracket.
4. The coherent diffraction imaging processing apparatus according to claim 3, wherein the distance Z1 between the sample and the multi-well plate ensures that the phase change of the object wave irradiated onto the multi-well plate at each pinhole clear aperture is not more than pi/4 radians; the image sensor is located in the back focal plane of the fourier transform lens, i.e. the light field distribution in the image sensor recording plane is proportional to the fourier transform of the object wave transmitted through the multipinhole plate.
5. The coherent diffraction image processing apparatus according to claim 1, 2, 3 or 4, wherein the multi-well plate is an opaque thin plate provided with a reference well and a plurality of measurement wells; the distribution of each needle hole on the multi-needle hole plate meets the following requirements: two identical multi-pinhole plates are overlapped, when one of the plates is translated to enable the reference pinhole to be overlapped with any measuring pinhole of the other plate, the other pinholes cannot be overlapped; the size of the pinhole is such that the phase change of the object wave in the range of one pinhole is not more than a quarter wavelength.
6. The coherent diffraction imaging processing apparatus according to claim 5, wherein the pinholes of the multi-pinhole plate are uniformly distributed on a semicircular ring, the centers of the pinholes are equally spaced and are not less than 1.5 times of the diameter of the pinholes, the pinhole at one end of the semicircular ring at the center of the pinhole plate is a reference pinhole, and the other pinholes are measurement pinholes.
7. The coherent diffraction imaging processing apparatus according to claim 5, wherein the pinholes of the multi-pinhole plate are distributed on three straight lines which are 120 degrees with each other, wherein the pinhole at the intersection of the three straight lines at the center of the pinhole plate is a reference pinhole, and the other pinholes are measurement pinholes; the distance D0 between the center of the reference pinhole and the center of the adjacent measurement pinhole is not less than 1.5 times of the diameter of the pinhole, and the centers of the other measurement pinholes are equally spaced and are twice of D0.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103502203A (en) * | 2010-10-06 | 2014-01-08 | 欧塞拉治疗有限公司 | Methods of making L-ornithine phenyl acetate |
| CN107320120A (en) * | 2017-08-01 | 2017-11-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray frame imaging device |
-
2009
- 2009-02-20 CN CN2009200194783U patent/CN201421432Y/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103502203A (en) * | 2010-10-06 | 2014-01-08 | 欧塞拉治疗有限公司 | Methods of making L-ornithine phenyl acetate |
| CN103502203B (en) * | 2010-10-06 | 2016-09-07 | 欧塞拉治疗有限公司 | The method preparing L-Orn phenyl acetate salt |
| CN107320120A (en) * | 2017-08-01 | 2017-11-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray frame imaging device |
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