CN108196357A - A kind of multi-angle illumination light source and the Fourier stacking imaging system based on this light source - Google Patents
A kind of multi-angle illumination light source and the Fourier stacking imaging system based on this light source Download PDFInfo
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- CN108196357A CN108196357A CN201810150498.8A CN201810150498A CN108196357A CN 108196357 A CN108196357 A CN 108196357A CN 201810150498 A CN201810150498 A CN 201810150498A CN 108196357 A CN108196357 A CN 108196357A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 48
- 238000005286 illumination Methods 0.000 title claims abstract description 32
- 238000000034 method Methods 0.000 claims description 14
- 230000008569 process Effects 0.000 claims description 8
- 238000003475 lamination Methods 0.000 description 9
- 230000000007 visual effect Effects 0.000 description 9
- 238000001228 spectrum Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
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- 238000003491 array Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000010186 staining Methods 0.000 description 2
- 101100117236 Drosophila melanogaster speck gene Proteins 0.000 description 1
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- 238000012634 optical imaging Methods 0.000 description 1
- 238000000399 optical microscopy Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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Abstract
The present invention provides a kind of multi-angle illumination light source, including LED or laser, scanning galvanometer or micro machine galvanometer, scanning lens and condenser；Wherein, the light beam that LED or laser generate is scanned galvanometer or micro machine galvanometer is emitted to scanning lens, light beam is scanned through the back focal plane that lens converge to condenser, then becomes directional light through condenser, can change parallel light propagation direction or angle by adjusting galvanometer angle.The present invention also provides a kind of Fouriers based on the multi-angle illumination light source to be laminated imaging system, and including object lens, Guan Jing and imaging sensor, object lens are placed between object and Guan Jing to be imaged, and Guan Jing is between object lens and imaging sensor；The Fourier is laminated imaging system and further includes the multi-angle illumination light source, and object to be imaged is placed between multi-angle illumination light source and object lens.
Description
Technical field
The present invention relates to the micro imaging system fields being imaged based on Fourier lamination, and in particular to a kind of multi-angle illumination
Light source and the Fourier stacking imaging system based on this light source.
Background technology
In previous traditional micro imaging system, it is necessary to increase field range to sacrifice resolution ratio.Because optical system
Aberration, it is difficult to accomplish high-resolution and big visual field simultaneously.In short, it can be seen that being detected object under low power microcobjective
Overall picture, but resolution ratio is very low.When changing high power objective into, resolution ratio improves but just can only see the very little one of tested object
Part.To solve this contradiction between visual field and resolution ratio, conventional microscopy system is mainly using high power objective and precision sweep electricity
Moving platform realizes a wide range of spatial domain scanning.This system one secondary high-resolution of acquisition every time, the image of small field of view, then scanning platform
Object is moved to another place and then adopts figure.The image of smaller continuous area of visual field is subjected to image finally by software
Splicing fusion.This method needs accurate mechanical scanning component, so highly complex all-electric platform microscope is had to rely on,
This is also one of increasingly expensive principal element of full sheet microscopic system price.On the other hand, quantitative phase imaging is due to that can carry
For by sample physical, it has also become a kind of current widely used unmarked micro imaging method.Quantitative phase imaging is general
Interference imaging based on digital hologram.Because interference device is complicated, measurement request is high, vibrates the noise and speckle noise of introducing
Significantly impact image quality.Although this method can realize that unmarked quantitative phase measures, because by microcobjective
Limitation, it is impossible to while obtain the micro-imaging result of large visual field high resolution.In conclusion big visual field, high-resolution are realized simultaneously
Rate, quantitative phase measurement are a developing goals of optical microscopy, and conventional optical microscope system is used to be difficult to cope with
This requirement.
Communication and signal processing theory, especially using synthetic aperture radar as the rapid hair of the microwave Imaging Technique of representative
Exhibition, effectively facilitates the birth of an important branch Fourier optics of contemporary optics.Fourier optics are by telecommunications theory
And the new disciplines that widely used Fourier analysis method is transplanted to optical field and is formed in radar system.It is traditional at one
In the system of Fourier lamination imaging, sample by the plane wave illumination of different angle and pass through the object lens of a low numerical aperture into
Row imaging.Since the thin objects of two dimension are by the plane wave illumination from different angle, so object on object lens back focal plane
Frequency spectrum is translated into corresponding different location.Therefore, some are translated into object beyond the frequency content of numerical aperture of objective originally
Imaging surface is can be transferred within mirror numerical aperture to be imaged.It sees in turn, the incident light of different angle can be equivalent to
The overlapping pupil function (sub-aperture) of different location on frequency spectrum, every time by the frequency spectrum of different location sub-aperture on frequency domain
Form lamination.
Restructuring procedure is as shown in Figure 1.Wherein, Fig. 1 (a) is the schematic diagram of system composition.The basic principle of restructuring procedure：It is first
An initial solution is first generated according to the low resolution image adopted.The initial solution can add up the figure of all low resolutions and phase
Take arbitrary constant.A series of low-resolution images taken followed by camera are in frequency domain and spatial domain iteration.In frequency domain
Update the spectrum information in corresponding sub-aperture, the strength information of image replaced in spatial domain the intensity for adopting figure and phase
Position retains constant.In this course, sub-aperture is overlapped with sub-aperture extends frequency domain bandwidth and recovers more than object lens sky
Between resolution ratio limit high-frequency information so as to obtain big synthetic aperture.This final process can reconstruct the big of object simultaneously
Visual field high-resolution light intensity and phase image (phase recovery).It thereby realizes using a low numerical aperture, low magnifying power
Object lens obtain big visual field and high-resolution imaging results simultaneously, the resolution ratio finally reconstructed depend on frequency domain in synthesize numerical value
The size in aperture.There is a LED to be lit in LED array in figure every time so as to be shone with certain incidence angle sample
It is bright.For each light angle, system can acquire the low-resolution image of a duplicate sample product, then, all low resolution figures
As in one secondary high-definition picture of Fourier domain synthesis.
As shown in Fig. 1 (b), the concrete operation step of restructuring procedure is as follows：The first step generates initial solution；Second step, initially
Low-resolution image is generated by low-pass filtering after solution Fourier transform；Third walks, and is replaced with collected intensity picture is tested
The information of the intensity of ground resolution image, phase keeps cloth constant and then the related corresponding region of update Fourier domain；4th step is right
Different irradiating angles repeats two and three；5th, two to four are repeated until convergence.
Fig. 2 shows reconstruction result of the Fourier lamination imaging to staining cell section sample.Fig. 2 (a) is full filed
Low resolution original image, Fig. 2 (b), (c1), (d), (e) are reconstruction result of the Fourier lamination imaging to different zones respectively
Figure, Fig. 2 (c2) is the original image taken using 20 times of object lens, and Fig. 2 (c3) is the direct interpolation amplification of low-resolution image
Design sketch.From figure 2 it can be seen that using the microcobjective of 0.08 2 times of magnifying powers of numerical aperture, it is imaged by Fourier lamination
The resolution ratio that equivalent synthetic aperture is 0.5 is realized, reconstruct resolution ratio has been even more than the aobvious of 20 times of 0.4 numerical apertures of magnifying power
The resolution ratio of speck mirror, and its visual field is even more the visual field taken much larger than 20 times of object lens.
The system of existing Fourier lamination imaging using programmable LED array as multi-angle illumination light source, exist with
Lower defect：1st, light-source brightness is insufficient.The method that LED array changes incidence angle is every time by being located at one of array different location
LED is illuminated to realize.This means that then entire array must all use high brightness to radiation response optimal in order to obtain
LED, array is bigger, and cost is higher.In view of the ability to shoulder economically of client, many manufacturers have to using luminance shortage
LED carrys out a group battle array, so as to reduce the picture quality of imaging.2nd, light angle is restricted.When the distance one between LED and object to be imaged
Periodically, every LED in array treats the incidence angle that imaging object irradiates and also fixes therewith, and light source treats the irradiation of imaging object
Just only a limited number of a incident angle selects for user, and can not arbitrarily adjust.
Invention content
The present invention provides a kind of Fourier and imaging system multi-angle illumination light source and corresponding imaging system scheme is laminated, can
To significantly reduce cost under conditions of certain light-source brightness is met, and realize the arbitrary adjustment to light source radiating angle.
The technical problems to be solved by the invention are achieved by the following technical solution：
The present invention provides a kind of multi-angle illumination light source, and including LED or laser, scanning galvanometer or micro machine galvanometer are swept
Retouch lens and condenser；Wherein, the light beam that LED or laser generate is scanned galvanometer or micro machine galvanometer is emitted to scanning thoroughly
Mirror, light beam is scanned through the back focal plane that lens converge to condenser, then becomes directional light through condenser, by adjusting galvanometer angle
Parallel light propagation direction or angle can be changed.
Preferably, the LED is single branch high-brightness LED.
Imaging system is laminated in a kind of Fourier based on multi-angle illumination light source, including object lens, Guan Jing and imaging sensor,
Object lens are placed between object and Guan Jing to be imaged, and Guan Jing is between object lens and imaging sensor；Imaging is laminated in the Fourier
System further includes the multi-angle illumination light source, and object to be imaged is placed between multi-angle illumination light source and object lens.
Preferably, in imaging process, computer sends instruction to galvanometer allows it to be adjusted to certain angle, and light beam is with one
In fixed angular illumination to object to be imaged, imaging sensor will acquire a photos；Computer then changes galvanometer angle weight
This multiple process is until the image of acquisition can cover Fourier domain.
Preferably, described image sensor is CCD or cmos image sensor.
The beneficial effects of the present invention are：Compared to the limitation under the pressure of cost using the low and middle-end of the LED group battle arrays of luminance shortage
LED array product, lighting source of the invention only need a high-brightness LED or laser, and brightness is by this branch height
Brightness LED is determined, so as to provide a kind of higher multi-angle illumination light source design scheme of beam brightness.Sufficient light-source brightness
Image exposuring time can significantly be shortened, Image Acquisition is completed in shorter time, improve the working efficiency of user.Due to galvanometer
It is cheap, compared to the high-end LED array product using branched LED especially high-brightness LED group battle arrays, lighting source of the invention
With apparent cost or price advantage.Multi-angle illumination light source of the present invention is by controlling galvanometer that can realize appointing for light angle
Meaning adjustment, overcomes the restricted defect of LED array light source light angle.Under the support of multi-angle illumination light source of the present invention,
The optical imaging system price of the present invention is lower, and applicable surface is wider, in addition in brightness, time for exposure and irradiating angle control aspect
Advantage, cost performance is better than prior art and products thereof.
Description of the drawings
Fig. 1 introduces existing Fourier and imaging system is laminated, and (a) is that imaging system architecture diagram, figure is laminated in a kind of Fourier
In LED array in there are one LED every time to be lit so as to being illuminated with certain incidence angle to sample, (b) is image weight
Structure process；
Fig. 2 shows reconstruction result of Fig. 1 system Fouriers lamination imaging to staining cell section sample, and (a) is full filed
Low resolution original image, (b), (c1), (d), (e) are reconstruction result figure of the Fourier lamination imaging to different zones respectively,
(c2) it is the original image taken using 20 times of object lens, (c3) is the design sketch of the direct interpolation amplification of low-resolution image；
Fig. 3 is the multi-angle illumination light source composition frame chart of the present invention；
The imaging block diagram of system is laminated in the Fourier based on multi-angle illumination that Fig. 4 is the present invention.
Reference sign：1LED or laser, 2 scanning galvanometers or micro machine galvanometer, 3 scanning lenses, 4 condensers, 5
Object to be imaged, 6 object lens, 7 pipe mirrors, 8 imaging sensors.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that specific embodiment described herein is not used to limit only to explain the present invention
The fixed present invention.Although the preferred embodiment of the present invention is disclosed as follows, it is not restricted to specification and embodiment
In listed utilization, it can be fully applied to various fields suitable for the present invention, for those skilled in the art, can
Easily realize other modification, therefore without departing from the general concept defined in the claims and the equivalent scope, the present invention
It is not limited to specific details and legend shown and described herein.
Fig. 3 is a kind of multi-angle illumination light source composition frame chart of the present embodiment.The light beam that LED or laser 1 generate is swept
It retouches galvanometer or micro machine galvanometer 2 is emitted to scanning lens 3.The light beam is scanned through the back focal plane that lens 3 converge to condenser 4,
Become directional light using condenser 4 for being radiated at object.Sending instruction to galvanometer 2 by computer allows it to be adjusted to certain
One angle, the direction of propagation of directional light or will modulate the incident angle of object, so as to generate incidence angles degree
Light beam.
Fig. 4 is that imaging system architecture is laminated in a kind of Fourier based on multi-angle illumination light source of the present invention.As shown in Figure 3
The collimated light beam that multi-angle illumination light source is sent out passes through object lens 6 and pipe mirror 7 after irradiating object 5 to be imaged, in CCD or cmos image
Opto-electronic conversion is completed at sensor 8, the data image signal of generation is acquired and cached by CCD or cmos image sensor 8
It exports to signal processor and carries out the Fourier domain synthesis of image, obtain high-definition picture.
In imaging process, computer sends instruction to galvanometer 2 allows it to be adjusted to certain angle, and light beam will be with certain
In angular illumination to object 5 to be imaged, imaging sensor 8 acquires a photos.Computer then changes 2 angle of galvanometer and repeats this
One process is until acquired image can cover Fourier domain.For the angle of each incident light, system all acquires a pair
The image of low resolution；Then, all low-resolution images are in one secondary high-definition picture of Fourier domain synthesis.Based on galvanometer
Under the control of the computer, light angle can arbitrarily adjust to realize more low-frequency image 2 multi-angle illumination light source
More frequency domain overlappings.
Comparison LED array, illumination path of the invention can only use a high-brightness LED or laser, bright
Degree is determined by a high-brightness LED, and faster, system robustness higher, cheaper, efficiency is far above existing for image taking speed
LED array system.
Claims (5)
1. a kind of multi-angle illumination light source, it is characterised in that：Including LED or laser (1), scanning galvanometer or micro machine galvanometer
(2), scanning lens (3) and condenser (4)；Wherein, the light beam that LED or laser (1) generate is scanned galvanometer or micro machine shakes
Mirror (2) is emitted to scanning lens (3), and light beam is scanned through the back focal plane that lens (3) converge to condenser (4), then through condenser
(4) become directional light, can change parallel light propagation direction or angle by adjusting galvanometer (2) angle.
2. multi-angle illumination light source according to claim 1, which is characterized in that the LED is single branch high-brightness LED.
3. imaging system is laminated in a kind of Fourier based on multi-angle illumination light source, passed including object lens (6), Guan Jing (7) and image
Sensor (8), object lens (6) are placed between object to be imaged (5) and Guan Jing (7), and Guan Jing (7) is positioned at object lens (6) and imaging sensor
(8) between；It is characterized in that, imaging system, which is laminated, in the Fourier further includes multi-angle illumination as claimed in claim 1 or 2
Light source, object (5) to be imaged are placed between multi-angle illumination light source and object lens (6).
4. imaging system is laminated in Fourier according to claim 3, it is characterised in that：In imaging process, computer pair
Galvanometer (2), which sends instruction, allows it to be adjusted to certain angle, and light beam is irradiated at an angle on object to be imaged (5), figure
As sensor will acquire a photos；Computer then changes galvanometer (2) angle and repeats this process until the image energy of acquisition
Cover Fourier domain.
5. imaging system is laminated in Fourier according to claim 3, it is characterised in that：Described image sensor (8) is CCD
Or cmos image sensor.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581643A (en) * | 2018-11-28 | 2019-04-05 | 中国科学院西安光学精密机械研究所 | Fourier's lamination microscopic imaging device and method |
| CN109683299A (en) * | 2019-01-10 | 2019-04-26 | 浙江大学 | A kind of high-resolution micro imaging system of polychrome multi-angle illumination |
| CN110579871A (en) * | 2019-09-05 | 2019-12-17 | 杭州电子科技大学 | LED illumination optimization method and device based on Fourier laminated microscopic imaging |
| CN111158130A (en) * | 2019-12-31 | 2020-05-15 | 北京理工大学 | Fourier laminated microscopic imaging system adopting laser array light source |
| CN111307759A (en) * | 2020-04-12 | 2020-06-19 | 北京工业大学 | Continuous terahertz wave Fourier laminated microscopic imaging system and method |
| CN111338068A (en) * | 2020-03-13 | 2020-06-26 | 中国科学院长春光学精密机械与物理研究所 | Fourier laminated imaging system based on telecentric scanning lens |
| CN114280055A (en) * | 2021-12-16 | 2022-04-05 | 北京工业大学 | Continuous terahertz wave synthetic aperture imaging system and method |
| WO2023019400A1 (en) * | 2021-08-16 | 2023-02-23 | 深圳华大生命科学研究院 | Microscopic imaging apparatus and illumination chip thereof, imaging method, electronic device, and medium |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581643A (en) * | 2018-11-28 | 2019-04-05 | 中国科学院西安光学精密机械研究所 | Fourier's lamination microscopic imaging device and method |
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| CN109683299A (en) * | 2019-01-10 | 2019-04-26 | 浙江大学 | A kind of high-resolution micro imaging system of polychrome multi-angle illumination |
| CN110579871A (en) * | 2019-09-05 | 2019-12-17 | 杭州电子科技大学 | LED illumination optimization method and device based on Fourier laminated microscopic imaging |
| CN110579871B (en) * | 2019-09-05 | 2021-08-03 | 杭州电子科技大学 | LED illumination optimization method and device based on Fourier laminated microscopic imaging |
| CN111158130A (en) * | 2019-12-31 | 2020-05-15 | 北京理工大学 | Fourier laminated microscopic imaging system adopting laser array light source |
| CN111338068A (en) * | 2020-03-13 | 2020-06-26 | 中国科学院长春光学精密机械与物理研究所 | Fourier laminated imaging system based on telecentric scanning lens |
| CN111338068B (en) * | 2020-03-13 | 2022-01-11 | 中国科学院长春光学精密机械与物理研究所 | Fourier laminated imaging system based on telecentric scanning lens |
| CN111307759A (en) * | 2020-04-12 | 2020-06-19 | 北京工业大学 | Continuous terahertz wave Fourier laminated microscopic imaging system and method |
| WO2023019400A1 (en) * | 2021-08-16 | 2023-02-23 | 深圳华大生命科学研究院 | Microscopic imaging apparatus and illumination chip thereof, imaging method, electronic device, and medium |
| CN114280055A (en) * | 2021-12-16 | 2022-04-05 | 北京工业大学 | Continuous terahertz wave synthetic aperture imaging system and method |
| CN114280055B (en) * | 2021-12-16 | 2024-02-23 | 北京工业大学 | Continuous terahertz wave synthetic aperture imaging system and method |
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