CN201408247Y - Test circuit for chip of solar cell - Google Patents
Test circuit for chip of solar cell Download PDFInfo
- Publication number
- CN201408247Y CN201408247Y CN2009201206237U CN200920120623U CN201408247Y CN 201408247 Y CN201408247 Y CN 201408247Y CN 2009201206237 U CN2009201206237 U CN 2009201206237U CN 200920120623 U CN200920120623 U CN 200920120623U CN 201408247 Y CN201408247 Y CN 201408247Y
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- circuit
- test circuit
- test
- load test
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Abstract
A test circuit for a chip of a solar cell adopts the technical scheme that the test circuit comprises a test terminal, voltmeters and an ammeter which are arranged on a test main circuit, an adjustable load test circuit, a fixed load test circuit, a short-circuit current test circuit and an open-circuit voltage test circuit which are connected in parallel, and a relay. An adjustable resistor is connected to the adjustable load test circuit; a fixed resistance is connected to the fixed load test circuit; the voltmeters are connected at two ends of the adjustable resistor and the fixed resistance; and the short-circuit current test circuit is connected to a normal-close contact of the relay and the open-circuit voltage test circuit is connected to a normal-open contact of the relay. Different gear tests are arranged according to the measurement of a plurality of different parameters in the test circuit; and the adjustable loads are utilized to realize load stimulation under different application environments.
Description
(1) technical field
The utility model relates to a kind of solar battery chip test circuit.
(2) background technology
Recently the demand of solar battery chip constantly increases, and constantly increases especially for the demand of the little chips of standard specification such as 40 * 40,50 * 50.The test of little chip has different requirements according to different application, need aborning to adjust, sometimes test needs transformation parameter, therefore test step is the very important operation that influences speed of production, but existing solar battery chip test circuit can't be realized the adjustment of test parameter.
(3) summary of the invention
In order to overcome the above-mentioned deficiency of existing solar battery chip, the utility model provides a kind of solar battery chip test circuit that a plurality of different test parameters are set.
The technical scheme in the invention for solving the technical problem is: a kind of solar battery chip test circuit, comprise calibrating terminal, voltage table and reometer on the test main circuit, also comprise tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit in parallel; Be connected to adjustable resistor on the described tunable load test circuit, be connected to fixed value resistance on the described fixed load test circuit, described voltage table is connected on the two ends of described adjustable resistor and fixed value resistance; One end of described tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit also is connected to the test main circuit, and the other end is a driving switch; Described test main circuit is provided with switch, opens a way thereby the connection of the driving switch of described switch and described tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit makes tunable load test circuit, fixed load test circuit and test main circuit form path, makes the short-circuit current test circuit and tests main circuit formation short circuit, the open-circuit voltage test circuit is formed with the test main circuit; Also comprise a relay, described short-circuit current test circuit is connected on the normally closed contact of described relay, and described open-circuit voltage test circuit is connected on the normally opened contact of described relay.
Further, described fixed load test circuit comprises the first fixed load test circuit and the second fixed load test circuit in parallel, be connected to first fixed value resistance on the described first fixed load test circuit, be connected to second fixed value resistance on the described second fixed load test circuit; Adjustable resistor on the described tunable load test circuit comprises roughly adjusted rheostat device and fine tuning resistor.
The utility model is provided with different gear tests, realize test, the test of fixed load, the test of open-circuit voltage and the test of short-circuit current of tunable load, wherein realize the quick switching of open-circuit voltage test and short-circuit current test: in the situation of load open circuit by relay, make the open-circuit voltage test circuit be connected on the normally opened contact of relay, the short-circuit current test circuit is connected on the normally closed contact of relay, and it tests open-circuit voltage values; Under short-circuit conditions, make the short-circuit current test circuit be connected on the normally closed contact of relay, the open-circuit voltage test circuit is connected on the normally opened contact of relay, and it tests short-circuit current value.
The beneficial effects of the utility model are: be provided with different gear tests, and can be according to the measurement of a plurality of different parameters; By getting involved tunable load, realize the load simulation under the different application environment.
(4) description of drawings
Fig. 1 is a structural representation of the present utility model.
(5) embodiment
Below in conjunction with the drawings and specific embodiments the utility model is described in further detail.
With reference to Fig. 1, a kind of solar battery chip test circuit, comprise calibrating terminal 1, voltage table 2 and reometer 3 on the test main circuit, also comprise tunable load test circuit 4, fixed load test circuit, short-circuit current test circuit 5, open-circuit voltage test circuit 6 in parallel; Be connected to adjustable resistor on the described tunable load test circuit 4, be connected to fixed value resistance on the described fixed load test circuit, described voltage table 2 is connected on the two ends of described adjustable resistor and fixed value resistance; One end of described tunable load test circuit 4, fixed load test circuit, short-circuit current test circuit 5, open-circuit voltage test circuit 6 also is connected to the test main circuit, and the other end is a driving switch; Described test main circuit is provided with switch 7, thereby the connection of the driving switch of described switch 7 and described tunable load test circuit 4, fixed load test circuit, short-circuit current test circuit 5, open-circuit voltage test circuit 6 makes tunable load test circuit 4, fixed load test circuit and test main circuit form path, makes short-circuit current test circuit 5 and test main circuit formation short circuit, makes open-circuit voltage test circuit 6 and the formation of test main circuit to be opened a way; Also comprise a relay 8, described short-circuit current test circuit 5 is connected on the normally closed contact of described relay 8, and described open-circuit voltage test circuit 6 is connected on the normally opened contact of described relay 8.
In the present embodiment, described fixed load test circuit comprises the first fixed load test circuit 9 and the second fixed load test circuit 10 in parallel, be connected to first fixed value resistance on the described first fixed load test circuit 9, be connected to second fixed value resistance on the described second fixed load test circuit 10; Adjustable resistor on the described tunable load test circuit comprises roughly adjusted rheostat device 11 and fine tuning resistor 12.
The utility model is provided with different gear tests, realize test, the test of fixed load, the test of open-circuit voltage and the test of short-circuit current of tunable load, wherein realize the quick switching of open-circuit voltage test and short-circuit current test: in the situation of load open circuit by relay 8, make the open-circuit voltage test circuit be connected on the normally opened contact of relay, the short-circuit current test circuit is connected on the normally closed contact of relay, and it tests open-circuit voltage values; Under short-circuit conditions, make the short-circuit current test circuit be connected on the normally closed contact of relay, the open-circuit voltage test circuit is connected on the normally opened contact of relay, and it tests short-circuit current value.
Claims (2)
1. solar battery chip test circuit, comprise calibrating terminal, voltage table and reometer on the test main circuit, it is characterized in that: also comprise tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit in parallel;
Be connected to adjustable resistor on the described tunable load test circuit, be connected to fixed value resistance on the described fixed load test circuit, described voltage table is connected on the two ends of described adjustable resistor and fixed value resistance;
One end of described tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit also is connected to the test main circuit, and the other end is a driving switch; Described test main circuit is provided with switch, opens a way thereby the connection of the driving switch of described switch and described tunable load test circuit, fixed load test circuit, short-circuit current test circuit, open-circuit voltage test circuit makes tunable load test circuit, fixed load test circuit and test main circuit form path, makes the short-circuit current test circuit and tests main circuit formation short circuit, the open-circuit voltage test circuit is formed with the test main circuit;
Also comprise a relay, described short-circuit current test circuit is connected on the normally closed contact of described relay, and described open-circuit voltage test circuit is connected on the normally opened contact of described relay.
2. solar battery chip test circuit as claimed in claim 1, it is characterized in that: described fixed load test circuit comprises the first fixed load test circuit and the second fixed load test circuit in parallel, be connected to first fixed value resistance on the described first fixed load test circuit, be connected to second fixed value resistance on the described second fixed load test circuit;
Adjustable resistor on the described tunable load test circuit comprises roughly adjusted rheostat device and fine tuning resistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201206237U CN201408247Y (en) | 2009-05-21 | 2009-05-21 | Test circuit for chip of solar cell |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201206237U CN201408247Y (en) | 2009-05-21 | 2009-05-21 | Test circuit for chip of solar cell |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201408247Y true CN201408247Y (en) | 2010-02-17 |
Family
ID=41679185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201206237U Expired - Fee Related CN201408247Y (en) | 2009-05-21 | 2009-05-21 | Test circuit for chip of solar cell |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201408247Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102043118A (en) * | 2010-11-17 | 2011-05-04 | 嘉友联精密机械工程(无锡)有限公司 | Detection device of solar module |
| TWI418829B (en) * | 2011-03-04 | 2013-12-11 | Ritek Corp | Solar cell test method |
| CN104198871A (en) * | 2014-09-26 | 2014-12-10 | 重庆梅安森科技股份有限公司 | Electronic device tester and testing method thereof |
-
2009
- 2009-05-21 CN CN2009201206237U patent/CN201408247Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102043118A (en) * | 2010-11-17 | 2011-05-04 | 嘉友联精密机械工程(无锡)有限公司 | Detection device of solar module |
| TWI418829B (en) * | 2011-03-04 | 2013-12-11 | Ritek Corp | Solar cell test method |
| CN104198871A (en) * | 2014-09-26 | 2014-12-10 | 重庆梅安森科技股份有限公司 | Electronic device tester and testing method thereof |
| CN104198871B (en) * | 2014-09-26 | 2017-02-15 | 重庆梅安森科技股份有限公司 | Electronic device tester and testing method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100217 Termination date: 20130521 |