CN201335815Y - X-ray diffraction-fluorescence double spectrometer - Google Patents
X-ray diffraction-fluorescence double spectrometer Download PDFInfo
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- CN201335815Y CN201335815Y CNU2009201051077U CN200920105107U CN201335815Y CN 201335815 Y CN201335815 Y CN 201335815Y CN U2009201051077 U CNU2009201051077 U CN U2009201051077U CN 200920105107 U CN200920105107 U CN 200920105107U CN 201335815 Y CN201335815 Y CN 201335815Y
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Abstract
The utility model relates to an X-ray diffraction-fluorescence double spectrometer, which comprises an X-ray source, a silicon detector, a single-channel pulse-height analyzer and a multi-channel pulse-height analyzer. The X-ray source produces X-rays to irradiate a sample to be detected; the silicon detector detects the X-rays reflected by the sample to be detected and transmits the output to the single-channel pulse-height analyzer and the multi-channel pulse-height analyzer; the single-channel pulse-height analyzer only selects diffraction wavelengths so as to obtain the X-ray diffraction spectrum of the sample to be detected; and the multi-channel pulse-height analyzer is used for obtaining the X-ray fluorescence energy spectrum of the sample to be detected. The utility model adopts the technical scheme that the fluorescence diffraction energy spectrum of the sample can be obtained when diffraction pattern scanning is performed, so that the spectrometer can fully obtain the information of the sample while working, and obtain the X-ray diffraction spectrum and the X-ray energy spectrum of the sample at the same time.
Description
Technical field
The utility model relates to the material phase analysis technology, relates in particular to the two spectrometers of a kind of X-ray diffraction-fluorescence.
Background technology
Powder X-ray diffractometry is the basic skills of material phase analysis, and its majority is to finish by powder x-ray diffraction.The X-ray diffractogram of crystalline state material comes down to the Fournier transform of its micromechanism view, and every kind of material all has its unique crystal structure in theory, thereby can carry out the discriminating and the mensuration of material according to X-ray diffractogram.But its element is formed different materials and structure is alike or structure is close phenomenon is comparatively common, therefore, only relies on the diffractogram of sample often to be not enough to determine the thing phase composition of sample.At this moment, the element information that sample is formed is most important for getting rid of existing of doubtful thing phase, but the powder x-ray diffraction of prior art only can obtain the powder diagram of sample, and the component of sample need carry out ultimate analysis in addition usually and just can know.
The utility model content
The purpose of this utility model provides the two spectrometers of a kind of X-ray diffraction-fluorescence, can not obtain the defective of sample diffraction information and element composition simultaneously to solve prior art.
In order to achieve the above object, the technical solution of the utility model proposes the two spectrometers of a kind of X-ray diffraction-fluorescence, comprises x-ray source, also comprises: silicon detecting device, single channel pulse height analyzer and multichannel pulse scope-analyzer,
Described x-ray source produces the x-ray bombardment testing sample;
The X ray that described silicon detecting device reflects described testing sample detects and output is distributed into described single channel pulse height analyzer and multichannel pulse scope-analyzer;
Described single channel pulse height analyzer is the gating diffraction wavelength only, is used to obtain the X-ray diffraction spectrum of testing sample;
Described multichannel pulse scope-analyzer is used to obtain the XRF power spectrum of testing sample.
In the two spectrometers of above-mentioned X-ray diffraction-fluorescence, the sensitizing range of described silicon detecting device is a strip.
In the two spectrometers of above-mentioned X-ray diffraction-fluorescence, the energy resolution of described silicon detecting device is better than 180eV.
The technical solution of the utility model also proposes the two spectrometers of a kind of X-ray diffraction-fluorescence, comprises x-ray source, conventional sense device and single channel pulse height analyzer, also comprises: silicon detecting device and multichannel pulse scope-analyzer,
Described x-ray source produces the x-ray bombardment testing sample;
The X ray that described conventional sense device reflects described testing sample detects and described single channel pulse height analyzer is sent in output, is used to obtain the X-ray diffraction spectrum of testing sample;
The X ray that described silicon detecting device reflects described testing sample detects and described multichannel pulse scope-analyzer is sent in output, is used to obtain the XRF power spectrum of testing sample.
In the two spectrometers of above-mentioned X-ray diffraction-fluorescence, the energy resolution of described silicon detecting device is better than 180eV.
The technical solution of the utility model is when diffractometer carries out diffractogram scanning, obtains the fluorescent scattering energy spectrum of sample, makes instrument can fully obtain the information of sample when work, obtains the X-ray diffraction spectrum of sample and the X-ray energy spectrum of sample simultaneously.
Description of drawings
Fig. 1 is embodiment one structural drawing of the two spectrometers of the utility model X-ray diffraction-fluorescence;
Fig. 2 is embodiment two structural drawing of the two spectrometers of the utility model X-ray diffraction-fluorescence.
Embodiment
Following examples are used to illustrate the utility model, but are not used for limiting scope of the present utility model.
Fig. 1 is embodiment one structural drawing of the two spectrometers of the utility model X-ray diffraction-fluorescence, as shown in the figure, two spectrometers of present embodiment comprise x-ray source 11, and sensitizing range is that (for example 0.5 * 20mm), energy resolution is 180eV or better silicon detecting device 12 to strip; The output of silicon detecting device 12 is distributed into a single channel pulse height analyzer 13 and a multiple tracks (for example 2048 roads) pulse height analyzer 14 simultaneously.Wherein, single channel pulse height analyzer 13 is set to only gating diffraction wavelength (diffraction is used CuK α wavelength always), so that obtain diffraction spectra; 14 of multichannel pulse scope-analyzers are used for the X ray energy spectrum of analytic sample scattering, and the line spectrum in this spectrogram is except that respective wavelength is the line of diffraction wavelength, and remaining spectral line should be the characteristic spectral line of the component of sample.Can determine the essential element composition of sample according to the energy spectrum of multichannel pulse scope-analyzer 14 outputs.
The same with the modern diffractometer that uses high energy resolution silicon detecting device, present embodiment no longer needs to use physics monochromatization methods such as graphite curved-crystal monochromator when obtaining diffraction spectra, under the x-ray source that uses equality strength and the condition of scanning, can access the diffractogram of better quality (diffracted intensity increases about 3 times), but, owing to increased the passage that obtains of X-ray energy spectrum, present embodiment can obtain the two spectrums of X-ray diffraction-fluorescence simultaneously, will be more useful for material phase analysis.
Fig. 2 is embodiment three structural drawing of the two spectrometers of the utility model X-ray diffraction-fluorescence, as shown in the figure, two spectrometers of present embodiment are identical with traditional x-ray powder diffraction instrument, comprise x-ray source 21, and common X-ray detector 22 and single channel pulse height analyzer 23 are as the measuring element of diffracted intensity.And in order to obtain the X-ray energy spectrum of sample, two spectrometers of present embodiment have increased a small-sized high energy resolution (180eV or better) silicon detecting device 24 and multichannel analyzer 25 independently.Such configuration also can obtain the two spectrums of X-ray diffraction-fluorescence simultaneously, and to compare its deployment cost lower with the foregoing description one.
More than be preferred forms of the present utility model, according to the disclosed content of the utility model, those of ordinary skill in the art can expect some identical, replacement schemes apparently, all should fall into the scope of the utility model protection.
Claims (5)
1, the two spectrometers of a kind of X-ray diffraction-fluorescence comprise x-ray source, it is characterized in that, also comprise: silicon detecting device, single channel pulse height analyzer and multichannel pulse scope-analyzer,
Described x-ray source produces the x-ray bombardment testing sample;
The X ray that described silicon detecting device reflects described testing sample detects and output is distributed into described single channel pulse height analyzer and multichannel pulse scope-analyzer;
Described single channel pulse height analyzer is the gating diffraction wavelength only, is used to obtain the X-ray diffraction spectrum of testing sample;
Described multichannel pulse scope-analyzer is used to obtain the XRF power spectrum of testing sample.
2, the two spectrometers of X-ray diffraction-fluorescence as claimed in claim 1 is characterized in that the sensitizing range of described silicon detecting device is a strip.
3, the two spectrometers of X-ray diffraction-fluorescence as claimed in claim 1 is characterized in that the energy resolution of described silicon detecting device is better than 180eV.
4, the two spectrometers of a kind of X-ray diffraction-fluorescence comprise x-ray source, conventional sense device and single channel pulse height analyzer, it is characterized in that, also comprise: silicon detecting device and multichannel pulse scope-analyzer,
Described x-ray source produces the x-ray bombardment testing sample;
The X ray that described conventional sense device reflects described testing sample detects and described single channel pulse height analyzer is sent in output, is used to obtain the X-ray diffraction spectrum of testing sample;
The X ray that described silicon detecting device reflects described testing sample detects and described multichannel pulse scope-analyzer is sent in output, is used to obtain the XRF power spectrum of testing sample.
5, the two spectrometers of X-ray diffraction-fluorescence as claimed in claim 4 is characterized in that the energy resolution of described silicon detecting device is better than 180eV.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2009201051077U CN201335815Y (en) | 2009-01-14 | 2009-01-14 | X-ray diffraction-fluorescence double spectrometer |
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| CNU2009201051077U CN201335815Y (en) | 2009-01-14 | 2009-01-14 | X-ray diffraction-fluorescence double spectrometer |
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| CN201335815Y true CN201335815Y (en) | 2009-10-28 |
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| CNU2009201051077U Expired - Lifetime CN201335815Y (en) | 2009-01-14 | 2009-01-14 | X-ray diffraction-fluorescence double spectrometer |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102770753A (en) * | 2009-12-17 | 2012-11-07 | 赛默飞世尔科技(埃居布朗)有限公司 | Method and apparatus for performing X-ray analysis of a sample |
| CN103076352A (en) * | 2012-12-28 | 2013-05-01 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN103698350A (en) * | 2013-12-26 | 2014-04-02 | 北京师范大学 | X-ray double spectrometer |
| CN105758882A (en) * | 2016-02-29 | 2016-07-13 | 章炜 | Fluorescence-detecting and spectrum pre-processing method for lubricating oil metal X-rays |
| CN111221028A (en) * | 2019-12-04 | 2020-06-02 | 中国工程物理研究院材料研究所 | Spectral line detection method and device, spectral line detector and spectral line detection system |
| CN113791098A (en) * | 2021-11-16 | 2021-12-14 | 四川大学 | Large-area multi-feature ray surface analysis device |
-
2009
- 2009-01-14 CN CNU2009201051077U patent/CN201335815Y/en not_active Expired - Lifetime
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102770753A (en) * | 2009-12-17 | 2012-11-07 | 赛默飞世尔科技(埃居布朗)有限公司 | Method and apparatus for performing X-ray analysis of a sample |
| CN102770753B (en) * | 2009-12-17 | 2016-09-14 | 赛默飞世尔科技(埃居布朗)有限公司 | The method and apparatus carrying out the X-ray analysis of sample |
| CN103076352A (en) * | 2012-12-28 | 2013-05-01 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN103076352B (en) * | 2012-12-28 | 2015-02-25 | 中国科学院高能物理研究所 | Method for obtaining high-quality X-ray absorption spectrum of thin film sample |
| CN103698350A (en) * | 2013-12-26 | 2014-04-02 | 北京师范大学 | X-ray double spectrometer |
| CN103698350B (en) * | 2013-12-26 | 2016-03-30 | 北京师范大学 | A kind of X-ray double spectrometer |
| CN105758882A (en) * | 2016-02-29 | 2016-07-13 | 章炜 | Fluorescence-detecting and spectrum pre-processing method for lubricating oil metal X-rays |
| CN111221028A (en) * | 2019-12-04 | 2020-06-02 | 中国工程物理研究院材料研究所 | Spectral line detection method and device, spectral line detector and spectral line detection system |
| CN113791098A (en) * | 2021-11-16 | 2021-12-14 | 四川大学 | Large-area multi-feature ray surface analysis device |
| CN113791098B (en) * | 2021-11-16 | 2024-03-26 | 四川大学 | Multi-feature surface analysis device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Beijing University Micro Structure Analytical Laboratory Co., Ltd. Assignor: Bulaige Technology (Beijing) Co., Ltd. Contract record no.: 2010110000204 Denomination of utility model: X-ray diffraction-fluorescence double spectrometer Granted publication date: 20091028 License type: Exclusive License Record date: 20101119 |
|
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 100084 North Pacific Science and technology development center, No. 52, Haidian Road, Haidian District, Beijing, 1710C Patentee after: Beijing Bragg Technology Co. Ltd. Address before: Room 2112, room 2, incubator of Science Park, Peking University, No. 116, Zhongguancun North Street, Haidian District, Beijing Patentee before: Bulaige Technology (Beijing) Co., Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20091028 |