CN201311466Y - LED testing set - Google Patents
LED testing set Download PDFInfo
- Publication number
- CN201311466Y CN201311466Y CNU2008202023807U CN200820202380U CN201311466Y CN 201311466 Y CN201311466 Y CN 201311466Y CN U2008202023807 U CNU2008202023807 U CN U2008202023807U CN 200820202380 U CN200820202380 U CN 200820202380U CN 201311466 Y CN201311466 Y CN 201311466Y
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- China
- Prior art keywords
- probe
- led
- probes
- limited block
- test group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to an LED packing machine, particularly to an LED testing set in the LED packing machine. The LED testing set comprises a pair of probes, a probe base and a probe position limiting block, wherein a testing machine is connected below the probes via wires, and the upper part of each probe is a probe head which is in contact with an LED positioned above the probe head; two probe holes formed on the probe base for the probes to be inserted into; and the probe position limiting block is positioned above the probe base and two position limiting holes are formed thereof for limiting the swing of the probes along the radial direction of the probes. The probe position limiting block is further arranged in the LED testing set, so as to effectively prevent the probes swinging along the radial direction, thereby resulting in stable contact of the tested material with the probe heads, safety and accurate testing, and avoiding the probes driving the tested material to swing.
Description
Technical field
The utility model relates to the LED packaging machine, relates in particular to the LED test group in the LED packaging machine.
Background technology
SMD (surface mount device, the sealed in unit of surface mount part) the LED packaging machine utilizes the unit for electrical property parameters (Direct/Reverse voltage, electric leakage etc.) of probe test LED, the structure of the LED test group of this LED packaging machine and mounting means are as shown in Figure 1, this LED test group comprises probe 1, probe 2 and probe base 3, and the probe aperture of inserting for probe 1,2 31,32 is arranged on the probe base 3.As shown in Figure 2, its test mode imposes the strength F that presses down and makes the tight contact probe 1,2 of LED and pass to the electrical parameter that certain current/voltage is tested LED for LED is placed probe 1 and probe 2 tops.The shortcoming of above-mentioned LED test group is, when LED places probe 1,2 tops, when imposing the strength F that presses down, because the gap relation of probe itself can make the probe double swerve, so can shine into the contact point instability of test, in addition, the anti-acting force that imposes on tested material makes the crooked and accuracy of influence test effect in tested material position because of rocking of probe.
Summary of the invention
The purpose of this utility model provides accurate, the safe LED test group of test.
For achieving the above object, the utility model provides following technical scheme:
LED test group comprises
A pair of probe, the below of probe connects test machine by lead, and the top of each probe is probe, and the probe contact is positioned at the LED of probe top;
Probe base has two probe aperture inserting for described a pair of probe respectively on it;
In addition, also comprise
Probe limited block, two spacing holes that restricted described a pair of probe radially wobbles along probe on it, described probe limited block are positioned at described probe base top.
Above-mentioned LED test group has been set up the probe limited block, and this probe limited block can effectively prevent swinging of probe, makes contact stabilization, safety, the test of tested material and probe accurate on the one hand; Also avoided probe to drive the swing of tested material on the other hand.
Description of drawings
Fig. 1 is the explosive view of prior art LED test group;
Fig. 2 is the wiring layout of prior art LED test group;
Fig. 3 is the explosive view of the utility model LED test group;
Fig. 4 is the wiring layout of the utility model LED test group.
The utility model is described in further detail below in conjunction with drawings and Examples.
Embodiment
Referring to Fig. 3 and Fig. 4, LED test group comprises probe 1, probe 2, and the below of probe 1,2 connects test machine (figure does not show) by lead, and the top of probe 1,2 is respectively probe 11,21, and probe 11,21 contacts are positioned at the LED of probe 11,21 tops.Two probe aperture 31,32 of inserting for probe 1,2 are respectively arranged on the probe base 3.Left limit piece 41 and right limit piece 42 constitute the probe limited block.Two semicircular spacing hole 41a, 41b are arranged on the left limit piece, two semicircular spacing hole 42a, 42b are arranged on the right limit piece.Pilot hole 411,412 and pilot hole 421,422 are not arranged on the left and right limited block 41,42, accordingly, pilot hole 33-36 is arranged on probe base 3, use four screws or pin etc. to insert pilot hole 411 and pilot hole 33, pilot hole 412 and pilot hole 34, pilot hole 421 and pilot hole 35, pilot hole 422 box pilot holes 36 respectively, left and right limited block 41,42 is fixed to probe base 3 tops.Probe 1 and probe 2 lay respectively between spacing hole 41a, 42a and spacing hole 41b, the 42b.The described probe 11,21 of the top clamping of spacing hole 41a, 42a and 41b, 42b.
Above-mentioned LED test group has increased left and right two limited blocks 41,42, when pressing down, LED does test job and when imposing probe 1,2 strength F, because probe 11,21 is by left and right limited block 41,42 restrictions, probe 1,2 can only be moved up and down, test is judged by accident thereby reduce because the double swerve that the gap of probe own causes causes the instability of test surfaces.
Above-mentioned LED test group also can be avoided because the reacting force that rocks of probe causes tested material position crooked, so that tested material can't be located work when moving to next workstation.
Certainly, the utility model LED test group also can have other distortion.For example, described probe limited block also can be integral type mechanism.In a word, do conspicuous change, and other every change that does not break away from the utility model essence all should be included within the described scope of claim according to the prompting of above-mentioned example.
Claims (4)
1, LED test group comprises
A pair of probe, the below of probe connects test machine by lead, and the top of each probe is probe, and the probe contact is positioned at the LED of probe top;
Probe base has two probe aperture inserting for described a pair of probe respectively on it;
It is characterized in that, also comprise
Probe limited block, two spacing holes that restricted described a pair of probe radially wobbles along probe on it, described probe limited block are positioned at described probe base top.
2, LED test group according to claim 1,
It is characterized in that:
Described probe limited block is fixed on the top of described probe base.
3, LED test group according to claim 1,
It is characterized in that:
Described probe limited block is divided into left limit piece and right limit piece, and two semicircular spacing holes are respectively arranged on the left and right limited block.
4, according to any described LED test group among the claim 1-3,
It is characterized in that:
The described probe of the top clamping of described spacing hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008202023807U CN201311466Y (en) | 2008-10-24 | 2008-10-24 | LED testing set |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008202023807U CN201311466Y (en) | 2008-10-24 | 2008-10-24 | LED testing set |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201311466Y true CN201311466Y (en) | 2009-09-16 |
Family
ID=41108724
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008202023807U Expired - Fee Related CN201311466Y (en) | 2008-10-24 | 2008-10-24 | LED testing set |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201311466Y (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104678274A (en) * | 2015-03-19 | 2015-06-03 | 山东浪潮华光光电子股份有限公司 | Nondestructive test method of LED chips |
-
2008
- 2008-10-24 CN CNU2008202023807U patent/CN201311466Y/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104678274A (en) * | 2015-03-19 | 2015-06-03 | 山东浪潮华光光电子股份有限公司 | Nondestructive test method of LED chips |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090916 Termination date: 20101024 |