CN201311395Y - Additional device for measuring sample - Google Patents
Additional device for measuring sample Download PDFInfo
- Publication number
- CN201311395Y CN201311395Y CN 200820124031 CN200820124031U CN201311395Y CN 201311395 Y CN201311395 Y CN 201311395Y CN 200820124031 CN200820124031 CN 200820124031 CN 200820124031 U CN200820124031 U CN 200820124031U CN 201311395 Y CN201311395 Y CN 201311395Y
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- CN
- China
- Prior art keywords
- sample
- light hole
- detection apparatus
- infrared radiation
- radiation detection
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to an additional device for measuring a sample, which is used for an infrared detector that is provided with connecting racks used for fixing a sample platform, wherein incident rays irradiate through the sample platform and irradiate on the sample on a sample placing plane arranged on the sample platform; the additional device comprises a connecting platform positioned between the connecting racks and used for mounting the sample, the connecting platform is provided with a light through hole, and the incident rays and the reflected rays of the sample irradiate through the light through hole; the bottom surface of the connecting platform comprises the light through hole and is connected to the sample placing surface of the infrared detector, and the height of the top surface of the connecting platform is higher than the heights of the connecting racks. The utility model provides the additional device which can measure the specular reflection ratio of various different sizes of samples.
Description
Technical field
The utility model relates to the sample installing mechanism, especially, relates to a kind of attachment device of specular reflectance of measuring samples.
Background technology
Infrared spectrometer is used very extensive at the spectral detection analysis field, because infrared spectrometer has bigger luminous flux, can gather spectroscopic data in real time, guarantees the authenticity and the reliability of data; Not only be suitable for the research and development of product, breadboard conventional analysis, and all having been widely used aspect the product quality monitorings such as chemical industry, medicine; Possess skills index height, scalability of infrared spectrometer is good, resolution height, advantage such as signal to noise ratio (S/N ratio) is good; In actual applications, be connected with various instruments such as infrared microscope, thermal weight loss, gas chromatography and improve the detection performance.
In addition, the infrared spectrum instrument also has analysis software and diffuse reflection, direct reflection, micro-example etc. at the interior infrared annex that is applicable to all kinds sample detection.
At present, the measurement annex that is used to measure the material sample specular reflectance of the prior art is when the infrared spectrometer that is connected detects, and the size of described measuring samples must meet the sample stage of described infrared spectrometer.
Prior art mid-infrared light spectrometer is as shown in Figure 1 measured the front elevation of direct reflection ratio device, as can be seen from the figure, in the middle of link 101, be provided with the sample stage 104 that comprises catoptron 103, sample setup face 105 is provided with light hole 106, light path incident light a1 as shown in the figure wear penetrate light hole 106 incide be positioned over the sample setup face 105 on sample 102, reflex on the catoptron 103, reflect via catoptron 103 and to arrive sample 102 surfaces once more, and then obtain reflection ray b1 and arrive detection instrument; Yet, the size of sample is limited between the link, need carry out the measurement of specular reflectance for some complete products, and when this product can not cut and block, can't carry out the analysis of specular reflectance to described product because the installing space of sample is limited, that is to say that the measurement annex of this measurement material sample specular reflectance has limited the scope of some measuring samples.
Thereby those skilled in the art press for and develop a kind of measurement annex that is attached to the sample that can measure various different sizes on the infrared radiation detection apparatus at present.
The utility model content
The utility model provides realizes on a kind of sample stage that is attached to infrared radiation detection apparatus that W shape light path is the light path of falling V, and can measure the attachment device of the specular reflectance of the big small sample of various differences.
For addressing the above problem, the utility model discloses a kind of attachment device of measuring samples, be used for infrared radiation detection apparatus, described infrared radiation detection apparatus is provided with the link that is used for fixing sample stage, wherein, incident ray is worn and is penetrated sample stage and shine sample on the sample setup face that is installed in described sample stage, it is characterized in that described attachment device comprises:
Being used between link installed the connection platform of sample, and this connection platform is provided with described incident ray and wears to penetrate with the reflection ray of described sample and wear the light hole of penetrating;
The bottom surface of described connection platform includes described light hole and is connected in the sample setup face of described infrared radiation detection apparatus, and the height of described connection countertop is higher than the height of described link.
Preferably, described light hole is conical, and the catoptron of described infrared radiation detection apparatus is the diameter less than the light hole of described connection platform bottom surface in the diameter projected of described sample setup face.
Preferably, described connection platform is the hollow rectangular parallelepiped.
Preferably, described light hole comprises:
Described infrared radiation detection apparatus incident ray is worn first light hole of the described connection platform bottom surface of penetrating;
Described infrared radiation detection apparatus receives second light hole of the described connection platform bottom surface of described sample reflection ray; And,
Described first light hole and described second light hole cross at described sample surfaces.
Compared with prior art, the utlity model has following advantage:
At first, the utility model increases the connection platform on the infrared radiation detection apparatus of prior art, making the light path of the specular reflectance of test sample move towards former inversed W-shape light path is the light path of falling V, and make the height that connects platform be higher than link by design, effectively realize measuring the specular reflectance of the big small sample of various differences, in addition, the utility model does not need sample is cut, simple and convenient, further reduced requirement to the size of sample, improved the sensing range of infrared radiation detection apparatus.
Description of drawings
Fig. 1 is the front elevation that prior art mid-infrared light spectrometer is measured the direct reflection ratio device;
Fig. 2 is the front elevation of the attachment device of measuring samples of the present invention;
Fig. 3 is the decomposing schematic representation of the attachment device embodiment 1 of measuring samples of the present invention;
Fig. 4 is the decomposing schematic representation of the attachment device embodiment 2 of measuring samples of the present invention.
Embodiment
The attachment device of the measuring samples that the utility model proposes is described as follows in conjunction with the accompanying drawings and embodiments.
Core idea of the present utility model is, on detector, increase the attachment device that connects platform, sample setup face that make to place sample is higher than link, and the inversed W-shape light path when making original measuring samples be the light path of falling V, and then the measurement of the sample of realization arbitrary dimension.
Embodiment 1
The front elevation of the attachment device of the measuring samples of the present invention that reference is shown in Figure 2; Be shown as the attachment device of the measuring samples that is used for infrared radiation detection apparatus among the figure;
Described infrared radiation detection apparatus is provided with the link 201 that is used for fixing sample stage, and wherein, incident ray a2 wears and penetrates sample stage 204 and shine on the sample setup face that is installed in described sample stage 204 202 sample 205,
Described attachment device comprises:
Being used between link 201 installed the connection platform 208 of sample, and this connection platform 208 is provided with the incident ray a2 incident of described infrared radiation detection apparatus and the reflection ray b2 of the described sample 205 of reception wears the light hole of penetrating 206;
The bottom surface of described connection platform 208 includes the sample setup face 202 that light hole 206 is connected in described infrared radiation detection apparatus, and the height of described connection platform 208 end faces is higher than the height of described link 201.
Wherein, sample setup face 202 tundish of described infrared radiation detection apparatus contain light hole 207, and be provided with catoptron 203 in the middle of the sample stage 204 of described infrared radiation detection apparatus, and this place is the device of infrared radiation detection apparatus measuring samples in the prior art, the utility model is not described in detail this;
Excite generation incident ray a2 when opening infrared radiation detection apparatus, this incident ray a2 wears the light hole 207 of penetrating sample setup face 202 and arrives the light hole 206 that connects platform 208, and then shine sample 205, reflection ray b2 via sample 205 reflections, wear the receiving trap of penetrating light hole 206 and light hole 207 arrival infrared radiation detection apparatus, and then can obtain specular reflectance.
The measuring process and the principle of described direct reflection are as follows:
At first, placing known reflectance is standard model sample position 205 places in Fig. 2 of ρ, measures signal S
ρ
Secondly, place unknown reflectance ρ
x Sample sample position 205 in Fig. 2 measure, obtain signal S
x
Moreover, calculated relationship ρ
x=ρ * S
x/ S
ρCan draw the reflectance of sample 205.
In the specific implementation process, described connection platform can be rectangular parallelepiped, simultaneously middle corresponding incident ray and reflection ray are worn the light hole of penetrating and can be conical light hole, this moment described infrared radiation detection apparatus catoptron in the diameter projected of described sample setup face the diameter less than the light hole of described connection platform bottom surface, thereby guarantee that described incident ray can shine on the sample, and the detection instrument of described infrared radiation detection apparatus can receive the reflection ray of sample.
Index path shown in Figure 1 in the contrast prior art, with index path of the present invention, as can be seen, present embodiment is the light path of falling V with the inversed W-shape light path of original optical path, and then can measure arbitrarily sample by increasing attachment device greater than the light hole shape, described sample can be cut, specular reflectance that just can well the measuring samples surface.
The decomposing schematic representation of the attachment device embodiment 2 of the measuring samples of the present invention that reference is shown in Figure 3, show sample stage 301 among this Fig. 3 and connected the schematic relationships that connects between the platform 308, by sunk screw with described screw 302 and screw 306 fixed-link, corresponding, sample stage 301 be connected platform 308 opposite sides and also can realize fixed-link, and guarantee that described connected mode is embedded connection; Incident ray a3 passes on the surface that light hole 305 shines sample 307, via the reflection ray b3 of sample 307 reflection not via catoptron 304, arrive on the detector of infrared radiation detection apparatus and directly pass light hole 303, realize measurement sample 307 specular reflectances.
The characteristics of present embodiment are, do not need sample is blocked, and additional connection platform and sample stage be for removably connecting, when needing the bigger sample of measurement size, with connect that platform is fixed and the sample stage of described infrared radiation detection apparatus on carry out the measurement of sample.
In actual applications, the described device that is used for the measuring samples specular reflectance can be connected arbitrarily can realize the light path of falling V, and incident ray is shone on the sample and reflection ray arrives the instrument of detector or measure the instrument of other spectral characteristic all passable, the utility model is not made particular restriction at this.
Embodiment 2
The decomposing schematic representation of the attachment device embodiment 2 of the measuring samples of the present invention that reference is shown in Figure 4; Present embodiment relates to a kind of device that can realize the relative measurement of spectrum specular reflectance, especially can be applied on the direct reflection annex of BRUKER Fourier infrared spectrograph, is used to measure the minute surface sample of various different sizes.
In concrete testing process, described connection platform 403 and sample stage 401 are by sunk screw or existing can fixing in a fixed manner, described connection platform 403 can be hollow rectangular parallelepiped or entity structure, simultaneously middle corresponding incident ray and reflection ray are worn the light hole of penetrating and can be conical light hole, and described light hole comprises:
Described infrared radiation detection apparatus incident ray a4 wears first light hole 405 of described connection platform 403 bottom surfaces of penetrating;
Described infrared radiation detection apparatus receives second light hole 406 of described connection platform 403 bottom surfaces of the reflection ray b4 of described sample 404 reflections; And,
Described first light hole 405 crosses at described sample surfaces with described second light hole 406.And the catoptron of described infrared radiation detection apparatus is equivalent to length m n between described first light hole 405 and second light hole 406 in the diameter projected of described sample setup face, and can guarantee that described incident ray a4 can shine on the sample, and the detection instrument of described infrared radiation detection apparatus can receive the reflection ray b4 of sample.
Excite generation incident ray a4 when opening infrared radiation detection apparatus, this incident ray a4 wears the light hole 402 of penetrating the sample setup face and arrives first light hole 405 that connects platform 403, and then shine sample 404, reflection ray b4 via sample 404 reflections, wear the receiving trap of penetrating second light hole 406 and light hole 402 arrival infrared radiation detection apparatus, analyzing of detection instrument by connecting microsystem, and then can obtain specular reflectance.
Certainly, in actual applications, described connection platform is the metal material preparation, also can be other material preparation, and the utility model does not limit this.
The same described simple mechanical mechanism that on the basis of original annex, increased of present embodiment, after the installation, become original inversed W-shape light path and be the light path of falling V, make and to measure any sample, reduced requirement to the size of sample, simple and convenient, improved the sensing range of infrared radiation detection apparatus.
Above embodiment only is used to illustrate the utility model; and be not to restriction of the present utility model; the those of ordinary skill in relevant technologies field; under the situation that does not break away from spirit and scope of the present utility model; can also make various variations and modification; therefore all technical schemes that are equal to also belong to category of the present utility model, and scope of patent protection of the present utility model should be defined by the claims.
Claims (4)
1, a kind of attachment device of measuring samples, be used for infrared radiation detection apparatus, described infrared radiation detection apparatus is provided with the link that is used for fixing sample stage, wherein, incident ray is worn and is penetrated sample stage and shine sample on the sample setup face that is installed in described sample stage, it is characterized in that described attachment device comprises:
Being used between link installed the connection platform of sample, and this connection platform is provided with described incident ray and wears to penetrate with the reflection ray of described sample and wear the light hole of penetrating;
The bottom surface of described connection platform includes described light hole and is connected in the sample setup face of described infrared radiation detection apparatus, and the height of described connection countertop is higher than the height of described link.
2, device as claimed in claim 1 is characterized in that, described light hole is conical, and the catoptron of described infrared radiation detection apparatus is the diameter less than the light hole of described connection platform bottom surface in the diameter projected of described sample setup face.
3, device as claimed in claim 1 is characterized in that, described connection platform is the hollow rectangular parallelepiped.
4, as claim 2 or 3 described devices, it is characterized in that described light hole comprises:
Described infrared radiation detection apparatus incident ray is worn first light hole of the described connection platform bottom surface of penetrating;
Described infrared radiation detection apparatus receives second light hole of the described connection platform bottom surface of described sample reflection ray; And,
Described first light hole and described second light hole cross at described sample surfaces.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200820124031 CN201311395Y (en) | 2008-11-28 | 2008-11-28 | Additional device for measuring sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200820124031 CN201311395Y (en) | 2008-11-28 | 2008-11-28 | Additional device for measuring sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201311395Y true CN201311395Y (en) | 2009-09-16 |
Family
ID=41108653
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200820124031 Expired - Fee Related CN201311395Y (en) | 2008-11-28 | 2008-11-28 | Additional device for measuring sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201311395Y (en) |
-
2008
- 2008-11-28 CN CN 200820124031 patent/CN201311395Y/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090916 Termination date: 20101128 |