CN201229567Y - Test module and test system - Google Patents
Test module and test system Download PDFInfo
- Publication number
- CN201229567Y CN201229567Y CNU2008201266553U CN200820126655U CN201229567Y CN 201229567 Y CN201229567 Y CN 201229567Y CN U2008201266553 U CNU2008201266553 U CN U2008201266553U CN 200820126655 U CN200820126655 U CN 200820126655U CN 201229567 Y CN201229567 Y CN 201229567Y
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- test
- interface
- power supply
- voltage regulator
- pure resistor
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Abstract
The utility model relates to a test module that is used for testing an external voltage adjuster. The test module includes a plurality of pure resistance load groups, a plurality of switches, a power-source test interface and a printing circuit board The switches are respectively coupled to the pure resistance load groups, and the power-source test interface is coupled to the external voltage adjuster and the switch, so as to adjust the electric energy of the external voltage adjuster to be the pure resistance load group. In addition, the pure resistance load groups, the switches and the power-source test interface can be arranged on the printing circuit board. On the other hand, a testing system that uses the test module is disclosed.
Description
Technical field
The utility model is relevant for a kind of test module and system, and particularly relevant for a kind of test module and system in order to the test voltage regulator.
Background technology
For detecting the power supply capacity of the voltage regulator of motherboard under various test environments, often all adopt the mode of operation of electronic load analog computer peripheral apparatus.For instance, set electronic load and switch between the different loads amount mode of operation with analog chip.
Yet even if electronic load is set in common-battery resistance (common resistor) pattern, electronic load still has capacitive reactance or induction reactance, and is wherein bigger to the influence of test macro with capacitive reactance especially.If have capacitive reactance in the test macro, when system transients, capacitive reactance will cause the generation of surging, make element breakdown.
In addition, the existence of capacitive reactance also causes interference to the integrated testability operation, and compared to the test macro that does not have capacitive reactance, the test macro with capacitive reactance may produce unusual test result, and the accuracy of test jobs is reduced.
In view of this, be necessary to design a kind of test module and system, it does not have any capacitive reactance composition, to improve the accuracy of test jobs.
The utility model content
Technical problem to be solved in the utility model is to provide a kind of test module on the one hand, and it can replace electronic load and carry out test jobs, so accuracy and the lifting research and development usefulness of capacitive reactance to improve test jobs in the elimination system substantially.
The utility model provides a kind of test macro on the other hand, and it can replace electronic load and carry out test jobs, adopts the capacitive reactance that electronic load caused so can eliminate, with accuracy and the lifting research and development usefulness that improves test jobs.
To achieve these goals, propose a kind of test module in the utility model one embodiment, it can be used for testing an external voltage regulator, and test module comprises: a plurality of pure resistor load groups, a plurality of switch, a power supply test interface and a printed circuit board (PCB).A plurality of switches are respectively coupled to the pure resistor load group.And the power supply test interface couples external voltage regulator and switch, in order to provide electric energy from external voltage regulator to the pure resistor load group.In addition, pure resistor load group, switch and power supply test interface are arranged on the printed circuit board (PCB).
To achieve these goals, propose a kind of test macro in another embodiment of the utility model, it comprises voltage regulator, slot configuration module and test module.The slot configuration module has a plurality of interface slots, and interface slot is electrically coupled to voltage regulator.
In addition, test module comprises a plurality of pure resistor load groups, a plurality of switch, power supply test interface and printed circuit board (PCB).Switch is respectively coupled to the pure resistor load group, and the power supply test interface can be plugged on the interface slot and be coupled to switch, providing to the pure resistor load group from the electric energy of voltage regulator.Above-mentioned pure resistor load group, switch and power supply test interface are arranged on the printed circuit board (PCB).
As shown in the above description, the utility model replaces electronic load by adopting the pure resistor load group, thus can suppress switching on and shutting down effectively the time produce capacitive reactance and the surging that causes to avoid taking place the breakdown situation of electronic component.Therefore, test module of the present utility model and test macro can be more stably and are carried out the test jobs of voltage regulator more accurately.
Description of drawings
For above-mentioned and other purpose of the present utility model, feature, advantage and embodiment can be become apparent, being described in detail as follows of appended accompanying drawing:
Fig. 1 is a kind of synoptic diagram according to the test macro of the utility model one preferred embodiment;
Fig. 2 is a kind of functional block diagram according to the slot configuration module of the test macro of the utility model one preferred embodiment.
[primary clustering symbol description]
100: test macro
110: voltage regulator
120: the slot configuration module
121: interface slot
130: test module
131: the pure resistor load group
133: switch
135: the power supply test interface
135a: conducting terminal
137: printed circuit board (PCB)
139: the dismounting handle
Embodiment
Fig. 1 shows a kind of synoptic diagram according to the test macro of the utility model one embodiment.As shown in the figure, test macro 100 comprises: voltage regulator 110, slot configuration module 120 and test module 130.Voltage regulator 110 can be arranged on the motherboard (not shown), and slot configuration module 120 is positioned at 130 of voltage regulator 110 and test modules, so as transmission from the electric energy of voltage regulator 110 to test module 130.
In the present embodiment, can be by the power supply capacity of test module 130 test voltage regulators 110.Test module 130 comprises: a plurality of pure resistor load groups 131, a plurality of switch 133, power supply test interface 135 and printed circuit board (PCB) 137.Switch 133 is respectively coupled to pure resistor load group 131, and power supply test interface 135 couples voltage regulator 110 and switch 133 to provide electric energy from voltage regulator 110 to pure resistor load group 131.And pure resistor load group 131, switch 133 are arranged on the printed circuit board (PCB) 137 with power supply test interface 135.
For test module 130, voltage regulator 110 is arranged on its outside, and just, test module 130 can be simulated the actual negative carrying capacity and be consumed situation, and the function of voltage supply so itself is not provided.
Though the shown test module 130 of present embodiment comprises six switches and 14 pure resistor load groups, and each switch can be electrically connected at two or above pure resistor load group, yet the utility model is not limited thereto.The utility model the technical staff in the technical field can dispose the switch and the pure resistor load group of various numbers according to different testing requirements on test module 130, so that simulation actual negative carrying capacity consumes situation.
When test jobs carried out, voltage regulator 110 was sent electric energy to pure resistor load group 131 via slot configuration module 120 and power supply test interface 135, so that the power supply capacity of test voltage regulator 110 effectively and exactly.
Adopt pure resistor load group 131 to carry out test jobs in this embodiment, thus in the test macro 100 with unlikely generation capacitive reactance.Therefore, when the moment of mainboard starting or shutdown, the surging that the reason capacitive reactance did not cause and make electronic component breakdown, and successfully finished test jobs.
In addition, test module 130 also comprises a plurality of conducting terminal 135a, is positioned on this power supply test interface 135.When test jobs carries out, can transmit electric energy via described conducting terminal 135a.
The tester can see through computing machine and suitable wiring figure is set on printed circuit board (PCB) 137, and cooperates the configuration of conducting terminal 135a, and designs suitable test module 130 to satisfy different testing requirements.
Because golden finger has that function is many, beautiful interface and the fast advantage of transmission speed, so in this embodiment, the embodiment of conducting terminal 135a is golden finger.
In addition, in this embodiment, switch 133 can be hand switch.So in test jobs carried out preceding or carries out, the tester can manually allot switch 133 and the charge capacity of adjusting test module.Thus, can improve the convenience of regulating load amount.
The PCI-E interface has characteristics such as high-speed transfer and high frequency range, so widely sound card, network card, transmission interface expansion board or TV card etc. adopt.Power supply test interface 135 can be a PCI-E interface, consumes situation so that simulate the actual negative carrying capacity of described Peripheral Interface card.Therefore, the accuracy of adopting the PCI-E interface can improve test jobs.
Yet power supply test interface 135 also can be a PCI-X interface, and the actual negative carrying capacity that can simulate described Peripheral Interface card equally consumes situation, and the accuracy that can improve test jobs.
For the actual negative carrying capacity that makes test module 130 can simulate described Peripheral Interface card more accurately consumes situation, the size of test module 130 and PCI-E interface card or PCI-X interface card measure-alike is improved the accuracy of test jobs.
In the present embodiment, test module 130 also comprises a dismounting handle 139, is arranged on the side of this printed circuit board (PCB) 137 with respect to this power supply test interface 135.The tester can carry out hot plug to test module 130 by dismounting handle 139, improves the convenience and the efficient of test jobs.
In addition, in order further to promote testing efficiency, test macro 100 can be tested a plurality of test modules 130 simultaneously.
Fig. 2 shows a kind of functional block diagram according to the slot configuration module of the test macro of the utility model one embodiment.As shown in Figure 2, slot configuration module 120 can have a plurality of interface slots 121, so that simultaneously a plurality of test modules 130 are plugged in the described interface slot 121.Slot configuration module 120 visual different testing requirements and being configured in the diverse location of motherboard, for instance, the position of the configurable Peripheral Interface cards that test module 130 is simulated on contiguous motherboard of slot configuration module 120 is in order to dispel the heat test and help to assess exactly the integral heat sink state of motherboard of tester.
By above-mentioned the utility model embodiment as can be known, the utility model replaces electronic load by adopting the pure resistor load group, so the surging that causes because of capacitive reactance can suppress system transients effectively the time is to avoid taking place the breakdown situation of electronic component.Therefore, test module of the present utility model and test macro can be more stably and the power supply capacity of test voltage regulator more accurately.
Certainly; the utility model also can have other various embodiments; under the situation that does not deviate from the utility model spirit and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the utility model, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the utility model.
Claims (10)
1, a kind of test module is characterized in that, in order to test an external voltage regulator, this test module comprises:
A plurality of pure resistor load groups;
A plurality of switches are respectively coupled to described a plurality of pure resistor load group;
One power supply test interface couples this external voltage regulator and described a plurality of switch, in order to provide from the electric energy of this external voltage regulator to described a plurality of pure resistor load groups; And
One printed circuit board (PCB), described a plurality of pure resistor load groups, described a plurality of switches and this power supply test interface is disposed thereon.
2, test module according to claim 1 is characterized in that, also comprises a plurality of conducting terminals, is positioned on this power supply test interface.
3, test module according to claim 2 is characterized in that, each described conducting terminal is respectively a golden finger.
4, test module according to claim 1 is characterized in that, this power supply test interface is a pci interface.
5, test module according to claim 1 is characterized in that, also comprises a dismounting handle, is arranged on the side of this printed circuit board (PCB) with respect to this power supply test interface.
6, a kind of test macro is characterized in that, comprising:
One voltage regulator;
At least one interface slot is electrically coupled to this voltage regulator; And
One test module comprises:
A plurality of pure resistor load groups;
A plurality of switches are respectively coupled to described pure resistor load group;
One power supply test interface is plugged in this interface slot and couples described a plurality of switch, in order to provide electric energy from this voltage regulator to described a plurality of pure resistor load groups; And
One printed circuit board (PCB), described a plurality of pure resistor load groups, described a plurality of switches and this power supply test interface is disposed thereon.
7, test macro according to claim 6 is characterized in that, also comprises a plurality of conducting terminals, is positioned on this power supply test interface.
8, test macro according to claim 7 is characterized in that, each described conducting terminal is respectively a golden finger.
9, test macro according to claim 6 is characterized in that, this power supply test interface is a pci interface.
10, test macro according to claim 6 is characterized in that, also comprises a dismounting handle, is arranged on the side of this printed circuit board (PCB) with respect to this power supply test interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201266553U CN201229567Y (en) | 2008-07-08 | 2008-07-08 | Test module and test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201266553U CN201229567Y (en) | 2008-07-08 | 2008-07-08 | Test module and test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201229567Y true CN201229567Y (en) | 2009-04-29 |
Family
ID=40634512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008201266553U Expired - Fee Related CN201229567Y (en) | 2008-07-08 | 2008-07-08 | Test module and test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201229567Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102706386A (en) * | 2012-05-23 | 2012-10-03 | 烽火通信科技股份有限公司 | Single disc used for simulating heat consumption of IC (integrated circuit) chip |
| CN103175704A (en) * | 2011-12-20 | 2013-06-26 | 鸿富锦精密工业(武汉)有限公司 | Test system and test method for electronic device |
| CN103175704B (en) * | 2011-12-20 | 2016-12-14 | 爱珂勒电子元器件（珠海）有限公司 | Electronic device test system |
| CN107615076A (en) * | 2015-12-28 | 2018-01-19 | 深圳配天智能技术研究院有限公司 | Multi-channel interface test device |
-
2008
- 2008-07-08 CN CNU2008201266553U patent/CN201229567Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103175704A (en) * | 2011-12-20 | 2013-06-26 | 鸿富锦精密工业(武汉)有限公司 | Test system and test method for electronic device |
| CN103175704B (en) * | 2011-12-20 | 2016-12-14 | 爱珂勒电子元器件（珠海）有限公司 | Electronic device test system |
| CN102706386A (en) * | 2012-05-23 | 2012-10-03 | 烽火通信科技股份有限公司 | Single disc used for simulating heat consumption of IC (integrated circuit) chip |
| CN107615076A (en) * | 2015-12-28 | 2018-01-19 | 深圳配天智能技术研究院有限公司 | Multi-channel interface test device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090429 Termination date: 20120708 |