CN201225969Y - Transmission electric mirror sample chemical thinning clamper - Google Patents
Transmission electric mirror sample chemical thinning clamper Download PDFInfo
- Publication number
- CN201225969Y CN201225969Y CNU2008201087604U CN200820108760U CN201225969Y CN 201225969 Y CN201225969 Y CN 201225969Y CN U2008201087604 U CNU2008201087604 U CN U2008201087604U CN 200820108760 U CN200820108760 U CN 200820108760U CN 201225969 Y CN201225969 Y CN 201225969Y
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- sample
- cutting ferrule
- seal
- electron microscope
- transmission electron
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Abstract
The utility model discloses a chemical thinning clamp of a transmission electron microscope sample which belongs to the technical field of experimental facilities and relates to a tool for manufacturing the sample of the transmission electron microscope. The chemical thinning clamp includes an acid-resistance upper cutting ferrule, a lower cutting ferrule, seal rings and a corrosion-resistance bolt. The transmission electron microscope sample is arranged between the two cutting ferrules; the seal rings at the two surfaces of the sample are closely stuck on the surfaces of the sample through the clamping effect of the cutting ferrules, thus playing the role of seal, avoiding heterogeneous corrosion thinning generated by that a thinning liquid flows to the edge of the sample and realizing the uniform thinning of the transmission electron microscope sample.
Description
Technical field
The invention belongs to the experimental facilities technical field, relate to the instrument of transmission electron microscope sample preparation, the use of this instrument helps preparing the undamaged tem sample of high-quality, thereby obtains real microstructure.
Background technology
The invention of electron microscope is brought up to nanometer scale with resolving power, also microscopical function is expanded to by single morphology observation simultaneously to integrate morphology observation, crystal structure, constituent analysis etc.From then on the ability of human knowledge's microworld has had significant progress.
Expect good TEM result, the film sample that will prepare at first, the TEM specimen preparation plays important effect in electron micrology research.The sample for use in transmitted electron microscope preparation requires: (1) must be transparent to electron beam for the sample of tem analysis, and the thickness of sample viewing area is advisable to be controlled at about 100～200nm usually.(2) prepared sample also must be representative with true some feature that reflects institute's analysis of material.Therefore, can not influence these features during specimen preparation, mode and the degree that then must know influence as exerting an influence.
The preparation film sample divides four steps: (a) sample is thinly sliced (thickness～500 μ m); (b) pre-attenuate with muller mill (or using sand paper), can be milled to below the 100 μ m; (c) cut into the disk of φ 3mm; (d) whole attenuate adopts the electropolishing attenuate more, and this method speed is fast, does not have mechanical damage.
In above-mentioned film sample preparation process, the method regular meeting of line cutting and mechanical lapping produces thicker mechanical damage layer, influences the microstructure of film, and for obtaining the film sample of not damaged layer, pre-attenuate also can adopt the mode of chemical reduction.During chemical reduction, because the corner of sample is the position of chemical reduction liquid preferential attack, occur inhomogeneous thinning phenomenon easily in thinning process, sample also is not thinned to suitable thickness even, and what sample had been etched has remained little.In order to guarantee the even attenuate of sample thin slice, usually acid-resistant paint is taked to be coated with in the sample corner, but effect not too desirable, and inconvenient operation.
Summary of the invention
In order to overcome the deficiency of existing chemical reduction, the utility model provides a kind of corner seal protection reliable, easy to operate transmission electron microscope sample chemical reduction anchor clamps.
The utility model is a principle of utilizing the rubber seal sealing, realizes the protection of transmission electron microscope thin slice sample edge, makes it not corroded by chemical reduction liquid, thereby realizes the uniform corrosion attenuate of sample thin slice inside.
A kind of transmission electron microscope sample chemical reduction anchor clamps comprise acidproof following cutting ferrule 1, go up cutting ferrule 2 and rubber seal 4,5,6, and employed screw 3 under the jig transformation pattern.The concrete structure characteristics are: on be covered with a seal groove, following cutting ferrule respectively has the seal groove of a different size up and down.Last cutting ferrule seal groove size is measure-alike with the lower seal groove of following cutting ferrule.Upper and lower cutting ferrule is connected by screw.Treat that chemical reduction thin slice sample is placed between the unidimensional upper and lower cutting ferrule O-ring seal, the seal sample edge by the connection of upper and lower cutting ferrule prevents that chemical reduction liquid from corroding the sample periphery.
The utility model provides a kind of corner seal protection reliable, easy to operate transmission electron microscope sample chemical reduction anchor clamps; make chemical reduction liquid only corrode the sample of cutting ferrule center exposure portion; avoided the erosion of reducer to the sample edge; so just realized protection to the sample edge; realize the even attenuate of sample for use in transmitted electron microscope, obtained undamaged tem sample.
Description of drawings
Accompanying drawing is the utility model cut-open view.
Embodiment
Acidproof O-ring seal 4 and 5 is put into down respectively in the seal groove of cutting ferrule 1 correspondence, to treat that then attenuate sample thin slice 7 lies on the O-ring seal 5, guarantee to push down sample 7 with the last cutting ferrule that has O-ring seal 6 after sample is placed steadily, connect with screw 3 at last, upper and lower cutting ferrule tightly is fixed together, and to guarantee O-ring seal 5 and 6 with the sealing of sample edge, O-ring seal 4 is with the joint face sealing of two cutting ferrules simultaneously, prevent that chemical reduction liquid from entering from the cutting ferrule joint face, corrosion sample periphery.
Claims (1)
1, a kind of transmission electron microscope sample chemical reduction anchor clamps, its feature comprise employed screw (3) under acidproof last cutting ferrule (2), following cutting ferrule (1) and rubber seal (4), (5), (6) and the jig transformation pattern; On be covered with a seal groove, following cutting ferrule respectively has the seal groove of a different size up and down, last cutting ferrule seal groove size is measure-alike with the lower seal groove of following cutting ferrule, upper and lower cutting ferrule is connected by screw (3), treat that chemical reduction thin slice sample (7) is placed between the unidimensional upper and lower cutting ferrule O-ring seal, the seal sample edge by the connection of upper and lower cutting ferrule prevents that chemical reduction liquid from corroding the sample periphery.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201087604U CN201225969Y (en) | 2008-06-20 | 2008-06-20 | Transmission electric mirror sample chemical thinning clamper |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201087604U CN201225969Y (en) | 2008-06-20 | 2008-06-20 | Transmission electric mirror sample chemical thinning clamper |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201225969Y true CN201225969Y (en) | 2009-04-22 |
Family
ID=40598864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008201087604U Expired - Fee Related CN201225969Y (en) | 2008-06-20 | 2008-06-20 | Transmission electric mirror sample chemical thinning clamper |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201225969Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103033403A (en) * | 2011-09-29 | 2013-04-10 | 鞍钢股份有限公司 | Preparation method of sheet metal film sample |
| CN109015157A (en) * | 2018-05-30 | 2018-12-18 | 扬州大学 | For the pre- thinning device of metal sample and the pre- thining method of metal sample |
-
2008
- 2008-06-20 CN CNU2008201087604U patent/CN201225969Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103033403A (en) * | 2011-09-29 | 2013-04-10 | 鞍钢股份有限公司 | Preparation method of sheet metal film sample |
| CN103033403B (en) * | 2011-09-29 | 2015-09-02 | 鞍钢股份有限公司 | Preparation method of sheet metal film sample |
| CN109015157A (en) * | 2018-05-30 | 2018-12-18 | 扬州大学 | For the pre- thinning device of metal sample and the pre- thining method of metal sample |
| CN109015157B (en) * | 2018-05-30 | 2020-04-10 | 扬州大学 | Pre-thinning device for metal sample and pre-thinning method for metal sample |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090422 Termination date: 20120620 |