CN201090975Y - 热电偶温度测量装置 - Google Patents
热电偶温度测量装置 Download PDFInfo
- Publication number
- CN201090975Y CN201090975Y CNU2006200493457U CN200620049345U CN201090975Y CN 201090975 Y CN201090975 Y CN 201090975Y CN U2006200493457 U CNU2006200493457 U CN U2006200493457U CN 200620049345 U CN200620049345 U CN 200620049345U CN 201090975 Y CN201090975 Y CN 201090975Y
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- Prior art keywords
- quartz socket
- socket tube
- tube
- temperature sensor
- measurement mechanism
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
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Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNU2006200493457U CN201090975Y (zh) | 2006-12-21 | 2006-12-21 | 热电偶温度测量装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNU2006200493457U CN201090975Y (zh) | 2006-12-21 | 2006-12-21 | 热电偶温度测量装置 |
Publications (1)
Publication Number | Publication Date |
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CN201090975Y true CN201090975Y (zh) | 2008-07-23 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CNU2006200493457U Expired - Lifetime CN201090975Y (zh) | 2006-12-21 | 2006-12-21 | 热电偶温度测量装置 |
Country Status (1)
Country | Link |
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CN (1) | CN201090975Y (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105874308A (zh) * | 2014-01-06 | 2016-08-17 | 株式会社神户制钢所 | 劣化检测装置以及热电偶检查装置 |
CN104755916B (zh) * | 2012-11-15 | 2016-12-28 | 株式会社神户制钢所 | 保护管劣化感测装置及该方法 |
-
2006
- 2006-12-21 CN CNU2006200493457U patent/CN201090975Y/zh not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104755916B (zh) * | 2012-11-15 | 2016-12-28 | 株式会社神户制钢所 | 保护管劣化感测装置及该方法 |
CN105874308A (zh) * | 2014-01-06 | 2016-08-17 | 株式会社神户制钢所 | 劣化检测装置以及热电偶检查装置 |
CN105874308B (zh) * | 2014-01-06 | 2018-09-25 | 株式会社神户制钢所 | 劣化检测装置以及热电偶检查装置 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130123 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
|
TR01 | Transfer of patent right |
Effective date of registration: 20130123 Address after: 100176 No. 18, Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corporation Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
|
CX01 | Expiry of patent term |
Granted publication date: 20080723 |
|
EXPY | Termination of patent right or utility model |