CN201054735Y - A mobile phone single board testing device - Google Patents
A mobile phone single board testing device Download PDFInfo
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- CN201054735Y CN201054735Y CNU2007201493105U CN200720149310U CN201054735Y CN 201054735 Y CN201054735 Y CN 201054735Y CN U2007201493105 U CNU2007201493105 U CN U2007201493105U CN 200720149310 U CN200720149310 U CN 200720149310U CN 201054735 Y CN201054735 Y CN 201054735Y
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Abstract
A single board testing device for a cellphone comprises a digital-analog I/O card used for acquisition, conversion and output of the multi-channel analog/digital signal and an adapter panel comprising a high-speed programmable logic device used for testing the digital signal of the cellphone, a first connector, a second connector and a cellphone element testing control circuit; wherein, the high-speed programmable logic device is respectively connected to the first connector, the second connector and the cellphone element testing control circuit, and the cellphone element testing control circuit is connected to the first connector and the second connector or connected to the first connector; the first connector is connected to the second connector and the digital-analog I/O card is connected with the second connector; the first connector is connected with a cellphone mainboard to be tested. The device can have larger test range and can be applicable for testing the mainboard in the production of the cellphones portably, thereby lowering the themorbidity rate.
Description
Technical field
The utility model relates to a kind of test device for mobile phone, particularly a kind of automatic test device examination of handset single-plate electrical property.
Background technology
Along with the raising of people's living standard, mobile phone is popularized gradually.On the market, numerous mobile phone vendor commercial city expands sales volume exhausting one's ability, and improves income, and is increasingly competitive.
Improving the mobile phone quality is that pendulum is in numerous mobile phone production firms major issue in front.Usually, in the mobile phone production process, the mobile phone quality is manual the inspection after complete machine is dressed up in the rear end, thereby problems such as artificial disturbance is bigger, test is not comprehensive occur through regular meeting.In order to address these problems, also exist in veneer stage employing automation means in the prior art and carry out the situation of veneer electric performance test, but these technology majorities all are to use programmable digital table and relay to test, and its test specification is very limited, mainly have following problem:
(1) only is suitable for detecting the analog DC signal, can't detects the signal of variations such as audio signal.
(2) can't send test massage to cell phone mainboard, thereby can not test signals such as button.
(3) can not test high-speed digital signal, as the LCM bus signals.
Owing to above reason, a kind of test device for mobile phone that can have big test specification of exigence on the market.
The utility model content
Technical problem to be solved in the utility model is the handset single-plate electric performance test device that proposes a kind of automation, and this device can have bigger test specification, can carry out the mainboard test easily in mobile phone production, and then reduces fraction defective.
To achieve these goals, the utility model provides a kind of handset single-plate testing apparatus, it is characterized in that, comprising:
One digital-to-analogue input/output cards is used for collection, conversion and the output of multichannel analog/digital signal;
One keyset comprises that one is used for high-speed programmable logical device, one first connector, one second connector and the mobile phone element test control circuit of testing mobile phone digital signal;
Wherein, this high-speed programmable logical device is connected to this first connector, this second connector and this mobile phone element test control circuit respectively, this mobile phone element test control circuit is connected to this first connector and this second connector or is connected to this first connector, this first connector is connected to this second connector, this digital-to-analogue input/output cards is connected with this second connector, and this first connector connects cell phone mainboard to be measured.
Above-mentioned a kind of handset single-plate testing apparatus, it is characterized in that, this mobile phone element test control circuit comprises again: earphone test circuit, mobile phone power-on control circuit, SIM card (the Subscriber Identity Module that is connected with this first connector with this high-speed programmable logical device respectively, user identification module) on-off control circuit and/or keyboard back light drive and measuring circuit, wherein, this keyboard back light drives with measuring circuit and also is connected to this second connector.
Above-mentioned a kind of handset single-plate testing apparatus is characterized in that, also is connected with a MIC level-conversion circuit between this first connector and this second connector.
Above-mentioned a kind of handset single-plate testing apparatus, it is characterized in that this high-speed programmable logical device comprises: a processor, a keyboard drive module that is connected with this processor respectively, a LCDs module bus test module and a mobile phone element test control module.
Above-mentioned a kind of handset single-plate testing apparatus, it is characterized in that, this mobile phone element test control module comprises again: earphone test module, mobile phone power-on control module, SIM card break-make control module and/or keyboard back light drive and measurement module, and correspondence is connected to this earphone test circuit, mobile phone power-on control circuit, SIM card on-off control circuit and/or keyboard back light driving and measuring circuit respectively.
Above-mentioned a kind of handset single-plate testing apparatus, it is characterized in that, also comprise a JTAG circuit, be connected to this a high-speed programmable logical device and a downloader according to the IEEE1149.1 agreement, wherein, the JTAG chip in this JTAG circuit is connected with this high-speed programmable logical device.
Above-mentioned a kind of handset single-plate testing apparatus is characterized in that, also comprises a power supply, is connected to this keyset.
Above-mentioned a kind of handset single-plate testing apparatus is characterized in that this earphone test circuit comprises one first resistance, and the test point of the earphone MIC of this earphone test circuit is connected to this high-speed programmable logical device through this first resistance.
Above-mentioned a kind of handset single-plate testing apparatus is characterized in that, this mobile phone power-on control circuit comprises a chip that is connected with the start key of tested mobile phone; This SIM card on-off control circuit comprises the chip that is connected with the SIM card of a tested mobile phone; This keyboard back light drive circuit comprises the chip that is connected to the keyboard back light power supply of tested mobile phone by resistance.
Above-mentioned a kind of handset single-plate testing apparatus, it is characterized in that, this keyboard back light measuring circuit comprises: a NPN type triode and a plurality of resistance, the base stage of this triode is connected to this high-speed programmable logical device by a resistance, the collector electrode of this triode is connected to the cell phone keyboard backlight electric power of tested mobile phone, and the emitter of this triode is connected to the measurement point backlight of this tested mobile phone and passes through another grounding through resistance.
Adopt the handset single-plate testing apparatus of such scheme, can realize the electric property of cell phone mainboard is tested, because the keyset acp chip is CPLD (Complex Programmable Logic Device, CPLD), it is a kind of programmable logic device of high speed, program just is solidificated in device inside after downloading, so do not need special storage chip to deposit program.Wherein, the program download is to download line by JTAG (Joint Test Action Group, JTAG) to finish.The chip internal logic is finished keyboard drive, LCM (Liquid Crystal Display Module, liquid crystal display panel module) bus test and to the control of peripheral circuit.
Wherein, this headset detection circuit can be simulated artificial insertion earphone and be simulated the situation of manually pressing the earphone key.This start control circuit can be simulated the situation of artificial button start, the control mobile phone power-on.This SIM card on-off control circuit can be simulated the situation of artificial plug SIM card, also can be used for the test of other compatible mobile phone card, as also can be used for CDMA (Code Division Multiple Access, code division multiple access) UIM of standard mobile phone (User Identify Module, subscriber identification module) card, (the 3 for PHS (Personal HandyPhone System, personal hand held phone system, i.e. Personal Handyphone System) standard mobile phone card and 3G
RdGeneration, the 3rd generation) UICC (Universal Subscriber Identity Module, common user identification module) of standard mobile phone card etc.This keyboard back light drives and measuring circuit can be measured cell phone keyboard operating current backlight.
The utility model can bring following beneficial effect:
(1) the utility model uses digital-to-analogue IO card to finish data analysis and transmit control signal, the test of carrying out the cell phone mainboard electric property that can automation.
(2) the utility model uses the high-speed programmable logical device to come the control main board test, can adapt to the situation of present mobile phone high speed LCM bus.
(3) integrated multiple test function on the utility model keyset can detect a plurality of parts of mobile phone, comprises keyboard, backlight, audio frequency, LCM, SIM card etc.Basically covered the test of the mobile phone circuit function directly related with the cellphone subscriber.
Below in conjunction with the drawings and specific embodiments the utility model is described in detail, but not as to qualification of the present utility model.
Description of drawings
Fig. 1 is the structural representation of the utility model handset single-plate electric performance test device.
Fig. 2 be high speed logic device inside function of the present utility model and with the annexation schematic diagram of peripheral circuits.
Fig. 3 is high-speed programmable logical device of the present utility model and earphone test circuit figure.
Fig. 4 is a keyboard back light drive circuit of the present utility model.
Fig. 5 is a keyboard back light current measurement circuit of the present utility model.
Fig. 6 is a start control circuit of the present utility model.
Fig. 7 is a SIM card on-off control circuit of the present utility model.
Fig. 8 is a MIC level-conversion circuit of the present utility model.
Fig. 9 is a jtag circuit of the present utility model.
Wherein, Reference numeral:
1-digital-to-analogue IO card
The 2-keyset
21-high-speed programmable logical device
210-mobile phone element test control module
The 211-test module of starting shooting
212-SIM card test module
213-keyboard back light module
214-earphone test module
215-keyboard drive module
216-bus test module
The 217-processor
22-mobile phone element test control circuit
221-earphone test circuit
222-mobile phone power-on control circuit
The 223-SIM cartoon control circuit that breaks
The 224-keyboard back light drives and measuring circuit
The 23-MIC level-conversion circuit
24-first connector
25-second connector
Embodiment
As shown in Figure 1, handset single-plate electric performance test device of the present utility model comprises digital-to-analogue IO card 1 and keyset 2.The model of this digital-to-analogue IO card 1 is DAQ2206, supports the multichannel collecting analog signal, supports to send analog signal by the digital-to-analogue conversion mode, and comprises the multichannel digital signal input and output.This keyset 2 comprises high-speed programmable logical device 21, mobile phone element test control circuit 22, MIC level-conversion circuit 23, be used to second connector 25 that connects first connector 24 of cell phone mainboard and keyset circuit and be used to be connected numeral/Simulation with I O card and keyset circuit.Wherein, this mobile phone element test control circuit 22 comprises that again earphone test circuit 221, mobile phone power-on control circuit 222, SIM card on-off control circuit 223 and keyboard back light drive and measuring circuit 224.
This digital-to-analogue IO card 1 is general to be installed on computers, and finishes control and data analysis to this digital-to-analogue IO card 1 by software supporting on the computer.
This high-speed programmable logical device 21 is CPLD (CPLD), and model is EPM7128, its inside function and with the annexation of peripheral circuits as shown in Figure 2, its pinouts is as shown in Figure 3.As can be seen from Figure 2, these high-speed programmable logical device 21 inside have been divided into a plurality of parts according to logic function, comprise a mobile phone element test control module 210, keyboard drive module 215, liquid crystal display panel module (LCM) bus test module 216 and processor 217.Wherein, this mobile phone element test control module 210 comprises start test module 211, SIM card test module 212, keyboard back light module 213 and earphone test module 214.Wherein, earphone test circuit 221, keyboard back light driving and measuring circuit 224, mobile phone power-on control circuit 222 and SIM card on-off control circuit 223 are connected respectively to the corresponding module of this high-speed programmable logical device 21, and are controlled by this high-speed programmable logical device 21.
Keyboard back light drives and measuring circuit 25 is divided into keyboard back light drive circuit and keyboard back light measuring circuit, and this keyboard back light drive circuit mainly is made of chip SI6562DQ and peripheral resistance as shown in Figure 4.The D1 end of this chip SI6562DQ is connected to a voltage source by one first resistance and is connected to the G2 end of this chip SI6562DQ by one second resistance, the S1A end of this chip SI6562DQ and S1B end ground connection, the G1 end of this chip SI6562DQ is connected to the KEYBKLIGHT_PWREN end of this high-speed programmable logical device 21 and passes through one the 4th grounding through resistance by one the 3rd resistance, the D2 of this chip SI6562DQ holds the keyboard back light power supply that is connected to tested mobile phone by one the 5th resistance, and S2A end and the S2B end of this chip SI6562DQ are connected to a voltage source.This chip SI6562DQ inner integrated a PMOS and a nmos pass transistor.When KEYBKLIGHT_PWREN level during by low uprising, PMOS conducting ,+5v level is sent on the TP_KEYBKLIGHT_PWR, as the power supply of keyboard back light.
This keyboard back light measuring circuit, as shown in Figure 5, comprise a NPN type triode and two resistance, the base stage of this triode is connected to the KEYBKLIGHTON end of this high-speed programmable logical device 21 by a resistance, the collector electrode of this triode is connected to the cell phone keyboard backlight electric power of tested mobile phone, and the emitter of this triode is connected to the measurement point backlight of this tested mobile phone and is connected to earth signal by another resistance.The cell phone keyboard back facet current will flow into this circuit from TP_KEYBKLIGHT.When KEYBKLIGHTON level during by high step-down, triode conducting, the electric current on the emitter resistance equates substantially with the keyboard back light electric current, thereby the AD_KEYBKLIGHT point occurs and the linear voltage of keyboard back light size of current, makes things convenient for this digital-to-analogue IO card 1 to gather.Thereby, realized test to the keyboard back light electric current.
Mobile phone power-on control circuit 23, as shown in Figure 6, mainly by chip ADG719BRT and on every side resistance form.The IN end of this chip ADG719BRT is connected to the PWRON end of this high-speed programmable logical device 21 and passes through another grounding through resistance by a resistance, the VOO end of this chip ADG719BRT is connected to a voltage source, the GND end of this chip ADG719BRT and D end ground connection, the S1 end of this chip ADG719BRT is connected to the start key of tested mobile phone.This chip ADG719BRT is an analog switch.When PWRON was high level, TP_PWRON was unsettled; When PWRON was low level, TP_PWRON was connected to ground level.TP_PWRON directly links to each other with the mobile phone power-on key, when TP_PWRON is low level, and can be so that mobile phone power-on.
SIM card on-off control circuit 24, as shown in Figure 7, circuit principle of compositionality and mobile phone power-on control circuit are similar, comprise chip ADG719BRT and two resistance, the IN end of this chip ADG719BRT is connected to the SIMON end of this high-speed programmable logical device and passes through another grounding through resistance by a resistance, the VOO end of this chip ADG719BRT is connected to a voltage source, the GND of this chip ADG719BRT and D end ground connection, the S1 end of this chip ADG719BRT is connected to the TP_SIMON of tested SIM cards of mobile phones.When SIMON was high level, TP_SIMON was unsettled, and the SIM card power supply is cut off, and SIM card can not be worked.When the SIMON level was low level, TP_SIMON was connected to ground level, the SIM card power connection, thus make the SIM can operate as normal.
MIC level-conversion circuit 26 as shown in Figure 8, mainly is made up of chip MAX492ESA and peripheral components such as resistance, electric capacity.The OUT1 of this chip MAX492ESA end is after through one first electric capacity, be connected to mobile phone master MIC test point and be connected to an earth signal by one first resistance, the IN1N of this chip MAX492ESA end is connected to from the DA_MICMAIN signal of second connector by one second resistance and is connected to the OUT1 end of this chip MAX492ESA by one the 3rd resistance, the IN1P end of this chip MAX492ESA is connected to a voltage source and is connected to earth signal by one the 5th resistance by one the 4th resistance, the VEE end of this chip MAX492ESA is connected to earth signal, the VCC of this chip MAX492ESA end is connected to a voltage source by one first inductance and second electric capacity and the 3rd electric capacity by a parallel connection are connected to earth signal, the OUT2 of this chip MAX492ESA end is after through one the 4th electric capacity, be connected to earphone MIC test point and be connected to earth signal by one the 6th resistance, the IN2N of this chip MAX492ESA end by one the 7th resistance be connected to this chip MAX492ESA the OUT2 end and by one the 8th resistance be connected to from second connector the DA_MICEAR signal, the IN2P of this chip MAX492ESA is connected to a voltage source by one the 9th resistance, and after through 1 the tenth resistance, be connected to earth signal and by one second inductance ground connection.Inner integrated two operational amplifiers of this chip MAX492ESA with peripheral circuit, have constituted the two cover circuit that the level of mobile phone master MIC and earphone MIC test signal carried out conversion.Every cover circuit has all comprised 50 times of attenuation functions, and a DC component simultaneously also superposes.Test signal is connected to mobile phone master MIC test point and earphone MIC test point through after handling like this, just can well simulate the process that sends voice signal in the communication process to mobile phone MIC.Mobile phone test software is opened after the audio loop, and test signal can be sent from receiver, by digital-to-analogue IO card 1 the receiver signals collecting is returned, and with the MIC signal contrast that sends, so just can check out the mobile phone audio quality.
Jtag circuit as shown in Figure 9, is used to connect this high-speed programmable logical device 21 and downloader, and the program of downloading high-speed programmable logical device 21.This JTAG (JTAG) circuit, be connected to this a high-speed programmable logical device and a downloader, wherein, the TCK of the JTAG chip in this JTAG circuit, TDO, TMS and TDI end are connected to the TCK of this high-speed programmable logical device respectively, TDO, TMS and TDI end, the GND1 of this JTAG chip and GND2 end are connected to the GND end of this high-speed programmable logical device, the VCC end of this JTAG chip is connected to a voltage source, and this JTAG chip is connected according to the IEEE1149.1 agreement with this high-speed programmable logical device and this downloader.
The power supply of this handset single-plate testing apparatus is provided by the outside, after step-down and voltage stabilizing, powers to the keyset internal circuit.
Certainly; the utility model also can have other various embodiments; under the situation that does not deviate from the utility model spirit and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the utility model, but these corresponding changes and distortion all should belong to the protection range of the appended claim of the utility model.
Claims (10)
1. a handset single-plate testing apparatus is characterized in that, comprising:
One digital-to-analogue input/output cards is used for collection, conversion and the output of multichannel analog/digital signal;
One keyset comprises that one is used for high-speed programmable logical device, one first connector, one second connector and the mobile phone element test control circuit of testing mobile phone digital signal;
Wherein, this high-speed programmable logical device is connected to this first connector, this second connector and this mobile phone element test control circuit respectively, this mobile phone element test control circuit is connected to this first connector and this second connector or is connected to this first connector, this first connector is connected to this second connector, this digital-to-analogue input/output cards is connected with this second connector, and this first connector connects cell phone mainboard to be measured.
2. a kind of handset single-plate testing apparatus as claimed in claim 1, it is characterized in that, this mobile phone element test control circuit comprises again: drive and measuring circuit with earphone test circuit, mobile phone power-on control circuit, SIM card on-off control circuit and/or the keyboard back light that this high-speed programmable logical device is connected with this first connector respectively, wherein, this keyboard back light drives with measuring circuit and also is connected to this second connector.
3. a kind of handset single-plate testing apparatus as claimed in claim 1 or 2 is characterized in that, also is connected with a MIC level-conversion circuit between this first connector and this second connector.
4. a kind of handset single-plate testing apparatus as claimed in claim 1 or 2, it is characterized in that this high-speed programmable logical device comprises: a processor, a keyboard drive module that is connected with this processor respectively, a LCDs module bus test module and a mobile phone element test control module.
5. a kind of handset single-plate testing apparatus as claimed in claim 4, it is characterized in that, this mobile phone element test control module comprises again: earphone test module, mobile phone power-on control module, SIM card break-make control module and/or keyboard back light drive and measurement module, and correspondence is connected to this earphone test circuit, mobile phone power-on control circuit, SIM card on-off control circuit and/or keyboard back light driving and measuring circuit respectively.
6. a kind of handset single-plate testing apparatus as claimed in claim 1, it is characterized in that, also comprise a JTAG circuit, connect this a high-speed programmable logical device and a downloader respectively according to the IEEE1149.1 agreement, wherein, the JTAG chip in this JTAG circuit is connected with this high-speed programmable logical device.
7. a kind of handset single-plate testing apparatus as claimed in claim 1 is characterized in that, also comprises a power supply, is connected to this keyset.
8. a kind of handset single-plate testing apparatus as claimed in claim 2 is characterized in that this earphone test circuit comprises one first resistance, and the test point of the earphone MIC of this earphone test circuit is connected to this high-speed programmable logical device through this first resistance.
9. a kind of handset single-plate testing apparatus as claimed in claim 2 is characterized in that, this mobile phone power-on control circuit comprises a chip that is connected with the start key of tested mobile phone; This SIM card on-off control circuit comprises the chip that is connected with the SIM card of a tested mobile phone; This keyboard back light drive circuit comprises the chip that is connected to the keyboard back light power supply of tested mobile phone by resistance.
10. a kind of handset single-plate testing apparatus as claimed in claim 2, it is characterized in that, this keyboard back light measuring circuit comprises: a NPN type triode and a plurality of resistance, the base stage of this triode is connected to this high-speed programmable logical device by a resistance, the collector electrode of this triode is connected to the cell phone keyboard backlight electric power of tested mobile phone, and the emitter of this triode is connected to the measurement point backlight of this tested mobile phone and passes through another grounding through resistance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007201493105U CN201054735Y (en) | 2007-05-25 | 2007-05-25 | A mobile phone single board testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007201493105U CN201054735Y (en) | 2007-05-25 | 2007-05-25 | A mobile phone single board testing device |
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| Publication Number | Publication Date |
|---|---|
| CN201054735Y true CN201054735Y (en) | 2008-04-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2007201493105U Expired - Fee Related CN201054735Y (en) | 2007-05-25 | 2007-05-25 | A mobile phone single board testing device |
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| CN (1) | CN201054735Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101895602A (en) * | 2010-07-27 | 2010-11-24 | 青岛海信移动通信技术股份有限公司 | Method and system for testing mobile phone mainboard |
| CN107271895A (en) * | 2017-08-01 | 2017-10-20 | 江苏省电力试验研究院有限公司 | A kind of the time reference device and check system of the verification of primary cut-out test system |
-
2007
- 2007-05-25 CN CNU2007201493105U patent/CN201054735Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101895602A (en) * | 2010-07-27 | 2010-11-24 | 青岛海信移动通信技术股份有限公司 | Method and system for testing mobile phone mainboard |
| WO2012013043A1 (en) * | 2010-07-27 | 2012-02-02 | 青岛海信移动通信技术股份有限公司 | Method and system for testing mobile phone mainboard |
| CN101895602B (en) * | 2010-07-27 | 2013-04-10 | 青岛海信移动通信技术股份有限公司 | Method and system for testing mobile phone mainboard |
| CN107271895A (en) * | 2017-08-01 | 2017-10-20 | 江苏省电力试验研究院有限公司 | A kind of the time reference device and check system of the verification of primary cut-out test system |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080430 Termination date: 20130525 |