CN201054235Y - A conversion interface circuit device for test - Google Patents

A conversion interface circuit device for test Download PDF

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Publication number
CN201054235Y
CN201054235Y CNU2006201690819U CN200620169081U CN201054235Y CN 201054235 Y CN201054235 Y CN 201054235Y CN U2006201690819 U CNU2006201690819 U CN U2006201690819U CN 200620169081 U CN200620169081 U CN 200620169081U CN 201054235 Y CN201054235 Y CN 201054235Y
Authority
CN
China
Prior art keywords
display screen
test
interface circuit
utility
screen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CNU2006201690819U
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Chinese (zh)
Inventor
邱勇
许德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kunshan Visionox Technology Co Ltd
Original Assignee
Kunshan Visionox Display Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kunshan Visionox Display Co Ltd filed Critical Kunshan Visionox Display Co Ltd
Priority to CNU2006201690819U priority Critical patent/CN201054235Y/en
Application granted granted Critical
Publication of CN201054235Y publication Critical patent/CN201054235Y/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

The utility model relates to a transform interface circuit device used for the test of a flat display screen. The device comprises a printed circuit board, a chovr FPC arranged on the board and a porous circuit socket. The utility model improves the trivial procedure in the prior art that the display screen is required to be respectively and directly swapped with each testing equipment, therefore, a lattice screen is not required to be assembled and disassembled repeatedly, the procedure is greatly saved, and the production efficiency is improved. Meanwhile, in the testing process, all row-columns on the display screen are lightened, therefore, the lack row-column display phenomenon can not occur, and the display screen can be ensured to display uniformly after being tested.

Description

A kind of test converting interface circuit arrangement
Technical field
The utility model relates to a kind of converting interface circuit arrangement that is used for the test of panel display screen.
Background technology
In the prior art, after the processing of finishing display screen on the production line, generally all need by behind this procedure of process test, product just can dispatch from the factory.Common test step comprises two parts, at first is the screen body is carried out high temperature aging, and be conventionally test then to the screen body.
The circuit of high temperature aging of the prior art test, be negative electrode with the dot matrix screen by a lead material short circuit, draw by a lead again; The situation of anode is identical.Because the connection of sort circuit is very unsettled, row occurs lacking in the time of can causing the full screen display of dot matrix screen and show.This situation causes the dot matrix screen through after the high temperature aging, non-uniform phenomenon (lack the place of row when high temperature is seasoned, its brightness meeting is darker than other normal regions) can occur showing.Moreover existing test step is because of the restriction of tested person device, cause operation steps very loaded down with trivial details: at first, display screen need be connected with the testing apparatus of high temperature aging, as shown in Figure 2, after high temperature aging is finished the screen body is taken off, and then display screen reconnected conventionally test equipment, energising is tested, as shown in Figure 3.
Because each piece display screen all needs when entering test so not only to have limited the efficient of producing in batches by manually it is connected, takes off, connect, take off the ground repeatable operation with testing apparatus, increased working hour expense simultaneously, also increased the input of equipment.
The utility model content
The utility model will solve the above-mentioned problem that exists in existing test step, a kind of novel converting interface circuit arrangement is provided, and be used to connect display screen and each testing apparatus.
A kind of converting interface circuit arrangement that is used for panel display screen test, this device comprise a printed circuit board (PCB) and are positioned at switching FPC and porous circuitry socket on this plate.
The quantity of FPC lead-in wire is identical with dot matrix screen lead-in wire.
The utility model can improve display screen in the prior art to be needed respectively and the direct loaded down with trivial details operation of plug of each testing apparatus, adopt converting interface circuit arrangement of the present utility model, as long as with the porous circuitry socket conversion different testing apparatuss of pegging graft, just can realize the test of conventional dot matrix screen, can carry out the high temperature aging test again, need not load and unload the dot matrix screen more repeatedly, save operation greatly, improve production efficiency.Simultaneously because the lead-in wire of the FPC on the converting interface circuit arrangement that adopts be with the lead-in wire of dot matrix screen one to one, in test process, ranks on the display screen are all lighted, and just can not occur lacking the phenomenon that row shows, can guarantee can show evenly after display screen is through test.
Description of drawings:
Fig. 1 is the synoptic diagram of converting interface circuit arrangement of the present utility model;
Fig. 2 is a proving installation connection diagram required when display screen carries out the high temperature aging test in the prior art;
Fig. 3 carries out normal temperature required proving installation connection diagram of when test for prior art gathers display screen;
Fig. 4 is the lead-in wire synoptic diagram of FPC on the utility model transfer interface circuit device;
Fig. 5 a, 5b are the lead-in wire key diagram of FPC on the utility model transfer interface circuit device;
Fig. 6 is the display screen test process synoptic diagram in the utility model;
Fig. 7 is the synoptic diagram that the plug of normal temperature testing apparatus in the utility model is connected with porous socket;
Fig. 8 is the synoptic diagram that the plug of the seasoned testing apparatus of high temperature in the utility model is connected with porous socket.
Embodiment:
Description of reference numerals:
1 is display screen; 2 is the FPC circuit; 3 is printed circuit board (PCB); 4 is the porous power source socket; 5 is frock clamp; 6 is the circuit interface of normal temperature testing apparatus; 7 is the circuit interface of the seasoned testing apparatus of high temperature; 61 are the circuit lead for connection normal temperature testing apparatus in the prior art; 81 is the circuit lead that connects the seasoned testing apparatus of high temperature in the prior art; 82 is the circuit lead that connects the seasoned testing apparatus of high temperature in the utility model.
When the utility model is tested display screen, at first use frock clamp that display screen is connected with the converting interface circuit arrangement, as shown in Figure 6, wherein 5 is frock clamp.
Lead-in wire on the display screen links to each other with the lead-in wire of FPC, and as Fig. 4, shown in Figure 5, wherein COM1~COM63 is a dot matrix screen negative electrode odd-numbered line, and COM0~COM62 is a dot matrix screen negative electrode even number line, and SEG1~SEG131 is the anode column of dot matrix screen.Because the FPC on the converting interface circuit arrangement goes between be and lead-in wire one correspondence of dot matrix screen, in test process, the ranks on the display screen are all lighted, and the phenomenon of row demonstration just can not occur lacking, can guarantee can show evenly after display screen is through test.
Then, the circuit interface of normal temperature testing apparatus is connected with porous socket on the converting interface circuit arrangement, display screen is carried out the normal temperature test.The circuit plug of normal temperature testing apparatus joins with porous socket as shown in Figure 6.
After finishing the normal temperature test, again the circuit interface of the porous socket on the converting interface circuit arrangement with the seasoned testing apparatus of high temperature is connected, display screen is carried out the seasoned test of high temperature.Because picking out the lead-in wire that comes, the plug during the high temperature aging test needs short circuit, be 64 naked input same signals that are connected together of lead-in wire of COM0~COM63,132 naked being connected together of lead-in wire of same SEG1~SEG131, the synoptic diagram that its plug is connected with porous socket as shown in Figure 7.
By above-mentioned embodiment, use converting interface circuit arrangement of the present utility model, the operation when having saved the display screen test has greatly improved production efficiency, also can not produce the infringement to the display screen body simultaneously.
Although describe the present invention in conjunction with the preferred embodiments; but the present invention is not limited to the foregoing description and accompanying drawing; be to be understood that; under the guiding of the present invention's design; without departing from the spirit and scope of the present invention; a few modifications that those skilled in the art only carry out and retouching are protection scope of the present invention and cover

Claims (2)

1. a test converting interface circuit arrangement is characterized in that, this device comprises a printed circuit board (PCB) and is positioned at switching FPC and porous circuitry socket on this plate.
2. converting interface circuit arrangement according to claim 1 is characterized in that, the quantity of described switching FPC lead-in wire is identical with dot matrix screen lead-in wire.
CNU2006201690819U 2006-12-29 2006-12-29 A conversion interface circuit device for test Expired - Lifetime CN201054235Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2006201690819U CN201054235Y (en) 2006-12-29 2006-12-29 A conversion interface circuit device for test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2006201690819U CN201054235Y (en) 2006-12-29 2006-12-29 A conversion interface circuit device for test

Publications (1)

Publication Number Publication Date
CN201054235Y true CN201054235Y (en) 2008-04-30

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Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2006201690819U Expired - Lifetime CN201054235Y (en) 2006-12-29 2006-12-29 A conversion interface circuit device for test

Country Status (1)

Country Link
CN (1) CN201054235Y (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102495244A (en) * 2011-11-29 2012-06-13 深圳市华星光电技术有限公司 Testing connector, transmission wire, testing system and use method
CN103366668A (en) * 2012-04-01 2013-10-23 昆山维信诺显示技术有限公司 Novel OLED module, OLED module product and OLED display
CN105548859A (en) * 2015-12-09 2016-05-04 上海精密计量测试研究所 Testing equipment and method for environment testing

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102495244A (en) * 2011-11-29 2012-06-13 深圳市华星光电技术有限公司 Testing connector, transmission wire, testing system and use method
CN103366668A (en) * 2012-04-01 2013-10-23 昆山维信诺显示技术有限公司 Novel OLED module, OLED module product and OLED display
CN103366668B (en) * 2012-04-01 2015-09-16 昆山维信诺显示技术有限公司 New O LED module, OLED module product and OLED display
CN105548859A (en) * 2015-12-09 2016-05-04 上海精密计量测试研究所 Testing equipment and method for environment testing

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
EE01 Entry into force of recordation of patent licensing contract

Assignee: Beijing Visionox Photoelectric Technology Co.,Ltd.

Assignor: Weixinnuo Display Tech Co., Ltd.

Contract record no.: 2012990000005

Denomination of utility model: A conversion interface circuit device for test

Granted publication date: 20080430

License type: Exclusive License

Record date: 20120106

C56 Change in the name or address of the patentee

Owner name: KUNSHAN VISIONOX TECHNOLOGY CO., LTD.

Free format text: FORMER NAME: WEIXINNUO DISPLAY TECH CO., LTD.

CP03 Change of name, title or address

Address after: 215300 Kunshan high tech Zone, Jiangsu Province, Feng Feng Road, No. 188, No.

Patentee after: KUNSHAN VISIONOX TECHNOLOGY CO., LTD.

Address before: 215300, No. 757, north way, Yushan Town, Kunshan, Jiangsu

Patentee before: Weixinnuo Display Tech Co., Ltd.

CX01 Expiry of patent term

Granted publication date: 20080430

EXPY Termination of patent right or utility model