CN201016936Y - Enamel-covered wire exterior imperfect detecting device - Google Patents

Enamel-covered wire exterior imperfect detecting device Download PDF

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Publication number
CN201016936Y
CN201016936Y CNU2007200953440U CN200720095344U CN201016936Y CN 201016936 Y CN201016936 Y CN 201016936Y CN U2007200953440 U CNU2007200953440 U CN U2007200953440U CN 200720095344 U CN200720095344 U CN 200720095344U CN 201016936 Y CN201016936 Y CN 201016936Y
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CN
China
Prior art keywords
enameled wire
light
signal
optical
bad order
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CNU2007200953440U
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Chinese (zh)
Inventor
洪元基
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LEXING CABLE (TIANJIN) CO Ltd
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LEXING CABLE (TIANJIN) CO Ltd
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Priority to CNU2007200953440U priority Critical patent/CN201016936Y/en
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Publication of CN201016936Y publication Critical patent/CN201016936Y/en
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Abstract

The utility model discloses an enameled wire appearance adverse detection device, consisting of a luminescence part which consists of an infrared light source and a convex lens and a receiving light part, which consists of a receiving light window of which one lateral surface is coated with not transparent material on which a plurality of optical gaps are formed and a signal transformation device which comprises a plurality of photodiodes. The utility model also comprises an appearance adverse detection part, which consists of an amplifier, a filter and a signal comparator, and a diameter detection part, which consists of an amplifier, a filter and a diameter determination device. The infrared lights pass through the enameled wire and form a plurality of light signals on the plurality of optical gaps of the receiving light window. The plurality of light signals is converted into a plurality of electric signals through the plurality of photodiodes. Foreign bodies pasted on the surface of the enameled wire and the diameter of the enameled wire can be detected instantly through the determination of the electric signals. The detection speed and the detection efficiency of the enameled wire are greatly improved. And the foreign bodies on the surface can be eliminated rapidly. The cost of the detection devices of the utility model is low. And a multi-axial optical system is easily assembled.

Description

Enameled wire bad order pick-up unit
Technical field
The utility model relates to a kind of pick-up unit.Particularly relate to and a kind ofly can detect the foreign matter of enameled wire surface adhesion and the enameled wire bad order pick-up unit of enameled wire diameter moment.
Background technology
When producing enameled wire, in the process of japanning, take place during owing to the situation of a variety of causes enameled wire surface adhesion foreign matter.When the foreign matter on enameled wire surface can not get removing and when solidifying, the possibility that may cause taking place the electric leakage accident in the position japanning thickness deficiency of solidifying is very big.At present, in time finding in producing the process of enameled wire has the bad enameled wire of foreign matter attached to the surface, and removes foreign matter or the existing method of the detection enameled wire surface adhesion foreign matter handled by defective products has lacquer solidifies before: with the enameled wire Superficial Foreign Body detection method of laser scanning enameled wire and with behind the camera enameled wire image the enameled wire Superficial Foreign Body detection method of detection again after decimally mode is handled.But the expense that has an equipment with the method for laser scanning is costliness and the low deficiency of the slow checking efficiency of inspection speed very; Enameled wire take a picture the back image decimally the method handled of mode have and can't detect the enameled wire foreign matter moment, can't detect problems such as foreign matter before enameled wire solidifies.Detection mode also exists can't test the enameled wire external diameter, and also needing independent enameled wire external diameter pick-up unit and constituting the multiaxis pick-up unit has problems such as great difficulty.
Summary of the invention
Technical problem to be solved in the utility model is to provide a kind of and can detect the foreign matter of enameled wire surface adhesion and the enameled wire bad order pick-up unit of enameled wire diameter moment.
The technical scheme that the utility model adopted is: a kind of enameled wire bad order pick-up unit includes: by the infrared light sources of infra-red-emitting with disperse the illuminating part that ultrared convex lens are formed; Scribble the reception optical window that forms a plurality of light slits after the light tight material thereon by a side surface, and the light reception element of forming by the chromacoder that a plurality of photodiodes of infrared signal switching electrical signals are formed; By the amplifier that a plurality of signals from photodiode transmission are amplified, the filtrator that amplifying signal is filtered, thus measure the bad order test section that signal comparator that potential difference (PD) between the electric signal detects the foreign matter on enameled wire surface is formed; By the amplifier that any one signal in the photodiode is amplified, to the filtrator that the signal after amplifying filters, the diameter test section of measuring the measuring diameter instrument composition of the semaphore calculated diameter that filters the back signal constitutes.
Be separated with enameled wire mutually between convex lens in the described illuminating part and the reception optical window in the light reception element and be arranged in parallel.
The length direction of a plurality of light slits in the described reception optical window and the direct of travel of measured object enameled wire are perpendicular.
A plurality of light slits in the described reception optical window and a plurality of photodiodes in the chromacoder are corresponding mutually to be provided with.
Described single illuminating part and single light reception element by mutual correspondence formed the optical system of 1 optical axis, and rearranges 2 spool or more 6 spool following optical systems on same plane with the angle of same intervals by the optical system of 2~6 1 optical axises.
Described 2~6 multiaxis optical system arrangement arranged side by side can be formed 4~12 optical systems.
Enameled wire bad order pick-up unit of the present utility model, a plurality of light signals that infrared ray forms at a plurality of light slits that receive optical window after by enameled wire become a plurality of electric signal by a plurality of photodiode converts, by measuring foreign matter and the enameled wire diameter that electric signal can detect the enameled wire surface adhesion moment, the detection speed and the detection efficiency of enameled wire have greatly been improved, and can remove Superficial Foreign Body rapidly, pick-up unit expense of the present utility model is cheap, forms the multiaxis optical system easily.
Description of drawings
Fig. 1 is an one-piece construction synoptic diagram of the present utility model;
Fig. 2 is the structural drawing of 3 optical systems;
Fig. 3 is the structural representation of multiaxis optical system arranged side by side.
Wherein:
1: enameled wire 2: infrared light sources
3: convex lens 4: receive optical window
5: coating 6: light slit
7: chromacoder 8: photodiode
9: infrared signal 10a: amplifier
10b: amplifier 11a: filtrator
11b: filtrator 12: signal comparator
13: measuring diameter instrument 14: foreign matter
15: illuminating part 16: light reception element
17: bad test section 18: diameter test section
20: the multiaxis optical system
Embodiment
Below in conjunction with embodiment enameled wire bad order pick-up unit of the present utility model is made a detailed description.
As shown in Figure 1, enameled wire bad order pick-up unit of the present utility model is by measured object enameled wire 1; Shine ultrared light source 15; Receive by behind the light signal 9 of enameled wire 1, convert the light reception element 16 of plural electric signal to; After the plural electric signal that light reception element 16 is transmitted compares, detect the bad test section 17 of the foreign matter 14 that adheres on the enameled wire 1; The measuring diameter portion 18 that is measured back embodiment enameled wire 1 diameter by electrical signal converted amount in any photodiode 8 in the light reception element 16 is constituted.
Form by infrared light sources 2 with by ultrared convex lens 3 to the ultrared illuminating part 15 of measured object enameled wire 1 irradiation.
Be arranged on the position on illuminating part 15 opposites, and with illuminating part 15 between be separated with measured object enameled wire 1 mutually, the light reception element 16 that converts electric signal behind the infrared signal 9 of reception by enameled wire 1 to is to scribble light tight material coating 5 by a: side, and is formed with the reception optical window 4 that a plurality of light slits 6 by the light tight material coating 5 of removing of the rectangular shape that is parallel to each other form in light tight material coating 5; The chromacoder 7 that converts into a plurality of photodiodes 8 formation of electric signal behind a plurality of infrared signals 9 of reception by a plurality of light slits 6 to is formed.
The infrared ray that sends for the convex lens 3 that make illuminating part 15 incides the reception optical window 4 in the light reception element 16 after by enameled wire 1, with the convex lens 3 of illuminating part 15 with receive be separated by enameled wire 1 and being parallel to each other of optical window 4.
Detect the foreign matter 14 that adheres on the enameled wire in order to compare at measured object enameled wire 1 approaching position, the a plurality of light slits 6 that form in the reception optical window 4 in light reception element 16 are made up of the rectangle big or small, that shape is identical, the length direction of its rectangle becomes vertical with the direct of travel of measured object enameled wire 1, a plurality of light slit 6 compositions parallel to each other.
Incide photodiode 8 in a plurality of chromacoders 7 in order to make by a plurality of infrared signals 9 that receive a plurality of light slits 6 in the optical window 4, a plurality of light slits 6 that will receive optical window 4 form corresponding mutually position setting with a plurality of photodiodes 8.
After the photodiode 8 that forms in the light reception element 16 compares a plurality of electric signal, be sent to the outward appearance test section 17 of the foreign matter 14 that detects enameled wire 1 surface adhesion, reception is amplified the back by noise filter 11a one by one by amplifier 10a behind the electric signal of photodiode 8 transmission, the a plurality of electric signal that transmit from filtrator 11a are measured the potential difference (PD) between the electric signal and are compared through signal comparator 12, and signal comparator 12 provides the signal that there is foreign matter 14 on enameled wire 1 surface when determining above the potential difference (PD) of setting range from a plurality of electric signal.
The measuring diameter portion 18 of embodying enameled wire 1 diameter behind the electric signal that any one photodiode 8 in the reception light reception element 16 is transmitted, be the amplifier 10b that amplifies by to the signal that transmits from any one photodiode 8, amplifying signal is carried out the filtrator 11b of filtering noise, calculate the measuring diameter instrument 13 of enameled wire 1 external diameter and expression and form.
As shown in Figure 2, form 1 optical system by single illuminating part 15 and single light reception element 16, if 2~6 1 optical systems on same plane during with same even angle layout, form the multiaxis optical system 20 below 6 more than 2, like this can be at the diameter of all measurement of angle enameled wires 1.The angle that multiaxis optical system 20 is closed between the optic axis is in the plane determined by following formula:
Close on the optic axis number of axle that angle between optical axis=180 ÷ form
When for example forming 3 optical systems 20, close on that angle is between the optical axis: 180 ÷ 3=60 °.
And as shown in Figure 3,, 2~6 multiaxis optical system 20 can form the multiaxis optical system below 12 more than 4 by being arranged side by side.
Principle of work of the present utility model is:
Pass through enameled wire 1 by certain direction in the optical axis between illuminating part 15 and light reception element 16, illuminating part 15 emission infrared light sources 2.Infrared ray is by enameled wire 1, by converting a plurality of infrared signals 9 behind a plurality of light slits in the reception optical window 4 of light reception element 16 to.A plurality of infrared signals 9 incide a plurality of photodiodes 8 in the signal converter 7, and photodiode 8 converts a plurality of electric signal to.If the foreign matter 14 of enameled wire 1 surface adhesion produces difference during by any one light slit 6 wherein with between a plurality of infrared ray signals 9 by other a plurality of light slits 6, thereby generation difference promptly produces potential difference (PD) between a plurality of electric signal of conversion in a plurality of photodiode 8.A plurality of electric signal amplify the back by being input to signal comparator 12 behind the wave filter 11a filtering noise by amplifier 10a, and 12 pairs of electric signal amounts of signal comparator compare the potential difference (PD) of measuring between electric signal.Represent the no foreign matter 14 in enameled wire 1 surface when the potential difference (PD) in a plurality of electric signal is lower than setting, detecting enameled wire 1 surface during greater than setting has foreign matter 14, at this moment removes enameled wire 1 Superficial Foreign Body or handles enameled wire 1 by defective products.Electrical signal converted is amplified the back by being input to measuring diameter instrument 13 behind the filtering noise among the filtrator 11b by amplifier 10b from any photodiode 8, calculates the diameter of enameled wire 1 behind the measuring diameter instrument 13 mensuration electric signal.

Claims (6)

1. enameled wire bad order pick-up unit is characterized in that: include: by the infrared light sources (2) of infra-red-emitting with disperse the illuminating part (15) that ultrared convex lens (3) are formed; Scribble the reception optical window (4) that forms a plurality of light slits (6) after the light tight material thereon by a side surface, and the light reception element of forming by the chromacoder (7) that a plurality of photodiodes (8) of infrared signal (9) switching electrical signals are formed (16); By the amplifier (10a) that a plurality of signals from photodiode (8) transmission are amplified, the filtrator (11b) that amplifying signal is filtered, thus the bad order test section (17) that signal comparator (12) that potential difference (PD) between the electric signal detects the foreign matter (14) on enameled wire (1) surface is formed measured; By the amplifier (10b) that any one signal in the photodiode (8) is amplified, to the filtrator (11b) that the signal after amplifying filters, the diameter test section (18) of measuring measuring diameter instrument (13) composition of the semaphore calculated diameter that filters the back signal constitutes.
2. enameled wire bad order pick-up unit according to claim 1 is characterized in that: be separated with enameled wire (1) mutually between convex lens (3) in the described illuminating part (15) and the reception optical window (4) in the light reception element (16) and be arranged in parallel.
3. enameled wire bad order pick-up unit according to claim 1 is characterized in that: the length direction of a plurality of light slits (6) in the described reception optical window (4) and the direct of travel of measured object enameled wire (1) are perpendicular.
4. enameled wire bad order pick-up unit according to claim 1 is characterized in that: a plurality of light slits (6) in the described reception optical window (4) and a plurality of photodiodes (8) in the chromacoder (7) are corresponding mutually to be provided with.
5. enameled wire bad order pick-up unit according to claim 1, it is characterized in that: described single illuminating part (15) and single light reception element (16) by mutual correspondence formed the optical system of 1 optical axis, and rearranges 2 spool or more 6 spool following optical systems (20) on same plane with the angle of same intervals by the optical system of 2~6 1 optical axises.
6. enameled wire bad order pick-up unit according to claim 5 is characterized in that: described 2~6 multiaxis optical system (20) arrangement side by side can be formed 4~12 optical systems.
CNU2007200953440U 2007-02-27 2007-02-27 Enamel-covered wire exterior imperfect detecting device Expired - Fee Related CN201016936Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2007200953440U CN201016936Y (en) 2007-02-27 2007-02-27 Enamel-covered wire exterior imperfect detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2007200953440U CN201016936Y (en) 2007-02-27 2007-02-27 Enamel-covered wire exterior imperfect detecting device

Publications (1)

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CN201016936Y true CN201016936Y (en) 2008-02-06

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102297870A (en) * 2011-05-19 2011-12-28 江苏句容联合铜材有限公司 On-line detection system for enamelled rectangular wire
CN102628779A (en) * 2012-04-19 2012-08-08 白银有色集团股份有限公司 Method for rapidly judging flexibility and attachment of enameled wire
CN103245721A (en) * 2013-05-22 2013-08-14 江苏句容联合铜材有限公司 On-line enameled flat wire detection method
CN106841232A (en) * 2016-12-30 2017-06-13 杭州魔方智能科技有限公司 A kind of cable open defect real-time monitoring device
CN109279441A (en) * 2017-07-21 2019-01-29 苏州凌犀物联网技术有限公司 Bulge detection device and detection method in a kind of automatic winding displacement control system

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102297870A (en) * 2011-05-19 2011-12-28 江苏句容联合铜材有限公司 On-line detection system for enamelled rectangular wire
CN102628779A (en) * 2012-04-19 2012-08-08 白银有色集团股份有限公司 Method for rapidly judging flexibility and attachment of enameled wire
CN103245721A (en) * 2013-05-22 2013-08-14 江苏句容联合铜材有限公司 On-line enameled flat wire detection method
CN106841232A (en) * 2016-12-30 2017-06-13 杭州魔方智能科技有限公司 A kind of cable open defect real-time monitoring device
CN106841232B (en) * 2016-12-30 2019-05-17 杭州魔方智能科技有限公司 A kind of cable open defect real-time monitoring device
CN109279441A (en) * 2017-07-21 2019-01-29 苏州凌犀物联网技术有限公司 Bulge detection device and detection method in a kind of automatic winding displacement control system
CN109279441B (en) * 2017-07-21 2021-12-10 苏州凌犀物联网技术有限公司 Bulge detection device and detection method in automatic wire arranging control system

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20080206

Termination date: 20110227