CN200953004Y - Automatic positioning X-ray fluorescent energy chromatic dispersion spectrograph - Google Patents

Automatic positioning X-ray fluorescent energy chromatic dispersion spectrograph Download PDF

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Publication number
CN200953004Y
CN200953004Y CN 200620014536 CN200620014536U CN200953004Y CN 200953004 Y CN200953004 Y CN 200953004Y CN 200620014536 CN200620014536 CN 200620014536 CN 200620014536 U CN200620014536 U CN 200620014536U CN 200953004 Y CN200953004 Y CN 200953004Y
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China
Prior art keywords
automatic
sample
mca
fluorescent energy
light
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Expired - Fee Related
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CN 200620014536
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Chinese (zh)
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刘召贵
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SKYRAY INSTRUMENT CO Ltd
Shenzhen Skyray Instrument Co Ltd
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SKYRAY INSTRUMENT CO Ltd
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Abstract

This is a self-positioning X fluorescent energy dispersive spectrometer, comprising the main body and PC (connected with the main body), among which the main body is provided with an illuminant system, a probe, and a signal processing & MCA modular system. The said illuminant system covers the high pressure and the light pipe as well as transmits X-ray. When the X-ray is transferred to the sample, each atom of the sample can be inspired with the X fluorescent light which is received by the probe and translated into the electrical signal. After processed by MCA modular system, the electrical signal will be delivered to the PC, so that such electrical signal could be displayed on the user's software interface. The said main body consists of a mainframe and a 3D sample sliding stage. Also, the main body is equipped with the illuminant system, the probe and signal processing & MCA modular system. The said 3D sample sliding stage is located at the lower side of the main body for the placement and moving of the samples.

Description

A kind of automatic location X fluorescent energy dispersive spectrometer
Technical field
The utility model relates to a kind of trace element detector device, and especially a kind of testing result accurately and the X fluorescent energy dispersive spectrometer that is user-friendly to and detects.
Background technology
Along with expanding economy, the paces of China's Foreign Trade further strengthen, and the enterprise that belongs to the RoHS of European Union instruction radiation scope is countless, and they are badly in need of wanting a kind of powerful mean, can assist them to tackle the RoHS instruction.The RoHS instruction, full name is " some objectionable impurities instruction is used in restriction in electric, the electronic equipment ", be actually one " Green Trade Barrier " that European Union releases, it is that European Union issued in February, 2003, be intended to limit the decree of using 6 kinds of objectionable impuritiess (lead, mercury, cadmium, 6 valency chromium, poly-bromo biphenyl and poly-dibromodiphenyl ether, these six kinds of objectionable impuritiess in fact only relate to five kinds of harmful elements) in the electronic electric equipment.Its target is consistent with other international regulations, is intended to limit new equipment and uses some objectionable impurities, with protection human health and environment.For the electronics manufacturer beyond the Europe, as long as the equipment final outlet of its production is to EU member country, just must on July 1st, 2006 in accordance with these rules, similar rules have also been drafted by global various countries.The also stranger RoHS of the European Union environmental protection for vast Chinese Consumer's of this is instructed, be known as " instruction that affects the global manufacturing nerve ", its related product scope is extremely extensive, comprise nearly 200,000 kinds of 10 big classes, all electronic information series products have almost been contained, as big small household appliance, IT and communication facilities, electric appliance and electronic instrument, toy leisure and sporting equipment, Medical Devices etc.
The method of Jian Ceing has much in the market, mainly contain the xrf analysis method, electron spectroscopy analysis method and inanimate matter Zymography three major types: the xrf analysis method accurate content of five kinds of contained elements in testing product or the raw material not only wherein, and from the testing process of customs of European Union, the accuracy that detects, the speed of detection, the intuitive of detection, many-sides such as the price of instrument are considered, and are most popular with the X fluorescence spectrophotometer.
Mainly there is following shortcoming in the X fluorescence spectrophotometer of Tui Chuing in the market:
One, the X fluorescence spectrophotometer of releasing in the market, some does not all have the such device of sample mobile platform, relies on manual operations when mobile example fully.When displacement is very little, be difficult to reach the effect of fine setting.Also some mobile platform is two-dimentional, so regulating power is very limited.And this mobile platform generally is a manual adjustments, also can have limitation on adjusting time and effect.
Two, generally adopt down in the market according to the formula light path system, X fluorescence light source when promptly testing is positioned at the below of sample, light is radiated on the sample from the below of sample, may pollute light path in the test process like this, further may exert an influence to test result.
Three, the X fluorescence spectrophotometer of releasing on the preceding market does not have to be provided with the laser positioning protective device that is used for protecting instrument
Four, the X fluorescence spectrophotometer of releasing in the market, when much adjusting collimating apparatus and optical filter at different samples, all be manual the operation, each so all must uncapping operated, may have dust and enter light path system, be the standard that relies on human eye during manual adjustment perhaps, has some deviations unavoidably, and these deviations are reacted on the specimen, will exert an influence to test result.
Five, the X fluorescence spectrophotometer of releasing in the market, sample cavity is generally all less.Can satisfy the demands when measuring small articles, in case when the client provides big article, just can only split to sample.So just destroyed the advantage that X fluorescence " can't harm ".
Summary of the invention
In order to overcome numerous shortcomings of above-mentioned X fluorescence spectrophotometer, order of the present utility model provides a kind of automatic location X fluorescent energy dispersive spectrometer, and this instrument is realized multiple new function by a plurality of new structures are set.
The technical scheme that the utility model adopted is:
A kind of automatic location X fluorescent energy dispersive spectrometer, comprise fuselage and the PC that is attached thereto, wherein, light-source system and detector system are installed in the described fuselage, signal Processing and MCA modular system, wherein, described light-source system comprises high pressure and light pipe, light-source system is launched X ray, after X ray acted on the sample, each atom in the sample can be inspired feature X fluorescence, and these X fluorescence are detected device and receive, analysis is converted into electric signal, electric signal is transferred in the PC through the processing of MCA modular system again, shows on the user interface of software, it is characterized in that: described fuselage comprises mainframe and three-dimensional sample mobile platform device, wherein, described light-source system and detector system, signal Processing and MCA modular system are fixedly mounted on the described mainframe, described three-dimensional sample mobile platform is positioned at described mainframe below, is used for placing and mobile example.
Described three-dimensional sample mobile platform comprises Z axle automatic lifting system and XY axle automatic worktable.
Above described XY axle automatic worktable, be provided with the laser positioning protective device; This laser positioning protective device one end is a transmitting terminal, and the other end is a receiving end, and this laser positioning protective device utilization optoelectronic switch principle forms a photoelectric protection net at the focus place of X ray and detector surface level.
Be provided with collimating apparatus optical filter automatic-exchanging system on the described XY axle automatic worktable, this collimating apparatus optical filter automatic-exchanging system of this collimating apparatus optical filter automatic-exchanging system comprises collimating apparatus, optical filter, displacement transducer and linear electric motors, described collimating apparatus comprises some collimating apertures, during use, change the permutation and combination of collimating aperture and optical filter automatically by displacement transducer location and linear motor driving.
The beneficial effects of the utility model are:
1. abandoned adopting on the market general following to the formula light path system, and innovation formula ground adopts and goes up according to the formula light path system.Adopt this light path, can avoid in test process the pollution that may cause light path, thereby further got rid of the factor that may exert an influence to test result, guaranteed the test effect.
2. three-dimensional accurately mobile platform device is arranged, accurately locate automatically, make the test position distincter by three-dimensional.
3. adopt automatic switchover collimating apparatus and filter system, reduce the trouble and the inexactness of people's operation to greatest extent.
4. also do time at secure context, exclusive lasing safety device can effectively prevent the loss of X ray in test process, really realizes triple safeguard functions.
Description of drawings
Fig. 1 the utility model structural principle synoptic diagram;
Fig. 2 whole schematic perspective view of the present utility model;
The whole three-view diagram of Fig. 3 the utility model;
Fig. 4 three-dimensional decomposition texture synoptic diagram of the present utility model;
Fig. 5 three-dimensional sample mobile platform of the present utility model structural plan synoptic diagram;
Fig. 6 three-dimensional sample mobile platform of the present utility model structural upright synoptic diagram;
Fig. 7 collimating apparatus optical filter of the present utility model automatic moving system synoptic diagram;
Fig. 8 laser positioning protective device of the present utility model synoptic diagram;
Fig. 9 the utility model uses the process flow diagram of software.
1. left and right sides link plates among the figure; 2. upper cover plate; 3. mainframe; 4.Z axle automatic lifting system; 5. power supply; 6. high pressure; 7. collimating apparatus optical filter automatic-exchanging system; 8. laser positioning protective device; 9. three-dimensional sample mobile platform device; 91.XY axle automatic worktable; 10. base;
Embodiment
Below in conjunction with drawings and Examples the utility model is further specified.
As shown in Figure 1, a kind of automatic location X fluorescent energy dispersive spectrometer, comprise fuselage and the PC that is attached thereto, wherein, light-source system and detector system are installed in the described fuselage, signal Processing and MCA modular system, wherein, described light-source system comprises high voltage unit and X-ray pipe, and light-source system is launched X ray, after X ray acts on the sample, each atom in the sample can be inspired feature X fluorescence, and these X fluorescence are detected device and receive, and analyzes to be converted into electric signal, electric signal is through the processing of MCA modular system, be transferred to again in the PC, on the user interface of software, show, as Fig. 2, Fig. 3 and shown in Figure 4, described fuselage comprises mainframe (3) and three-dimensional sample mobile platform device (9), wherein, described light-source system and detector system, signal Processing and MCA modular system are fixedly mounted on the described mainframe (3), described three-dimensional sample mobile platform (9) is positioned at described mainframe (3) below, is used for placing and mobile example.
As shown in Figure 5 and Figure 6, described three-dimensional sample mobile platform (9) comprises Z axle automatic lifting system (4) and XY axle automatic worktable (91).
As shown in Figure 8, be provided with laser positioning protective device (8) in the top of described XY axle automatic worktable (91); This laser positioning protective device one end is transmitting terminal (81), and the other end is receiving end (82), and this laser positioning protective device utilization optoelectronic switch principle forms a photoelectric protection net at the focus place of X ray and detector surface level.
As shown in Figure 7, be provided with collimating apparatus optical filter automatic-exchanging system (7) on the described XY axle automatic worktable (91), this collimating apparatus optical filter automatic-exchanging system (7) comprises collimating apparatus (71), optical filter, displacement transducer and linear electric motors, described collimating apparatus (71) comprises when some collimating apertures (711) use, and changes the permutation and combination of collimating aperture (711) and optical filter automatically by displacement transducer location and linear motor driving.
As shown in Figure 4, be provided with a base (10) on the described three-dimensional sample mobile platform (9).
As shown in Figure 9, the utility model adopts the principle of work of software as follows:
One, instrumental correction
Adjust the instrument enlargement factor, eliminate the influence that the peak floats, guarantee that testing sample is consistent with the mark sample condition.
Two, working curve
Composition per sample is different with base material, can add many curves.
Three, intensity is calculated
Strength calculation method has: gross area, and net area, Gauss curve fitting, the pure element match, several different methods such as multispectral match are selective.
Four, calculate
The cubage formula:
C = Σ i K i I i
Parameter declaration:
C: the content of element to be measured in the sample;
I: the fluorescence intensity content of sample
K: undetermined coefficient.
The coating computing formula:
Ln ( I ) Ln ( Σ i I i ) = K 1 T + K 2
Parameter declaration:
T: the thickness of coating
Figure Y20062001453600083
The summation of each element fluorescence intensity in the matrix
K: undetermined coefficient
Seven, report the result
After test finishes, can provide the two dimensional analysis collection of illustrative plates of complete content and coating.Can draw corresponding three-dimensional image according to measurement data after promptly detection finishes, and express the content or the thickness of corresponding each position in the measurement range all sidedly, test data output simultaneously by 3-D walls and floor.

Claims (4)

1. locate X fluorescent energy dispersive spectrometer automatically for one kind, comprise fuselage and the PC that is attached thereto, wherein, light-source system and detector system are installed in the described fuselage, signal Processing and MCA modular system, wherein, described light-source system comprises high pressure and light pipe, light-source system is launched X ray, after X ray acted on the sample, each atom in the sample can be inspired feature X fluorescence, and these X fluorescence are detected device and receive, analysis is converted into electric signal, electric signal is transferred in the PC through the processing of MCA modular system again, shows on the user interface of software, it is characterized in that: described fuselage comprises mainframe and three-dimensional sample mobile platform device, wherein, described light-source system and detector system, signal Processing and MCA modular system are fixedly mounted on the described mainframe, described three-dimensional sample mobile platform is positioned at described mainframe below, is used for placing and mobile example.
2. automatic location as claimed in claim 1 X fluorescent energy dispersive spectrometer, it is characterized in that: described three-dimensional sample mobile platform comprises Z axle automatic lifting system and XY axle automatic worktable.
3. automatic location as claimed in claim 1 or 2 X fluorescent energy dispersive spectrometer is characterized in that: be provided with the laser positioning protective device between described base and XY axle automatic worktable; This laser positioning protective device one end is a transmitting terminal, and the other end is a receiving end, and described laser positioning protective device utilization optoelectronic switch principle forms a photoelectricity protection network at the focus place of X ray and detector surface level.
4. automatic location as claimed in claim 1 or 2 X fluorescent energy dispersive spectrometer, it is characterized in that: under the described base, be provided with collimating apparatus optical filter automatic-exchanging system on the XY axle automatic worktable, this collimating apparatus optical filter automatic-exchanging system comprises collimating apparatus, optical filter, displacement transducer and linear electric motors, and described collimating apparatus comprises some collimating apertures.
CN 200620014536 2006-09-06 2006-09-06 Automatic positioning X-ray fluorescent energy chromatic dispersion spectrograph Expired - Fee Related CN200953004Y (en)

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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104198508A (en) * 2014-09-30 2014-12-10 江苏天瑞仪器股份有限公司 Food heavy metal detection instrument with light filter switching function
CN104660339A (en) * 2015-02-09 2015-05-27 福建师范大学 Method and device for realizing optical signal delay by utilizing fluorescence effect
CN107064197A (en) * 2017-06-12 2017-08-18 沈阳科晶自动化设备有限公司 A kind of automatic high flux x-ray fluorescence analyzer
US10207296B2 (en) 2015-07-16 2019-02-19 UHV Technologies, Inc. Material sorting system
CN109716115A (en) * 2016-09-15 2019-05-03 华盛顿大学 X-ray spectrometer and application method
US10625304B2 (en) 2017-04-26 2020-04-21 UHV Technologies, Inc. Recycling coins from scrap
US10710119B2 (en) 2016-07-18 2020-07-14 UHV Technologies, Inc. Material sorting using a vision system
US10722922B2 (en) 2015-07-16 2020-07-28 UHV Technologies, Inc. Sorting cast and wrought aluminum
US10823687B2 (en) 2015-08-03 2020-11-03 UHV Technologies, Inc. Metal analysis during pharmaceutical manufacturing
US11278937B2 (en) 2015-07-16 2022-03-22 Sortera Alloys, Inc. Multiple stage sorting
US11964304B2 (en) 2015-07-16 2024-04-23 Sortera Technologies, Inc. Sorting between metal alloys
US11969764B2 (en) 2016-07-18 2024-04-30 Sortera Technologies, Inc. Sorting of plastics
US12017255B2 (en) 2022-03-16 2024-06-25 Sortera Technologies, Inc. Sorting based on chemical composition

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104198508A (en) * 2014-09-30 2014-12-10 江苏天瑞仪器股份有限公司 Food heavy metal detection instrument with light filter switching function
CN104660339B (en) * 2015-02-09 2017-11-07 福建师范大学 The method and apparatus that a kind of utilization fluorescent effect realizes optical signal delay
CN104660339A (en) * 2015-02-09 2015-05-27 福建师范大学 Method and device for realizing optical signal delay by utilizing fluorescence effect
US10722922B2 (en) 2015-07-16 2020-07-28 UHV Technologies, Inc. Sorting cast and wrought aluminum
US11278937B2 (en) 2015-07-16 2022-03-22 Sortera Alloys, Inc. Multiple stage sorting
US11975365B2 (en) 2015-07-16 2024-05-07 Sortera Technologies, Inc. Computer program product for classifying materials
US11964304B2 (en) 2015-07-16 2024-04-23 Sortera Technologies, Inc. Sorting between metal alloys
US10207296B2 (en) 2015-07-16 2019-02-19 UHV Technologies, Inc. Material sorting system
US11471916B2 (en) 2015-07-16 2022-10-18 Sortera Alloys, Inc. Metal sorter
US10823687B2 (en) 2015-08-03 2020-11-03 UHV Technologies, Inc. Metal analysis during pharmaceutical manufacturing
US10710119B2 (en) 2016-07-18 2020-07-14 UHV Technologies, Inc. Material sorting using a vision system
US11969764B2 (en) 2016-07-18 2024-04-30 Sortera Technologies, Inc. Sorting of plastics
CN109716115A (en) * 2016-09-15 2019-05-03 华盛顿大学 X-ray spectrometer and application method
US11260426B2 (en) 2017-04-26 2022-03-01 Sortera Alloys, hic. Identifying coins from scrap
US10625304B2 (en) 2017-04-26 2020-04-21 UHV Technologies, Inc. Recycling coins from scrap
CN107064197A (en) * 2017-06-12 2017-08-18 沈阳科晶自动化设备有限公司 A kind of automatic high flux x-ray fluorescence analyzer
US12017255B2 (en) 2022-03-16 2024-06-25 Sortera Technologies, Inc. Sorting based on chemical composition

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070926

Termination date: 20150906

EXPY Termination of patent right or utility model