CN1995487A - Germanium-doped directional solidification casting polycrystalline silicon - Google Patents

Germanium-doped directional solidification casting polycrystalline silicon Download PDF

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Publication number
CN1995487A
CN1995487A CN 200610154949 CN200610154949A CN1995487A CN 1995487 A CN1995487 A CN 1995487A CN 200610154949 CN200610154949 CN 200610154949 CN 200610154949 A CN200610154949 A CN 200610154949A CN 1995487 A CN1995487 A CN 1995487A
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China
Prior art keywords
germanium
polycrystalline silicon
casting polycrystalline
silicon
directional solidification
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CN 200610154949
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CN100570020C (en
Inventor
杨德仁
朱鑫
汪雷
席珍强
阙端麟
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Zhejiang University ZJU
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Zhejiang University ZJU
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Priority to CNB2006101549492A priority Critical patent/CN100570020C/en
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Publication of CN100570020C publication Critical patent/CN100570020C/en
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Abstract

The invention discloses a directional solidifying and casting method of polysilicon with doped germanium, which is characterized by the following: possessing certain density phosphor or boron with density at 1*1015-1*1017 /cm3 as well as germanium with density at 1*1016-1*1019/cm3; improving mechanic strength of polysilicon; fitting for making solar battery.

Description

A kind of directional solidification casting polycrystalline silicon of doped germanium
Technical field
The present invention relates to a kind of casting polycrystalline silicon, especially the directional solidification casting polycrystalline silicon of doped germanium.
Background technology
Sun power is inexhaustible clear energy sources, utilizes the light transfer characteristic of semiconductor material, is prepared into solar cell, sun power can be transformed into electric energy.
Directional solidification casting polycrystalline silicon is a kind of main raw of solar cell, and influencing the widely used major obstacle of solar cell is that cost is higher, and the prime cost of battery is at silicon chip.In order to reduce cost, the measure of taking now is the thickness that reduces silicon chip, makes the material usage of each sheet silicon chip reduce, and still, the casting polycrystalline silicon that generally uses at present is to mix phosphorus or boron-doping concentration is 1 * 10 15~1 * 10 17/ cm 3Casting polycrystalline silicon, its shortcoming is that physical strength is lower, if reduce silicon wafer thickness, silicon chip is dressed up in the process such as assembly in processing, cell preparation or series of cells, damage, fragmentation easily, the silicon chip breakage rate increases, and certainly will cause the increase of cost.
Summary of the invention
The directional solidification casting polycrystalline silicon that the purpose of this invention is to provide a kind of doped germanium of high mechanical strength.
The directional solidification casting polycrystalline silicon of doped germanium of the present invention, containing concentration is 1 * 10 15~1 * 10 17/ cm 3Phosphorus or boron, it is characterized in that also containing concentration is 1 * 10 16~1 * 10 19/ cm 3Germanium.
The preparation method of the directional solidification casting polycrystalline silicon of doped germanium is as follows:
1) the silicon raw material is placed crucible, add phosphorus or boron and germanium, shove charge by doping content;
2) furnace chamber is evacuated, adds or do not add protection gas, the silicon raw material is heated to 1420 ℃~1450 ℃ gradually, all be fused into liquid until the silicon raw material;
3) by directional freeze, make silicon crystallization gradually from the bottom to top of fusing, form directional solidification casting polycrystalline silicon.
Above-mentioned germanium is meant that purity is at elemental Germanium more than 95% or germanium-silicon alloy.Directional freeze can realize by adjusting crucible position, stay-warm case position or thermal field.
Beneficial effect of the present invention is:
1. add germanium in casting polycrystalline silicon, utilize germanium can follow closely the character of dislocation raising physical strength in the assorted silicon, can strengthen the physical strength of casting polycrystalline silicon, silicon chip can be thinner like this, is used for solar cell, can significantly reduce cost.
2. on the basis of mixing phosphorus or boron casting polycrystalline silicon originally, mix a certain amount of germanium, germanium mix the electric property that does not influence casting polycrystalline silicon.
3. preparation technology is simple, and is easy to operate.
Embodiment
Further specify the present invention below in conjunction with embodiment.
Embodiment 1
The silicon raw material of 240kg is placed crucible, mix the doping agent boron of 20mg, the purity that adds 350mg is 99.999% germanium, realizes shove charge.Then furnace chamber is evacuated, uses Ar gas as protection gas.Again the silicon raw material is heated to 1440 ℃ gradually, all is fused into liquid until the silicon raw material.By promoting stay-warm case position and directional freeze, make silicon crystallization gradually from the bottom to top of fusing, form boron concentration and be about 9.5 * 10 15/ cm 3, germanium concentration is about 1 * 10 16/ cm 3Directional solidification casting polycrystalline silicon.
The room temperature fracture physical strength of the directional solidification casting polycrystalline silicon of this routine doped germanium is about 130N/mm 2, and only the room temperature of the casting polycrystalline silicon of boron-doping fracture physical strength is about 110N/mm 2, the casting polycrystalline silicon physical strength of mixing a casting polycrystalline silicon ratio boron-doping of germanium increases about 18%.
Embodiment 2
The silicon raw material of 240kg is placed crucible, mix the doping agent boron of 20mg, the purity that adds 350g is 99.9999% germanium, realizes shove charge.Then furnace chamber is evacuated, uses Ar gas as protection gas.Again the silicon raw material is heated to 1440 ℃ gradually, all is fused into liquid until the silicon raw material.By promoting stay-warm case position and directional freeze, make silicon crystallization gradually from the bottom to top of fusing, form boron concentration and be about 9.5 * 10 15/ cm 3, germanium concentration is about 1 * 10 19/ cm 3Directional solidification casting polycrystalline silicon.
The room temperature fracture physical strength of the directional solidification casting polycrystalline silicon of this routine doped germanium is about 145N/mm 2, and only the room temperature of the casting polycrystalline silicon of boron-doping fracture physical strength is about 110N/mm 2, the casting polycrystalline silicon physical strength of mixing a casting polycrystalline silicon ratio boron-doping of germanium increases about 30%.

Claims (1)

1. the directional solidification casting polycrystalline silicon of a doped germanium, containing concentration is 1 * 10 15~1 * 10 17/ cm 3Phosphorus or boron, it is characterized in that also containing concentration is 1 * 10 16~1 * 10 19/ cm 3Germanium.
CNB2006101549492A 2006-11-30 2006-11-30 A kind of directional solidification casting polycrystalline silicon of doped germanium Expired - Fee Related CN100570020C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2006101549492A CN100570020C (en) 2006-11-30 2006-11-30 A kind of directional solidification casting polycrystalline silicon of doped germanium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2006101549492A CN100570020C (en) 2006-11-30 2006-11-30 A kind of directional solidification casting polycrystalline silicon of doped germanium

Publications (2)

Publication Number Publication Date
CN1995487A true CN1995487A (en) 2007-07-11
CN100570020C CN100570020C (en) 2009-12-16

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101307487B (en) * 2007-05-16 2010-05-19 佳科太阳能硅(厦门)有限公司 Directional solidification method and its device for continuous production for polycrystalline silicon ingot
CN101597788B (en) * 2009-06-24 2011-12-07 浙江大学 Method for preparing cast nitrogen-doped monocrystalline silicon through melting polycrystalline silicon under nitrogen
CN102534772A (en) * 2012-02-28 2012-07-04 江苏协鑫硅材料科技发展有限公司 Method for growing large-grain cast polycrystalline silicon
CN103590104A (en) * 2010-03-12 2014-02-19 厦门大学 Zinc electrolytic recovery processing method
CN105002557A (en) * 2015-08-12 2015-10-28 常州天合光能有限公司 Gallium, germanium and boron co-doped polycrystalline silicon and preparation method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101307487B (en) * 2007-05-16 2010-05-19 佳科太阳能硅(厦门)有限公司 Directional solidification method and its device for continuous production for polycrystalline silicon ingot
CN101597788B (en) * 2009-06-24 2011-12-07 浙江大学 Method for preparing cast nitrogen-doped monocrystalline silicon through melting polycrystalline silicon under nitrogen
CN103590104A (en) * 2010-03-12 2014-02-19 厦门大学 Zinc electrolytic recovery processing method
CN102534772A (en) * 2012-02-28 2012-07-04 江苏协鑫硅材料科技发展有限公司 Method for growing large-grain cast polycrystalline silicon
CN102534772B (en) * 2012-02-28 2014-11-05 江苏协鑫硅材料科技发展有限公司 Method for growing large-grain cast polycrystalline silicon
CN105002557A (en) * 2015-08-12 2015-10-28 常州天合光能有限公司 Gallium, germanium and boron co-doped polycrystalline silicon and preparation method thereof

Also Published As

Publication number Publication date
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Granted publication date: 20091216