CN1975935A - 外部存储性能测试方法和装置 - Google Patents
外部存储性能测试方法和装置 Download PDFInfo
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- CN1975935A CN1975935A CNA2006101680173A CN200610168017A CN1975935A CN 1975935 A CN1975935 A CN 1975935A CN A2006101680173 A CNA2006101680173 A CN A2006101680173A CN 200610168017 A CN200610168017 A CN 200610168017A CN 1975935 A CN1975935 A CN 1975935A
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- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 238000000034 method Methods 0.000 claims abstract description 14
- 239000012634 fragment Substances 0.000 claims abstract description 11
- 238000006062 fragmentation reaction Methods 0.000 claims description 56
- 238000013467 fragmentation Methods 0.000 claims description 55
- 230000005055 memory storage Effects 0.000 claims description 28
- 238000009434 installation Methods 0.000 claims description 2
- 238000011056 performance test Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000013500 data storage Methods 0.000 description 1
- 238000012217 deletion Methods 0.000 description 1
- 230000037430 deletion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNB2006101680173A CN100440383C (zh) | 2006-12-15 | 2006-12-15 | 外部存储性能测试方法和装置 |
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CNB2006101680173A CN100440383C (zh) | 2006-12-15 | 2006-12-15 | 外部存储性能测试方法和装置 |
Publications (2)
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CN1975935A true CN1975935A (zh) | 2007-06-06 |
CN100440383C CN100440383C (zh) | 2008-12-03 |
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CNB2006101680173A Expired - Fee Related CN100440383C (zh) | 2006-12-15 | 2006-12-15 | 外部存储性能测试方法和装置 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101727394B (zh) * | 2009-12-28 | 2011-09-07 | 成都市华为赛门铁克科技有限公司 | 一种对存储设备进行性能测试的方法及装置 |
CN110221781A (zh) * | 2019-06-04 | 2019-09-10 | Oppo广东移动通信有限公司 | 一种磁盘碎片的制造方法、装置、存储介质及智能终端 |
CN111209257A (zh) * | 2020-01-15 | 2020-05-29 | 西安奥卡云数据科技有限公司 | 一种文件系统碎片化的方法及装置 |
CN111427733A (zh) * | 2020-03-13 | 2020-07-17 | 苏州浪潮智能科技有限公司 | 一种测试磁盘稳定性的方法、系统、设备及介质 |
CN115237352A (zh) * | 2022-08-03 | 2022-10-25 | 中国电子科技集团公司信息科学研究院 | 隐匿存储方法、装置、存储介质和电子设备 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1118025C (zh) * | 2000-10-23 | 2003-08-13 | 大唐电信科技股份有限公司微电子分公司 | 采用逻辑区间链表寻址的智能卡嵌入式软件系统实现方法 |
US20050050108A1 (en) * | 2003-08-21 | 2005-03-03 | Texas Instruments Incorporated | File system for digital processing systems with limited resources |
US6967869B1 (en) * | 2004-07-22 | 2005-11-22 | Cypress Semiconductor Corp. | Method and device to improve USB flash write performance |
-
2006
- 2006-12-15 CN CNB2006101680173A patent/CN100440383C/zh not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101727394B (zh) * | 2009-12-28 | 2011-09-07 | 成都市华为赛门铁克科技有限公司 | 一种对存储设备进行性能测试的方法及装置 |
CN110221781A (zh) * | 2019-06-04 | 2019-09-10 | Oppo广东移动通信有限公司 | 一种磁盘碎片的制造方法、装置、存储介质及智能终端 |
CN110221781B (zh) * | 2019-06-04 | 2022-08-23 | Oppo广东移动通信有限公司 | 一种磁盘碎片的制造方法、装置、存储介质及智能终端 |
CN111209257A (zh) * | 2020-01-15 | 2020-05-29 | 西安奥卡云数据科技有限公司 | 一种文件系统碎片化的方法及装置 |
CN111427733A (zh) * | 2020-03-13 | 2020-07-17 | 苏州浪潮智能科技有限公司 | 一种测试磁盘稳定性的方法、系统、设备及介质 |
CN115237352A (zh) * | 2022-08-03 | 2022-10-25 | 中国电子科技集团公司信息科学研究院 | 隐匿存储方法、装置、存储介质和电子设备 |
CN115237352B (zh) * | 2022-08-03 | 2023-08-15 | 中国电子科技集团公司信息科学研究院 | 隐匿存储方法、装置、存储介质和电子设备 |
Also Published As
Publication number | Publication date |
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CN100440383C (zh) | 2008-12-03 |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: WUXI VIMICRO ELECTRONIC CO., LTD. Free format text: FORMER OWNER: BEIJING ZHONGXING MICROELECTRONICS CO., LTD. Effective date: 20110127 |
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Free format text: CORRECT: ADDRESS; FROM: 100083 15/F, SHINING BUILDING, NO.35, XUEYUAN ROAD, HAIDIAN DISTRICT, BEIJING TO: 214028 610, NATIONAL INTEGRATED CIRCUIT DESIGN PARK (CHUANGYUAN BUILDING), NO.21-1, CHANGJIANG ROAD, NEW DISTRICT, WUXI CITY, JIANGSU PROVINCE |
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TR01 | Transfer of patent right |
Effective date of registration: 20110127 Address after: 214028 national integrated circuit design (21-1), Changjiang Road, New District, Jiangsu, Wuxi, China, China (610) Patentee after: Wuxi Vimicro Co., Ltd. Address before: 100083, Haidian District, Xueyuan Road, Beijing No. 35, Nanjing Ning building, 15 Floor Patentee before: Beijing Vimicro Corporation |
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C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081203 Termination date: 20121215 |