CN1969401B - Transconductance circuit including piezoelectric transducer, piezoelectric detector, and package thereof - Google Patents

Transconductance circuit including piezoelectric transducer, piezoelectric detector, and package thereof Download PDF

Info

Publication number
CN1969401B
CN1969401B CN2005800108689A CN200580010868A CN1969401B CN 1969401 B CN1969401 B CN 1969401B CN 2005800108689 A CN2005800108689 A CN 2005800108689A CN 200580010868 A CN200580010868 A CN 200580010868A CN 1969401 B CN1969401 B CN 1969401B
Authority
CN
China
Prior art keywords
circuit
transconductance
field effect
effect transistor
transducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2005800108689A
Other languages
Chinese (zh)
Other versions
CN1969401A (en
Inventor
埃里克·斯科特·米科
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suren Systems Ltd
Original Assignee
Suren Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/812,603 external-priority patent/US7042134B2/en
Application filed by Suren Systems Ltd filed Critical Suren Systems Ltd
Publication of CN1969401A publication Critical patent/CN1969401A/en
Application granted granted Critical
Publication of CN1969401B publication Critical patent/CN1969401B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Amplifiers (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Networks Using Active Elements (AREA)

Abstract

Transconductance monitoring and amplifying circuit for a piezoelectric transducer (22, 28, 34, 40), such as may be used in a motion detector system, comprising: FET (Q1), piezoelectric transducer (22, 28, 34, 40) (and, thus, signal voltage reference), which floats between the gate and source of FET (Q1), as opposed to being connected to the common ground of the circuit. This allows for the generation of a larger detector signal with the use of a relatively inexpensive FET (Q1) rather than a relatively more expensive high impedance operational amplifier as would be necessary in a conventional transconductance circuit. The FET (Q1) and transducers (22, 28, 34, 40) may be housed in a single four-pin package (54).

Description

包括压电换能器的跨导电路、压电检测器以及其包装 Transconductance circuit including piezoelectric transducer, piezoelectric detector and packaging thereof

技术领域technical field

本发明一般地涉及一种压电换能器系统。The present invention generally relates to a piezoelectric transducer system.

背景技术Background technique

压电传感器系统在广泛的应用中使用。仅作为一个非限制的例子,一些安全系统使用无源红外(PIR)运动传感器来检测在监控区中的移动,所述传感器检测由于对象(例如人)和其背景环境之间的温差而引起的远红外辐射(8-14微米波长)的变化。在检测时,运动传感器通常发送指示给主机系统,主机系统可转而激活侵入“警报”、改变室内照明、打开门、或执行一些其它功能。有利地,这种传感器简单且相对便宜。Piezoelectric sensor systems are used in a wide variety of applications. As just one non-limiting example, some security systems detect movement within a surveillance zone using passive infrared (PIR) motion sensors that detect motion due to temperature differences between an object (such as a person) and its background environment. Changes in far-infrared radiation (8-14 micron wavelength). Upon detection, the motion sensor typically sends an indication to the host system, which may in turn activate an intrusion "alarm," change interior lighting, open a door, or perform some other function. Advantageously, such sensors are simple and relatively inexpensive.

PIR传感器的检测器可包括热电检测器,其测量远红外辐射的变化。这种检测器通过“压电效应”来工作,所述压电效应在机械应变存在的情况下引起电荷迁移。热电检测器采用电容器的形式——两个由电介质隔开的导电板。电介质可以是压电陶瓷。当远红外辐射引起陶瓷温度变化(并因而有一些机械应变)时,电荷从一个板迁移到另一个板。如果没有外部电路(或者非常高阻抗的电路)连接到检测器(“电压输出模式”),则可测量的电压表现为“电容器”电荷。如果相对低阻抗的外部电路连接在所述板之间(“电流输出模式”),则电流流动。Detectors of PIR sensors may include pyroelectric detectors, which measure changes in far-infrared radiation. Such detectors work by means of the "piezoelectric effect", which induces a migration of charges in the presence of mechanical strain. Pyroelectric detectors take the form of capacitors—two conducting plates separated by a dielectric. The dielectric may be piezoelectric ceramics. When far-infrared radiation causes a temperature change (and thus some mechanical strain) in the ceramic, charges migrate from one plate to the other. If no external circuitry (or very high impedance circuitry) is connected to the detector ("voltage output mode"), the measurable voltage appears as a "capacitor" charge. If a relatively low impedance external circuit is connected between the plates ("current output mode"), current flows.

电流输出模式下的压电检测器被放置在跨导放大器电路中,其中,作为允许换能器的板子之间的电压基本上变化的替代,电荷通过高阻抗运算放大器的反馈电阻器传导以创建用于建立电路输出信号的电压。所谓“高”阻抗是指至少107欧姆的阻抗。The piezoelectric detector in current output mode is placed in a transconductance amplifier circuit, where, instead of allowing the voltage between the plates of the transducer to vary substantially, the charge is conducted through the feedback resistor of a high impedance operational amplifier to create The voltage used to establish the output signal of a circuit. By "high" impedance is meant an impedance of at least 107 ohms.

本发明涉及提供跨导电路的便宜版本。如这里所理解的,因为必须测量少量由所述压电检测器产生的电荷,所以之前的压电检测器的跨导电路要求相对昂贵的高阻抗运算放大器。如这里所进一步理解的,可利用这里的发明概念来提供较便宜的电路。The present invention involves providing an inexpensive version of the transconductance circuit. As understood herein, previous transconductance circuits for piezoelectric detectors required relatively expensive high-impedance operational amplifiers because the small amount of charge generated by the piezoelectric detector had to be measured. As further understood herein, the inventive concepts herein can be utilized to provide less expensive circuits.

发明内容Contents of the invention

公开了跨导电路的若干版本,例如可在红外运动传感器中实现的压电远红外辐射检测器。Several versions of transconductance circuits are disclosed, such as piezoelectric far-infrared radiation detectors that can be implemented in infrared motion sensors.

由此,压电检测器包括压电换能器和与该换能器电连接的跨导电路。跨导电路定义公共接地和没有直接连接到公共接地的信号电压基准。Thus, a piezoelectric detector includes a piezoelectric transducer and a transconductance circuit electrically connected to the transducer. The transconductance circuit defines a common ground and a signal voltage reference that is not directly connected to the common ground.

在一些实施例中,跨导电阻器可连接到场效应晶体管(FET)的栅极,并且跨导电路不具有高阻抗运算放大器。输出电阻器可潜在地通过双极结晶体管(BJT)连接到FET的源极,双极结晶体管的基极可连接到FET的源极。如果需要,以传感器信号工作频率提供近似短路电路的“短路”电容器可将FET的漏极连接到FET的源极,并且,交流电(AC)耦合的输出反馈分压器可连接在FET的源极和与FET的栅极连接的跨导电阻器之间。In some embodiments, a transconductance resistor may be connected to the gate of a field effect transistor (FET), and the transconductance circuit does not have a high impedance operational amplifier. The output resistor can be connected to the source of the FET potentially through a bipolar junction transistor (BJT), the base of which can be connected to the source of the FET. If desired, a "short circuit" capacitor that provides an approximate short circuit at the operating frequency of the sensor signal can connect the drain of the FET to the source of the FET, and an alternating current (AC) coupled output feedback divider can be connected at the source of the FET and the transconductance resistor connected to the gate of the FET.

在特定的非限制实施例中,跨导电阻器通过标准输入阻抗运算放大器连接到FET的栅极。运算放大器的倒相输入可连接到FET的源极,并且运算放大器的非倒相输入可连接到信号电压基准。并且,AC耦合的输出反馈分压器可连接在运算放大器的输出和与FET的栅极连接的跨导电阻器之间。In a specific non-limiting embodiment, the transconductance resistor is connected to the gate of the FET through a standard input impedance operational amplifier. The inverting input of the op amp can be connected to the source of the FET, and the non-inverting input of the op amp can be connected to the signal voltage reference. Also, an AC-coupled output feedback divider may be connected between the output of the operational amplifier and the transconductance resistor connected to the gate of the FET.

在另一方面,在包括压电换能器的跨导检测器电路中,场效应晶体管(FET)连接到用于放大其信号的换能器。该电路还具有电路公共接地和信号电压基准节点,该节点处于不同于接地的AC电位。On the other hand, in a transconductance detector circuit including a piezoelectric transducer, a field effect transistor (FET) is connected to the transducer for amplifying its signal. The circuit also has a circuit common ground and a signal voltage reference node that is at an AC potential different from ground.

在又一个方面,电路包括压电换能器和跨导放大器电路,后者沿着电通路接收来自换能器的信号并处理该信号以产生输出。跨导放大器电路不包括高阻抗运算放大器。In yet another aspect, a circuit includes a piezoelectric transducer and a transconductance amplifier circuit that receives a signal from the transducer along an electrical path and processes the signal to produce an output. Transconductance amplifier circuits do not include high impedance op amps.

在一个电路实施方式中,压电检测器包括压电换能器和电连接到该换能器的跨导电路。如前所述,跨导电路包括连接到场效应晶体管(FET)的栅极的压电换能器,并且跨导电路不具有运算放大器。但是,跨导电路包括连接到FET栅极的跨导电阻器和除了该FET之外的第一和第二晶体管。在该最后电路的一个特定实施方式中,反馈电路部分包括第一晶体管和第二晶体管,并且第二晶体管电连接到跨导电阻器和第一晶体管。In one circuit implementation, a piezoelectric detector includes a piezoelectric transducer and a transconductance circuit electrically connected to the transducer. As previously mentioned, the transconductance circuit includes a piezoelectric transducer connected to the gate of a field effect transistor (FET), and the transconductance circuit does not have an operational amplifier. However, the transconductance circuit includes a transconductance resistor connected to the gate of the FET and first and second transistors other than the FET. In a particular embodiment of this last circuit, the feedback circuit portion comprises a first transistor and a second transistor, and the second transistor is electrically connected to the transconductance resistor and the first transistor.

在另一方面,压电检测器包装包括容纳了三个部件,即压电换能器、定义栅极的场效应晶体管(FET)、和与栅极连接的跨导电阻器的外壳。第一到第四电连接器位于外壳上并且在外壳内分别电连接到FET源极、FET漏极、压电换能器、和跨导电阻器。所述连接器机械上可与外壳外的电路元件耦合。In another aspect, a piezoelectric detector package includes a housing housing three components, namely a piezoelectric transducer, a field effect transistor (FET) defining a gate, and a transconductance resistor connected to the gate. First through fourth electrical connectors are located on the housing and electrically connected within the housing to the FET source, the FET drain, the piezoelectric transducer, and the transconductance resistor, respectively. The connector is mechanically coupleable to circuit elements outside the housing.

在特定实施例中,反馈电路部分线路可连接到第一连接器,以便连接到由FET源极驱动的反馈电路部分。并且,电源线路可连接到第二连接器,以便将电源连接到FET的漏极。此外,电路线路可连接到第三连接器,以便将至少一部分的跨导电路连接到换能器。此外,反馈线路可连接到第四连接器,以便将至少一部分电路连接到跨导电阻器。In a particular embodiment, the feedback circuit portion may be wired to the first connector for connection to the feedback circuit portion driven by the source of the FET. Also, a power supply line may be connected to a second connector to connect the power supply to the drain of the FET. Additionally, a circuit line can be connected to a third connector to connect at least a portion of the transconductance circuit to the transducer. Additionally, a feedback line can be connected to a fourth connector to connect at least a portion of the circuit to the transconductance resistor.

在另一个方面,用于可操作地将与场效应晶体管(FET)的栅极耦合的压电换能器与跨导电路接合的方法,包括在单个外壳内提供压电换能器、FET、和跨导电阻器。该方法还包括在外壳上提供四个连接器,并且将这些连接器连接到跨导电路的一些部分。In another aspect, a method for operably coupling a piezoelectric transducer coupled to a gate of a field effect transistor (FET) with a transconductance circuit comprises providing within a single housing the piezoelectric transducer, FET, and transconductance resistors. The method also includes providing four connectors on the housing and connecting the connectors to portions of the transconductance circuit.

附图说明Description of drawings

参考附图,可最好地理解本发明有关其结构和操作的细节,在附图中,类似的引用标记表示类似的部分,并且其中:Details of the invention as to its structure and operation are best understood by reference to the accompanying drawings, in which like reference numerals indicate like parts, and in which:

图1是本系统体系结构的框图;Fig. 1 is the block diagram of this system architecture;

图2是本跨导电路的第一实施例的示意图;Fig. 2 is the schematic diagram of the first embodiment of this transconductance circuit;

图3是本跨导电路的第二实施例的示意图;Fig. 3 is the schematic diagram of the second embodiment of this transconductance circuit;

图4是本跨导电路的第三实施例的示意图;Fig. 4 is the schematic diagram of the third embodiment of this transconductance circuit;

图5是本跨导电路的第四实施例的示意图;Fig. 5 is the schematic diagram of the fourth embodiment of this transconductance circuit;

图6是图2中所示的第一实施例的修改版本的示意图,其中到换能器的交流(AC)和直流(DC)连接彼此分开以避免如果足够高就可能使电路饱和的DC输出;Figure 6 is a schematic diagram of a modified version of the first embodiment shown in Figure 2 in which the alternating current (AC) and direct current (DC) connections to the transducer are separated from each other to avoid a DC output that could saturate the circuit if high enough ;

图7是图3中所示的第二实施例的修改版本的示意图,其中到换能器的AC和DC连接彼此分开;Figure 7 is a schematic diagram of a modified version of the second embodiment shown in Figure 3, in which the AC and DC connections to the transducer are separated from each other;

图8是图4中所示的第三实施例的修改版本的示意图,其中到换能器的AC和DC连接彼此分开;Figure 8 is a schematic diagram of a modified version of the third embodiment shown in Figure 4, in which the AC and DC connections to the transducer are separated from each other;

图9是图5中所示的第四实施例的修改版本的示意图,其中到换能器的AC和DC连接彼此分开;Figure 9 is a schematic diagram of a modified version of the fourth embodiment shown in Figure 5, in which the AC and DC connections to the transducers are separated from each other;

图10是本跨导电路的另一个可替换实施例的示意图;和Figure 10 is a schematic diagram of another alternative embodiment of the present transconductance circuit; and

图11是换能器包装的透视图。Figure 11 is a perspective view of a transducer package.

具体实施方式Detailed ways

初始地参考图1,示出实例的非限制性系统,一般地用10来表示,用于检测移动对象12,比如人。系统10包括光学系统14,其可包括适当的反射镜、透镜和其它在本领域中已知用来将对象12的图像聚焦在无源红外(PIR)检测器系统16上的部件。响应于移动对象12,PIR检测器系统16生成可由信号处理电路18进行过滤、放大和数字化的信号,并且处理系统20(比如,计算机或特定用途集成电路)接收该信号并确定是否激活可听见或可看见的警报21或其它输出设备,比如用于门的激活系统,等等。Referring initially to FIG. 1 , there is shown an example non-limiting system, generally indicated at 10 , for detecting a moving object 12 , such as a person. System 10 includes optical system 14 , which may include appropriate mirrors, lenses, and other components known in the art for focusing an image of object 12 onto passive infrared (PIR) detector system 16 . In response to moving object 12, PIR detector system 16 generates a signal that may be filtered, amplified, and digitized by signal processing circuitry 18, and processing system 20 (e.g., a computer or application specific integrated circuit) receives the signal and determines whether to activate the audible or A visible alarm 21 or other output device, such as an activation system for a door, etc.

已经描述了本发明的压电检测器的一个应用后,现在集中到图2-5,它们示出了本发明概念的各种实施方式。如图2中所示,压电换能器22被提供在具有直流(DC)电压源26的跨导电路24中。电路24可被看作为用于压电换能器22的监控电路。并且,电路24阻抗缓冲(impedance-buffer)和放大来自换能器22的信号。Having described one application of the piezoelectric detector of the present invention, attention is now directed to Figures 2-5, which illustrate various embodiments of the inventive concept. As shown in FIG. 2 , a piezoelectric transducer 22 is provided in a transconductance circuit 24 with a direct current (DC) voltage source 26 . Circuitry 24 may be viewed as a monitoring circuit for piezoelectric transducer 22 . Also, circuitry 24 impedance-buffers and amplifies the signal from transducer 22 .

根据本原理,“跨导电路”是一个这样的电路,其中作为允许换能器(例如换能器22)的板子之间的电压基本上变化的替代,电荷通过电阻器传导以创建用于建立电路输出信号的电压。In accordance with the present principles, a "transconductance circuit" is a circuit in which, instead of allowing the voltage between the plates of a transducer (such as transducer 22) to vary substantially, charge is conducted through a resistor to create a The voltage of the circuit output signal.

压电换能器22可以是任何压电换能器。在一个示例说明中,压电换能器22是通过“压电效应”测量远红外辐射变化的热电检测器,所述压电效应在机械应变存在的情况下引起电荷迁移,所述机械应变可由例如远红外辐射引起的温度变化而诱发。压电换能器22可以采取电容器的形式,即两个由电介质隔开的导电板,电介质可以是压电陶瓷。当压电换能器22的陶瓷经受机械应变时,电荷从一个板迁移到另一个板。Piezoelectric transducer 22 may be any piezoelectric transducer. In one illustrative illustration, piezoelectric transducer 22 is a pyroelectric detector that measures changes in far-infrared radiation through the "piezoelectric effect," which induces charge migration in the presence of mechanical strain, which can be determined by For example, it is induced by temperature changes caused by far-infrared radiation. The piezoelectric transducer 22 may take the form of a capacitor, ie two conductive plates separated by a dielectric, which may be a piezoelectric ceramic. When the ceramic of piezoelectric transducer 22 is subjected to mechanical strain, charge migrates from one plate to the other.

在如图2中所示的电路24中,换能器22连接在结型场效应晶体管(FET)Q1的源极和栅极之间,在非限制性实施例中,该结型场效应晶体管可由型号2N4338的FET实现。电源26连接到所示FET Q1的漏极,所述电源可以是通过一个或多个干电池组建立的五伏特电源。In circuit 24 as shown in FIG. 2, transducer 22 is connected between the source and gate of junction field effect transistor (FET) Q1 which, in a non-limiting embodiment, Can be realized by FET model 2N4338. A power source 26 is connected to the drain of the shown FET Q1, which may be a five volt power source established from one or more dry battery packs.

如图2中所示,通过将FET Q1的源极电流传递经过输出电阻器R1而变化为电压。该电压经由跨导电阻器R2而被连接并引起电流流回FET Q1的栅极,其中电阻器R1、R2连接到接地,当时换能器22在FET Q1的源极和栅极之间“浮动”(即,其信号基准电压没有连接到接地)。As shown in Figure 2, the source current of FET Q1 is changed to a voltage by passing it through output resistor R1. This voltage is connected via transconductance resistor R2 and causes current to flow back to the gate of FET Q1, where resistors R1, R2 are connected to ground, while transducer 22 is "floating" between the source and gate of FET Q1. ” (that is, its signal reference voltage is not connected to ground).

利用上述结构,本领域技术人员将认识到,FET Q1通过变化输出电阻器R1两端的电压来控制经过跨导电阻器R2到FET Q1的栅极的反馈电流,所述电阻器R1两端的电压经由接地节点而在跨导电阻器R2之间施加相同变化的电压。在输出电阻器R1两端测量电路24输出的交流(AC)分量,其可在机械上以足够的精度通过将换能器22的输出电流与跨导电阻器R2的电阻相乘来计算,以反应实际的电路功能。所述输出的直流(DC)分量由FET Q1的栅极-源极工作电压来确定。Using the above structure, those skilled in the art will recognize that FET Q1 controls the feedback current through transconductance resistor R2 to the gate of FET Q1 by varying the voltage across output resistor R1 via ground node while applying the same varying voltage across transconductance resistor R2. The alternating current (AC) component of the output of circuit 24 is measured across output resistor R1, which can be calculated mechanically with sufficient accuracy by multiplying the output current of transducer 22 by the resistance of transconductance resistor R2 to give Reflect the actual circuit function. The direct current (DC) component of the output is determined by the gate-source operating voltage of FET Q1.

换句话说,与传统非跨导电路对比,电路24的信号电压基准节点相对电路的公共接地而浮动,在传统非跨导电路中,信号电压基准节点接地并且FET被用作为以电压输出模式工作的压电检测器的缓冲器。因此,与传统电压输出模式电路比较,跨导电路结构的该组合产生了特性更大的信号电压,而有利地允许使用相对便宜的FET Q1,所述FETQ1与传统电压输出模式电路中使用的类型相同,以替代相对更贵的高阻抗运算放大器。以另一方式看来,与传统电压输出模式电路对比,图2中所示的电路24实质上具有三个功能块,即是,换能器22、FET Q1、和跨导电阻器R2,其中后者是反馈元件。In other words, the signal voltage reference node of circuit 24 is floating with respect to the common ground of the circuit in contrast to conventional non-transconductance circuits where the signal voltage reference node is grounded and the FETs are used to operate in voltage output mode buffer for the piezoelectric detector. Thus, this combination of transconductance circuit configurations produces a more characteristic signal voltage than conventional voltage output mode circuits, while advantageously allowing the use of a relatively inexpensive FET Q1 of the type used in conventional voltage output mode circuits. Same, to replace relatively more expensive high-impedance op amps. Viewed in another way, in contrast to conventional voltage output mode circuits, the circuit 24 shown in FIG. 2 has essentially three functional blocks, namely, the transducer 22, the FET Q1, and the transconductance resistor R2, where The latter is the feedback element.

图3-5示出了向图2的电路添加了部件的各种电路,用于增加由电路产生的进一步的信号。如图3中所示,压电换能器28被提供在具有DC电压源32的跨导电路30中。在如图3中所示的电路30中,换能器28连接在结型场效应晶体管(FET)Q1的源极和栅极之间,并因此电路30的信号电压基准相对于电路公共接地而浮动。电源32通过漏极电阻器R9连接到FET Q1的漏极。3-5 illustrate various circuits with components added to the circuit of FIG. 2 for adding further signals generated by the circuit. As shown in FIG. 3 , the piezoelectric transducer 28 is provided in a transconductance circuit 30 with a DC voltage source 32 . In circuit 30 as shown in FIG. 3, transducer 28 is connected between the source and gate of junction field effect transistor (FET) Q1, and thus the signal voltage reference of circuit 30 is relative to circuit common ground. float. Power supply 32 is connected to the drain of FET Q1 through drain resistor R9.

在图3中所示的电路中,除了下面讨论的另外的电路元件之外,不仅提供了FET Q1,还提供了双极结晶体管(BJT)Q2。如果希望,便宜的标准输入阻抗运算放大器可用来代替BJT Q2。“标准输入阻抗”是指不超过107欧姆的阻抗。In the circuit shown in FIG. 3, in addition to the additional circuit elements discussed below, not only FET Q1 but also bipolar junction transistor (BJT) Q2 are provided. If desired, an inexpensive standard input impedance op amp can be used in place of the BJT Q2. "Standard input impedance" means an impedance not exceeding 10 7 ohms.

在图3中所示的实施例中,BJT Q2的基极连接到换能器28并连接到所示的FET Q1的源极,其中BJT Q2的发射极连接到接地的输出电阻器R1并且BJT Q2的集电极连接到电源32,并且通过漏极电阻器R9与FET Q1的漏极分离。因为由BJT Q2提供的额外增益并且因为其基极连接到FETQ1的源极,由电阻器R3、R4和电容器C3建立的输出反馈分压器可被添加,以便将在跨导电阻器R2两端产生的基本跨导电压放大例如10倍,并将该电压作为电流通过跨导电阻器R2反馈到FET Q1的栅极。因此,图3中电路30输出(在输出电阻器R1两端测量)的AC分量可以是图2中所示的电路24输出的十倍,前提是向两个电路换能器提供相同的激励能量。In the embodiment shown in Figure 3, the base of BJT Q2 is connected to transducer 28 and to the source of FET Q1 as shown, with the emitter of BJT Q2 connected to output resistor R1 at ground and the BJT The collector of Q2 is connected to power supply 32 and is separated from the drain of FET Q1 by drain resistor R9. Because of the extra gain provided by BJT Q2 and because its base is connected to the source of FET Q1, an output feedback voltage divider established by resistors R3, R4, and capacitor C3 can be added so that the voltage across transconductance resistor R2 The resulting basic transconductance voltage is amplified by a factor of, say, 10, and this voltage is fed back as current through transconductance resistor R2 to the gate of FET Q1. Thus, the AC component of the output of circuit 30 in Figure 3 (measured across output resistor R1) can be ten times greater than the output of circuit 24 shown in Figure 2, provided the same excitation energy is supplied to both circuit transducers .

此外,在图3中所示的电路30中,FET Q1的漏极实质上通过短路电容器C5被短路(为AC信号)到FET Q1的源极,如前面提到的,FET Q1的源极是信号电压基准节点。FET Q1的漏极实质上短路连接到信号电压基准节点,FET Q1的内部电容不再建立不期望的反馈元件,从而扩展电路30的高频响应。Furthermore, in circuit 30 shown in FIG. 3, the drain of FET Q1 is essentially shorted (to an AC signal) through shorting capacitor C5 to the source of FET Q1, which, as previously mentioned, is the signal voltage reference node. With the drain of FET Q1 essentially shorted to the signal voltage reference node, the internal capacitance of FET Q1 no longer creates an undesirable feedback element, thereby extending the high frequency response of circuit 30 .

现在参考图4,压电换能器34被提供在具有DC电压源38的跨导电路36中。在如图4中所示的电路36中,换能器34连接在结型场效应晶体管(FET)Q1的源极和栅极之间,并因此电路36的信号电压基准相对于电路公共接地而浮动。如所示的,电源38连接到FET Q1的漏极。Referring now to FIG. 4 , a piezoelectric transducer 34 is provided in a transconductance circuit 36 with a DC voltage source 38 . In circuit 36 as shown in FIG. 4, transducer 34 is connected between the source and gate of junction field effect transistor (FET) Q1, and thus the signal voltage reference of circuit 36 is relative to circuit common ground. float. As shown, power supply 38 is connected to the drain of FET Q1.

在图4中所示的实施例中,便宜的标准输入阻抗运算放大器U1具有其与换能器34和FET Q1的源极连接的倒相输入,FET Q1的源极间接连接到接地(即通过电阻器R4)。运算放大器U1的输出通过跨导电阻器R3被反馈到FET Q1的栅极。并且,运算放大器U1的非倒相输入连接到分压器,该分压器由与电源38连接的电阻器R1和接地的电阻器R2构成。In the embodiment shown in FIG. 4, an inexpensive standard input impedance op amp U1 has its inverting input connected to the transducer 34 and the source of FET Q1, which is indirectly connected to ground (i.e., via resistor R4). The output of operational amplifier U1 is fed back to the gate of FET Q1 through transconductance resistor R3. Also, the non-inverting input of the operational amplifier U1 is connected to a voltage divider consisting of a resistor R1 connected to the power supply 38 and a resistor R2 connected to ground.

如前述电路那样的情况,从源极电流产生的FET源极电阻器R2两端的电压作为电流被反馈给FET Q1的栅极。反馈路径扩展通过如图4中所示的电路36中的运算放大器U1并通过跨导电阻器R3。跨导电流求和节点位于FET Q1的栅极,其缓冲运算放大器U1的倒相输入。运算放大器U1的非倒相输入是电路36的“浮动”信号电压基准节点。运算放大器U1改变其输出电源以控制经过跨导电阻器R3的反馈电流,其中电路的输出信号是运算放大器U1的输出电压的AC分量,DC分量由FET Q1的栅极-源极工作电压确定。As was the case with the previous circuit, the voltage across FET source resistor R2 resulting from the source current is fed back as current to the gate of FET Q1. The feedback path extends through operational amplifier U1 in circuit 36 as shown in FIG. 4 and through transconductance resistor R3. The transconductance current summing node is at the gate of FET Q1, which buffers the inverting input of op amp U1. The non-inverting input of operational amplifier U1 is the “floating” signal voltage reference node for circuit 36 . Op-amp U1 varies its output supply to control the feedback current through transconductance resistor R3, where the output signal of the circuit is the AC component of the output voltage of op-amp U1 and the DC component is determined by the gate-source operating voltage of FET Q1.

图4中的电路36为信号电压基准节点提供了实质上恒定的电压(由运算放大器U1在其倒相输入处保持)。由此,相比较放大器输出和作为经过跨导电阻器R3的电流而反馈到FET Q1栅极的反馈电压,FET Q1的漏极-栅极电压实质上是恒定的。因此,不存在因FET Q1的内部漏极-栅极电容的任何影响而引起的高频限制,因此图3中只有晶体管的电路中示出的电阻器-电容器对R9-C5在图4的电路36中是不需要的。Circuit 36 in FIG. 4 provides a substantially constant voltage to the signal voltage reference node (held by operational amplifier U1 at its inverting input). Thus, the drain-gate voltage of FET Q1 is substantially constant compared to the amplifier output and the feedback voltage fed back to the gate of FET Q1 as a current through transconductance resistor R3. Therefore, there is no high-frequency limitation due to any effect of the internal drain-gate capacitance of FET Q1, so the resistor-capacitor pair R9-C5 shown in the transistor-only circuit of Figure 3 is in the circuit of Figure 4 36 is not required.

图5示出在具有DC电压源44的跨导电路42中的压电换能器40,除了在运算放大器U1的非倒相输入和反馈电阻器R3之间提供电阻器R5和电容器C3、在电阻器R5/电容器C3对的抽头和FET Q1的栅极之间提供跨导电阻R6之外,其实质上在所有方面都与图4中示出的电路36相同。由运算放大器U1提供的充足增益,由电阻器R3和R5以及电容器C3建立的输出分压器可将基本跨导电压放大例如十倍。FIG. 5 shows a piezoelectric transducer 40 in a transconductance circuit 42 with a DC voltage source 44, except that resistor R5 and capacitor C3 are provided between the non-inverting input of operational amplifier U1 and feedback resistor R3. It is substantially identical in all respects to the circuit 36 shown in FIG. 4 except that a transconductance resistance R6 is provided between the tap of the resistor R5/capacitor C3 pair and the gate of the FET Q1. With sufficient gain provided by operational amplifier U1, the output voltage divider established by resistors R3 and R5 and capacitor C3 can amplify the basic transconductance voltage by a factor of, say, ten.

图6-9分别对应于图2-5,各自的电路实质上如所示的相同,除了在图6-9中所示的变化之外,其中到换能器的AC和DC连接彼此分开,以避免这种高DC输出使电路进入称为“饱和”的条件,在该条件下,电路DC输出电压应当(从理想计算的立场看)要比电源的阳极端更正或者比电源的阴极端更负。因为这在实际上是不可能的,电路DC输出可能对于电源的阳极端或阴极端而变为“被卡住”,在该情况下,不可能有AC信号,否则会使电路完全不能工作。这种高DC输出可源自由于在一些换能器中存在的并联泄漏电阻所引起的DC放大。当正确工作时,如图6-9中所示的电路正如它们在图2-5中各自的对应部分来工作,因为在本发明中使用的正是AC信号,而不是DC信号。Figures 6-9 correspond to Figures 2-5, respectively, with the respective circuits being substantially the same as shown, except for the changes shown in Figures 6-9, in which the AC and DC connections to the transducers are separated from each other, To avoid such a high DC output from putting the circuit into a condition known as "saturation", the circuit DC output voltage should (from an ideal calculation standpoint) be more positive than the anode terminal of the power supply or more positive than the cathode terminal of the power supply. burden. Since this is not practically possible, the circuit DC output could become "stuck" to either the anode or cathode terminals of the power supply, in which case no AC signal would be possible, otherwise rendering the circuit completely inoperable. This high DC output may result from DC amplification due to parallel leakage resistance present in some transducers. When operating correctly, the circuits shown in Figures 6-9 work just like their respective counterparts in Figures 2-5, since it is AC signals, not DC signals, that are used in the present invention.

在图6和8中通过将换能器输出信号的AC分量传递经过AC-通过DC-阻塞的电容器Cac、从这里再到信号处理电路,即图6中的FET Q1和图8中的运算放大器U1,同时将换能器输出信号的DC分量通过DC接地电阻器RDC而分流到接地,来完成上述的从DC中分离AC。另一方面在图7和9中,认识到AC-通过DC-阻塞的电容器C3已经存在于这些电路中,在这些电路中相应换能器的输出连接到电容器C3和电阻器(图7中R4,图9中R5)之间的线路。In Figures 6 and 8 by passing the AC component of the transducer output signal through the AC-through DC-blocking capacitor C ac , and from there to the signal processing circuit, ie FET Q1 in Figure 6 and the operation in Figure 8 The amplifier U1 shunts the DC component of the output signal of the transducer to the ground through the DC grounding resistor R DC at the same time, so as to complete the above separation of AC from DC. On the other hand in Figures 7 and 9, it is recognized that AC-by DC-blocking capacitor C3 is already present in these circuits where the output of the corresponding transducer is connected to capacitor C3 and resistor (R4 in Figure 7 , the line between R5) in Figure 9.

图10示出与图9中所示电路类似的电路,其中类似的引用标记表示类似部分,但是其中运算放大器U1由与NPN晶体管Q4级联的PNP晶体管Q3替换,以达到较便宜的实现。更具体地,在图10中,跨导电阻R6连接到FET Q1的栅极,其漏极连接到电源线46,并且其源极通过在其中放置了PNP晶体管Q3的输出线48而连接到包括电阻器R1和R2的分压电路,这些电阻通过建立FET Q1的源极电压而为FET Q1的工作提供偏压信号。PNP晶体管Q3缓冲该偏置信号以建立FET Q1的源极偏压。并且如所示的,晶体管Q3将FET漏极-到-源极输出电流传递到NPN晶体管Q4的基极,其中,由于晶体管Q4的增益,产生相称的更大晶体管输出电流(集电极-发射极电流),其转而通过与电源电压连接的负载电阻被转换回为电压。Figure 10 shows a circuit similar to that shown in Figure 9, wherein like reference numerals indicate like parts, but in which operational amplifier U1 is replaced by a PNP transistor Q3 cascaded with an NPN transistor Q4 for a less expensive implementation. More specifically, in FIG. 10, transconductance resistor R6 is connected to the gate of FET Q1, its drain is connected to power supply line 46, and its source is connected through output line 48 in which PNP transistor Q3 is placed to include The voltage divider circuit of resistors R1 and R2, these resistors provide the bias signal for the operation of FET Q1 by establishing the source voltage of FET Q1. PNP transistor Q3 buffers this bias signal to establish the source bias of FET Q1. And as shown, transistor Q3 passes the FET drain-to-source output current to the base of NPN transistor Q4, where, due to the gain of transistor Q4, a commensurately larger transistor output current (collector-emitter current), which in turn is converted back to a voltage through a load resistor connected to the supply voltage.

如前面那样通过反馈线路50将来自FETQ1源极的反馈信号提供给跨导电阻器R6,并且如上所述,在图10中所示的特定电路中,其是通过PNP晶体管Q3和NPN晶体管Q4以及反馈电阻器R3而提供的。根据相对于图5和9如上所述的原理,压电换能器经由换能器线路52连接到电容器C3(在电路的分压器部分),其提供到信号电压基准节点的AC连接。The feedback signal from the source of FETQ1 is provided to transconductance resistor R6 via feedback line 50 as before, and as described above, in the particular circuit shown in FIG. 10, via PNP transistor Q3 and NPN transistor Q4 and Feedback resistor R3 is provided. According to the principles described above with respect to Figures 5 and 9, the piezoelectric transducer is connected via transducer line 52 to capacitor C3 (in the voltage divider part of the circuit), which provides an AC connection to the signal voltage reference node.

上面所有电路包括并联连接于FET栅极的压电换能器和跨导电阻器,FET的漏极连接到电源并且源极连接到电路的反馈部分。图11示出了为了方便可在单个包装内提供压电换能器、FET和跨导电阻器,在该包装上提供诸如但不限于是引脚的四个连接器,以将换能器、FET源极、FET栅极、和跨导电阻器连接到上述电路。其它连接器结构,例如插座、焊盘、焊接的电线等等可以使用,只要这些连接器可从外壳的外部访问。All of the above circuits consist of a piezoelectric transducer and a transconductance resistor connected in parallel to the gate of a FET with the drain connected to the power supply and the source connected to the feedback portion of the circuit. Figure 11 shows that for convenience the piezoelectric transducer, FET and transconductance resistor can be provided in a single package on which four connectors such as but not limited to pins are provided to connect the transducer, The FET source, FET gate, and transconductance resistors are connected to the above circuit. Other connector configurations such as sockets, pads, soldered wires, etc. may be used as long as the connectors are accessible from the outside of the housing.

由此,图11示出了包装结构,一般地由54表示,其包括空的、平行六面体形的外壳55,该外壳包括四个外部连接器56、58、60、62,比如但不限于是引脚。空外壳55容纳了如上所示任何电路中的所述压电换能器、FET、和跨导电阻器。由此,第一和第二连接器56和58可电连接到外壳55内的FET。更具体地,第一连接器56可连接到FET的漏极,并且利用为说明的如图10中所示的电路,第一连接器56可借助互补形状的连接器在外部连接到线路46,从而将FET漏极连接到电源。另一方面,第二FET连接器58连接外壳55内的FET源极,并且其可接合转而连接到图10中线路48的互补形状的连接器,从而将FET源极连接到所示的电路部分。Thus, Figure 11 shows a packaging structure, generally indicated at 54, comprising an empty, parallelepiped-shaped housing 55 comprising four external connectors 56, 58, 60, 62, such as but not limited to pin. Empty housing 55 houses the piezoelectric transducer, FET, and transconductance resistor in any of the circuits shown above. Thus, the first and second connectors 56 and 58 can be electrically connected to the FETs within the housing 55 . More specifically, the first connector 56 may be connected to the drain of the FET, and with the circuit shown in FIG. Thus connecting the FET drain to the supply. On the other hand, a second FET connector 58 connects the source of the FET within housing 55, and it can engage a complementary shaped connector which in turn connects to line 48 in FIG. 10, thereby connecting the source of the FET to the circuit shown. part.

第三连接器60可内部地连接到跨导电阻器。第三连接器60可接着在外部与互补形状的连接器接合,从而将图10中的线路50连接到外壳55内的跨导电阻器R6。第四连接器62可连接到包含在包装结构54内侧的压电换能器。第四连接器62可接着连接到线路52,如图10的说明电路中所示,线路52将FET栅极处的压电换能器连接另一个电路结构。优选的是,空外壳包装结构54的三个部件,即压电换能器、FET和跨导电阻器被包装在纯氮气64中。可以理解,如图10中所示的物理连接器布置仅仅是示例的,并且可实现其它连接器布置(例如,在外壳55四侧的每一侧上有一个连接器)。The third connector 60 may be internally connected to a transconductance resistor. The third connector 60 may then be externally engaged with a complementary shaped connector to connect line 50 in FIG. 10 to transconductance resistor R6 within housing 55 . The fourth connector 62 can be connected to a piezoelectric transducer contained inside the packaging structure 54 . A fourth connector 62 may then be connected to line 52, as shown in the illustrative circuit of FIG. 10, which connects the piezoelectric transducer at the gate of the FET to another circuit structure. Preferably, the three components of the empty housing package structure 54 , namely the piezoelectric transducer, FET and transconductance resistor are packaged in pure nitrogen 64 . It will be appreciated that the physical connector arrangement shown in FIG. 10 is exemplary only, and other connector arrangements may be implemented (eg, one connector on each of the four sides of the housing 55).

利用上面四连接器、三部件的包装,与非常高的电阻(比如通常是125G欧姆跨导电阻)相关联的极小电流都包含在外壳55的内侧。电路外部的换能器、FET和跨导电阻器使用比在外壳内侧流过的电流高很多的电流。因此,当制作单个外壳用来包含如图10中所示的整个电路时,这种外壳十分昂贵,而如图11中所示的简单四引脚包装是便宜的,其可制成刚好合适的大小来容纳前述的三个部分。With the above four-connector, three-part package, the very small currents associated with very high resistance (such as typically 125G ohm transconductance resistance) are contained inside the housing 55 . Transducers, FETs, and transconductance resistors outside the circuit use much higher current than flows inside the case. Thus, while a single housing is expensive to make to contain the entire circuit as shown in Figure 10, a simple four-pin package as shown in Figure 11 is cheap and can be made just to fit sized to accommodate the aforementioned three sections.

在外壳上并且在外壳内分别电连接到漏极、源极、跨导电阻器(R2,R3,R6)、和压电换能器(22,28,34,40)的第一到第四电连接器(56,58,60,62),所述连接器机械上可与外壳(55)外的电路元件耦合。First to fourth on and within the housing electrically connected to drain, source, transconductance resistors (R2, R3, R6), and piezoelectric transducers (22, 28, 34, 40), respectively Electrical connectors (56, 58, 60, 62) mechanically coupleable to circuit elements external to the housing (55).

Claims (17)

1.一种压电检测器,包括:1. A piezoelectric detector comprising: 包括压电换能器(22,28,34,40)的跨导电路(24,30,36,42),该跨导电路(24,30,36,42)定义公共接地和没有直接连接到公共接地的信号电压基准,所述跨导电路包括连接到场效应晶体管(Q1)的栅极的跨导电阻器(R2,R3,R6),所述跨导电路(24,30,36,42)不具有阻抗大于107欧姆的运算放大器,所述场效应晶体管还连接到所述压电换能器。A transconductance circuit (24, 30, 36, 42) comprising piezoelectric transducers (22, 28, 34, 40) defining a common ground and not directly connected to a signal voltage reference to a common ground, said transconductance circuit comprising a transconductance resistor (R2, R3, R6) connected to the gate of a field effect transistor (Q1), said transconductance circuit (24, 30, 36, 42) Without an operational amplifier having an impedance greater than 10 7 ohms, the field effect transistor is also connected to the piezoelectric transducer. 2.根据权利要求1的检测器,其中跨导电阻器(R3,R6)通过运算放大器(U1)连接到栅极。2. A detector according to claim 1, wherein the transconductance resistors (R3, R6) are connected to the gate via an operational amplifier (U1). 3.根据权利要求2的检测器,其中运算放大器(U1)的倒相输入连接到场效应晶体管(Q1)的源极。3. A detector according to claim 2, wherein the inverting input of the operational amplifier (U1) is connected to the source of the field effect transistor (Q1). 4.根据权利要求3的检测器,其中运算放大器(U1)的非倒相输入连接到信号电压基准。4. A detector according to claim 3, wherein the non-inverting input of the operational amplifier (U1) is connected to the signal voltage reference. 5.根据权利要求1的检测器,包括连接到场效应晶体管(Q1)源极的输出电阻器(R1),在该输出电阻器两端获得所述电路的输出。5. A detector according to claim 1, comprising an output resistor (R1) connected to the source of the field effect transistor (Q1), across which output resistor the output of said circuit is obtained. 6.根据权利要求5的检测器,其中输出电阻器(R1)通过双极结晶体管(Q2)连接到场效应晶体管(Q1)。6. A detector according to claim 5, wherein the output resistor (R1) is connected to the field effect transistor (Q1) via a bipolar junction transistor (Q2). 7.根据权利要求6的检测器,其中双极结晶体管(Q2)的基极连接到场效应晶体管(Q1)的源极。7. A detector according to claim 6, wherein the base of the bipolar junction transistor (Q2) is connected to the source of the field effect transistor (Q1). 8.根据权利要求1的检测器,包括将场效应晶体管(Q1)的漏极连接到场效应晶体管(Q1)源极的短路电容器(C3)。8. A detector according to claim 1, comprising a short circuit capacitor ( C3 ) connecting the drain of the field effect transistor (Q1) to the source of the field effect transistor (Q1). 9.根据权利要求1的检测器,包括连接在场效应晶体管(Q1)的栅极和场效应晶体管(Q1)的源极之间的输出分压器(R3,R4,C3和R3,R5,C3)。9. The detector according to claim 1, comprising an output voltage divider (R3, R4, C3 and R3, R5, C3) connected between the gate of the field effect transistor (Q1) and the source of the field effect transistor (Q1). ). 10.一种包括压电换能器(22,28,34,40)的跨导检测器电路,其中场效应晶体管(Q1)连接到用于放大换能器信号的所述换能器(22,28,34,40)、电路公共接地和信号电压基准节点,该节点处于除接地之外的任何AC电位。10. A transconductance detector circuit comprising a piezoelectric transducer (22, 28, 34, 40), wherein a field effect transistor (Q1) is connected to said transducer (22) for amplifying the transducer signal , 28, 34, 40), the circuit common ground and signal voltage reference node, which is at any AC potential except ground. 11.根据权利要求10的跨导检测器电路,包括连接到场效应晶体管(Q1)栅极的跨导电阻器(R2,R3,R6),跨导检测器电路不具有高阻抗运算放大器,所述场效应晶体管还连接到所述压电换能器,所述高阻抗为至少10兆欧姆的阻抗。11. The transconductance detector circuit according to claim 10, comprising a transconductance resistor (R2, R3, R6) connected to the field effect transistor (Q1) gate, the transconductance detector circuit not having a high impedance operational amplifier, said A field effect transistor is also connected to the piezoelectric transducer, and the high impedance is an impedance of at least 10 megohms. 12.一种电路,包括:12. A circuit comprising: 压电换能器(22,28,34,40);Piezoelectric transducers (22, 28, 34, 40); 跨导电路(24,30,36,42),其沿着电通路接收来自换能器(22,28,34,40)的信号,并处理该信号以产生输出,该跨导电路(24,30,36,42)不包括高阻抗运算放大器,所述高阻抗为至少10兆欧姆的阻抗。a transconductance circuit (24, 30, 36, 42), which receives a signal from a transducer (22, 28, 34, 40) along an electrical path and processes the signal to produce an output, the transconductance circuit (24, 30, 36, 42) do not include a high impedance operational amplifier, said high impedance being an impedance of at least 10 megohms. 13.一种压电检测器,包括:13. A piezoelectric detector comprising: 包括压电换能器的跨导电路,所述压电换能器连接到跨导电路的场效应晶体管(Q1)的栅极,该跨导电路不具有运算放大器,该跨导电路还包括连接到场效应晶体管(Q1)栅极的跨导电阻器(R6),该电路包括除了该场效应晶体管(Q1)之外的第一晶体管(Q3)和第二晶体管(Q4),场效应晶体管(Q1)、第一晶体管(Q3)和第二晶体管(Q4)彼此电连接。A transconductance circuit comprising a piezoelectric transducer connected to the gate of a field effect transistor (Q1) of the transconductance circuit, which does not have an operational amplifier, and which also includes a connection transconductance resistor (R6) to the gate of the field effect transistor (Q1), the circuit includes a first transistor (Q3) and a second transistor (Q4) in addition to the field effect transistor (Q1), the field effect transistor (Q1 ), the first transistor (Q3) and the second transistor (Q4) are electrically connected to each other. 14.根据权利要求13的检测器,包括连接到场效应晶体管(Q1)源极的反馈电路部分(50,R3)。14. A detector according to claim 13, comprising a feedback circuit part (50, R3) connected to the source of the field effect transistor (Q1). 15.根据权利要求14的检测器,其中第二晶体管(Q4)电连接到跨导电阻器(R6)和第一晶体管(Q3)。15. A detector according to claim 14, wherein the second transistor (Q4) is electrically connected to the transconductance resistor (R6) and the first transistor (Q3). 16.根据权利要求13的检测器,包括物理上只容纳压电换能器、场效应晶体管(Q1)、和跨导电阻器(R6)的换能器包装(54),该换能器包装包括用于与电源连接而电连接到场效应晶体管(Q1)漏极的外部可访问的第一连接器(56)、电连接到场效应晶体管(Q1)源极的外部可访问的第二连接器(58)、电连接到跨导电阻器(R6)的外部可访问的第三连接器(60)、和电连接到压电换能器的外部可访问的第四连接器(62)。16. The detector according to claim 13, comprising a transducer package (54) that physically only accommodates the piezoelectric transducer, the field effect transistor (Q1), and the transconductance resistor (R6), the transducer package comprising an externally accessible first connector (56) electrically connected to the drain of the field effect transistor (Q1) for connection to a power supply, a second externally accessible connector (56) electrically connected to the source of the field effect transistor (Q1) 58), an externally accessible third connector (60) electrically connected to the transconductance resistor (R6), and an externally accessible fourth connector (62) electrically connected to the piezoelectric transducer. 17.一种压电检测器包装(54),包括:17. A piezoelectric detector package (54), comprising: 外壳(55);shell (55); 在外壳中的压电换能器(22,28,34,40);piezoelectric transducers (22, 28, 34, 40) in the housing; 在外壳中的场效应晶体管(Q1),该场效应晶体管(Q1)定义与换能器(22,28,34,40)连接的栅极,该场效应管的栅极还连接到跨导电阻器(R2,R3,R6),该场效应晶体管(Q1)还定义源极和漏极;Field effect transistor (Q1) in the housing, the field effect transistor (Q1) defines the gate connected to the transducer (22, 28, 34, 40), the gate of the field effect transistor is also connected to the transconductance resistance device (R2, R3, R6), the field effect transistor (Q1) also defines the source and drain; 在外壳上的第一连接器到第四连接器(56,58,60,62),该第一连接器到第四连接器(56,58,60,62)分别电连接到在外壳内的漏极、源极、跨导电阻器(R2,R3,R6)、和压电换能器(22,28,34,40),所述四个连接器机械上与外壳(55)外的电路元件耦合。The first to fourth connectors (56, 58, 60, 62) on the shell are electrically connected to the sockets in the shell respectively. Drain, source, transconductance resistors (R2, R3, R6), and piezoelectric transducers (22, 28, 34, 40), the four connectors are mechanically connected to the electrical circuit outside the housing (55) component coupling.
CN2005800108689A 2004-03-30 2005-03-16 Transconductance circuit including piezoelectric transducer, piezoelectric detector, and package thereof Expired - Fee Related CN1969401B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/812,603 US7042134B2 (en) 2003-03-31 2004-03-30 Transconductance circuit for piezoelectric transducer
US10/812,603 2004-03-30
PCT/US2005/008726 WO2005101538A2 (en) 2003-03-31 2005-03-16 Transconductance circuit for piezoelectric transducer

Publications (2)

Publication Number Publication Date
CN1969401A CN1969401A (en) 2007-05-23
CN1969401B true CN1969401B (en) 2010-06-09

Family

ID=38077170

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2005800108689A Expired - Fee Related CN1969401B (en) 2004-03-30 2005-03-16 Transconductance circuit including piezoelectric transducer, piezoelectric detector, and package thereof

Country Status (3)

Country Link
CN (1) CN1969401B (en)
BR (1) BRPI0509551A (en)
RU (1) RU2390882C2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1159659A (en) * 1995-08-31 1997-09-17 株式会社村田制作所 piezoelectric transducer
CN1299530A (en) * 1998-04-29 2001-06-13 爱特梅尔股份有限公司 Crystal osciallator with controlled duty cycle
US6647764B1 (en) * 1998-10-26 2003-11-18 Frank Paul Quartz crystal microbalance with feedback loop for automatic gain control

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1448293A1 (en) * 1986-12-24 1988-12-30 Предприятие П/Я В-2015 Electrometric charge converter
RU2097772C1 (en) * 1995-08-15 1997-11-27 Арзамасский филиал Акционерного общества "Глобалтест" Piezoelectric accelerometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1159659A (en) * 1995-08-31 1997-09-17 株式会社村田制作所 piezoelectric transducer
CN1299530A (en) * 1998-04-29 2001-06-13 爱特梅尔股份有限公司 Crystal osciallator with controlled duty cycle
US6647764B1 (en) * 1998-10-26 2003-11-18 Frank Paul Quartz crystal microbalance with feedback loop for automatic gain control

Also Published As

Publication number Publication date
RU2390882C2 (en) 2010-05-27
RU2006135801A (en) 2008-04-20
BRPI0509551A (en) 2007-09-18
CN1969401A (en) 2007-05-23

Similar Documents

Publication Publication Date Title
US7622845B2 (en) Piezoelectric transducer signal processing circuit
US7141910B2 (en) Transconductance circuit for piezoelectric transducer
AU2005234374B2 (en) Transconductance circuit for piezoelectric transducer
KR100580563B1 (en) Infrared detection circuit and infrared detector
DK1219967T3 (en) Impedance detection circuit, impedance detector and method for detecting impedance
US7352107B2 (en) Transconductance circuit for piezoelectric transducer
NO20032015L (en) Device capacitance detection method and method
JPH0262923A (en) Pyroelectric type infrared ray sensor
US20040164647A1 (en) Piezoelectric transducer circuit with improved shock recovery
CN1969401B (en) Transconductance circuit including piezoelectric transducer, piezoelectric detector, and package thereof
CN103109167B (en) There is the pin compatibility infrared light detector of the thermal stability through improving
JP3472908B2 (en) Pyroelectric infrared detector
JP3111878B2 (en) LED current control circuit for smoke detector
KR100368068B1 (en) Assistant Circuit of Infrared Sensor Using Pyroeletric Effect
JP2700500B2 (en) Pressure detection circuit
JP2001091384A (en) Bridge sensor with function of detecting breaking of wire
JPS601389Y2 (en) infrared detection device
JP3100477B2 (en) High input impedance voltage measuring device
SU945878A1 (en) Electric circuit for ionization-type fire alarm with twin field-effect mos-transistor
JP2001099939A (en) Electrometer circuit
CS226654B1 (en) Amplifier circuitry
JPH0566796U (en) Smoke detector circuit
JP2000304606A (en) Infrared detector

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100609

CF01 Termination of patent right due to non-payment of annual fee