JP3100477B2 - High input impedance voltage measuring device - Google Patents

High input impedance voltage measuring device

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Publication number
JP3100477B2
JP3100477B2 JP04269392A JP26939292A JP3100477B2 JP 3100477 B2 JP3100477 B2 JP 3100477B2 JP 04269392 A JP04269392 A JP 04269392A JP 26939292 A JP26939292 A JP 26939292A JP 3100477 B2 JP3100477 B2 JP 3100477B2
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JP
Japan
Prior art keywords
voltage
conductor
circuit
input
voltage measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP04269392A
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Japanese (ja)
Other versions
JPH0694759A (en
Inventor
重代記 森永
信義 伊藤
久雄 加藤
雅彦 小島
充 月東
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CITY OF NAGOYA
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CITY OF NAGOYA
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Priority to JP04269392A priority Critical patent/JP3100477B2/en
Publication of JPH0694759A publication Critical patent/JPH0694759A/en
Application granted granted Critical
Publication of JP3100477B2 publication Critical patent/JP3100477B2/en
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Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】この発明は、内部インピ−ダンス
の高い信号源の電圧測定を目的とした電圧測定装置に関
するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a voltage measuring apparatus for measuring a voltage of a signal source having a high internal impedance.

【0002】[0002]

【従来の技術】イオン感応電極のような内部インピ−ダ
ンスの高い信号源の電圧測定には、従来、次のような装
置が用いられている。
2. Description of the Related Art Conventionally, the following apparatus has been used for measuring the voltage of a signal source having a high internal impedance, such as an ion-sensitive electrode.

【0003】1)負帰還増幅を用いた電圧測定装置 トランジスタまたは電界効果トランジスタによるエミッ
タまたはソ−ス・ホロワ回路あるいは演算増幅器による
ボルテ−ジ・ホロワ回路を電圧増幅器の入力回路の初段
に設けて、入力抵抗を高くした電圧測定装置。
1) Voltage measuring device using negative feedback amplification An emitter or a source follower circuit using a transistor or a field effect transistor or a voltage follower circuit using an operational amplifier is provided at the first stage of an input circuit of a voltage amplifier. Voltage measuring device with high input resistance.

【0004】これは、信号源の電圧と外部電界によるノ
イズ電圧とを分離するために低周波濾波回路が電圧測定
器の入力回路に設けられるので入力抵抗は高くなるがイ
ンピ−ダンスは非常に低くなり、出力の応答速度が遅
い。
This is because a low-frequency filtering circuit is provided in the input circuit of the voltmeter in order to separate the voltage of the signal source from the noise voltage due to the external electric field, so that the input resistance becomes high but the impedance is very low. Output response speed is slow.

【0005】2)信号源から電圧測定回路の入力端まで
を結ぶ導線の浮遊容量や漏洩抵抗による電流を除去する
高入力インピ−ダンス電圧測定回路。これは、ボルテ−
ジ・ホロワ回路をなす演算増幅器の入力端子と信号源を
結ぶ導線が導体管または導体網によって二重に覆われ、
内側の導体管または導体網はその演算増幅器の出力に接
続され、外側の導体管または導体網は接地されており、
信号源と入力端とを結ぶ導線に浮遊容量や漏洩抵抗があ
っても、それを覆った導体管または導体網がその導線と
同電位になっているから漏洩電流は存在しなく高入力イ
ンピ−ダンスの電圧測定器が可能になる。
[0005] 2) A high input impedance voltage measuring circuit for eliminating current caused by stray capacitance and leakage resistance of a conductor connecting a signal source to an input terminal of the voltage measuring circuit. This is Volte
The conductor connecting the input terminal of the operational amplifier and the signal source forming the follower circuit is double covered with a conductor tube or conductor network,
The inner conductor tube or conductor network is connected to the output of the operational amplifier, the outer conductor tube or conductor network is grounded,
Even if there is stray capacitance or leakage resistance in the conductor connecting the signal source and the input end, the conductor tube or conductor network covering it has the same potential as the conductor, so there is no leakage current and the high input impedance It becomes possible to measure the voltage of the dance.

【0006】しかし、信号源のインピ−ダンスが高くな
ると入力回路の動作点が正または負の電源電圧に流動
し、電圧測定が不可能になる。
However, when the impedance of the signal source becomes high, the operating point of the input circuit flows to the positive or negative power supply voltage, and it becomes impossible to measure the voltage.

【0007】3)トランジスタまたは電界効果トランジ
スタによるエミッタまたはソ−ス・ホロワ回路あるいは
演算増幅器によるボルテ−ジ・ホロワ回路を電圧増幅器
の初段に設け、機械的に振動する電極板をその回路の入
力端に接続し、これに対向した電極板に信号源を接続し
た振動容量型電圧測定装置。
3) An emitter or source-follower circuit using a transistor or a field-effect transistor or a voltage follower circuit using an operational amplifier is provided at the first stage of a voltage amplifier, and a mechanically oscillating electrode plate is connected to the input terminal of the circuit. And a signal source connected to an electrode plate facing the electrode plate.

【0008】これは振動電極が信号電極に近づけば高い
電圧が、遠ざかれば低い電圧が電圧増幅回路の入力端に
誘導し、信号源の電圧は交流に変換されて測定され、入
力抵抗の非常に高い電圧測定装置の製作が可能になる。
[0008] This is because a high voltage is induced when the vibrating electrode approaches the signal electrode, and a low voltage is induced at the input terminal of the voltage amplifying circuit when the vibrating electrode moves away from the signal electrode. It is possible to manufacture a high voltage measuring device.

【0009】しかし、信号源から電圧測定回路までの導
線の浮遊容量や漏洩電流を除去することができないの
で、応答速度が遅い欠点がある。
However, since the stray capacitance and leakage current of the conductor from the signal source to the voltage measuring circuit cannot be removed, there is a disadvantage that the response speed is slow.

【0010】[0010]

【発明が解決しようとする課題】水溶液中のイオン濃度
をその水溶液に浸漬したイオン選択膜と溶液との界面間
に生じる電圧で測定する場合、例えば、pH計において
はガラスと水溶液との界面間に生じる電圧を、そのガラ
スの抵抗を通して、測定するためそのガラスの抵抗より
も十分に高い入力抵抗を持った電圧測定器が必要とされ
る。そのため現状においては、製作可能な電圧測定器の
入力抵抗に見合うように、ガラスの厚みをできるだけ薄
くしかつその面積を広げてガラスの抵抗値が下げられて
いる。
When the ion concentration in an aqueous solution is measured by the voltage generated between the interface between the ion selective membrane immersed in the aqueous solution and the solution, for example, in the case of a pH meter, the ion concentration between the glass and the aqueous solution is measured. A voltage measuring instrument having an input resistance sufficiently higher than the resistance of the glass is required to measure the voltage generated in the glass through the resistance of the glass. Therefore, under the present circumstances, the resistance value of the glass is reduced by reducing the thickness of the glass as much as possible and expanding the area thereof so as to match the input resistance of the voltage measuring device that can be manufactured.

【0011】すなわち、イオン選択膜が絶縁体の場合イ
オン感応部の大きさは、電圧検出に使用する増幅器の入
力抵抗値に制約されて、小さくすることができない。
That is, when the ion selective membrane is an insulator, the size of the ion sensitive portion cannot be reduced because it is limited by the input resistance of the amplifier used for voltage detection.

【0012】本願の発明はイオン感応部の微少化に必要
な電圧測定回路の高入力インピ−ダンス化を課題として
為したものである。
An object of the present invention is to increase the input impedance of a voltage measuring circuit required for miniaturizing an ion sensitive section.

【0013】[0013]

【課題を解決するための手段】電気的に同等な二つの電
圧検出回路を配置し、一方の検出回路は測定対象の電極
60とその検出回路の入力端子が導線56で結ばれ、そ
の導線56は導体管または導体で二重に覆われ、外側の
導体管または導体58は接地され、導線56に近い内側
の導体管または導体57は他方の電圧検出回路の入力端
子に接続され、その入力端子は両検出回路の出力電圧差
を増幅する差動増幅器55の出力端子に接続された回路
を構成して、高入力インピーダンス化を図る。
Means for Solving the Problems Two voltage detection circuits which are electrically equivalent to each other are arranged, and one of the detection circuits has an electrode 60 to be measured and an input terminal of the detection circuit connected by a conductor 56, and the conductor 56 Is double covered with a conductor tube or conductor, the outer conductor tube or conductor 58 is grounded, the inner conductor tube or conductor 57 near the conductor 56 is connected to the input terminal of the other voltage detection circuit, and the input terminal Constitutes a circuit connected to the output terminal of the differential amplifier 55 that amplifies the difference between the output voltages of the two detection circuits, thereby achieving high input impedance.

【0014】[0014]

【発明の作用】本願の発明は、電圧測定装置の入力イン
ピ−ダンスがその回路に固有の高い値になり、かつ、応
答速度が早く、測定対象の信号源のインピ−ダンスが高
くても、電圧測定回路の動作点が流動しなく安定に測定
できる。
According to the present invention, even if the input impedance of the voltage measuring device becomes a high value inherent to the circuit, the response speed is fast, and the impedance of the signal source to be measured is high, The operating point of the voltage measurement circuit can be measured stably without flowing.

【0015】[0015]

【実施例】【Example】

実施例1 図1に、イオン感応部(イオン感応電極)と電圧測定部
とが分離された従来のイオン感応電極の電圧の検出を始
め、電気工事における活線の判定やクレ−ン作業におけ
る活線への接近警報、静電気の検出など電界検出などに
使用する実施例を示す。
Embodiment 1 FIG. 1 shows the detection of the voltage of a conventional ion-sensitive electrode in which an ion-sensitive section (ion-sensitive electrode) and a voltage measuring section are separated, the determination of a live line in electric work and the activity in a crane work. An embodiment used for detecting an electric field such as a warning of approaching a line and detecting static electricity will be described.

【0016】電界効果トランジスタ1、28のドレ−ン
・ソ−ス間の電圧およびソ−ス電流をそれぞれ一定の値
に制御することによりゲ−ト・接地間の電圧変化をソ−
ス・接地間の電圧変化に変換して出力する全く等しい二
つの回路を配置し、一方の回路は電圧または電界測定用
の探触子を持ち、その探触子60と電界効果トランジス
タ1のゲ−トが導線56で結ばれ、その導線は導体管ま
たは導体網で二重に覆われ、外側の導体管または導体網
58は接地され、導線56に近い内側の導体管または導
体網57は他方の回路の電界効果トランジスタ28のゲ
−トに接続され、そのゲ−トは両回路の出力電圧差を増
幅する差動増幅器55の出力端子に接続されている。電
界効果トランジスタ1、28のゲ−トが互いに等しくな
るように差動増幅器55によって制御されるので、測定
対象の電極と電界効果トランジスタ1のゲ−トを結ぶ導
線56とその導線を覆う内側の導体管または導体57と
の電位が等しくなり、覆われた導線の浮遊容量や漏洩抵
抗による漏洩電流が打ち消され、測定用探触子60から
見た入力インピ−ダンスは測定回路に固有の入力インピ
−ダンスになり非常に高くなる。測定用探触子60から
電圧測定回路の入力を見た、すなわち、図1に示す本発
明の電圧測定回路の入力インピ−ダンスの測定方法を図
2に示す。測定用探触子60と低周波発振器の出力端子
との間に結合コンデンサを接続し、コンデンサを挿入し
たときとしない時の出力電圧Vo1の比(電圧増幅度)
をコンデンサの容量値に対して求め、その結果を図3に
示す。図3において、コンデンサの容量が、使用してい
るトランジスタ1のゲ−ト・ソ−ス間の容量に一致す
る、6pFの値において電圧増幅度が2分の1になり、
この電圧測定回路の入力インピ−ダンスがトランジスタ
1のゲ−ト・ソ−ス間の容量のみによって決定づけられ
ていることを示す。
By controlling the voltage between the source and the drain of the field effect transistors 1 and 28 and the source current to constant values, the voltage change between the gate and the ground can be reduced.
Two circuits are provided which convert the voltage into a voltage change between the ground and the ground and output the same. One circuit has a probe for measuring the voltage or electric field, and the probe 60 and the gate of the field effect transistor 1 are connected. The conductors are connected by conductors 56, the conductors are doubly covered by a conductor tube or conductor network, the outer conductor tube or conductor network 58 is grounded, and the inner conductor tube or conductor network 57 near conductor 56 is The gate of the circuit is connected to the gate of the field effect transistor 28, and the gate is connected to the output terminal of the differential amplifier 55 for amplifying the output voltage difference between the two circuits. Since the gates of the field effect transistors 1 and 28 are controlled by the differential amplifier 55 so as to be equal to each other, a conductor 56 connecting the electrode to be measured and the gate of the field effect transistor 1 and an inner portion covering the conductor are provided. The potential of the conductor tube or the conductor 57 becomes equal, the leakage current due to the stray capacitance and the leakage resistance of the covered conductor is canceled, and the input impedance seen from the measuring probe 60 becomes the input impedance specific to the measurement circuit. -Dance and get very high. FIG. 2 shows a method of measuring the input impedance of the voltage measurement circuit of the present invention shown in FIG. 1 when the input of the voltage measurement circuit is viewed from the measurement probe 60. A coupling capacitor is connected between the measurement probe 60 and the output terminal of the low-frequency oscillator, and a ratio (voltage amplification) of the output voltage Vo1 when the capacitor is inserted and when the capacitor is not inserted.
Is obtained for the capacitance value of the capacitor, and the result is shown in FIG. In FIG. 3, when the capacitance of the capacitor coincides with the capacitance between the gate and source of the transistor 1 used, the voltage amplification becomes half at a value of 6 pF,
This shows that the input impedance of this voltage measuring circuit is determined only by the capacitance between the gate and source of the transistor 1.

【0017】実施例2 図4は電圧測定用探触子とイオン感応電極とを一体にし
たイオンセンサへの応用例である。測定用探触子60の
み露出させ、これをイオン感応電極とし、その導体面に
イオン選択膜61を作製し、これを水溶液に浸漬し、イ
オン選択膜と水溶液との界面間に生じる界面電圧を測定
する場合、厚さ0.2μmの五酸化タンタル膜で被覆し
たpH測定用探触子導体面の面積を6×10-2mm2
しても十分に測定が可能になる。
Embodiment 2 FIG. 4 shows an application example to an ion sensor in which a voltage measuring probe and an ion-sensitive electrode are integrated. Only the measurement probe 60 is exposed, this is used as an ion-sensitive electrode, an ion-selective film 61 is formed on the conductor surface thereof, immersed in an aqueous solution, and the interface voltage generated between the ion-selective film and the aqueous solution is measured. In the case of measurement, sufficient measurement is possible even if the area of the probe surface for pH measurement covered with a tantalum pentoxide film having a thickness of 0.2 μm is 6 × 10 −2 mm 2 .

【0018】[0018]

【発明の効果】電圧測定回路の入力インピダンスはその
回路固有の高いインピ−ダンスになり、かつ、電圧測定
回路の動作点は流動しなく安定し、インピ−ダンスの高
い信号源の電圧測定が可能になり、絶縁性のイオン選択
膜を用いたイオン感応電極の小型化が可能になった。
The input impedance of the voltage measuring circuit is a high impedance inherent to the circuit, and the operating point of the voltage measuring circuit is stable without flowing, and the voltage of a signal source having a high impedance can be measured. As a result, the size of the ion-sensitive electrode using the insulating ion selective membrane can be reduced.

【0019】[0019]

【図面の簡単な説明】[Brief description of the drawings]

【図1】高入力インピ−ダンスをもつた電圧測定回路図
と測定探触子の断面図である。
FIG. 1 is a circuit diagram of a voltage measuring circuit having a high input impedance and a sectional view of a measuring probe.

【図2】電圧測定回路の入力インピ−ダンスの測定方法
を示す図である。
FIG. 2 is a diagram illustrating a method of measuring the input impedance of a voltage measurement circuit.

【図3】電圧測定回路の入力インピダンスを推定するた
めに実験した結果である。
FIG. 3 is a result of an experiment for estimating an input impedance of a voltage measurement circuit.

【図4】イオン感応電極の構造を示す図である。FIG. 4 is a diagram showing a structure of an ion-sensitive electrode.

【符号の説明】[Explanation of symbols]

1、28 電界効果トランジスタ 2、29 トランジスタ 3、30 抵抗 4、31 トランジスタ 5、32 演算増幅器 6、33 演算増幅器 7、34 演算増幅器 8、35 抵抗 9、36 抵抗 10、37 抵抗 11、38 抵抗 12、39 抵抗 13、40 トランジスタ 14、41 ツェナ−ダイオ−ド 15、42 ツェナ−ダイオ−ド 16、43 トランジスタ 17、44 抵抗 18、45 演算増幅器 19、46 演算増幅器 20、47 抵抗 21、48 抵抗 22、49 抵抗 23、50 抵抗 24、51 ツェナ−ダイオ−ド 25、52 抵抗 26、53 抵抗 27、54 ツェナ−ダイオ−ド 55 演算増幅器 56 電圧測定用同軸芯導線 57 同軸内側導線 58 同軸外側導線 59 絶縁体 60 測定用探触子 61 イオン選択膜 62 塩化カリ水溶液 63 溶液交換口 1, 28 field effect transistor 2, 29 transistor 3, 30 resistor 4, 31 transistor 5, 32 operational amplifier 6, 33 operational amplifier 7, 34 operational amplifier 8, 35 resistor 9, 36 resistor 10, 37 resistor 11, 38 resistor 12 , 39 Resistance 13, 40 Transistor 14, 41 Zener Diode 15, 42 Zener Diode 16, 43 Transistor 17, 44 Resistance 18, 45 Operational Amplifier 19, 46 Operational Amplifier 20, 47 Resistance 21, 48 Resistance 22 , 49 Resistance 23, 50 Resistance 24, 51 Zener diode 25, 52 Resistance 26, 53 Resistance 27, 54 Zener diode 55 Operational amplifier 56 Coaxial core conductor for voltage measurement 57 Coaxial inner conductor 58 Coaxial outer conductor 59 Insulator 60 Probe for measurement 61 Ion selective membrane 62 Potassium chloride water Liquid 63 solution exchange opening

───────────────────────────────────────────────────── フロントページの続き (72)発明者 小島 雅彦 愛知県名古屋市北区上飯田北町4丁目75 番3号 上飯田第2団地2−411 (72)発明者 月東 充 愛知県名古屋市中川区山王1丁目5番25 号 (56)参考文献 森永重代記ほか4名著、「ISFET 用イオン感度測定回路」、名古屋市工業 研究所研究報告No.76、p.14−17 (58)調査した分野(Int.Cl.7,DB名) G01R 19/00 - 19/32 G01N 27/416 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Masahiko Kojima 4-75-3, Kamiida Kitamachi, Kita-ku, Nagoya-shi, Aichi 2-411 Kamiiida 2nd complex 2-411 (72) Inventor Mitsuru Tsutohito Sanno, Nakagawa-ku, Nagoya-shi, Aichi Prefecture 1-5-5-25 (56) References Shigeyo Morinaga and four others, “Ion Sensitivity Measurement Circuit for ISFET”, Nagoya City Industrial Research Institute Research Report No. 76, p. 14-17 (58) Field surveyed (Int. Cl. 7 , DB name) G01R 19/00-19/32 G01N 27/416

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電気的に同等な二つの電圧検出回路を配置
し、一方の検出回路は測定対象の電極(60)とその検
出回路の入力端子が導線(56)で結ばれ、その導線
(56)は導体管または導体で二重に覆われ、外側の導
体管または導体(58)は接地され、導線(56)に近
い内側の導体管または導体(57)は他方の電圧検出回
路の入力端子に接続され、その入力端子は両検出回路の
出力電圧差を増幅する差動増幅器(55)の出力端子に
接続された回路構成を特徴とする電圧測定装置。
An electric voltage detection circuit is provided. One of the detection circuits has an electrode to be measured (60) and an input terminal of the detection circuit connected by a conductor (56). 56) is doubly covered with a conductor tube or conductor, the outer conductor tube or conductor (58) is grounded, and the inner conductor tube or conductor (57) near the conductor (56) is the input of the other voltage detection circuit. A voltage measuring device, characterized in that it is connected to a terminal and an input terminal thereof is connected to an output terminal of a differential amplifier (55) for amplifying a difference between output voltages of the two detection circuits.
JP04269392A 1992-09-11 1992-09-11 High input impedance voltage measuring device Expired - Fee Related JP3100477B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04269392A JP3100477B2 (en) 1992-09-11 1992-09-11 High input impedance voltage measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04269392A JP3100477B2 (en) 1992-09-11 1992-09-11 High input impedance voltage measuring device

Publications (2)

Publication Number Publication Date
JPH0694759A JPH0694759A (en) 1994-04-08
JP3100477B2 true JP3100477B2 (en) 2000-10-16

Family

ID=17471773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04269392A Expired - Fee Related JP3100477B2 (en) 1992-09-11 1992-09-11 High input impedance voltage measuring device

Country Status (1)

Country Link
JP (1) JP3100477B2 (en)

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
森永重代記ほか4名著、「ISFET用イオン感度測定回路」、名古屋市工業研究所研究報告No.76、p.14−17

Also Published As

Publication number Publication date
JPH0694759A (en) 1994-04-08

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