CN1948985A - Press key function testing system and method - Google Patents
Press key function testing system and method Download PDFInfo
- Publication number
- CN1948985A CN1948985A CN 200510100408 CN200510100408A CN1948985A CN 1948985 A CN1948985 A CN 1948985A CN 200510100408 CN200510100408 CN 200510100408 CN 200510100408 A CN200510100408 A CN 200510100408A CN 1948985 A CN1948985 A CN 1948985A
- Authority
- CN
- China
- Prior art keywords
- button
- chip microcomputer
- test
- key
- bad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention supplies key-press functional test system. It includes one power module, one SCM control module, and one photogenic module. The power module includes one power supply and many power supply switching circuits. The SCM control module includes one parameter setup sub-module, one SCM, one display sub-module, one buzzer, at least one solenoid valve, and one locking cylinder. The photogenic module includes one cold light board and many light emitting diodes. The SCM can transmit control command to the solenoid valve to control the motion of the locking cylinder. The invention also supplies its testing method. The invention uses SCM structure to realize key press functional auto testing which has high testing speed, efficiency, and is on the safe side.
Description
[technical field]
The present invention relates to a kind of key test system and method, relate in particular to a kind of press key function testing system and method.
[background technology]
For guaranteeing that its quality must carry out strict test to its each component capabilities, test event comprises mobile phone: press key function testing, temperature test, hardness test, signal receiver test etc. before dispatching from the factory.Press key function testing system in the past generally all adopts the manual testing, but cell-phone function is numerous, and the regression test workload is big, if the Test Engineer only depends on manual button to carry out all tests, not only test speed is slow, and efficient is low, also might cause the omission of test, and, easily cause breakage to button because of artificial keystroke dynamics inequality.
[summary of the invention]
In view of above content, be necessary to provide a kind of press key function testing system, it utilizes the single-chip microcomputer framework to realize the automatic test of keypress function, and test speed is fast, the efficient height.
In view of above content, also be necessary to provide a kind of press key function testing method, it utilizes the single-chip microcomputer framework to realize the automatic test of keypress function, and test speed is fast, the efficient height.
A kind of press key function testing system is used for the press key function testing on the various keypads, and this system comprises a power module, a single chip control module and a light emitting module.Described single chip control module comprises: a parameter setting submodule, be used to set the repeat key number of times of button when bad, and the button parameter whether proceeding to test when bad, and with the form output of this parameter with digital signal; One single-chip microcomputer, setting submodule with above-mentioned parameter links to each other, be used to receive and preserve the digital signal of parameter setting submodule output, this single-chip microcomputer comprises a microprocessor and an application program, this microprocessor can call and carry out described application program, with at least one solenoid valve sending controling instruction, the corresponding straight dynamic air cylinder of solenoid control is moved up and down, thereby moving up and down, the button on the control keypad finishes functional test.
Described single chip control module also comprises: a display sub-module, link to each other with above-mentioned single-chip microcomputer, it is made up of a plurality of light emitting diodes, the corresponding button of each light emitting diode, when tested keypress function just often, corresponding lumination of light emitting diode; One hummer links to each other with above-mentioned single-chip microcomputer, is used for sending when end of test (EOT) keypress function regular prompt sound or alerting signal; One barostat is used for supplying required air pressure for above-mentioned straight dynamic air cylinder by above-mentioned solenoid valve.
Described application program comprises: a test module, be used to make single-chip microcomputer to the solenoid valve sending controling instruction with the opening and turn-offing of control electromagnetic valve, being moved up and down by the straight dynamic air cylinder of solenoid control moves up and down according to testing sequence of setting and the setup parameter that single-chip microcomputer was received with the button that drives on the keypad; Whether one judge module is used to judge whether button arrives the button of the setting repeat key number of times when bad, and judges and proceed when button is bad to test.
A kind of press key function testing method is used for the press key function testing on the various keypads, and this method comprises the steps: (a) opening power; (b) provide a single-chip microcomputer to receive the parameter of setting; (c) this single-chip microcomputer is according to parameter sending controling instruction to a solenoid valve of setting, by solenoid control always dynamic air cylinder move up and down to push button; (d) read first key assignments; (e) judge whether first key assignments is correct; (f) if key assignments is correct, then unclamp button, read second key assignments; (g) judge whether second key assignments is correct; (h) if correct, judge again whether all buttons have all been tested one time, if then finish test; (i) if not, then return step (c).
The setup parameter that described single-chip microcomputer receives comprises whether proceeding test when repeat key number of times when button is bad and button are bad.
In step (e),, then carry out following steps: judge (e1) whether touch potential arrives the button of the setting repeat key number of times when bad if judge that first key assignments is incorrect; (e2) if not, then return the step of single-chip microcomputer sending controling instruction to solenoid valve; (e3) if whether continue test when then judging that according to setup parameter button is bad, and carry out one of following steps: if then return the step of single-chip microcomputer sending controling instruction to solenoid valve; If not, then finish test.
In step (g),, then carry out following steps: judge (g1) whether touch potential arrives the button of the setting repeat key number of times when bad if judge that second key assignments is incorrect; (g2) if not, then return the step of single-chip microcomputer sending controling instruction to solenoid valve; (g3) if whether proceed test when then judging that according to setup parameter button is bad, and carry out one of following steps: if then return the step of single-chip microcomputer sending controling instruction to solenoid valve; If not, then finish test.
Described first key assignments and second key assignments are the magnitude of voltage that reads, each tested button is the conducting key of two circuit, and wherein a circuit is connected in high level, when tested button is pressed, with above-mentioned two circuit turn-ons, the magnitude of voltage of an end that does not link to each other with described tested button of another that a reads circuit is first key assignments, and the magnitude of voltage that reads this end after button unclamps again is second key assignments.
Compare prior art, described press key function testing system and method adopt the single-chip microcomputer framework to realize the automatic test of keypress function, and test speed is fast, and the efficient height is safe and reliable.
[description of drawings]
Fig. 1 is the hardware structure figure of press key function testing system preferred embodiment of the present invention.
Fig. 2 is the inner bay composition of power module shown in Figure 1.
Fig. 3 is the inner bay composition of single-chip microcomputer shown in Figure 1.
Fig. 4 is the process flow diagram of press key function testing method of the present invention preferred embodiment.
[embodiment]
Consulting shown in Figure 1ly, is the hardware structure figure of press key function testing system preferred embodiment of the present invention.This preferred embodiment is that example describes with the mobile phone.This system comprises a power module 1, a single chip control module 2 and a light emitting module 3.Power module 1 is used for to single chip control module 2 and the required supply voltage of light emitting module 3 supplies.
Wherein the inner bay composition of power module 1 as shown in Figure 2, this power module 1 comprises a Switching Power Supply 111 and a plurality of power-switching circuit 112,113,114.Switching Power Supply 111 is used for converting a specific alternating voltage a to two-way DC voltage b1, b2, wherein b1 converts certain two-way specific voltage c1, c2 to through power-switching circuit 112 again, c1 is in order to give a cold light panel 32 supplies in the light emitting module 3 required supply voltage, and c2 is in order to give an optical sensor 33 and the required supply voltage of a Magnetic Sensor 36 supplies in the light emitting module 3.B2 can directly give single-chip microcomputer 21 supplies in the single chip control module 2 required supply voltage, and b2 also can give analog amplify circuit 34,37 supplies in the light emitting module 3 required supply voltage d1 after power-switching circuit 113 conversions; B2 also can be the required supply voltage d2 of reometer 31 supplies in the light emitting module 3 after power-switching circuit 114 conversions.A is the 220v alternating current in this preferred embodiment, and b1 is a 12v voltage, and b2 is a 5v voltage, and c1 is a 3v voltage, and c2 is a 2.5v voltage, and d1 is-5v voltage, and d2 is a 5v voltage independently, this 5v voltage not with the shared reference voltage of other voltages.
Single chip control module 2 comprises above-mentioned single-chip microcomputer 21, a parameter setting submodule 22, a display sub-module 23, a hummer 24, at least one solenoid valve 25, a barostat 26, a dynamic air cylinder 27 and a keypad 28 at least always.
Single-chip microcomputer 21 can receive and preserve the setup parameter that parameter setting submodule 22 is sent out.The inside structure of this single-chip microcomputer 21 as shown in Figure 3, this single-chip microcomputer 21 comprises an application program 201 and a microprocessor 211.Application program 201 comprises a test module 202 and a judge module 203.Wherein test module 202 is used to make single-chip microcomputer 21 to the opening and turn-offing with control electromagnetic valve 25 of solenoid valve 25 sending controling instructions, being moved up and down by the straight dynamic air cylinder 27 of solenoid valve 25 control moves up and down according to the setup parameter that testing sequence of setting and single-chip microcomputer 21 are received with the button that drives on the keypad 28, to carry out the test of keypress function; This test module 202 if all keypress functions are normal, then makes hummer 24 send a kind of regular prompt sound after also being set in the button on the keypad 28 being finished test according to the order of setting, if there is keypress function bad, then makes hummer 24 send alerting signal; Microprocessor 211 can call and carry out test module 202 to assign steering order to solenoid valve 25; Judge module 203 is used to judge whether the key assignments that single-chip microcomputer 21 reads is correct, and whether button arrives repeat key number of times when bad of the button of setting, and judges when button to occur whether proceeding to test when bad etc.
The display sub-module 23 that links to each other with single-chip microcomputer 21 comprises a plurality of light emitting diodes (LED), a button on the corresponding keypad 28 of each LED, and when the key assignments that is read when single-chip microcomputer in the test process 21 was correct, the LED of tested button correspondence will be luminous.
Barostat 26 is used for regulating the air pressure size to be supplied to straight dynamic air cylinder 27 required air pressure by solenoid valve 25 according to the test needs.The steering order that solenoid valve 25 is assigned according to microprocessor 211 is controlled entering and turn-offing of the gas that feeds in the straight dynamic air cylinder 27, thereby controls moving up and down of straight dynamic air cylinder 27.Straight dynamic air cylinder 27 moves up and down to push button according to the testing sequence that sets in the test module 202 by it and coils corresponding button in 28, to carry out the test of keypress function.Keypad 28 in the present embodiment comprises 24 buttons, described key testing is according to set in the test module 202 24 button groupings are tested in proper order, it is five groups that described 24 keys are divided into, and is grouped as follows: " KEY_9 ", " NAV_DOWN ", " NAV_RIGHT ", " NAV_LEFT ", " NAV_UP "; " MENU ", " KEY_* ", " KEY_5 ", " KEY_3 ", " KEY_1 "; " SEL_RIGHT ", " SEL_LEFT ", " NAV_CENTER ", " KEY_# ", " KEY_0 "; " KEY_7 ", " KEY_8 ", " KEY_6 ", " KEY_4 ", " KEY_2 "; " CARRIER ", " MAIL ", " SEND ", " PWR_SW ".Each test has one group of button and is pressed entirely, reads the key assignments of all buttons that are pressed then.Each button on the keypad 28 all is in the intersection of two circuit, in a single day button is pressed, will connect above-mentioned two circuit, there is an end of a circuit to be connected near the above-mentioned button in described two circuit, also have an end to be connected in high level, one end of another circuit is connected near the described button, and the other end promptly is defined as the key assignments of tested button for the magnitude of voltage end that continues, the magnitude of voltage of this end.After button is pressed, because above-mentioned two circuit turn-ons, so the magnitude of voltage end that continues is equivalent to directly link to each other with high level and present high level.If read this key assignments and be high level really, only illustrate that button can press but can't illustrate that tested keypress function is good, have only after unclamping tested button, when reading key assignments again and being low level, illustrate that just tested keypress function is good.Because might this button itself just will above-mentioned two short circuits connection, rather than well circuit is connected because of tested keypress function.And when test was finished, if all keypress functions are good, then hummer 24 sent the regular prompt sound, if there is keypress function bad, then when end of test (EOT), hummer 24 can send alerting signal.
Consulting shown in Figure 4ly, is the process flow diagram of press key function testing method of the present invention preferred embodiment.This preferred embodiment is that example describes with the mobile phone.At first, opening power is to open test macro (step S100); Single-chip microcomputer 21 receives the setup parameter that parameter setting submodule 22 sends, and comprising: whether proceed parameters (step S102) such as test when repeat key number of times when button is bad and button are bad; Judge module 203 in the single-chip microcomputer 21 judges whether to press on/off buttons (step S104); If, microprocessor 211 in the single-chip microcomputer 21 calls and carries out test module 202, to assign steering order opening and turn-offing to solenoid valve 25 with control electromagnetic valve 25, by the opening and turn-off and control moving up and down of straight dynamic air cylinder 27 of solenoid valve 25, straight dynamic air cylinder 27 is pressed corresponding button (step S106) by moving up and down according to the testing sequence of setting in the test module 202; Single-chip microcomputer 21 reads key assignments, and this key assignments is the wherein magnitude of voltage of an end of tested button two circuit of connecting when pressing, and the other end is connected in a high level (step S108); Judge module 203 in the single-chip microcomputer 21 judges whether this key assignments is correct, and in the present embodiment, key assignments is correct (step S110) for high level 5v; If correct, then button is unclamped, read key assignments (step S112) again; Judge module 203 in the single-chip microcomputer 21 judges whether this key assignments is correct again, and this key assignments is that 0v is correct (step S114) in the present embodiment; If judge module 203 judges whether all buttons have all tested one time (step S116); If, finishing test, hummer 24 sends the regular prompt sound, if not, then return step S106.
In step S104,, return step S104 (step S105) after then waiting for if do not press on/off buttons.
In step S110,, judge again then whether touch potential arrives the button of the setting repeat key number of times (step S118) when bad if judge that key assignments is incorrect; If judge again that then the position of whether proceeding to test when button is bad in the setup parameter that single-chip microcomputer 21 received is 1 still is 0 (step S120); If 1, indicate to continue test, then return step S106, otherwise finish test, hummer 24 sends alerting signal simultaneously.
In step S118, do not arrive the button of the setting repeat key number of times when bad if judge button, then return step S106.
In step S114,, then go to step S118 if judge that the key assignments that is read is incorrect.
Claims (8)
1. a press key function testing system is used for the press key function testing on the various keypads, and this system comprises a power module, a single chip control module and a light emitting module, it is characterized in that, described single chip control module comprises:
One parameter setting submodule is used to set the repeat key number of times of button when bad, and the button parameter whether proceeding to test when bad, and with the form output of this parameter with digital signal;
One single-chip microcomputer, setting submodule with above-mentioned parameter links to each other, be used to receive and preserve the digital signal of parameter setting submodule output, this single-chip microcomputer comprises a microprocessor and an application program, this microprocessor can call and carry out described application program, with at least one solenoid valve sending controling instruction, the corresponding straight dynamic air cylinder of solenoid control is moved up and down, thereby moving up and down, the button on the control keypad finishes functional test.
2. press key function testing system as claimed in claim 1 is characterized in that, described single chip control module also comprises:
One display sub-module links to each other with above-mentioned single-chip microcomputer, and it is made up of a plurality of light emitting diodes, the corresponding tested button of each light emitting diode, when tested keypress function just often, corresponding lumination of light emitting diode;
One hummer links to each other with above-mentioned single-chip microcomputer, is used for sending when end of test (EOT) keypress function regular prompt sound or alerting signal;
One barostat is used for supplying required air pressure for above-mentioned straight dynamic air cylinder by above-mentioned solenoid valve.
3. press key function testing system as claimed in claim 1 is characterized in that, described application program comprises:
One test module, be used to make single-chip microcomputer to the solenoid valve sending controling instruction with the opening and turn-offing of control electromagnetic valve, being moved up and down by the straight dynamic air cylinder of solenoid control moves up and down according to testing sequence of setting and the setup parameter that single-chip microcomputer was received with the button that drives on the keypad;
Whether one judge module is used to judge whether button arrives the button of the setting repeat key number of times when bad, and judges and proceed when button is bad to test.
4. a press key function testing method is used for the press key function testing on the various keypads, it is characterized in that, this method may further comprise the steps:
Opening power;
Provide a single-chip microcomputer to receive the parameter of setting;
This single-chip microcomputer is according to parameter sending controling instruction to a solenoid valve of setting, by solenoid control always dynamic air cylinder move up and down to push button;
Read first key assignments;
Judge whether first key assignments is correct;
If key assignments is correct, then unclamp button, read second key assignments;
Judge whether second key assignments is correct;
If correct, judge again whether all buttons have all been tested one time, if then finish test;
If not, then return the step of single-chip microcomputer sending controling instruction to solenoid valve.
5. press key function testing method as claimed in claim 4 is characterized in that, the setup parameter that described single-chip microcomputer receives comprises whether proceeding test when repeat key number of times when button is bad and button are bad.
6. press key function testing method as claimed in claim 5 is characterized in that, if step judges that whether correct step is not to first key assignments, then carries out following steps:
Judge whether touch potential arrives the button of the setting repeat key number of times when bad;
If not, then return the step of single-chip microcomputer sending controling instruction to solenoid valve;
If whether continue test when then judging that according to setup parameter button is bad, and carry out one of following steps:
If then return the step of single-chip microcomputer sending controling instruction to solenoid valve;
If not, then finish test.
7. press key function testing method as claimed in claim 5 is characterized in that, if step judges that whether correct result is not to second key assignments, then carries out following steps:
Judge whether touch potential arrives the button of the setting repeat key number of times when bad;
If not, then return the step of single-chip microcomputer sending controling instruction to solenoid valve;
If whether continue test when then judging that according to setup parameter button is bad, and carry out one of following steps:
If then return the step of single-chip microcomputer sending controling instruction to solenoid valve;
If not, then finish test.
8. press key function testing method as claimed in claim 4, it is characterized in that, described first key assignments and second key assignments are the magnitude of voltage that reads, each tested button is the conducting key of two circuit, and wherein a circuit is connected in high level, when tested button is pressed, with above-mentioned two circuit turn-ons, the magnitude of voltage of an end that does not link to each other with described tested button of another that a reads circuit is first key assignments, and the magnitude of voltage that reads this end after button unclamps again is second key assignments.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510100408 CN1948985A (en) | 2005-10-13 | 2005-10-13 | Press key function testing system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510100408 CN1948985A (en) | 2005-10-13 | 2005-10-13 | Press key function testing system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1948985A true CN1948985A (en) | 2007-04-18 |
Family
ID=38018561
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510100408 Pending CN1948985A (en) | 2005-10-13 | 2005-10-13 | Press key function testing system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1948985A (en) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339109B (en) * | 2007-07-02 | 2010-12-08 | 鸿富锦精密工业（深圳）有限公司 | Product squeezing and test device and method |
| CN101384064B (en) * | 2008-10-21 | 2011-08-10 | 深圳市汇创达科技有限公司 | Mobile phone thin film press-key duplicate tablet/missing tablet/reversed tablet detection method and device thereof |
| CN102163169A (en) * | 2010-12-30 | 2011-08-24 | 东莞市长田电子有限公司 | Testing device of keyboard type circuit board |
| CN102200566A (en) * | 2010-03-22 | 2011-09-28 | 鸿富锦精密工业（深圳）有限公司 | Key testing device |
| CN102466780A (en) * | 2010-11-03 | 2012-05-23 | 北京普源精电科技有限公司 | Method and device for detecting starting-up keyboard of instrument |
| CN101639506B (en) * | 2009-07-16 | 2012-06-27 | 旭丽电子(广州)有限公司 | Test method of electronic device |
| CN102645631A (en) * | 2012-04-28 | 2012-08-22 | 吉林大学 | Automobile key switch testing system and testing method |
| CN102735954A (en) * | 2011-04-14 | 2012-10-17 | 东莞市时唛特电器有限公司 | Test device for toaster service life |
| CN104215531A (en) * | 2013-05-30 | 2014-12-17 | 深圳市海洋王照明工程有限公司 | Key switch lift test circuit |
| CN105258927A (en) * | 2015-10-21 | 2016-01-20 | 昆山鸿志犀自动化机电设备有限公司 | Keyboard button longevity testing device |
| CN105572507A (en) * | 2016-01-12 | 2016-05-11 | 中国信息安全测评中心 | Automation test circuit and method for key-type equipment |
| CN109884510A (en) * | 2019-03-29 | 2019-06-14 | 珠海格力大金机电设备有限公司 | Control panel automatic detection system and detection method |
| CN113341300A (en) * | 2021-06-23 | 2021-09-03 | 紫光展讯通信(惠州)有限公司 | Matrix key circuit automatic detection method, system, medium and equipment |
-
2005
- 2005-10-13 CN CN 200510100408 patent/CN1948985A/en active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339109B (en) * | 2007-07-02 | 2010-12-08 | 鸿富锦精密工业（深圳）有限公司 | Product squeezing and test device and method |
| CN101384064B (en) * | 2008-10-21 | 2011-08-10 | 深圳市汇创达科技有限公司 | Mobile phone thin film press-key duplicate tablet/missing tablet/reversed tablet detection method and device thereof |
| CN101639506B (en) * | 2009-07-16 | 2012-06-27 | 旭丽电子(广州)有限公司 | Test method of electronic device |
| CN102200566A (en) * | 2010-03-22 | 2011-09-28 | 鸿富锦精密工业（深圳）有限公司 | Key testing device |
| CN102466780B (en) * | 2010-11-03 | 2016-03-09 | 苏州普源精电科技有限公司 | A kind of starting-up keyboard detection method of instrument and device |
| CN102466780A (en) * | 2010-11-03 | 2012-05-23 | 北京普源精电科技有限公司 | Method and device for detecting starting-up keyboard of instrument |
| CN102163169A (en) * | 2010-12-30 | 2011-08-24 | 东莞市长田电子有限公司 | Testing device of keyboard type circuit board |
| CN102735954A (en) * | 2011-04-14 | 2012-10-17 | 东莞市时唛特电器有限公司 | Test device for toaster service life |
| CN102645631A (en) * | 2012-04-28 | 2012-08-22 | 吉林大学 | Automobile key switch testing system and testing method |
| CN104215531A (en) * | 2013-05-30 | 2014-12-17 | 深圳市海洋王照明工程有限公司 | Key switch lift test circuit |
| CN104215531B (en) * | 2013-05-30 | 2017-02-08 | 深圳市海洋王照明工程有限公司 | Key switch lift test circuit |
| CN105258927A (en) * | 2015-10-21 | 2016-01-20 | 昆山鸿志犀自动化机电设备有限公司 | Keyboard button longevity testing device |
| CN105572507A (en) * | 2016-01-12 | 2016-05-11 | 中国信息安全测评中心 | Automation test circuit and method for key-type equipment |
| CN109884510A (en) * | 2019-03-29 | 2019-06-14 | 珠海格力大金机电设备有限公司 | Control panel automatic detection system and detection method |
| CN113341300A (en) * | 2021-06-23 | 2021-09-03 | 紫光展讯通信(惠州)有限公司 | Matrix key circuit automatic detection method, system, medium and equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1948985A (en) | Press key function testing system and method | |
| CN1156991C (en) | Information terminal apparatus setted with background light | |
| CN100583647C (en) | Over-drive D/A converter and source pole driver and its method | |
| TW200608031A (en) | Method and system for controlling interchangeable components in a modular test system | |
| CN1959792A (en) | System and method for driving keypad backlight with balance-dimming capability | |
| CN1936615A (en) | Push-button service-life detection system and method | |
| CN200972840Y (en) | Operation mechanism for linear electric machine of high voltage breaker | |
| CN1822679A (en) | Automatic detecting device and method for TV set | |
| CN102011945B (en) | A light emitting device capable of dynamically regulating output voltage and related control method | |
| CN1255016A (en) | TV receiver | |
| CN101286287A (en) | Light-emitting component drive apparatus and its assembly and status transferring method | |
| CN101547537A (en) | Scene switch control method with touch control and dynamic interface display | |
| CN1761299A (en) | Method for automatical selecting video channel | |
| CN1057436A (en) | Controlling apparatus for elevator group manage | |
| CN2719789Y (en) | Three-in-one external-calling elevator control display device | |
| CN100335391C (en) | Three in one elevator controlling and displaying unit called from outside | |
| CN201334284Y (en) | Lift linkage system applied to building control system | |
| WO2019244123A1 (en) | Touch slider based landing operating panel system and method thereof | |
| CN101625566B (en) | Keystroke automatic assembly control system, key assembling device and main control device | |
| GB2304439A (en) | Key function setting method using dual colour light emitting diode | |
| CN1677360A (en) | Multi-computer detest switch-over device | |
| CN211639980U (en) | Terminal keypad test system of cooperation robot | |
| CN215415682U (en) | Backlight test system | |
| CN1054229A (en) | Controlling apparatus for indicator lamp of elevator | |
| CN2748977Y (en) | Electronic equipment having touch plate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |