CN215415682U - Backlight test system - Google Patents

Backlight test system Download PDF

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Publication number
CN215415682U
CN215415682U CN202121671739.7U CN202121671739U CN215415682U CN 215415682 U CN215415682 U CN 215415682U CN 202121671739 U CN202121671739 U CN 202121671739U CN 215415682 U CN215415682 U CN 215415682U
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China
Prior art keywords
backlight
path
switch
module
power supply
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CN202121671739.7U
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Chinese (zh)
Inventor
姜培培
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Jiangxi Holitech Technology Co Ltd
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Jiangxi Holitech Technology Co Ltd
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Priority to CN202121671739.7U priority Critical patent/CN215415682U/en
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Abstract

The utility model discloses a backlight test system, comprising: the device comprises a control module, a backlight power supply module and a backlight module to be tested; the control signal output end of the control module is connected with the control signal input end of the backlight power supply module, and the current output end of the backlight power supply module is connected with the current input end of the backlight module to be tested; the backlight power supply module comprises a backlight switch unit, and the backlight switch unit consists of a first path of backlight switch, a second path of backlight switch, a third path of backlight switch, a fourth path of backlight switch, a fifth path of backlight switch and a sixth path of backlight switch. According to the utility model, the backlight power supply module is added to control the output current, and the on-off condition of the switch in the backlight power supply module is controlled to meet the backlight modules with different power consumption requirements, so that the operation is convenient, the intelligent and reliable effects are realized, and the manual switching is not required by simultaneously welding a plurality of power supply boards.

Description

Backlight test system
Technical Field
The utility model relates to the technical field of test fixtures, in particular to a backlight test system.
Background
The traditional backlight testing device uses a special constant current chip, and manually adjusts the current output by a plurality of parallel testing plates according to the different required testing currents.
With the development of science and technology, customers have higher and higher requirements on the quality of a function machine, and various reliability experiments are added to become necessary means for verification, such as the service life of backlight under a limiting current and the like; the factory is tested by using an external backlight power supply, the backlight current is manually welded and wired according to each project, and if the current needs to be switched in the experimental process, a plurality of power panels need to be welded simultaneously for switching, so that the experiment is complex.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem of providing a backlight testing system, which controls output current by adding a backlight power supply module, controls the on-off condition of a switch in the backlight power supply module to meet backlight modules with different power consumption requirements, is convenient to operate, is intelligent and reliable, and does not need to weld a plurality of power supply boards for switching at the same time.
In order to achieve the above object, the present invention provides a backlight testing system, which comprises: the device comprises a control module, a backlight power supply module and a backlight module to be tested;
the control signal output end of the control module is connected with the control signal input end of the backlight power supply module, and the current output end of the backlight power supply module is connected with the current input end of the backlight module to be tested;
the backlight power supply module comprises a backlight switch unit, and the backlight switch unit consists of a first path of backlight switch, a second path of backlight switch, a third path of backlight switch, a fourth path of backlight switch, a fifth path of backlight switch and a sixth path of backlight switch;
the control module controls the first path of backlight switch, the second path of backlight switch, the third path of backlight switch, the fourth path of backlight switch, the fifth path of backlight switch and the sixth path of backlight switch to be switched on and off according to the power current required by the backlight module to be tested.
Specifically, a control signal output end of the control module sends a control signal output control instruction to a control signal input end of the backlight power supply module, and the on-off condition of a backlight switch unit in the backlight power supply module is controlled to meet backlight modules with different power consumption requirements, so that complicated operation steps of welding a plurality of power supply boards for switching at the same time in the prior art are simplified. The standard of each of the first backlight switch, the second backlight switch, the third backlight switch, the fourth backlight switch, the fifth backlight switch and the sixth backlight switch is 20mA, the backlight module meets different test power consumption requirements through different combinations, and for special test power consumption requirements, the backlight module can be realized by adjusting the variable resistor.
Furthermore, the control module controls the input of the test current at the current input end of the backlight module to be tested by controlling the on and off of the backlight switch unit in the backlight power supply module.
Further, the control module adopts a micro-processing chip with the model number of C8051.
Furthermore, the backlight power supply module further comprises a backlight chip and a variable resistor, wherein a control signal output end of the control module is connected with a control signal input end of the backlight chip in the backlight power supply module, a current output end of the backlight chip is connected with the backlight switch unit through the variable resistor, and the backlight switch unit is connected with a current input end of the backlight module to be tested.
Further, the backlight chip is the backlight chip with the model number RP 1366.
Compared with the prior art, the technical scheme of the utility model has the following advantages: the control module sends a corresponding control signal to the backlight power supply module through the signal control end, controls the backlight current in the backlight power supply module to enable the backlight power supply module to output a test current corresponding to the backlight module to be tested, and transmits the test current to the input end of the backlight module to be tested through the output end of the backlight power supply module to supply power for the backlight module to be tested. Compared with the traditional backlight testing device, the manual and tedious welding work is avoided, so that the backlight testing is more intelligent and reliable, and the switching is convenient.
Drawings
Fig. 1 is a block diagram of a backlight testing system according to an embodiment of the present invention.
Detailed Description
In this embodiment:
the following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the utility model but are not intended to limit the scope of the utility model.
As shown in fig. 1, a backlight testing system includes: the device comprises a control module, a backlight power supply module and a backlight module to be tested;
the control signal output end of the control module is connected with the control signal input end of the backlight power supply module, and the current output end of the backlight power supply module is connected with the current input end of the backlight module to be tested;
the backlight power supply module comprises a backlight switch unit, and the backlight switch unit consists of a first path of backlight switch, a second path of backlight switch, a third path of backlight switch, a fourth path of backlight switch, a fifth path of backlight switch and a sixth path of backlight switch;
the control module controls the on and off of the first path of backlight switch, the second path of backlight switch, the third path of backlight switch, the fourth path of backlight switch, the fifth path of backlight switch and the sixth path of backlight switch according to the power consumption current required by the backlight module to be tested.
Specifically, a control signal output end of the control module sends a control signal output control instruction to a control signal input end of the backlight power supply module, and the on-off condition of a backlight switch unit in the backlight power supply module is controlled to meet backlight modules with different power consumption requirements, so that complicated operation steps of welding a plurality of power supply boards for switching at the same time in the prior art are simplified. The standard of each of the first path of backlight switch, the second path of backlight switch, the third path of backlight switch, the fourth path of backlight switch, the fifth path of backlight switch and the sixth path of backlight switch is 20 mA.
The control module controls the input of the test current at the current input end of the backlight module to be tested by controlling the on and off of the backlight switch unit in the backlight power supply module.
Wherein, the control module adopts a micro-processing chip with the model number of C8051.
The backlight power supply module further comprises a backlight chip and a variable resistor, a control signal output end of the control module is connected with a control signal input end of the backlight chip in the backlight power supply module, a current output end of the backlight chip is connected with a backlight switch unit through the variable resistor, and the backlight switch unit is connected with a current input end of the backlight module to be tested.
The backlight chip is the RP1366 backlight chip.
The control module sends a corresponding control signal to the backlight power supply module through the signal control end, controls the backlight current in the backlight power supply module to enable the backlight power supply module to output a test current corresponding to the backlight module to be tested, and transmits the test current to the input end of the backlight module to be tested through the output end of the backlight power supply module to supply power for the backlight module to be tested. Compared with the traditional backlight testing device, the manual and tedious welding work is avoided, so that the backlight testing is more intelligent and reliable, and the switching is convenient.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the technical principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims (5)

1. A backlight test system, comprising: the device comprises a control module, a backlight power supply module and a backlight module to be tested;
the control signal output end of the control module is connected with the control signal input end of the backlight power supply module, and the current output end of the backlight power supply module is connected with the current input end of the backlight module to be tested;
the backlight power supply module comprises a backlight switch unit, and the backlight switch unit consists of a first path of backlight switch, a second path of backlight switch, a third path of backlight switch, a fourth path of backlight switch, a fifth path of backlight switch and a sixth path of backlight switch;
the control module controls the first path of backlight switch, the second path of backlight switch, the third path of backlight switch, the fourth path of backlight switch, the fifth path of backlight switch and the sixth path of backlight switch to be switched on and off according to the power current required by the backlight module to be tested.
2. The backlight testing system of claim 1, wherein the control module controls the input of the testing current at the current input terminal of the backlight module to be tested by controlling the on/off of the backlight switch unit in the backlight power supply module.
3. The backlight test system of claim 1, wherein the control module is a microprocessor chip with a model number of C8051.
4. The backlight testing system of claim 1, wherein the backlight power supply module further comprises a backlight chip and a variable resistor, a control signal output terminal of the control module is connected to a control signal input terminal of the backlight chip in the backlight power supply module, a current output terminal of the backlight chip is connected to the backlight switch unit through the variable resistor, and the backlight switch unit is connected to a current input terminal of the backlight module to be tested.
5. The backlight test system according to claim 4, wherein the backlight chip is a RP1366 backlight chip.
CN202121671739.7U 2021-07-22 2021-07-22 Backlight test system Active CN215415682U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202121671739.7U CN215415682U (en) 2021-07-22 2021-07-22 Backlight test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202121671739.7U CN215415682U (en) 2021-07-22 2021-07-22 Backlight test system

Publications (1)

Publication Number Publication Date
CN215415682U true CN215415682U (en) 2022-01-04

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202121671739.7U Active CN215415682U (en) 2021-07-22 2021-07-22 Backlight test system

Country Status (1)

Country Link
CN (1) CN215415682U (en)

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