CN1928836A - Automatic control testing system and method for host board - Google Patents
Automatic control testing system and method for host board Download PDFInfo
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- CN1928836A CN1928836A CN 200510103757 CN200510103757A CN1928836A CN 1928836 A CN1928836 A CN 1928836A CN 200510103757 CN200510103757 CN 200510103757 CN 200510103757 A CN200510103757 A CN 200510103757A CN 1928836 A CN1928836 A CN 1928836A
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Abstract
The automatic-control testing method for complex mainboards at one time comprises: providing a network system between a control host and complex testing devices with communication through network; or outputting testing signal from the host to control devices for testing; a memory in the host used to store testing results. This invention can improve testing efficiency.
Description
Technical field
The present invention is a kind of automatic control test macro and method, particularly a kind of system and method that adopts network mode motherboard to be controlled automatically test.
Background technology
Be provided with many chipsets and electronic component above the motherboard, by adapter (as display card, network card, sound card), central processing unit, storer, Winchester disk drive are installed, and can offer a processing platform of computer operating on motherboard.Yet motherboard can work orderly in order to ensure motherboard via after the Production Line manufacturing, must verify whether the feature operation of motherboard is normal through the test of row.
And for the test mode of motherboard, is that the manual operations of being dependent on manpower is tested mostly in early days, but this test mode obviously can't satisfy the desired high efficiency of production line, and the manual testing also makes mistakes easily.Therefore be to come motherboard is made automatic test at present mostly in conjunction with computing machine, its test mode is by the corresponding Testing apparatus of a main control system (as computing machine), cooperate some complicated test cards simultaneously, and motherboard to be measured is installed in Testing apparatus, give motherboard to be measured by the relevant test signal of main control system control Testing apparatus output, and finish the automatic test of motherboard.
Therefore for the automatic test of existing motherboard, be to take man-to-man mode to carry out, promptly main control system can only corresponding Testing apparatus, and if will test a plurality of motherboards to be measured, can utilize the mode of wheel current test to finish, but the efficient of wheel current test is too poor, and build-in test finishes all motherboards to be measured at one time, so just must use more hardware cost in order to improve testing efficiency, utilize the Testing apparatus of many group main control systems and many groups, at one time intact all motherboards to be measured of build-in test.Therefore, for as less hardware cost how, and finish the test of all motherboards to be measured in can be at one time, and can improve testing efficiency and accuracy again, then be that the present invention has problem to be solved.
Summary of the invention
Technical matters to be solved by this invention, be to provide a kind of automatic control test macro and method thereof of motherboard, in test process, a plurality of motherboards to be measured are tested by coming in conjunction with network system, reaching less hardware cost demand and to reduce the required time of test, and then improve the efficient of test.
In order to solve the problems of the technologies described above, according to a kind of scheme of the present invention, provide a kind of automatic control test macro of motherboard, be used for testing simultaneously a plurality of motherboards to be measured, comprising: a network system; A plurality of Testing apparatus that are connected with network system respectively, and in these Testing apparatus, have a test procedure respectively, Testing apparatus can be tested these motherboard to be measured respectively by carrying out test procedure; A main control system that is connected with network system, main control system has a control program, and the execution of control program can be used to control and monitors these Testing apparatus and carry out automatic test; A test signal generation unit that is connected with main control system can be used to output test signal and gives these motherboards to be measured; One switch control unit can will be given that of these motherboards to be measured with the test signal of selecting test signal generation unit to be exported according to the execution of control program.Therefore these test procedures a plurality of test results of carrying out gained can return to main control system by network system, and allow main control system these test results of can filing.
In order to solve the problems of the technologies described above, according to another kind of scheme of the present invention, a kind of automatic control method of testing of motherboard is provided, be used for testing simultaneously a plurality of motherboards to be measured, the step that comprises is: set up a network system of linking up transmission between a plurality of Testing apparatus and a main control system; Main control system is controlled these Testing apparatus starts to test by carrying out a control program; These Testing apparatus indivedual test procedures of carrying out after start come respectively these host board testings to be measured; These Testing apparatus are also carried out the test result of gained to main control system by network system passback test procedure respectively; And main control system can file the test result that receives.
Adopt the automatic control test macro and the method thereof of motherboard of the present invention, allow one main control system can control many Testing apparatus simultaneously by network system, so, the present invention finishes the test of a plurality of motherboards to be measured in can be at one time, and do not need expensive hardware cost expenditure, also improved testing efficiency simultaneously.
Description of drawings
Fig. 1 is the system architecture diagram of one of preferred embodiment of the present invention;
Fig. 2 is the block schematic diagram of Testing apparatus of the present invention; And
Fig. 3 is the process flow diagram of one of preferred embodiment of the present invention.
Symbol description among the figure:
10 main control systems
30 network systems
50 Testing apparatus
70 motherboards to be measured
80 test signal generation units
90 switch control units
501 tunnel interface modules
503 control modules
505 storage elements
5051 test procedures
Embodiment
See also Fig. 1, it is the system architecture diagram of one of preferred embodiment of the present invention.A kind of automatic control test macro of motherboard is provided in the present embodiment, can be used to test simultaneously a plurality of motherboards to be measured 70, include: a main control system 10, a network system 30, a plurality of Testing apparatus 50, a test signal generation unit 80 and a switch control unit 90.
Wherein main control system 10 has a control program, and main control system 10 controls and monitor the test that each Testing apparatus 50 is finished robotization by executive control program, and the test result of each Testing apparatus 50 that can file.
Network system 30 is connected between main control system 10 and each Testing apparatus 50, and the transmission communication platform between main control system 10 and each Testing apparatus 50 is provided.The network system 30 of present embodiment can be Ethernet system (Ethernet network), can pass through a hub (figure slightly) and be connected with the network port of main control system 10 and the network port of each Testing apparatus 50.
Testing apparatus 50 is used for motherboard 70 to be measured is tested, and motherboard 70 to be measured of each Testing apparatus 50 corresponding installation is tested.See also Fig. 2, Testing apparatus 50 includes: a tunnel interface module 501, one control module 503 and a storage element 505, the tunnel interface module 501 of Testing apparatus 50 can be used to be connected with the I/O port of motherboard 70 to be measured, storage element 505 is used for storing a test procedure 5051, these test procedure 5051 usefulness decide will be to the content measurement of motherboard 70 to be measured, control module 503 is connected between tunnel interface module 501 and the storage element 505, control module 503 can be carried out the test procedure 5051 in the storage element 505, and gives motherboard 70 to be measured by tunnel interface module 501 test transmission signals.
80 of test signal generation units provide main control system 10 to test and to measure motherboard 70 to be measured in response to the test request of Testing apparatus 50 propositions.Test signal generation unit 80 is connected in main control system 10, and can export the test signal and give motherboard 70 to be measured under the control of main control system 10.The test signal generation unit 80 of present embodiment can be I/O control card and measuring instrument, wherein the I/O control card can be connected with the I/O port of main control system 10, as RS-232 port, USB port, LPT port, and allow main control system 10 test for motherboard 70 to be measured by control I/O control card output I/O test signal.Measuring instrument then is and GPIB (the General Purpose Instrument Bus) card connection of main control system 10, and allow main control system 10 control measuring instrument by control GPIB card motherboard 70 to be measured is carried out the signal measurement.
It is receive for that Testing apparatus 50 that 90 execution according to control program of switch control unit are used for controlling the signal that test signal generation unit 80 exported.Therefore the switch that provides by this switch control unit 90 switches selection, the signal that test signal generation unit 80 is exported can be switched to for some Testing apparatus 50 receptions, and allow main control system 10 assign the test control of wanting any Testing apparatus 50.
Present embodiment is by the connection of network system 30, and can allow main control system 10 and each Testing apparatus 50 form a LAN framework, and main control system 10 also can provide a storage area (as Winchester disk drive) of sharing to use for each Testing apparatus 50 by the execution of control program, and the pattern of utilizing archives to share allows communication between main control system 10 and the Testing apparatus 50, so just can allow each Testing apparatus 50 passback test result file in the main control system 10.
See also Fig. 3, it is the process flow diagram of one of preferred embodiment of the present invention.At first each motherboard 70 to be measured is installed to each Testing apparatus 50, allows Testing apparatus 50 go into signal and test for motherboard 70 to be measured, therefore when main control system 10 beginning executive control programs (S301) by tunnel interface module 501 outputs; Each Testing apparatus 50 starts (S303) of main control system 10 controls, and the mode of main control system 10 control Testing apparatus 50 starts is to export I/O test signal (as the switch signal) by the I/O control card, and select a Testing apparatus 50 to receive this I/O by switch control unit 90 and test signal, finish the start of this Testing apparatus 50, and come in the same way other Testing apparatus of not starting shooting 50 is started shooting.And after each Testing apparatus 50 is all started shooting, can carry out the test procedure 5051 of oneself and respectively each motherboard 70 to be measured be tested (S305); Each Testing apparatus 50 can return the test result of carrying out test procedure 5051 gained respectively by network system 30 and give main control system 10 (S307) afterwards.
Then, main control system 10 equally receives the test result of each Testing apparatus 50 passback and upgrades the last state (S309) of the test result in main control system 10 before by network system 30; Next main control system 10 checks whether the test request (S311) of receiving each Testing apparatus 50 passback is arranged; If check result is for being, main control system 10 is tested (S313) according to the test request of each Testing apparatus 50 passback by test signal generation unit 80, for example when Testing apparatus 50 is wanted the execute key looping test, Testing apparatus 50 can first transfer key looping test requirement give main control system 10, and main control system 10 receives that this test request will come the instruction of run-out key looping test by the I/O control card, and the Testing apparatus 50 of passback test request can be tested motherboard 70 to be measured according to this keyboard test instruction.
Next after the step of (S313) or step (S311) when not being judged as not, main control system 10 is judged whether end of test (EOT) (S315) of each Testing apparatus 50; If judged result for otherwise the step of getting back to (S307) continue to carry out; And if judged result is for being the test result (S317) of each Testing apparatus 50 passback of main control system 10 files; Main control system 10 and control 50 shutdown (S319) of each Testing apparatus afterwards, and finish automatic test to these motherboards 70 to be measured.And when need next organizing the motherboard to be measured 70 of quantity in test, the motherboard to be measured 70 that then only needs to be installed in Testing apparatus 50 at present unloads, reinstall one of new group motherboard 70 to be measured, and just can finish the automatic test of motherboard 70 to be measured according to operating process shown in Figure 3.
In sum, the automatic control test macro and the method thereof of motherboard provided by the present invention have following characteristics:
1, simultaneously many Testing apparatus is controlled with a main control system, and each Testing apparatus all is equipped with a motherboard to be measured, therefore can finish the test of a plurality of motherboards to be measured at one time with the less hardware cost, time in the time of so can reducing test, to improve testing efficiency, reach the expenditure that reduces hardware cost.
2, control computer hardware automatically by program implementation, not only can reduce the operation of manpower and reduce artificial operating mistake, more can improve precision of test result.
The above-mentioned accompanying drawing that discloses, explanation only are embodiments of the invention, allly are skillful in this skill person when can doing other all improvement according to above-mentioned explanation, and these change in the claim that still belongs to invention spirit of the present invention and defined.
Claims (17)
1, a kind of automatic control test macro of motherboard is used for testing simultaneously a plurality of motherboards to be measured, it is characterized in that, comprising:
One network system;
A plurality of Testing apparatus are connected with this network system respectively, and these testers have a test procedure respectively, and these Testing apparatus are used for respectively these motherboards to be measured are tested by carrying out these test procedures respectively;
One main control system is connected with this network system, has a control program and is used for controlling and monitoring these Testing apparatus and carry out automatic test;
One test signal generation unit is connected with this main control system, is used for output test signal to these motherboards to be measured; And
One switch control unit is given one of these motherboards to be measured according to the execution of this control program with the test signal of selecting this test signal generation unit and being exported;
Wherein these test procedures a plurality of test results of carrying out gained return to this main control system by this network system, for this main control system these test results of filing.
2, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, wherein this network system is the Ethernet system.
3, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, wherein this network system is connected to form by the network port of a hub and this main control system and the network port of these Testing apparatus.
4, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, this Testing apparatus wherein comprises:
One tunnel interface module is used for being connected with the I/O port of this motherboard to be measured;
One storage element stores this test procedure; And
One control module is carried out this test procedure and by this tunnel interface module this motherboard to be measured is tested.
5, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, wherein this main control system so that a storage area of sharing to be provided, supplies the test result of these Testing apparatus passbacks of file by the execution of this control program.
6, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, should test signal generation unit be an I/O control card that is connected with the I/O port of this main control system wherein.
7, the automatic control test macro of motherboard as claimed in claim 6 is characterized in that, wherein the I/O port of this main control system is RS-232 port, USB port or LPT port.
8, the automatic control test macro of motherboard as claimed in claim 1 is characterized in that, wherein this test signal generation unit is a measuring instrument, a GPIB card connection of this measuring instrument and this main control system.
9, a kind of automatic control method of testing of motherboard is used for testing simultaneously a plurality of motherboards to be measured, it is characterized in that, comprising:
Set up a network system between a plurality of Testing apparatus and a main control system;
This main control system is carried out a control program and is controlled these Testing apparatus starts to test;
The indivedual test procedures of carrying out of these Testing apparatus come respectively these host board testings to be measured;
These Testing apparatus return this test procedure by this network system respectively and carry out the test result of gained to this main control system; And
This main control system these test results of filing.
10, the automatic control method of testing of motherboard as claimed in claim 9 is characterized in that, wherein this network system is the Ethernet system.
11, the automatic control method of testing of motherboard as claimed in claim 9 is characterized in that, wherein this main control system is to export I/O test signal by the I/O control card to start shooting for this Testing apparatus.
12, the automatic control method of testing of motherboard as claimed in claim 9, it is characterized in that, wherein this main control system provides a storage area of sharing to use for these Testing apparatus, and the pattern of utilizing archives to share these test results that these Testing apparatus return of filing.
13, the automatic control method of testing of motherboard as claimed in claim 9 is characterized in that, further comprises:
This main control system judges whether to receive the test request of arbitrary this Testing apparatus passback, if judged result is for being that this main control system comes this host board testing to be measured for this Testing apparatus that returns test request by a test signal generation unit output test signal.
14, the automatic control method of testing of motherboard as claimed in claim 13 is characterized in that, should test signal generation unit be an I/O control card that is connected with the I/O port of this main control system wherein.
15, the automatic control method of testing of motherboard as claimed in claim 13 is characterized in that, wherein this test signal generation unit is a measuring instrument, a GPIB card connection of this measuring instrument and this main control system.
16, the automatic control method of testing of motherboard as claimed in claim 13, it is characterized in that, this Testing apparatus of wherein should test signal generation unit output test signal giving the passback test request is by a switch control unit, and this switch control unit provides switch and switches to select this test signal generation unit to be exported and test signal and switch to and supply the reception of one of these Testing apparatus.
17, the automatic control method of testing of motherboard as claimed in claim 9 is characterized in that, further comprises:
This main control system receives these test results of these Testing apparatus passbacks, and is used for upgrading the last state of the test result in this main control system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101037574A CN100397359C (en) | 2005-09-09 | 2005-09-09 | Automatic control testing system and method for host board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101037574A CN100397359C (en) | 2005-09-09 | 2005-09-09 | Automatic control testing system and method for host board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1928836A true CN1928836A (en) | 2007-03-14 |
| CN100397359C CN100397359C (en) | 2008-06-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005101037574A Expired - Fee Related CN100397359C (en) | 2005-09-09 | 2005-09-09 | Automatic control testing system and method for host board |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101963930B (en) * | 2009-07-21 | 2013-06-12 | 纬创资通股份有限公司 | Automatic test device |
| CN105607977A (en) * | 2015-12-28 | 2016-05-25 | 环胜电子(深圳)有限公司 | Power state testing system |
| CN108627195A (en) * | 2018-08-17 | 2018-10-09 | 深圳市金邦科技发展有限公司 | A kind of intelligent detecting method and intelligent checking system that memory body module is detected |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11211796A (en) * | 1998-01-30 | 1999-08-06 | Toshiba Corp | Substrate unit function tester |
| US20030060996A1 (en) * | 2000-06-07 | 2003-03-27 | John Yi | Semi-automated multi-site system tester |
| CN1176423C (en) * | 2001-05-10 | 2004-11-17 | 华硕电脑股份有限公司 | Mainboard test program process system and method thereof |
| CN1180347C (en) * | 2001-05-11 | 2004-12-15 | 华硕电脑股份有限公司 | Realtime on-line supervisory/control method |
-
2005
- 2005-09-09 CN CNB2005101037574A patent/CN100397359C/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101963930B (en) * | 2009-07-21 | 2013-06-12 | 纬创资通股份有限公司 | Automatic test device |
| CN105607977A (en) * | 2015-12-28 | 2016-05-25 | 环胜电子(深圳)有限公司 | Power state testing system |
| CN108627195A (en) * | 2018-08-17 | 2018-10-09 | 深圳市金邦科技发展有限公司 | A kind of intelligent detecting method and intelligent checking system that memory body module is detected |
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| Publication number | Publication date |
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| CN100397359C (en) | 2008-06-25 |
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Owner name: HUANSHENG ELECTRONIC (SHENZHEN) CO., LTD. Free format text: FORMER OWNER: UNIVERSAL SCIENTIFIC INDUSTRIAL CO., LTD. Effective date: 20081107 |
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Granted publication date: 20080625 Termination date: 20110909 |