CN1873432A - Testing device and testing method thereof - Google Patents
Testing device and testing method thereof Download PDFInfo
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- CN1873432A CN1873432A CN 200510103836 CN200510103836A CN1873432A CN 1873432 A CN1873432 A CN 1873432A CN 200510103836 CN200510103836 CN 200510103836 CN 200510103836 A CN200510103836 A CN 200510103836A CN 1873432 A CN1873432 A CN 1873432A
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- connector
- pattern
- workstation
- pin cap
- row
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Abstract
The invention relates to a measuring method. The cable is connected to a working station, working station is provided with pass mode and not-pass mode, cable comprises the first connector and the second connector, which are connected to said device in selector mode; be-measured device comprises a signal receiving terminal and a jumper wire receiving terminal, the signal receiving terminal receives the first connector or the second connector, jumper wire terminal includes one main device connector, one auxiliary device connector and one selecting creel connector, one of which can be provided with one pin cap. When the first connector is connected to signal receiving terminal, and if the pin cap is installed in main device connector or selecting creel connector, the working station will show pass mode, and if pin cap is installed in auxiliary device connector, the working station will show not-pass mode. When the second connector is connected to signal receiving terminal, and if the pin cap is installed in auxiliary device connector or selecting creel connector, the working station will show pass mode, and if pin cap is installed in main device connector, the working station will show not-pass mode.
Description
Technical field
The present invention is about a kind of proving installation and method of testing thereof, especially about a kind of proving installation and method of testing thereof that can detect for the pattern of the device with ide interface.
Background technology
General device (for example: CD-ROM drive (CD-ROM drive) or Winchester disk drive (harddrive)) with ide interface be dispose a main equipment joint (master pin), a secondary device junction (slave pin) and is chosen winding displacement joint (cable select pin), so just can carry out the setting of different mode for this IDE device by at least one row's pin cap (jumper cap).
When row's pin cap was arranged at choosing winding displacement joint, IDE device and being connected in a main frame (host) via a connector (connector) (being generally black) of a cable end piece of IDE device, then just can to detect this IDE device when start be to be in main equipment " Master " pattern to main frame.When row's pin cap was arranged at choosing winding displacement joint, IDE device and being connected in main frame via another connector (being generally blueness) of cable of IDE device, then just can to detect this IDE device when start be to be in secondary equipment " Slave " pattern to main frame.Online in producing, if main frame detects row's pin cap of this IDE device when being incorrect placements when start, operating personnel then must with part or even all circuits of being correlated with removed so that carry out visual examination.
Summary of the invention
Purpose of the present invention just is to provide an a kind of proving installation and method of testing thereof that can detect the pattern of an IDE device.
For reaching above-mentioned purpose, the invention provides a kind of proving installation, in order to test for a device under test.Device under test comprises a signal terminal and wire jumper terminals, and the wire jumper terminals comprise that a main equipment joint, a secondary device junction and choose the winding displacement joint.Proving installation comprises: a workstation, comprise by pattern with do not pass through pattern; One cable is connected in workstation, and cable comprises one first connector and one second connector, but first connector, second connector are connected in signal terminal with selection mode; One row's pin cap, but be connected in main equipment joint, secondary device junction and one of choose in the winding displacement joint person with selection mode.When first connector is connected in signal terminal, if when row's pin cap is arranged at the main equipment joint and one of chooses in the winding displacement joint person, then workstation shows by pattern, if row's pin cap is arranged at when choosing the winding displacement joint, then workstation shows and do not pass through pattern; When second connector is connected in signal terminal, if when row's pin cap is arranged at secondary device junction and one of chooses in the winding displacement joint person, then workstation shows by pattern, if when row's pin cap is arranged at the main equipment joint, then workstation shows and do not pass through pattern.
For above and other objects of the present invention, feature and advantage can be become apparent, a preferred embodiment cited below particularly, and conjunction with figs. are described in detail below:
Description of drawings
Fig. 1 is shown in the proving installation of the present invention (E) and of test period and integrates driving electronic interface device (IDE device) stereographic map;
The proving installation of the present invention (E) that Fig. 2 A is shown in test period is connected in the planimetric map of device under test (D1);
The proving installation of the present invention (E) that Fig. 2 B is shown in test period is connected in the planimetric map of device under test (D1);
Fig. 3 A-Fig. 3 C represent device under test (D1) three kinds of indivedual pattern main equipments, secondary equipment, choose the planimetric map of winding displacement (MA, SL, CS); And
Fig. 4 represents the process flow diagram of method of testing of the present invention.
Symbol description
1～housing
10～signal terminal
101,102～step
1011,1012,1013～step
1021,1022～step
11～wire jumper terminals
12～socket
C1, C2, C3～first connector
CB～cable
CS～choose winding displacement joint
D1～device under test (tested integration drives the electronic interface device)
E～proving installation
HW～hardware
JC～row's pin cap
MA～main equipment joint
SL～secondary device junction
ST～workstation
SW～software
Embodiment
As shown in Figure 1, a proving installation E of the present invention comprises a workstation (station) ST, a cable (cable) CB and row's pin cap (jumper cap) JC.One tested integration (for example: CD driver device (CD-ROM device)) comprise a housing (housing) 1, a signal terminal (signal terminal) 10, one wire jumper terminals (jumperterminal) 11 and a socket (socket) 12 drives electronic interface device (testedIDE device) D1 (hereinafter to be referred as device under test).Signal terminal 10, wire jumper terminals 11 and socket 12 are arranged at the rear side of housing 1.
Shown in Fig. 2 A, Fig. 2 B, workstation ST comprises software (software) SW and hardware (hardware) HW.Software SW can provide two kinds of patterns (by (pass) with by (fail)), by by with not by pattern with check device under test D1.Hardware HW (for example: be to be controlled by software SW and to be connected in cable CB motherboard (motherboard)).Cable CB comprises one first connector (firstconnector) C1, one second connector (second connector) C2 and one the 3rd connector (thirdconnector) C3.But the first connector C1 and the second connector C2 are the signal terminals 10 that is connected in device under test D1 with selection mode, and the 3rd connector C3 is the hardware HW that is electrically connected at workstation ST.Wire jumper terminals 11 have comprised that a main equipment joint (master pin) MA, a secondary device junction (slave pin) SL and choose winding displacement joint (cable select pin) CS.Shown in Fig. 3 A-Fig. 3 C, but row's pin cap JC is connected in main equipment joint MA, the secondary device junction SL of wire jumper terminals 11 or chooses winding displacement joint CS with selection mode, so device under test D1 can be set at main equipment " Master ", secondary equipment " Slave " or choose winding displacement " Cable Select ".In present embodiment, hardware HW comprises AT package connecting interface, and (Advanced Technology Attachment Packet Interface, ATAPI) (hereinafter to be referred as ATAPI) have the various device of ide interface whereby with connection.
Fig. 4 represents the process flow diagram of method of testing of the present invention.In the test process of device under test D1, when row's pin cap JC be arranged at device under test D1 choose winding displacement joint CS the time: if device under test D1 is connected in the first connector C1, then computing machine (PC) or server (server) (not shown) are just the open state of detected device under test D1 can present main equipment " Master " pattern; If device under test D1 is connected in the second connector C2, just then the open state of computing machine or the detected device under test D1 of server can present secondary equipment " Slave " pattern.
On production line (production line), single workstation ST can carry out two continuous testing procedures for the device under test D1 that is tested.Software SW installs in the mode of DOS platform to be arranged among the workstation ST, and wherein, the software SW in first testing procedure is set at main equipment " Master " pattern, and the software SW in second testing procedure is set at secondary equipment " Slave " pattern.Do not needing to close under the situation of PC power source (not shown), the software SW in the above-mentioned testing procedure can utilize ATAPI order (ATAPI command) to detect with main equipment " Master " pattern or secondary equipment " Slave " pattern for device under test D1.
In step 101, when the first connector C1 is connected in signal terminal 10 (step 1011): if row's pin cap JC is placed on main equipment joint MA (Fig. 3 A) or chooses winding displacement joint CS (Fig. 3 C) (step 1013), just then the software SW of workstation ST can demonstrate by pattern or message (message); If row's pin cap JC is when being placed on secondary device junction SL, just then the software SW of workstation ST can demonstrate not by pattern or message (step 1012).
In step 102, when the second connector C2 is connected in signal terminal 10 (step 1021): if row's pin cap JC is placed on secondary device junction SL (Fig. 3 B) or chooses winding displacement joint CS (Fig. 3 C), just then the software SW of workstation ST can demonstrate by pattern or message; If row's pin cap JC is when being placed on main equipment joint MA (Fig. 3 A), just then the software SW of workstation ST can demonstrate not by pattern or message (step 1022).
When device under test D1 has passed through two steps of workstation ST and its software SW and all shows by pattern, then can represent to arrange pin cap JC and be on the position of choosing winding displacement joint CS in the wire jumper terminals 11 that correctly are placed on device under test D1.
Passed through two steps of workstation ST as device under test D1 after, software SW shows by pattern but when second step shows by pattern in first step, then can represent to arrange pin cap JC and is on the position of the main equipment joint MA in the wire jumper terminals 11 that are placed on device under test D1.
Passed through two steps of workstation ST as device under test D1 after, software SW shows not by pattern but when second step shows by pattern in first step, then can represent to arrange pin cap JC and be on the position of the secondary device junction SL in the wire jumper terminals 11 that are placed on device under test D1, or row's pin cap JC is not placed on the wire jumper terminals 11 of device under test D1 when row's pin cap JC is not placed on the wire jumper terminals 11 of device under test D1 (if, then device under test D1 normally is predetermined to be secondary equipment " Slave " pattern) at all.
It should be noted that whether method of testing of the present invention can be placed on the position of the secondary device junction SL in the wire jumper terminals 11 of device under test D1 for row's pin cap JC detects, whereby to replace operating personnel's visual detection mode.In test process, if operating personnel have forgotten to arrange on the wire jumper terminals 11 that pin cap JC is placed on device under test D1, or operating personnel will be will arrange pin cap JC and be placed on main equipment joint MA or secondary device junction SL the time, and then device under test D1 just only can be by person one of in the first step or second step.
Though the present invention with preferred embodiment openly as above; right its is not in order to restriction the present invention, any insider, without departing from the spirit and scope of the present invention; change and retouching when doing, so protection scope of the present invention is as the criterion as the thing appending claims person of defining.
Claims (7)
1. method of testing, test for a device under test by a cable, this cable is connected in a workstation, this workstation provides by pattern and does not pass through pattern, this cable comprises one first connector and one second connector, this first connector, but this second connector is connected in this device under test with selection mode, this device under test comprises a signal terminal and wire jumper terminals, this signal terminal is in order to accept this first connector or this second connector, these wire jumper terminals comprise a main equipment joint, one secondary device junction and one is chosen the winding displacement joint, this main equipment joint, this pair device junction, this chooses the winding displacement joint can accept row's pin cap individually, and this method may further comprise the steps:
(i) this first connector is connected in this signal terminal, if this row's pin cap is arranged at this main equipment joint and this when one of choosing in the winding displacement joint person, then this workstation demonstration should be by pattern, and when being arranged at this pair device junction as if this row's pin cap, then this workstation shows that this does not pass through pattern; And
(ii) this second connector is connected in this signal terminal, if this row's pin cap is arranged at this pair device junction and this when one of choosing in the winding displacement joint person, then this workstation demonstration should be by pattern, and when being arranged at this main equipment joint as if this row's pin cap, then this workstation shows that this does not pass through pattern.
2. method of testing according to claim 1 is characterized in that, if should (i) step with this when (ii) this workstation in the step shows that all this passes through pattern, this row's pin cap that then this device under test connected is to be arranged at this to choose the winding displacement joint.
3. method of testing according to claim 1, it is characterized in that, if this workstation that should (i) step show this pass through pattern and this when (ii) this workstation in the step shows this by pattern, this row's pin cap that then this device under test connected is to be arranged at this main equipment joint.
4. method of testing according to claim 1, it is characterized in that, if this workstation that should (i) step show this not by pattern and this (ii) this workstation in the step show should be by pattern the time that this row's pin cap that then this device under test connected is to be arranged at this pair device junction or this device under test does not connect this row's pin cap.
5. proving installation, in order to test for a device under test, this device under test comprises a signal terminal and wire jumper terminals, and these wire jumper terminals comprise that a main equipment joint, a secondary device junction and choose the winding displacement joint, and this proving installation comprises:
One workstation, comprise by pattern with do not pass through pattern;
One cable is connected in this workstation, and this cable comprises one first connector and one second connector, but this first connector, this second connector are connected in this signal terminal with selection mode;
One row's pin cap one of is chosen in the winding displacement joint person but be connected in this main equipment joint, this pair device junction and this with selection mode; And
When this first connector is connected in this signal terminal, if this row's pin cap is arranged at this main equipment joint and this when one of choosing in the winding displacement joint person, then show should be by pattern for this workstation, if this row's pin cap is arranged at this when choosing the winding displacement joint, then this workstation shows that this does not pass through pattern; And
When this second connector is connected in this signal terminal, if this row's pin cap is arranged at this pair device junction and this when one of choosing in the winding displacement joint person, then this workstation demonstration should be by pattern, and when being arranged at this main equipment joint as if this row's pin cap, then this workstation shows that this does not pass through pattern.
6. proving installation according to claim 5 is characterized in that this workstation comprises software and hardware, and this software provides this not pass through pattern by pattern and this, and this hardware controlled is in this software and be connected in this cable.
7. proving installation according to claim 5 is characterized in that, this workstation comprises AT package connecting interface.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| MYPI20052492 | 2005-06-01 | ||
| MYPI20052492 | 2005-06-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1873432A true CN1873432A (en) | 2006-12-06 |
Family
ID=37483958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510103836 Pending CN1873432A (en) | 2005-06-01 | 2005-09-12 | Testing device and testing method thereof |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN1873432A (en) |
| TW (1) | TW200643704A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101281233B (en) * | 2007-04-05 | 2012-01-18 | 鸿富锦精密工业（深圳）有限公司 | Electric connector test system |
| CN105785160A (en) * | 2015-01-09 | 2016-07-20 | 瑞萨电子株式会社 | Testing method for semiconductor manufacturing equipment |
-
2005
- 2005-09-05 TW TW094130399A patent/TW200643704A/en unknown
- 2005-09-12 CN CN 200510103836 patent/CN1873432A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101281233B (en) * | 2007-04-05 | 2012-01-18 | 鸿富锦精密工业（深圳）有限公司 | Electric connector test system |
| CN105785160A (en) * | 2015-01-09 | 2016-07-20 | 瑞萨电子株式会社 | Testing method for semiconductor manufacturing equipment |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200643704A (en) | 2006-12-16 |
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| C06 | Publication | ||
| PB01 | Publication | ||
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| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |