CN1779923A

CN1779923A - Production of thin-film ferroelectric materials with lead zirconate-titanate with reading circuit integration

Info

Publication number: CN1779923A
Application number: CN 200510029985
Authority: CN
Inventors: 褚君浩; 张晓东; 孟祥建; 孙璟兰; 林铁
Original assignee: Shanghai Institute of Technical Physics of CAS
Current assignee: Shanghai Institute of Technical Physics of CAS
Priority date: 2005-09-23
Filing date: 2005-09-23
Publication date: 2006-05-31
Anticipated expiration: 2025-09-23
Also published as: CN100365776C

Abstract

A process for preparing the ferroelectric film of lead zirconate titanate able to be integrated with read-out circuit includes low-temp (400 deg.C) in-situ growth by magnetically controlled sputtering and high-pressure low-temp processing to obtain high-orientation perovskite-phase PZT film.

Description

Can with the preparation method of the integrated ferroelectric lead zirconate titanate film material of reading circuit

Technical field

The present invention relates to ferroelectric thin-flim materials, specifically be meant a kind of can with the preparation method of integrated lead zirconate titanate (PZT) ferroelectric thin-flim materials of reading circuit.

Background technology

Ferroelectric material is a class strong dielectric material, and its dielectric constant can be up to 10 ²～10 ⁶Ferroelectric material has good ferroelectric, piezoelectricity, pyroelectricity, electric light, acousto-optic and non-linear optical property, has the incomparable superior function of other material.These special natures of ferroelectric material make it all be with a wide range of applications in many-sides such as ultrasonic transduction device, micro electronmechanical coupled apparatus, high capacity capacitor, ferroelectric memory, electrooptical shutter, light shutter device, imaging and display devices.Therefore, its technology of preparing and The Characteristic Study have obtained people's extensive attention.

From practical angle, on the Si base, realize that with the MOS device of preparation in advance monolithic is integrated, be the inevitable development direction of ferroelectric thin film device.Realize this goal, the problem that at first will solve on technology is to reduce the crystallization temperature of ferroelectric thin film.At present broad research is the ferroelectric thin film of representative with PZT, barium strontium titanate (BST), in order to obtain having the ferroelectric phase of pure perovskite structure, generally all needs＞600 ℃ high-temperature process.Because about 450 ℃ of the limit treatment temperature that generally can bear of MOS device of preparation in advance, more than limiting temperature, along with the rising of temperature or the increase of heat treatment time, the life-span and the reliability of MOS device sharply descend.Can not reduce under the heat treatment temperature situation, take in order to reduce total heat, people generally adopt the Technology for Heating Processing of short annealing.But, realizing that single chip integrated basic outlet also is to reduce the crystallization treatment temperature of ferroelectric thin film, the research worker carries out effort always in this respect.

Summary of the invention

Based on the problem that above-mentioned prior art exists, the objective of the invention is to provide a kind of pzt thin film and high pressure low temperature post-processing approach, thereby obtain having the ferroelectric phase pzt thin film of pure perovskite structure by the sputtering method preparation, its concrete steps are as follows:

1.PZT the preparation of film

A. get the monocrystalline silicon piece of substrate, adopt conventional cleaning method, that is, with the ultrasonic cleaning that hockets of ethanol, acetone, carry out chemical cleaning with trichloroethylene then earlier, in vacuum chamber, peel off cleaning with the ar-ion beam etching more at last for (100) orientation.

B. then substrate is put on the specimen holder of sputter, with conventional sputtering technology, LaNiO grows on substrate ₃Bottom electrode layer;

The sputter of C.PZT film

The in-situ sputtering pzt thin film is changed the PZT sputtering target, and sputter cavity base vacuum degree is extracted into 5 * 10 ^-4Pa.Heating simultaneously has LaNiO ₃The silicon substrate of bottom electrode layer, heating-up temperature scope are room temperature to 400 ℃, feed argon gas then and keep air pressure at 1-2pa, carry out the pzt thin film sputtering sedimentation, until desired thickness.

Said PZT sputtering target is by PbO, ZrO ₂And TiO ₂Powder is the volatilization loss of compensation Pb by the stoichiometric proportion proportioning, and the excessive Pb that adds 10%wt more evenly mixes, is pressed into bulk, sinters ceramic target into.

2.PZT the reprocessing of film

The above-mentioned pzt thin film sample for preparing is put into pressure pan, heating pzt thin film sample, heating-up temperature is 380-410 ℃, aerating oxygen and keep air pressure to anneal then at 4Mpa-8Mpa, annealing time is 8-12 hour.Can obtain the pure perovskite phase pzt thin film of height (100) orientation at last, and have good ferroelectricity.

The pzt thin film material of the inventive method preparation has following effect:

1. method of operation is simple, stable performance, good reproducibility;

2. Zhi Bei ferroelectric PZT film cost is low, and whole growth and post-processing temperature are lower than 450 ℃ of the highest tolerance temperature of reading circuit, therefore can be compatible mutually with the monolithic integrated technique of ferroelectric micro element;

3. better than high-temp in-situ sputter growth of electric hysteresis loop rectangularity and saturation.

Description of drawings

Fig. 1. the X-ray diffractogram of the pzt thin film of sputter when underlayer temperature is respectively room temperature, 200 ℃, 300 ℃ and 400 ℃.

Fig. 2. the X-ray diffractogram of pzt thin film before and after hyperbaric oxygen heat treatment of sputter when underlayer temperature is respectively room temperature, 200 ℃, 300 ℃ and 400 ℃.

Fig. 3. the pzt thin film of sputter was pressed at hyperbaric oxygen oxygen and is the electric hysteresis loop after the 4Mpa heat treatment when underlayer temperature was respectively room temperature, 200 ℃, 300 ℃ and 400 ℃.

Fig. 4. the pzt thin film of sputter was pressed at hyperbaric oxygen oxygen and is the electric hysteresis loop after 4Mpa, 6Mpa, the 8Mpa heat treatment when underlayer temperature was 300 ℃.

Fig. 5. the electric hysteresis loop of the pzt thin film after the HIGH PRESSURE TREATMENT of optimization technology.

Embodiment

Below in conjunction with accompanying drawing the specific embodiment of the present invention is described in further detail:

See Fig. 1, the pzt thin film of sputtering sedimentation when underlayer temperature is room temperature, 200 ℃, 300 ℃ and 400 ℃ is burnt green stone phase for amorphous or partially crystallizable substantially as can be seen from the figure.And along with the rising of underlayer temperature, the peak of Jiao Lvshi phase is enhanced, and when underlayer temperature reaches 400 ℃, the perovskite phase of partially crystallizable for (100) orientation occurred, but above situation all can not surveyed electric hysteresis loop, shows not have ferroelectricity.

See Fig. 2, Fig. 2 (a) and (b), (c), (d) are respectively the X-ray diffractograms before and after the pzt thin film hyperbaric oxygen heat treatment of underlayer temperature sputtering sedimentation when being room temperature, 200 ℃, 300 ℃ and 400 ℃, the hyperbaric oxygen heat-treat condition: oxygen is pressed 6Mpa, 400 ℃ of heat treatment temperatures, 10 hours time, pzt thin film all changes the perovskite structure of height (100) orientation into after hyperbaric oxygen is handled as can be seen.Abscissa among the figure is the angle of diffraction 2 θ (degree), and ordinate is diffracted intensity (absolute unit).After the processing, find out by Fig. 2 (a), amorphous become perovskite structure mutually; Find out that by Fig. 2 (b, c) Jiao Lvshi is inhibited mutually, disappears, perovskite obtains generating and strengthening mutually; Find out that by Fig. 2 (d) Jiao Lvshi is inhibited mutually, disappears, perovskite is enhanced mutually, thereby the pzt thin film crystallinity that obtains is better.

As can be seen from Figure 3, along with the raising of sputter underlayer temperature, because the degree of crystallinity of pzt thin film improves, thereby the ferroelectricity after hyperbaric oxygen is handled is also along with improve, and 400 ℃ are better than 300 ℃, and 300 ℃ are better than room temperature.But along with the raising of underlayer temperature, plumbous volatilization and oxygen volatilization can increase, and this will make ferroelectricity reduce.Underlayer temperature is 200 ℃ a pzt thin film, because the volatilization of plumbous and oxygen is less, thereby better than high underlayer temperature degree of crystallinity, so the ferroelectricity of the pzt thin film of 200 ℃ of degree sputter is best.

As can be seen from Figure 4, along with the raising that reprocessing oxygen is pressed, the ferroelectricity of PZT film is improved.Because along with the raising that reprocessing oxygen is pressed, the degree of crystallinity of film is improved, lead volatilizees and the oxygen volatilization has obtained inhibition, the oxygen room has obtained compensation.In view of above each process conditions and analysis, the optimum implementation that we propose is, at first underlayer temperature is located at 200 ℃ and carries out the pzt thin film sputtering sedimentation, then with the gained pzt thin film under the 8Mpa hyperbaric oxygen, heat-treat heat treatment time 12 hours under 400 ℃ the low temperature.Under these process conditions, the electric hysteresis loop of resulting pzt thin film as shown in Figure 5.And this material identified that performance parameter is as follows:

Under the electric field strength of room temperature 633kV/cm, the average residual polarization: (|+P _r|+|-P _r|)/2 be 44 μ C/cm ²Average coercive field (|+E _c|-E _c|)/2 be 126kV/cm.

Claims

One kind can with the preparation method of the integrated ferroelectric lead zirconate titanate film material of reading circuit, it is characterized in that concrete steps are as follows:

(1) preparation of .PZT film

A. get the monocrystalline silicon piece of substrate, adopt conventional cleaning method, that is, with the ultrasonic cleaning that hockets of ethanol, acetone, carry out chemical cleaning with trichloroethylene then earlier, in vacuum chamber, peel off cleaning with the ar-ion beam etching more at last for (100) orientation;

B. then substrate is put on the specimen holder of sputter, with conventional sputtering technology, LaNiO grows on substrate ₃Bottom electrode layer;

C. the in-situ sputtering pzt thin film is changed the PZT sputtering target, and sputter cavity base vacuum degree is extracted into 5 * 10 ^-4Pa, heating simultaneously has LaNiO ₃The silicon substrate of bottom electrode layer, heating-up temperature scope are room temperature to 400 ℃, feed argon gas then, and keep air pressure at 1-2pa, carry out the pzt thin film sputtering sedimentation, until desired thickness;

Said PZT sputtering target is by PbO, ZrO ₂And TiO ₂Powder is the volatilization loss of compensation Pb by the stoichiometric proportion proportioning, and the excessive Pb that adds 10%wt more evenly mixes, is pressed into bulk, sinters ceramic target into;

(2) reprocessing of .PZT film

The above-mentioned pzt thin film sample for preparing is put into pressure pan, heating pzt thin film sample, heating-up temperature is 380-410 ℃, aerating oxygen and keep air pressure to anneal then at 4Mpa-8Mpa, annealing time is 8-12 hour.