CN1766595A - Method and apparatus for improving absorptivity and emissivity in infrared thermal wave non-destructive testing - Google Patents
Method and apparatus for improving absorptivity and emissivity in infrared thermal wave non-destructive testing Download PDFInfo
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- CN1766595A CN1766595A CN 200510125666 CN200510125666A CN1766595A CN 1766595 A CN1766595 A CN 1766595A CN 200510125666 CN200510125666 CN 200510125666 CN 200510125666 A CN200510125666 A CN 200510125666A CN 1766595 A CN1766595 A CN 1766595A
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Abstract
The invention relates to a method and apparatus for improving the surface absorbing ratio and emissive power during the infrared heat wave nondestructive testing course in the field of infrared heat wave nondestructive test. It is characterized in that it chooses the function thin foil with better light absorbing ratio and emissive power to cover or coat the tested object and uses the method of drafting the air between the tested object surface and the thin foil to make them closed contact with each other during the infrared heat wave nondestructive testing course. The invention provides two apparatus to achieve the method by the size of the tested object.
Description
Technical field
The present invention relates to the infrared thermal wave Dynamic Non-Destruction Measurement, especially in infrared thermal wave Non-Destructive Testing process, improve the method and the device thereof of testee surface absorptivity and emissivity.
Background technology
The infrared thermal wave Dynamic Non-Destruction Measurement is based on the heat wave theory, the detected material surface is heated, utilize equipment such as thermal infrared imager to write down the variation of body surface temperature, come have the kind of zero defect and defective and character to distinguish interior of articles by interpretation to surface temperature field.Infrared thermal wave detection technique and traditional thermal imaging one is remarkable, and different what be exactly that its adopts is defective under the ACTIVE CONTROL formula heating technique drive surface.Adopting under the situation of visible light as the thermal excitation source, for some surperficial visible light strong reflection objects (as most of metal), often need carry out spray treatment to its surface, improve the visible-light absorptivity and the infrared emittance on testee surface.But for some corrosion-vulnerable or accurate space flight, aviation device, this kind anti-reflex treated can cause pollution to a certain degree even damages the testee surface, has limited the application in this respect of infrared thermal wave Dynamic Non-Destruction Measurement.
Summary of the invention
For overcoming this testee surface treatment method of spraying testee is caused stained deficiency, the invention provides the method and the device that improve testee surface visible-light absorptivity and infrared emittance in a kind of infrared thermal wave Non-Destructive Testing, it can guarantee object to be detected is not had fully stained, thereby is applicable to the infrared thermal wave Non-Destructive Testing to perishable or accurate space flight, aviation device.
The present invention realizes by the following technical solutions:
In infrared thermal wave Non-Destructive Testing process, select function film for use with better visible-light absorptivity and infrared emittance, wrap up or the covering testee, and functional membrane is closely contacted with testee by the method that air between testee surface and the film is taken out.
At the difference of testee size, the invention provides two kinds of devices of realizing said method.
Device 1: be independent of the vacuum film covering device of detection system, promptly with the antireflection vacuum bag of aspirating hole.At first object to be detected is put into the antireflection vacuum bag during use and also sealed,, vacuum bag and detected material surface is closely contacted by the air in the aspirating hole extraction vacuum bag, and then the infrared thermal wave detection system detection of the testee of the above-mentioned processing of process.
Vacuum bag can adopt elasticity and the higher thin polymer film of ductility/strength, and require this polymkeric substance that visible-light absorptivity and infrared emittance are preferably arranged, do not possess higher visible-light absorptivity and infrared emittance can spray anti reflection paint thereon as film.
Device 2: on the basis of existing infrared thermal wave nondestructive detection system, the flashlamp shade is improved.Increasing a rubber skirt between flashlamp shade and testee surface encloses, shape and size that rubber skirt is placed port and flashlamp shade lower port match, can connect together, the lower port that rubber skirt is enclosed is opened wide, and match with the surface configuration and the radian of testee, rubber skirt puts and leaves aspirating hole.In measuring process, the lower port of rubber skirt cover is placed on the surface of testee, film is covered the upper port that rubber skirt is enclosed, the upper port that the lower port of flashlamp shade and rubber skirt are enclosed connects together then, simultaneously film is blocked, extract out between film and the testee surface by checking matter surface, film and rubber skirt by aspirating hole then and enclose air in the confined space that forms, make film closely be attached on the testee surface.Requiring used rubber skirt to enclose will have certain elasticity, and its effect has two: the one, and fixed film; The 2nd, between film and testee surface, form a confined space.Place out aspirating hole in rubber skirt, can extract the air between film and the measured object out, film is closely contacted with the testee surface.
Second kind of device is applicable to and detects large-area object or carry out the outfield detection, it is that original detection system flashlamp shade is improved the device that obtains, can design shape and lower limb radian that rubber skirt is enclosed according to the shape of object to be detected, make it better and the testee applying.
Two kinds of devices all need to extract out gas in the sealing area, can utilize mobile equilibrium to keep film to contact with the tight of testee surface in testing process.
The present invention can realize in the testing process that object to be detected is not had stained the time fully, can also improve absorptivity and the infrared emittance of testee, thereby improve the detection effect of infrared thermal wave Non-Destructive Testing and can not the spray paint object handled higher greatly surface reflectivity to visible light.
Description of drawings
Fig. 1 is the vacuum film covering device synoptic diagram that is independent of detection system;
Fig. 2 is for improving the assembling synoptic diagram of vacuum film covering device in the infrared thermal wave nondestructive detection system of back;
Fig. 3 is for improving the diagrammatic cross-section of vacuum film covering device in the infrared thermal wave nondestructive detection system of back.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
Embodiment 1: for the vacuum film covering device that is independent of detection system, referring to Fig. 1, at first will choose the vacuum bag 1 of appropriate materials, the material that requires vacuum bag 1 is elasticity and the higher thin polymer film of ductility/strength, has visible-light absorptivity and infrared emittance preferably.Detected material 2 pack into the vacuum bag 1 interior buckle 4 of also using with vacuum bag 1 sealing, by the air in the aspirating hole 3 extraction vacuum bags 1, no air-gap and closely contacting between the film that makes vacuum bag 1 and the detected material 2, aspirating hole 3 is connected to vacuum extractor by tracheae 5.If will further improve the visible-light absorptivity and the infrared emittance on film surface, can carry out even spray treatment on the surface of film.
Embodiment 2: the vacuum film covering device in the infrared thermal wave nondestructive detection system is referring to Fig. 2 and Fig. 3.Between flashlamp shade 6 and testee surface 12, increase a rubber skirt and enclose 9, making rubber skirt encloses 9 elastomeric material certain elasticity should be arranged, rubber skirt enclose the shape of 9 upper port and size and flashlamp shade 6 lower port shape and size be complementary, rubber skirt is enclosed the shape and the radian of 9 lower port need be according to the shape and the design of surperficial radian of test specimen.Enclose in rubber skirt and to have aspirating hole 10 on 9.Film 8 is covered rubber skirt enclose 9 upper port, then the lower port of flashlamp shade 6 is inserted rubber skirt and enclose 9 upper port, simultaneously film 8 is blocked, in measuring process, the lower port of rubber skirt cover 9 is placed on the testee surface 12, between detected material surface 12 and film 8, enclose 9 like this and just form a confined space by checking matter surface 12, film 8 and rubber skirt, the air of extracting out in the confined space by aspirating hole 10 makes film 8 closely be attached on the testee surface 12 then.Detecting mouth 7 is openings of placing the thermal imaging system camera lens, and flashlamp 11 is as the thermal excitation source of infrared thermal wave Non-Destructive Testing.
Claims (4)
1. improve the method for absorptivity and emissivity in the infrared thermal wave Non-Destructive Testing, it is characterized in that in infrared thermal wave Non-Destructive Testing process, select function film for use with better visible-light absorptivity and infrared emittance, wrap up or the covering testee, and functional membrane is closely contacted with testee by the method that air between testee surface and the film is taken out.
2. improve the method for absorptivity and emissivity in the infrared thermal wave Non-Destructive Testing as claimed in claim 1, it is characterized in that on film, spraying anti reflection paint.
3. as improving the implement device of the method for absorptivity and emissivity in claim 1 or the described infrared thermal wave Non-Destructive Testing of claim 2, it is characterized in that constituting antireflection vacuum bag [1] buckle [4] that has aspirating hole [3] on the vacuum bag [1] and be used to seal by function film.
4. as improving the another kind of implement device of the method for absorptivity and emissivity in claim 1 or the described infrared thermal wave Non-Destructive Testing of claim 2, it is characterized in that on the basis of existing infrared thermal wave nondestructive detection system, the flashlamp shade is improved, between flashlamp shade [6] and testee surface [12], increase a rubber skirt and enclose [9], shape and size that rubber skirt is enclosed [9] upper port and flashlamp shade [6] lower port match, can connect together, rubber skirt is enclosed the lower port of [9] and is opened wide, and match with testee surface [12] shape and radian, leave aspirating hole [10] on the rubber skirt cover [9].Film [8] is covered the upper port that rubber skirt is enclosed [9], the upper port that the lower port and the rubber skirt of flashlamp shade [6] are enclosed [9] connects together then, simultaneously film [8] is blocked, in measuring process, the lower port of rubber skirt cover [9] is placed on the surface [1 2] of testee, extract out by checking matter surface [12], film [8] and rubber skirt by aspirating hole [10] then and enclose air in the confined space that [9] form, make film [8] closely be attached on the testee surface [12].
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510125666 CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and apparatus for improving absorptivity and emissivity in infrared thermal wave non-destructive detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510125666 CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and apparatus for improving absorptivity and emissivity in infrared thermal wave non-destructive detection |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2008101678577A Division CN101368920A (en) | 2005-12-02 | 2005-12-02 | Apparatus for improving absorption rate and emission rate in infrared heat wave nondestructive detection |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1766595A true CN1766595A (en) | 2006-05-03 |
| CN1766595B CN1766595B (en) | 2010-07-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510125666 Expired - Fee Related CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and apparatus for improving absorptivity and emissivity in infrared thermal wave non-destructive detection |
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| CN (1) | CN1766595B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675020A (en) * | 2013-12-18 | 2014-03-26 | 工业和信息化部电子第五研究所 | System for detecting transmitting rate of electronic assembly |
| CN103822942A (en) * | 2014-02-28 | 2014-05-28 | 武汉理工大学 | Active xenon lamp array harmonic thermal excitation device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1065024A (en) * | 1992-04-09 | 1992-10-07 | 天津市硅酸盐研究所 | Fast heating far-infrared therapeutic bag |
| US5745238A (en) * | 1992-12-22 | 1998-04-28 | International Business Machines Corporation | Apparatus and method for non-destructive inspection and/or measurement |
| JP2006505764A (en) * | 2002-01-23 | 2006-02-16 | マレナ システムズ コーポレーション | Infrared thermography for defect detection and analysis |
-
2005
- 2005-12-02 CN CN 200510125666 patent/CN1766595B/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675020A (en) * | 2013-12-18 | 2014-03-26 | 工业和信息化部电子第五研究所 | System for detecting transmitting rate of electronic assembly |
| CN103675020B (en) * | 2013-12-18 | 2016-04-20 | 工业和信息化部电子第五研究所 | Electronic package emissivity detection system |
| CN103822942A (en) * | 2014-02-28 | 2014-05-28 | 武汉理工大学 | Active xenon lamp array harmonic thermal excitation device |
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| Publication number | Publication date |
|---|---|
| CN1766595B (en) | 2010-07-28 |
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Granted publication date: 20100728 Termination date: 20211202 |
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