CN1687229A - Method for preparing composition of epoxy resin for packaging semiconductor - Google Patents

Method for preparing composition of epoxy resin for packaging semiconductor Download PDF

Info

Publication number
CN1687229A
CN1687229A CN 200510038942 CN200510038942A CN1687229A CN 1687229 A CN1687229 A CN 1687229A CN 200510038942 CN200510038942 CN 200510038942 CN 200510038942 A CN200510038942 A CN 200510038942A CN 1687229 A CN1687229 A CN 1687229A
Authority
CN
China
Prior art keywords
epoxy resin
resins
preparation
composition epoxy
compound inorganic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 200510038942
Other languages
Chinese (zh)
Other versions
CN100335541C (en
Inventor
成兴明
韩江龙
单玉来
李兰侠
谢广超
张立忠
孙波
李云芝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hysol Huawei Electronics Co Ltd
Original Assignee
JIANGSU ZHONGDIAN HUAWEI ELECTRONICS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=35305271&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=CN1687229(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by JIANGSU ZHONGDIAN HUAWEI ELECTRONICS CO Ltd filed Critical JIANGSU ZHONGDIAN HUAWEI ELECTRONICS CO Ltd
Priority to CNB200510038942XA priority Critical patent/CN100335541C/en
Publication of CN1687229A publication Critical patent/CN1687229A/en
Application granted granted Critical
Publication of CN100335541C publication Critical patent/CN100335541C/en
Ceased legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)

Abstract

The present invention relates to a preparation method of epoxy resin compound for semiconductor packaging process. Said epoxy resin compound has the advantages of low-viscosity, high-flowability, low water absorption and low porosity, etc. and can be used for packaging various integrated circuits and semiconductor devices.

Description

A kind of preparation method who is used for the composition epoxy resin of semiconductor packages
Technical field
The present invention relates to a kind of preparation method of composition epoxy resin, particularly a kind of preparation method who is used for the composition epoxy resin of semiconductor packages.
Background technology
Along with developing rapidly of semicon industry, the semiconductor packages industry has also obtained development fast.As a kind of epoxy resin composition for semiconductor encapsulation, with advantages such as its low cost, good reliabilitys and used widely, account for more than 95% of semiconductor sealing material.Under the variation trend that electronic technology is maked rapid progress, unicircuit just develops rapidly towards ultra-large, ultra-high speed, high-density, high-power, high precision, multi-functional direction, thereby the composition epoxy resin that unicircuit is encapsulated usefulness has also proposed more and more higher requirement.Viscosity is an important factor that influences the composition epoxy resin encapsulation performance always, in the process of plastic packaging, plastic cement directly has influence on the performance of unicircuit to the size of spun gold surging force, viscosity can cause the spun gold distortion when big and cause short circuit, thereby reduce yield rate.Yet, the preparation method of existing composition epoxy resin can not satisfy produce possess low-viscosity, the composition epoxy resin of the performance requriements in high workability, weak breath hole.Therefore, the new production technique of research is produced this kind composition epoxy resin and is just seemed particularly important.
Summary of the invention
Technical problem to be solved by this invention is at the deficiencies in the prior art, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages is provided, composition epoxy resin with this method preparation has good flowability, and pore also seldom occurs when the semiconductor packages moulding.
Technical problem to be solved by this invention can realize by following technical scheme.The present invention is a kind of preparation method who is used for the composition epoxy resin of semiconductor packages, is characterized in, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 70-110 degree centigrade, and stir, after cooling, be crushed to particle diameter again and will account for 70% of Resins, epoxy and phenolic resin amount of the mixture at least less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 70-130 degree centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
Technical problem to be solved by this invention can also further realize by following technical scheme.Above-described a kind of preparation method who is used for the composition epoxy resin of semiconductor packages, be characterized in, described Resins, epoxy is biphenyl type epoxy resin, and described solidifying agent resol is the phenol lacquer resins, and described curing catalyst is phosphorous/tertiary amines curing catalyst.
Technical problem to be solved by this invention can also further realize by following technical scheme.Above-described a kind of preparation method who is used for the composition epoxy resin of semiconductor packages, be characterized in, described compound inorganic stuffing is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, and wherein the median size of A part is 0.05-1 μ m, accounts for the 4-15% of filler total amount; The median size of B part is 1-20 μ m, accounts for the 45-70% of filler total amount; The median size of C part is 20-45 μ m, accounts for the 20-35% of filler total amount.
Technical problem to be solved by this invention can also further realize by following technical scheme.Above-described a kind of preparation method who is used for the composition epoxy resin of semiconductor packages is characterized in, the median size of described compound inorganic stuffing is 5-40 μ m.
Technical problem to be solved by this invention can also further realize by following technical scheme.Above-described a kind of preparation method who is used for the composition epoxy resin of semiconductor packages is characterized in that the loading level of described compound inorganic stuffing is the 80%-92% of composition epoxy resin gross weight.Like this, can guarantee that its flowability can significantly not descend, the water-intake rate of finished product is low, the yield rate height of encapsulating products.
Each raw material optimum weight of using in the inventive method is: the Resins, epoxy of 4-20 part, the solidifying agent resol of 2-15 part, 0.01-1 the curing catalyst of part, the compound inorganic stuffing of 60-92 part, 0.01-2 the releasing agent of part, 0.01-1 the tinting material of part, the fire retardant of 0.01-3 part, the coupling agent of 0.01-1 part.
Resins, epoxy used in the present invention can be biphenyl type epoxy resin, ortho-cresol linear epoxy resin, polyfunctional group type Resins, epoxy, dihydroxyphenyl propane-type Resins, epoxy, aliphatic epoxy resin, heterocyclic-type epoxy resin etc.The Resins, epoxy that wherein has can be used alone or as a mixture.Preferred biphenyl type epoxy resin, polyfunctional group type Resins, epoxy and heterocyclic-type epoxy resin.
Solidifying agent resol used in the present invention, can be the multipolymer etc. of condenses, phenol-ing fixed agent dicyclopentadiene and the phenol of polyfunctional group solidifying agent, phenol lacquer resins and its derivative, phenyl methylcarbamate lacquer resins, p-Xylol and phenol or naphthols, they can use separately also can mix use.
Curing catalyst used in the present invention, can be 2, glyoxaline compounds such as 4-methylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, triethylamine benzyldimethylamine, 1, tertiary amine compound such as 8-diazabicyclo (5,4,0) undecylene-7 grade, organic phosphine compounds such as triphenylphosphine, three (p-methylphenyl) phosphine, they can use separately also can mix use.
Compared with prior art, use the prepared composition epoxy resin of the inventive method to have advantages such as low-viscosity, high workability, low water absorption, weak breath hole, that its performance can satisfy is ultra-large, the demand of ultra-high speed, high-density, high-power, high precision, multifunctional integrated circuit encapsulation; The composition epoxy resin of using the inventive method preparation carries out the encapsulation of various unicircuit and semiconducter device, can significantly reduce bad phenomenon such as dashing silk, layering, pore, improve the encapsulation yield rate of various unicircuit and semiconducter device, thereby reduce cost.The prepared composition epoxy resin of the inventive method is applicable to various unicircuit of encapsulation and semiconducter device.
Embodiment
Embodiment 1.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 80 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 70% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 100 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
Embodiment 2.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 110 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 80% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 130 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The compound inorganic stuffing of present embodiment is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, and wherein the median size of A part is 1 μ m, accounts for 15% of filler total amount; The median size of B part is 10 μ m, accounts for 60% of filler total amount; The median size of C part is 30 μ m, accounts for 25% of filler total amount, and the loading level of described compound inorganic stuffing is 80% of a composition epoxy resin gross weight.
Embodiment 3.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 90 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 75% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 120 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The compound inorganic stuffing of present embodiment is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, and wherein the median size of A part is 0.05 μ m, accounts for 4% of filler total amount; The median size of B part is 1 μ m, accounts for 70% of filler total amount; The median size of C part is 20 μ m, accounts for 26% of filler total amount, and the loading level of described compound inorganic stuffing is 87% of a composition epoxy resin gross weight.
Embodiment 4.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 70 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 85% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 70 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The compound inorganic stuffing of present embodiment is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, and wherein the median size of A part is 0.5 μ m, accounts for 10% of filler total amount; The median size of B part is 20 μ m, accounts for 55% of filler total amount; The median size of C part is 45 μ m, accounts for 35% of filler total amount, and the loading level of described compound inorganic stuffing is 92% of a composition epoxy resin gross weight.
Embodiment 5.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 100 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 90% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 110 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The compound inorganic stuffing of present embodiment is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, and wherein the median size of A part is 0.1 μ m, accounts for 15% of filler total amount; The median size of B part is 15 μ m, accounts for 50% of filler total amount; The median size of C part is 40 μ m, accounts for 35% of filler total amount, and the loading level of described compound inorganic stuffing is 89% of a composition epoxy resin gross weight.
Embodiment 6.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 85 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 78% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 95 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The median size of the compound inorganic stuffing of present embodiment is 5 μ m.The loading level of described compound inorganic stuffing is 80% of a composition epoxy resin gross weight.
Embodiment 7.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 105 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 72% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 115 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The median size of the compound inorganic stuffing of present embodiment is 40 μ m.The loading level of described compound inorganic stuffing is 82% of a composition epoxy resin gross weight.
Embodiment 8.A kind of preparation method who is used for the composition epoxy resin of semiconductor packages, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 75 degrees centigrade, and stir, after cooling, be crushed to particle diameter again and account for 82% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 85 degrees centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
The median size of the compound inorganic stuffing of present embodiment is 20 μ m.The loading level of described compound inorganic stuffing is 90% of a composition epoxy resin gross weight.
Embodiment 9.Be detection and the result thereof that the contriver does the finished product that adopts the inventive method to produce below.
The finished product preparation.Select 1. Resins, epoxy for use: 60 grams; 2. resol: 52 grams; 3. phosphorous curing catalyst/tertiary amines curing catalyst: 1.5/1.0 gram; 4. compound inorganic stuffing: A part 78 grams, B part 532 grams, C part 358 grams; 5. carbon black: 4 grams; 6. carnauba wax: 4 grams; 7. coupling agent: 5mL; 8. fire retardant: 3 grams.This kind composition epoxy resin is made in accordance with the following methods: at first, with 1. load weighted and 2., under 100 degrees centigrade, carry out heat and melt and mix, through cooling, be crushed to particle diameter and account for 70% of Resins, epoxy and phenolic resin amount of the mixture less than the amount of the powder of 250um.Secondly, with 4. load weighted and 7. carry out pre-treatment, and stir.At last, with above handle well 1.+2. and 4.+7., and 3. 5. 6. 8. carry out pre-mixing, high-speed stirring, mix, under 130 degrees centigrade condition, carry out melting mixing, again through calendering, cooling, meal, fine powder (granularity is below the 0.5mm), after mix, beat series of process flow processs such as cake, packing, get final product finished product.
Test with following method:
1, gelation time GT: get the sample (powder) of about 1 ~ 2 gram, be placed on the electric heating plate (175 ± 2 ℃) and test.
2, helicoidal flow length SF: taking by weighing the sample (powder) of 15 grams, is that (175 ± 2 ℃), injection pressure are 3.5Mpa (35Kg/cm in mobile die temperature 2), mold pressure is 21Mpa (210Kg/cm 2), injection moulding speed is under the condition of 6cm/sec, in die for molding, solidify and recorded in 2 ~ 3 minutes.
3, water-absorbent: sample is made the disk of Φ 100 * 2 (mm), and under the condition of 100 ℃/24h, carry out after fixing, then successively: oven dry-drying-weighing m according to GB1034-86 1-boil-the dried surface of sassafras-weighing m 2The calculating of water-intake rate: Wp=(m 2-m 1)/m 1* 100%,
4, viscosity: the CFT heightization instrument that flows, sample is made Φ 100 * 2g, under 150 ℃/10kg condition, test obtaining.
5, pore: powerful microscope and infrared scan.Test result (seeing the following form):
Index parameter ? ????GT(sec) ? ????21
????SF(cm) ????124
Viscosity (Pa.s) ????21.5
Water-intake rate ????0.11
Pore No

Claims (5)

1, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages is characterized in that, its step is as follows,
(1) with load weighted Resins, epoxy and solidifying agent resol, in reactor, carry out heat and melt mixing with 70-110 degree centigrade, and stir, after cooling, be crushed to particle diameter again and will account for 70% of Resins, epoxy and phenolic resin amount of the mixture at least less than the amount of the powder of 250um;
(2), in homogenizer, carry out surface treatment, and stir with silane coupling agent with load weighted compound inorganic stuffing;
(3) with above Resins, epoxy and solidifying agent resol mixed powder, the compound inorganic stuffing of anticipating, and minor component curing catalyst, tinting material, releasing agent, coupling agent and fire retardant carry out high-speed stirring in mixing machine, mixes;
(4) mixture with step (3) carries out melting mixing through the through-hole type twin screw extruder, its melting temperature is set in 70-130 degree centigrade, being broken to granularity through calendering, cooling, coarse reduction, fine powder again is that 0.5mm is following, the back is mixed, beaten cake, packaging process, promptly.
2, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages according to claim 1, it is characterized in that, described Resins, epoxy is biphenyl type epoxy resin, described solidifying agent resol is the phenol lacquer resins, and described curing catalyst is phosphorous/tertiary amines curing catalyst.
3, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages according to claim 1, it is characterized in that, described compound inorganic stuffing is the mixture of being made up of the silica flour of A, B, three kinds of different-grain diameters of C, wherein the median size of A part is 0.05-1 μ m, accounts for the 4-15% of filler total amount; The median size of B part is 1-20 μ m, accounts for the 45-70% of filler total amount; The median size of C part is 20-45 μ m, accounts for the 20-35% of filler total amount.
4, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages according to claim 1 is characterized in that, the median size of described compound inorganic stuffing is 5-40 μ m.
5, a kind of preparation method who is used for the composition epoxy resin of semiconductor packages according to claim 1 is characterized in that, the loading level of described compound inorganic stuffing is the 80%-92% of composition epoxy resin gross weight.
CNB200510038942XA 2005-04-15 2005-04-15 Method for preparing composition of epoxy resin for packaging semiconductor Ceased CN100335541C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB200510038942XA CN100335541C (en) 2005-04-15 2005-04-15 Method for preparing composition of epoxy resin for packaging semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB200510038942XA CN100335541C (en) 2005-04-15 2005-04-15 Method for preparing composition of epoxy resin for packaging semiconductor

Publications (2)

Publication Number Publication Date
CN1687229A true CN1687229A (en) 2005-10-26
CN100335541C CN100335541C (en) 2007-09-05

Family

ID=35305271

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB200510038942XA Ceased CN100335541C (en) 2005-04-15 2005-04-15 Method for preparing composition of epoxy resin for packaging semiconductor

Country Status (1)

Country Link
CN (1) CN100335541C (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101580629A (en) * 2008-05-15 2009-11-18 日东电工株式会社 Method for fabricating resin composition for semiconductor packaging
CN101851386A (en) * 2009-04-01 2010-10-06 汉高(中国)投资有限公司 Epoxy resin compound
CN101173159B (en) * 2006-11-02 2010-12-08 比亚迪股份有限公司 Epoxy resin encapsulating material composition
WO2012000171A1 (en) * 2010-06-29 2012-01-05 Dow Global Technologies Llc Storage-stable heat-activated tertiary amine catalysts for epoxy resins
CN102453340A (en) * 2010-10-21 2012-05-16 日立化成工业株式会社 Thermosetting resin composition for sealing packing of semiconductor, and semiconductor device
CN102786811A (en) * 2011-05-20 2012-11-21 日东电工株式会社 Resin kneaded material and sheet
CN105368003A (en) * 2015-12-14 2016-03-02 科化新材料泰州有限公司 Preparation method of epoxy resin composition for semiconductor packaging
CN105778409A (en) * 2014-12-18 2016-07-20 北京首科化微电子有限公司 Epoxy resin composition for semiconductor packaging, and preparation method thereof
CN105778411A (en) * 2014-12-18 2016-07-20 北京首科化微电子有限公司 Secondary mixing method of epoxy resin composition for semiconductor encapsulation
CN110642998A (en) * 2019-08-27 2020-01-03 中山精合电子材料有限公司 Epoxy resin composition, curable dry film, cured product and printed circuit board
CN111978678A (en) * 2020-08-31 2020-11-24 江苏华海诚科新材料股份有限公司 Epoxy resin composition and preparation method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1036348C (en) * 1994-06-02 1997-11-05 中国科学院化学研究所 Epoxy resin composite for plastic sealing semiconductor device and its preparing method
JP3771020B2 (en) * 1997-11-26 2006-04-26 住友ベークライト株式会社 Epoxy resin composition for optical semiconductor encapsulation
JP2000340720A (en) * 1999-06-01 2000-12-08 Toshiba Chem Corp Epoxy resin composition and semiconductor sealing device
JP2003064185A (en) * 2001-08-27 2003-03-05 Sumitomo Bakelite Co Ltd Method for producing epoxy resin molding material and semiconductor device
CN1250598C (en) * 2004-03-10 2006-04-12 中国科学院广州化学研究所 Modified epoxy resin by organic silicon and its electronic packag material and preparation process thereof

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101173159B (en) * 2006-11-02 2010-12-08 比亚迪股份有限公司 Epoxy resin encapsulating material composition
CN101580629B (en) * 2008-05-15 2014-05-14 日东电工株式会社 Method for fabricating resin composition for semiconductor packaging
CN101580629A (en) * 2008-05-15 2009-11-18 日东电工株式会社 Method for fabricating resin composition for semiconductor packaging
CN101851386A (en) * 2009-04-01 2010-10-06 汉高(中国)投资有限公司 Epoxy resin compound
CN101851386B (en) * 2009-04-01 2012-09-05 汉高华威电子有限公司 Epoxy resin compound
WO2012000171A1 (en) * 2010-06-29 2012-01-05 Dow Global Technologies Llc Storage-stable heat-activated tertiary amine catalysts for epoxy resins
CN102453340B (en) * 2010-10-21 2016-10-12 日立化成株式会社 Encapsulating semiconductor filling compositions of thermosetting resin and semiconductor device
US9431314B2 (en) 2010-10-21 2016-08-30 Hitachi Chemical Company, Ltd Thermosetting resin composition for sealing packing of semiconductor, and semiconductor device
CN102453340A (en) * 2010-10-21 2012-05-16 日立化成工业株式会社 Thermosetting resin composition for sealing packing of semiconductor, and semiconductor device
CN102786811A (en) * 2011-05-20 2012-11-21 日东电工株式会社 Resin kneaded material and sheet
CN105778409A (en) * 2014-12-18 2016-07-20 北京首科化微电子有限公司 Epoxy resin composition for semiconductor packaging, and preparation method thereof
CN105778411A (en) * 2014-12-18 2016-07-20 北京首科化微电子有限公司 Secondary mixing method of epoxy resin composition for semiconductor encapsulation
CN105368003A (en) * 2015-12-14 2016-03-02 科化新材料泰州有限公司 Preparation method of epoxy resin composition for semiconductor packaging
CN110642998A (en) * 2019-08-27 2020-01-03 中山精合电子材料有限公司 Epoxy resin composition, curable dry film, cured product and printed circuit board
CN111978678A (en) * 2020-08-31 2020-11-24 江苏华海诚科新材料股份有限公司 Epoxy resin composition and preparation method thereof
CN111978678B (en) * 2020-08-31 2023-09-19 江苏华海诚科新材料股份有限公司 Epoxy resin composition and preparation method thereof

Also Published As

Publication number Publication date
CN100335541C (en) 2007-09-05

Similar Documents

Publication Publication Date Title
CN100335541C (en) Method for preparing composition of epoxy resin for packaging semiconductor
CN1080746C (en) Inorganic filler, epoxy resin composition, and semiconductor device
CN106753205B (en) Epoxy modified organic silicon pouring sealant with low viscosity and high heat conductivity and application thereof
CN1244660C (en) Preparation method of room temperature cured high temperature tolerant flexible epoxy adhesive
CN1083851C (en) Epoxy resin composition
CN1288206C (en) Epoxy resin/montmorillonoid nano-compoiste-material and its preparation method
CN1077121C (en) Semiconductor encapsulating epoxy resin compositions and semiconductor devices encapsulated therewith
CN111378244B (en) Solid buoyancy material and preparation method and application thereof
CN1923887A (en) Structure-type wave-absorption composite material containing magnetic glass fiber and preparation method thereof
CN1217972C (en) Epoxy resin composition for semi-conductor packaging and semi-conductor device using the composition
CN1884376A (en) Thermostable benzoxazine resin compound and its preparation method and uses
CN1934190A (en) Epoxy resin composition for the encapsulation of semiconductors and semiconductor devices
JP2019176023A (en) Semiconductor-sealing resin composition and semiconductor device
CN1546566A (en) Molding compound for sheet tantalum capacitor
JP6389382B2 (en) Semiconductor encapsulating resin sheet and resin encapsulating semiconductor device
CN1621479A (en) Epoxy resin composition for semiconductor packaging and its preparation
CN1676565A (en) Epoxy resin composition for semiconductor encapsulation and semiconductor device using the same
CN1219803C (en) Moulding composition for producing bipolar plates
JP2007077333A (en) Manufacturing method of epoxy resin molding material for sealing, epoxy resin molding material for sealing and electronic part unit
CN1705110A (en) Semiconductor encapsulating epoxy resin composition and semiconductor device
CN1175042C (en) High temp. resistant inorganic fibre reinforced injection type phenolic moulding plastics
KR20240081446A (en) Liquid encapsulant, electronic components and manufacturing method thereof, and semiconductor device
US11702537B2 (en) Tablet-type epoxy resin composition for sealing semiconductor device, and semiconductor device sealed using the same
CN1304480C (en) Polyphenylene sulfide electronic packaging material and its preparing method
CN107955335B (en) Preparation method of epoxy resin composition prepared by using stirrer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: HENKEL HUAWEI ELECTRONICS CO., LTD.

Free format text: FORMER NAME: JIANGSU ZHONGDIAN HUAWEI ELECTRONICS CO., LTD.

CP03 Change of name, title or address

Address after: 222006 song Jump Development Zone, Jiangsu, Lianyungang

Patentee after: Henkel Huawei Electronics Co., Ltd.

Address before: 222004 No. 26, new sea road, Sinpo District, Jiangsu, Lianyungang

Patentee before: Jiangsu Zhongdian Huawei Electronics Co., Ltd.

C35 Partial or whole invalidation of patent or utility model
IW01 Full invalidation of patent right

Decision date of declaring invalidation: 20130206

Decision number of declaring invalidation: 20014

Granted publication date: 20070905