CN1680507A - Binding composition, electric circuit connecting material, electric component connecting structure and production thereof - Google Patents

Binding composition, electric circuit connecting material, electric component connecting structure and production thereof Download PDF

Info

Publication number
CN1680507A
CN1680507A CNA200510009016XA CN200510009016A CN1680507A CN 1680507 A CN1680507 A CN 1680507A CN A200510009016X A CNA200510009016X A CN A200510009016XA CN 200510009016 A CN200510009016 A CN 200510009016A CN 1680507 A CN1680507 A CN 1680507A
Authority
CN
China
Prior art keywords
circuit
aforementioned
electrode
connection material
interarea
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CNA200510009016XA
Other languages
Chinese (zh)
Other versions
CN1329470C (en
Inventor
加藤木茂树
须藤朋子
汤佐正己
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2004038869A external-priority patent/JP4655488B2/en
Priority claimed from JP2004038859A external-priority patent/JP4655487B2/en
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Publication of CN1680507A publication Critical patent/CN1680507A/en
Application granted granted Critical
Publication of CN1329470C publication Critical patent/CN1329470C/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02B—HYDRAULIC ENGINEERING
    • E02B15/00—Cleaning or keeping clear the surface of open water; Apparatus therefor
    • E02B15/04—Devices for cleaning or keeping clear the surface of open water from oil or like floating materials by separating or removing these materials
    • E02B15/08—Devices for reducing the polluted area with or without additional devices for removing the material
    • E02B15/0857—Buoyancy material
    • E02B15/0864—Air
    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02B—HYDRAULIC ENGINEERING
    • E02B15/00—Cleaning or keeping clear the surface of open water; Apparatus therefor
    • E02B15/04—Devices for cleaning or keeping clear the surface of open water from oil or like floating materials by separating or removing these materials
    • E02B15/08—Devices for reducing the polluted area with or without additional devices for removing the material
    • E02B15/0814—Devices for reducing the polluted area with or without additional devices for removing the material with underwater curtains
    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02B—HYDRAULIC ENGINEERING
    • E02B15/00—Cleaning or keeping clear the surface of open water; Apparatus therefor
    • E02B15/04—Devices for cleaning or keeping clear the surface of open water from oil or like floating materials by separating or removing these materials
    • E02B15/08—Devices for reducing the polluted area with or without additional devices for removing the material
    • E02B15/085—Details of connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/831—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
    • H01L2224/83101—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus as prepeg comprising a layer connector, e.g. provided in an insulating plate member

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Adhesives Or Adhesive Processes (AREA)

Abstract

The invention provides an adhesive composition, which contains a radically polymerizable compound, a radical polymerization initiator and a compound having a nitrogen-silicon bond.

Description

The connection structure and the method for making thereof of adhesive composite, circuit connection material, circuit block
Technical field
The present invention relates to adhesive composite, used the manufacture method of the connection structure of the connection structure of film like caking agent, the circuit connection material of adhesive composite, the film-shaped circuit connection material that has used circuit connection material, circuit block and circuit block.
Background technology
In power industry and electronics industry,, often use various adhesivess in order to make the parts combination of various circuit blocks etc.Particularly in semiconductor element and liquid crystal display device field, along with densification, height become more meticulous growing, the caking agent that requires to be used for these purposes also will have high bonding strength, particularly has good bonding strength under hot and humid condition.
In addition, in utilizing the bonding lining body of caking agent, use to have to be metal and ITO (indium tinoxide), silicon nitride (SiN such as the copper of representative, aluminium with organic substrates such as printed circuit board and polyimide x), silicon-dioxide (SiO 2) base material of the various condition of surface that wait.Therefore, preferably make caking agent meet the body design that respectively is covered.
In the past, in the caking agent of semiconductor element and used for liquid crystal display element, used with reference to the spy with the heat-curing resin (for example, opening flat 1-113480 communique) of Resins, epoxy as representative.Described caking agent makes it to solidify by the thermal treatment of carrying out under 170～250 ℃ 1～3 hour.
In recent years, along with the height highly integrated, liquid crystal display device of semiconductor element becomes more meticulous, the pitch of interelement and wiring closet is to narrowization development.For this reason, when heat-treating under 170～250 ℃ temperature as mentioned above, the heating of carrying out during curing may produce detrimentally affect to parts on every side.Therefore, in order to prevent that parts are on every side caused detrimentally affect, caking agent is cured under lower temperature (100～170 ℃).And, in order to improve throughput capacity, require caking agent was cured in the short period of time (in 1 hour).In other words, promptly require to obtain the caking agent of " low temperature fast setting ".
In order to adapt to described requirement, open the spy and to disclose the anisotropic conductive caking agent that contains free-radical polymerised resin, organo-peroxide, thermoplastic elastomer, phosphoric acid ester and epoxy silane coupler as resin combination in the 2000-44905 communique.
Summary of the invention
But, although above-mentioned spy open the anisotropic conductive caking agent described in the 2000-44905 communique can the low temperature fast setting,, its bonding strength is not enough.
The present invention is the research of carrying out in view of above-mentioned the problems of the prior art point.Its purpose is to provide the manufacture method of the connection structure of a kind of connection structure with the adhesive composite of enough bonding strengths, the film like caking agent, the circuit connection material that have used adhesive composite, the film-shaped circuit connection material that has used circuit connection material, circuit block and circuit block.
In order to address the above problem, adhesive composite of the present invention is characterised in that, contains free-radical polymerised compound, radical polymerization initiator and has the compound (more preferably silicon nitrogen silane compound) of nitrogen-silicon key.
Adhesive composite of the present invention is to contain free-radical polymerised compound, radical polymerization initiator, is so-called radical-curable adhesive composite.Adhesive composite of the present invention is by comprising the compound that contains nitrogen-silicon key in the radical-curable adhesive composite, make it have enough bonding strengths, particularly under hot and humid (85 ℃, 85%RH) condition, make it have good bonding strength.In addition, adhesive composite of the present invention has high bonding strength for the surperficial at least lining body that constitutes based on the inorganic materials of metal, also can the low temperature fast setting.As mentioned above, because the surface is had high bonding strength by the lining body that inorganic materials constitutes, adhesive composite of the present invention is suitable for circuit connection material.
Though adhesive composite of the present invention shows that the reason of above-mentioned effect is uncertain, present inventors are presumed as follows.That is, adhesive composite of the present invention contains and has nitrogen-compound of silicon key.Described nitrogen-silicon key has and SiO 2And SiN xSame bonding mode is so the bonding strength of adhesive composite of the present invention had obviously good bonding strength than former adhesive composite.And think that in adhesive composite of the present invention, the cure shrinkage when making curing by the compound with nitrogen-silicon key is inhibited, bonding force improves, and shows enough bonding strengths.
Film like caking agent of the present invention is made film like with the adhesive composite of the invention described above and is formed.Utilize this film like caking agent, easy to operate, can be easily positioned in the lining body, can easily carry out attended operation.
Circuit connection material of the present invention is used to make at first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate and is formed with the second circuit parts of second circuit electrode on the interarea of second circuit substrate, be connected making under aforementioned first circuit electrode and the state that aforementioned second circuit electrode is disposing relatively, it is characterized in that, contain the adhesive composite of the invention described above.This circuit connection material so also have high bonding strength for the circuit block that is made of inorganic materials, is suitable for bonding circuit block because contain the adhesive composite of the invention described above.
The connection structure of circuit block of the present invention has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, make under the relative state that is disposing of aforementioned first circuit electrode with aforementioned second circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks, it is characterized in that, the circuit connecting section part is made of the cured article of circuit connection material of the present invention, and first circuit electrode and aforementioned second circuit electrode are electrically connected.The connection structure of this circuit block constitutes because of the cured article of circuit connecting section part by circuit connection material of the present invention, reduces the reliability height of bonding strength fully so it connects resistance.
In addition, circuit connection material of the present invention is used to make the second circuit parts that are formed with the second circuit electrode on the interarea of first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate and second circuit substrate, is connected making under aforementioned first circuit electrode and the state that aforementioned second circuit electrode is disposing relatively; It is characterized in that, comprise the adhesive composite that contains free-radical polymerised compound and radical polymerization initiator, carried out the surface-treated conducting particles with compound with nitrogen-silicon key.
Circuit connection material of the present invention is because the compound by having nitrogen-silicon key that contains as electro-conductive material has carried out the surface-treated conducting particles, so be configured between the electrode of relative circuit block, make after its curing, between electrode, can obtain enough low connection resistance.Circuit connection material of the present invention in addition has good connection resistance stability after preserving.The good stability of the connection resistance after in addition, circuit connection material of the present invention is preserved.This thinks owing to the reason with enough bonding strengths.The stability of the connection resistance after the preservation described here, be meant with respect to the connection resistance in the connection structure of the circuit block that uses the circuit connection material just made to obtain, use the change of making the connection resistance in the connection structure of placing the circuit block that the circuit connection material after the specified time obtains in the back to be suppressed fully.
In addition, circuit connection material of the present invention is because contain the adhesive composite with free-radical polymerised compound and radical polymerization initiator, so can the low temperature fast setting.
Film-shaped circuit connection material of the present invention connects material with foregoing circuit and makes film like and form.This film-shaped circuit connection material is easy to operate, can easily carry out attended operation easily to the setting of lining body.
The connection structure of circuit block of the present invention has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, making under the relative state that is disposing of aforementioned first circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks with aforementioned second circuit electrode; It is characterized in that, constitute, first circuit electrode and second circuit electrode were electrically connected by carrying out the surface-treated conducting particles by the compound with aforementioned nitrogen-silicon key by the cured article of circuit connection material of the present invention.Because the circuit connecting section part is made of the cured article that foregoing circuit connects material, so the connection resistance between first circuit electrode and the second circuit electrode reduces fully and stablize the reliability height of bonding strength.
The manufacture method of the connection structure of circuit block of the present invention, this connection structure has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, making under the relative state that is disposing of aforementioned first circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks with aforementioned second circuit electrode; It is characterized in that, configuration circuit connection material of the present invention between the interarea of the interarea of first circuit substrate and second circuit substrate, by the first and second circuit block materials, heating and pressurization circuit connection material, make it be cured processing, aforementioned first circuit block is connected with aforementioned second circuit parts, makes the connection structure of circuit block thus.As long as and with the circuit connection material of manufacture method the application of the invention of the connection of this circuit block structure, just can the low temperature fast setting, make the detrimentally affect that suppresses fully circuit block, the raising throughput capacity becomes possibility.
Description of drawings
Fig. 1 is the sectional view that shows an embodiment of film like caking agent of the present invention.
Fig. 2 is the constructed profile of an embodiment that shows the connection structure of circuit block of the present invention.
Fig. 3 (a)～Fig. 3 (c) is a series of process picture sheet that connects each circuit block.
Fig. 4 is the constructed profile that shows an embodiment of film-shaped circuit connection material of the present invention.
Fig. 5 is the constructed profile of an embodiment that shows the connection structure of circuit block of the present invention.
Fig. 6 (a)～Fig. 6 (c) is a series of process picture sheet that connects each circuit block.
Embodiment
Below, according to circumstances with reference to accompanying drawing, preferred implementation of the present invention is described.Similar elements is used identical symbol, not repeat specification in addition.In addition, below in the explanation, (methyl) acrylate is meant acrylate or its corresponding methacrylic ester.
The 1st embodiment
Adhesive composite
Adhesive composite of the present invention contains free-radical polymerised compound, radical polymerization initiator and has the compound of nitrogen-silicon key.
Free-radical polymerised compound is the compound with functional group of the radical polymerization of utilizing.Free-radical polymerised compound for example has (methyl) acrylic compound, maleimide compound, citraconimide compound, indophenols imide (Na ジ ィ ミ De) compound etc.These can be used alone, and also can mix and use two or more.In addition, free-radical polymerised compound can use under monomer or any state of oligopolymer, also monomer and oligopolymer can be mixed use.
(methyl) acrylic compound for example has: (methyl) methyl acrylate, (methyl) ethyl propenoate, (methyl) isopropyl acrylate, (methyl) isobutyl acrylate, (methyl) vinylformic acid glycol ester, two (methyl) vinylformic acid binaryglycol ester, three (methyl) vinylformic acid trishydroxymethyl propyl diester, four (methyl) vinylformic acid tetramethyl diol ester, 2-hydroxyl-1,3-two propylene acyloxy propane, 2, two [4-(acryloyl-oxy ylmethoxy) phenyl] propane of 2-, 2, two [4-(acryloyl-oxy base oxethyl) phenyl] propane of 2-, (methyl) vinylformic acid two cyclopentenes esters, (methyl) vinylformic acid tricyclodecenyl esters, three (acryloxy ethyl) chlorinated isocyanurates, carbamate (methyl) acroleic acid polyurethane, tricarbimide oxyethane modification diacrylate etc.These can be used alone, and also can mix two or more use.By above-mentioned (methyl) acrylic compound is carried out radical polymerization, can obtain (methyl) acrylic resin.
Maleimide compound is the compound that contains 1 dimaleoyl imino at least.Maleimide compound for example has: phenyl maleimide, 1-methyl-2,4-bismaleimides benzene, N, N '--the penylene bismaleimides, N, N '-right-penylene bismaleimides, N, N '-4, the two penylene bismaleimidess of 4-, N, N '-4,4-(3, the two penylenes of 3-dimethyl) bismaleimides, N, N '-4,4-(3, the 3-dimethyl diphenylmethane) bismaleimides, N, N '-4,4-(3, the two phenylmethanes of 3-diethyl) bismaleimides, N, N '-4,4-ditan bismaleimides, N, N '-4,4-diphenyl propane bismaleimides, N, N '-4,4-diphenyl ether bismaleimides, N, N '-4,4-sulfobenzide bismaleimides, 2, two (4-(the 4-maleimide phenoxy group) phenyl) propane of 2-, 2, two (3-sec-butyl-3,4-(the 4-maleimide phenoxy group) phenyl) propane of 2-, 1, two (4-(the 4-maleimide phenoxy group) phenyl) decane of 1-, 4,4 '-cyclohexylidene-two (1-(4-maleimide phenoxy group) phenoxy group)-2-phenylcyclohexane, 2, two (4-(4-maleimide phenoxy group) phenyl) HFC-236fa of 2-etc.These can be used alone, and also can mix two or more use.
The citraconimide compound is the compound that contains 1 citraconimide base at least.The citraconimide compound for example has: the phenyl citraconimide, 1-methyl-2,4-two citraconimide benzene, N, N '--penylene two citraconimides, N, N '-right-penylene two citraconimides, N, N '-4,4-two penylene dual-citraconic imides, N, N '-4,4-(3, the two penylenes of 3-dimethyl) dual-citraconic imide, N, N '-4,4-(3, the 3-dimethyl diphenylmethane) dual-citraconic imide, N, N '-4,4-(3, the two phenylmethanes of 3-diethyl) dual-citraconic imide, N, N '-4,4-ditan dual-citraconic imide, N, N '-4,4-diphenyl propane dual-citraconic imide, N, N '-4,4-diphenyl ether dual-citraconic imide, N, N '-4,4-sulfobenzide dual-citraconic imide, 2, two (4-(the 4-citraconimide phenoxy group) phenyl) propane of 2-, 2, two (3-sec-butyl-3,4-(the 4-citraconimide phenoxy group) phenyl) propane of 2-, 1, two (4-(the 4-citraconimide phenoxy group) phenyl) decane of 1-, 4,4 '-cyclohexylidene-two (1-(4-citraconimide phenoxy group) phenoxy group)-2-phenylcyclohexane, 2, two (4-(4-citraconimide phenoxy group) phenyl) HFC-236fa of 2-etc.These can be used alone, and also can mix two or more use.
The indophenols imide compound is the compound that contains 1 indophenols imide at least.The indophenols imide compound for example has: phenyl indophenols imide, 1-methyl-2, the two indophenols imide benzene of 4-, N, N '--the two indophenols imides of penylene, N, the two indophenols imides of N '-right-penylene, N, N '-4, the two indophenols imides of 4-two penylenes, N, N '-4,4-(3, the two penylenes of 3-dimethyl) two indophenols imides, N, N '-4,4-(3, the 3-dimethyl diphenylmethane) two indophenols imides, N, N '-4, the two indophenols imides of 4-(3, the two phenylmethanes of 3-diethyl), N, N '-4, the two indophenols imides of 4-ditan, N, N '-4, the two indophenols imides of 4-diphenyl propane, N, N '-4, the two indophenols imides of 4-diphenyl ether, N, N '-4, the two indophenols imides of 4-sulfobenzide, 2, two (4-(the 4-indophenols imide phenoxy group) phenyl) propane of 2-, 2, two (3-sec-butyl-3,4-(the 4-indophenols imide phenoxy group) phenyl) propane of 2-, 1, two (4-(the 4-indophenols imide phenoxy group) phenyl) decane of 1-, 4,4 '-cyclohexylidene-two (1-(4-indophenols imide phenoxy group) phenoxy group)-2-phenylcyclohexane, 2, two (4-(4-indophenols imide phenoxy group) phenyl) HFC-236fa of 2-etc.These can be used alone, and also can mix two or more use.
And free-radical polymerised compound can use the free-radical polymerised compound with phosphate ester structure, preferably has the free-radical polymerised compound of the phosphate ester structure shown in the following formula (I).
Change 1
In the above-mentioned formula, n is 1～3 integer.
Has the free-radical polymerised compound of phosphate ester structure because can improve the bonding force of adhesive composite, so be preferred to inorganicss such as metals.Solids component 100 mass parts of the relative adhesive composite of usage quantity with free-radical polymerised compound of phosphate ester structure, preferred 0.1～30 mass parts, more preferably 0.5～10 mass parts, most preferably 0.5～5 mass parts.Free-radical polymerised compound with phosphate ester structure obtains with the resultant of reaction as phosphoric anhydride and (methyl) vinylformic acid 2-hydroxy methacrylate.Concrete material for example has: single (2-methacryloxyethyl) acid phosphoric acid ester, two (2-methacryloxyethyl) acid phosphoric acid ester (dimethacrylate phosphoric acid ester) etc.These can be used alone, and also can mix two or more use.
Free-radical polymerised compound preferably is used (methyl) acrylic compound and has the free-radical polymerised compound of phosphate ester structure.When as above cooperating, to compare with the free-radical polymerised compound that uses respectively separately (methyl) acrylic compound, have a phosphate ester structure, the bonding strength of its adhesive composite is higher.
Radical polymerization initiator is not particularly limited so long as utilize rayed and/or add the compound of thermogenesis free radical just passable.Described radical polymerization initiator preferably utilizes the rayed of 150～750nm and/or 80～200 ℃ the compound that adds the thermogenesis free radical.Concrete material is superoxide, azo-compound etc. for example.These consider that the connection temperature of target, tie-time, storage stability etc. can suitably be selected.
Superoxide is considered hyperergy and storage stability two aspects, preferred organo-peroxide, preferred 10 hours transformation period, temperature are more than 40 ℃, and 1 minute transformation period, the organo-peroxide of temperature below 180 ℃, preferred especially 10 hours transformation period, temperature are more than 40 ℃, and 1 minute transformation period, the organo-peroxide of temperature below 170 ℃.In addition, in the time will being set at the tie-time below 10 seconds, the use level that is used to obtain the radical polymerization initiator of enough reactivities is a benchmark with the total amount of the solids component of adhesive composite, preferred 0.5～20 quality %, preferred especially 1～15 quality %.
The organo-peroxide concrete example is if any diacyl peroxide, peroxy dicarbonate, peroxyester, ketal peroxide, dialkyl peroxide, hydroxyl peroxide, silylation superoxide etc.Wherein peroxyester, dialkyl peroxide, hydroxyl peroxide, silylation superoxide are because chlorion and organic acid concentration in the initiator are below the 5000ppm, the organic acid that produces after the thermal degradation is few, and it is can suppress the corrosion of the circuit electrode of circuit block, so preferred especially.
Diacyl peroxide for example has: isobutyl peroxide, 2; 4-dichlorobenzene acyl peroxide, 3; 5,5-trimethyl acetyl base superoxide, sim peroxides, lauroyl peroxide, stearyl superoxide, amber superoxide, benzoyl peroxidation toluene, benzoyl peroxide etc.
Peroxy dicarbonate for example has: di peroxy dicarbonate, diisopropyl peroxydicarbonate, two (4-tert-butylcyclohexyl) peroxy dicarbonate, two-2-oxyethyl group methoxy base peroxy dicarbonate, two (2-ethylhexyl peroxy dicarbonate, dimethoxy butyl peroxyization two carbonic ethers, two (3-methyl-3-methoxyl group butyl peroxyization) two carbonic ethers etc.
Peroxyester for example has: the cumyl new decanoate ester peroxide; 1; 1; 3; 3-tetramethyl butyl new decanoate ester peroxide; 1-cyclohexyl-1-methylethyl new decanoate ester peroxide; uncle's hexyl new decanoate ester peroxide; tert-butyl hydroperoxide trimethylacetic acid ester; 1; 1; 3; 3-tetramethyl butyl peroxidation-2-ethylhexanoate; 2; 5-dimethyl-2; 5-two (2-ethyl hexanoyl base peroxy) hexane; 1-cyclohexyl-1-methylethyl peroxidation-2-ethylhexanoate; uncle's hexyl peroxidation-2-ethylhexanoate; tert-butyl hydroperoxide-2-ethylhexanoate; the tert-butyl hydroperoxide isobutyrate; 1; two (tert-butyl hydroperoxide) hexanaphthenes of 1-; uncle's hexyl peroxidation sec.-propyl monocarbonate; tert-butyl hydroperoxide-3; 5; 5-tri-methyl hexanoic acid ester; the tert-butyl hydroperoxide laurate; 2; 5-dimethyl-2,5-two (-the toluyl peroxidation) hexane; tert-butyl hydroperoxide sec.-propyl monocarbonate; tert-butyl hydroperoxide-2-ethylhexyl monocarbonate; uncle's hexyl peroxide benzoate; tert-butyl hydroperoxide acetic ester etc.
Ketal peroxide for example has: 1, two (the uncle's hexyl peroxies)-3 of 1-, 3,5-trimethyl-cyclohexane, 1, two (the uncle's hexyl peroxy) hexanaphthenes, 1 of 1-, 1-bis(t-butylperoxy)-3,3,5-trimethyl-cyclohexane, 1,1-(t-butylperoxy) cyclododecane, 2,2-bis(t-butylperoxy) decane etc.
Dialkyl peroxide for example has: α, α '-bis(t-butylperoxy) diisopropyl benzene, dicumyl peroxide, 2,5-2, tert-butyl peroxide cumyl peroxide etc.
Hydrogen peroxide for example has: diisopropylbenzenehydroperoxide, cumene hydroperoxide etc.
The silylation superoxide for example has: tertiary butyl TMS superoxide, two (tertiary butyl) dimethylsilyl superoxide, tertiary butyl trivinyl silylation superoxide, two (tertiary butyl) divinyl silylation superoxide, three (tertiary butyl) vinyl silanes base superoxide, tertiary butyl triallyl silylation superoxide, two (tertiary butyl) diallylsilane base superoxide, three (tertiary butyl) allyl silicane base superoxide etc.
These radical polymerization initiators can be used alone, and also can mix two or more use, also can mix and use decomposition accelerating agent, inhibitor etc.
In addition, these radical polymerization initiators of lining such as polymer substance with polyurethane series, polyester system make its material that forms micro encapsulation, because can extend working time like this, so preferred.
In addition, when adhesive composite used in circuit connection material, for the corrosion of the circuit electrode that suppresses circuit block, chlorion that contains in radical polymerization initiator or organic acid concentration were preferably below the 5000ppm.And, the more preferably few radical polymerization initiator of the organic acid that produces after the thermal degradation.In addition, because the stability after the adhesive composite curing improves, so preferably after 24 hours, have the above quantity retention of 20 quality % in open placement under room temperature and the normal pressure.
The compound that has nitrogen-silicon key at intramolecularly is not particularly limited, and can use known compound.The compound that has nitrogen-silicon key at intramolecularly preferably uses at least a in silicon nitrogen silane compound, silylation amine and the aminosilane.Wherein, preferred especially silicon nitrogen silane compound.
Silicon nitrogen silane compound can be any in polymkeric substance, oligopolymer, the monomer.The silicon nitrogen silane compound concrete example is if any hexamethyldisilazane, 1,1,3,3-tetramethyl--1, the 3-divinyl disilazane, tetramethyl--1,3-phenylbenzene disilazane, 1,1,1,3,3, the 3-hexamethyldisilazane, 2,2,4,4,6,6-pregnancy basic ring three silazane, heptamethyldisilazane, the prestox cyclotetrasilazane, 1,1,3, the 3-tetramethyl-disilazane, allyl dimethyl base (diisopropylaminoethyl) silane, TMS aniline, 1, two (chloromethyl) tetramethyl-disilazanes of 3-, two (diethylamino) dimethylsilane, two (dimethylamino) diethylsilane, two (dimethylamino) dimethylsilane, two (dimethylamino dimethylsilyl) ethane, two (dimethylamino) diphenyl silane, two (dimethylamino) methyl-monosilane, two (dimethylamino) vinyl ethylsilane, two (dimethylamino) vinyl methyl-monosilane, two (ethylamino) dimethylsilane, two (N-methyl-benzamide) (ethoxymethyl) base silane, 1,3-two (3,3, the 3-trifluoro propyl) tetramethyl-disilazane, N-6, two (TMS) VITAMIN B4 of 9-, N, N '-two (TMS)-1, the 4-butanediamine, two (TMS) cytosine(Cyt), N, two (TMS) oxyamines of O-, normal-butyl dimethyl (dimethylamino) silane, chloromethyl silatrane (シ ラ ト ラ Application), between-the chlorophenoxy silatrane, 3-cyano group propyl group (di-isopropyl) dimethylamino silane, 3-cyano group propyl group methyl ring silazane, the di-n-butyl tetramethyl-disilazane, (diethylin) trimethyl silane, (diisopropylaminoethyl) trimethyl silane, (N, N-dimethylamino) dimethylsilane, (N, the N-dimethylamino) dimethylsilane, the dimethylamino methyl Ethoxysilane, (N, the N-dimethylamino) triethyl silicane, (N, N-dimethylamino) trimethylchlorosilane, 1,3-di-n-octyl tetramethyl-disilazane, 1,3-phenylbenzene-1,1,3, the 3-tetramethyl-disilazane, 1,3-dipropyl-1,1,3, the 3-tetramethyl-disilazane, 1,3-divinyl-1,3-phenylbenzene-1,3-dimethyl disilazane, 1,1,3,3,5,5-pregnancy basic ring three silazane, 1,2,3,4,5,6-pregnancy basic ring three silazane, the hydroxyl-oxethyl silatrane, the Methacrylamide trimethyl silane, the methacryloxypropyl silatrane, the methyl silatrane, methyl-N-TMS carbamate, N methyl N trimethylsilyl trifluoroacetamide, nine methyl, three silazane, just-octadecyl diisobutyl (dimethylamino) silane, just-octadecyl dimethyl (dimethylamino) silane, just-octyl dimethyl base (dimethylamino) silane, two (dimethylamino) chlorosilanes of phenyl, two (dimethylamino) silane of phenmethyl, 1,3,5,7-tetraethyl--2,4,6,8-tetramethyl cyclotetrasiloxane silazane, four (diethylamino) silane, four (dimethylamino) silane, 2,2,5,5-tetramethyl--2,5-two silicon (ジ シ ラ)-1-aza-cyclopentane, 1,1,3,3-tetraphenyl dimethyl disilazane, 1,3,5,7-tetrem thiazolinyl-1,3,5,7-tetramethyl cyclotetrasiloxane silazane, 1,2,3-triethyl-2,4,6-front three basic ring three silazane, three-n-hexyl silylation amine, N-(TMS) ethanamide, between-TMS aminophenyl acetylene, N-(TMS) morpholine, 3-TMS-2-azolactone, 1-TMS pyrroles, 1-TMS-1,2, the 4-triazole, three (cyclohexyl amino) methyl-monosilane, three (dimethylamino) chlorosilane, three (dimethylamino) ethylsilane, three (dimethylamino) methyl-monosilane, three (dimethylamino) phenyl silane, three (dimethylamino) silane, 1,3,5-trivinyl-1,3,5-front three basic ring three silazane, (N-vinyl formamide) trimethyl silane, the vinyl silatrane, 1-TMS pyrrolidone, poly-(1,1-dimethyl-silicon azane), poly-(1,2-dimethyl-silicon azane) etc.These can be used alone, and also can mix two or more use.
Silylation amine for example has: N, N-diethyl-1,1,1-TMS amine, N, N-di-isopropyl TMS amine, N, two (TMS) ethanamides of O-, N-6, two (TMS) VITAMIN B4 of 9-, two (TMS) cytosine(Cyt), N, two (TMS) azanols of O-etc.These can be used alone, and also can mix two or more use.
Aminosilane for example has: the allyl amino trimethyl silane, allyl dimethyl base (diisopropylaminoethyl) silane, the anilino trimethyl silane, two (diethylamino) dimethylsilane, two (dimethylamino) diethylsilane, two (dimethylamino) dimethylsilane, two (dimethylamino) diphenyl silane, two (dimethylamino) dimethylsilane, two (dimethylamino) vinyl ethylsilane, two (N-methyl-benzamide) (ethoxymethyl) base silane, normal-butyl dimethyl (dimethylamino) silane etc.These can be used alone, and also can mix two or more use.
In addition, as required, adhesive composite also can contain radical polymerization inhibitors such as quinhydrones, methyl ether quinhydrones in the scope that does not influence curing.
Adhesive composite also can contain the heat-curing resin beyond the free-radical polymerised compound.These thermoplastic resins for example have Resins, epoxy.Resins, epoxy for example has: bisphenol A type epoxy resin, bisphenol f type epoxy resin, bisphenol-s epoxy resin, phenol line style phenol aldehyde type epoxy resin, meta-cresol line style phenol aldehyde type epoxy resin, dihydroxyphenyl propane line style phenol aldehyde type epoxy resin, Bisphenol F line style phenol aldehyde type epoxy resin, alicyclic epoxy resin, glycidyl ester epoxy resin, glycidyl group amine type Resins, epoxy, glycolylurea type Resins, epoxy, isocyanate-based Resins, epoxy, aliphatics chain Resins, epoxy etc.These Resins, epoxy also can halogenation, also can hydrogenation.These Resins, epoxy can be used alone, and also can mix two or more use.
In addition, above-mentioned curing agent for epoxy resin can be used normally used curing agent for epoxy resin.Concrete example is if any amine, phenol, anhydrides, imidazoles, Dyhard RU 100 etc.And, be fit to use as the normally used tertiary amine of curing catalyst, organophosphorus based compound.
In addition, the method that makes the Resins, epoxy reaction also can be used sulfonium salt, salt compounded of iodine etc. except that using above-mentioned solidifying agent, make it carry out cationoid polymerisation.
Stress retentivity when making it have film forming, cementability, curing also can contain macromolecular compound in the adhesive composite.Macromolecular compound for example has: polyvinylbutyral resin, vinyl-formal resin, vibrin, polyamide resin, polyimide resin, xylene resin, phenoxy resin, urethane resin, urea resin etc.
These macromolecular compound preferred molecular weight are 10000～10,000,000 material.In addition, these macromolecular compounds also can carry out modification with free-radical polymerised functional group, and in this case, thermotolerance improves.And these macromolecular compounds also can contain carboxyl.Preferred 2～80 quality % of the total amount of the solids component in the relative adhesive composite of the use level of macromolecular compound in adhesive composite, more preferably 5～70 quality %, preferred especially 10～60 quality %.The use level of macromolecular compound is tended to stress and is relaxed and the bonding force deficiency during less than 2 quality %.On the contrary, when surpassing 80 quality %, tend to mobile low.
Also suitably absorb fillers, tenderizer, promotor, antiager, tinting material, fire retardant, coupler in the adhesive composite.
In the adhesive composite of above explanation, relative free-radical polymerised compound 100 mass parts, radical polymerization initiator preferably contains 0.5～30 mass parts, more preferably 1.0～10 mass parts.When the content of radical polymerization initiator during less than 0.5 mass parts, can not be cured reaction fully, tend to solidify not enough.In addition, when surpassing 30 mass parts, it is low to tend to storage stability.
In addition, relative free-radical polymerised compound 100 mass parts, the compound with nitrogen-silicon key preferably contains 0.1～20 mass parts, more preferably contains 0.5～15 mass parts, most preferably contains 0.5～10 mass parts.When the content of the compound with nitrogen-silicon key during less than 0.1 mass parts, it is low to tend to bonding force, or hopeless raising bonding force.On the contrary, when surpassing 20 mass parts, tend to solidify the rerum natura variation.
In addition, use form to adhesive composite is not particularly limited, for example can make following use, be about to above-mentioned each composition dissolving and/or be dispersed in the organic solvents such as toluene, ethyl acetate form solution, perhaps from this solution, remove and desolvate, make the formed body (film like caking agent for example described later) of the shape of regulation.
Fig. 1 is the sectional view that shows an embodiment of film like caking agent of the present invention.The film like caking agent 1 that Fig. 1 shows is above-mentioned adhesive composite to be made film like form.By using this film like caking agent, easy and simple to handle, both can easily on the lining body, be provided with, can easily carry out attended operation again.
Tg (second-order transition temperature) when in addition, film like caking agent 1 also can be made and be solidified by adhesive composite is the multilayered structure (not shown) that the two or more layer more than 5 ℃ constitutes for difference.
Film like caking agent 1 for example can use apparatus for coating that adhesive composite is dissolved in the material that forms in the solvent and be coated on the supporting mass (PET (polyethylene terephthalate) film etc.), make adhesive composite not carry out the warm air drying of specified time under the solidified temperature, making thus and form.In addition, preferred 10～50 μ m of the thickness of film like caking agent 1.
The connection structure of circuit block
Fig. 2 is the constructed profile of an embodiment that shows the connection structure of circuit block of the present invention.As shown in Figure 2, the connection of the circuit block of present embodiment structure is provided with relative first circuit block 20 and second circuit parts 30 mutually, between first circuit block 20 and second circuit parts 30, is provided with the circuit connecting section part 10 that connects.
First circuit block 20 is provided with circuit substrate (first circuit substrate) 21, be formed at the circuit electrode (first circuit electrode) 22 on the interarea 21a of circuit substrate 21.In addition, on the interarea 21a of circuit substrate 21, according to circumstances also can form the insulation layer (not shown).
In addition, second circuit parts 30 are provided with circuit substrate (second circuit substrate) 31, are formed at the circuit electrode (second circuit electrode) 32 on the 31a on the interarea of circuit substrate 31.In addition, on the interarea 31a of circuit substrate 31, according to circumstances also can form the insulation layer (not shown).
First and second circuit block 20,30 is not particularly limited so long as to be formed with the material of the electrode that must be electrically connected just passable.Concrete example if any: that uses in the liquid-crystal display forms the glass of electrode or plastic base, printed wiring board, ceramic wiring plate, flexible wiring board, semi-conductor silicon chip etc. by ITO etc., and these can be used as required.As mentioned above, can use the material that constitutes with organism such as printed wiring board and polyimide metal or ITO (indium tin oxide), silicon nitride (SiN in the present embodiment as the copper of representative, aluminium etc. X), silicon-dioxide (SiO 2) wait the circuit block with various condition of surface of inorganic class.
Circuit connecting section part 10 contains insulativity material 11 and conducting particles 7.Conducting particles 7 not only is configured between relative circuit electrode 22 and the circuit electrode 32, also is configured between interarea 21a, the 31a.In the connection of circuit block structure, circuit electroplax 22,32 is electrically connected by conducting particles 7.Just, conducting particles 7 directly and the contact both sides of circuit electrode 22,32.
Here, just passable as long as conducting particles 7 has the electroconductibility that can be electrically connected, be not particularly limited.Metallicss such as Au, Ag, Ni, Cu, Co, scolding tin and carbon etc. are arranged.In addition, also can use by conducting material such as the above-mentioned metal material that dielectric glass, pottery, plastics etc. obtain that is covered.At this moment, the metal layer thickness of lining is in order to obtain enough electroconductibility, preferably more than the 10nm.
In the connection structure of this circuit block, as mentioned above, relative circuit electrode 22 and circuit electrode 32 are electrically connected by conducting particles 7.For this reason, the connection resistance between the circuit electrode 22,32 reduces fully.Therefore, the electric current of 22,32 of circuit electrodes is unimpededly flowed, can bring into play the function that circuit has fully.In addition, when circuit connecting section part 10 does not contain conducting particles 7, directly contact with circuit electrode 32, can be electrically connected by making circuit electrode 22.
Circuit connecting section part 10 as described later, because utilize the cured article of the circuit connection material that contains above-mentioned adhesive composite to constitute, so the bonding strength of circuit connecting section part 10 relative circuit blocks 20 or 30 is very high, bonding strength becomes very high under hot and humid especially condition.In addition, in the connection structure of circuit block, bonding strength can continue sufficiently high state for a long time.Therefore, can prevent fully that the distance of 22,32 of circuit electrodes from taking place in time through the time change, can fully improve the long-term reliability of the circuit characteristic of 22,32 of circuit electrodes.
The manufacture method of the connection structure of circuit block
Below, the manufacture method that the connection of above-mentioned circuit block is constructed describes.
At first, prepare above-mentioned first circuit block 20 and film-shaped circuit connection material 40 (with reference to Fig. 3 (a)).Film-shaped circuit connection material 40 is made circuit connection material membranaceous and is formed.Circuit connection material contains adhesive composite 5 and conducting particles 7.Here adhesive composite 5 use above-mentioned contain free-radical polymerised compound, at least by the radical polymerization initiator that adds the thermogenesis free radical, compound with nitrogen-silicon key.In addition, even circuit connection material does not contain under the situation of conducting particles 7, it is bonding that this circuit connection material also can be used for anisotropic conductive as the insulativity caking agent, also is called NCP (Non-Conductive Paste) sometimes especially.In addition, contain at circuit connection material under the situation of conducting particles 7, this circuit connection material is called ACP (Anisotropic Conductive Paste) sometimes.
Preferred 0.1～30 volume % of the total amount of the relative circuit connection material of content of the conducting particles 7 in the circuit connection material, more preferably 1.0～20 volume %.When content during, tend to be difficult to obtain good path less than 0.1 volume %.In addition, when surpassing 30 volume %, may cause short circuit in abutting connection with circuit.
Preferred 10～50 μ m of the thickness of film-shaped circuit connection material 40.When the thickness of film-shaped circuit connection material 40 during less than 10 μ m, circuit connection material tends to lack of fill between circuit electrode 22,32.In addition, when surpassing 50 μ m, tend to be difficult to get rid of fully the adhesive composite between the circuit electrode 22,32, be difficult to guarantee the path between the circuit electrode 22,32.
Then, film-shaped circuit connection material 40 is loaded on the face of the circuit electrode 22 that is formed with first circuit block 20.In addition, under the situation of film-shaped circuit connection material 40, a side of film-shaped circuit connection material 40 is loaded on first circuit block 20 to first circuit block, 20 ground attached to the supporting mass (not shown).At this moment, film-shaped circuit connection material 40 is a film like, easily operation.Therefore, both can easily film-shaped circuit connection material 40 be contained between first circuit block 20 and the second circuit parts 30, can easily carry out the attended operation of first circuit block 20 and second circuit parts 30 again.
Then, with arrow A and the B direction pressurization of film-shaped circuit connection material 40, make film-shaped circuit connection material 40 be connected (with reference to Fig. 3 (b)) on first circuit block 20 along Fig. 3 (a) temporarily.At this moment, also can limit heating edge pressurization.But Heating temperature is set at the adhesive composite solidified temperature not in the film-shaped circuit connection material 40, just produces the low temperature of temperature of free radical than radical polymerization initiator.
Then, as shown in Figure 3, second circuit parts 30 are installed on the film-shaped circuit connection material 40, make the second circuit electrode surface to first circuit block 20.In addition, film-shaped circuit connection material 40 attached to the supporting mass (not shown) on the time, make after supporting mass peels off, second circuit parts 30 are loaded on the film-shaped circuit connection material 40.
Then, limit heating film-shaped circuit connection material 40, the limit is by arrow A and the B direction pressurization of first and second circuit blocks 20,30 to Fig. 3 (c).At this moment Heating temperature is set at the temperature that radical initiator can produce free radical.Thus, in radical polymerization initiator, produce free radical, cause free-radical polymerised compound generation polymerization.Like this, film-shaped circuit connection material 40 is cured processing, carry out this connection, obtains the connection structure of circuit block shown in Figure 2.
Heating temperature for example is set at 90～200 ℃, and the tie-time is set at for example 1 second～10 minutes.Above-mentioned condition can suitably be selected according to the purposes, adhesive composite, the circuit block that use, also can after fixing according to condition.As mentioned above, film-shaped circuit connection material 40 is because contain adhesive composite of the present invention, so can connect at low temperatures than the circuit connection material that contains Resins, epoxy etc.
As mentioned above, when making the connection structure of circuit block, in the connection structure of the circuit block that obtains, the both sides of the relative circuit electrode 22,32 of conducting particles 7 contacts can be made, the connection resistance between the circuit electrode 22,32 can be reduced fully.
In addition, by heating film-shaped circuit connection material 40, distance between circuit electrode 22 and the circuit electrode 32 is reduced fully, adhesive composite 5 is solidified, forming insulativity material 11, the first circuit blocks 20 is connected by circuit connecting section part 10 securely with second circuit parts 30.Just, in the connection structure of the circuit block that obtains, circuit connecting section part 10 is because utilize the cured article of the circuit connection material that contains above-mentioned adhesive composite to constitute, so the bonding strength of circuit connecting section part 10 relative circuit blocks 20 or 30 is high especially, particularly under hot and humid condition, it is very high that bonding strength becomes.In addition, bonding strength can keep under the state that becomes very high for a long time in the connection structure of circuit block.Therefore, the connection of the circuit block of gained structure can prevent fully distance between the circuit electrode 22,32 through the time change, the long-term reliability of the electrical characteristic between the circuit electrode 22,32 is good.
In addition, in the above-described embodiment, adhesive composite 5 uses the material that contains at least by the radical polymerization initiator that adds the thermogenesis free radical, also can replace this radical polymerization initiator, use and only carry out rayed, produce the radical polymerization initiator of free radical.In this case, when film-shaped circuit connection material 40 is cured processing, can replaces heating and carry out rayed.In addition, in the above-described embodiment, use film-shaped circuit connection material 40 to make the connection structure of circuit block, also can replace film-shaped circuit connection material 40, use circuit connection material.In this case, if circuit connection material is dissolved in the solvent, this solution coat on any one of first circuit block 20 or second circuit parts 30, is made its drying, just can between first and second circuit blocks 20,30, insert circuit connection material.
In addition, in the manufacture method of the connection of circuit block structure,, as required, also can use the radical polymerization initiator that utilizes ultrasonic wave, hertzian wave etc. to produce free radical except that utilizing heating or rayed to produce the radical polymerization initiator of free radical.
In addition, replace conducting particles 7, also can use other electro-conductive material.Other electro-conductive material for example has the carbon of particle shape or staple fibre shape, the metal wires such as Ni line of plating Au etc.
The 2nd embodiment
Circuit connection material
The circuit connection material of present embodiment be used to make the second circuit parts that are formed with the second circuit electrode on the interarea of first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate and second circuit substrate with first circuit electrode and second circuit electrode relatively the state of configuration be connected, comprise adhesive composite and carry out the surface-treated conducting particles with compound with nitrogen-silicon key with free-radical polymerised compound and radical polymerization initiator.
At first, the adhesive composite that contains in the circuit connection material in the present embodiment is described.Adhesive composite contains free-radical polymerised compound and radical polymerization initiator at least.
Free-radical polymerised compound uses the material identical with first embodiment with radical polymerization initiator.In addition, in the time of will being set at the tie-time below 10 seconds in the present embodiment, the use level that is used to obtain the radical polymerization initiator of enough reactivities is a benchmark with the total amount of the solids component of adhesive composite, preferably uses 1～20 quality %, preferred especially 2～15 quality %.As required, adhesive composite also can contain radical polymerization inhibitors such as quinhydrones, methyl ether quinhydrones in the scope that does not influence solidified nature.
Adhesive composite also can contain the heat-curing resin beyond the free-radical polymerised compound.These heat-curing resins for example have Resins, epoxy.Resins, epoxy for example is the material identical with the 1st embodiment.
In addition, above-mentioned curing agent for epoxy resin can be used the solidifying agent that common Resins, epoxy uses.Concrete material for example has: amine, phenol, anhydrides, imidazoles, dicyanamide etc.And, also can suitably use as the normally used tertiary amines of curing catalyst, organophosphorus based compound.
In addition, the method that makes the Resins, epoxy reaction also can be used sulfonium salt, salt compounded of iodine etc. except that using above-mentioned solidifying agent, make it carry out cationoid polymerisation.
Stress retentivity when making it have film forming, cementability, curing also can contain macromolecular compound in the adhesive composite.Macromolecular compound for example have with the 1st embodiment in identical material.
Also suitably absorb fillers, tenderizer, promotor, antiager, tinting material, fire retardant, coupler in the adhesive composite.
In the adhesive composite of above explanation, relative free-radical polymerised compound 100 mass parts preferably contain the radical polymerization initiator of 0.5～30 mass parts, more preferably contain 1.0～10 mass parts.When the content of radical polymerization initiator during less than 0.5 mass parts, can not be cured reaction fully, tend to solidify not enough.In addition, when surpassing 30 mass parts, it is low to tend to storage stability.
Below, the compound that has nitrogen-silicon key with intramolecularly is carried out surface-treated conducting particles (below be also referred to as " surface treatment conducting particles ") describe.In containing the solution of compound that intramolecularly has nitrogen-silicon key, add conducting particles, stir, from this solution, separate conducting particles and obtain the surface treatment conducting particles.In particular, the compound dissolution that intramolecularly is had nitrogen-silicon key in the solution that forms, adds conducting particles in specified solvent, stir the specified time.At this moment, preferably in being 20～40 ℃ scope, the temperature of solution carries out the scope that churning time is preferred 3～30 minutes.In addition, solvent uses organic solvents such as methyl ethyl ketone.Then, from solution, filter conducting particles, drying.The result obtains the surface treatment conducting particles.
Here conducting particles is not particularly limited so long as can be electrically connected, have the just passable of electroconductibility, and metallicss such as Au, Ag, Ni, Cu, Co, scolding tin and carbon etc. are for example arranged.In addition, also can use by conducting material such as above-mentioned metals and overlayed on the material that obtains on dielectric glass, pottery, the plastics etc.At this moment, the metal layer thickness of lining is in order to obtain enough electroconductibility, preferably more than the 10nm.
The above-mentioned compound that has nitrogen-silicon key at intramolecularly is not particularly limited, and can use known compound.Intramolecularly has at least a in the preferred silicon nitrogen silane compound of compound, silylation amine, ethylamino silane of nitrogen-silicon key.Wherein preferred especially silicon nitrogen silane compound.
Silicon nitrogen silane compound can be any in polymkeric substance, oligopolymer, the monomer.Silicon nitrogen silane compound for example is the material identical with the 1st embodiment.
In addition, preferred 0.1～30 volume % of the total amount of the relative circuit connection material of content of the surface treatment conducting particles in the circuit connection material, more preferably 1.0～20 volume %.When content during, tend to be difficult to carry out good conducting less than 0.1 volume %.In addition, when surpassing 30 volume %, may cause short circuit in abutting connection with circuit.
The use form of circuit connection material is not particularly limited, and for example each composition in the above-mentioned adhesive composite can be dissolved in the organic solvents such as toluene, ethyl acetate, above-mentioned surface treatment conducting particles is dispersed in the above-mentioned solution uses.In addition, also can from the solution that is dispersed with above-mentioned surface treatment conducting particles, remove and desolvate, make the shape of regulation, use formed body (film-shaped circuit connection material for example described later).
Fig. 4 is the constructed profile that shows an embodiment of film-shaped circuit connection material of the present invention.The film-shaped circuit connection material 1a that shows among Fig. 4 comprises adhesive composite, the surface treatment conducting particles 7a that contains above-mentioned free-radical polymerised compound and radical polymerization initiator.Utilize this membranaceous circuit connection material easily to operate, both can be easily positioned on the lining body, can easily carry out attended operation again.
In addition, film-shaped circuit connection material 1a also can make by when adhesive composite solidifies, and the Tg of adhesive composite (second-order transition temperature) difference is the multilayered structure (not shown) that the two or more layer more than 5 ℃ constitutes.
Film-shaped circuit connection material 1a for example can use apparatus for coating that adhesive composite is dissolved in the solvent, and the material after the surface treatment conducting particles disperses is coated on the supporting mass (PET (polyethylene terephthalate) film etc.), make adhesive composite not under the solidified temperature, carry out the warm air drying of specified time, manufacturing forms thus.
Preferred 10～50 μ m of the thickness of film-shaped circuit connection material.When the thickness of film-shaped circuit connection material during less than 10 μ m, circuit connection material tends to lack of fill between relative circuit block.In addition, when surpassing 50 μ m, be difficult to get rid of fully the adhesive composite between the clean circuit electrode, tend to be difficult to guarantee the conducting between circuit electrode.
The connection structure of circuit block
Fig. 5 is the constructed profile of an embodiment that shows the connection structure of circuit block of the present invention.As shown in Figure 5, the connection of the circuit block of present embodiment structure is provided with the relative first circuit block 20a and second circuit parts 30a mutually, between the first circuit block 20a and second circuit parts 30a, is provided with the circuit connecting section part 10a that connects.
The first circuit block 20a is provided with circuit substrate (first circuit substrate) 21b, be formed at circuit electrode (first circuit electrode) 22a on the interarea 21c of circuit substrate 21b.In addition, on the interarea 21c of circuit substrate 21b, according to circumstances also can form the insulation layer (not shown).
On the one hand, second circuit parts 30a is provided with circuit substrate (second circuit substrate) 31b, is formed at the circuit electrode (second circuit electrode) 32 on the interarea 31c of circuit substrate 31b.In addition, on the interarea 31c of circuit substrate 31b, according to circumstances also can form the insulation layer (not shown).
First and second circuit block 20a, 30a are not particularly limited so long as to have formed the material of the electrode that must be electrically connected just passable.Concrete example if any: that uses in the liquid-crystal display forms the glass of electrode or plastic base, printed wiring board, ceramic wiring plate, flexible wiring board, semi-conductor silicon chip etc. by ITO etc., and these can be used as required.As mentioned above, can use the material that constitutes based on organism such as printed wiring board and polyimide in the present embodiment, metal and ITO (indium tin oxide), the silicon nitride (SiN of copper, aluminium etc. X), silicon-dioxide (SiO 2) wait the circuit block with various condition of surface of inorganic class.
Circuit connecting section part 10a contains insulativity material 11a and surface treatment conducting particles 7a.Surface treatment conducting particles 7a is not between relative circuit electrode 22a and circuit electrode 32a, is configured between interarea 21c, the 31a yet.In the connection structure of circuit block, circuit electrode 22a, 32 is electrically connected by surface treatment conducting particles 7a.Just, surface treatment conducting particles 7a directly and circuit electrode 22a, 32 contact both sides.
In the connection structure of this circuit block, as mentioned above, relative circuit electrode 22a and circuit electrode 32a are electrically connected by surface treatment conducting particles 7a.For this reason, the connection resistance between circuit electrode 22a, the 32a reduces fully.Therefore, the electric current between circuit electrode 22a, 32a is unimpededly flowed, can bring into play the function that circuit has fully.
Circuit connecting section part 10a is because utilize the cured article of the circuit connection material that contains above-mentioned adhesive composite and surface treatment conducting particles to constitute, so at circuit block 20a, the circuit electrode 22a of 30a has enough low and stable connection resistance between the 32a.In addition, in circuit connecting section part 10a, obtain enough low and stable connection resistance, think that circuit connection material that present embodiment relates to has the reason of enough bonding strengths.
The manufacture method of the connection structure of circuit block
Below, the manufacture method that the connection of above-mentioned circuit block is constructed describes.
At first, prepare the above-mentioned first circuit block 20a and film-shaped circuit connection material 40a (with reference to Fig. 6 (a)).Film-shaped circuit connection material 40a makes circuit connection material membranaceous and forms, and film-shaped circuit connection material 40a is identical material with film-shaped circuit connection material 1a.Just, circuit connection material contains the above-mentioned free-radical polymerised compound and the adhesive composite of the radical polymerization initiator by adding the thermogenesis free radical at least.
Then, film-shaped circuit connection material 40a is loaded on the face of the circuit electrode 22a that is formed with the first circuit block 20a.In addition, under the situation of film-shaped circuit connection material 40a, the side of film-shaped circuit connection material 40a to the first circuit block 20a, is loaded on the first circuit block 20a attached to the supporting mass (not shown).At this moment, film-shaped circuit connection material 40a is a film like, easily operation., can easily film-shaped circuit connection material 40a be contained between the first circuit block 20a and the second circuit parts 30a for this reason, can easily carry out the attended operation of the first circuit block 20a and second circuit parts 30a.
Then, with arrow A a and the Ba direction pressurization of film-shaped circuit connection material 40a, make film-shaped circuit connection material 40a be connected the first circuit block 20a temporarily and go up (with reference to Fig. 6 (b)) along Fig. 6 (a).At this moment, also can limit heating edge pressurization.But Heating temperature is set at the adhesive composite solidified temperature not among the film-shaped circuit connection material 40a, just produces the low temperature of temperature of free radical than radical polymerization initiator.
Then, shown in Fig. 6 (c), 30a is installed on the film-shaped circuit connection material 40a with the second circuit parts, makes the second circuit electrode surface to the first circuit block 20a.In addition, film-shaped circuit connection material 40a attached to the supporting mass (not shown) on the time, make after supporting mass peels off, 30a is loaded on the film-shaped circuit connection material 40a with the second circuit parts.
Then, limit heating film-shaped circuit connection material 40a, the first and second circuit block 20a are passed through on the limit, 30 arrow A a and the pressurizations of Ba direction to Fig. 6 (c).At this moment Heating temperature is set at the temperature that radical initiator can produce free radical.Thus, in radical polymerization initiator, produce free radical, cause free-radical polymerised compound generation polymerization.Like this, film-shaped circuit connection material 40a is cured processing, carry out this connection, obtains the connection structure of circuit block shown in Figure 5.
Heating temperature for example is set at 90～200 ℃, and the tie-time is set at for example 1 second～10 minutes.Above-mentioned condition can suitably be selected according to the purposes, adhesive composite, the circuit block that use, also can after fixing according to condition.As mentioned above, film-shaped circuit connection material 40a is because have an above-mentioned formation, so can connect at low temperatures than the circuit connection material that contains Resins, epoxy etc.
As mentioned above, when making the connection structure of circuit block, in the connection structure of the circuit block that obtains, can make the relative circuit electrode 22a of surface treatment conducting particles 7a contact, the both sides of 32a, can reduce the connection resistance between circuit electrode 22a, the 32a fully.
In addition, by heating film-shaped circuit connection material 40a, distance between circuit electrode 22a and the circuit electrode 32a is reduced fully, adhesive composite is solidified, form insulativity material 11a, the first circuit block 20a is connected by circuit connecting section part 10a securely with second circuit parts 30a.Just, in the connection structure of the circuit block that obtains, circuit connecting section part 10a utilizes the cured article of above-mentioned circuit connection material to constitute because be, so the bonding strength of circuit connecting section relative circuit block 20a of part 10a or 30a is high especially, at circuit block 20a, obtain enough low connection resistance between circuit electrode 22a, the 32a of 30a.
In addition, in the above-described embodiment, adhesive composite uses the material contain at least by the radical polymerization initiator that adds the thermogenesis free radical, also can replace this radical polymerization initiator, uses and only carries out the radical polymerization initiator that rayed produces free radical.In this case, when film-shaped circuit connection material 40a is cured processing, can replaces heating and carry out rayed.In addition, in the above-described embodiment, use film-shaped circuit connection material 40a, make the connection structure of circuit block, also can replace film-shaped circuit connection material 40a, use circuit connection material.In this case, if circuit connection material is dissolved in the solvent, this solution coat on any one of the first circuit block 20a or second circuit parts 30a, is made its drying, can insert circuit connection material between 30 at the first and second circuit block 20a.
In addition, in the manufacture method of the connection of circuit block structure, except that utilizing heating or rayed to produce the radical polymerization initiator of free radical, also can use as required the radical polymerization initiator that utilizes ultrasonic wave, hertzian wave etc. to produce free radical.
In addition, except surface treatment conducting particles 7a, also can use other electro-conductive material.Other electro-conductive material for example has the compound that does not utilize intramolecularly to have nitrogen-silicon key to carry out the surface-treated conducting particles; The carbon of particle shape or staple fibre shape; The metal wires such as Ni line of plating Au etc.
Embodiment
Below, use embodiment to be described more specifically content of the present invention, the invention is not restricted to these embodiment.
Embodiment 1
With phenoxy resin (Union Carbide Co., Ltd. system, trade(brand)name PKHC, molecular-weight average 45,000) 50g is dissolved in the mixed solvent of toluene (110.6 ℃ of boiling points, SP value 8.90)/ethyl acetate (77.1 ℃ of boiling points, SP value 9.10) of mass ratio=50/50, obtains the phenoxy resin solution of solids component 40 quality %.
Free-radical polymerised compound uses dimethacrylate hydroxyethyl glycol ester (Kyoeisha Chemical Co., Ltd.'s system, trade(brand)name 80MFA) and dimethacrylate phosphoric acid ester (Kyoeisha Chemical Co., Ltd.'s system, trade(brand)name P-2M).
Silicon nitrogen silane compound (compound with nitrogen-silicon key) uses 1,3,5,7-tetrem thiazolinyl-1,3,5,7-tetramethyl cyclotetrasiloxane silazane (Chisso Co., Ltd. system).
Radical polymerization initiator uses two-2-ethylhexyl peroxy dicarbonate (NOF Corp's system, trade(brand)name パ-ロ ィ Le OPP).
On the surface of polystyrene for the particle of nuclear, use nickel as material, the nickel dam of thickness 0.2 μ m is set, in the outside of this nickel dam, use gold that the gold layer of thickness 0.04 μ m is set as material.Make the conducting particles of median size 5 μ m like this.
Ready material is cooperated according to the solids component mass ratio shown in the table 1, cooperate the conducting particles of 1.5 volume % again, make its dispersion.Use applying device to be coated on the fluorine resin film of thickness 80 μ m the solution that obtains,, obtain the film-shaped circuit connection material that thickness is 20 μ m thus 70 ℃ of following warm air dryings 10 minutes.The film-shaped circuit connection material that obtains at room temperature shows sufficient flexibility.
Table 1
Synergist S-421 95 Embodiment 1 Embodiment 2 Embodiment 3 Comparative example 1
Thermoplastic resin PKHC ???50 ???50 ???50 ???50
Free-radical polymerised compound 80MFA ???50 ???50 ???50 ???50
Light ester P-2M ???10 ???10 ???10 ???10
Radical polymerization initiator パ-ロィルOPP ???5 ???5 ???5 ???5
Silicon nitrogen silane compound 1,3,5,7-tetrem thiazolinyl-1,3,5,7-tetramethyl cyclotetrasiloxane silazane ???3 ???- ???- ???-
1,3-divinyl-1,3-phenylbenzene-1,3-dimethyl disilazane ???- ???3 ???- ???-
Poly-(1,2-dimethyl-silicon azane) ???- ???- ???3 ???-
Embodiment 2
Remove and use 1,3-divinyl-1,3-phenylbenzene-1,3-dimethyl disilazane (Chisso Co., Ltd. system) are as outside the silicon nitrogen silane compound, and other is same with embodiment 1, makes obtaining the film-shaped circuit connection material that thickness is 20 μ m.The film-shaped circuit connection material that obtains at room temperature shows enough flexibilities.
Embodiment 3
Remove and use poly-(1,2-dimethyl-silicon azane) (Chisso Co., Ltd. system) as outside the silicon nitrogen silane compound, other is same with embodiment 1, makes obtaining the film-shaped circuit connection material that thickness is 20 μ m.The film-shaped circuit connection material that obtains at room temperature shows enough flexibilities.
Comparative example 1
Except that not adding the silicon nitrogen silane compound, other is same with embodiment 1, makes obtaining the film-shaped circuit connection material that thickness is 20 μ m.Show enough flexibilities under the film-shaped circuit connection material room temperature that obtains.
Bonding strength and the mensuration that is connected resistance
At first, preparation have 500 live width 50 μ m, pitch 100 μ m, thickness 18 μ m copper circuit flexible wiring board (FPC substrate) and (be formed with the ito substrate of 0.2 μ m Indium sesquioxide (ITO) thin layer on thickness 1.1mm, surface resistivity 20 Ω/) at glass substrate.The film-shaped circuit connection material of configuration embodiment 1～3 and comparative example 1 uses thermo-compression bonding device (type of heating: constant hot type, Dongli Engineering Co., Ltd's system) between FPC substrate and ito substrate, 15 seconds of heating and pressurizing under 160 ℃, 3Mpa.At this moment, use the film-shaped circuit connection material of wide 2mm that the FPC substrate is connected with ito substrate, make the connection structure (ITO/FPC connects structure) of the circuit block of embodiment 1～3 and comparative example 1 like this.
After bonding, in 85 ℃ and hot and humid groove, keep 240 hours at once at 85%RH after, carry out after the hot and humid processing, the ITO/FPC that utilizes universal meter to measure embodiment 1～3 and comparative example 1 connect structure in abutting connection with the resistance value between circuit.Resistance value average (x+3 б) expression in abutting connection with 150 of the resistance between the circuit.What obtain the results are shown in table 2.
In addition,, utilize 90 degree to peel off method and measure the bonding strength that the ITO/FPC of embodiment 1～3 and comparative example 1 connects structure, estimate with reference to JIS-Z0237.Here, the determinator of bonding strength uses the system Tensilon UTM-4 of Japan Baldwin Co., Ltd. (peeling rate 50mm/min, 25 ℃).What obtain the results are shown in table 2.
Table 2
Project ITO/FPC connects the resistance value (Ω) of structure ITO/FPC connects the bonding strength (N/m) of structure ??SiN X/ FPC connects the bonding strength (N/m) of structure
After just bonding After the hot and humid processing After just bonding After the hot and humid processing After just bonding After the hot and humid processing
Embodiment
1 ????2.3 ????2.5 ????1000 ????800 ????500 ????300
Embodiment 2 ????2.2 ????2.6 ????950 ????750 ????450 ????200
Embodiment 3 ????2.8 ????2.2 ????900 ????770 ????550 ????150
Comparative example 1 ? ????2.8 ? ????8.9 ? ????800 ? ????700 ? ????500 ? ????0
Then, prepare to have 500 live width 50 μ m, pitch 100 μ m, thickness 18 μ m copper circuit flexible wiring board (FPC substrate) and on glass substrate (thickness 0.7mm), be formed with 0.5 μ m silicon nitride (SiN X) SiN of thin layer XSubstrate.At FPC substrate and SiN XThe film-shaped circuit connection material of configuration embodiment 1～3 and comparative example 1 uses thermo-compression bonding device (type of heating: constant hot type, Dongli Engineering Co., Ltd's system) between the substrate, 15 seconds of heating and pressurizing under 160 ℃, 3Mpa.At this moment, use the film-shaped circuit connection material of wide 2mm with FPC substrate and SiN XSubstrate connects, and makes the connection structure (SiN of the circuit block of embodiment 1～3 and comparative example 1 X/ FPC connects structure).
Utilize 90 degree to peel off method is measured embodiment 1～3 and comparative example 1 under above-mentioned device and condition SiN according to JIS-Z0237 X/ FPC connects the bonding strength of structure, estimates.With the table 2 that the results are shown in that obtains.
The film-shaped circuit connection material of embodiment 1～3 shows to have good connection resistance and bonding strength after bonding back and hot and humid processing.Relative therewith, in the comparative example 1, in adhesive composite, do not contain silicon nitrogen silane compound, connect resistance and show high value, particularly at SiN X/ FPC connects in the structure, does not have bonding force fully after the hot and humid processing, can not be met the connection structure of Practical Performance.In addition, embodiment 1～3 and comparative example 1 are first
The content that embodiment relates to.
Carried out the surface-treated conducting particles with compound with nitrogen-silicon key
At first, on the surface of polystyrene, use nickel, the nickel dam of thickness 0.2 μ m is set,, use gold that the gold layer of thickness 0.04 μ m is set as material in the outside of this nickel dam as material for the particle of nuclear.Make the conducting particles (conducting particles is untreated) of median size 5 μ m like this.
Then, in the mixing solutions of silicon nitrogen silane compound 1g and methyl ethyl ketone 10g, add the conducting particles of median size 5 μ m, stirred 5 minutes down at 30 ℃.Filter after the conducting particles, drying is 5 minutes under 80 ℃, obtains having carried out surface-treated conducting particles 1～3 by silicon nitrogen silane compound.In addition, silicon nitrogen silane compound uses surface treatment conducting particles 1:1,3,5,7-tetrem thiazolinyl-1,3,5,7-tetramethyl cyclotetrasiloxane silazane (Chisso Co., Ltd.), surface treatment conducting particles 2:1,3-divinyl-1,3-phenylbenzene-1,3-dimethyl disilazane (Chisso Co., Ltd.) and surface treatment conducting particles 3: poly-(1,2-dimethyl-silicon azane) (Chisso Co., Ltd.).
Embodiment 4
With phenoxy resin (Union Carbide Co., Ltd. system, trade(brand)name PKHC, molecular-weight average 45,000) 50g, be dissolved in the mixed solvent of toluene (110.6 ℃ of boiling points, SP value 8.90)/ethyl acetate (77.1 ℃ of boiling points, SP value 9.10) of mass ratio=50/50, obtain the phenoxy resin solution of solids component 40 quality %.
Free-radical polymerised compound uses dimethacrylate hydroxyethyl glycol ester (Kyoeisha Chemical Co., Ltd.'s system, trade(brand)name 80MFA) and dimethacrylate phosphoric acid ester (Kyoeisha Chemical Co., Ltd.'s system, trade(brand)name P-2M).
Radical polymerization initiator uses two-2-ethylhexyl peroxy dicarbonate (NOF Corp's system, trade(brand)name パ-ロ ィ Le OPP).
Ready material is as mentioned above cooperated according to the solids component mass ratio shown in the table 3, add surface treatment conducting particles 1, making its total amount that is dispersed into relative circuit connection material is 3 volume %.Use applying device to be coated on the fluorine resin film of thickness 80 μ m the solution that obtains,, thus, obtain the film-shaped circuit connection material that thickness is 20 μ m 70 ℃ of following warm air dryings 10 minutes.The film-shaped circuit connection material that obtains at room temperature shows sufficient flexibility.
Table 3
Embodiment 4 Embodiment 5 Embodiment 6 Comparative example 2
Thermoplastic resin PKHC ???50 ???50 ???50 ???50
Free-radical polymerised compound 80MFA ???50 ???50 ???50 ???50
Light ester P-2M ???10 ???10 ???10 ???10
Radical polymerization initiator パ-ロィルOPP ???5 ???5 ???5 ???5
Embodiment 5
Replace surface treatment conducting particles 1, use surface treatment conducting particles 2, in addition, other is identical with embodiment 4, obtains the film-shaped circuit connection material that thickness is 20 μ m.The film-shaped circuit connection material that obtains at room temperature shows sufficient flexibility.
Embodiment 6
Replace surface treatment conducting particles 1, use surface treatment conducting particles 3, remove in addition, other is identical with embodiment 4, obtains the film-shaped circuit connection material that thickness is 20 μ m.The film-shaped circuit connection material that obtains at room temperature shows sufficient flexibility.
Comparative example 2
Replace surface treatment conducting particles 1, do not use with silicon nitrogen silane compound and carry out surface-treated conducting particles (conducting particles is untreated), remove in addition, other is identical with embodiment 4, obtains the film-shaped circuit connection material of 20 μ m.The film-shaped circuit connection material that obtains at room temperature shows sufficient flexibility.
Bonding strength and the mensuration that is connected resistance
At first, preparation have 500 live width 50 μ m, pitch 100 μ m, thickness 18 μ m copper circuit flexible wiring board (FPC substrate) and (be formed with the ito substrate of 0.2 μ m Indium sesquioxide (ITO) thin layer on thickness 1.1mm, surface resistivity 20 Ω/) at glass substrate.The film-shaped circuit connection material of configuration embodiment 4～6 and comparative example 2 between FPC substrate and ito substrate (be untreated, width 2mm), use thermo-compression bonding device (type of heating: constant hot type, Dongli Engineering Co., Ltd's system), 15 seconds of heating and pressurizing under 160 ℃, 3Mpa.Then, use the film-shaped circuit connection material of embodiment 4～6 and comparative example 2, make the connection structure (ITO/FPC connects structure) of circuit block.
After bonding, at once the ITO/FPC that measures embodiment 4～6 and comparative example 2 with universal meter connect structure in abutting connection with the resistance value between circuit.Resistance value average (x+3 б) expression in abutting connection with 150 of the resistance between the circuit.What obtain the results are shown in table 4.
Table 4
ITO/FPC connects the resistance value (Ω) of structure ITO/FPC connects the bonding strength (N/m) of structure
Untreated film-shaped circuit connection material The open test film-shaped circuit connection material afterwards of placing Untreated film-shaped circuit connection material The open test film-shaped circuit connection material afterwards of placing
Embodiment 4 ??2.3 ??2.2 ??930 ??800
Embodiment 5 ??2.2 ??2.6 ??1000 ??850
Embodiment 6 ??2.5 ??2.8 ??950 ??770
Comparative example 2 ??2.8 ??8.9 ??800 ??700
In addition, with reference to JIS-Z0237, the ITO/FPC that the film-shaped circuit connection material that utilizes 90 degree to peel off method mensuration use embodiment 4～6 and comparative example 2 is made connects the bonding strength of structure.Here the determinator of bonding strength uses the system TensilonUTM-4 of Japan Baldwin Co., Ltd. (peeling rate 50mm/min, 25 ℃).What obtain the results are shown in table 4.
Open placement (preservation) test
In 35 ℃, the constant temperature and humidity cabinet of 60%RH, open (in the air) placed (open place (preservations) test) 5 hours with the film-shaped circuit connection material of embodiment 4～6 and comparative example 2.Use the open embodiment 4～6 after the test and the film-shaped circuit connection material of comparative example 2 placed, in addition, other is with above-mentioned identical, make embodiment 4～6 and comparative example 2 circuit block be connected structure (ITO/FPC connects structure).Measure same as described abovely the ITO/FPC that obtains connect structure in abutting connection with resistance value between circuit and bonding strength.What obtain the results are shown in table 4.
The film-shaped circuit connection material of embodiment 4～6 shows after just bonding and open the placement after the test, shows good connection resistance and bonding strength.Particularly in the connection structure of the circuit block of the film-shaped circuit connection material after having used open placement test, show that embodiment 4～6 has good connection resistance stability.Why embodiment 4～6 has good connection resistance stability, thinks because have sufficient adhesion strength.Relative therewith, the comparative example 2 that contains the conducting particles that is untreated shows after open placement test to have high connection resistance, shows that its stability that connects resistance is not enough.The stability that why connects resistance in comparative example 2 is not enough, think bonding strength not enough due to.In addition, embodiment 4～6 and comparative example 2 relate to the content of the 2nd embodiment.
Adhesive composite of the present invention has enough bonding strengths, particularly has good bonding strength under hot and humid (85 ℃, 85%RH) condition.In addition, adhesive composite of the present invention has high bonding strength for the surperficial at least lining body that is made of the inorganic materials based on metal, can the low temperature fast setting.
In addition, used the circuit connection material of adhesive composite of the present invention to be suitable for bonding circuit block (for example semiconductor element, liquid crystal display device), use the connection structure of the circuit block that described circuit connection material makes, its connection resistance is reduced fully, has good bonding strength (under the particularly hot and humid condition) reliability.In addition, the manufacture method of connection structure of utilizing the circuit block used described circuit connection material is because can the low temperature fast setting, thus can suppress detrimentally affect fully to circuit block, and can improve throughput capacity.
The circuit connection material that the 2nd embodiment of the present invention relates to has good connection resistance stability after preserving, can the low temperature fast setting, be suitable for circuit block (for example semiconductor element, liquid crystal display device), in addition, the circuit connection material that the 2nd embodiment of the present invention relates to connects the good stability of resistance after preservation, think to have the reason of enough bonding strengths.In addition, use the connection structure of the circuit block that such circuit connection material makes, make to connect resistance and reduced fully, and stable, the reliability of bonding strength is good.And, utilize to use the manufacture method of connection structure of the circuit block of above-mentioned circuit connection material, because can the low temperature fast setting, so can suppress detrimentally affect to circuit block fully, the while can be improved throughput capacity.

Claims (17)

1. an adhesive composite is characterized in that, contains free-radical polymerised compound, radical polymerization initiator and has the compound of nitrogen-silicon key.
2. adhesive composite as claimed in claim 1 is characterized in that, aforementioned compound with nitrogen-silicon key is a silicon nitrogen silane compound.
3. adhesive composite as claimed in claim 1 is characterized in that, aforementioned radical polymerization initiator is by rayed and/or adds the material of thermogenesis free radical.
4. adhesive composite as claimed in claim 1 is characterized in that, aforementioned relatively free-radical polymerised compound 100 mass parts contain the aforementioned radical polymerization initiator of 0.5～30 mass parts.
5. adhesive composite as claimed in claim 1 is characterized in that, aforementioned relatively free-radical polymerised compound 100 mass parts contain the aforementioned compound with nitrogen-silicon key of 0.5～20 mass parts.
6. a film like caking agent is characterized in that, the described adhesive composite of claim 1 is made film like and forms.
7. circuit connection material, it is used to make the second circuit parts that are formed with the second circuit electrode on the interarea of first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate and second circuit substrate, be connected making under aforementioned first circuit electrode and the state that aforementioned second circuit electrode is disposing relatively, it is characterized in that, contain the described adhesive composite of claim 1.
8. circuit connection material as claimed in claim 7 is characterized in that, also contains conducting particles, and the relative total amount of circuit connection material contains the aforementioned conducting particles of 0.1～30 volume %.
9. the connection of a circuit block is constructed, and this connection structure has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, making under the relative state that is disposing of aforementioned first circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks with aforementioned second circuit electrode; It is characterized in that the aforementioned circuit interconnecting piece is made of the cured article of the described circuit connecting section part of claim 7, aforementioned first circuit electrode and aforementioned second circuit electrode are electrically connected mutually.
10. circuit connection material, this connection material is used to make the second circuit parts that are formed with the second circuit electrode on the interarea of first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate and second circuit substrate, is connected making under aforementioned first circuit electrode and the state that aforementioned second circuit electrode is disposing relatively; It is characterized in that, contain adhesive composite, carried out the surface-treated conducting particles with compound with nitrogen-silicon key with free-radical polymerised compound and radical polymerization initiator.
11. circuit connection material as claimed in claim 10 is characterized in that, aforementioned compound with nitrogen-silicon key is a silicon nitrogen silane compound.
12. circuit connection material as claimed in claim 10 is characterized in that, aforementioned radical polymerization initiator is by rayed and/or adds the material of thermogenesis free radical.
13. circuit connection material as claimed in claim 10 is characterized in that, aforementioned relatively free-radical polymerised compound 100 mass parts contain the aforementioned radical polymerization initiator of 0.5～30 mass parts.
14. circuit connection material as claimed in claim 10 is characterized in that, the relative total amount of circuit connection material, and the compound that the usefulness that contains 0.1～30 volume % has aforementioned nitrogen-silicon key carried out the surface-treated conducting particles.
15. a film-shaped circuit connection material is characterized in that, the described circuit connection material of claim 10 is made film like and forms.
16. the connection of circuit block structure, this connection structure has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, making under the relative state that is disposing of aforementioned first circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks with aforementioned second circuit electrode; It is characterized in that, the aforementioned circuit interconnecting piece is made of the cured article of the described circuit connection material of claim 10, and aforementioned first circuit electrode and aforementioned second circuit electrode were electrically connected by carrying out the surface-treated conducting particles by the compound with aforementioned nitrogen-silicon key.
17. the manufacture method of the connection of circuit block structure, this connection structure has: first circuit block that is formed with first circuit electrode on the interarea of first circuit substrate; On the interarea of second circuit substrate, be formed with the second circuit parts of second circuit electrode; Be located between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, making under the relative state that is disposing of aforementioned first circuit electrode, make the interconnected circuit connecting section part of aforementioned first and second circuit blocks with aforementioned second circuit electrode; It is characterized in that, the circuit connection material described in the configuration claim 7 or 10 between the interarea of the interarea of aforementioned first circuit substrate and aforementioned second circuit substrate, by aforementioned first and second circuit blocks, heating and pressurization, solidification treatment aforementioned circuit connect material, aforementioned first circuit block is connected with aforementioned second circuit parts, makes the connection structure of circuit block thus.
CNB200510009016XA 2004-02-16 2005-02-16 Binding composition, electric circuit connecting material, electric component connecting structure and production thereof Expired - Fee Related CN1329470C (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP38859/2004 2004-02-16
JP2004038869A JP4655488B2 (en) 2004-02-16 2004-02-16 Circuit connection material, film-like circuit connection material using the same, circuit member connection structure, and manufacturing method thereof
JP38859/04 2004-02-16
JP38869/2004 2004-02-16
JP2004038859A JP4655487B2 (en) 2004-02-16 2004-02-16 Adhesive composition, film-like adhesive and circuit connecting material using the same, circuit member connecting structure, and manufacturing method thereof
JP38869/04 2004-02-16

Publications (2)

Publication Number Publication Date
CN1680507A true CN1680507A (en) 2005-10-12
CN1329470C CN1329470C (en) 2007-08-01

Family

ID=35067271

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB200510009016XA Expired - Fee Related CN1329470C (en) 2004-02-16 2005-02-16 Binding composition, electric circuit connecting material, electric component connecting structure and production thereof

Country Status (3)

Country Link
KR (1) KR20060041808A (en)
CN (1) CN1329470C (en)
TW (1) TW200538522A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103222076A (en) * 2010-11-18 2013-07-24 3M创新有限公司 Light emitting diode component comprising polysilazane bonding layer
CN103937405A (en) * 2013-01-18 2014-07-23 信越化学工业株式会社 Primer composition and optical semiconductor apparatus using same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3408301B2 (en) * 1993-12-16 2003-05-19 ミネソタ マイニング アンド マニュファクチャリング カンパニー Anisotropic conductive film
TW459032B (en) * 1998-03-18 2001-10-11 Sumitomo Bakelite Co An anisotropic conductive adhesive and method for preparation thereof and an electronic apparatus using said adhesive

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103222076A (en) * 2010-11-18 2013-07-24 3M创新有限公司 Light emitting diode component comprising polysilazane bonding layer
CN103222076B (en) * 2010-11-18 2017-10-27 3M创新有限公司 Include the Light emitting diode component of polysilazane bonding layer
CN103937405A (en) * 2013-01-18 2014-07-23 信越化学工业株式会社 Primer composition and optical semiconductor apparatus using same
CN103937405B (en) * 2013-01-18 2017-01-04 信越化学工业株式会社 Primer composition and optical semiconductor device using the same

Also Published As

Publication number Publication date
CN1329470C (en) 2007-08-01
TWI316080B (en) 2009-10-21
KR20060041808A (en) 2006-05-12
TW200538522A (en) 2005-12-01

Similar Documents

Publication Publication Date Title
CN109643662B (en) Chip bonding paste and semiconductor device
CN1214455C (en) Adhesive for circuit connection, circuit connection method using the same, and circuit connection structure
CN1723590A (en) Circuit connecting material, film-like circuit connecting material using the same, circuit member connecting structure, and method of producing the same
CN1230483C (en) Adhesive for bonding circuit members, circuit board, and method of producing same
CN100335582C (en) Wiring-connecting material and wiring-connected board production process using the same
KR101311681B1 (en) Connecting material and semiconductor device
TWI378745B (en)
CN1796453A (en) Anisotropic conductive film forming composition
CN1441448A (en) Electrode connection method and surface processing distribution panel and adhesive film used thereof
CN101037573A (en) Adhesive, method of connecting wiring terminals and wiring structure
CN1195035C (en) Adhesive for connecting anisotropic circuit, circuit board connection method and connector
JP7384168B2 (en) Semiconductor device manufacturing method and adhesive film for semiconductor wafer processing
CN1906265A (en) Circuit connection material, film-shaped circuit connection material using the same, circuit member connection structure, and manufacturing method thereof
JP2020109173A (en) Adhesive composition and connection body
US20160272854A1 (en) Adhesive for mounting electronic component and adhesive film for mounting flip chip
CN102206480A (en) Application of circuit-connecting material as circuit-connecting material
CN1680507A (en) Binding composition, electric circuit connecting material, electric component connecting structure and production thereof
CN113632219A (en) Thermally conductive composition and semiconductor device
CN1883938A (en) Multilayer anisotropic conductive film and process for preparing same
JP2006016580A (en) Adhesive composition, film adhesive and circuit-connecting material using the same, coupling structure of circuit member and production method thereof
WO2021153405A1 (en) Paste-like resin composition, highly heat conductive material, and semiconductor device
CN100335585C (en) Wiring-connecting material and process for producing circuit board with the same
CN1900195A (en) Adhesive agent for circuit member connection, circuit board and its producing method
TWI690580B (en) Adhesive composition, anisotropic conductive adhesive composition, circuit connecting material and connector
JPWO2017037951A1 (en) Adhesive composition, anisotropic conductive adhesive composition, circuit connection material and connector

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070801

Termination date: 20130216