CN1567076A - Process for restoring LCD containing foreign matter - Google Patents
Process for restoring LCD containing foreign matter Download PDFInfo
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- CN1567076A CN1567076A CN 03149064 CN03149064A CN1567076A CN 1567076 A CN1567076 A CN 1567076A CN 03149064 CN03149064 CN 03149064 CN 03149064 A CN03149064 A CN 03149064A CN 1567076 A CN1567076 A CN 1567076A
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- foreign matter
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Abstract
A mending method for LCD with foreign matters comprises the following: to provide a LCD with multiple picture element areas with at least one picture element electrode and a thin film transistor used to control the picture element electrode and the foreign matters in the picture element area; and to cut the picture element area with foreign matters in by laser to destroy the electrode on the cutting path to separate the area with foreign matters and other areas without foreign matters to repair electrically the LCD. So, the direct or indirect short circuit between the thin film transistor , signal line and scanning line in the picture element area can avoid the signal transmit the foreign matters through thin film electrode of the TFT side plate and flow to the color filter slice to form short circuit and result in line defect.
Description
Technical field
The present invention relates to a kind of reparation LCD (Liquid Crystal Display; LCD) method, the restorative procedure when particularly containing foreign matter in the pixel region of LCD and causing fleck defect (bright defect).
Background technology
LCD is to be material with the liquid crystal molecule, controls the arrangement of liquid crystal molecule by the variation of electric field, cause light cover or penetrating, form bright spot or dim spot, and on screen composing images and manifest color.The LCD bright state that when no power, is white in color, but Show Color and pattern after the energising.LCD is divided into two kinds: passive matrix type LCD (passive matrix LCD) and active-matrix formula LCD (active matrixLCD).Aspect passive matrix type LCD, the demonstration of each pixel determines the color that it is shown by the transistorized size of current of each beginning-of-line of transistor AND gate of each row terminal point, advantage be cheap, volume is little, it is very little that shortcoming is that scan speed reaches the visual angle slowly.Aspect active-matrix formula LCD, each pixel is switch separately, and scan speed is very fast.
The liquid crystal panel of active-matrix formula LCD is formed with 1,000,000 above transistor components, and is arranged in a plane by many liquid crystal displays, and a display unit is by three display unit＜R.G.B〉form.
In the process of making active-matrix formula LCD, may be because of fabrication error the origination point defective.Point defect has two kinds, and a kind of is fleck defect, and a kind of is DSD dark spot defect (dark defect).If the point defect number that comprises in a slice panel in allowed limits, can allow shipment.For instance, with regard to A level product, the summation of bright spot and DSD dark spot defect must not surpass 5 points.Yet, because human eyes responsive higher to bright spot is lower to the susceptibility of dim spot.Therefore, fleck defect all can be repaired into dim spot usually again, makes it not obvious.
Cause the reason of fleck defect, for example be present between thin film transistor (TFT) (TFT) substrate and the colored filter as foreign matter.Please refer to Fig. 1, label 10 is signal wire (signal line; SL), 20 is gate line (gate line; GL), 30 is pixel electrode, and 40 is foreign matter, and 60 is thin film transistor (TFT) (TFT) electrode.When foreign matter 40 is arranged in pixel electrode 30 zones, will cause pixel region can't have enough electric charges.For the position of the above-mentioned foreign matter of shows in detail more, please refer to Fig. 2, wherein label 40 is a foreign matter, 32 is the colored filter side, 34 is indium tin oxide (ITO) electrode, and 55 is thin film transistor (TFT) (TFT), and 45 is data line, the existence of foreign matter 40 will make signal be lost to colored filter 32 sides from TFT 55 sides, thereby form bright spot.
It is directly thin film transistor (TFT) or other repairing circuit of LCD electrically to be repaired that the above-mentioned LCD of general solution causes the method for fleck defect because of foreign matter exists, thereby with membrane electrode and signal wire or the direct or indirect short circuit of scanning linear, at this moment, voltage from signal wire or scanning linear will be lost to opposite side via foreign matter, just from the TFT side to colored filter, the situation of the line defect of, horizontal line vertical or cross line style with causing, and can't improve the problem that above-mentioned foreign matter produces bright spot.
Summary of the invention
In view of this, the invention provides a kind of method of repairing foreign matter in the LCD, it utilizes electrode zone and other electrode zone of not containing above-mentioned foreign matter that laser will be contained foreign matter to isolate, therefore when in pixel region, making the directly or indirectly electrical short circuit of thin film transistor (TFT), signal wire and scanning linear, can avoid signal to see through foreign matter and be lost to colored filter side (common electric voltage side) and form electrical short circuit and cause line defect, then with general electrical restorative procedure LCD reparation be got final product again via the membrane electrode of TFT substrate-side.
In order to realize above-mentioned purpose of the present invention, the invention provides the method that a kind of reparation contains the LCD of foreign matter, it comprises: a LCD is provided, this LCD has a plurality of pixel regions, each pixel region has a pixel electrode and a thin film transistor (TFT) at least, this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter is arranged in pixel region; With the profile of laser pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction along this foreign matter; And this LCD electrically repaired.
The LCD method that the present invention also provides a kind of reparation to contain foreign matter, this method comprises: a LCD is provided, this LCD has a plurality of pixel regions, each pixel region has a pixel electrode and a thin film transistor (TFT) at least, this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter be arranged in pixel region near or be overlapped in signal wire; Avoid this signal wire with laser along the profile of this foreign matter pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction; And this LCD electrically repaired.
The LCD method that the present invention also provides a kind of reparation to contain foreign matter, this method comprises: a LCD is provided, this LCD has a plurality of pixel regions, each pixel region has a pixel electrode and a thin film transistor (TFT) at least, this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter be arranged in pixel region near or be overlapped in scanning linear; Avoid scanning linear with laser along the profile of this foreign matter pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction; And this LCD electrically repaired.
In said method, be applicable to that laser of the present invention is not defined as particular types, can give an example as UV, YAG etc.Because above-mentioned use laser radiation LCD contains the zone of foreign matter, mainly be to isolate in order to electrode zone and other electrode zone that does not cover foreign matter that will cover foreign matter, be lost to the possibility that colored filter causes bright spot or line defect with truncated signal from the TFT side, so the kind of laser, the situation of visual board and application is done selection.In addition, the step of above-mentioned use laser can only be carried out at the thin film transistor (TFT) side, or carries out in the colored filter side, but also both carry out simultaneously, all can reach the effect of repairing LCD.
Description of drawings
Fig. 1 is the front elevation that contains foreign matter in the general LCD.
Fig. 2 shows the sectional view that contains foreign matter in the LCD.
Fig. 3 repairs the front elevation that contains the foreign matter method in the LCD according to the embodiment of the invention 1.
Fig. 4 repairs the sectional view that contains the foreign matter method in the LCD according to the embodiment of the invention 1.
Fig. 5 repairs the top view that LCD includes the method for foreign matter according to the embodiment of the invention 2.
Fig. 6 repairs the top view that LCD includes the method for foreign matter according to the embodiment of the invention 3.
Wherein:
10～signal wire; 20～scanning linear; 30～pixel electrode; 60～thin film transistor (TFT);
32～colored filter side; 34a～ITO electrode; 40～foreign matter; 50～laser light;
55～thin film transistor (TFT); 45～data line; 50b～laser scanning figure.
Embodiment
In order to allow above-mentioned purpose of the present invention, feature and advantage become apparent, cited below particularlyly go out preferred embodiment, and cooperate appended diagram, be described in detail below.
Because it is different that foreign matter is equipped with institute at the LCD meta, thus following examples 1～3 will be middle at foreign matter respectively at pixel region, explain near signal line side and near the situation of scanning linear side.
Embodiment 1
See also Fig. 3, it illustrates the pixel region synoptic diagram that contains foreign matter in the LCD.
At first, provide a LCD, this LCD is by many signal wires 10,10 and scanning linear 20,20, and is made of the zone institute that is defined as pixel region that every adjacent two signal wires and adjacent two scanning linears are constituted.Each pixel region has a pixel electrode 30 and a thin film transistor (TFT) 60 at least, and this thin film transistor (TFT) 60 is in order to controlling this pixel electrode 30, and a foreign matter 40 is arranged in this pixel region.Pixel electrodes is by transparency conducting film, for example is formed with indium tin oxide (indium tin oxide; ITO) film constitutes, and the thickness of this transparency conducting film is preferably 140nm.
Then, pixel electrode is carried out laser radiation, scan, form the figure shown in label 50a the profile cutting of pixel electrodes 30 along this foreign matter 40.Illustrate the above-mentioned location drawing that carries out laser step for clearer, please refer to the sectional view that contains foreign matter in the LCD shown in Figure 4.In Fig. 4, laser light 50 is cut with destruction the ITO electrode 34a of containing this foreign matter 40 around the foreign matter 40 and is positioned at electrode on the cutting path, thereby separates above-mentioned foreign matter and the electrode zone of not containing foreign matter contained.In the present embodiment, as shown in Figure 4, the substrate of colored filter side 32 and TFT side is carried out laser radiation simultaneously, also can reach same effect but only the substrate of colored filter side or TFT side is carried out laser.That is to say, the colored filter side or the TFT side that are positioned at the foreign matter both sides will be contained after the zone isolation of foreign matter by laser radiation, can reach thin film transistor (TFT) in making pixel region and signal wire or scanning linear directly or indirectly electrically during short circuit, avoid signal to see through foreign matter and be lost to colored filter side (common electric voltage side) and form electrical short circuit and cause line defect via the membrane electrode of TFT substrate-side.Contain regional 34a and other zone of not containing foreign matter 34 of foreign matter in the above-mentioned laser light 50a isolate pixels district this moment, thereby can then electrically repair with existing mode the TFT side, and can not cause the problem of line defect in the prior art.
Embodiment 2
Except the close as shown in Figure 5 signal wire in the position of foreign matter 40, all the other conditions are all identical with embodiment 1.
Because signal wire near signal wire 10, must be avoided when therefore scanning with laser in the position of above-mentioned foreign matter, only scans at the ITO electrode zone of containing foreign matter, above-mentioned laser scanning figure is shown in label 50b.Then with general known method the TFT side is electrically repaired again, thereby repair the fleck defect that contains foreign matter in the LCD.
Embodiment 3
Except the close as shown in Figure 6 scanning linear in the position of foreign matter 40, all the other conditions are all identical with embodiment 1.
Because scanning linear near scanning linear 20, must be avoided when therefore scanning with laser in the position of above-mentioned foreign matter, only scans at the ITO electrode zone of containing foreign matter in the pixel electrode, above-mentioned laser scanning figure is shown in label 50c.Then with general known method the TFT side is electrically repaired again, thereby repair the fleck defect that contains foreign matter in the LCD.
Repair the method that contains foreign matter in the LCD according to the present invention, can improve and directly LCD electrically be repaired in the prior art and cause directly or indirectly electrically short circuit to produce line defect, thereby repair the problem that has foreign matter in the LCD and cause brightness.
Though the present invention is described by preferred embodiment, so it is not in order to limit the present invention.Any those skilled in the art without departing from the spirit and scope of the invention, can change, so protection scope of the present invention is as the criterion when looking the scope that appended claim defines.
Claims (15)
1. a reparation contains the method for the LCD of foreign matter, and this method comprises:
One LCD is provided, and this LCD has a plurality of pixel regions, and each pixel region has a pixel electrode and a thin film transistor (TFT) at least, and this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter is arranged in pixel region;
With the profile of laser pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction along this foreign matter; And
This LCD is electrically repaired.
2. reparation as claimed in claim 1 contains the method for the LCD of foreign matter, and wherein, this foreign matter refers to cause the foreign matter of luminescent spot defect of liquid crystal display.
3. reparation as claimed in claim 1 contains the method for the LCD of foreign matter, and wherein, the step of using laser is thin film transistor (TFT) side or the colored filter side in LCD, or carry out simultaneously both sides.
4. reparation as claimed in claim 1 contains the method for the LCD of foreign matter, and wherein, this is electrically repaired is to carry out from the thin film transistor (TFT) side of this LCD.
5. reparation as claimed in claim 1 contains the method for the LCD of foreign matter, and wherein, this pixel electrode is an indium tin oxide.
6. a reparation contains the LCD method of foreign matter, and this method comprises:
One LCD is provided, and this LCD has a plurality of pixel regions, and each pixel region has a pixel electrode and a thin film transistor (TFT) at least, and this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter be arranged in pixel region near or be overlapped in signal wire;
Avoid this signal wire with laser along the profile of this foreign matter pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction; And
This LCD is electrically repaired.
7. reparation as claimed in claim 6 contains the method for the LCD of foreign matter, and wherein, this foreign matter is meant the foreign matter that causes luminescent spot defect of liquid crystal display.
8. reparation as claimed in claim 6 contains the method for the LCD of foreign matter, and wherein, the step of using laser is thin film transistor (TFT) side or the colored filter side in LCD, or carry out simultaneously both sides.
9. reparation as claimed in claim 6 contains the method for the LCD of foreign matter, and wherein, this is electrically repaired is to carry out from the thin film transistor (TFT) side of this LCD.
10. reparation as claimed in claim 6 contains the method for the LCD of foreign matter, and wherein, this pixel electrode is an indium tin oxide.
11. a reparation contains the LCD method of foreign matter, this method comprises:
One LCD is provided, and this LCD has a plurality of pixel regions, and each pixel region has a pixel electrode and a thin film transistor (TFT) at least, and this thin film transistor (TFT) is in order to controlling this pixel electrode, and this foreign matter be arranged in pixel region near or be overlapped in scanning linear;
Avoid scanning linear with laser along the profile of this foreign matter pixel region is cut, be positioned at electrode on the cutting path, and isolate the electrode zone of containing foreign matter and other does not contain the electrode zone of foreign matter in order to destruction; And
This LCD is electrically repaired.
12. reparation as claimed in claim 11 contains the method for the LCD of foreign matter, wherein, this foreign matter is meant the foreign matter that causes luminescent spot defect of liquid crystal display.
13. reparation as claimed in claim 11 contains the method for the LCD of foreign matter, wherein, the step of using laser is thin film transistor (TFT) side or the colored filter side in LCD, or carry out simultaneously both sides.
14. reparation as claimed in claim 11 contains the method for the LCD of foreign matter, wherein, this is electrically repaired is to carry out from the thin film transistor (TFT) side of this LCD.
15. reparation as claimed in claim 11 contains the method for the LCD of foreign matter, wherein, this pixel electrode is an indium tin oxide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03149064 CN1567076A (en) | 2003-06-20 | 2003-06-20 | Process for restoring LCD containing foreign matter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03149064 CN1567076A (en) | 2003-06-20 | 2003-06-20 | Process for restoring LCD containing foreign matter |
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| CN1567076A true CN1567076A (en) | 2005-01-19 |
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| CN 03149064 Pending CN1567076A (en) | 2003-06-20 | 2003-06-20 | Process for restoring LCD containing foreign matter |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100353222C (en) * | 2005-02-21 | 2007-12-05 | 广辉电子股份有限公司 | Manufacture of panel of liquid crystal displaying device |
| CN101018447B (en) * | 2006-02-10 | 2010-06-09 | 财团法人工业技术研究院 | Circuit base board, its encapsulation structure, and making method of the encapsulation structure |
| CN101706636B (en) * | 2007-07-05 | 2011-06-29 | 瀚宇彩晶股份有限公司 | Liquid crystal display (LCD) panel and remedying method thereof |
| CN102508329A (en) * | 2011-09-13 | 2012-06-20 | 友达光电股份有限公司 | Method for repairing damage of three-dimensional optical film and three-dimensional plane display adopting same |
| CN101109852B (en) * | 2006-07-21 | 2012-07-18 | 奇美电子股份有限公司 | Method for repairing pixel defect and image display system |
| CN102707463A (en) * | 2011-08-17 | 2012-10-03 | 京东方科技集团股份有限公司 | Method for repairing pixel bright spot |
| CN103698907A (en) * | 2013-09-18 | 2014-04-02 | 北京京东方光电科技有限公司 | Method for extracting foreign materials from liquid crystal panel |
| CN105810138A (en) * | 2016-06-01 | 2016-07-27 | 京东方科技集团股份有限公司 | Method for maintenance against display badness |
| CN107703657A (en) * | 2017-11-23 | 2018-02-16 | 武汉华星光电半导体显示技术有限公司 | Array base palte defect mending method |
| CN110021630A (en) * | 2017-12-29 | 2019-07-16 | 乐金显示有限公司 | Organic electroluminescence display device and method of manufacturing same and its manufacturing method |
| CN111816796A (en) * | 2020-06-16 | 2020-10-23 | 江苏亚威艾欧斯激光科技有限公司 | Short circuit repairing method and device for display substrate |
| CN111816797A (en) * | 2020-06-16 | 2020-10-23 | 江苏亚威艾欧斯激光科技有限公司 | Laser repairing device for display substrate |
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2003
- 2003-06-20 CN CN 03149064 patent/CN1567076A/en active Pending
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100353222C (en) * | 2005-02-21 | 2007-12-05 | 广辉电子股份有限公司 | Manufacture of panel of liquid crystal displaying device |
| CN101018447B (en) * | 2006-02-10 | 2010-06-09 | 财团法人工业技术研究院 | Circuit base board, its encapsulation structure, and making method of the encapsulation structure |
| CN101109852B (en) * | 2006-07-21 | 2012-07-18 | 奇美电子股份有限公司 | Method for repairing pixel defect and image display system |
| CN101706636B (en) * | 2007-07-05 | 2011-06-29 | 瀚宇彩晶股份有限公司 | Liquid crystal display (LCD) panel and remedying method thereof |
| CN102707463A (en) * | 2011-08-17 | 2012-10-03 | 京东方科技集团股份有限公司 | Method for repairing pixel bright spot |
| CN102508329A (en) * | 2011-09-13 | 2012-06-20 | 友达光电股份有限公司 | Method for repairing damage of three-dimensional optical film and three-dimensional plane display adopting same |
| CN103698907A (en) * | 2013-09-18 | 2014-04-02 | 北京京东方光电科技有限公司 | Method for extracting foreign materials from liquid crystal panel |
| CN103698907B (en) * | 2013-09-18 | 2016-04-06 | 北京京东方光电科技有限公司 | A kind of method of foreign matter in extract crystal panel |
| CN105810138A (en) * | 2016-06-01 | 2016-07-27 | 京东方科技集团股份有限公司 | Method for maintenance against display badness |
| WO2017206549A1 (en) * | 2016-06-01 | 2017-12-07 | 京东方科技集团股份有限公司 | Repair method for display defect |
| CN105810138B (en) * | 2016-06-01 | 2019-07-23 | 京东方科技集团股份有限公司 | Show undesirable method for maintaining |
| CN107703657A (en) * | 2017-11-23 | 2018-02-16 | 武汉华星光电半导体显示技术有限公司 | Array base palte defect mending method |
| CN110021630A (en) * | 2017-12-29 | 2019-07-16 | 乐金显示有限公司 | Organic electroluminescence display device and method of manufacturing same and its manufacturing method |
| CN110021630B (en) * | 2017-12-29 | 2023-06-16 | 乐金显示有限公司 | Organic electroluminescent display device and method of manufacturing the same |
| CN111816796A (en) * | 2020-06-16 | 2020-10-23 | 江苏亚威艾欧斯激光科技有限公司 | Short circuit repairing method and device for display substrate |
| CN111816797A (en) * | 2020-06-16 | 2020-10-23 | 江苏亚威艾欧斯激光科技有限公司 | Laser repairing device for display substrate |
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