CN1461023A - Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process - Google Patents

Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process Download PDF

Info

Publication number
CN1461023A
CN1461023A CN 03147880 CN03147880A CN1461023A CN 1461023 A CN1461023 A CN 1461023A CN 03147880 CN03147880 CN 03147880 CN 03147880 A CN03147880 A CN 03147880A CN 1461023 A CN1461023 A CN 1461023A
Authority
CN
China
Prior art keywords
temperature
ceramic capacitor
dielectric material
sintering
cao
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN 03147880
Other languages
Chinese (zh)
Inventor
王晓慧
陈仁政
文海
李龙土
桂治轮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Original Assignee
Tsinghua University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University filed Critical Tsinghua University
Priority to CN 03147880 priority Critical patent/CN1461023A/en
Publication of CN1461023A publication Critical patent/CN1461023A/en
Pending legal-status Critical Current

Links

Images

Abstract

The present invention discloses a superfine temp.-stabilized multi-layer ceramic capacitor dielectric material and its sintering process. The material contains main component BaTiO3 and secondary additive CaO, CaTiO3, BaO, SiO2, SrO, MnO2, MgO, Co2O3, Co3O4, Fe2O3 and Y2O3 and one kind of more than one kind of rare earth oxide. Said invention adopts "two-stage" type microcrystalline control technique sintering process and utilizes the above-mentioned materials to obtain the temp.-stabilized type (including XTR and X5R) MLCC antireduction dielectric material with excellent performance. The invention is suitable for producing multi-layer ceramic capacitor with large capacity and superthin dielectric layer.

Description

Ultra-fine temperature-stable multilayer ceramic capacitor dielectric material and sintering process thereof
Technical field
The invention belongs to field of capacitor material technology, particularly a kind of ultra-fine temperature-stable multilayer ceramic capacitor dielectric material and sintering process thereof.
Background technology
High speed development along with mobile electronic devices such as polytype electronic equipment such as digital camera, mobile phone, notebook computer, palmtop PCs, miniaturization and the lightness trend that is inevitable, the components and parts that constitute these electronic equipments also must reduce volume and weight, change the needs of surface mounting technology (SMD) into the mounting technique that adapts to electronic component, the components and parts that surface mounting technology requires are chip components and parts.Multilayer ceramic capacitor is a most widely used class in the chip component.Multilayer ceramic capacitor (Multilayer Ceramic Capacitors) is called for short MLCC.It is that electrode material is replaced in parallel being superimposed together with ceramic body with multilayer, and burns till an integral body simultaneously.According to the international EIA of Electronic Industries Association (Electronic IndustriesAssociation) standard: temperature stabilization X7R type MLCC is meant that the capacitance with 25 ℃ is a benchmark, within the scope of from-55 to+125 ℃ of temperature, temperature coefficient of capacitance≤± 15%, dielectric loss (DF)≤2.5%; Temperature stabilization X5R type MLCC is meant that the capacitance with 25 ℃ is a benchmark, within the scope of from-55 to+85 ℃ of temperature, and temperature coefficient of capacitance≤± 15%, dielectric loss (DF)≤2.5%.Temperature-stable MLCC divides two big classes by forming: a class is made up of leaded ferroelectric, and is another kind of with BaTiO 3The ferroelectric of the non-plumbous system of base is formed.And the latter is because environmentally safe, and mechanical strength and reliability be better than the former, and therefore non-lead is BaTiO 3Base temperature-stable MLCC has broad application prospects.
When the multilayer ceramic capacitor that with the barium titanate is base during sintering, needs to use noble metals (Pt, Au, Pd metal and alloy thereof etc.) as interior electrode in air.The cost of electrode is 30%~70% of a multilayer ceramic capacitor production cost in the noble metal.Therefore use noble metal to become the obstacle that reduces the MLCC cost as interior electrode.Based on the consideration that reduces cost, base metals such as use such as Ni, Fe, Co, Cu and alloy thereof are as the interior electrode of MLCC, but, therefore lose effect as interior electrode when these base-metal inner-electrodes under the sintering condition oxidation can take place in the conventional air of dielectric ceramic material.In order to prevent the oxidation of base-metal inner-electrode in sintering process, must use neutrality or reducing atmosphere.To guarantee that simultaneously the barium titanate based dielectric pottery does not become semiconductor behind sintering under neutrality or the reducing atmosphere, and enough insulation resistances and superior dielectric properties are arranged.Generally dielectric layer and interior electrode mutual superposition are formed green compact, then by N 2, H 2Under the reducing atmosphere that produces with steam, in 1200 ℃~1400 ℃ temperature range, carry out sintering, under 1000 ℃~1100 ℃ temperature, have 10 then -8Anneal in the atmosphere of the above partial pressure of oxygen of Pa,, add upper end electrode afterwards to improve the breakdown characteristics of pottery.At present, at Japan Patent JP-A-63-103861, ceramic material basic composition is BaTiO 3-MnO-MgO-rare earth oxide.The insulation resistance of this composition and dielectric temperature coefficient are influenced by the grain size of barium titanate major ingredient, therefore are difficult to form the dielectric property that obtain temperature stabilization by control material.At U.S. Pat-005403797A, the basic composition of ceramic material is BaTiO 3-Y 2O 3-MgO-V 2O 5This composition satisfies the X7R performance requirement substantially, and room temperature dielectric constant is more than 2500, but sintering temperature is too high, greater than 1350 ℃; The dielectric temperature coefficient is bigger, at-55 ℃ approaching-15%; Loss is bigger, substantially all is higher than 2.0%.Therefore be not suitable for large-scale production.
In addition, along with electronic devices and components miniaturization, high performance growth requirement, base metal inner electrode multilayer ceramic capacitor also develops to big capacity, superthin layer direction.The medium thickness in monolayer constantly reduces, and drops to 5 μ m from 10 μ m, 2 μ m even thinner.This just proposes higher requirement to the ceramic medium material crystallite dimension, and for guaranteeing the reliability of device, the ceramic crystalline grain size also will be reduced to 500 nanometers from 1000 nanometers accordingly, 200 nanometers and even littler, and require the size of ceramic crystalline grain even.But the reduction that reduces often to cause dielectric constant of crystallite dimension, in U.S. Pat 6,270, among the 9906B1, when the ceramic crystalline grain size was reduced to the 100-200 nanometer, dielectric constant was 1600~1800, all is lower than 2000.Therefore, composition, structure and sintering process how to control ceramic medium material is problem to be solved by this invention to obtain thin crystalline substance, epigranular and high performance MLCC material with the requirement of satisfying big capacity, superthin layer base metal inner electrode multilayer ceramic capacitor.
Summary of the invention
It is easy to the purpose of this invention is to provide a kind of preparation technology, and it is simply adjustable to fill a prescription, and sintering process is easily controlled, and has the temperature-stable base metal inner electrode multilayer ceramic capacitor dielectric material and the sintering process of high dielectric constant nanometer/sub-micron crystal.
A kind of ultra-fine temperature-stable multilayer ceramic capacitor dielectric material that the present invention proposes, this material mainly is made up of barium titanate major ingredient and secondary additive, it is characterized in that: described major ingredient BaTiO 3Shared molal quantity is 94~99% in prescription; The consumption of described secondary additive accounts for 1~6mol% of total amount of material.
In above-mentioned dielectric material, the crystallite dimension of described major ingredient barium titanate is less than 500nm;
Described secondary additive comprises CaTiO 3, CaO, BaO, SiO 2, SrO, MnO 2, MgO, Co 2O 3, Co 3O 4, Fe 2O 3, Y 2O 3And one or more rare earth oxide Re 2O 3And the presoma of these oxides, the mole proportioning of described each material is: CaTiO 3: 0~1mol%; CaO:0~3mol%; BaO:0.01~2mol%; SiO 2: 0.1~5mol%; SrO:0~2mol%; MnO 2: 0.01~3mol%; MgO:0~2mol%; Co 2O 3: 0~2mol%; Co 3O 4: 0~1mol%; Fe 2O 3: 0~1mol%; Y 2O 3: 0~4mol%; Re 2O 3: 0~4mol%;
The presoma of described oxide comprises carbonate, hydroxide, oxalates, acetate, nitrate, citrate and alkoxide;
Described rare earth oxide Re 2O 3Middle Re representative: lanthanide series lanthanum, cerium, praseodymium, neodymium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, lutetium;
SiO in the described secondary additive 2, BaO, CaO and CaTiO 3A part be with the form of glassy state as additive, (Ba ACa (1-A)O) x(Si BTi (1-B)O 2), 0≤A wherein, B≤1,0.9≤x≤1.1 account for 0~3wt% of ceramic weight;
Described frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) be with SiO 2, BaO, CaO and CaTiO 3Or presoma mixes according to the proportioning of A, B, x accordingly, what calcining obtained under 800~1200 ℃ then;
To mix the back with the mode of solution and major ingredient dry for oxide precursor in the described secondary additive, and the calcination processing temperature is less than 1100 ℃, and ball milling in addition.
The sintering process of the ultra-fine temperature-stable multilayer ceramic capacitor dielectric material that the present invention proposes, it is characterized in that: the sintering densification process of green compact is divided into two stages: the phase I, in temperature T 1Down, of short duration insulation 0~30 minute cools to the second stage temperature T then rapidly 2Under be incubated 1~6 hour, 1100 ℃≤T wherein 2<T 1≤ 1350 ℃, T 1Compare T 2High 10~250 ℃, from T 1To T 2Temperature fall time between 0~60 minute; The atmosphere of described phase I and second stage all is controlled at 10 -6~10 -12Pa under 900~1100 ℃ temperature, has 10 then -3~10 -8Anneal annealing time 0.5~4 hour in the atmosphere of Pa partial pressure of oxygen.
According to material compositing formula of the present invention, can under 1100 ℃~1350 ℃ temperature, adopt " two-part " novel sintered technology and normal sintering to prepare the temperature-stable of excellent performance (X7R and X5R type) the anti-reducing material of MLCC.Its room temperature dielectric constant can be controlled between 2000~4000, satisfies X7R and X5R performance requirement, and temperature coefficient of capacitance is little, and dielectric loss is little, and material homogeneity is good.And has high insulation resistivity, stable performance.And the uniform crystal particles of material, the ceramic crystalline grain size is below 500 nanometers, and minimum can be controlled at about 100 nanometers.Be applicable to the base metal inner electrode multilayer ceramic capacitor of producing big capacity, ultra-thin dielectric layer (medium thickness is less than 10 μ m).
Description of drawings
Fig. 1 is the characteristic curve that the dielectric constant with temperature of embodiment 1 sample changes;
Fig. 2 is the temperature variant curve of temperature coefficient of capacitance of embodiment 1 sample;
Fig. 3 is the stereoscan photograph of the sintering rear surface pattern of embodiment 1 sample;
Fig. 4 is the characteristic curve that the dielectric constant with temperature of embodiment 2 samples changes;
Fig. 5 is the temperature variant curve of temperature coefficient of capacitance of embodiment 2 samples;
Fig. 6 is the stereoscan photograph of the sintering rear surface pattern of embodiment 2 samples;
Fig. 7 is the characteristic curve that the dielectric constant with temperature of embodiment 3 samples changes;
Fig. 8 is the temperature variant curve of temperature coefficient of capacitance of embodiment 3 samples;
Fig. 9 is the stereoscan photograph of the sintering rear surface pattern of embodiment 3 samples;
Figure 10 is the characteristic curve that the dielectric constant with temperature of embodiment 4 samples changes;
Figure 11 is the temperature variant curve of temperature coefficient of capacitance of embodiment 4 samples;
Figure 12 is the stereoscan photograph of the sintering rear surface pattern of embodiment 4 samples.
Embodiment
The present invention is that a kind of preparation technology is easy, and it is simply adjustable to fill a prescription, and sintering process is easily controlled, and has the nanometer/sub-micron crystal temperature temperature mode base metal inner electrode multilayer ceramic capacitor dielectric material of high dielectric constant, and it is by the barium titanate BaTiO of granularity less than 500nm 3The shared molal quantity of major ingredient be 94~99% and the consumption of secondary additive account for 1~6mol% of total amount of material.Its secondary additive comprises CaTiO 3, CaO, BaO, SiO 2, SrO, MnO 2, MgO, Co 2O 3, Co 3O 4, Fe 2O 3, Y 2O 3And one or more rare earth oxide Re 2O 3And the presoma of these oxides (comprising carbonate, hydroxide, oxalates, acetate, nitrate, citrate and corresponding alkoxide etc.).Described each material mixture ratio is (in mole): CaTiO 3: 0~1mol%; CaO:0~3mol%; BaO:0.01~2mol%; SiO 2: 0.1~5mol%; SrO:0~2mol%; MnO 2: 0.01~3mol%; MgO:0~2mol%; Co 2O 3: 0~2mol%; Co 3O 4: 0~1mol%; Fe 2O 3: 0~1mol%; Y 2O 3: 0~4mol%; Re 2O 3: 0~4mol%.
Above-mentioned rare earth oxide Re 2O 3Middle Re representative: lanthanide series lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium (Nd), samarium (Sm), europium (Eu), gadolinium (Gd), terbium (Tb), dysprosium (Dy), holmium (Ho), erbium (Er), thulium (Tm), ytterbium (Yb), lutetium (Lu).
It is dry that mode that the presoma of oxide can solution in the above-mentioned secondary additive and major ingredient mix the back, and the calcination processing temperature is less than 1100 ℃, and ball milling in addition.
SiO in the above-mentioned secondary additive 2, BaO, CaO and CaTiO 3A part be with the form of glassy state as additive, (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) (0≤A, B≤1,0.9≤x≤1.1), account for 0~3wt% of ceramic weight.This frit is with SiO 2, BaO, CaO and CaTiO 3Or presoma (comprising carbonate, hydroxide, oxalates, acetate, nitrate, citrate and corresponding alkoxide etc.) mixes according to the proportioning of A, B, x accordingly, what calcining obtained under 800~1200 ℃ then.
The concrete processing step of making MLCC is as follows:
1. the major ingredient barium titanate being mixed with additive, is medium with water, ball milling 2~48 hours;
2. oven dry: under 70~130 ℃ of temperature, dry;
3. curtain coating becomes dielectric layer: medium thickness is 10 μ m or below the 10 μ m;
4. with base-metal inner-electrode layer mutual superposition, produce green compact;
5. binder removal: about 300 ℃, in the air, be incubated about 20 hours; If be higher than 300 ℃ of dump temperatures, can use nitrogen protection;
6. green compact sintering under reducing atmosphere: feed N in the sintering process 2/ H 2, humidification is controlled at 10 with partial pressure of oxygen simultaneously -8~10 -12In the scope of MPa, can adopt normal sintering and two-part sintering: (a) " two-part " sintering refers to that two stages are experienced in the densification of green compact, in advance at T 1Under the temperature, of short duration insulation 0~30 minute cools to T then 2Temperature continues to be incubated a few hours, reaches complete densification, wherein T 1>T 2(1100≤T 2<T 1≤ 1350 ℃); (b) normal sintering refers to that green sintering is T at a certain temperature 1(1100~1350 ℃) directly are incubated a few hours and finish densification process.
7. anneal under the weak oxide condition: furnace temperature is incubated 0.5~4 hour at 900 ℃~1100 ℃, and partial pressure of oxygen is controlled at 10 -3~10 -8In the scope of Pa;
8. be cooled to room temperature;
9. termination electrode technology: termination electrode is Cu or Ag, and furnace temperature is incubated about 1 hour at 600 ℃~850 ℃, and nitrogen protection behind the natural cooling, obtains promptly that electrode is the multi-layer ceramic capacitance dielectric material of base metal in nanometer/sub-micron crystal temperature-stable.The present invention will be further described below in conjunction with embodiment:
Embodiment 1
Earlier according to BaTiO 3: 96.4mol%; (grain size is 30nm) CaTiO 30.5mol%; CaO:0.4mol%; SiO 20.6mol%; SrO:0.10mol%; MnO 2: 0.25mol%; MgO:0.5mol%; Co 2O 3: 0.25mol%; Y 2O 3: the weighing of 1.0mol% proportioning.And then adding frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) (A=0.4, B=0.9 x=1.0), account for the 1wt% of above-mentioned batch mixing.Above-mentioned material is mixed, ball milling, dry then.This porcelain casting film-forming sheet with the stack of Ni electrode, is made the MLCC green compact, behind the binder removal, adopts " two-part " sintering (to feed N in the sintering process under reducing atmosphere 2/ H 2, humidification is controlled at 10 with partial pressure of oxygen simultaneously -10Atm is warmed up to 1200 ℃ with 200 ℃/hour speed, is incubated 5 minutes, cools to 1100 ℃ again, and temperature retention time is 2 hours), annealing under the weak oxide condition then, (furnace temperature is incubated 3 hours at 1000 ℃, and partial pressure of oxygen is controlled to be 10 -5Atm).Add Cu termination electrode (furnace temperature is incubated 1 hour, nitrogen protection at 700 ℃) afterwards.Multilayer ceramic capacitor is carried out performance test, and the dielectric property parameter sees Table one.What the curve of Fig. 1 provided is the characteristic curve of the dielectric constant with temperature variation of present embodiment sample, and Fig. 2 provides the temperature variant curve of rate of change of capacitance of sample.Fig. 3 is the stereoscan photograph of sample at sintering rear surface pattern, and ceramic crystalline grain is spherical, and epigranular, crystallite dimension are about 110 nanometers.
Table 1
Sample Sintering condition Dielectric constant ??TCC(%) Dielectric constant (25 ℃) Dielectric constant ??TCC(%) ??tgδ(%) ???(25℃) ???ρ 25℃??(Ω·cm) ?E B,25℃?(kV/mm)
?????-55℃ ???????125℃
????1 " two-part " (1200 ℃/5 minutes, 1100 ℃/2 hours) ?1761 ??-13.9 ??2046 ??1788 ??-12.6 ??0.56 ??46.2× ????10 12 ??8.15
Embodiment 2
Earlier according to BaTiO 3: 95.2mol%; (grain size is 200nm) CaTiO 3: 0.7mol%; CaO:0.4mol%; SiO 2: 0.8mol%; SrO:0.3mol%; MnO 2: 0.3mol%; MgO:0.3mol%; Co 2O 3: 0.2mol%; Y 2O 3: 0.8mol%; Lu 2O 3: the weighing of 1.0mol% proportioning.And then adding frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) (A=0.5, B=0.8 x=1), account for the 1.5wt% of above-mentioned batch mixing.Above-mentioned material is mixed, ball milling, dry then.This porcelain casting film-forming sheet with the stack of Ni electrode, is made the MLCC green compact, and behind the binder removal, sintering under reducing atmosphere (feeds N in the sintering process 2/ H 2, humidification is controlled at 10 with partial pressure of oxygen simultaneously -9Atm is warmed up to 1220 ℃ with 200 ℃/hour speed, and temperature retention time is 2 hours), annealing under the weak oxide condition then, (furnace temperature is incubated 4 hours at 1100 ℃, and partial pressure of oxygen is controlled to be 10 -5Atm).Add Cu termination electrode (furnace temperature is incubated 1 hour, nitrogen protection at 700 ℃) afterwards.Multilayer ceramic capacitor is carried out performance test, satisfy the X7R requirement, the dielectric property parameter sees Table two.What the curve of Fig. 4 provided is the characteristic curve of the dielectric constant with temperature variation of present embodiment sample, and Fig. 5 provides the temperature variant curve of rate of change of capacitance of sample.Fig. 6 is the surface topography stereoscan photograph behind this sample sintering, and crystallite dimension is about 200 nanometers.
Table 2
Sample Sintering condition Dielectric constant TCC(%) Dielectric constant (25 ℃) Dielectric constant ???TCC(%) tgδ(%) ?(25℃) ??ρ 25℃??(Ω·cm) ??E B25℃??(kV/mm)
??????-55℃ ???????125℃
??2 1220 ℃/2 hours 1895 ?-9.6 ?2097 ??2088 ????-0.4 ??0.92 ??15.5×10 12 ???8.21
Embodiment 3
Earlier according to BaTiO 3: 95mol%; (grain size is 300nm) CaTiO 30.5mol%; CaO:0.5mol%; SiO 20.8mol%; SrO:0.2mol%; MnO 2: 0.5mol%; MgO:0.5mol%; Co 2O 3: 0.4mol%; Y 2O 3: 0.8mol%; Er 2O 3: the weighing of 0.8mol% proportioning.And then adding frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) (A=0.6, B=0.8 x=1.1), account for the 2wt% of above-mentioned batch mixing.Above-mentioned material is mixed, ball milling, dry then.This porcelain casting film-forming sheet with the stack of Ni electrode, is made the MLCC green compact, behind the binder removal, adopts " two-part " sintering (to feed N in the sintering process under reducing atmosphere 2/ H 2, humidification is controlled at 10 with partial pressure of oxygen simultaneously -10Atm is warmed up to 1250 ℃ of insulations 0 minute with 200 ℃/hour speed, and cooling to 1200 ℃ of temperature retention times again is 2 hours), annealing under the weak oxide condition then, (furnace temperature is incubated 4 hours at 1000 ℃, and partial pressure of oxygen is controlled to be 10 -5Atm).Add Cu termination electrode (furnace temperature is incubated 1 hour, nitrogen protection at 700 ℃) afterwards.Multilayer ceramic capacitor is carried out performance test, satisfy the X5R requirement, the dielectric property parameter sees Table five.What the curve of Fig. 7 provided is the characteristic curve of the dielectric constant with temperature variation of present embodiment sample, and Fig. 8 provides the temperature variant curve of rate of change of capacitance of sample.Fig. 9 is the surface topography stereoscan photograph behind this sample sintering, and the ceramic crystalline grain size is about 350 nanometers.
Table 3
Sample Sintering condition Dielectric constant TCC(%) Dielectric constant (25 ℃) Dielectric constant ??TCC(%) tgδ(%) (25℃) ρ 25℃(Ω·cm) ??E B25℃??(kV/mm)
??????-55℃ ???????85℃
??3 " two-part " 1250 ℃/0 minute 1200 ℃/2 hours ?3719 ??-5.88 ??3950 ??3554 ???-10.0 ??0.78 25.0×10 12 ???6.92
Embodiment 4
Earlier according to BaTiO 3: 95mol%; (grain size is 450nm) CaTiO 3: 0.7mol%; CaO:0.4mol%; SiO 2: 0.7mol%; SrO:0.3mol%; MnO 2: 0.5mol%; MgO:0.4mol%; Co 2O 3: 0.2mol%; Y 2O 3: 0.7mol%; Gd 2O 3: the weighing of 1.1mol% proportioning.And then adding frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) (A=0.5, B=0.9 x=1.1), account for the 2.5wt% of above-mentioned batch mixing.Above-mentioned material is mixed, ball milling, dry then.This porcelain casting film-forming sheet with the stack of Ni electrode, is made the MLCC green compact, and behind the binder removal, sintering under reducing atmosphere (feeds N in the sintering process 2/ H 2, humidification is controlled at 10 with partial pressure of oxygen simultaneously -9Atm is warmed up to 1280 ℃ with 200 ℃/hour speed, and temperature retention time is 2 hours), annealing under the weak oxide condition then, (furnace temperature is incubated 4 hours at 1100 ℃, and partial pressure of oxygen is controlled to be 10 -5Atm).Add Cu termination electrode (furnace temperature is incubated 1 hour, nitrogen protection at 700 ℃) afterwards.Multilayer ceramic capacitor is carried out performance test, satisfy the X7R requirement, the dielectric property parameter sees Table four.What the curve of Figure 10 provided is the characteristic curve of the dielectric constant with temperature variation of present embodiment sample, and Figure 11 provides the temperature variant curve of rate of change of capacitance of sample.Figure 12 is the surface topography stereoscan photograph behind this sample sintering, and ceramic crystalline grain is of a size of 500 nanometers.
Table 4
Sample Sintering condition Dielectric constant TCC(%) Dielectric constant (25 ℃) Dielectric constant TCC(%) tgδ(%) (25℃) 25℃?(Ω·cm) ??E B25℃??(kV/mm)
??????-55℃ ??????125℃
??4 1280 ℃/2 hours 2771 ??-10.6 ??3100 ??3503 ??13 ??0.71 14.9×10 12 ???7.78
The foregoing description has prepared nanometer, sub-micron crystal barium phthalate base base-metal inner-electrode MLCC porcelain that satisfied temperature stable type X7R and X5R type performance index require in 1100~1350 ℃ temperature range.The room temperature dielectric constant of MLCC can be controlled between 2000 to 4000, and temperature coefficient of capacitance is less than ± 15%, and dielectric loss is less than 2.5%.Insulation resistivity is about 10 13Ω cm, puncture voltage is greater than 5KV/mm.Utilize prescription of the present invention and sintering process, it is low to obtain sintering temperature, and structure and performance are adjustable, and sintering range is wide, stability and the good barium phthalate base temperature-stable MLCC material of reproducibility.And the uniform crystal particles of material, grain size can be controlled in the scope of 100nm~500nm.Can be applied to big capacity, superthin layer (medium thickness is less than 10 μ m) multilayer ceramic capacitor, be a kind of MLCC material with wide application prospect.
Above-mentioned Fig. 1~Figure 12 is corresponding to the temperature variant curve of temperature characteristics, rate of change of capacitance of each sample dielectric constant of embodiment 1~4 and the stereoscan photograph of sintering rear surface pattern.Probe temperature is-60 ℃~+ 130 ℃.
The meaning of each parameter representative is as follows in table 1~table 4: TCC (55 ℃): temperature coefficient of capacitance in the time of-55 ℃; TCC (125 ℃): temperature coefficient of capacitance in the time of 125 ℃; Tg δ (25 ℃): dielectric loss during room temperature; TCC (T) %=100 * (ε (T)-ε (25 ℃))/ε (25 ℃): temperature coefficient of capacitance.

Claims (9)

1, ultra-fine temperature-stable multilayer ceramic capacitor dielectric material, this material mainly is made up of barium titanate major ingredient and secondary additive, it is characterized in that: described major ingredient BaTiO 3Shared molal quantity is 94~99% in prescription; The consumption of described secondary additive accounts for 1~6mol% of total amount of material.
2, dielectric material according to claim 1 is characterized in that: the crystallite dimension of described major ingredient barium titanate is less than 500nm.
3, according to the described dielectric material of claim 1, it is characterized in that: described secondary additive comprises CaTiO 3, CaO, BaO, SiO 2, SrO, MnO 2, MgO, Co 2O 3, Co 3O 4, Fe 2O 3, Y 2O 3And one or more rare earth oxide Re 2O 3And the presoma of these oxides, the mole proportioning of described each material is: CaTiO 3: 0~1mol%; CaO:0~3mol%; BaO:0.01~2mol%; SiO 2: 0.1~5mol%; SrO:0~2mol%; MnO 2: 0.01~3mol%; MgO:0~2mol%; Co 2O 3: 0~2mol%; Co 3O 4: 0~1mol%; Fe 2O 3: 0~1mol%; Y 2O 3: 0~4mol%; Re 2O 3: 0~4mol%.
4, according to claim 1 or 3 described dielectric materials, it is characterized in that: the presoma of described oxide comprises carbonate, hydroxide, oxalates, acetate, nitrate, citrate and alkoxide.
5, according to claim 1 or 3 described dielectric materials, it is characterized in that: described rare earth oxide Re 2O 3Middle Re representative: lanthanide series lanthanum, cerium, praseodymium, neodymium, samarium, europium, gadolinium, terbium, dysprosium, holmium, erbium, thulium, ytterbium, lutetium.
6, according to claim 1 or 3 described dielectric materials, it is characterized in that: SiO in the described secondary additive 2, BaO, CaO and CaTiO 3A part be with the form of glassy state as additive, (Ba ACa (1-A)O) x(Si BTi (1-B)O 2), 0≤A wherein, B≤1,0.9≤x≤1.1 account for 0~3wt% of ceramic weight.
7, according to claim 1 or 6 described electric materials, it is characterized in that: described frit (Ba ACa (1-A)O) x(Si BTi (1-B)O 2) be with SiO 2, BaO, CaO and CaTiO 3Or presoma mixes according to the proportioning of A, B, x accordingly, what calcining obtained under 800~1200 ℃ then.
8, according to claim 1 or 3 described dielectric materials, it is characterized in that: to mix the back with the mode of solution and major ingredient dry for oxide precursor in the described secondary additive, and the calcination processing temperature is less than 1100 ℃, and ball milling in addition.
9, the sintering process of preparation base metal inner electrode multilayer ceramic capacitor dielectric material according to claim 1 is characterized in that: the sintering densification process of green compact is divided into two stages: the phase I, and in temperature T 1Down, of short duration insulation 0~30 minute cools to the second stage temperature T then rapidly 2Under be incubated 1~6 hour, 1100 ℃≤T wherein 2<T 1≤ 1350 ℃, T 1Compare T 2High 10~250 ℃, from T 1To T 2Temperature fall time between 0~60 minute; The atmosphere of described phase I and second stage all is controlled at 10 -6~10 -12Pa under 900~1100 ℃ temperature, has 10 then -3~10 -8Anneal annealing time 0.5~4 hour in the atmosphere of Pa partial pressure of oxygen.
CN 03147880 2003-06-27 2003-06-27 Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process Pending CN1461023A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 03147880 CN1461023A (en) 2003-06-27 2003-06-27 Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 03147880 CN1461023A (en) 2003-06-27 2003-06-27 Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process

Publications (1)

Publication Number Publication Date
CN1461023A true CN1461023A (en) 2003-12-10

Family

ID=29591402

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 03147880 Pending CN1461023A (en) 2003-06-27 2003-06-27 Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process

Country Status (1)

Country Link
CN (1) CN1461023A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100354996C (en) * 2004-11-08 2007-12-12 华南理工大学 Process for preparing low frequency fine crystal ceramic capacitor dielectric material
CN101182201B (en) * 2007-11-27 2010-06-02 清华大学 Nano doping dielectric material for preparing base-metal inner-electrode multi-layer ceramic sheet type capacitor
CN101844927A (en) * 2010-05-28 2010-09-29 电子科技大学 High-low temperature circular sintering method for electronic ceramic materials
CN101486571B (en) * 2009-02-25 2012-07-04 同济大学 High Q electricity adjustable Ba1-xSrxTi1-yMnyO3 ceramic dielectric material and preparation thereof
CN102791654A (en) * 2009-12-16 2012-11-21 天工方案公司 Dielectric ceramic materials and associated methods
CN105693237A (en) * 2016-01-21 2016-06-22 中国科学院上海硅酸盐研究所 High-voltage-withstanding ceramic dielectric material and preparation method thereof
CN110668814A (en) * 2019-10-14 2020-01-10 天津大学 Microwave dielectric material with near-zero temperature coefficient of resonant frequency
CN112645708A (en) * 2020-12-24 2021-04-13 福建火炬电子科技股份有限公司 Anti-reduction BME ceramic dielectric capacitor and ceramic material for capacitor
CN114014649A (en) * 2021-12-13 2022-02-08 深圳先进电子材料国际创新研究院 Co-doped barium titanate ceramic dielectric material, preparation method and application thereof
CN114230335A (en) * 2021-12-22 2022-03-25 福建贝思科电子材料股份有限公司 BaTiO with giant dielectric constant, low loss and high resistivity3Fine crystal ceramic and its prepn
CN115504781A (en) * 2022-08-24 2022-12-23 深圳先进电子材料国际创新研究院 Wide-temperature-range stable ceramic dielectric material and preparation method and application thereof
CN116462500A (en) * 2023-04-19 2023-07-21 杭州兴容科技有限公司 X7R characteristic thin-layer BME ceramic dielectric material and preparation method thereof
CN116573931A (en) * 2023-05-16 2023-08-11 中国科学技术大学 Preparation method of barium titanate ceramic materials with different grain sizes and capable of improving flexural electricity response performance

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100354996C (en) * 2004-11-08 2007-12-12 华南理工大学 Process for preparing low frequency fine crystal ceramic capacitor dielectric material
CN101182201B (en) * 2007-11-27 2010-06-02 清华大学 Nano doping dielectric material for preparing base-metal inner-electrode multi-layer ceramic sheet type capacitor
CN101486571B (en) * 2009-02-25 2012-07-04 同济大学 High Q electricity adjustable Ba1-xSrxTi1-yMnyO3 ceramic dielectric material and preparation thereof
CN102791654A (en) * 2009-12-16 2012-11-21 天工方案公司 Dielectric ceramic materials and associated methods
CN101844927A (en) * 2010-05-28 2010-09-29 电子科技大学 High-low temperature circular sintering method for electronic ceramic materials
CN105693237A (en) * 2016-01-21 2016-06-22 中国科学院上海硅酸盐研究所 High-voltage-withstanding ceramic dielectric material and preparation method thereof
CN110668814A (en) * 2019-10-14 2020-01-10 天津大学 Microwave dielectric material with near-zero temperature coefficient of resonant frequency
CN112645708B (en) * 2020-12-24 2022-07-15 福建火炬电子科技股份有限公司 Anti-reduction BME ceramic dielectric capacitor and ceramic material for capacitor
CN112645708A (en) * 2020-12-24 2021-04-13 福建火炬电子科技股份有限公司 Anti-reduction BME ceramic dielectric capacitor and ceramic material for capacitor
CN114014649A (en) * 2021-12-13 2022-02-08 深圳先进电子材料国际创新研究院 Co-doped barium titanate ceramic dielectric material, preparation method and application thereof
CN114014649B (en) * 2021-12-13 2023-07-25 深圳先进电子材料国际创新研究院 Co-doped barium titanate ceramic dielectric material, preparation method and application thereof
CN114230335A (en) * 2021-12-22 2022-03-25 福建贝思科电子材料股份有限公司 BaTiO with giant dielectric constant, low loss and high resistivity3Fine crystal ceramic and its prepn
CN114230335B (en) * 2021-12-22 2022-12-13 福建贝思科电子材料股份有限公司 BaTiO with giant dielectric constant, low loss and high resistivity 3 Fine crystal ceramic and its prepn
CN115504781A (en) * 2022-08-24 2022-12-23 深圳先进电子材料国际创新研究院 Wide-temperature-range stable ceramic dielectric material and preparation method and application thereof
CN116462500A (en) * 2023-04-19 2023-07-21 杭州兴容科技有限公司 X7R characteristic thin-layer BME ceramic dielectric material and preparation method thereof
CN116573931A (en) * 2023-05-16 2023-08-11 中国科学技术大学 Preparation method of barium titanate ceramic materials with different grain sizes and capable of improving flexural electricity response performance

Similar Documents

Publication Publication Date Title
CN1252755C (en) Dielectric material for thermostable laminated ceramic capacitor with basic-metal inner electrode
CN101182201B (en) Nano doping dielectric material for preparing base-metal inner-electrode multi-layer ceramic sheet type capacitor
JP4965435B2 (en) Multilayer ceramic capacitor and manufacturing method thereof
JP4991564B2 (en) Multilayer ceramic capacitor
US7157396B2 (en) Dielectric ceramic composition and method of production and electronic device of the same
CN101183610B (en) Chemical coating prepared base metal internal electrode multi-layer ceramic chip capacitor dielectric material
US9266781B2 (en) Nano complex oxide doped dielectric ceramic material, preparation method thereof and multilayer ceramic capacitors made from the same
WO2007026614A1 (en) Dielectric ceramic, process for producing the same, and laminated ceramic capacitor
CN100508084C (en) Thin crystal base metal internal electrode multilayer ceramic sheet type capacitor medium material
JP5210300B2 (en) Dielectric porcelain and multilayer ceramic capacitor
EP1792881A1 (en) Dielectric ceramic composition, electronic device, and multilayer ceramic capacitor
JPH11273985A (en) Dielectric ceramic and its manufacture, and laminated ceramic electronic part and its manufacture
US8456798B2 (en) Hexagonal type barium titanate powder, producing method thereof, dielectric ceramic composition and electronic component
JP5146475B2 (en) Dielectric ceramic composition and ceramic electronic component
CN1854105A (en) Nanometer ceramic-material doping agent, ceramic capacitor media material and production thereof
CN110828170B (en) Multilayer ceramic capacitor
CN1461023A (en) Ultrathin temperature stable type multilayer ceramic capacitor dielectric material and its sintering process
CN101570434A (en) X8R type base metal inner electrode multilayer ceramic capacitor dielectric material and preparation method thereof
CN106747419B (en) Dielectric material for medium-high voltage X7R characteristic multilayer ceramic capacitor
CN114188155A (en) X7R/X8R dielectric powder suitable for ultrathin base metal inner electrode multilayer ceramic capacitor and preparation method thereof
CN100570771C (en) Electrodes in base metal medium material for multilayer ceramic capacitors and preparation method thereof
JP5541318B2 (en) Dielectric ceramic composition and ceramic electronic component
JP4511323B2 (en) Multilayer ceramic capacitor and manufacturing method thereof
CN1258783C (en) High-dielectric constant and reduction resistant dielectric material for capacitor with basic-metal electrode
JP2005162557A (en) Method of manufacturing dielectric ceramic composition, method of manufacturing dielectric layer-containing electronic component, and dielectric layer-containing electronic component

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication