CN1442754A - Method of forming isolated line using multiple exposure - Google Patents
Method of forming isolated line using multiple exposure Download PDFInfo
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- CN1442754A CN1442754A CN 02106483 CN02106483A CN1442754A CN 1442754 A CN1442754 A CN 1442754A CN 02106483 CN02106483 CN 02106483 CN 02106483 A CN02106483 A CN 02106483A CN 1442754 A CN1442754 A CN 1442754A
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Abstract
A process for forming a lone line by multiple exposing includes such steps as providing a semiconductor substrate, generating a photoresist layer, defining the first line pattern by a pattern mask, moving the mask at a particular distance, defining the second line pattern the same as the first one to make them be overlapped partially, and developing.
Description
Technical field
The present invention relates to a kind of method for making of utilizing the multiple-exposure method to form pattern, particularly relate to a kind of method for making of utilizing multiple-exposure to form isolated line.
Background technology
In the manufacture process of SIC (semiconductor integrated circuit), little shadow imaging (microlithography) processing procedure (manufacture craft) occupy epochmaking status far and away, people can accurately be defined in the pattern of design on the photoresist layer by this manufacture craft, utilize etching program that the design transfer of photoresist layer is made required circuit configurations then above the semiconductor-based end.Generally speaking, micro-photographing process mainly comprises linging (pfiming), photoresistance coating (coating), pre-roasting (or claiming soft roasting), exposure (expose), the aftertreatment of exposing to the sun, development and hard a plurality of steps such as roasting.Wherein, the resolution of exposure program (resolution) is the key factor that can the element integrated level further improve, and each big semiconductor manufacturing factory actively drops into research and development invariably to seek more upper floor.
At present, along with the quick increase of the integrated level of SIC (semiconductor integrated circuit), the desired wire spoke width of little shadow technology is also more and more littler, same, and the distance between each semiconductor element also shortens day by day.Yet above-mentioned interelement distance can have its restriction physically because being subjected to the influence of optical characteristics in exposure manufacture process.When its reason is to expose, obtain minute sized element for asking, interval between the photic zone of light shield dwindles the co-operating member size, but if the interval between the photic zone when being contracted to specific scope (exposure wavelength be 1/2 or when following), by the light of light shield the phenomenon of diffraction will take place, and then influence the resolution that shifts the back pattern.Moreover when having different intervals between the photic zone of light shield, wherein the light by at interval less photic zone will be subjected to having the phenomenon that influence than the photic zone of large-spacing makes that pattern after the transfer is distorted.
As shown in Figure 1, be to be irradiation-out of focus dendrogram (the Exposure-Defocus Tree of example with 0.35 micron live width, be called for short E-D Tree), the Z-axis on the left side is a line width values, get 0.35 micron live width ± 10% be a scope (0.315-0.385 micron), transverse axis is that positive and negative out of focus value (Focus) TDOF is the gross focusing degree of depth, at different exposure dose (100mJ/cm
2, 120mJ/cm
2) under, can obtain a form tolerance value W, in the micro-photographing process of prior art, we know that utilizing isolated line (Isolated Line) is the form tolerance value W that can't obtain in a big way, in order to obtain less isolated line, and obtain in a big way form tolerance value W, someone research and development goes out optical proximity effect correction (Optical Proximity Correction, OPC) method is changed into the master with the mask pattern design, or use the auxiliary patterns group on light shield, but, the method that these were improved, though can obtain less isolated line, form tolerance value W in a big way but can't effectively be obtained.
Summary of the invention
Technical matters to be solved by this invention provides a kind of method for making of utilizing multiple-exposure to form isolated line, can effectively obtain form tolerance value W in a big way, make light pattern when being subjected to having by less photic zone at interval phenomenon that is not distorted than the influencing of large-spacing photic zone.
For realizing above-mentioned purpose, the present invention proposes a kind of method of utilizing multiple-exposure to form isolated line, comprise the following steps, the semiconductor substrate is provided, form a photoresist layer in the above-mentioned semiconductor-based end, define one first line image with the pattern light shield in above-mentioned photoresist layer, above-mentioned pattern light shield is moved a specific range, make above-mentioned pattern light shield define second line image identical with above-mentioned first line image in above-mentioned photoresist layer, and above-mentioned first line image and above-mentioned second line image can form the overlapping pattern of lines, and the overlapping pattern of above-mentioned lines has a set live width, and carry out a developing manufacture process, make the overlapping pattern of above-mentioned lines be revealed in above-mentioned photoresist layer.
For above-mentioned purpose of the present invention, feature and advantage can be become apparent, a preferred embodiment cited below particularly, and cooperate appended graphicly, be described in detail below:
Description of drawings:
Fig. 1 is to be the irradiation-out of focus dendrogram (Exposure-Defocus Tree is called for short E-D Tree) of example with 0.35 micron live width;
Fig. 2 defines a plurality of first line images with the pattern light shield in photoresist layer among the present invention;
Fig. 3 moves a specific range with the pattern light shield among the present invention, forms the overlapping pattern of multi-line;
Fig. 4 carries out a developing manufacture process among the present invention, make the overlapping pattern of lines be revealed in photoresist layer.
Embodiment
The inventive method is to utilize twice repeated exposure method, forms isolated line, and above-mentioned isolated line has form tolerance value in a big way.At first, as shown in Figure 2, semiconductor silicon base (not being shown among the figure) is provided, form a photoresist layer (not being shown among the figure) in above-mentioned semiconductor silicon substrate, wherein above-mentioned photoresist layer can be positive photoresistance or negative photoresistance one of them, but be to use positive photoresist layer in the present invention, define a plurality of first line images 10 at above-mentioned photoresist layer with pattern light shield (not being shown among the figure).
As shown in Figure 3, above-mentioned pattern light shield (not being shown among the figure) is moved a specific range F, make above-mentioned pattern light shield (not being shown among the figure) define and identical a plurality of second line images 12 of above-mentioned first line image 10 at above-mentioned photoresist layer (not being shown among the figure), and above-mentioned first line image and above-mentioned second line image can form the overlapping pattern 14 of a plurality of lines, and above-mentioned superimposed lines pattern has a set live width L.
As shown in Figure 4, carry out a development method for making, make the overlapping pattern 14 of above-mentioned lines be revealed in above-mentioned photoresist layer, the overlapping pattern 14 of wherein above-mentioned lines has a both set a distance S to each other, is both determining deviations P of the overlapping pattern 14 of above-mentioned lines and the present invention defines the summation of both set a distances 8 of the set live width L of the overlapping pattern 14 of above-mentioned lines and the overlapping pattern 14 of above-mentioned lines.
Pattern dimension on the wherein above-mentioned pattern light shield (not being shown among the figure) (Mask Size) approximates both determining deviations P of the overlapping pattern 14 of the above-mentioned lines of twice.And in Fig. 3, above-mentioned pattern light shield (not being shown among the figure) moved a specific range F, and half of both determining deviations P that is about the overlapping pattern 14 of above-mentioned lines under the above-mentioned specific range deducts the set live width L of the overlapping pattern 14 of above-mentioned lines.Above-mentioned first line image 10 has identical intensive live width with above-mentioned second line image 12, and above-mentioned intensive live width is half of both determining deviations P of the overlapping pattern 14 of above-mentioned lines.
Comprehensive above-mentioned relation, the present invention summarizes following two formula:
1.
Mask?Size/4≡P/2
2.
F≡P/2-L
P=L+S wherein, for instance, if obtain the isolated line pattern (the set live width L of the overlapping pattern 14 of above-mentioned lines) of 0.1 μ m, and spacing is 0.4 μ m (both determining deviations P of the overlapping pattern 14 of above-mentioned lines), calculate with the above-mentioned formula of being summarized of the present invention, L=0.1 as can be known, P=0.4, required mobile specific range F=(0.4/2) the μ m-0.1 μ m=0.1 μ m of pattern light shield then, and the pattern dimension on the above-mentioned pattern light shield (Mask Size) equals 2P=0.8 μ m, above-mentioned first line image 10 has identical intensive live width with above-mentioned second line image 12, and above-mentioned intensive live width is half of both determining deviations P of the overlapping pattern 14 of above-mentioned lines, just 0.4/2=0.2 μ m.Utilize method of the present invention, can obtain less isolated line, and obtain in a big way form tolerance value, as long as know the live width of the isolated line of being desired, and isolated line both determining deviations each other, bring formula into, just can learn the value of intensive live width, and the required mobile specific range of the pattern light shield second time, form the plural isolated line of form tolerance value in a big way with twice repeated exposure.
Though the present invention discloses as above with preferred embodiment; right its is not; in order to limit scope of the present invention; anyly have the knack of this skill person; without departing from the spirit and scope of the present invention; when can doing a little change and retouching, so protection scope of the present invention should be as the criterion with the desired protection domain of patent claim.
Claims (10)
1. a method of utilizing multiple-exposure to form isolated line is characterized in that: comprise the following steps:
The semiconductor substrate is provided;
Form a photoresist layer in the above-mentioned semiconductor-based end;
Define one first line image with the pattern light shield in above-mentioned photoresist layer;
Above-mentioned pattern light shield is moved a specific range, make above-mentioned pattern light shield define second line image identical with above-mentioned first line image in above-mentioned photoresist layer, and above-mentioned first line image and above-mentioned second line image can form the overlapping pattern of lines, and the overlapping pattern of above-mentioned lines has a set live width; And
Carry out a developing manufacture process, make the overlapping pattern of above-mentioned lines be revealed in above-mentioned photoresist layer.
2. the method for utilizing multiple-exposure to form isolated line as claimed in claim 1 is characterized in that the described semiconductor-based end is the semiconductor silicon base.
3. the method for utilizing multiple-exposure to form isolated line as claimed in claim 1, it is characterized in that described photoresist layer be positive photoresistance or negative photoresistance one of them.
4. a method of utilizing multiple-exposure to form isolated line is characterized in that: comprise the following steps:
The semiconductor silicon base is provided;
Form a photoresist layer in above-mentioned semiconductor silicon substrate;
Define a plurality of first line images with the pattern light shield in above-mentioned photoresist layer;
Above-mentioned pattern light shield is moved a specific range, make above-mentioned pattern light shield define a plurality of second line images identical with above-mentioned first line image in above-mentioned photoresist layer, and above-mentioned first line image and above-mentioned second line image can form the overlapping pattern of a plurality of lines, and the overlapping pattern of above-mentioned lines has a set live width; And
Carry out a developing manufacture process, make the overlapping pattern of above-mentioned lines be revealed in above-mentioned photoresist layer, and the overlapping pattern of above-mentioned lines there is a both determining deviation to each other.
5. the method for utilizing multiple-exposure to form isolated line as claimed in claim 4, it is characterized in that described above-mentioned photoresist layer be positive photoresistance or negative photoresistance one of them.
6. the method for utilizing multiple-exposure to form isolated line as claimed in claim 4 is characterized in that the overlapping pattern of described above-mentioned lines has a both set a distance to each other.
7. the method for utilizing multiple-exposure to form isolated line as claimed in claim 6, the both determining deviations that it is characterized in that the overlapping pattern of described above-mentioned lines are the summation of both set a distances of the set live width of the overlapping pattern of above-mentioned lines and the overlapping pattern of above-mentioned lines.
8. the method for utilizing multiple-exposure to form isolated line as claimed in claim 4 it is characterized in that on the described above-mentioned pattern light shield pattern dimension being arranged, and above-mentioned pattern dimension approximates both determining deviations of the overlapping pattern of the above-mentioned lines of twice.
9. the method for utilizing multiple-exposure to form isolated line as claimed in claim 4, it is characterized in that described above-mentioned pattern light shield moves a specific range, and above-mentioned specific range is stated approximately at once half of both determining deviations of the overlapping pattern of lines and is deducted the set live width of the overlapping pattern of above-mentioned lines.
10. the method for utilizing multiple-exposure to form isolated line as claimed in claim 4, it is characterized in that described above-mentioned first line image has identical intensive live width with above-mentioned second line image, and above-mentioned intensive live width is half of both determining deviations of the overlapping pattern of above-mentioned lines.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02106483 CN1212548C (en) | 2002-03-01 | 2002-03-01 | Method of forming isolated line using multiple exposure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02106483 CN1212548C (en) | 2002-03-01 | 2002-03-01 | Method of forming isolated line using multiple exposure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1442754A true CN1442754A (en) | 2003-09-17 |
| CN1212548C CN1212548C (en) | 2005-07-27 |
Family
ID=27793203
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 02106483 Expired - Lifetime CN1212548C (en) | 2002-03-01 | 2002-03-01 | Method of forming isolated line using multiple exposure |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102736451A (en) * | 2012-07-04 | 2012-10-17 | 苏州大学 | Three-beam interference lithography method and system |
| CN104166315A (en) * | 2014-08-14 | 2014-11-26 | 深圳市华星光电技术有限公司 | Exposure method and exposure machine |
| WO2018188134A1 (en) * | 2017-04-12 | 2018-10-18 | 深圳市华星光电技术有限公司 | Method for fabricating multi-color color resistor |
| CN112882355A (en) * | 2021-03-09 | 2021-06-01 | 上海大溥实业有限公司 | Method for narrowing photoetching line and photoetching machine |
-
2002
- 2002-03-01 CN CN 02106483 patent/CN1212548C/en not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102736451A (en) * | 2012-07-04 | 2012-10-17 | 苏州大学 | Three-beam interference lithography method and system |
| CN104166315A (en) * | 2014-08-14 | 2014-11-26 | 深圳市华星光电技术有限公司 | Exposure method and exposure machine |
| WO2016023253A1 (en) * | 2014-08-14 | 2016-02-18 | 深圳市华星光电技术有限公司 | Exposure method and exposure apparatus |
| WO2018188134A1 (en) * | 2017-04-12 | 2018-10-18 | 深圳市华星光电技术有限公司 | Method for fabricating multi-color color resistor |
| CN112882355A (en) * | 2021-03-09 | 2021-06-01 | 上海大溥实业有限公司 | Method for narrowing photoetching line and photoetching machine |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1212548C (en) | 2005-07-27 |
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